[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

TWI769485B - Optical detection system and detection method thereof - Google Patents

Optical detection system and detection method thereof Download PDF

Info

Publication number
TWI769485B
TWI769485B TW109123922A TW109123922A TWI769485B TW I769485 B TWI769485 B TW I769485B TW 109123922 A TW109123922 A TW 109123922A TW 109123922 A TW109123922 A TW 109123922A TW I769485 B TWI769485 B TW I769485B
Authority
TW
Taiwan
Prior art keywords
image information
comparison
information
automatic control
path
Prior art date
Application number
TW109123922A
Other languages
Chinese (zh)
Other versions
TW202204882A (en
Inventor
毛偉龍
陳瑩娟
吳奕廷
賴世聰
游承諺
張登文
蕭吉甫
林建州
徐榮祥
Original Assignee
國立雲林科技大學
駿曦股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 國立雲林科技大學, 駿曦股份有限公司 filed Critical 國立雲林科技大學
Priority to TW109123922A priority Critical patent/TWI769485B/en
Publication of TW202204882A publication Critical patent/TW202204882A/en
Application granted granted Critical
Publication of TWI769485B publication Critical patent/TWI769485B/en

Links

Images

Landscapes

  • Inspection Of Paper Currency And Valuable Securities (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Holo Graphy (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

本發明係關於一種光學檢測系統。該光學檢測系統包括自動控制設備、光源及控制檢測模組,其中自動控制設備具有影像感測器,並且控制檢測模組包含有路徑單元、比對單元以及顯示單元。首先,藉由路徑單元運算出路徑資訊做為自動控制設備的移動路徑,接著使用者根據路徑資訊,排除移動路徑中具有大幅度的檢測角度者,以產生最佳移動路徑資訊,之後使用者根據最佳移動路徑資訊,各自啟動或關閉每一個光源,隨後自動控制設備沿最佳移動路徑移動,藉由光感測器產生影像資訊,最後藉由比對模組辨識影像資訊上所存在的瑕疵以產生比對影像資訊,並透過顯示器顯示比對影像資訊。藉此檢測待測物上所存在的瑕疵,達成檢測瑕疵以及減少檢測時間等目的。The present invention relates to an optical detection system. The optical detection system includes an automatic control device, a light source and a control and detection module, wherein the automatic control device has an image sensor, and the control and detection module includes a path unit, a comparison unit and a display unit. First, the path information is calculated by the path unit as the moving path of the automatic control device, and then the user excludes those with a large detection angle in the moving path according to the path information, so as to generate the best moving path information, and then the user according to the path information. Optimal moving path information, each light source is turned on or off, and then the equipment is automatically controlled to move along the optimal moving path, image information is generated by the light sensor, and finally, the defects in the image information are identified by the comparison module. Generate the comparison image information, and display the comparison image information through the display. In this way, the defects existing on the object to be tested are detected, so as to achieve the purpose of detecting the defects and reducing the detection time.

Description

光學檢測系統及其檢測方法Optical detection system and detection method thereof

本發明係有關於一種檢測系統,特別係關於一種光學檢測系統及其檢測方法。The present invention relates to a detection system, in particular to an optical detection system and a detection method thereof.

近年來,為符合車輛造型設計之流行趨勢,輪圈尺寸有逐漸增大的趨勢市售車輛配備的標準輪圈,從以往的15吋,轉變為16吋,更有朝17吋發展的趨勢,而輪圈越大重量勢必越重,在講求省能低油耗的高油價時代,以鋁或鎂等合金所製造的輕合金輪圈,逐漸成為市場上的主流。In recent years, in order to conform to the popular trend of vehicle styling design, the size of the rims has gradually increased. The standard rims equipped on commercial vehicles have changed from the previous 15 inches to 16 inches, and have a trend of developing towards 17 inches. The larger the rim, the heavier it will be. In the era of high oil prices that emphasizes energy saving and low fuel consumption, light alloy rims made of alloys such as aluminum or magnesium have gradually become the mainstream in the market.

輕合金輪圈具有許多優點,以直徑13吋為例,鋁合金輪圈約比鋼圈輕11%,14吋則約輕22%,當輪徑尺寸越大則兩者重量相差越大,由於輪圈重量輕,驅動輪圈轉動的慣性阻力相對較小,將大幅提升使用者操控的靈敏度,同時亦可節省些許油耗。此外,以鋁合金之輪圈為例,其熱傳性能佳而有助於通風散熱,如此可以提高輪胎壽命,減少爆胎危險。Light alloy rims have many advantages. Taking a 13-inch diameter as an example, an aluminum alloy rim is about 11% lighter than a steel rim, and a 14-inch rim is about 22% lighter. The larger the wheel diameter, the greater the weight difference between the two. The rim is light in weight, and the inertial resistance driving the rotation of the rim is relatively small, which will greatly improve the user's control sensitivity and save a little fuel consumption. In addition, taking the aluminum alloy rim as an example, its heat transfer performance is good, which helps to ventilate and dissipate heat, which can improve the life of the tire and reduce the risk of tire blowout.

然而,使用輕合金輪圈的缺點在於,合金材質的延伸率通常較鋼材低,造成輕合金輪圈允許變形的能力較差,品質不佳的輕合金輪圈容易產生斷裂的危險。另一方面,由於製造過程較複雜,包括材質成份、鑄造技術、模具設計、熱處理過程、切削及塗裝等過程,較容易因人為疏失而產生問題。因此如何準確辨識並檢測輕合金輪圈上之瑕疵,則為研發人員應解決的問題之一。However, the disadvantage of using light alloy rims is that the elongation of the alloy material is usually lower than that of steel, resulting in a poor ability to allow deformation of the light alloy rim, and the poor quality of the light alloy rim is prone to the risk of fracture. On the other hand, due to the complex manufacturing process, including material composition, casting technology, mold design, heat treatment process, cutting and painting, etc., it is easier to cause problems due to human negligence. Therefore, how to accurately identify and detect defects on light alloy rims is one of the problems that R&D personnel should solve.

是以,本案發明人在觀察上述缺失後,而遂有本發明之產生。Therefore, the inventors of the present invention came to the present invention after observing the above-mentioned defects.

