A critical path delay check system

There are two methods for applying path delay tests to a sequential circuit. We show that all path delay faults that can affect the rated-clock operation of the circuit are testable by the variable-clock method. Also, all path delay faults that are ...

We propose a path selection criterion to improve the coverage of small delay defects. Under this criterion, every line in the circuit is covered by one of the longest testable paths or subpaths that goes through it. Earlier criteria that considered only ...

Process together with runtime variations in temperature and voltage, as well as transistor aging, degrade path delay and may eventually induce circuit failure due to timing variations. Therefore, in-field tracking of path delays is essential, and to ...