WO1995030166A1 - Verfahren zur lumineszenz-rastermikroskopie und ein lumineszenzrastermikroskop - Google Patents
Verfahren zur lumineszenz-rastermikroskopie und ein lumineszenzrastermikroskop Download PDFInfo
- Publication number
- WO1995030166A1 WO1995030166A1 PCT/DE1995/000566 DE9500566W WO9530166A1 WO 1995030166 A1 WO1995030166 A1 WO 1995030166A1 DE 9500566 W DE9500566 W DE 9500566W WO 9530166 A1 WO9530166 A1 WO 9530166A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- laser
- luminescence
- luminescent
- scanning microscope
- light emitted
- Prior art date
Links
- 238000004020 luminiscence type Methods 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000004621 scanning probe microscopy Methods 0.000 title claims abstract description 5
- 230000005284 excitation Effects 0.000 claims abstract description 13
- 230000005855 radiation Effects 0.000 claims abstract description 5
- 238000011156 evaluation Methods 0.000 claims description 3
- 238000000386 microscopy Methods 0.000 claims description 2
- 238000012216 screening Methods 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000011835 investigation Methods 0.000 claims 1
- 230000004936 stimulating effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 7
- 239000000975 dye Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000004880 explosion Methods 0.000 description 1
- 239000007850 fluorescent dye Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000009916 joint effect Effects 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
Definitions
- the invention relates to a method for luminescence scanning microscopy according to the preamble of the main claim and a luminescence scanning microscope for performing this method.
- REPLACEMENT LEAF luminescent, especially fluorescent dye The dye in the object is excited by the joint action of two photons and the light emitted by the dye is registered and evaluated by means of a detector. In order to capture the entire sample, the laser beam is scanned over the object. The values of all points of the object are registered, which enables a three-dimensional representation of the evaluation results.
- the two-photon excitation in connection with the scanning leads to a direct three-dimensional image of the object.
- laser pulses are used, the duration of which is in the sub-pico second range. Lasers that generate such extremely short pulses are very expensive.
- biological objects are often destroyed by the pulses of high power. Excitation of the object with laser pulses in the sub-pico-second range often leads to the luminescence signal "breaking down". This "collapse” can be clearly illustrated as a "micro-explosion” that destroys the object material.
- the object of the invention is to develop a generic method in such a way that the disadvantages mentioned above do not occur.
- Measuring times are usually applied, the sensitivity of the detector used being adapted to the measuring conditions. It has been found that if the
- lasers with continuous or pulsed radiation can be used as the light source for carrying out the measuring method according to the invention. These are not expensive.
- Conventional semiconductor or gas lasers can be used. HeNe lasers and krypton ion lasers are particularly suitable as gas lasers.
- the laser arrangement can also be designed in the form of an array. The use of two or three lasers for irradiating the same object point has proven to be particularly advantageous.
- a detector with a high signal-to-noise ratio is used to record and evaluate the luminescent light. It is particularly important that the detector used has a correspondingly high sensitivity and a has low self-noise.
- the array-like arrangement of the lasers and detectors and the resulting irradiation and measurement of several raster points makes it possible to shorten the duration of the method.
- a beam screening device is arranged upstream of the object, the beam being scanned over the object.
- Filters are also provided in the luminescence scanning microscope according to the invention for separating the light emitted by the sample from the laser light.
- a detector can also be used, which filters out the corresponding wavelength.
- FIG. 1 A schematic representation of a luminescence scanning microscope for carrying out the method according to the invention is shown in FIG. 1.
- the luminescence scanning microscope has a laser 1 for generating the laser light, a photo detector 2 for evaluating the measurement results and a lens 3 for focusing the laser beam 4 emitted by the laser light source 1 onto the object 5 to be examined.
- the laser beam 4 is controlled with a beam raster device 6 for scanning the object 5.
- the luminescence scanning microscope has filters 7 and 8 for separating the laser light 4 from the luminescent light.
- the laser light source 1 is designed as a conventional laser with continuous or pulsed radiation.
- the laser light source 1 can also be formed by an array-like arrangement of lasers.