本發明的目的係提供一種光學檢測系統,其係能根據待測物之結構,產生對應之最佳移動路徑資訊,並且能夠根據最佳移動路徑調整光源,以檢測待測物表面的瑕疵,並大幅縮減檢測時間。The object of the present invention is to provide an optical inspection system, which can generate the corresponding optimal moving path information according to the structure of the object to be tested, and can adjust the light source according to the optimal moving path to detect defects on the surface of the object to be tested, and Significantly reduces detection time.

為達上述目的,本發明提供一種光學檢測系統,其係包括:一自動控制設備,其係設置於一待測物的周圍,該自動控制模組具有一影像感測器,該影像感測器拍攝該待測物並產生複數影像資訊;複數光源,其係圍繞該待測物,該等光源中的每一個根據該自動控制設備的一最佳移動路徑資訊各自啟動或關閉;以及一控制檢測模組,其係與該自動控制設備以及該等光源電性連接,該控制檢測模組係包含有一路徑單元、一比對單元及一顯示單元;其中,該路徑單元係針對該待測物之結構,運算出一路徑資訊,該路徑資訊做為該自動控制設備的移動路徑;該比對單元,其係與該路徑單元電性連接,該比對單元內儲存有複數瑕疵影像資訊,該比對單元接收該影像感測器所產生的該等影像資訊,並藉由該等瑕疵影像資訊辨識該等影像資訊上所存在的瑕疵,以產生複數比對影像資訊;以及該顯示單元,其係與該比對單元電性連接,該比對單元將該等比對影像資訊傳輸至該顯示單元,並由該顯示單元顯示該等比對影像資訊或該等影像資訊。In order to achieve the above object, the present invention provides an optical detection system, which includes: an automatic control device, which is arranged around an object to be measured, the automatic control module has an image sensor, the image sensor photographing the object to be tested and generating a plurality of image information; a plurality of light sources, which surround the object to be tested, each of the light sources is activated or deactivated according to an optimal moving path information of the automatic control device; and a control detection A module, which is electrically connected with the automatic control device and the light sources, the control and detection module includes a path unit, a comparison unit and a display unit; wherein, the path unit is directed to the object to be tested. The structure is to calculate a path information, and the path information is used as the moving path of the automatic control device; the comparison unit is electrically connected with the path unit, and the comparison unit stores a plurality of defect image information, the comparison unit The pair unit receives the image information generated by the image sensor, and identifies the defects existing in the image information by the defect image information, so as to generate a plurality of comparison image information; and the display unit, which is Electrically connected with the comparison unit, the comparison unit transmits the comparison image information to the display unit, and the display unit displays the comparison image information or the image information.

較佳地,根據本發明之光學檢測系統,其中,該等自動控制設備可以使用三軸機械手臂及多軸機械手臂其中之一。Preferably, according to the optical inspection system of the present invention, the automatic control devices can use one of a three-axis robot arm and a multi-axis robot arm.

較佳地,根據本發明之光學檢測系統,其中,該控制檢測模組可以為電腦、伺服器及智慧型手機其中之一。Preferably, according to the optical detection system of the present invention, the control detection module can be one of a computer, a server and a smart phone.

較佳地,根據本發明之光學檢測系統,其中,該影像感測器可以為工業相機及高速攝影機其中之一。Preferably, according to the optical detection system of the present invention, the image sensor can be one of an industrial camera and a high-speed camera.

較佳地,根據本發明之光學檢測系統,其中,該控制檢測模組為電腦、伺服器及智慧型手機其中之一。Preferably, according to the optical detection system of the present invention, the control detection module is one of a computer, a server and a smart phone.

較佳地,根據本發明之光學檢測系統,其中,該控制檢測模組進一步包括一設定單元,該設定單元用於設定該待測物的結構。Preferably, according to the optical detection system of the present invention, the control detection module further includes a setting unit, and the setting unit is used for setting the structure of the object to be tested.

較佳地,根據本發明之光學檢測系統,其中,該比對模組透過高斯濾波(Gaussian Blur)及二值化(Binarization)過濾該等影像資訊中的雜訊,以提高辨識該等影像資訊上所存在的瑕疵的準確率。Preferably, according to the optical detection system of the present invention, the comparison module filters the noise in the image information through Gaussian Blur and Binarization, so as to improve the identification of the image information The accuracy of the existing flaws.

較佳地,根據本發明之光學檢測系統,其中,該比對模組結合卷積神經網路辨識該等影像資訊上所存在的瑕疵。Preferably, according to the optical detection system of the present invention, the comparison module is combined with a convolutional neural network to identify defects existing in the image information.

較佳地,根據本發明之光學檢測系統,其中,該比對單元能夠分別辨識出髒粒及漆料刮兩種瑕疵。Preferably, according to the optical inspection system of the present invention, the comparison unit can respectively identify two kinds of defects: dirty particles and paint scratches.

較佳地,根據本發明之光學檢測系統,其中,該比對單元所產生的該等比對影像資訊,其係於髒粒處標示一第一警示圖案,並且於漆料刮傷處標示一第二警示圖案。Preferably, according to the optical detection system of the present invention, the comparison image information generated by the comparison unit is marked with a first warning pattern at the dirty particle, and a first warning pattern is marked at the scratch of the paint. The second warning pattern.

又,為達上述目的,本發明係根據上述光學檢測系統為基礎,進一步提供一種執行上述光學檢測系統的檢測方法,其係包含有:一模擬步驟,該光學檢測系統根據該待測物之結構,藉由該路徑單元運算出該路徑資訊,該路徑資訊做為該自動控制設備的移動路徑;一修正步驟,使用者根據該路徑資訊,排除該自動控制設備的移動路徑中具有大幅度的檢測角度者,以縮減檢測時間,並產生該自動控制設備的該最佳移動路徑資訊;一校正步驟,使用者根據該最佳移動路徑資訊,各自啟動或關閉該等光源中的每一個,以得到較清晰之該等影像資訊;一拍攝步驟,該自動控制設備根據該最佳移動路徑資訊移動,並藉由該影像感測器拍攝該待測物產生該等影像資訊;一比對步驟,比對單元接收該影像感測器所產生的該等影像資訊,並藉由該等瑕疵影像資訊辨識該等影像資訊上所存在的瑕疵,以產生該等比對影像資訊;以及一顯示步驟,該比對單元將該等比對影像資訊傳輸至該顯示單元,並由該顯示單元顯示該等比對影像資訊。Furthermore, in order to achieve the above-mentioned object, the present invention is based on the above-mentioned optical detection system, and further provides a detection method for implementing the above-mentioned optical detection system, which comprises: a simulation step, the optical detection system is based on the structure of the object to be measured. , the path information is calculated by the path unit, and the path information is used as the moving path of the automatic control device; in a correction step, the user eliminates the detection of large amplitudes in the moving path of the automatic control device according to the path information angle, in order to shorten the detection time and generate the optimal movement path information of the automatic control device; in a calibration step, the user activates or deactivates each of the light sources according to the optimal movement path information to obtain The image information is relatively clear; a photographing step, the automatic control device moves according to the optimal moving path information, and uses the image sensor to photograph the object to be tested to generate the image information; a comparison step, comparing The pair unit receives the image information generated by the image sensor, and identifies the defects existing in the image information by the defect image information, so as to generate the comparison image information; and a display step, the The comparison unit transmits the comparison image information to the display unit, and the display unit displays the comparison image information.

