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WO2020056685A1 - Transmission gate circuit, matrix switch and electronic device - Google Patents

Transmission gate circuit, matrix switch and electronic device Download PDF

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Publication number
WO2020056685A1
WO2020056685A1 PCT/CN2018/106770 CN2018106770W WO2020056685A1 WO 2020056685 A1 WO2020056685 A1 WO 2020056685A1 CN 2018106770 W CN2018106770 W CN 2018106770W WO 2020056685 A1 WO2020056685 A1 WO 2020056685A1
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WO
WIPO (PCT)
Prior art keywords
transmission gate
control signal
control
signal
input
Prior art date
Application number
PCT/CN2018/106770
Other languages
French (fr)
Chinese (zh)
Inventor
邹小卫
鲁海生
李赞
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to CN202310955788.0A priority Critical patent/CN117220662A/en
Priority to PCT/CN2018/106770 priority patent/WO2020056685A1/en
Priority to CN201880097532.8A priority patent/CN112689959B/en
Publication of WO2020056685A1 publication Critical patent/WO2020056685A1/en

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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175Coupling arrangements; Interface arrangements
    • H03K19/0185Coupling arrangements; Interface arrangements using field effect transistors only

Definitions

  • the present application relates to the field of electronic communication technology, and particularly to the field of semiconductor technology.
  • Transmission gate is a controllable switch circuit that can transmit both digital and analog signals. It is one of the most common structures in integrated circuit devices. It is used to control the connection between the input signal and the load circuit. The path is turned on or off.
  • the transmission gate is a semiconductor device, there is still a certain leakage current flowing through the path where the transmission gate is located when the transmission gate is in the off state.
  • the path where the transmission gate is located and other paths connected to the path where the transmission gate is located are connected.
  • the path affects, especially for large-scale programming circuits.
  • the input signals on the bus are connected to the corresponding load circuit through multiple transmission gates.
  • the user-defined addressing signal can be used to connect the bus to only one load circuit at a time. The load circuit remains disconnected.
  • the traditional transmission gate design reduces the leakage current when the transmission gate is turned off by reducing the size of the transmission gate.
  • the smaller the size of the transmission gate the smaller the driving capability of the transmission gate when it is in the conducting state. Therefore, the design of such a transmission gate is not suitable for switching circuit applications that have certain requirements for the driving capability.
  • the application provides a transmission gate circuit, a matrix switch, and an electronic device to reduce leakage current of the transmission gate.
  • the present application provides a transmission gate circuit, the transmission gate circuit including a first transmission gate and a second transmission gate, wherein an input terminal of the first transmission gate is used to transmit an input signal of a load circuit or An output signal, the load circuit is connected to the output end of the first transmission gate, the control end of the first transmission gate is used to input a first control signal, and the output end of the first transmission gate is also connected to the first transmission gate
  • the output ends of the two transmission gates are connected; the input end of the second transmission gate is used to input a leakage adjustment signal, and the control end of the second transmission gate is used to input a second control signal.
  • the second transmission gate When the first transmission gate is in an on state under the control of the first control signal, the second transmission gate is in an off state under the control of the second control signal.
  • the second transmission gate When the gate is in the off state under the control of the first control signal, the second transmission gate is in the on state under the control of the second control signal; the leakage adjustment signal is used for the first When the transmission gate is in the off state and the second transmission gate is in the on state, the leakage current of the first transmission gate is reduced.
  • the second transmission gate in the transmission gate circuit is under the control of the second control signal In the off state, the input signal input to the first transmission gate is transmitted to the load circuit of the first stage of the first transmission gate, that is, the second transmission gate has no effect on the load circuit of the path where the first transmission gate is located.
  • the leakage adjustment signals of the two transmission gates can pass through the second transmission gate and adjust the voltage of the output end of the first transmission gate to reduce the leakage current generated when the first transmission gate is in the off state, and it is not necessary Limiting the size of the first transmission gate will not affect the driving capability of the first transmission gate and ensure that the first transmission gate has a larger driving capability.
  • the leakage adjustment signal can be flexibly configured according to the opening voltage of the first transmission gate to adjust the clamping voltage transmitted by the second transmission gate, which can achieve the results obtained by the advanced processing technology with large fluctuations in processing technology.
  • Transmission gate performance fluctuation immunity is that the leakage adjustment function of the second transmission gate can adapt to transmission gate performance fluctuations.
  • a size of the second transmission gate is smaller than a size of the first transmission gate, and a size of the first transmission gate is determined according to a driving capability of the transmission gate circuit.
  • the transmission gate circuit may be specifically implemented by, but not limited to, any one of the following five methods:
  • the first transmission gate is a first complementary metal oxide semiconductor CMOS transmission gate
  • the second transmission gate is a second CMOS transmission gate.
  • the control terminal of the first CMOS transmission gate includes a first control terminal and a second control terminal. The first control terminal is used to input a first sub-control signal, and the second control terminal is used to input a second sub-control signal.
  • Control signal; the control end of the second CMOS transmission gate includes a third control end and a fourth control end, the third control end is used to input a third sub-control signal, and the fourth control end is used to input a fourth Sub control signal
  • the first control signal includes the first sub-control signal and the second sub-control signal
  • the second control signal includes the third sub-control signal and the fourth sub-control signal
  • the second The sub-control signal is an inverted signal of the first sub-control signal
  • the third sub-control signal is an inverted signal of the first sub-control signal
  • the fourth sub-control signal is the second sub-control The inverted signal of the signal.
  • the first transmission gate is a first P-channel metal-oxide-semiconductor PMOS transmission gate
  • the second transmission gate is a second PMOS transmission gate
  • the second control signal is a signal of the first control signal. Inverted signal.
  • the first transmission gate is a first N-channel metal oxide semiconductor NMOS transmission gate
  • the second transmission gate is a second NMOS transmission gate
  • the second control signal is a signal of the first control signal. Inverted signal.
  • the first transmission gate is a P-channel metal-oxide-semiconductor PMOS transmission gate
  • the second transmission gate is an N-channel metal-oxide-semiconductor NMOS transmission gate
  • the second control signal and the first The control signals are the same.
  • the first transmission gate is an N-channel metal oxide semiconductor NMOS transmission gate
  • the second transmission gate is a P-channel metal oxide semiconductor PMOS transmission gate
  • the second control signal and the first The control signals are the same.
  • first transmission gate or the second transmission gate when the first transmission gate or the second transmission gate is a PMOS transmission gate, the first transmission gate or the second transmission gate may include one or more PMOS transistors.
  • first transmission gate or the second transmission gate when the first transmission gate or the second transmission gate is an NMOS transmission gate, the first transmission gate or the second transmission gate may include one or more NMOS transistors.
  • an embodiment of the present application further provides a matrix switch.
  • the matrix switch includes multiple switches, and the multiple switches are transmission gate circuits according to any one of the possible implementation manners of the first aspect.
  • the plurality of switches constitute a switch array, and for any one of the switches in the switch array, the input end of the switch is connected to the input end of each switch in the row where the switch is located, and the output end where the switch is located is connected to the switch where The output terminal of each switch in the column is connected, and the control terminal of the switch is used to input the first control signal and the second control signal.
  • an embodiment of the present application further provides an electronic device, where the electronic device includes the matrix switch and the controller according to any one of the possible implementation manners of the second aspect, where the controller is configured to generate The first control signal and the second control signal.
  • FIG. 1 is a schematic structural diagram of a matrix switch in the prior art
  • FIG. 2 is a schematic structural diagram of an NMOS transistor
  • FIG. 3 is a schematic structural diagram of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 4 is a schematic diagram of a specific structure of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 5 is a second schematic diagram of a specific structure of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 6 is a third specific schematic structural diagram of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 7 is a fourth specific structural schematic diagram of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 8 is a fifth specific structural schematic diagram of a transmission gate circuit according to an embodiment of the present application.
  • FIG. 9 is a schematic structural diagram of a matrix switch according to an embodiment of the present application.
  • FIG. 10 is a schematic diagram of a specific structure of a matrix switch according to an embodiment of the present application.
  • FIG. 11 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
  • Transmission gates are widely used in various integrated circuits to achieve the functions of switches, multiplexers, and logic functional devices, such as programmable logic devices.
  • the transmission gate can be composed of semiconductor devices such as bipolar transistors (BJT) or metal-oxide semiconductor (MOS) transistors, and an NMOS transmission gate composed of a single N (negative) channel MOS transistor is Example, its structure is shown in Figure 2.
  • the NMOS transmission gate includes a P-type semiconductor silicon substrate with a lower doping concentration, and two N-regions with a higher doping concentration formed on the P-type semiconductor substrate by a semiconductor photolithography and diffusion process.
  • the electrodes on the two N regions are the source (source, S) and the drain (drain, D), and the electrode on the P-type semiconductor between the source and the drain is the gate (gate, G).
  • V GS When a forward voltage V GS is applied between the gate and the source of the NMOS transmission gate, an electric field is generated in the silicon dioxide SiO2 insulating layer between the gate and the silicon substrate and the gate points toward the P-type silicon substrate.
  • the holes in the P-type substrate near the gate are repelled, leaving immovable acceptor ions (negative ions) to form a depletion layer, and the electrons (majority) in the P-type substrate are attracted to the substrate surface.
  • V GS When V GS is small, the electric field is not capable of attracting electrons, and a conductive channel cannot be formed between the drain and the source. As V GS increases, more electrons are attracted to the surface layer of the P substrate.
  • V GS When the turn-on voltage value V TH of the NMOS transmission gate is reached, an N-type conductive channel is formed from the drain to the source, and its conductivity type is opposite to that of the P substrate, so it is also called an inversion layer. After the conductive channel is formed, the NMOS transmission gate is in a conducting state, and a forward voltage V DS is applied between the drain and the source, and a current is generated between the drain and the source.
  • the NMOS transmission gate when V GS ⁇ V TH , the NMOS transmission gate is in an off state, and no current flows between the drain and the source, but between the drain and the substrate of the NMOS transmission gate, the source There are two PN junctions between the electrode and the substrate. Even if there is no conductive channel in the NMOS transmission gate, there is still a reverse saturation current between the drain and the source, which is the so-called leakage current.
  • the leakage current will not only increase the power consumption of the transmission gate, but also affect the signals of other paths connected to the path where the transmission gate is located.
  • the traditional transmission gate design reduces the leakage current when the transmission gate is turned off by reducing the size of the transmission gate.
