TWM605997U - Optical inspection system - Google Patents
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- TWM605997U TWM605997U TW109209015U TW109209015U TWM605997U TW M605997 U TWM605997 U TW M605997U TW 109209015 U TW109209015 U TW 109209015U TW 109209015 U TW109209015 U TW 109209015U TW M605997 U TWM605997 U TW M605997U
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Abstract
本創作係關於一種光學檢測系統。該光學檢測系統包括自動控制設備、光源及控制檢測模組,其中自動控制設備具有影像感測器,並且控制檢測模組包含有路徑單元、比對單元以及顯示單元。首先,藉由路徑單元運算出路徑資訊做為自動控制設備的移動路徑,接著使用者根據路徑資訊,排除移動路徑中具有大幅度的檢測角度者,以產生最佳移動路徑資訊,之後使用者根據最佳移動路徑資訊,各自啟動或關閉每一個光源,隨後自動控制設備沿最佳移動路徑移動,藉由光感測器產生影像資訊,最後藉由比對模組辨識影像資訊上所存在的瑕疵以產生比對影像資訊,並透過顯示器顯示比對影像資訊。藉此檢測待測物上所存在的瑕疵,達成檢測瑕疵以及減少檢測時間等目的。This creation is about an optical inspection system. The optical detection system includes an automatic control device, a light source, and a control detection module. The automatic control device has an image sensor, and the control detection module includes a path unit, a comparison unit, and a display unit. First, the path information is calculated by the path unit as the movement path of the automatic control device. Then the user excludes those with a large detection angle in the movement path based on the path information to generate the best movement path information. The best moving path information, each light source is turned on or off separately, and then the device is automatically controlled to move along the best moving path, the image information is generated by the light sensor, and finally the defects in the image information are identified by the comparison module Generate comparison image information, and display the comparison image information through the monitor. In this way, the defects existing on the object to be tested are detected, and the purpose of detecting the defects and reducing the detection time is achieved.
Description
本創作係有關於一種檢測系統,特別係關於一種光學檢測系統。This creation is about a detection system, especially an optical detection system.
近年來,為符合車輛造型設計之流行趨勢,輪圈尺寸有逐漸增大的趨勢市售車輛配備的標準輪圈,從以往的15吋,轉變為16吋,更有朝17吋發展的趨勢,而輪圈越大重量勢必越重,在講求省能低油耗的高油價時代,以鋁或鎂等合金所製造的輕合金輪圈,逐漸成為市場上的主流。In recent years, in order to comply with the popular trend of vehicle styling design, the rim size has gradually increased. The standard rims equipped on commercial vehicles have changed from 15 inches to 16 inches, and there is a trend towards 17 inches. The larger the rim, the heavier the weight. In the era of high oil prices where energy saving and low fuel consumption are important, light alloy wheels made of aluminum or magnesium alloys have gradually become the mainstream in the market.
輕合金輪圈具有許多優點,以直徑13吋為例,鋁合金輪圈約比鋼圈輕11%,14吋則約輕22%,當輪徑尺寸越大則兩者重量相差越大,由於輪圈重量輕,驅動輪圈轉動的慣性阻力相對較小,將大幅提升使用者操控的靈敏度,同時亦可節省些許油耗。此外,以鋁合金之輪圈為例,其熱傳性能佳而有助於通風散熱,如此可以提高輪胎壽命,減少爆胎危險。Light alloy wheels have many advantages. Taking a diameter of 13 inches as an example, aluminum alloy wheels are about 11% lighter than steel rims, and 14 inches are about 22% lighter. The larger the wheel diameter, the greater the weight difference between the two. The rim is light in weight, and the inertial resistance of the driving rim is relatively small, which will greatly enhance the sensitivity of the user's manipulation and save a little fuel consumption. In addition, taking the aluminum alloy wheel as an example, its heat transfer performance is good and helps to ventilate and dissipate heat, which can increase the life of the tire and reduce the risk of tire blowout.