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95916571A EP0706671A1 (de) | 1994-04-28 | 1995-04-27 | Verfahren zur lumineszenz-rastermikroskopie und ein lumineszenzrastermikroskop |
US08/571,839 US5777732A (en) | 1994-04-28 | 1995-04-27 | Luminescence-scanning microscopy process and a luminescence scanning microscope utilizing picosecond or greater pulse lasers |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEP4414940.9 | 1994-04-28 | ||
DE4414940A DE4414940C2 (de) | 1994-04-28 | 1994-04-28 | Lumineszenz-Rastermikroskop mit zwei Photonen Anregung |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1995030166A1 true WO1995030166A1 (de) | 1995-11-09 |
Family
ID=6516737
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE1995/000566 WO1995030166A1 (de) | 1994-04-28 | 1995-04-27 | Verfahren zur lumineszenz-rastermikroskopie und ein lumineszenzrastermikroskop |
Country Status (4)
Country | Link |
---|---|
US (1) | US5777732A (de) |
EP (1) | EP0706671A1 (de) |
DE (1) | DE4414940C2 (de) |
WO (1) | WO1995030166A1 (de) |
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EP1102101A1 (de) * | 1999-11-22 | 2001-05-23 | Leica Microsystems Heidelberg GmbH | Laserscanmikroskop |
DE19733194B4 (de) * | 1997-08-01 | 2005-06-16 | Carl Zeiss Jena Gmbh | Laser-Scanning-Mikroskop |
DE19733193B4 (de) * | 1997-08-01 | 2005-09-08 | Carl Zeiss Jena Gmbh | Mikroskop mit adaptiver Optik |
DE19733195B4 (de) * | 1997-08-01 | 2006-04-06 | Carl Zeiss Jena Gmbh | Hoch-Kompaktes Laser Scanning Mikroskop mit integriertem Kurzpuls Laser |
US7772569B2 (en) | 2008-04-01 | 2010-08-10 | The Jackson Laboratory | 3D biplane microscopy |
US8217992B2 (en) | 2007-01-11 | 2012-07-10 | The Jackson Laboratory | Microscopic imaging techniques |
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CA2231222C (en) * | 1995-09-19 | 2001-12-11 | Cornell Research Foundation, Inc. | Multi-photon laser microscopy |
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DE19653413C2 (de) | 1996-12-22 | 2002-02-07 | Stefan Hell | Rastermikroskop, bei dem eine Probe in mehreren Probenpunkten gleichzeitig optisch angeregt wird |
EP2264427B1 (de) | 1997-01-31 | 2017-05-03 | Xy, Llc | Optisches Gerät mit fokussierendem Reflektor zur Konvergenz der Strahlung auf einen Partikelfluss, und zugehöriges Analyseverfahren |
JP3816632B2 (ja) * | 1997-05-14 | 2006-08-30 | オリンパス株式会社 | 走査型顕微鏡 |
US6020591A (en) * | 1997-07-11 | 2000-02-01 | Imra America, Inc. | Two-photon microscopy with plane wave illumination |
US6149867A (en) | 1997-12-31 | 2000-11-21 | Xy, Inc. | Sheath fluids and collection systems for sex-specific cytometer sorting of sperm |
CA2318892A1 (en) | 1998-01-27 | 1999-07-29 | Wisconsin Alumni Research Foundation | Signal enhancement for fluorescence microscopy |
US6342397B1 (en) * | 1998-06-04 | 2002-01-29 | Erkki Soini | Homogeneous biospecific assay using a solid phase, two-photon excitation and confocal fluorescence detection |
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US6687000B1 (en) | 2000-06-26 | 2004-02-03 | Wisconsin Alumni Research Foundation | Photon-sorting spectroscopic microscope system |
DE10039520A1 (de) | 2000-08-08 | 2002-02-21 | Leica Microsystems | Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten |
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JP2005535346A (ja) | 2002-08-15 | 2005-11-24 | エックスワイ,インコーポレイテッド | 高分解能フローサイトメーター |
US7169548B2 (en) | 2002-09-13 | 2007-01-30 | Xy, Inc. | Sperm cell processing and preservation systems |
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PL2151243T3 (pl) | 2004-03-29 | 2013-03-29 | Inguran Llc | Zawiesiny plemników do sortowania na populacje wzbogacone w niosące chromosom X lub Y |