  • the smaller the size of the transmission gate the smaller the driving capability of the transmission gate when it is in the on state.
  • the present application proposes a transmission gate circuit, a matrix switch, and an electronic device, so as to reduce the leakage current of the transmission gate when it is turned off without reducing the driving capability of the transmission gate.
  • the transmission gate circuit 300 includes a first transmission gate 310 and a second transmission gate 320, wherein an input terminal of the first transmission gate 310 is used to transmit an input signal or an output signal of a load circuit,
  • the load circuit is connected to an output terminal of the first transmission gate 310, a control terminal of the first transmission gate 310 is used to input a first control signal, and an output terminal of the first transmission gate 310 is also connected to the first transmission gate 310.
  • the output ends of the two transmission gates 320 are connected; the input end of the second transmission gate 320 is used to input a leakage adjustment signal, and the control end of the second transmission gate 320 is used to input a second control signal.
  • the second transmission gate 320 When the first transmission gate 310 is in an on state under the control of the first control signal, the second transmission gate 320 is in an off state under the control of the second control signal. When a transmission gate 310 is in an off state under the control of the first control signal, the second transmission gate 320 is in an on state under the control of the second control signal; the leakage adjustment signal is used for When the first transmission gate 310 is in the off state and the second transmission gate 320 is in the on state, the leakage current of the first transmission gate 310 is reduced.
  • the leakage adjustment signal can be flexibly configured according to an opening voltage of the first transmission gate 310, so that the second transmission gate 320 changes the first transmission gate 310 when the first transmission gate 310 is turned off.
  • the voltage at the output terminal of the MOSFET is further reduced to reduce the leakage current when the first transmission gate 310 is turned off.
  • the driving capability of the transmission gate circuit 300 is mainly It depends on the driving capability of the first transmission gate 310.
  • the driving capability of the transmission gate is determined by the size of the transmission gate. The larger the size of the transmission gate, the greater the driving capability of the transmission gate. That is, the size of the first transmission gate 310 is determined by the size of the first transmission gate 310.
  • the driving capability is determined.
  • the size of the second transmission gate 320 may be smaller than the size of the first transmission gate 310, and the size of the transmission gate circuit 300 may be reduced.
  • the size of the transmission gate is generally characterized by the width W of the conductive channel of the transmission gate and the length L of the control end of the transmission gate (for example, when the transmission gate is a PMOS transistor, L is the length of the gate of the PMOS transistor), which can be expressed as Means. That is, the size of the first transmission gate 310 may be the ratio of the width W 1 of the conductive channel of the first transmission gate 310 to the length L 1 of the control end of the first transmission gate 310. It is indicated that the size of the second transmission gate 320 may be the ratio of the width W 2 of the conductive channel of the second transmission gate 320 to the length L 2 of the control end of the second transmission gate 320. Means.
  • the transmission gates can be realized by MOS transistors, including PMOS transmission gates, NMOS transmission gates, and complementary metal oxide semiconductor (CMOS) transmission gates.
  • CMOS complementary metal oxide semiconductor
  • the transmission gate circuit 300 may be specifically implemented in any one of the following five ways:
  • the first transmission gate 310 is a first CMOS transmission gate
  • the second transmission gate 320 is a second CMOS transmission gate, as shown in FIG. 4.
  • the control terminal of the first CMOS transmission gate includes a first control terminal and a second control terminal. The first control terminal is used to input a first sub-control signal, and the second control terminal is used to input a second sub-control signal.
  • Control signal the control end of the second CMOS transmission gate includes a third control end and a fourth control end, the third control end is used to input a third sub-control signal, and the fourth control end is used to input a fourth A sub-control signal;
  • the first control signal includes the first sub-control signal and the second sub-control signal, and the second control signal includes the third sub-control signal and the fourth sub-control signal.
  • the second sub-control signal is an inverted signal of the first sub-control signal
  • the third sub-control signal is an inverted signal of the first sub-control signal
  • the fourth sub-control signal is the An inverted signal of a second sub-control signal, so that when the first CMOS transmission gate is in a conducting state under the control of the first sub-control signal and the second sub-control signal, the second CMOS transmission gate The gate is in an off state under the control of the third sub-control signal and the fourth sub-control signal.
  • the first CMOS transmission gate is controlled by the first sub-control signal and the second sub-control signal. When it is in the off state, the second CMOS transmission gate is in the on state under the control of the third sub-control signal and the fourth sub-control signal.
  • the first control terminal is a PMOS transistor in the first CMOS transmission gate 310.
  • the second control terminal is the gate of the NMOS transistor in the first CMOS transmission gate 310
  • the third control terminal is the gate of the PMOS transistor in the second CMOS transmission gate 320
  • the fourth control terminal is a gate of an NMOS transistor in the second CMOS transmission gate 320.
  • the input terminal of the first CMOS transmission gate 310 may be the source of the PMOS transistor and the NMOS transistor in the first CMOS transmission gate 310, or the first CMOS transmission.
  • an input terminal of the first CMOS transmission gate 310 is a drain of a PMOS transistor and an NMOS transistor in the first CMOS transmission gate 310
  • an output terminal of the first CMOS transmission gate 310 is the first CMOS The source of the PMOS transistor and the NMOS transistor in the transmission gate 310.
  • the first An output terminal of the CMOS transmission gate 310 is a drain of a PMOS transistor and an NMOS transistor in the first CMOS transmission gate 310.
  • the first transmission gate 310 is a first PMOS transmission gate
  • the second transmission gate 320 is a second PMOS transmission gate, as shown in FIG. 5, wherein the second control signal is the first transmission gate.
  • An inverted signal of a control signal so that when the first PMOS transmission gate is in an on state under the control of the first control signal, the second PMOS transmission gate is in a state under the control of the second control signal
  • the first PMOS transmission gate is in the off state under the control of the first control signal
  • the second PMOS transmission gate is in the on state under the control of the second control signal.
  • the first PMOS transmission gate may include one or more PMOS transistors
  • the second PMOS transmission gate may include one or more PMOS transistors.
  • FIG. 5 only the first PMOS transmission is used.
  • the gate includes a PMOS transistor
  • the second PMOS transmission gate includes a PMOS transistor as an example, which does not limit the embodiment of the present application.
  • the first PMOS transmission gate includes a PMOS transistor
  • a control terminal of the first PMOS transmission gate is a gate of the PMOS transistor
  • an input terminal of the first PMOS transmission gate is a drain of the PMOS transistor.
  • An output terminal of the first PMOS transmission gate is a gate of the PMOS transistor, or a control terminal of the first PMOS transmission gate is a gate of the PMOS transistor, and an input terminal of the first PMOS transmission gate is The gate of the PMOS transistor, and the output of the first PMOS transmission gate is the drain of the PMOS transistor.
  • the second PMOS transmission gate includes a PMOS transistor
  • the input terminal, the control terminal, and the output terminal of the second PMOS transmission gate are similar to the first PMOS transmission gate. See above for the first PMOS transistor. The related description is not repeated here.
  • the first transmission gate 310 is a first NMOS transmission gate
  • the second transmission gate 320 is a second NMOS transmission gate, as shown in FIG. 6, wherein the second control signal is the first An inverted signal of a control signal, so that when the first NMOS transmission gate is in an on state under the control of the first control signal, the second NMOS transmission gate is in a state under the control of the second control signal
  • the first NMOS transmission gate is in the off state under the control of the first control signal
  • the second NMOS transmission gate is in the on state under the control of the second control signal.
  • the first NMOS transmission gate may include one or more NMOS transistors
  • the second NMOS transmission gate may include one or more NMOS transistors. In FIG. 5, only the first NMOS transmission gate is included.
  • An NMOS transistor, and the second NMOS transmission gate includes an NMOS transistor as an example, which does not limit the embodiment of the present application.
  • the first NMOS transmission gate includes an NMOS transistor
  • a control terminal of the first NMOS transmission gate is a gate of the NMOS transistor
  • an input terminal of the first NMOS transmission gate is a drain of the NMOS transistor.
  • the output terminal of the first NMOS transmission gate is the gate of the NMOS transistor, or the control terminal of the first NMOS transmission gate is the gate of the NMOS transistor, and the input terminal of the first NMOS transmission gate is the The gate of the NMOS transistor, and the output of the first NMOS transmission gate is the drain of the NMOS transistor.
  • the input terminal, the control terminal, and the output terminal of the second NMOS transmission gate are similar to the first NMOS transmission gate. See above for the first NMOS transistor. The related description is not repeated here.
  • the first transmission gate 310 is a PMOS transmission gate
  • the second transmission gate 320 is an NMOS transmission gate.
  • the second control signal is the same as the first control signal.
  • the NMOS transmission gate is in the off state under the control of the second control signal
  • the PMOS transmission gate is in all states.
  • the first control signal is in the off state
  • the NMOS transmission gate is in the on state under the control of the second control signal.
  • the first transmission gate 310 is an NMOS transmission gate
  • the second transmission gate 320 is a PMOS transmission gate, as shown in FIG. 8, wherein the second control signal is the same as the first control signal.
  • the NMOS transmission gate is in an on state under the control of the first control signal
  • the PMOS transmission gate is in an off state under the control of the second control signal
  • the NMOS transmission gate is in
  • the first control signal is in the off state
  • the PMOS transmission gate is in the on state under the control of the second control signal.
  • the PMOS transmission gate may include one or more PMOS transistors
  • the NMOS transmission gate may include one or more NMOS transistors.
  • FIG. 7 and FIG. 8 only the PMOS transmission gate is included.
  • a PMOS transistor, and the NMOS transmission gate includes an NMOS transistor as an example, which does not limit the embodiment of the present application.
  • the control end of the PMOS transmission gate is the gate of the PMOS transistor, and the input end of the PMOS transmission gate is the drain of the PMOS transistor.
  • the output terminal of the PMOS transmission gate is the gate of the PMOS transistor, or the control terminal of the PMOS transmission gate is the gate of the PMOS transistor, and the input terminal of the PMOS transmission gate is the gate of the PMOS transistor.
  • the output of the PMOS transmission gate is the drain of the PMOS transistor.