然而,使用輕合金輪圈的缺點在於,合金材質的延伸率通常較鋼材低,造成輕合金輪圈允許變形的能力較差,品質不佳的輕合金輪圈容易產生斷裂的危險。另一方面,由於製造過程較複雜,包括材質成份、鑄造技術、模具設計、熱處理過程、切削及塗裝等過程,較容易因人為疏失而產生問題。因此如何準確辨識並檢測輕合金輪圈上之瑕疵,則為研發人員應解決的問題之一。However, the disadvantage of using light alloy rims is that the elongation of alloy materials is generally lower than that of steel, which results in poor deformability of light alloy rims, and poor quality light alloy rims are prone to the danger of fracture. On the other hand, because the manufacturing process is more complicated, including material composition, casting technology, mold design, heat treatment process, cutting and painting, etc., it is easier to cause problems due to human error. Therefore, how to accurately identify and detect defects on light alloy wheels is one of the problems that R&D personnel should solve.
是以,本案創作人在觀察上述缺失後,而遂有本創作之產生。Therefore, after observing the above-mentioned deficiencies, the creator of this case has produced this creation.
本創作的目的係提供一種光學檢測系統,其係能根據待測物之結構,產生對應之最佳移動路徑資訊,並且能夠根據最佳移動路徑調整光源,以檢測待測物表面的瑕疵,並大幅縮減檢測時間。The purpose of this creation is to provide an optical inspection system, which can generate corresponding optimal movement path information according to the structure of the object to be measured, and adjust the light source according to the optimal movement path to detect defects on the surface of the object to be measured, and Significantly reduce the detection time.
為達上述目的,本創作提供一種光學檢測系統,其係包括:一自動控制設備,其係設置於一待測物的周圍,該自動控制模組具有一影像感測器,該影像感測器拍攝該待測物並產生複數影像資訊;複數光源,其係圍繞該待測物,該等光源中的每一個根據該自動控制設備的一最佳移動路徑資訊各自啟動或關閉;以及一控制檢測模組,其係與該自動控制設備以及該等光源電性連接,該控制檢測模組係包含有一路徑單元、一比對單元及一顯示單元;其中,該路徑單元係針對該待測物之結構,運算出一路徑資訊,該路徑資訊做為該自動控制設備的移動路徑;該比對單元,其係與該路徑單元電性連接,該比對單元內儲存有複數瑕疵影像資訊,該比對單元接收該影像感測器所產生的該等影像資訊,並藉由該等瑕疵影像資訊辨識該等影像資訊上所存在的瑕疵,以產生複數比對影像資訊;以及該顯示單元,其係與該比對單元電性連接,該比對單元將該等比對影像資訊傳輸至該顯示單元,並由該顯示單元顯示該等比對影像資訊或該等影像資訊。To achieve the above objective, this creation provides an optical inspection system, which includes: an automatic control device, which is arranged around an object to be measured, the automatic control module has an image sensor, and the image sensor Shooting the object under test and generating plural image information; plural light sources, which surround the object under test, each of the light sources is turned on or off according to an optimal movement path information of the automatic control device; and a control detection The module is electrically connected to the automatic control equipment and the light sources. The control detection module includes a path unit, a comparison unit and a display unit; wherein, the path unit is directed to the object under test Structure, a path information is calculated, and the path information is used as the moving path of the automatic control device; the comparison unit is electrically connected to the path unit, and the comparison unit stores multiple defect image information, the comparison unit The pairing unit receives the image information generated by the image sensor, and uses the defective image information to identify the defects existing in the image information to generate plural comparison image information; and the display unit, which is It is electrically connected to the comparison unit, and the comparison unit transmits the comparison image information to the display unit, and the display unit displays the comparison image information or the image information.
較佳地,根據本創作之光學檢測系統,其中,該等自動控制設備可以使用三軸機械手臂及多軸機械手臂其中之一。Preferably, according to the optical inspection system of the present invention, the automatic control equipment can use one of a three-axis robotic arm and a multi-axis robotic arm.
較佳地,根據本創作之光學檢測系統,其中,該控制檢測模組可以為電腦、伺服器及智慧型手機其中之一。Preferably, according to the optical detection system of the present invention, the control detection module can be one of a computer, a server, and a smart phone.
較佳地,根據本創作之光學檢測系統,其中,該影像感測器可以為工業相機及高速攝影機其中之一。Preferably, according to the optical inspection system of the present invention, the image sensor can be one of an industrial camera and a high-speed camera.
較佳地,根據本創作之光學檢測系統,其中,該控制檢測模組為電腦、伺服器及智慧型手機其中之一。Preferably, according to the optical inspection system of the present invention, the control inspection module is one of a computer, a server, and a smart phone.