EP2269617B1 (de) | 2004-07-22 | 2016-04-27 | Inguran, LLC | Spermasuspensionen zur Sortierung in X- oder Y-Chromosomen-tragende angereicherte Populationen |
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DE102006029809B3 (de) | 2006-06-28 | 2007-11-08 | Ltb Lasertechnik Berlin Gmbh | Ortsaufgelöstes Messverfahren für die Detektion von Melanin in Fluorophorgemischen in einer Festkörperprobe |
DE102009029831A1 (de) | 2009-06-17 | 2011-01-13 | W.O.M. World Of Medicine Ag | Vorrichtung und Verfahren für die Mehr-Photonen-Fluoreszenzmikroskopie zur Gewinnung von Informationen aus biologischem Gewebe |
DE102011007751B4 (de) * | 2011-04-20 | 2023-10-19 | Carl Zeiss Microscopy Gmbh | Weitfeldmikroskop und Verfahren zur Weitfeldmikroskopie |
WO2018089839A1 (en) | 2016-11-10 | 2018-05-17 | The Trustees Of Columbia University In The City Of New York | Rapid high-resolution imaging methods for large samples |
CN109718476A (zh) * | 2018-12-28 | 2019-05-07 | 中国科学院苏州生物医学工程技术研究所 | 三维扫描双光子刺激系统及其刺激方法 |
CN110146473B (zh) * | 2019-04-16 | 2020-10-13 | 浙江大学 | 一种轴向超分辨的双光子荧光显微装置及方法 |
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WO1991007651A1 (en) * | 1989-11-14 | 1991-05-30 | Cornell Research Foundation, Inc. | Two-photon laser scanning microscopy |
DE4113279A1 (de) * | 1991-04-24 | 1992-10-29 | Miodrag Dipl Phys Milicev | Verfahren und vorrichtung zum abbilden eines objektes |
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-
1994
- 1994-04-28 DE DE4414940A patent/DE4414940C2/de not_active Revoked
-
1995
- 1995-04-27 WO PCT/DE1995/000566 patent/WO1995030166A1/de not_active Application Discontinuation
- 1995-04-27 US US08/571,839 patent/US5777732A/en not_active Expired - Lifetime
- 1995-04-27 EP EP95916571A patent/EP0706671A1/de not_active Ceased
Patent Citations (2)
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WO1991007651A1 (en) * | 1989-11-14 | 1991-05-30 | Cornell Research Foundation, Inc. | Two-photon laser scanning microscopy |
DE4113279A1 (de) * | 1991-04-24 | 1992-10-29 | Miodrag Dipl Phys Milicev | Verfahren und vorrichtung zum abbilden eines objektes |
Non-Patent Citations (2)
Title |
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P.HÄNNINEN ET AL.: "Two Photon Excitation in Time-Resolved Fluorescence Microscopy", PROCEEDINGS SPIE: THREE-DIMENSIONAL MICROSCOPY:IMAGE ACQUISITION AND PROCESSING, vol. 2184, 7 February 1994 (1994-02-07), SAN JOSE,US, pages 66 - 71 * |
V.S. ANTONOV ET AL.: "Multiple Photon Processes in Molecules Induced by Picosecond UV Laser Pulses", SPRINGER SERIES IN CHEMICAL PHYSIC:PICOSECOND PHENOMENA III, vol. 23, 1982, BERLIN,DE, pages 310 - 314 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19733194B4 (de) * | 1997-08-01 | 2005-06-16 | Carl Zeiss Jena Gmbh | Laser-Scanning-Mikroskop |
DE19733193B4 (de) * | 1997-08-01 | 2005-09-08 | Carl Zeiss Jena Gmbh | Mikroskop mit adaptiver Optik |
DE19733195B4 (de) * | 1997-08-01 | 2006-04-06 | Carl Zeiss Jena Gmbh | Hoch-Kompaktes Laser Scanning Mikroskop mit integriertem Kurzpuls Laser |
EP1102101A1 (de) * | 1999-11-22 | 2001-05-23 | Leica Microsystems Heidelberg GmbH | Laserscanmikroskop |
US8217992B2 (en) | 2007-01-11 | 2012-07-10 | The Jackson Laboratory | Microscopic imaging techniques |
US7772569B2 (en) | 2008-04-01 | 2010-08-10 | The Jackson Laboratory | 3D biplane microscopy |
US7880149B2 (en) | 2008-04-01 | 2011-02-01 | The Jackson Laboratory | 3D biplane microscopy |
Also Published As
Publication number | Publication date |
---|---|
DE4414940C2 (de) | 1998-07-02 |
DE4414940A1 (de) | 1995-11-02 |
EP0706671A1 (de) | 1996-04-17 |
US5777732A (en) | 1998-07-07 |
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