  • the NMOS transmission gate includes an NMOS transistor
  • a control terminal of the NMOS transmission gate is a gate of the NMOS transistor
  • an input terminal of the NMOS transmission gate is a drain of the NMOS transistor
  • the output end of the transmission gate is the gate of the NMOS transistor, or the control end of the NMOS transmission gate is the gate of the NMOS transistor, the input end of the NMOS transmission gate is the gate of the NMOS transistor, and the NMOS The output of the transmission gate is the drain of the NMOS transistor.
  • first transmission gate 310 and the second transmission gate 320 may also be implemented by a bipolar transistor (ie, a triode), where the emitter (E) and the base of the bipolar transistor
  • the (base, B) and the collector (C) correspond to the source, gate, and drain of the MOS transistor, respectively. Their functions are similar.
  • the collector is usually used as the input, and the emitter is usually used as the output.
  • the specific implementation manner of the transmission gate circuit 300 is similar to the foregoing manners A to E, and is not repeated here.
  • the second transmission gate 320 in the transmission gate circuit 300 when the first transmission gate 310 in the transmission gate circuit 300 is in an on state under the control of the first control signal, the second transmission gate 320 in the transmission gate circuit 300 is in the second control It is in the off state under the control of the signal, and the input signal input to the first transmission gate 310 is transmitted to the subsequent-stage load circuit of the first transmission gate 310, that is, the second transmission gate 320 controls the first transmission gate.
  • the load circuit of the path where 310 is located has no effect; when the first transmission gate 310 is in the off state under the control of the first control signal, the second transmission gate 320 is under the control of the second control signal It is in a conducting state, and the leakage adjustment signal input to the second transmission gate 320 can pass through the second transmission gate 320 and adjust the voltage at the output terminal of the first transmission gate 310 to reduce the first transmission gate.
  • the leakage current generated when the 310 is in the off state does not need to limit the size of the first transmission gate 310, and thus does not affect the driving ability of the first transmission gate 310, ensuring that the first transmission gate 310 has a large Driving capacity.
  • the leakage adjustment signal can be flexibly configured according to the opening voltage of the first transmission gate 310 to adjust the clamping voltage transmitted by the second transmission gate 320, which can realize an advanced processing process with large fluctuations in processing technology
  • the obtained transmission gate performance fluctuation immunity is that the leakage adjustment function of the second transmission gate 320 can adapt to the transmission gate performance fluctuation.
  • this application further provides a matrix switch.
  • the matrix switch 900 includes multiple switches, and the multiple switches are transmissions described in any one of the foregoing possible implementation manners.
  • the plurality of switches constitute a switch array. For any one of the switches in the switch array, the input terminal of the switch is connected to the input terminal of each switch in the row where the switch is located, and the output terminal of the switch is connected to the switch. An output terminal of each switch in the column is connected, and a control terminal of the switch is used to input the first control signal and the second control signal.
  • the control signal (including the first control signal and the second control signal) and the leakage current adjustment signal of each of the switches may be generated by the same circuit (or device), or may be generated by different circuits ( Or device).
  • the matrix switch 900 when the matrix switch 900 is an n ⁇ 1 switch array, its specific structure is shown in FIG. 10. It should be noted that this is only an example and does not limit the embodiments of the present application.
  • the matrix switch 900 may also be an n ⁇ m switch array, where n and m are positive integers.
  • each switch in the matrix switch 900 is implemented by the transmission gate circuit 300, which can effectively reduce the total of the matrix switch 900 while ensuring that the matrix switch 900 has a large driving capability. Leakage current.
  • this application further provides an electronic device.
  • the electronic device 1100 includes the matrix switch 900 and the controller 1110 described in any one of the foregoing possible implementation manners.
  • the controller 1110 is configured to generate the first control signal and the second control signal.
  • the leakage adjustment signal may be generated by an external signal generating device or a signal generating circuit in the electronic device 1110. Or generated by the controller 1110.
  • the matrix switch 900 in the electronic device 1100 has a large driving capability, and the total leakage current of the matrix switch 900 is small, so that when one of the switches in the matrix switch 900 is gated, the The leakage current generated by other switches in the off state of the matrix switch has less influence on the signal on the path where the switch is located.
  • the other switches in the matrix switch 900 are in the off state.
  • the leakage current generated by the switch in the off state has less influence on the signal on the path where the switch is located, so the measurement accuracy of the electronic device can be effectively improved.

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Abstract

A transmission gate circuit, a matrix switch, and an electronic device. The transmission gate circuit comprises a first transmission gate and a second transmission gate. An input end of the first transmission gate is used to transmit an input signal or an output signal of a load circuit connected to the first transmission gate, a control end of the first transmission gate is used to input a first control signal, and an output end of the first transmission gate is also connected to an output end of the second transmission gate; and an input end of the second transmission gate is used to input an electric leakage adjustment signal, and a control end of the second transmission gate is used to input a second control signal. When the first transmission gate is in a turned-on state under the control of the first control signal, the second transmission gate is in a turned-off state under the control of the second control signal, and when the first transmission gate is in a turned-off state under the control of the first control signal, the second transmission gate is in a turned-on state under the control of the second control signal; and the electric leakage adjustment signal is used to reduce a leakage current of the first transmission gate when the first transmission gate is turned off and the second transmission gate is turned on.

Description

一种传输门电路、矩阵开关以及电子设备Transmission gate circuit, matrix switch and electronic equipment 技术领域Technical field
本申请涉及电子通信技术领域,尤其涉及半导体技术领域。The present application relates to the field of electronic communication technology, and particularly to the field of semiconductor technology.
背景技术Background technique
传输门(transmission gate,TG)是一种既可以传送数字信号又可以传输模拟信号的可控开关电路,是集成电路器件中最普遍的结构之一,用于控制输入信号与负载电路之间的通路的导通或者关断。Transmission gate (TG) is a controllable switch circuit that can transmit both digital and analog signals. It is one of the most common structures in integrated circuit devices. It is used to control the connection between the input signal and the load circuit. The path is turned on or off.
由于传输门是一种半导体器件,在传输门处于关断状态时还是会有一定的漏电流流过该传输门所在的通路,对该传输门所在的通路以及该传输门所在的通路连接的其它通路造成影响,尤其对于大规模编程电路中总线上的输入信号通过多个传输门与相应的负载电路连接,通过自定义的寻址信号实现在某一时刻总线只连接到某一个负载电路,其他负载电路保持断开状态的场景,如图1所示,当传输门TG 0导通,其它传输门TG 1~TG n关断时,关断的传输门中的漏电流I leak1~I leakn都会叠加在导通的传输门所在的通路上,影响导通的传输门所在的通路中的信号I totalBecause the transmission gate is a semiconductor device, there is still a certain leakage current flowing through the path where the transmission gate is located when the transmission gate is in the off state. The path where the transmission gate is located and other paths connected to the path where the transmission gate is located are connected. The path affects, especially for large-scale programming circuits. The input signals on the bus are connected to the corresponding load circuit through multiple transmission gates. The user-defined addressing signal can be used to connect the bus to only one load circuit at a time. The load circuit remains disconnected. As shown in Figure 1, when transmission gate TG 0 is turned on and other transmission gates TG 1 to TG n are turned off, the leakage currents I leak1 to I leakn in the turned-off transmission gates are all Superimposed on the path where the conductive transmission gate is located, it affects the signal I total in the path where the conductive transmission gate is located.
传统的传输门设计通过减小传输门的尺寸,减小传输门关断时的漏电流。但是,传输门的尺寸越小,传输门处于导通状态时的驱动能力也越小,因而这种传输门的设计不适用于对驱动能力有一定要求的开关电路应用。The traditional transmission gate design reduces the leakage current when the transmission gate is turned off by reducing the size of the transmission gate. However, the smaller the size of the transmission gate, the smaller the driving capability of the transmission gate when it is in the conducting state. Therefore, the design of such a transmission gate is not suitable for switching circuit applications that have certain requirements for the driving capability.
发明内容Summary of the Invention
本申请提供了一种传输门电路、矩阵开关以及电子设备,以减小传输门的漏电流。The application provides a transmission gate circuit, a matrix switch, and an electronic device to reduce leakage current of the transmission gate.
第一方面,本申请提供了一种传输门电路,所述传输门电路包括第一传输门以及第二传输门,其中,所述第一传输门的输入端用于传输负载电路的输入信号或输出信号,所述负载电路与所述第一传输门的输出端连接,所述第一传输门的控制端用于输入第一控制信号,所述第一传输门的输出端还与所述第二传输门的输出端连接;所述第二传输门的输入端用于输入漏电调节信号,所述第二传输门的控制端用于输入第二控制信号。In a first aspect, the present application provides a transmission gate circuit, the transmission gate circuit including a first transmission gate and a second transmission gate, wherein an input terminal of the first transmission gate is used to transmit an input signal of a load circuit or An output signal, the load circuit is connected to the output end of the first transmission gate, the control end of the first transmission gate is used to input a first control signal, and the output end of the first transmission gate is also connected to the first transmission gate The output ends of the two transmission gates are connected; the input end of the second transmission gate is used to input a leakage adjustment signal, and the control end of the second transmission gate is used to input a second control signal.
当所述第一传输门在所述第一控制信号的控制下处于导通状态时,所述第二传输门在所述第二控制信号的控制下处于关断状态,当所述第一传输门在所述第一控制信号的控制下处于关断状态时,所述第二传输门在所述第二控制信号的控制下处于导通状态;所述漏电调节信号用于在所述第一传输门处于关断状态,且所述第二传输门处于导通状态时,减小所述第一传输门的漏电流。When the first transmission gate is in an on state under the control of the first control signal, the second transmission gate is in an off state under the control of the second control signal. When the gate is in the off state under the control of the first control signal, the second transmission gate is in the on state under the control of the second control signal; the leakage adjustment signal is used for the first When the transmission gate is in the off state and the second transmission gate is in the on state, the leakage current of the first transmission gate is reduced.