較佳地,根據本創作之光學檢測系統,其中,該控制檢測模組進一步包括一設定單元,該設定單元用於設定該待測物的結構。Preferably, according to the optical inspection system of the present invention, the control inspection module further includes a setting unit for setting the structure of the test object.
較佳地,根據本創作之光學檢測系統,其中,該比對模組透過高斯濾波(Gaussian Blur)及二值化(Binarization)過濾該等影像資訊中的雜訊,以提高辨識該等影像資訊上所存在的瑕疵的準確率。Preferably, according to the optical inspection system of the present invention, the comparison module filters the noise in the image information through Gaussian Blur and Binarization to improve the recognition of the image information The accuracy of the flaws on the
較佳地,根據本創作之光學檢測系統,其中,該比對模組結合卷積神經網路辨識該等影像資訊上所存在的瑕疵。Preferably, according to the optical inspection system of the present invention, the comparison module is combined with a convolutional neural network to identify defects in the image information.
較佳地,根據本創作之光學檢測系統,其中,該比對單元能夠分別辨識出髒粒及漆料刮兩種瑕疵。Preferably, according to the optical inspection system of the present invention, the comparison unit can respectively identify two types of defects: dirt particles and paint scratches.
較佳地,根據本創作之光學檢測系統,其中,該比對單元所產生的該等比對影像資訊,其係於髒粒處標示一第一警示圖案,並且於漆料刮傷處標示一第二警示圖案。Preferably, according to the optical inspection system of the present invention, the comparison image information generated by the comparison unit is marked with a first warning pattern on the dirt particles and a mark on the scratched part of the paint The second warning pattern.
綜上,本創作所提供之光學檢測系統,主要利用本創作之光學檢測系統並搭配其檢測方法,能根據待測物之結構,產生對應之最佳移動路徑資訊,並且能夠根據最佳移動路徑調整光源,以檢測待測物表面的瑕疵,並大幅縮減檢測時間,如此一來,本創作將不受待測物之結構影響,能夠快速且全面的檢測待測物表面之瑕疵。To sum up, the optical inspection system provided by this creation mainly uses the optical inspection system of this creation and matches its detection method. It can generate the corresponding optimal movement path information according to the structure of the object to be measured, and can according to the optimal movement path Adjust the light source to detect defects on the surface of the object to be tested and greatly reduce the inspection time. As a result, this creation will not be affected by the structure of the object to be tested, and can quickly and comprehensively detect the surface defects of the object to be tested.
爲使熟悉該項技藝人士瞭解本創作之目的、特徵及功效,茲藉由下述具體實施例,並配合所附之圖式,對本創作詳加說明如下。In order to enable those familiar with the art to understand the purpose, features and effects of this creation, the following specific embodiments are used in conjunction with the accompanying drawings to explain this creation in detail as follows.
以下配合圖式及元件符號對本創作的實施方式作更詳細的說明,俾使其所屬技術領域中具有通常知識者在研讀本說明書後能據以實施。The following is a more detailed description of the implementation of this creation in conjunction with the drawings and component symbols, so that those with ordinary knowledge in the technical field can implement it after studying this specification.
然而,本創作不限於本文所公開的實施例,而是將以各種形式實現。However, the present creation is not limited to the embodiments disclosed herein, but will be implemented in various forms.
以下實施例僅作為示例提供,使得所屬技術領域中具有通常知識者可以完全理解本創作的公開內容和本創作所公開的範圍。The following embodiments are only provided as examples, so that those with ordinary knowledge in the technical field can fully understand the disclosure of this creation and the scope of this creation.
因此,本創作將僅由所附申請專利範圍限定。Therefore, this creation will only be limited by the scope of the attached patent application.
用於描述本創作的各種實施例的附圖中,所示出的形狀、尺寸、比率、數量等僅僅為示例性,並且本創作不限於此。In the drawings used to describe various embodiments of the present creation, the shapes, sizes, ratios, numbers, etc. shown are merely exemplary, and the present creation is not limited thereto.
在本說明書中,相同的附圖標記通常表示相同的元件。In this specification, the same reference numerals generally denote the same elements.
除非另有明確說明,否則對單數的任何引用可以包含複數。Unless expressly stated otherwise, any reference to the singular may include the plural.