較佳地,其中,該警示方法進一步包括一標示步驟,該標示步驟介於該比對步驟以及該顯示步驟之間,其係透過該比對單元於髒粒處標示該第一警示圖案,並且於漆料刮傷處標示該第二警示圖案。Preferably, wherein, the warning method further includes a marking step, the marking step is between the comparing step and the displaying step, and the first warning pattern is marked at the dirty particle through the comparing unit, and The second warning pattern is marked on the scratched part of the paint.

綜上,本發明所提供之光學檢測系統及其檢測方法,主要利用本發明之光學檢測系統並搭配其檢測方法,能根據待測物之結構,產生對應之最佳移動路徑資訊,並且能夠根據最佳移動路徑調整光源,以檢測待測物表面的瑕疵,並大幅縮減檢測時間,如此一來,本發明將不受待測物之結構影響,能夠快速且全面的檢測待測物表面之瑕疵。To sum up, the optical detection system and the detection method provided by the present invention mainly utilize the optical detection system of the present invention and the detection method thereof, and can generate the corresponding optimal moving path information according to the structure of the object to be tested, and can The optimal moving path adjusts the light source to detect defects on the surface of the object to be tested, and greatly reduces the detection time. In this way, the present invention will not be affected by the structure of the object to be tested, and can quickly and comprehensively detect the surface of the object to be tested. .

爲使熟悉該項技藝人士瞭解本發明之目的、特徵及功效,茲藉由下述具體實施例,並配合所附之圖式,對本發明詳加說明如下。In order for those skilled in the art to understand the purpose, features and effects of the present invention, the present invention is described in detail as follows by means of the following specific embodiments and in conjunction with the accompanying drawings.

以下配合圖式及元件符號對本發明的實施方式作更詳細的說明,俾使其所屬技術領域中具有通常知識者在研讀本說明書後能據以實施。The embodiments of the present invention will be described in more detail below with reference to the drawings and component symbols, so that those with ordinary knowledge in the technical field can implement them accordingly after studying the description.

然而,本發明不限於本文所公開的實施例,而是將以各種形式實現。However, the present invention is not limited to the embodiments disclosed herein, but will be implemented in various forms.

以下實施例僅作為示例提供,使得所屬技術領域中具有通常知識者可以完全理解本發明的公開內容和本發明所公開的範圍。The following embodiments are provided only as examples, so that those having ordinary skill in the art can fully understand the disclosure of the present invention and the scope of the disclosure of the present invention.

因此,本發明將僅由所附申請專利範圍限定。Accordingly, the present invention should be limited only by the scope of the appended claims.

用於描述本發明的各種實施例的附圖中,所示出的形狀、尺寸、比率、數量等僅僅為示例性,並且本發明不限於此。In the drawings for describing various embodiments of the present invention, the shapes, sizes, ratios, numbers, etc. shown are merely exemplary, and the present invention is not limited thereto.

在本說明書中,相同的附圖標記通常表示相同的元件。In this specification, the same reference numerals generally refer to the same elements.

除非另有明確說明,否則對單數的任何引用可以包含複數。Any reference to the singular may include the plural unless expressly stated otherwise.

請參閱圖1至圖4所示,圖1為根據本發明第一實施例之光學檢測系統的示意圖。如圖1所示,根據本發明之光學檢測系統100包括:自動控制設備10、控制檢測模組20、光源30。Please refer to FIG. 1 to FIG. 4 . FIG. 1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention. As shown in FIG. 1 , the optical detection system 100 according to the present invention includes: an automatic control device 10 , a control detection module 20 , and a light source 30 .

具體地,在本實施例中,該待測物200為輪圈,其材質係可以為鐵、鋁及鎂其中之一或其組合,然而本發明不限於此。Specifically, in this embodiment, the object to be tested 200 is a wheel rim, and its material can be one or a combination of iron, aluminum and magnesium, but the present invention is not limited thereto.

該自動控制設備10,其係設置於待測物200的周圍,並且自動控制設備10具有影像感測器11,影像感測器11係拍攝待測物200並產生複數影像資訊111。The automatic control device 10 is disposed around the object to be tested 200 , and the automatic control device 10 has an image sensor 11 . The image sensor 11 captures the object to be tested 200 and generates complex image information 111 .

具體地,根據本發明之自動控制設備10可以為三軸機械手臂及多軸機械手臂其中之一,然而本發明不限於此。自動控制設備10與控制檢測模組20電性連接,並且接收控制檢測模組20之指令控制並移動,以使自動控制設備10上之影像感測器11可以完整拍攝待測物200之表面。Specifically, the automatic control device 10 according to the present invention may be one of a three-axis robot arm and a multi-axis robot arm, but the present invention is not limited thereto. The automatic control device 10 is electrically connected with the control and detection module 20 , and receives the command of the control and detection module 20 to control and move, so that the image sensor 11 on the automatic control device 10 can completely photograph the surface of the object to be tested 200 .

具體地,根據本發明之影像感測器11可以為工業相機及高速攝影機其中之一,然而本發明不限於此。需要進一步說明的是,相比使用一般相機,使用工業相機的優點在於穩定性高、容易安裝、結構穩定不易損壞及連續工作時間長等,因此影像感測器11使用工業相機拍攝效果較佳,然而缺點在於大幅提高作業成本且作業時間較長。Specifically, the image sensor 11 according to the present invention may be one of an industrial camera and a high-speed camera, but the present invention is not limited thereto. It should be further explained that, compared with using a general camera, the advantages of using an industrial camera are high stability, easy installation, stable structure and not easy to be damaged, and a long continuous working time. However, the disadvantage is that the operation cost is greatly increased and the operation time is long.