采用上述方案,当所述传输门电路中的第一传输门在第一控制信号的控制下处于导通状态时,所述传输门电路中所述第二传输门在第二控制信号的控制下处于关断状态,输入所述第一传输门的输入信号传输到所述第一传输门的后级负载电路,即所述第二传输门对所述第一传输门所在的通路的负载电路没有影响;当所述第一传输门在所述第一控制信号的控制下处于关断状态时,所述第二传输门在所述第二控制信号的控制下处于导通状态,输入所述第二传输门的漏电调节信号能够通过所述第二传输门,并调整所述第一传输门的输出端的电压,以减小所述第一传输门处于关断状态时产生的漏电流,不需要限制所述第 一传输门的尺寸,进而不会影响所述第一传输门的驱动能力,保证所述第一传输门具有较大的驱动能力。With the above solution, when the first transmission gate in the transmission gate circuit is in an on state under the control of the first control signal, the second transmission gate in the transmission gate circuit is under the control of the second control signal In the off state, the input signal input to the first transmission gate is transmitted to the load circuit of the first stage of the first transmission gate, that is, the second transmission gate has no effect on the load circuit of the path where the first transmission gate is located. Effect; when the first transmission gate is in an off state under the control of the first control signal, the second transmission gate is in an on state under the control of the second control signal, and the first transmission gate is input The leakage adjustment signals of the two transmission gates can pass through the second transmission gate and adjust the voltage of the output end of the first transmission gate to reduce the leakage current generated when the first transmission gate is in the off state, and it is not necessary Limiting the size of the first transmission gate will not affect the driving capability of the first transmission gate and ensure that the first transmission gate has a larger driving capability.
并且,所述漏电调节信号可以根据所述第一传输门的的开启电压灵活配置,以调节所述第二传输门传输的钳位电压,可以实现对加工工艺波动较大的先进加工工艺得到的传输门性能波动免疫,即所述第二传输门的漏电调节功能能够适应传输门性能波动。In addition, the leakage adjustment signal can be flexibly configured according to the opening voltage of the first transmission gate to adjust the clamping voltage transmitted by the second transmission gate, which can achieve the results obtained by the advanced processing technology with large fluctuations in processing technology. Transmission gate performance fluctuation immunity is that the leakage adjustment function of the second transmission gate can adapt to transmission gate performance fluctuations.
一个可能的实施方式中,所述第二传输门的尺寸小于所述第一传输门的尺寸,所述第一传输门的尺寸根据所述传输门电路的驱动能力确定。In a possible implementation manner, a size of the second transmission gate is smaller than a size of the first transmission gate, and a size of the first transmission gate is determined according to a driving capability of the transmission gate circuit.
一个可能的实施方式中,所述传输门电路具体可以通过但不限于以下五种方式中的任意一种方式实现:In a possible implementation manner, the transmission gate circuit may be specifically implemented by, but not limited to, any one of the following five methods:
方式一、所述第一传输门为第一互补金属氧化物半导体CMOS传输门,所述第二传输门为第二CMOS传输门。其中,所述第一CMOS传输门的控制端包括第一控制端和第二控制端,所述第一控制端用于输入第一子控制信号,所述第二控制端用于输入第二子控制信号;所述第二CMOS传输门的控制端包括第三控制端和第四控制端,所述第三控制端用于输入第三子控制信号,所述第四控制端用于输入第四子控制信号;Manner 1: The first transmission gate is a first complementary metal oxide semiconductor CMOS transmission gate, and the second transmission gate is a second CMOS transmission gate. The control terminal of the first CMOS transmission gate includes a first control terminal and a second control terminal. The first control terminal is used to input a first sub-control signal, and the second control terminal is used to input a second sub-control signal. Control signal; the control end of the second CMOS transmission gate includes a third control end and a fourth control end, the third control end is used to input a third sub-control signal, and the fourth control end is used to input a fourth Sub control signal
所述第一控制信号包括所述第一子控制信号和所述第二子控制信号,所述第二控制信号包括所述第三子控制信号和所述第四子控制信号;所述第二子控制信号为所述第一子控制信号的反相信号,所述第三子控制信号为所述第一子控制信号的反相信号,所述第四子控制信号为所述第二子控制信号的反相信号。The first control signal includes the first sub-control signal and the second sub-control signal, and the second control signal includes the third sub-control signal and the fourth sub-control signal; the second The sub-control signal is an inverted signal of the first sub-control signal, the third sub-control signal is an inverted signal of the first sub-control signal, and the fourth sub-control signal is the second sub-control The inverted signal of the signal.
方式二、所述第一传输门为第一P沟道金属氧化物半导体PMOS传输门,所述第二传输门为第二PMOS传输门;所述第二控制信号为所述第一控制信号的反相信号。Manner 2: The first transmission gate is a first P-channel metal-oxide-semiconductor PMOS transmission gate, the second transmission gate is a second PMOS transmission gate, and the second control signal is a signal of the first control signal. Inverted signal.
方式三、所述第一传输门为第一N沟道金属氧化物半导体NMOS传输门,所述第二传输门为第二NMOS传输门;所述第二控制信号为所述第一控制信号的反相信号。Manner 3: The first transmission gate is a first N-channel metal oxide semiconductor NMOS transmission gate, the second transmission gate is a second NMOS transmission gate, and the second control signal is a signal of the first control signal. Inverted signal.
方式四、所述第一传输门为P沟道金属氧化物半导体PMOS传输门,所述第二传输门为N沟道金属氧化物半导体NMOS传输门;所述第二控制信号与所述第一控制信号相同。Manner 4: The first transmission gate is a P-channel metal-oxide-semiconductor PMOS transmission gate, and the second transmission gate is an N-channel metal-oxide-semiconductor NMOS transmission gate; the second control signal and the first The control signals are the same.
方式五、所述第一传输门为N沟道金属氧化物半导体NMOS传输门,所述第二传输门为P沟道金属氧化物半导体PMOS传输门;所述第二控制信号与所述第一控制信号相同。Manner 5: The first transmission gate is an N-channel metal oxide semiconductor NMOS transmission gate, and the second transmission gate is a P-channel metal oxide semiconductor PMOS transmission gate; the second control signal and the first The control signals are the same.
需要说明的是,当所述第一传输门或所述第二传输门为PMOS传输门时,所述第一传输门或所述第二传输门中可以包括一个或多个PMOS晶体管,当所述第一传输门或所述第二传输门为NMOS传输门时,所述第一传输门或所述第二传输门中可以包括一个或多个NMOS晶体管。It should be noted that when the first transmission gate or the second transmission gate is a PMOS transmission gate, the first transmission gate or the second transmission gate may include one or more PMOS transistors. When the first transmission gate or the second transmission gate is an NMOS transmission gate, the first transmission gate or the second transmission gate may include one or more NMOS transistors.
第二方面,本申请实施例还提供了一种矩阵开关,所述矩阵开关包括多个开关,所述多个开关分别为上述第一方面的中任意一个可能的实施方式所述的传输门电路;所述多个开关构成开关阵列,针对所述开关阵列中任意一个开关,该开关的输入端与该开关所在的行中每个开关的输入端连接,该开关所在的输出端与该开关所在的列中每个开关的输出端连接,该开关的控制端用于输入所述第一控制信号以及所述第二控制信号。In a second aspect, an embodiment of the present application further provides a matrix switch. The matrix switch includes multiple switches, and the multiple switches are transmission gate circuits according to any one of the possible implementation manners of the first aspect. The plurality of switches constitute a switch array, and for any one of the switches in the switch array, the input end of the switch is connected to the input end of each switch in the row where the switch is located, and the output end where the switch is located is connected to the switch where The output terminal of each switch in the column is connected, and the control terminal of the switch is used to input the first control signal and the second control signal.
第三方面,本申请实施例还提供了一种电子设备,所述电子设备包括上述第二方面的中任意一个可能的实施方式所述的矩阵开关以及控制器,其中,所述控制器用于生成所述第一控制信号以及所述第二控制信号。According to a third aspect, an embodiment of the present application further provides an electronic device, where the electronic device includes the matrix switch and the controller according to any one of the possible implementation manners of the second aspect, where the controller is configured to generate The first control signal and the second control signal.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为现有技术中的一种矩阵开关的结构示意图;FIG. 1 is a schematic structural diagram of a matrix switch in the prior art; FIG.
图2为NMOS晶体管的结构示意图;FIG. 2 is a schematic structural diagram of an NMOS transistor; FIG.
图3为本申请实施例提供的一种传输门电路的结构示意图;3 is a schematic structural diagram of a transmission gate circuit according to an embodiment of the present application;
图4为本申请实施例提供的一种传输门电路的具体结构示意图之一;4 is a schematic diagram of a specific structure of a transmission gate circuit according to an embodiment of the present application;
图5为本申请实施例提供的一种传输门电路的具体结构示意图之二;5 is a second schematic diagram of a specific structure of a transmission gate circuit according to an embodiment of the present application;
图6为本申请实施例提供的一种传输门电路的具体结构示意图之三;FIG. 6 is a third specific schematic structural diagram of a transmission gate circuit according to an embodiment of the present application; FIG.
图7为本申请实施例提供的一种传输门电路的具体结构示意图之四;FIG. 7 is a fourth specific structural schematic diagram of a transmission gate circuit according to an embodiment of the present application;
图8为本申请实施例提供的一种传输门电路的具体结构示意图之五;FIG. 8 is a fifth specific structural schematic diagram of a transmission gate circuit according to an embodiment of the present application; FIG.
图9为本申请实施例提供的一种矩阵开关的结构示意图;9 is a schematic structural diagram of a matrix switch according to an embodiment of the present application;
图10为本申请实施例提供的一种矩阵开关的具体结构示意图;FIG. 10 is a schematic diagram of a specific structure of a matrix switch according to an embodiment of the present application; FIG.
图11为本申请实施例提供的一种电子设备的结构示意图。FIG. 11 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
具体实施方式detailed description
传输门广泛地应用于各种集成电路,以实现开关、多路复用器以及逻辑功能器件等的功能,例如可编程逻辑器件。传输门可以由双极性晶体管(bipolar junction transistor,BJT)或金属氧化物半导体(metal-oxide semiconductor,MOS)晶体管等半导体器件构成,以单个N(negative)沟道MOS晶体管构成的NMOS传输门为例,其结构如图2所示。所述NMOS传输门包括掺杂浓度较低的P型半导体硅衬底,以及在P型半导体衬底上通过半导体光刻、扩散工艺形成的两个掺杂浓度较高的N区,其中,这两个N区上的电极分别为源极(source,S)和漏极(drain,D),源极和漏极之间P型半导体上的电极为栅极(gate,G)。Transmission gates are widely used in various integrated circuits to achieve the functions of switches, multiplexers, and logic functional devices, such as programmable logic devices. The transmission gate can be composed of semiconductor devices such as bipolar transistors (BJT) or metal-oxide semiconductor (MOS) transistors, and an NMOS transmission gate composed of a single N (negative) channel MOS transistor is Example, its structure is shown in Figure 2. The NMOS transmission gate includes a P-type semiconductor silicon substrate with a lower doping concentration, and two N-regions with a higher doping concentration formed on the P-type semiconductor substrate by a semiconductor photolithography and diffusion process. The electrodes on the two N regions are the source (source, S) and the drain (drain, D), and the electrode on the P-type semiconductor between the source and the drain is the gate (gate, G).
