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US20060012866A1 - Arrangement for microscopic observation and/or detection and use - Google Patents

Arrangement for microscopic observation and/or detection and use Download PDF

Info

Publication number
US20060012866A1
US20060012866A1 US10/967,322 US96732204A US2006012866A1 US 20060012866 A1 US20060012866 A1 US 20060012866A1 US 96732204 A US96732204 A US 96732204A US 2006012866 A1 US2006012866 A1 US 2006012866A1
Authority
US
United States
Prior art keywords
illumination
sample
objective
microscope
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US10/967,322
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English (en)
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Assigned to CARL ZEISS JENA GMBH reassignment CARL ZEISS JENA GMBH ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: WOLLESCHENSKY, RALF
Publication of US20060012866A1 publication Critical patent/US20060012866A1/en
Priority to US11/808,569 priority Critical patent/US7796328B2/en
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only

Definitions

  • a mirroring is carried out on the edge outside the actual viewing lens, e.g. using imaging mirrors with small numerical aperture that is mechanically a part of the objective, in order to achieve a very homogeneous Z resolution along a line or surface that is created.
  • a light branching (splitter) for parallel laser illumination of several sides advantageously parallel beams go through a main color splitter, which is also designed as in DE10257237, the disclosure contents of which can be included here, and a scanning optics to the sample.
  • the thickness of the line or surface can be adjusted using the focal width/numerical aperture.
  • the depth resolution is specified by the focal width/numerical aperture of the mirroring from the side.
  • a line scanner it can also be adjusted by a confocal aperture diaphragm that is located before the line detector.
  • the beam splitter is advantageously arranged in the lens diaphragm plate (of the viewing objective) and on the edge, has two points or bars for reflection of the quasi-parallel light beams in the direction of the objective.
  • a reversal (illumination over small transmitting areas) and viewing of the reflected sample light is also an object of the invention.
  • a line is generated and the fluorescence along this line is imaged on a line detector. Shadows are eliminated because of the illumination on both sides. In principle, it would also be possible to illuminate from only one side. In order to generate this line, focusing on the spot is carried out using lateral illumination.
  • the line generated in the object is moved over the object by the scanner present in the pupil (conjugate plane).
  • the scanner descans the line again in the direction of the detection and images it on a line detector.
  • the return light from the sample goes through the partial mirror in the direction of the line detector.
  • the edge area of a reflective strip according to 7563 could also be used with illumination with two points.
  • a cylinder lens or other suitable optics and the mirrors generate an illumination line along the y-axis so that a viewing area occurs in the xy-plane.
  • the objective has reflectors, at least in the area of the illumination.
  • the dimensions are sized such that in wide field a light band can be transferred, whereby this formation can also be used with point beams from the side (image at different times in different areas of the mirror).
  • the mirrors focus parallel beams on the optical axis of the inner objective, the reverse focal planes of the mirrors lie in the objective pupil.
  • An inner lens is used for viewing (detection).
  • no optics are required, an optical effect of the outer ring by using corresponding optics with small aperture is only necessary.
  • the optical section thickness (along the optical axis of the inner objective) is adjusted with the selection of the outer focal width (influence of beam diameter).
  • the mirror optics can be circular, i.e. for rotation-symmetrical illumination of the sample from all sides. This arrangement is especially advantageous during wide field detection.
  • the illumination of the sample is preferably carried out with a ring segment, i.e. from a fixed specified direction. Along the imaged axis, which runs perpendicular to the optical axis, this can be carried out using illumination from one direction or two directions opposite to each other.
  • the two illumination beams preferably form a common focus point in the sample.
  • the objective can be designed as an immersion objective.
  • the space from the sample to the first lens surface, including the mirroring optics, are immersed appropriately from the side.
  • the energy input for generating the same signal per sample volume is identical to that of a regular LSM point scanner, since the direction of incidence lies in the plane of the optical section to be detected.
  • the invention can be adapted to a line scanner especially advantageously, with the use of the scanner that scans the line over the sample and with the use of elements for overlaying the illumination and/or extracting the detection (beam splitter mirror), whereby especially advantageous areas of a beam splitter designed according to DE10257237 can be used.
  • FIG. 1 shows an objective arrangement that consists of a central lens unit Lz, in which it may be a case of a usual viewing object of a microscope.
  • light guides LF are provided in which parallel illumination beams Ls 1 , Ls 2 run in the direction of the sample, at first parallel to the optical axis A of viewing in Lz.
  • the illumination beams Ls 1 , Ls 2 arrive at the reflectors R 1 , R 2 , mounted on housing H, which can be imaging mirrors with small aperture, and focus the illumination beams in a direction perpendicular to the optical viewing axis in a point Pin of the optical axis of the objective Lz.