請參閱圖2及圖3所示,圖2為根據本發明第一實施例之光學檢測系統設置位置示意圖,圖3為根據本發明第一實施例之光學檢測系統架構示意圖。根據本發明之控制檢測模組20係與自動控制設備10以及光源30電性連接,控制檢測模組20包含:路徑單元21、比對單元22及顯示單元23。Please refer to FIG. 2 and FIG. 3 , FIG. 2 is a schematic diagram of the arrangement position of the optical detection system according to the first embodiment of the present invention, and FIG. 3 is a schematic diagram of the structure of the optical detection system according to the first embodiment of the present invention. The control and detection module 20 according to the present invention is electrically connected with the automatic control device 10 and the light source 30 . The control and detection module 20 includes a path unit 21 , a comparison unit 22 and a display unit 23 .

具體地,根據本發明之控制檢測模組20可以為電腦、伺服器及智慧型手機其中之一,然而本發明不限於此。Specifically, the control and detection module 20 according to the present invention may be one of a computer, a server and a smart phone, but the present invention is not limited thereto.

該路徑單元21,其係根據待測物200的結構,運算出路徑資訊211(圖未示)作為自動控制設備10的移動路徑,當路徑資訊211作為自動控制設備10的移動路徑時,可以保證自動控制設備10上之影像感測器11完整拍攝待測物200之表面。The path unit 21 calculates the path information 211 (not shown) as the moving path of the automatic control device 10 according to the structure of the object to be tested 200 . When the path information 211 is used as the moving path of the automatic control device 10 , it is guaranteed that The image sensor 11 on the automatic control device 10 completely captures the surface of the object to be tested 200 .

需要進一步說明的是,路徑資訊211並非自動控制設備10的最佳移動路徑,其中某些移動可能包含有大幅度的檢測角度,從而造成檢測時間變長,因此根據本發明第一實施例之光學檢測系統100,在路徑單元21運算出路徑資訊211作為自動控制設備10的移動路徑後,使用者可以根據路徑資訊211並去除其中具有大幅度的檢測角度之路徑資訊,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,有效減少光學檢測系統100的檢測時間。It should be further explained that the path information 211 is not the optimal moving path of the automatic control device 10, and some of the movements may include a large detection angle, which will result in a longer detection time. Therefore, the optical system according to the first embodiment of the present invention In the detection system 100, after the path unit 21 calculates the path information 211 as the moving path of the automatic control device 10, the user can obtain the optimal moving path by removing the path information with a large detection angle according to the path information 211. The information 212 is used as the moving path of the automatic control device 10 , which effectively reduces the detection time of the optical detection system 100 .

請參閱圖2所示,並搭配圖5所示,該比對單元22係與路徑單元21電性連接,比對單元22內儲存有複數瑕疵影像資訊221(圖未示),比對單元22接收該影像感測器11所產生的該等影像資訊111,並藉由該等瑕疵影像資訊221辨識該等影像資訊111上所存在的瑕疵,以產生複數比對影像資訊222。Please refer to FIG. 2 , in conjunction with FIG. 5 , the comparison unit 22 is electrically connected to the path unit 21 , and the comparison unit 22 stores a plurality of defective image information 221 (not shown), and the comparison unit 22 The image information 111 generated by the image sensor 11 is received, and the defects existing in the image information 111 are identified by the defect image information 221 to generate a plurality of comparison image information 222 .

具體地,根據本發明第一實施例之瑕疵影像資訊221,其中瑕疵可以包含有雜質、凸點、黑點、棉絮、縮孔、凹洞、磨痕、刮線、刮痕、碰傷、異色、刀痕、缺肉、毛頭、崩漆、流漆、薄噴、高亮銀色差等,上述皆為在輪圈生產的各個階段中所產生的各種製造失誤,然而本發明不限於此。Specifically, according to the defect image information 221 according to the first embodiment of the present invention, the defects may include impurities, bumps, black spots, cotton wool, shrinkage holes, dents, wear marks, scratch lines, scratches, bumps, and different colors , knife marks, lack of meat, bristle, chipping paint, flowing paint, thin spraying, high-gloss silver difference, etc., all of the above are various manufacturing errors generated in various stages of rim production, but the present invention is not limited to this.

該顯示單元23,係與比對單元22電性連接,比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222或該等影像資訊111。具體地,根據本發明之顯示單元23可以為液晶顯示器、發光二極體顯示器或有機發光二極體顯示器,然而本發明不限於此。The display unit 23 is electrically connected to the comparison unit 22, the comparison unit 22 transmits the comparison image information 222 to the display unit 23, and the display unit 23 displays the comparison image information 222 or the images Information 111. Specifically, the display unit 23 according to the present invention may be a liquid crystal display, a light emitting diode display or an organic light emitting diode display, but the present invention is not limited thereto.

請參閱圖4所示,並搭配圖3所示,圖4為根據本發明第一實施例之光源設置位置示意圖。在本實施例中,該等光源30係圍繞待測物200設置,光源30之具體數量為7個,然而本發明不限於此,使用者可以根據需求增加或減少該等光源30之數量,並且光源30係與該控制檢測模組20電性連接。具體地,根據本發明之光源30可以使用發光二極體及有機發光二極體其中之一或其組合,然而本發明不限於此。Please refer to FIG. 4 , in conjunction with FIG. 3 . FIG. 4 is a schematic diagram of the arrangement position of the light source according to the first embodiment of the present invention. In this embodiment, the light sources 30 are arranged around the object to be tested 200, and the specific number of the light sources 30 is 7, however, the present invention is not limited to this, and the user can increase or decrease the number of the light sources 30 according to requirements, and The light source 30 is electrically connected to the control and detection module 20 . Specifically, the light source 30 according to the present invention may use one or a combination of light emitting diodes and organic light emitting diodes, but the present invention is not limited thereto.