当所述NMOS传输门的栅极与源极之间施加正向电压V GS时,栅极和硅衬底之间的二氧化硅SiO2绝缘层中产生栅极指向P型硅衬底的电场,使得栅极附近的P型衬底中的空穴被排斥,剩下不能移动的受主离子(负离子),形成耗尽层,并将P型衬底中的电子(少子)吸引到衬底表面。V GS较小时,所述电场吸引电子的能力不强,漏极与源极之间无法形成导电沟道,随着V GS的增加,被吸引到P衬底表面层的电子增多,当V GS达到所述NMOS传输门的开启电压值V TH时,形成一个从漏极到源极的N型导电沟道,其导电类型与P衬底相反,故又称为反型层。导电沟道形成以后,NMOS传输门处于导通状态,在漏极与源极之间施加正向电压V DS,漏极和源极之间就会有电流产生。 When a forward voltage V GS is applied between the gate and the source of the NMOS transmission gate, an electric field is generated in the silicon dioxide SiO2 insulating layer between the gate and the silicon substrate and the gate points toward the P-type silicon substrate. The holes in the P-type substrate near the gate are repelled, leaving immovable acceptor ions (negative ions) to form a depletion layer, and the electrons (majority) in the P-type substrate are attracted to the substrate surface. . When V GS is small, the electric field is not capable of attracting electrons, and a conductive channel cannot be formed between the drain and the source. As V GS increases, more electrons are attracted to the surface layer of the P substrate. When V GS When the turn-on voltage value V TH of the NMOS transmission gate is reached, an N-type conductive channel is formed from the drain to the source, and its conductivity type is opposite to that of the P substrate, so it is also called an inversion layer. After the conductive channel is formed, the NMOS transmission gate is in a conducting state, and a forward voltage V DS is applied between the drain and the source, and a current is generated between the drain and the source.
理想情况下,当V GS<V TH时,所述NMOS传输门处于关断状态,漏极和源极之间没有电流流过,但是所述NMOS传输门的漏极与衬底之间、源极与衬底之间是两个PN结,即使所述NMOS传输门中没有导电沟道,漏极与源极之间还是有反向的饱和电流,这就是所谓的漏电流。 Ideally, when V GS <V TH , the NMOS transmission gate is in an off state, and no current flows between the drain and the source, but between the drain and the substrate of the NMOS transmission gate, the source There are two PN junctions between the electrode and the substrate. Even if there is no conductive channel in the NMOS transmission gate, there is still a reverse saturation current between the drain and the source, which is the so-called leakage current.
漏电流不仅会增加传输门的功耗,还会影响传输门所在通路连接的其它通路的信号。传统的传输门设计通过减小传输门的尺寸,减小传输门关断时的漏电流。但是,传输门的尺寸越小,传输门处于导通状态时的驱动能力也越小。The leakage current will not only increase the power consumption of the transmission gate, but also affect the signals of other paths connected to the path where the transmission gate is located. The traditional transmission gate design reduces the leakage current when the transmission gate is turned off by reducing the size of the transmission gate. However, the smaller the size of the transmission gate, the smaller the driving capability of the transmission gate when it is in the on state.
为了解决上述问题,本申请提出了一种传输门电路、矩阵开关以及电子设备,以在不降低传输门的驱动能力的同时,尽量减小传输门关断时的漏电流。In order to solve the above problems, the present application proposes a transmission gate circuit, a matrix switch, and an electronic device, so as to reduce the leakage current of the transmission gate when it is turned off without reducing the driving capability of the transmission gate.
另外,需要理解的是,在本申请的描述中,“多个”指两个或两个以上;“第一”、“第二”等词汇,仅用于区分描述的目的,而不能理解为指示或暗示相对重要性,也不能理解为指示或暗示顺序。In addition, it should be understood that in the description of the present application, "multiple" means two or more; words such as "first" and "second" are used only for the purpose of distinguishing descriptions, and cannot be understood as The relative importance of indication or implication cannot be understood as the order of indication or implication.
为了使本申请的目的、技术方案和优点更加清楚,下面将结合附图对本申请作进一步地详细描述。In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings.
本申请提供了一种传输门电路,通过增加用于调节漏电流的传输门,调节用于控制输入信号与负载电路之间的通路的导通或者关断的传输门关断时的漏电流。如图3所示,所述传输门电路300包括:第一传输门310以及第二传输门320,其中,所述第一传输门310的输入端用于传输负载电路的输入信号或输出信号,所述负载电路与所述第一传输门310的输出端连接,所述第一传输门310的控制端用于输入第一控制信号,所述第一传输门310的输出端还与所述第二传输门320的输出端连接;所述第二传输门320的输入端用于输入漏电调节信号,所述第二传输门320的控制端用于输入第二控制信号。The present application provides a transmission gate circuit that adjusts the leakage current when the transmission gate is turned off by adding a transmission gate for adjusting the leakage current to control the on or off of the path between the input signal and the load circuit. As shown in FIG. 3, the transmission gate circuit 300 includes a first transmission gate 310 and a second transmission gate 320, wherein an input terminal of the first transmission gate 310 is used to transmit an input signal or an output signal of a load circuit, The load circuit is connected to an output terminal of the first transmission gate 310, a control terminal of the first transmission gate 310 is used to input a first control signal, and an output terminal of the first transmission gate 310 is also connected to the first transmission gate 310. The output ends of the two transmission gates 320 are connected; the input end of the second transmission gate 320 is used to input a leakage adjustment signal, and the control end of the second transmission gate 320 is used to input a second control signal.
当所述第一传输门310在所述第一控制信号的控制下处于导通状态时,所述第二传输门320在所述第二控制信号的控制下处于关断状态,当所述第一传输门310在所述第一控制信号的控制下处于关断状态时,所述第二传输门320在所述第二控制信号的控制下处于导通状态;所述漏电调节信号用于在所述第一传输门310处于关断状态,且所述第二传输门320处于导通状态时,减小所述第一传输门310的漏电流。When the first transmission gate 310 is in an on state under the control of the first control signal, the second transmission gate 320 is in an off state under the control of the second control signal. When a transmission gate 310 is in an off state under the control of the first control signal, the second transmission gate 320 is in an on state under the control of the second control signal; the leakage adjustment signal is used for When the first transmission gate 310 is in the off state and the second transmission gate 320 is in the on state, the leakage current of the first transmission gate 310 is reduced.
其中,所述漏电调节信号可以根据所述第一传输门310的开启电压灵活配置,使得所述第二传输门320在所述第一传输门310关断时,改变所述第一传输门310的输出端的电压,进而达到减小所述第一传输门310关断时的漏电流。The leakage adjustment signal can be flexibly configured according to an opening voltage of the first transmission gate 310, so that the second transmission gate 320 changes the first transmission gate 310 when the first transmission gate 310 is turned off. The voltage at the output terminal of the MOSFET is further reduced to reduce the leakage current when the first transmission gate 310 is turned off.
由于所述输入信号是通过所述第一传输门310传输到所述负载电路,而不是通过所述第二传输门320传输到所述负载电路,因此,所述传输门电路300的驱动能力主要取决与所述第一传输门310的驱动能力。而传输门的驱动能力由传输门的尺寸决定,传输门的尺寸越大,传输门的驱动能力越大,也就是说,所述第一传输门310的尺寸根据所述第一传输门310的驱动能力确定,所述第二传输门320的尺寸可以小于所述第一传输门310的尺寸,进而可以减小所述传输门电路300的尺寸。Since the input signal is transmitted to the load circuit through the first transmission gate 310, rather than to the load circuit through the second transmission gate 320, the driving capability of the transmission gate circuit 300 is mainly It depends on the driving capability of the first transmission gate 310. The driving capability of the transmission gate is determined by the size of the transmission gate. The larger the size of the transmission gate, the greater the driving capability of the transmission gate. That is, the size of the first transmission gate 310 is determined by the size of the first transmission gate 310. The driving capability is determined. The size of the second transmission gate 320 may be smaller than the size of the first transmission gate 310, and the size of the transmission gate circuit 300 may be reduced.
其中,传输门的尺寸通常用传输门的导电沟道的宽度W以及传输门的控制端的长度L(例如,当传输门为PMOS晶体管时,L为PMOS晶体管栅极的长度)表征,可以用
Figure PCTCN2018106770-appb-000001
表示。即所述第一传输门310的尺寸可以用所述第一传输门310的导电沟道的宽度W 1与所述第一传输门310的控制端的长度L 1的比值
Figure PCTCN2018106770-appb-000002
表示,所述第二传输门320的尺寸可以用所述第二传输门320的导电沟道的宽度W 2与所述第二传输门320的控制端的长度L 2的比值
Figure PCTCN2018106770-appb-000003
表示。
Among them, the size of the transmission gate is generally characterized by the width W of the conductive channel of the transmission gate and the length L of the control end of the transmission gate (for example, when the transmission gate is a PMOS transistor, L is the length of the gate of the PMOS transistor), which can be expressed as
Figure PCTCN2018106770-appb-000001
Means. That is, the size of the first transmission gate 310 may be the ratio of the width W 1 of the conductive channel of the first transmission gate 310 to the length L 1 of the control end of the first transmission gate 310.
Figure PCTCN2018106770-appb-000002
It is indicated that the size of the second transmission gate 320 may be the ratio of the width W 2 of the conductive channel of the second transmission gate 320 to the length L 2 of the control end of the second transmission gate 320.
Figure PCTCN2018106770-appb-000003
Means.