  • R 1 , R 2 can also be flat reflecting mirrors and then display elements with small aperture can be provided in the light guides LF, whereby R 1 , R 2 are used only for deflection in the direction of the sample and the focus in the sample will be generated by the imaging elements.
  • the waist of the illumination runs almost parallel in the area of the sample and generates, in the sample, a thin illumination line that is imaged in objective pupil P 3 .
  • Objective pupil P 3 , objective Lz and the sample focus are located here in a 2 f arrangement, i.e. in each case at a distance from each other that equals the simple focal width.
  • the objective can be used for telecentric scanning, for example of an illumination line in the sample.
  • a light source LQ is mounted after a beam splitter T that creates two parallel partial beams Ls 1 , Ls 2 that are reflected over a beam splitter lying in the conjugate plane of the objective pupil, this beam splitter having on its edge opposite circular reflecting partial sections ( FIG. 2 b ) and are transferred over a scanner P 2 for movement of the illumination beams over the sample in one direction, scanning optics SO and a tube lens for transfer of an intermediate image ZB onto the objective pupil P 2 .
  • the attachment of the objective according to the lens takes place over the pupil P 3 to the beam of a line scanner, which has an appropriately designed beam splitter, as already described in DE10257237 A21, and the transmitting or reflecting surfaces of which can be used.
  • the illumination line described here is moved through the sample by way of the scanner (in the pupil P 2 ) of the line scanner.
  • the viewing beam is dotted, the illumination beam is a solid line.
  • the image of the sample in the intermediate image ZB is descanned by way of a tube lens, scanning optics and scanner and is imaged onto a slot shutter SB (optional here) in front of a line detector, through the surface of the beam splitter MDB necessary for the sample irradiation (except for the circular reflecting points) by means of pinhole optics PO.
  • FIG. 3 a shows the cross section of the objective pupil on the MDB with the illumination channels BK and the effective area for the viewing FB.
  • FIG. 3 b shows the illuminated line L in the object plane, on which focusing is carried out with the objective and by means of which the detection is recorded.
  • the thickness of the line is adjusted, in that the effective numerical aperture of the lateral optics that is focused with variation along the beam direction in the sample. If this NA is decreased, the line width increases accordingly.
  • the manipulation of the numerical aperture can also be e.g. by a variable ring shutter in the pupil that is not shown, arranged around the illumination channel. By moving the scanner P perpendicular to the longitudinal direction (x axis), the line is moved perpendicular in y direction on the sample.
  • FIG. 4 a shows the arrangement for wide field illumination.
  • a splitter can be used for illumination of the sample from two irradiation directions.
  • FIG. 4 b shows the plane of the objective pupil on the beam splitter MDB with wide field illumination.
  • This advantageously has two line-shaped transmitting areas B 1 , B 2 that are opposite each other on the outer edge, each of which transfers a line-shaped area of the illumination (dotted line) in the direction of the outer area of the objective.
  • These areas are imaged with the reflectors in the direction of the sample with small aperture and form a quasi-parallel surface light area of small thickness through the sample.
  • the adjustment of the thickness is carried out, in turn, by a shutter in the pupil, which is not shown, that contracts the pupil of the illumination channel along the x axis at the location of the pupil.
  • the objective according to the invention is advantageously connected by way of a pupil P 3 as in FIG. 2 to the beam of a line scanner.
  • the illumination is focused in the y direction by a cylinder lens L.
  • a splitter T e.g. double-refractive medium
  • T can be located in the illumination beam to generate 2 partial beams.
  • FIG. 4 c shows the scanned light area in the sample plane (focal plane of the objective).
  • the sample light goes over the beam splitter MDB (reflecting) in the direction of an area detector DEF.
  • a Powell aspherical can optionally be used in front of the cylinder optics ZL 1 in FIG. 4 for homogenizing the illumination along the y-axis.
  • the invention described represents an important expansion of the application possibilities of fast confocal laser scanning microscopes.
  • the importance of such a further development can be understood from reading the standard cell biology literature and the fast cellular and subcellular processes 1 described there and the testing methods used there with a large number of dyes 2 .
  • 1 B. Alberts et al. (2002): Molecular Biology of the Cell; Garland Science. 1,2 G. Karp (2002): Cell and Molecular Biology: Concepts and Experiments; Wiley Text Books. 1,2 R. Yuste et al. (2000): Imaging neurons—a laboratory Manual; Cold Spring Harbor Laboratory Press, New York.
  • the invention has especially great importance for the following processes and procedures:
  • the invention described is suitable, among other things, for the examination of development processes, which are mainly characterized by dynamic process in the range of tenths of a second to hours.
  • Example applications on the level of symplasts and complete organisms are described here as an example:
  • Soll, D. R. et al. describe, in 2003 in Scientific World Journ. 3:827-841, a software-based movement analysis of microscopic data of nuclei and pseudopods of living cells in all 3 spatial dimensions.