請參閱圖1至圖4所示,圖1為根據本創作第一實施例之光學檢測系統的示意圖。如圖1所示,根據本創作之光學檢測系統100包括:自動控制設備10、控制檢測模組20、光源30。Please refer to FIG. 1 to FIG. 4. FIG. 1 is a schematic diagram of the optical detection system according to the first embodiment of the present invention. As shown in FIG. 1, the
具體地,在本實施例中,該待測物200為輪圈,其材質係可以為鐵、鋁及鎂其中之一或其組合,然而本創作不限於此。Specifically, in this embodiment, the
該自動控制設備10,其係設置於待測物200的周圍,並且自動控制設備10具有影像感測器11,影像感測器11係拍攝待測物200並產生複數影像資訊111。The
具體地,根據本創作之自動控制設備10可以為三軸機械手臂及多軸機械手臂其中之一,然而本創作不限於此。自動控制設備10與控制檢測模組20電性連接,並且接收控制檢測模組20之指令控制並移動,以使自動控制設備10上之影像感測器11可以完整拍攝待測物200之表面。Specifically, the
具體地,根據本創作之影像感測器11可以為工業相機及高速攝影機其中之一,然而本創作不限於此。需要進一步說明的是,相比使用一般相機,使用工業相機的優點在於穩定性高、容易安裝、結構穩定不易損壞及連續工作時間長等,因此影像感測器11使用工業相機拍攝效果較佳,然而缺點在於大幅提高作業成本且作業時間較長。Specifically, the
請參閱圖2及圖3所示,圖2為根據本創作第一實施例之光學檢測系統設置位置示意圖,圖3為根據本創作第一實施例之光學檢測系統架構示意圖。根據本創作之控制檢測模組20係與自動控制設備10以及光源30電性連接,控制檢測模組20包含:路徑單元21、比對單元22及顯示單元23。Please refer to FIG. 2 and FIG. 3. FIG. 2 is a schematic diagram of the installation position of the optical detection system according to the first embodiment of the invention, and FIG. 3 is a schematic diagram of the optical detection system architecture according to the first embodiment of the invention. The control and
具體地,根據本創作之控制檢測模組20可以為電腦、伺服器及智慧型手機其中之一,然而本創作不限於此。Specifically, the
該路徑單元21,其係根據待測物200的結構,運算出路徑資訊211(圖未示)作為自動控制設備10的移動路徑,當路徑資訊211作為自動控制設備10的移動路徑時,可以保證自動控制設備10上之影像感測器11完整拍攝待測物200之表面。The
需要進一步說明的是,路徑資訊211並非自動控制設備10的最佳移動路徑,其中某些移動可能包含有大幅度的檢測角度,從而造成檢測時間變長,因此根據本創作第一實施例之光學檢測系統100,在路徑單元21運算出路徑資訊211作為自動控制設備10的移動路徑後,使用者可以根據路徑資訊211並去除其中具有大幅度的檢測角度之路徑資訊,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,有效減少光學檢測系統100的檢測時間。It should be further explained that the path information 211 is not the best moving path of the
請參閱圖2所示,並搭配圖5所示,該比對單元22係與路徑單元21電性連接,比對單元22內儲存有複數瑕疵影像資訊221(圖未示),比對單元22接收該影像感測器11所產生的該等影像資訊111,並藉由該等瑕疵影像資訊221辨識該等影像資訊111上所存在的瑕疵,以產生複數比對影像資訊222。Please refer to FIG. 2 and in conjunction with FIG. 5, the
具體地,根據本創作第一實施例之瑕疵影像資訊221,其中瑕疵可以包含有雜質、凸點、黑點、棉絮、縮孔、凹洞、磨痕、刮線、刮痕、碰傷、異色、刀痕、缺肉、毛頭、崩漆、流漆、薄噴、高亮銀色差等,上述皆為在輪圈生產的各個階段中所產生的各種製造失誤,然而本創作不限於此。Specifically, according to the defect image information 221 of the first embodiment of the present creation, the defect may include impurities, bumps, black spots, cotton wool, shrinkage holes, cavities, abrasion marks, scratches, scratches, bruises, and different colors. , Knife marks, lack of meat, hair, cracked paint, flow paint, thin spray, high-gloss silver difference, etc., all of the above are various manufacturing errors that occur in various stages of rim production, but this creation is not limited to this.