需要進一步說明的是,如上所述,根據本發明之光學檢測系統100,其係將根據待測物200之結構而產生的最佳移動路徑資訊212作為自動控制設備10的移動路徑,在本實施例中,由於待測物200為金屬材質,因此其表面存在光澤並且容易反光,造成在自動控制設備10移動並以不同角度拍攝待測物200之表面時,影像感測器11無法拍攝出清晰的影像資訊111,從而使比對單元22在辨識瑕疵時難以實行,造成檢測結果錯誤或檢測次數增加。It should be further explained that, as mentioned above, according to the optical detection system 100 of the present invention, the optimal moving path information 212 generated according to the structure of the object to be tested 200 is used as the moving path of the automatic control device 10. In this implementation In the example, since the object to be tested 200 is made of metal, its surface is shiny and easy to reflect light, so that when the automatic control device 10 moves and shoots the surface of the object to be tested 200 at different angles, the image sensor 11 cannot take a clear picture. Therefore, it is difficult for the comparison unit 22 to identify defects, resulting in incorrect detection results or an increase in the number of detections.

因此,在本實施例中,使用者可以根據作為自動控制設備10的移動路徑之最佳移動路徑資訊212,將該等光源30中的每一個各自開啟或關閉,以減少待測物表面反光的程度,從而保證影像感測器11拍攝出清晰的影像資訊111,以供比對單元22辨識該等影像資訊111上之瑕疵,以提升根據本發明之光學檢測系統100檢測瑕疵的準確性。Therefore, in this embodiment, the user can turn on or off each of the light sources 30 individually according to the optimal movement path information 212 as the movement path of the automatic control device 10 to reduce the reflection of light on the surface of the object to be measured. This ensures that the image sensor 11 captures clear image information 111 for the comparison unit 22 to identify the defects on the image information 111, so as to improve the detection accuracy of the optical inspection system 100 according to the present invention.

請參閱圖5所示,圖5為根據本發明第一實施例之比對單元辨識影像資訊之過程的流程示意圖。該比對單元22,首先對該等影像資訊111進行高斯濾波,將影像資訊111中像素的加權平均值代替影像資訊111中的每個像素的值,降低影像資訊111灰度的劇烈變化從而降低雜訊,然而如圖5所示,進行高斯濾波後必然造成影像資訊111邊緣及輪廓模糊;接著比對單元22,對該等影像資訊111進行二值化,將影像資訊111中大於預設臨界灰度值的像素灰度設為灰度極大值,並把小於預設臨界灰度值的像素灰度設為灰度極小值,從而實現二值化並過濾該等影像資訊111中的雜訊,從而提高比對單元22辨識該等影像資訊111上所存在的瑕疵之準確度。Please refer to FIG. 5 , which is a schematic flowchart of a process of identifying image information by the comparison unit according to the first embodiment of the present invention. The comparison unit 22 first performs Gaussian filtering on the image information 111 , and replaces the value of each pixel in the image information 111 with the weighted average value of the pixels in the image information 111 , thereby reducing the drastic change in the gray level of the image information 111 and thereby reducing the However, as shown in FIG. 5 , the edges and contours of the image information 111 are bound to be blurred after Gaussian filtering. Then, the comparison unit 22 binarizes the image information 111, and sets the image information 111 that is larger than a predetermined threshold. The pixel grayscale of the grayscale value is set as the grayscale maximum value, and the pixel grayscale less than the preset critical grayscale value is set as the grayscale minimum value, so as to realize binarization and filter the noise in the image information 111 , so as to improve the accuracy of the comparison unit 22 in identifying the defects existing in the image information 111 .

為供進一步瞭解本發明構造特徵、運用技術手段及所預期達成之功效,茲將本發明使用方式加以敘述,相信當可由此而對本發明有更深入且具體瞭解,如下所述:In order to further understand the structural features of the present invention, the application of technical means and the expected effect, the usage mode of the present invention is described here.

請參閱圖6及圖7所示,並且搭配圖3至圖5所示,圖6為根據本發明第一實施例之光學檢測系統辨識結果示意圖,圖7為說明執行本發明第一實施例的光學檢測系統之檢測方法的步驟流程圖。本發明以上述之光學檢測系統100為基礎,進一步提供一種光學檢測系統100的檢測方法,係包含下列步驟:Please refer to FIG. 6 and FIG. 7 , in conjunction with FIG. 3 to FIG. 5 , FIG. 6 is a schematic diagram of the identification result of the optical detection system according to the first embodiment of the present invention, and FIG. 7 is a diagram illustrating the execution of the first embodiment of the present invention. The flow chart of the steps of the detection method of the optical detection system. The present invention is based on the above-mentioned optical detection system 100, and further provides a detection method of the optical detection system 100, which includes the following steps:

模擬步驟S1,光學檢測系統100根據待測物200之結構,藉由路徑單元21運算出該路徑資訊211,路徑資訊211可以做為自動控制設備10的移動路徑,接著執行修正步驟S2。In the simulation step S1, the optical detection system 100 calculates the path information 211 through the path unit 21 according to the structure of the object to be tested 200. The path information 211 can be used as the moving path of the automatic control device 10, and then performs the correction step S2.

修正步驟S2,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,以縮減檢測時間,接著執行校正步驟S3。In the correction step S2, the user removes those with a large detection angle according to the path information 211, thereby obtaining the optimal moving path information 212 as the moving path of the automatic control device 10 to shorten the detection time, and then execute the correction step S3.

校正步驟S3,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉複數光源30中的每一個,從而保證影像感測器11能夠拍攝出清晰的影像資訊111,之後執行拍攝步驟S4。In the calibration step S3, the user activates or deactivates each of the plurality of light sources 30 respectively according to the optimal moving path information 212 generated in the calibration step S2, so as to ensure that the image sensor 11 can capture the clear image information 111, and then The photographing step S4 is performed.

拍攝步驟S4,該自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面,產生清晰的影像資訊111,並執行比對步驟S5。In the photographing step S4, the automatic control device 10 moves according to the optimal moving path information 212 generated in the correcting step S2, and uses the image sensor 11 to photograph the surface of the object to be tested 200 to generate clear image information 111, and performs a comparison. to step S5.

比對步驟S5,藉由比對單元22接收影像感測器11所產生的該等影像資訊111,藉由儲存於該比對單元22中的瑕疵影像資訊辨221以辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222,接著執行顯示步驟S6。In the comparison step S5, the image information 111 generated by the image sensor 11 is received by the comparison unit 22, and the image information 111 is identified by the defective image information 221 stored in the comparison unit 22. Existing flaws are detected, and complex comparison image information 222 is generated, and then the display step S6 is performed.