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
US10/967,322 2004-07-16 2004-10-19 Arrangement for microscopic observation and/or detection and use Abandoned US20060012866A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/808,569 US7796328B2 (en) 2004-07-16 2007-06-11 Laser scanning microscope with illumination perpendicular to the optical axis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102004034957A DE102004034957A1 (de) 2004-07-16 2004-07-16 Anordnung zur mikroskopischen Beobachtung und/oder Detektion und Verwendung
DE102004034957.6 2004-07-16

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/808,569 Continuation US7796328B2 (en) 2004-07-16 2007-06-11 Laser scanning microscope with illumination perpendicular to the optical axis

Publications (1)

Publication Number Publication Date
US20060012866A1 true US20060012866A1 (en) 2006-01-19

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US10/967,322 Abandoned US20060012866A1 (en) 2004-07-16 2004-10-19 Arrangement for microscopic observation and/or detection and use
US11/808,569 Expired - Fee Related US7796328B2 (en) 2004-07-16 2007-06-11 Laser scanning microscope with illumination perpendicular to the optical axis

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US (2) US20060012866A1 (de)
EP (1) EP1617255B1 (de)
JP (1) JP4970748B2 (de)
AT (1) ATE422065T1 (de)
DE (2) DE102004034957A1 (de)
GB (1) GB2416403A (de)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090161207A1 (en) * 2004-07-16 2009-06-25 Ralf Wolleschensky Optical scanning microscope
US20110036996A1 (en) * 2008-02-13 2011-02-17 Ralf Wolleschensky Apparatus and method for high spatial resolution imaging of a structure of a sample
CN102385151A (zh) * 2010-08-30 2012-03-21 徕卡显微系统复合显微镜有限公司 包括显微物镜和微距物镜的显微镜
US20130107358A1 (en) * 2011-10-28 2013-05-02 Leica Mircosystems Cms Gmbh Method and system for illuminating a sample
RU2494089C2 (ru) * 2007-04-20 2013-09-27 Акьюсела Инк. Соединения, представляющие собой стиролильные производные, для лечения офтальмических заболеваний и расстройств
US20150070757A1 (en) * 2007-12-20 2015-03-12 Carl Zeiss Microimaging Gmbh Microscope
WO2016107992A1 (fr) 2014-12-29 2016-07-07 Karla Balaa Dispositif pour réaliser de la microscopie à feuille de lumière
JP2016529519A (ja) * 2013-08-28 2016-09-23 ナショナル ユニバーシティ オブ シンガポール ３次元マルチスケール顕微鏡法のための集積型マイクロミラーを備えた微細表面構造
US10458899B2 (en) 2013-06-18 2019-10-29 Leica Microsystems Cms Gmbh Method and optical device for microscopically examining a multiplicity of specimens
US10495865B2 (en) 2015-04-17 2019-12-03 Leica Microsystems Cms Gmbh Method and device for the SPIM analysis of a sample
US11086117B2 (en) 2016-05-04 2021-08-10 Leica Microsystems Cms Gmbh Apparatus and method for light-sheet-like illumination of a sample
US11709137B2 (en) 2019-12-05 2023-07-25 Leica Microsystems Cms Gmbh Light sheet fluorescence microscope