該顯示單元23,係與比對單元22電性連接,比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222或該等影像資訊111。具體地,根據本創作之顯示單元23可以為液晶顯示器、發光二極體顯示器或有機發光二極體顯示器,然而本創作不限於此。The
請參閱圖4所示,並搭配圖3所示,圖4為根據本創作第一實施例之光源設置位置示意圖。在本實施例中,該等光源30係圍繞待測物200設置,光源30之具體數量為7個,然而本創作不限於此,使用者可以根據需求增加或減少該等光源30之數量,並且光源30係與該控制檢測模組20電性連接。具體地,根據本創作之光源30可以使用發光二極體及有機發光二極體其中之一或其組合,然而本創作不限於此。Please refer to FIG. 4 in conjunction with FIG. 3. FIG. 4 is a schematic diagram of the light source setting position according to the first embodiment of the present creation. In this embodiment, the
需要進一步說明的是,如上所述,根據本創作之光學檢測系統100,其係將根據待測物200之結構而產生的最佳移動路徑資訊212作為自動控制設備10的移動路徑,在本實施例中,由於待測物200為金屬材質,因此其表面存在光澤並且容易反光,造成在自動控制設備10移動並以不同角度拍攝待測物200之表面時,影像感測器11無法拍攝出清晰的影像資訊111,從而使比對單元22在辨識瑕疵時難以實行,造成檢測結果錯誤或檢測次數增加。It should be further explained that, as described above, according to the
因此,在本實施例中,使用者可以根據作為自動控制設備10的移動路徑之最佳移動路徑資訊212,將該等光源30中的每一個各自開啟或關閉,以減少待測物表面反光的程度,從而保證影像感測器11拍攝出清晰的影像資訊111,以供比對單元22辨識該等影像資訊111上之瑕疵,以提升根據本創作之光學檢測系統100檢測瑕疵的準確性。Therefore, in this embodiment, the user can turn on or off each of the
請參閱圖5所示,圖5為根據本創作第一實施例之比對單元辨識影像資訊之過程的流程示意圖。該比對單元22首先對該等影像資訊111進行高斯濾波,將影像資訊111中像素的加權平均值代替影像資訊111中的每個像素的值,降低影像資訊111灰度的劇烈變化從而降低雜訊,然而如圖5所示,進行高斯濾波後必然造成影像資訊111邊緣及輪廓模糊。接著比對單元22對該等影像資訊111進行二值化,將影像資訊111中大於預設臨界灰度值的像素灰度設為灰度極大值,並把小於預設臨界灰度值的像素灰度設為灰度極小值,從而實現二值化並過濾該等影像資訊111中的雜訊,從而提高比對單元22辨識該等影像資訊111上所存在的瑕疵之準確度。Please refer to FIG. 5, which is a schematic flowchart of the process of identifying image information by the comparison unit according to the first embodiment of the creation. The
為供進一步瞭解本創作構造特徵、運用技術手段及所預期達成之功效,茲將本創作使用方式加以敘述,相信當可由此而對本創作有更深入且具體瞭解,如下所述:In order to provide a further understanding of the structural features of this creation, the use of technical means and the expected effects, the method of use of this creation is described. I believe that we can have a deeper and specific understanding of this creation from this, as follows:
請參閱圖6及圖7所示,並且搭配圖3至圖5所示,圖6為根據本創作第一實施例之光學檢測系統辨識結果示意圖,圖7為說明執行本創作第一實施例的光學檢測系統之檢測方法的步驟流程圖。本創作以上述之光學檢測系統100為基礎,進一步提供一種光學檢測系統100的檢測方法,係包含下列步驟:Please refer to Figures 6 and 7, and in conjunction with Figures 3 to 5, Figure 6 is a schematic diagram of the identification result of the optical detection system according to the first embodiment of the creation, and Figure 7 is a diagram illustrating the implementation of the first embodiment of the creation The flow chart of the inspection method of the optical inspection system. This creation is based on the above-mentioned
模擬步驟S1,光學檢測系統100根據待測物200之結構,藉由路徑單元21運算出該路徑資訊211,路徑資訊211可以做為自動控制設備10的移動路徑,接著執行修正步驟S2。In the simulation step S1, the
修正步驟S2,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,以縮減檢測時間,接著執行校正步驟S3。In the correction step S2, the user removes those with a large detection angle according to the path information 211, thereby obtaining the best moving