顯示步驟S6,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。In the display step S6, the comparison image information 222 is transmitted to the display unit 23 by the comparison unit 22, and the display unit 23 displays the comparison image information 222.

舉例而言,請參閱圖6,並且搭配圖3至圖7所示,圖6為根據本發明第一實施例之光學檢測系統辨識結果示意圖。根據本發明之光學檢測系統100,首先執行模擬步驟S1,藉由路徑單元21運算出該路徑資訊211;接著執行修正步驟S2,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑;之後執行校正步驟S3,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉該等光源30中的每一個;之後執行拍攝步驟S4,自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面;拍攝完成後進入比對步驟S5,藉由比對單元22,辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222;最後執行顯示步驟S6,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。。For example, please refer to FIG. 6 , in conjunction with FIG. 3 to FIG. 7 , FIG. 6 is a schematic diagram of the identification result of the optical detection system according to the first embodiment of the present invention. According to the optical detection system 100 of the present invention, firstly, the simulation step S1 is performed, and the path information 211 is calculated by the path unit 21; then, the correction step S2 is performed, and the user removes those with a large detection angle according to the path information 211, thereby The optimal movement path information 212 is obtained as the movement path of the automatic control device 10; then the calibration step S3 is executed, and the user activates or deactivates the light sources 30 according to the optimal movement path information 212 generated in the calibration step S2. Each; then perform the photographing step S4, the automatic control device 10 moves according to the optimal moving path information 212 generated in the correcting step S2, and uses the image sensor 11 to photograph the surface of the object to be tested 200; After the photographing is completed, enter the comparison In step S5, the comparison unit 22 identifies the defects existing in the image information 111, and generates a plurality of comparison image information 222; finally, the display step S6 is performed, and the comparison unit 22 uses the comparison image information 222. It is transmitted to the display unit 23 , and the display unit 23 displays the comparison image information 222 . .

需進一步說明的是,在本實施例中,於比對步驟S5時,該比對單元22首先對該等影像資訊111進行高斯濾波,將影像資訊111中像素的加權平均值代替影像資訊111中的每個像素的值,降低影像資訊111灰度的劇烈變化從而降低雜訊,然而如圖5所示,進行高斯濾波後必然造成影像資訊111邊緣及輪廓模糊;接著比對單元22對等影像資訊111進行二值化,將影像資訊111中大於預設臨界灰度值的像素灰度設為灰度極大值,並把小於預設臨界灰度值的像素灰度設為灰度極小值,從而實現二值化並對濾該等影像資訊111中的雜訊,進而提高比對單元22辨識該等影像資訊111上所存在的瑕疵之準確度。It should be further noted that, in the present embodiment, in the comparison step S5 , the comparison unit 22 first performs Gaussian filtering on the image information 111 , and replaces the weighted average of the pixels in the image information 111 with the weighted average value of the pixels in the image information 111 . However, as shown in FIG. 5 , after Gaussian filtering, the edges and contours of the image information 111 are bound to be blurred; then the comparison unit 22 aligns the images The information 111 is binarized, and the pixel gray level greater than the preset critical gray value in the image information 111 is set as the gray maximum value, and the pixel gray level smaller than the preset critical gray value is set as the gray minimum value, Therefore, binarization is realized and the noise in the image information 111 is filtered, thereby improving the accuracy of the comparison unit 22 in identifying the defects existing in the image information 111 .

藉此,由上述說明可得知,根據本發明所提供之光學檢測系統100並搭配其檢測方法,係能夠產生針對待測物200之結構在檢測時的最佳移動路徑資訊212,並藉由該最佳移動路徑資訊212搭配合適的光源30配置,準確辨識待測物200表面所存在之瑕疵,如此一來,根據本發明所提供之光學檢測系統100將不受待測物200之結構影響,能夠快速且全面的檢測待測物200表面之瑕疵。Therefore, it can be known from the above description that the optical detection system 100 provided by the present invention and the detection method thereof can generate the optimal moving path information 212 for the structure of the object to be tested 200 during detection. The optimal moving path information 212 is matched with a suitable configuration of the light source 30 to accurately identify the defects existing on the surface of the object to be tested 200 . In this way, the optical inspection system 100 provided according to the present invention will not be affected by the structure of the object to be tested 200 . , which can quickly and comprehensively detect defects on the surface of the object to be tested 200 .

請參閱圖8及圖9所示,圖8為根據本發明第二實施例之光學檢測系統辨識結果示意圖,圖9為說明執行本發明第二實施例的光學檢測系統之檢測方法的步驟流程圖。第二實施例相較於第一實施例,第二實施例的主要差異在於,該比對單元22進一步結合卷積神經網路(圖未示)並搭配該等瑕疵影像資訊221,從而增進比對單元22辨識該等影像資訊111上所存在的瑕疵之速度及準確性。需要進一步說明的是,類神經網路(Artificial Neural Network)為一種模仿生物神經網路的結構和功能的數學模型或計算模型,而其中卷積類神經網路則進一步加入區塊的概念,以鎖定具有區域性質的資料型態,如此一來,結合使用卷積類神經網路可以使比對單元22運算效能大幅提升。在第二實施例中,比對單元22可以進一步分別辨識出髒粒及漆料刮傷兩種瑕疵,因此比對單元22可以於髒粒處標示第一警示圖案41,並且於漆料刮傷處標示第二警示圖案42。Please refer to FIG. 8 and FIG. 9 , FIG. 8 is a schematic diagram of the identification result of the optical detection system according to the second embodiment of the present invention, and FIG. 9 is a flowchart illustrating the steps of executing the detection method of the optical detection system according to the second embodiment of the present invention . Compared with the first embodiment, the main difference between the second embodiment and the second embodiment is that the comparison unit 22 is further combined with a convolutional neural network (not shown) and matched with the defective image information 221, thereby improving the ratio The speed and accuracy of identifying defects existing in the image information 111 for the unit 22 . It needs to be further explained that the artificial neural network is a mathematical model or computational model that imitates the structure and function of the biological neural network, and the convolutional neural network further adds the concept of blocks to Locking the data type with regional properties, in this way, the operation performance of the comparison unit 22 can be greatly improved by using the convolutional neural network in combination. In the second embodiment, the comparison unit 22 can further identify two kinds of defects, dirty particles and paint scratches, respectively. Therefore, the comparison unit 22 can mark the first warning pattern 41 at the dirty particles and paint scratches. The second warning pattern 42 is marked there.