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DE102007015063B4 (de) * 2007-03-29 2019-10-17 Carl Zeiss Microscopy Gmbh Optische Anordnung zum Erzeugen eines Lichtblattes
US8610085B2 (en) * 2009-08-20 2013-12-17 Bio-Rad Laboratories, Inc. High-speed cellular cross sectional imaging
DE202011110077U1 (de) 2011-10-28 2012-11-29 Leica Microsystems Cms Gmbh Anordnung zur Beleuchtung einer Probe
DE102012211780B4 (de) 2012-07-05 2023-12-07 Carl Zeiss Microscopy Gmbh Vorrichtung zur Halterung und Beleuchtung von Proben für ein Mikroskop
DE102012211943A1 (de) 2012-07-09 2014-06-12 Carl Zeiss Microscopy Gmbh Mikroskop
DE102012214568A1 (de) 2012-08-16 2014-02-20 Leica Microsystems Cms Gmbh Optische Anordnung und ein Mikroskop
DE102013213781A1 (de) * 2013-03-20 2014-09-25 Leica Microsystems Cms Gmbh Verfahren und optische Anordnung zum Manipulieren und Abbilden einer mikroskopischen Probe
JP2015203708A (ja) * 2014-04-10 2015-11-16 オリンパス株式会社 顕微鏡装置
DE102015114756B4 (de) * 2014-09-25 2021-07-22 Leica Microsystems Cms Gmbh Spiegelvorrichtung
DE102015104789A1 (de) * 2015-03-27 2016-09-29 J & M Analytik Ag Vorrichtung zur Beleuchtung einer Probe
LU92846B1 (de) 2015-10-09 2017-05-02 Leica Microsystems Verfahren und Beleuchtungsanordnung zum Beleuchten einer Probenschicht mit einem Lichtblatt
JP6768289B2 (ja) 2015-12-01 2020-10-14 キヤノン株式会社 走査型顕微鏡
EP3465316A1 (de) * 2016-06-03 2019-04-10 Leica Microsystems CMS GmbH Lichtblattmikroskop und mikroskopisches verfahren mit einem lichtblattmikroskop
DE102017119169B4 (de) 2016-08-22 2023-07-27 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zur SPIM-Untersuchung einer Probe
JP2022509823A (ja) 2018-11-30 2022-01-24 コーニング インコーポレイテッド 細胞培養監視のための小型光学結像システム

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1943510A (en) * 1931-10-15 1934-01-16 Zeiss Carl Fa Device for light-field and darkfield illumination of microscopic objects
US2357378A (en) * 1941-12-01 1944-09-05 Bausch & Lomb Microscope illuminator
US3857626A (en) * 1971-12-10 1974-12-31 Bausch & Lomb Microscope coaxial illumination apparatus
US4127318A (en) * 1975-09-20 1978-11-28 Ernst Leitz Wetzlar Gmbh Direct illumination apparatus for light and dark field illumination
US4317613A (en) * 1979-08-27 1982-03-02 Johannes Grosser Illumination arrangement for microscopes
US4475796A (en) * 1981-03-13 1984-10-09 Olympus Optical Co., Ltd. Epidark illumination system
US4585315A (en) * 1984-11-13 1986-04-29 International Business Machines Corporation Brightfield/darkfield microscope illuminator
US4626079A (en) * 1984-04-13 1986-12-02 Nippon Kogaku K.K. Dark field illumination apparatus for epi-illumination system
US4881802A (en) * 1987-05-05 1989-11-21 Ernst Leitz Wetzlar Gmbh Combined bright field-dark field incident light illumination apparatus
US4964707A (en) * 1988-12-05 1990-10-23 Olympus Optical Co., Ltd. Differential interference microscope
US4974094A (en) * 1989-12-04 1990-11-27 Yuhkoh Morito Direct lighting/illuminating system for miniature CCD camera
US5351169A (en) * 1992-04-23 1994-09-27 Mitsubishi Kasei Corporation Lighting device
US6179439B1 (en) * 1998-06-10 2001-01-30 Optical Gaging Products, Inc. High-incidence programmable surface illuminator for video inspection systems
US6259557B1 (en) * 1998-04-30 2001-07-10 Nikon Corporation Device and method for dark field illumination
US6392793B1 (en) * 1996-07-22 2002-05-21 Kla-Tencor Corporation High NA imaging system