校正步驟S3,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉複數光源30中的每一個,從而保證影像感測器11能夠拍攝出清晰的影像資訊111,之後執行拍攝步驟S4。In the calibration step S3, the user individually activates or deactivates each of the plurality of
拍攝步驟S4,該自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面,產生清晰的影像資訊111,並執行比對步驟S5。In the shooting step S4, the
比對步驟S5,藉由比對單元22接收影像感測器11所產生的該等影像資訊111,藉由儲存於該比對單元22中的瑕疵影像資訊辨221以辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222,接著執行顯示步驟S6。In the comparison step S5, the
顯示步驟S6,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。In the display step S6, the
舉例而言,請參閱圖6,並且搭配圖3至圖7所示。根據本創作之光學檢測系統100,首先執行模擬步驟S1,藉由路徑單元21運算出該路徑資訊211;接著執行修正步驟S2,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑;之後執行校正步驟S3,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉該等光源30中的每一個;之後執行拍攝步驟S4,自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面;拍攝完成後進入比對步驟S5,藉由比對單元22,辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222;在辨識完成後執行顯示步驟S6,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。For example, please refer to FIG. 6, and in conjunction with FIGS. 3 to 7. According to the
需進一步說明的是,在本實施例中,於比對步驟S5時,該比對單元22首先對該等影像資訊111進行高斯濾波,將影像資訊111中像素的加權平均值代替影像資訊111中的每個像素的值,降低影像資訊111灰度的劇烈變化從而降低雜訊,然而如圖5所示,進行高斯濾波後必然造成影像資訊111邊緣及輪廓模糊,接著比對單元22對等影像資訊111進行二值化,將影像資訊111中大於預設臨界灰度值的像素灰度設為灰度極大值,並把小於預設臨界灰度值的像素灰度設為灰度極小值,從而實現二值化並對濾該等影像資訊111中的雜訊,進而提高比對單元22辨識該等影像資訊111上所存在的瑕疵之準確度。It should be further explained that in this embodiment, in the comparison step S5, the
藉此,由上述說明可得知,根據本創作所提供之光學檢測系統100並搭配其檢測方法,係能夠產生針對待測物200之結構在檢測時的最佳移動路徑資訊212,並藉由該最佳移動路徑資訊212搭配合適的光源30配置,準確辨識待測物200表面所存在之瑕疵,如此一來,根據本創作所提供之光學檢測系統100將不受待測物200之結構影響,能夠快速且全面的檢測待測物200表面之瑕疵。Therefore, it can be known from the above description that the
請參閱圖8及圖9所示,圖8為根據本創作第二實施例之光學檢測系統辨識結果示意圖,圖9為說明執行本創作第二實施例的光學檢測系統之檢測方法的步驟流程圖。第二實施例相較於第一實施例,第二實施例的主要差異在於,該比對單元22進一步結合卷積神經網路(圖未示)並搭配該等瑕疵影像資訊221,從而增進比對單元22辨識該等影像資訊111上所存在的瑕疵之速度及準確性。需要進一步說明的是,類神經網路(Artificial Neural Network)為一種模仿生物神經網路的結構和功能的數學模型或計算模型,而其中卷積類神經網路則進一步加入區塊的概念,以鎖定具有區域性質的資料型態,如此一來,結合使用卷積類神經網路可以使比對單元22運算效能大幅提升。在第二實施例中,比對單元22可以進一步分別辨識出髒粒及漆料刮傷兩種瑕疵,因此比對單元22可以於髒粒處標示第一警示圖案41,並且於漆料刮傷處標示第二警示圖案42。Please refer to FIG. 8 and FIG. 9. FIG. 8 is a schematic diagram of the identification result of the optical inspection system according to the second embodiment of the invention, and FIG. 9 is a flowchart illustrating the steps of the inspection method of the optical inspection system according to the second embodiment of the invention. . Compared with the first embodiment, the main difference of the second embodiment is that the
藉此,第二實施例不僅能達到第一實施例之功效,同時能夠進一步辨識並分類瑕疵之種類並於瑕疵處標示明顯之標記,比對單元22透過結合卷積類神經網路,大幅提升根據本創作之光學檢測系統100之適用性及便利性。In this way, the second embodiment can not only achieve the effects of the first embodiment, but also can further identify and classify the types of defects and mark obvious marks on the defects. The