藉此,第二實施例不僅能達到第一實施例之功效,同時能夠進一步辨識並分類瑕疵之種類並於瑕疵處標示明顯之標記,比對單元22透過結合卷積類神經網路,大幅提升根據本發明之光學檢測系統100之適用性及便利性。In this way, the second embodiment can not only achieve the effect of the first embodiment, but also can further identify and classify the types of defects and mark obvious marks at the defects. The comparison unit 22 can greatly improve the performance of Applicability and convenience of the optical detection system 100 according to the present invention.

請參閱圖9所示,並搭配圖8所示,圖9為說明執行本發明第二實施例的光學檢測系統之警示方法的步驟流程圖。本發明以第二實施例之光學檢測系統100為基礎,進一步提供一種光學檢測系統1的檢測方法,係包含下列步驟:Please refer to FIG. 9 in conjunction with FIG. 8 . FIG. 9 is a flow chart illustrating the steps of executing the warning method of the optical detection system according to the second embodiment of the present invention. Based on the optical detection system 100 of the second embodiment, the present invention further provides a detection method of the optical detection system 1, which includes the following steps:

擬步驟S1’,光學檢測系統100根據待測物200之結構,藉由路徑單元21運算出該路徑資訊211,路徑資訊211可以做為自動控制設備10的移動路徑,接著執行修正步驟S2’。Similar to step S1', the optical detection system 100 calculates the path information 211 through the path unit 21 according to the structure of the object to be tested 200, and the path information 211 can be used as the moving path of the automatic control device 10, and then executes the correction step S2'.

修正步驟S2’,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑,以縮減檢測時間,接著執行校正步驟S3。In the correction step S2', the user removes those with a large detection angle according to the path information 211, thereby obtaining the optimal movement path information 212 as the movement path of the automatic control device 10 to shorten the detection time, and then execute the correction step S3.

校正步驟S3’,使用者根據修正步驟S2’所產生之最佳移動路徑資訊212,分別各自啟動或關閉複數光源30中的每一個,從而保證影像感測器11能夠拍攝出清晰的影像資訊111,之後執行拍攝步驟S4。In the calibration step S3 ′, the user activates or deactivates each of the plurality of light sources 30 respectively according to the optimal moving path information 212 generated in the calibration step S2 ′, so as to ensure that the image sensor 11 can capture the clear image information 111 , and then execute the shooting step S4.

拍攝步驟S4’,該自動控制設備10根據修正步驟S2所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面,產生清晰的影像資訊111,並執行比對步驟S5’。In the photographing step S4 ′, the automatic control device 10 moves according to the optimal moving path information 212 generated in the correction step S2 , and uses the image sensor 11 to photograph the surface of the object to be tested 200 to generate clear image information 111 , and execute Compare step S5'.

比對步驟S5’,藉由比對單元22接收影像感測器11所產生的該等影像資訊111,藉由儲存於該比對單元22中的瑕疵影像資訊辨221並搭配卷積神經網路,以辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222,接著執行標示步驟S7’。In the comparison step S5 ′, the image information 111 generated by the image sensor 11 is received by the comparison unit 22 , and the defective image information 221 stored in the comparison unit 22 is identified and matched with a convolutional neural network, In order to identify the defects existing in the image information 111, a plurality of comparison image information 222 is generated, and then the marking step S7' is performed.

標示步驟S7’,藉由比對單元22結合卷積神經網路分別辨識出髒粒及漆料刮傷兩種瑕疵,比對單元22在該等比對影像資訊222上於髒粒處標示第一警示圖案41,並於漆料刮傷處標示第二警示圖案42,之後執行顯示步驟S6’。In step S7 ′, the comparison unit 22 and the convolutional neural network are used to identify two kinds of defects, dirty particles and paint scratches, respectively. The comparison unit 22 marks the first place on the dirty particles on the comparison image information 222 . The warning pattern 41 is marked, and the second warning pattern 42 is marked on the scratched part of the paint, and then the display step S6' is performed.

顯示步驟S6’,藉由比對單元22將該等比對影像資訊222傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。In the display step S6', the comparison unit 22 transmits the comparison image information 222 to the display unit 23, and the display unit 23 displays the comparison image information 222.

舉例而言,請參閱圖8,並且搭配圖3、圖4及圖9所示。根據本發明之光學檢測系統100,首先執行擬步驟S1’,藉由路徑單元21運算出該路徑資訊211;接著執行修正步驟S2’,使用者根據路徑資訊211去除其中具有大幅度的檢測角度者,從而得出最佳移動路徑資訊212作為自動控制設備10的移動路徑;之後執行校正步驟S3’,使用者根據修正步驟S2所產生之最佳移動路徑資訊212,分別各自啟動或關閉該等光源30中的每一個;之後執行拍攝步驟S4’,自動控制設備10根據修正步驟S2’所產生之最佳移動路徑資訊212移動,並藉由影像感測器11拍攝待測物200之表面;拍攝完成後進入比對步驟S5’,藉由比對單元221並搭配卷積神經網路,以辦識該等影像資訊111上所存在的瑕疵,並產生複數比對影像資訊222;接著在辨識完成後執行標示步驟S7’,藉由比對單元22結合卷積神經網路分別辨識出髒粒及漆料刮傷兩種瑕疵,該比對單元22在該等比對影像資訊222上於髒粒處標示第一警示圖案41,並於漆料刮傷處標示第二警示圖案42;最後執行顯示步驟S6’,將該等包含有第一警示圖案41以及第二警示圖案42之比對影像資訊222,藉由比對單元22傳輸至顯示單元23,並由顯示單元23顯示該等比對影像資訊222。For example, please refer to FIG. 8 in conjunction with FIG. 3 , FIG. 4 and FIG. 9 . According to the optical detection system 100 of the present invention, the pseudo-step S1 ′ is first performed, and the path information 211 is calculated by the path unit 21 ; then the correction step S2 ′ is performed, and the user removes the detection angle with a large magnitude according to the path information 211 . , so as to obtain the optimal moving path information 212 as the moving path of the automatic control device 10 ; after that, the calibration step S3 ′ is executed, and the user activates or deactivates the light sources respectively according to the optimal moving path information 212 generated in the modification step S2 . 30; after that, the photographing step S4' is performed, the automatic control device 10 moves according to the optimal movement path information 212 generated in the correcting step S2', and the surface of the object to be tested 200 is photographed by the image sensor 11; photographing After completion, enter the comparison step S5 ′, and use the comparison unit 221 and the convolutional neural network to identify the defects existing in the image information 111 , and generate a complex number of comparison image information 222 ; and then after the identification is completed Carrying out the marking step S7 ′, by combining the convolutional neural network with the comparison unit 22 to identify two kinds of defects, dirty particles and paint scratches, respectively, and the comparison unit 22 marks the dirty particles on the comparison image information 222 The first warning pattern 41 is marked with the second warning pattern 42 at the scratched part of the paint; finally, the displaying step S6 ′ is executed to compare the image information 222 including the first warning pattern 41 and the second warning pattern 42 , The comparison image information 222 is transmitted to the display unit 23 by the comparison unit 22 , and the display unit 23 displays the comparison image information 222 .