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1935444A (en) * 1930-12-19 1933-11-14 Ernst Leitz Optische Werke Microscope
US1996920A (en) * 1932-09-14 1935-04-09 Zeiss Carl Fa Revolving nose-piece for microscopes
US2097762A (en) * 1933-05-26 1937-11-02 Ernst Leitz Microscope
GB415342A (en) * 1934-03-03 1934-08-23 Carl Reichert Improvements in illuminating devices for microscopes
US2809554A (en) * 1954-07-16 1957-10-15 Zeiss Carl Microscope objective with low magnification for epi-microscopes
DE2331750C3 (de) * 1973-06-22 1978-04-20 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Auflicht-Beleuchtungseinrichtung für wahlweise Hell- und Dunkelfeldbeleuchtung
JPS5324637U (de) * 1976-08-09 1978-03-02
US4160578A (en) * 1978-04-17 1979-07-10 American Optical Corporation Annular reflector for microscope objective
BE875482A (nl) * 1979-04-11 1979-10-11 Chandesais Jean L J Verbeterde ringverlichting voor mikroskopen
JPS5979817U (ja) * 1982-11-18 1984-05-30 株式会社ニコン エピダ−ク用対物レンズ
DE3409657A1 (de) * 1984-03-16 1985-09-19 Fa. Carl Zeiss, 7920 Heidenheim Dunkelfeldbeleuchtungseinrichtung fuer mikroskope
DE3527322A1 (de) * 1985-07-31 1987-02-12 Zeiss Carl Fa Autofokuseinrichtung fuer auflichtmikroskope
WO1989006817A1 (en) * 1988-01-25 1989-07-27 Czirbik Sandor Universal condenser for the illumination of objects
JPH03142301A (ja) * 1989-10-30 1991-06-18 Erionikusu:Kk 走査トンネル顕微鏡
WO1992002842A1 (en) * 1990-07-31 1992-02-20 Scalar Corp. Imaging instrument for observing magnified object
US5325231A (en) * 1991-03-22 1994-06-28 Olympus Optical Co., Ltd. Microscope illuminating apparatus
US5268749A (en) * 1991-07-26 1993-12-07 Kollmorgen Corporation Apparatus and method for providing uniform illumination of a sample plane
JP3217097B2 (ja) * 1991-12-18 2001-10-09 科学技術振興事業団 高分解能顕微鏡
JP3359071B2 (ja) * 1992-12-11 2002-12-24 オリンパス光学工業株式会社 エピダーク対物レンズ
DE69525007T2 (de) * 1994-09-30 2002-09-26 Scalar Corp., Tokio/Tokyo Beleuchtungsvorrichtung für ein Betrachtungs- oder Bildaufnahmegerät
JPH0943147A (ja) * 1995-07-28 1997-02-14 Bunshi Bio Photonics Kenkyusho:Kk 暗視野落射蛍光顕微鏡装置
JP3872871B2 (ja) * 1996-07-29 2007-01-24 オリンパス株式会社 対物レンズ及び顕微鏡
DE19632040C2 (de) * 1996-08-08 1999-11-18 Europ Lab Molekularbiolog Konfokales Mikroskop
US5926311A (en) * 1997-02-28 1999-07-20 International Business Machines Corporation Illumination/viewing system for features in transparent materials
US20030076587A1 (en) 1998-07-30 2003-04-24 Carl Zeiss Jena Gmbh Confocal theta microscope
DE19903486C2 (de) * 1999-01-29 2003-03-06 Leica Microsystems Verfahren und Vorrichtung zur optischen Untersuchung von strukturierten Oberflächen von Objekten
JP3634985B2 (ja) * 1999-08-26 2005-03-30 住友大阪セメント株式会社 光学的表面検査機構及び光学的表面検査装置
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1943510A (en) * 1931-10-15 1934-01-16 Zeiss Carl Fa Device for light-field and darkfield illumination of microscopic objects
US2357378A (en) * 1941-12-01 1944-09-05 Bausch & Lomb Microscope illuminator
US3857626A (en) * 1971-12-10 1974-12-31 Bausch & Lomb Microscope coaxial illumination apparatus
US4127318A (en) * 1975-09-20 1978-11-28 Ernst Leitz Wetzlar Gmbh Direct illumination apparatus for light and dark field illumination
US4317613A (en) * 1979-08-27 1982-03-02 Johannes Grosser Illumination arrangement for microscopes
US4475796A (en) * 1981-03-13 1984-10-09 Olympus Optical Co., Ltd. Epidark illumination system
US4626079A (en) * 1984-04-13 1986-12-02 Nippon Kogaku K.K. Dark field illumination apparatus for epi-illumination system
US4585315A (en) * 1984-11-13 1986-04-29 International Business Machines Corporation Brightfield/darkfield microscope illuminator
US4881802A (en) * 1987-05-05 1989-11-21 Ernst Leitz Wetzlar Gmbh Combined bright field-dark field incident light illumination apparatus
US4964707A (en) * 1988-12-05 1990-10-23 Olympus Optical Co., Ltd. Differential interference microscope
US4974094A (en) * 1989-12-04 1990-11-27 Yuhkoh Morito Direct lighting/illuminating system for miniature CCD camera
US5351169A (en) * 1992-04-23 1994-09-27 Mitsubishi Kasei Corporation Lighting device
US6392793B1 (en) * 1996-07-22 2002-05-21 Kla-Tencor Corporation High NA imaging system
US6259557B1 (en) * 1998-04-30 2001-07-10 Nikon Corporation Device and method for dark field illumination
US6179439B1 (en) * 1998-06-10 2001-01-30 Optical Gaging Products, Inc. High-incidence programmable surface illuminator for video inspection systems