实施中,传输门可以通过MOS晶体管实现,包括PMOS传输门、NMOS传输门以及互补金属氧化物半导体(complementary metal oxide semiconductor,CMOS)传输门。此时,所述传输门电路300具体可以通过以下五种方式中的任意一种方式实现:In implementation, the transmission gates can be realized by MOS transistors, including PMOS transmission gates, NMOS transmission gates, and complementary metal oxide semiconductor (CMOS) transmission gates. At this time, the transmission gate circuit 300 may be specifically implemented in any one of the following five ways:
方式A、所述第一传输门310为第一CMOS传输门,所述第二传输门320为第二CMOS传输门,如图4所示。其中,所述第一CMOS传输门的控制端包括第一控制端和第二控制端,所述第一控制端用于输入第一子控制信号,所述第二控制端用于输入第二子控制信号; 所述第二CMOS传输门的控制端包括第三控制端和第四控制端,所述第三控制端用于输入第三子控制信号,所述第四控制端用于输入第四子控制信号;所述第一控制信号包括所述第一子控制信号和所述第二子控制信号,所述第二控制信号包括所述第三子控制信号和所述第四子控制信号。Method A. The first transmission gate 310 is a first CMOS transmission gate, and the second transmission gate 320 is a second CMOS transmission gate, as shown in FIG. 4. The control terminal of the first CMOS transmission gate includes a first control terminal and a second control terminal. The first control terminal is used to input a first sub-control signal, and the second control terminal is used to input a second sub-control signal. Control signal; the control end of the second CMOS transmission gate includes a third control end and a fourth control end, the third control end is used to input a third sub-control signal, and the fourth control end is used to input a fourth A sub-control signal; the first control signal includes the first sub-control signal and the second sub-control signal, and the second control signal includes the third sub-control signal and the fourth sub-control signal.
所述第二子控制信号为所述第一子控制信号的反相信号,所述第三子控制信号为所述第一子控制信号的反相信号,所述第四子控制信号为所述第二子控制信号的反相信号,以使所述第一CMOS传输门在所述第一子控制信号以及所述第二子控制信号的控制下处于导通状态时,所述第二CMOS传输门在所述第三子控制信号以及所述第四子控制信号的控制下处于关断状态,所述第一CMOS传输门在所述第一子控制信号以及所述第二子控制信号的控制下处于关断状态时,所述第二CMOS传输门在所述第三子控制信号以及所述第四子控制信号的控制下处于导通状态。The second sub-control signal is an inverted signal of the first sub-control signal, the third sub-control signal is an inverted signal of the first sub-control signal, and the fourth sub-control signal is the An inverted signal of a second sub-control signal, so that when the first CMOS transmission gate is in a conducting state under the control of the first sub-control signal and the second sub-control signal, the second CMOS transmission gate The gate is in an off state under the control of the third sub-control signal and the fourth sub-control signal. The first CMOS transmission gate is controlled by the first sub-control signal and the second sub-control signal. When it is in the off state, the second CMOS transmission gate is in the on state under the control of the third sub-control signal and the fourth sub-control signal.
当所述第一CMOS传输门310以及所述第二CMOS传输门320均由一个PMOS晶体管和一个NMOS晶体管构成时,所述第一控制端为所述第一CMOS传输门310中的PMOS晶体管的栅极,所述第二控制端为所述第一CMOS传输门310中的NMOS晶体管的栅极,所述第三控制端为所述第二CMOS传输门320中的PMOS晶体管的栅极,所述第四控制端为所述第二CMOS传输门320中的NMOS晶体管的栅极。When the first CMOS transmission gate 310 and the second CMOS transmission gate 320 are each composed of a PMOS transistor and an NMOS transistor, the first control terminal is a PMOS transistor in the first CMOS transmission gate 310. Gate, the second control terminal is the gate of the NMOS transistor in the first CMOS transmission gate 310, and the third control terminal is the gate of the PMOS transistor in the second CMOS transmission gate 320, so The fourth control terminal is a gate of an NMOS transistor in the second CMOS transmission gate 320.
由于MOS晶体管的结构是对称的,所述第一CMOS传输门310的输入端可以是所述第一CMOS传输门310中的PMOS晶体管以及NMOS晶体管的源极,也可以是所述第一CMOS传输门310中的PMOS晶体管以及NMOS晶体管的漏极。当所述第一CMOS传输门310的输入端为所述第一CMOS传输门310中的PMOS晶体管以及NMOS晶体管的漏极时,所述第一CMOS传输门310的输出端为所述第一CMOS传输门310中的PMOS晶体管以及NMOS晶体管的源极,当所述第一CMOS传输门310的输入端为所述第一CMOS传输门中的PMOS晶体管以及NMOS晶体管的源极时,所述第一CMOS传输门310的输出端为所述第一CMOS传输门310中的PMOS晶体管以及NMOS晶体管的漏极。Since the structure of the MOS transistor is symmetrical, the input terminal of the first CMOS transmission gate 310 may be the source of the PMOS transistor and the NMOS transistor in the first CMOS transmission gate 310, or the first CMOS transmission. PMOS transistor in gate 310 and drain of NMOS transistor. When an input terminal of the first CMOS transmission gate 310 is a drain of a PMOS transistor and an NMOS transistor in the first CMOS transmission gate 310, an output terminal of the first CMOS transmission gate 310 is the first CMOS The source of the PMOS transistor and the NMOS transistor in the transmission gate 310. When the input terminal of the first CMOS transmission gate 310 is the source of the PMOS transistor and the NMOS transistor in the first CMOS transmission gate, the first An output terminal of the CMOS transmission gate 310 is a drain of a PMOS transistor and an NMOS transistor in the first CMOS transmission gate 310.
方式B、所述第一传输门310为第一PMOS传输门,所述第二传输门320为第二PMOS传输门,如图5所示,其中,所述第二控制信号为所述第一控制信号的反相信号,以使所述第一PMOS传输门在所述第一控制信号的控制下处于导通状态时,所述第二PMOS传输门在所述第二控制信号的控制下处于关断状态,所述第一PMOS传输门在所述第一控制信号的控制下处于关断状态时,所述第二PMOS传输门在所述第二控制信号的控制下处于导通状态。Method B. The first transmission gate 310 is a first PMOS transmission gate, and the second transmission gate 320 is a second PMOS transmission gate, as shown in FIG. 5, wherein the second control signal is the first transmission gate. An inverted signal of a control signal, so that when the first PMOS transmission gate is in an on state under the control of the first control signal, the second PMOS transmission gate is in a state under the control of the second control signal When the first PMOS transmission gate is in the off state under the control of the first control signal, the second PMOS transmission gate is in the on state under the control of the second control signal.
需要说明的是,所述第一PMOS传输门中可以包括一个或多个PMOS晶体管,所述第二PMOS传输门中可以包括一个或多个PMOS晶体管,图5中仅以所述第一PMOS传输门中包括一个PMOS晶体管,所述第二PMOS传输门中包括一个PMOS晶体管为例,并不对本申请实施例构成限定。It should be noted that the first PMOS transmission gate may include one or more PMOS transistors, and the second PMOS transmission gate may include one or more PMOS transistors. In FIG. 5, only the first PMOS transmission is used. The gate includes a PMOS transistor, and the second PMOS transmission gate includes a PMOS transistor as an example, which does not limit the embodiment of the present application.
当所述第一PMOS传输门中包括一个PMOS晶体管时,所述第一PMOS传输门的控制端为该PMOS晶体管的栅极,所述第一PMOS传输门的输入端为该PMOS晶体管的漏极,所述第一PMOS传输门的输出端为该PMOS晶体管的栅极,或者,所述第一PMOS传输门的控制端为该PMOS晶体管的栅极,所述第一PMOS传输门的输入端为该PMOS晶体管的栅极,所述第一PMOS传输门的输出端为该PMOS晶体管的漏极。当所述第二PMOS传输门中包括一个PMOS晶体管时,所述第二PMOS传输门的输入端、控制端以及 输出端与所述第一PMOS传输门类似,参见上述关于所述第一PMOS晶体管的相关描述,此处不再赘述。When the first PMOS transmission gate includes a PMOS transistor, a control terminal of the first PMOS transmission gate is a gate of the PMOS transistor, and an input terminal of the first PMOS transmission gate is a drain of the PMOS transistor. An output terminal of the first PMOS transmission gate is a gate of the PMOS transistor, or a control terminal of the first PMOS transmission gate is a gate of the PMOS transistor, and an input terminal of the first PMOS transmission gate is The gate of the PMOS transistor, and the output of the first PMOS transmission gate is the drain of the PMOS transistor. When the second PMOS transmission gate includes a PMOS transistor, the input terminal, the control terminal, and the output terminal of the second PMOS transmission gate are similar to the first PMOS transmission gate. See above for the first PMOS transistor. The related description is not repeated here.
方式C、所述第一传输门310为第一NMOS传输门,所述第二传输门320为第二NMOS传输门,如图6所示,其中,所述第二控制信号为所述第一控制信号的反相信号,以使所述第一NMOS传输门在所述第一控制信号的控制下处于导通状态时,所述第二NMOS传输门在所述第二控制信号的控制下处于关断状态,所述第一NMOS传输门在所述第一控制信号的控制下处于关断状态时,所述第二NMOS传输门在所述第二控制信号的控制下处于导通状态。Method C. The first transmission gate 310 is a first NMOS transmission gate, and the second transmission gate 320 is a second NMOS transmission gate, as shown in FIG. 6, wherein the second control signal is the first An inverted signal of a control signal, so that when the first NMOS transmission gate is in an on state under the control of the first control signal, the second NMOS transmission gate is in a state under the control of the second control signal When the first NMOS transmission gate is in the off state under the control of the first control signal, the second NMOS transmission gate is in the on state under the control of the second control signal.
其中,所述第一NMOS传输门中可以包括一个或多个NMOS晶体管,所述第二NMOS传输门中可以包括一个或多个NMOS晶体管,图5中仅以所述第一NMOS传输门中包括一个NMOS晶体管,所述第二NMOS传输门中包括一个NMOS晶体管为例,并不对本申请实施例构成限定。The first NMOS transmission gate may include one or more NMOS transistors, and the second NMOS transmission gate may include one or more NMOS transistors. In FIG. 5, only the first NMOS transmission gate is included. An NMOS transistor, and the second NMOS transmission gate includes an NMOS transistor as an example, which does not limit the embodiment of the present application.