請參閱圖9所示,並搭配圖8所示,圖9為說明執行本創作第二實施例的光學檢測系統之警示方法的步驟流程圖。本創作以第二實施例之光學檢測系統100為基礎,進一步提供一種光學檢測系統1的檢測方法,係包含下列步驟:Please refer to FIG. 9 in conjunction with FIG. 8. FIG. 9 is a flowchart illustrating the steps of the warning method of the optical detection system according to the second embodiment of the present creation. This creation is based on the
擬步驟S1’,光學檢測系統100根據待測物200之結構,藉由路徑單元21運算出該路徑資訊211,路徑資訊211可以做為自動控制設備10的移動路徑,接著執行修正步驟S2’。In step S1', the
修正步驟S2’,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,以縮減檢測時間,接著執行校正步驟S3。In the correction step S2', the user removes those with a large detection angle according to the path information 211, thereby obtaining the best moving
校正步驟S3’,使用者根據修正步驟S2’所產生之最佳移動路徑資訊212,分別各自啟動或關閉複數光源30中的每一個,從而保證影像感測器11能夠拍攝出清晰的影像資訊111,之後執行拍攝步驟S4。In the calibration step S3', the user individually activates or deactivates each of the plurality of
拍攝步驟S4’,該自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面,產生清晰的影像資訊111,並執行比對步驟S5’。In the shooting step S4', the
比對步驟S5’,藉由比對單元22接收影像感測器11所產生的該等影像資訊111,藉由儲存於該比對單元22中的瑕疵影像資訊辨221並搭配卷積神經網路,以辦識該等影像資訊111上所存在的瑕疵,比對單元22可以辨識出髒粒及漆料刮傷兩種瑕疵,並產生複數比對影像資訊222,接著執行標示步驟S7’。In the comparison step S5', the
標示步驟S7’,藉由比對單元22結合卷積神經網路分別辨識出髒粒及漆料刮傷兩種瑕疵,比對單元22在該等比對影像資訊222上於髒粒處標示第一警示圖案41,並於漆料刮傷處標示第二警示圖案42,之後執行顯示步驟S6’。In the marking step S7', the
顯示步驟S6’,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。In the display step S6', the
舉例而言,請參閱圖8,並且搭配圖3、圖4及圖9所示。根據本創作之光學檢測系統100,首先執行擬步驟S1’,藉由路徑單元21運算出該路徑資訊211;接著執行修正步驟S2’,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑;之後執行校正步驟S3’,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉該等光源30中的每一個;之後執行拍攝步驟S4’,自動控制設備10根據修正步驟S2’所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面;拍攝完成後進入比對步驟S5’,藉由比對單元221並搭配卷積神經網路,以辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222;接著在辨識完成後執行標示步驟S7’,藉由比對單元22結合卷積神經網路分別辨識出髒粒及漆料刮傷兩種瑕疵,該比對單元22在該等比對影像資訊222上於髒粒處標示第一警示圖案41,並於漆料刮傷處標示第二警示圖案42;最後執行顯示步驟S6’,將該等包含有第一警示圖案41以及第二警示圖案42之比對影像資訊222,藉由比對單元22傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。For example, please refer to FIG. 8, and in conjunction with FIG. 3, FIG. 4 and FIG. 9. According to the
值得一提的是,儘管上方之描述是基於比對單元22辨識髒粒及漆料刮傷進行說明,但本創作不限於此,如雜質、凸點、黑點、棉絮、縮孔、凹洞、磨痕、刮線、刮痕、碰傷、異色、刀痕、缺肉、毛頭、崩漆、流漆、薄噴、高亮銀色差等,當比對單元22內部儲存有足夠的瑕疵影像資訊221並且結合使用卷積類神經網路時,比對單元22能夠進一步分別單獨辨識出上述之瑕疵或其組合,並一一標示不同的警示圖案以方便使用者辨識。It is worth mentioning that although the above description is based on the
藉此,本創作具有以下之實施功效及技術功效:In this way, this creation has the following implementation and technical effects:
其一,藉由本創作之之光學檢測系統100為基礎,並搭配本創作所提供之檢測方法,其係能根據待測物200之結構,產生對應之最佳移動路徑資訊212,並且能夠根據最佳移動路徑212調整該等光源30,以檢測待測物200表面的瑕疵,並大幅縮減檢測時間。First, based on the
其二,本創作透過將比對單元22結合卷積神經網路,能夠實現辨識並分類瑕疵之種類並於瑕疵處標示明顯之標記,大幅提升根據本創作之光學檢測系統100之適用性及便利性。Secondly, by combining the
以上係藉由特定的具體實施例說明本創作之實施方式,所屬技術領域具有通常知識者可由本說明書所揭示之內容輕易地瞭解本創作之其他優點及功效。The above is to illustrate the implementation of this creation through specific specific embodiments. Those with ordinary knowledge in the art can easily understand the other advantages and effects of this creation from the content disclosed in this specification.