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7688504B2 (en) * 2004-07-16 2010-03-30 Carl Zeiss Microimaging Gmbh Optical scanning microscope
US20090161207A1 (en) * 2004-07-16 2009-06-25 Ralf Wolleschensky Optical scanning microscope
RU2494089C2 (ru) * 2007-04-20 2013-09-27 Акьюсела Инк. Соединения, представляющие собой стиролильные производные, для лечения офтальмических заболеваний и расстройств
US10054780B2 (en) * 2007-12-20 2018-08-21 Carl Zeiss Microscopy Gmbh Microscope
US20150070757A1 (en) * 2007-12-20 2015-03-12 Carl Zeiss Microimaging Gmbh Microscope
US8362448B2 (en) * 2008-02-13 2013-01-29 Carl Zeiss Microscopy Gmbh Apparatus and method for high spatial resolution imaging of a structure of a sample
US20110036996A1 (en) * 2008-02-13 2011-02-17 Ralf Wolleschensky Apparatus and method for high spatial resolution imaging of a structure of a sample
CN102385151A (zh) * 2010-08-30 2012-03-21 徕卡显微系统复合显微镜有限公司 包括显微物镜和微距物镜的显微镜
US9772481B2 (en) * 2011-10-28 2017-09-26 Leica Microsystems Cms Gmbh Arrangement for use in the illumination of a specimen in SPIM microscopy
US20130107358A1 (en) * 2011-10-28 2013-05-02 Leica Mircosystems Cms Gmbh Method and system for illuminating a sample
CN103091825A (zh) * 2011-10-28 2013-05-08 莱卡微系统Cms有限责任公司 用于照明样品的方法和系统
CN104054014A (zh) * 2011-10-28 2014-09-17 莱卡微系统Cms有限责任公司 用于以spim显微术照明样品的布置
US20140300958A1 (en) * 2011-10-28 2014-10-09 Leica Microsystems Cms Gmbh Arrangement for use in the illumination of a specimen in spim microscopy
US9104020B2 (en) * 2011-10-28 2015-08-11 Leica Microsystems Cms Gmbh Method and system for illuminating a sample
US10458899B2 (en) 2013-06-18 2019-10-29 Leica Microsystems Cms Gmbh Method and optical device for microscopically examining a multiplicity of specimens
JP2016529519A (ja) * 2013-08-28 2016-09-23 ナショナル ユニバーシティ オブ シンガポール ３次元マルチスケール顕微鏡法のための集積型マイクロミラーを備えた微細表面構造
WO2016107992A1 (fr) 2014-12-29 2016-07-07 Karla Balaa Dispositif pour réaliser de la microscopie à feuille de lumière
US10712549B2 (en) 2014-12-29 2020-07-14 Gataca Systems Device for carrying out light-sheet microscopy
US10495865B2 (en) 2015-04-17 2019-12-03 Leica Microsystems Cms Gmbh Method and device for the SPIM analysis of a sample
US11086117B2 (en) 2016-05-04 2021-08-10 Leica Microsystems Cms Gmbh Apparatus and method for light-sheet-like illumination of a sample
US11709137B2 (en) 2019-12-05 2023-07-25 Leica Microsystems Cms Gmbh Light sheet fluorescence microscope

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GB0508927D0 (en) 2005-06-08
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JP2006030992A (ja) 2006-02-02
EP1617255B1 (de) 2009-01-28
US20080068710A1 (en) 2008-03-20
EP1617255A1 (de) 2006-01-18
ATE422065T1 (de) 2009-02-15
GB2416403A (en) 2006-01-25
US7796328B2 (en) 2010-09-14
DE102004034957A1 (de) 2006-02-02

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