所述第一NMOS传输门中包括一个NMOS晶体管时,所述第一NMOS传输门的控制端为该NMOS晶体管的栅极,所述第一NMOS传输门的输入端为该NMOS晶体管的漏极,所述第一NMOS传输门的输出端为该NMOS晶体管的栅极,或者,所述第一NMOS传输门的控制端为该NMOS晶体管的栅极,所述第一NMOS传输门的输入端为该NMOS晶体管的栅极,所述第一NMOS传输门的输出端为该NMOS晶体管的漏极。当所述第二NMOS传输门中包括一个NMOS晶体管时,所述第二NMOS传输门的输入端、控制端以及输出端与所述第一NMOS传输门类似,参见上述关于所述第一NMOS晶体管的相关描述,此处不再赘述。When the first NMOS transmission gate includes an NMOS transistor, a control terminal of the first NMOS transmission gate is a gate of the NMOS transistor, and an input terminal of the first NMOS transmission gate is a drain of the NMOS transistor. The output terminal of the first NMOS transmission gate is the gate of the NMOS transistor, or the control terminal of the first NMOS transmission gate is the gate of the NMOS transistor, and the input terminal of the first NMOS transmission gate is the The gate of the NMOS transistor, and the output of the first NMOS transmission gate is the drain of the NMOS transistor. When the second NMOS transmission gate includes an NMOS transistor, the input terminal, the control terminal, and the output terminal of the second NMOS transmission gate are similar to the first NMOS transmission gate. See above for the first NMOS transistor. The related description is not repeated here.
方式D、所述第一传输门310为PMOS传输门,所述第二传输门320为NMOS传输门,如图7所示,其中,所述第二控制信号与所述第一控制信号相同,以使所述PMOS传输门在所述第一控制信号的控制下处于导通状态时,所述NMOS传输门在所述第二控制信号的控制下处于关断状态,所述PMOS传输门在所述第一控制信号的控制下处于关断状态时,所述NMOS传输门在所述第二控制信号的控制下处于导通状态。Method D. The first transmission gate 310 is a PMOS transmission gate, and the second transmission gate 320 is an NMOS transmission gate. As shown in FIG. 7, the second control signal is the same as the first control signal. When the PMOS transmission gate is in the on state under the control of the first control signal, the NMOS transmission gate is in the off state under the control of the second control signal, and the PMOS transmission gate is in all states. When the first control signal is in the off state, the NMOS transmission gate is in the on state under the control of the second control signal.
方式E、所述第一传输门310为NMOS传输门,所述第二传输门320为PMOS传输门,如图8所示,其中,所述第二控制信号与所述第一控制信号相同,以使所述NMOS传输门在所述第一控制信号的控制下处于导通状态时,所述PMOS传输门在所述第二控制信号的控制下处于关断状态,所述NMOS传输门在所述第一控制信号的控制下处于关断状态时,所述PMOS传输门在所述第二控制信号的控制下处于导通状态。Method E. The first transmission gate 310 is an NMOS transmission gate, and the second transmission gate 320 is a PMOS transmission gate, as shown in FIG. 8, wherein the second control signal is the same as the first control signal. When the NMOS transmission gate is in an on state under the control of the first control signal, the PMOS transmission gate is in an off state under the control of the second control signal, and the NMOS transmission gate is in When the first control signal is in the off state, the PMOS transmission gate is in the on state under the control of the second control signal.
应当理解的是,所述PMOS传输门中可以包括一个或多个PMOS晶体管,所述NMOS传输门中可以包括一个或多个NMOS晶体管,图7和图8中仅以所述PMOS传输门中包括一个PMOS晶体管,所述NMOS传输门中包括一个NMOS晶体管为例,并不对本申请实施例构成限定。It should be understood that the PMOS transmission gate may include one or more PMOS transistors, and the NMOS transmission gate may include one or more NMOS transistors. In FIG. 7 and FIG. 8, only the PMOS transmission gate is included. A PMOS transistor, and the NMOS transmission gate includes an NMOS transistor as an example, which does not limit the embodiment of the present application.
具体地,当所述PMOS传输门中包括一个PMOS晶体管时,所述PMOS传输门的控制端为该PMOS晶体管的栅极,所述PMOS传输门的输入端为该PMOS晶体管的漏极,所述PMOS传输门的输出端为该PMOS晶体管的栅极,或者,所述PMOS传输门的控制端为该PMOS晶体管的栅极,所述PMOS传输门的输入端为该PMOS晶体管的栅极,所述PMOS传输门的输出端为该PMOS晶体管的漏极。当所述NMOS传输门中包括一个NMOS晶体管时,所述NMOS传输门的控制端为该NMOS晶体管的栅极,所述NMOS传 输门的输入端为该NMOS晶体管的漏极,所述第一NMOS传输门的输出端为该NMOS晶体管的栅极,或者,所述NMOS传输门的控制端为该NMOS晶体管的栅极,所述NMOS传输门的输入端为该NMOS晶体管的栅极,所述NMOS传输门的输出端为该NMOS晶体管的漏极。Specifically, when the PMOS transmission gate includes a PMOS transistor, the control end of the PMOS transmission gate is the gate of the PMOS transistor, and the input end of the PMOS transmission gate is the drain of the PMOS transistor. The output terminal of the PMOS transmission gate is the gate of the PMOS transistor, or the control terminal of the PMOS transmission gate is the gate of the PMOS transistor, and the input terminal of the PMOS transmission gate is the gate of the PMOS transistor. The output of the PMOS transmission gate is the drain of the PMOS transistor. When the NMOS transmission gate includes an NMOS transistor, a control terminal of the NMOS transmission gate is a gate of the NMOS transistor, an input terminal of the NMOS transmission gate is a drain of the NMOS transistor, and the first NMOS The output end of the transmission gate is the gate of the NMOS transistor, or the control end of the NMOS transmission gate is the gate of the NMOS transistor, the input end of the NMOS transmission gate is the gate of the NMOS transistor, and the NMOS The output of the transmission gate is the drain of the NMOS transistor.
需要说明的是,所述第一传输门310以及所述第二传输门320也可以通过双极性晶体管(即三极管)实现,其中,双极性晶体管的发射极(emitter,E)、基极(base,B)和集电极(collector,C)分别对应MOS晶体管的源极、栅极和漏极,它们的作用相似,集电极通常作为输入端,发射极通常作为输出端。当所述第一传输门310以及所述第二传输门320通过双极性晶体管实现时,所述传输门电路300的具体实现方式与上述方式A至方式E类似,此处不再赘述。It should be noted that the first transmission gate 310 and the second transmission gate 320 may also be implemented by a bipolar transistor (ie, a triode), where the emitter (E) and the base of the bipolar transistor The (base, B) and the collector (C) correspond to the source, gate, and drain of the MOS transistor, respectively. Their functions are similar. The collector is usually used as the input, and the emitter is usually used as the output. When the first transmission gate 310 and the second transmission gate 320 are implemented by a bipolar transistor, the specific implementation manner of the transmission gate circuit 300 is similar to the foregoing manners A to E, and is not repeated here.
通过上述方案,当所述传输门电路300中的第一传输门310在第一控制信号的控制下处于导通状态时,所述传输门电路300中所述第二传输门320在第二控制信号的控制下处于关断状态,输入所述第一传输门310的输入信号传输到所述第一传输门310的后级负载电路,即所述第二传输门320对所述第一传输门310所在的通路的负载电路没有影响;当所述第一传输门310在所述第一控制信号的控制下处于关断状态时,所述第二传输门320在所述第二控制信号的控制下处于导通状态,输入所述第二传输门320的漏电调节信号能够通过所述第二传输门320,并调整所述第一传输门310的输出端的电压,减小所述第一传输门310处于关断状态时产生的漏电流,不需要限制所述第一传输门310的尺寸,进而不会影响所述第一传输门310的驱动能力,保证所述第一传输门310具有较大的驱动能力。According to the above solution, when the first transmission gate 310 in the transmission gate circuit 300 is in an on state under the control of the first control signal, the second transmission gate 320 in the transmission gate circuit 300 is in the second control It is in the off state under the control of the signal, and the input signal input to the first transmission gate 310 is transmitted to the subsequent-stage load circuit of the first transmission gate 310, that is, the second transmission gate 320 controls the first transmission gate. The load circuit of the path where 310 is located has no effect; when the first transmission gate 310 is in the off state under the control of the first control signal, the second transmission gate 320 is under the control of the second control signal It is in a conducting state, and the leakage adjustment signal input to the second transmission gate 320 can pass through the second transmission gate 320 and adjust the voltage at the output terminal of the first transmission gate 310 to reduce the first transmission gate. The leakage current generated when the 310 is in the off state does not need to limit the size of the first transmission gate 310, and thus does not affect the driving ability of the first transmission gate 310, ensuring that the first transmission gate 310 has a large Driving capacity.
并且,所述漏电调节信号可以根据所述第一传输门310的的开启电压灵活配置,以调节所述第二传输门320传输的钳位电压,可以实现对加工工艺波动较大的先进加工工艺得到的传输门性能波动免疫,即所述第二传输门320的漏电调节功能能够适应传输门性能波动。In addition, the leakage adjustment signal can be flexibly configured according to the opening voltage of the first transmission gate 310 to adjust the clamping voltage transmitted by the second transmission gate 320, which can realize an advanced processing process with large fluctuations in processing technology The obtained transmission gate performance fluctuation immunity is that the leakage adjustment function of the second transmission gate 320 can adapt to the transmission gate performance fluctuation.
基于以上实施例,本申请还提供了一种矩阵开关,如图9所示,所述矩阵开关900包括多个开关,所述多个开关为上述任意一种可能的实施方式中所述的传输门电路300。所述多个开关构成开关阵列,针对所述开关阵列中任意一个开关,该开关的输入端与该开关所在的行中每个开关的输入端连接,该开关所在的输出端与该开关所在的列中每个开关的输出端连接,该开关的控制端用于输入所述第一控制信号以及所述第二控制信号。Based on the above embodiment, this application further provides a matrix switch. As shown in FIG. 9, the matrix switch 900 includes multiple switches, and the multiple switches are transmissions described in any one of the foregoing possible implementation manners. Gate circuit 300. The plurality of switches constitute a switch array. For any one of the switches in the switch array, the input terminal of the switch is connected to the input terminal of each switch in the row where the switch is located, and the output terminal of the switch is connected to the switch. An output terminal of each switch in the column is connected, and a control terminal of the switch is used to input the first control signal and the second control signal.
其中,每个所述开关的控制信号(包括所述第一控制信号和所述第二控制信号)以及漏电流调节信号,可以由同一个电路(或装置)生成,也可以由不同的电路(或装置)生成。The control signal (including the first control signal and the second control signal) and the leakage current adjustment signal of each of the switches may be generated by the same circuit (or device), or may be generated by different circuits ( Or device).