儘管本創作是透過參考附圖中所描繪的實施例進行說明,但其僅為實施例,本領域中具有通常知識者應當理解的是可以對其進行各種改變以及變形。然而,這些改變以及變形不應脫離本創作所保護的範圍。因此,本創作的保護範圍必須被限定於所附的申請專利範圍。Although the creation is described by referring to the embodiments depicted in the drawings, it is only an embodiment, and those with ordinary knowledge in the art should understand that various changes and modifications can be made to it. However, these changes and deformations should not deviate from the scope of protection of this creation. Therefore, the scope of protection of this creation must be limited to the scope of the attached patent application.
100:光學檢測系統 10:自動控制設備 11:影像感測器 111:影像資訊 20:控制檢測模組 21:路徑單元 211:路徑資訊 212:最佳移動路徑資訊 22:比對單元 221:瑕疵影像資訊 222:比對影像資訊 23:顯示單元 30:光源 41:第一警示圖案 42:第二警示圖案 200:待測物 S1:模擬步驟 S2:修正步驟 S3:校正步驟 S4:拍攝步驟 S5:比對步驟 S6:顯示步驟 S1’:模擬步驟 S2’:修正步驟 S3’:校正步驟 S4’:拍攝步驟 S5’:比對步驟 S6’:顯示步驟 S7’:標示步驟 100: Optical inspection system 10: Automatic control equipment 11: Image sensor 111: Image Information 20: Control detection module 21: Path unit 211: Path Information 212: Best moving path information 22: Comparison unit 221: Defective image information 222: Compare image information 23: display unit 30: light source 41: The first warning pattern 42: The second warning pattern 200: DUT S1: Simulation steps S2: Correction steps S3: Calibration steps S4: shooting steps S5: Comparison steps S6: Show steps S1’: Simulation steps S2’: Correction steps S3’: Calibration steps S4’: Shooting steps S5’: Comparison step S6’: Show steps S7’: marking steps
圖1為根據本創作第一實施例之光學檢測系統的示意圖; 圖2為根據本創作第一實施例之光學檢測系統設置位置示意圖; 圖3為根據本創作第一實施例之光學檢測系統架構示意圖; 圖4為根據本創作第一實施例之光源設置位置示意圖; 圖5為根據本創作第一實施例之比對單元辨識影像資訊之過程的流程示意圖; 圖6為根據本創作第一實施例之光學檢測系統辨識結果示意圖; 圖7為說明執行本創作第一實施例的光學檢測系統之檢測方法的步驟流程圖; 圖8為根據本創作第二實施例之光學檢測系統辨識結果示意圖; 圖9為說明執行本創作第二實施例的光學檢測系統之檢測方法的步驟流程圖。 Fig. 1 is a schematic diagram of an optical inspection system according to the first embodiment of the invention; Fig. 2 is a schematic diagram of the position of the optical detection system according to the first embodiment of the present creation; 3 is a schematic diagram of the optical inspection system architecture according to the first embodiment of the present invention; Fig. 4 is a schematic diagram of a light source setting position according to the first embodiment of the creation; FIG. 5 is a schematic flowchart of the process of identifying image information by the comparison unit according to the first embodiment of the creation; 6 is a schematic diagram of the identification result of the optical inspection system according to the first embodiment of the present creation; FIG. 7 is a flowchart illustrating the steps of performing the inspection method of the optical inspection system of the first embodiment of the creation; 8 is a schematic diagram of the identification result of the optical inspection system according to the second embodiment of the present creation; FIG. 9 is a flowchart illustrating the steps of the inspection method of the optical inspection system according to the second embodiment of the present creation.
100:光學檢測系統 100: Optical inspection system
10:自動控制設備 10: Automatic control equipment
11:影像感測器 11: Image sensor
20:控制檢測模組 20: Control detection module
21:路徑單元 21: Path unit
22:比對單元 22: Comparison unit
23:顯示單元 23: display unit
30:光源 30: light source
Claims (8)
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TWI769485B (en) * | 2020-07-15 | 2022-07-01 | 國立雲林科技大學 | Optical detection system and detection method thereof |
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TWI769485B (en) * | 2020-07-15 | 2022-07-01 | 國立雲林科技大學 | Optical detection system and detection method thereof |
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