例如,当所述矩阵开关900为n×1的开关阵列时,其具体结构如图10所示。需要说明的是,此处仅为举例说明,并不对本申请实施例构成限定,所述矩阵开关900还可以为n×m的开关阵列,其中,n、m为正整数。For example, when the matrix switch 900 is an n × 1 switch array, its specific structure is shown in FIG. 10. It should be noted that this is only an example and does not limit the embodiments of the present application. The matrix switch 900 may also be an n × m switch array, where n and m are positive integers.
通过上述方案,所述矩阵开关900中的每个开关通过所述传输门电路300实现,可以在保证所述矩阵开关900具有较大的驱动能力的同时,有效减小所述矩阵开关900的总漏电流。Through the above solution, each switch in the matrix switch 900 is implemented by the transmission gate circuit 300, which can effectively reduce the total of the matrix switch 900 while ensuring that the matrix switch 900 has a large driving capability. Leakage current.
基于以上实施例,本申请还提供了一种电子设备,如图11所示,所述电子设备1100包括上述任意一种可能的实施方式中所述的矩阵开关900以及控制器1110,其中,所述控制器1110用于产生所述第一控制信号以及所述第二控制信号。Based on the above embodiments, this application further provides an electronic device. As shown in FIG. 11, the electronic device 1100 includes the matrix switch 900 and the controller 1110 described in any one of the foregoing possible implementation manners. The controller 1110 is configured to generate the first control signal and the second control signal.
需要说明的是,本申请实施例并不对所述漏电调节信号的生成方式进行限定,所述漏电调节信号可以由外部的信号发生装置产生,或者由所述电子设备1110中的信号发生电路产生,或者由所述控制器1110产生。It should be noted that the embodiment of the present application does not limit the manner of generating the leakage adjustment signal. The leakage adjustment signal may be generated by an external signal generating device or a signal generating circuit in the electronic device 1110. Or generated by the controller 1110.
通过上述方案,所述电子设备1100中的矩阵开关900具有较大的驱动能力,且所述矩阵开关900的总漏电流较小,使得所述矩阵开关900中某一个开关选通时,所述矩阵开关中其它处于关断状态的开关产生的漏电流对该开关所在通路上的信号影响较小。例如,对于应用于多路选通测量场景的电子设备1110,所述电子设备1110在对所述矩阵开关900中某一个开关连接的负载电路进行测量时,由于所述矩阵开关900中其它处于关断状态的开关产生的漏电流对该开关所在通路上的信号影响较小,因此可以有效提高所述电子设备的测量精度。Through the above solution, the matrix switch 900 in the electronic device 1100 has a large driving capability, and the total leakage current of the matrix switch 900 is small, so that when one of the switches in the matrix switch 900 is gated, the The leakage current generated by other switches in the off state of the matrix switch has less influence on the signal on the path where the switch is located. For example, for an electronic device 1110 applied to a multi-channel gating measurement scenario, when the electronic device 1110 measures a load circuit connected to one of the switches of the matrix switch 900, the other switches in the matrix switch 900 are in the off state. The leakage current generated by the switch in the off state has less influence on the signal on the path where the switch is located, so the measurement accuracy of the electronic device can be effectively improved.
显然,本领域的技术人员可以对本申请实施例进行各种改动和变型而不脱离本申请实施例的精神和范围。这样,倘若本申请实施例的这些修改和变型属于本申请权利要求及其等同技术的范围之内,则本申请也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various modifications and variations to the embodiments of the present application without departing from the spirit and scope of the embodiments of the present application. In this way, if these modifications and variations of the embodiments of the present application fall within the scope of the claims of the present application and their equivalent technologies, the present application also intends to include these changes and variations.

Claims (9)

  1. 一种传输门电路,其特征在于,包括:第一传输门以及第二传输门;A transmission gate circuit, comprising: a first transmission gate and a second transmission gate;
    其中,所述第一传输门的输入端用于传输负载电路的输入信号或输出信号,所述负载电路与所述第一传输门的输出端连接,所述第一传输门的控制端用于输入第一控制信号,所述第一传输门的输出端还与所述第二传输门的输出端连接;所述第二传输门的输入端用于输入漏电调节信号,所述第二传输门的控制端用于输入第二控制信号;The input end of the first transmission gate is used to transmit an input signal or an output signal of a load circuit, the load circuit is connected to the output end of the first transmission gate, and the control end of the first transmission gate is used to A first control signal is input, and an output end of the first transmission gate is also connected to an output end of the second transmission gate; an input end of the second transmission gate is used to input a leakage adjustment signal, and the second transmission gate A control terminal for inputting a second control signal;
    当所述第一传输门在所述第一控制信号的控制下处于导通状态时,所述第二传输门在所述第二控制信号的控制下处于关断状态,当所述第一传输门在所述第一控制信号的控制下处于关断状态时,所述第二传输门在所述第二控制信号的控制下处于导通状态;When the first transmission gate is in an on state under the control of the first control signal, the second transmission gate is in an off state under the control of the second control signal. When the gate is in an off state under the control of the first control signal, the second transmission gate is in an on state under the control of the second control signal;
    所述漏电调节信号用于在所述第一传输门处于关断状态,且所述第二传输门处于导通状态时,减小所述第一传输门的漏电流。The leakage adjustment signal is used to reduce a leakage current of the first transmission gate when the first transmission gate is in an off state and the second transmission gate is in an on state.
  2. 如权利要求1所述的传输门电路,其特征在于,所述第二传输门的尺寸小于所述第一传输门的尺寸。The transmission gate circuit according to claim 1, wherein a size of the second transmission gate is smaller than a size of the first transmission gate.
  3. 如权利要求1或2所述的传输门电路,其特征在于,所述第一传输门为第一互补金属氧化物半导体CMOS传输门,所述第二传输门为第二CMOS传输门;The transmission gate circuit according to claim 1 or 2, wherein the first transmission gate is a first complementary metal oxide semiconductor CMOS transmission gate, and the second transmission gate is a second CMOS transmission gate;
    所述第一CMOS传输门的控制端包括第一控制端和第二控制端,所述第一控制端用于输入第一子控制信号,所述第二控制端用于输入第二子控制信号;所述第二CMOS传输门的控制端包括第三控制端和第四控制端,所述第三控制端用于输入第三子控制信号,所述第四控制端用于输入第四子控制信号;The control terminal of the first CMOS transmission gate includes a first control terminal and a second control terminal. The first control terminal is used to input a first sub-control signal, and the second control terminal is used to input a second sub-control signal. The control end of the second CMOS transmission gate includes a third control end and a fourth control end, the third control end is used to input a third sub-control signal, and the fourth control end is used to input a fourth sub-control signal;
    所述第一控制信号包括所述第一子控制信号和所述第二子控制信号,所述第二控制信号包括所述第三子控制信号和所述第四子控制信号;所述第二子控制信号为所述第一子控制信号的反相信号,所述第三子控制信号为所述第一子控制信号的反相信号,所述第四子控制信号为所述第二子控制信号的反相信号。The first control signal includes the first sub-control signal and the second sub-control signal, and the second control signal includes the third sub-control signal and the fourth sub-control signal; the second The sub-control signal is an inverted signal of the first sub-control signal, the third sub-control signal is an inverted signal of the first sub-control signal, and the fourth sub-control signal is the second sub-control The inverted signal of the signal.
  4. 如权利要求1或2所述的传输门电路,其特征在于,所述第一传输门为第一P沟道金属氧化物半导体PMOS传输门,所述第二传输门为第二PMOS传输门;所述第二控制信号为所述第一控制信号的反相信号。The transmission gate circuit according to claim 1 or 2, wherein the first transmission gate is a first P-channel metal oxide semiconductor PMOS transmission gate, and the second transmission gate is a second PMOS transmission gate; The second control signal is an inverted signal of the first control signal.
  5. 如权利要求1所述的传输门电路,其特征在于,所述第一传输门为第一N沟道金属氧化物半导体NMOS传输门,所述第二传输门为第二NMOS传输门;所述第二控制信号为所述第一控制信号的反相信号。The transmission gate circuit according to claim 1, wherein the first transmission gate is a first N-channel metal oxide semiconductor NMOS transmission gate, and the second transmission gate is a second NMOS transmission gate; The second control signal is an inverted signal of the first control signal.
  6. 如权利要求1或2所述的传输门电路,其特征在于,所述第一传输门为P沟道金属氧化物半导体PMOS传输门,所述第二传输门为N沟道金属氧化物半导体NMOS传输门;所述第二控制信号与所述第一控制信号相同。The transmission gate circuit according to claim 1 or 2, wherein the first transmission gate is a P-channel metal oxide semiconductor (PMOS) transmission gate, and the second transmission gate is an N-channel metal oxide semiconductor (NMOS). Transmission gate; the second control signal is the same as the first control signal.
  7. 如权利要求1或2所述的传输门电路,其特征在于,所述第一传输门为N沟道金属氧化物半导体NMOS传输门,所述第二传输门为P沟道金属氧化物半导体PMOS传输门;所述第二控制信号与所述第一控制信号相同。The transmission gate circuit according to claim 1 or 2, wherein the first transmission gate is an N-channel metal oxide semiconductor NMOS transmission gate, and the second transmission gate is a P-channel metal oxide semiconductor PMOS Transmission gate; the second control signal is the same as the first control signal.
  8. 一种矩阵开关,其特征在于,包括多个开关,所述多个开关为如权利要求1-7任意一项所述的传输门电路;A matrix switch, comprising a plurality of switches, wherein the plurality of switches are transmission gate circuits according to any one of claims 1-7;
    所述多个开关构成开关阵列,针对所述开关阵列中任意一个开关,该开关的输入端与该开关所在的行中每个开关的输入端连接,该开关所在的输出端与该开关所在的列中每个 开关的输出端连接,该开关的控制端用于输入所述第一控制信号以及所述第二控制信号。The plurality of switches constitute a switch array. For any one of the switches in the switch array, the input terminal of the switch is connected to the input terminal of each switch in the row where the switch is located, and the output terminal of the switch is connected to the switch. An output terminal of each switch in the column is connected, and a control terminal of the switch is used to input the first control signal and the second control signal.
  9. 一种电子设备,其特征在于,包括如权利要求8所述的矩阵开关以及控制器,其中,所述控制器用于生成所述第一控制信号以及所述第二控制信号。An electronic device, comprising the matrix switch and the controller according to claim 8, wherein the controller is configured to generate the first control signal and the second control signal.
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