值得一提的是,儘管上方之描述是基於比對單元22辨識髒粒及漆料刮傷進行說明,但本發明不限於此,如雜質、凸點、黑點、棉絮、縮孔、凹洞、磨痕、刮線、刮痕、碰傷、異色、刀痕、缺肉、毛頭、崩漆、流漆、薄噴、高亮銀色差等,當比對單元22內部儲存有足夠的瑕疵影像資訊221並且結合使用卷積類神經網路時,比對單元22能夠進一步分別單獨辨識出上述之瑕疵或其組合,並一一標示不同的警示圖案以方便使用者辨識。It is worth mentioning that although the above description is based on the identification of dirt particles and paint scratches by the comparison unit 22, the present invention is not limited to this, such as impurities, bumps, black spots, cotton wool, shrinkage holes, and concave holes. , wear marks, scratches, scratches, bumps, discoloration, knife marks, lack of flesh, burrs, cracked paint, flowing paint, thin spray, high-brightness silver difference, etc., when the comparison unit 22 stores enough defective images When the information 221 is combined with a convolutional neural network, the comparison unit 22 can further identify the above-mentioned defects or their combination individually, and mark different warning patterns one by one to facilitate the user to identify.

藉此,本發明具有以下之實施功效及技術功效:Thereby, the present invention has the following implementation effect and technical effect:

其一,藉由本發明之之光學檢測系統100為基礎,並搭配本發明所提供之檢測方法,其係能根據待測物200之結構,產生對應之最佳移動路徑資訊212,並且能夠根據最佳移動路徑212調整該等光源30,以檢測待測物200表面的瑕疵,並大幅縮減檢測時間。First, based on the optical detection system 100 of the present invention and the detection method provided by the present invention, it can generate the corresponding optimal moving path information 212 according to the structure of the object to be tested 200, and can The optimal moving path 212 adjusts the light sources 30 to detect the defects on the surface of the object to be tested 200 and greatly reduces the detection time.

其二,本發明透過將比對單元22結合卷積神經網路,能夠實現辨識並分類瑕疵之種類並於瑕疵處標示明顯之標記,大幅提升根據本發明之光學檢測系統100之適用性及便利性。Second, by combining the comparison unit 22 with the convolutional neural network, the present invention can identify and classify the types of defects and mark the defects with obvious marks, which greatly improves the applicability and convenience of the optical inspection system 100 according to the present invention. sex.

以上係藉由特定的具體實施例說明本發明之實施方式,所屬技術領域具有通常知識者可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。The embodiments of the present invention are described above by means of specific embodiments. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

儘管本發明是透過參考附圖中所描繪的實施例進行說明,但其僅為實施例,本領域中具有通常知識者應當理解的是可以對其進行各種改變以及變形。然而,這些改變以及變形不應脫離本發明所保護的範圍。因此,本發明的保護範圍必須被限定於所附的申請專利範圍。Although the present invention has been described with reference to the embodiments depicted in the accompanying drawings, these are merely embodiments and it will be understood by those skilled in the art that various changes and modifications may be made thereto. However, these changes and modifications should not depart from the scope of protection of the present invention. Therefore, the protection scope of the present invention must be limited to the appended claims.

100:光學檢測系統 10:自動控制設備 11:影像感測器 111:影像資訊 20:控制檢測模組 21:路徑單元 211:路徑資訊 212:最佳移動路徑資訊 22:比對單元 221:瑕疵影像資訊 222:比對影像資訊 23:顯示單元 30:光源 41:第一警示圖案 42:第二警示圖案 200:待測物 S1:模擬步驟 S2:修正步驟 S3:校正步驟 S4:拍攝步驟 S5:比對步驟 S6:顯示步驟 S1’:模擬步驟 S2’:修正步驟 S3’:校正步驟 S4’:拍攝步驟 S5’:比對步驟 S6’:顯示步驟 S7’:標示步驟100: Optical Inspection System 10: Automatic control equipment 11: Image sensor 111: Video Information 20: Control detection module 21: Path unit 211: Path information 212: Best moving path information 22: Comparison unit 221: Flawed image information 222: Compare image information 23: Display unit 30: Light source 41: The first warning pattern 42: Second warning pattern 200: Object to be tested S1: Simulation step S2: Correction steps S3: Calibration step S4: Shooting steps S5: comparison step S6: Display steps S1': Simulation step S2': Correction step S3': Calibration step S4': Shooting steps S5': comparison step S6': Display steps S7': marking step

圖1為根據本發明第一實施例之光學檢測系統的示意圖; 圖2為根據本發明第一實施例之光學檢測系統設置位置示意圖; 圖3為根據本發明第一實施例之光學檢測系統架構示意圖; 圖4為根據本發明第一實施例之光源設置位置示意圖; 圖5為根據本發明第一實施例之比對單元辨識影像資訊之過程的流程示意圖; 圖6為根據本發明第一實施例之光學檢測系統辨識結果示意圖; 圖7為說明執行本發明第一實施例的光學檢測系統之檢測方法的步驟流程圖; 圖8為根據本發明第二實施例之光學檢測系統辨識結果示意圖; 圖9為說明執行本發明第二實施例的光學檢測系統之檢測方法的步驟流程圖。1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention; FIG. 2 is a schematic diagram of the setting position of the optical detection system according to the first embodiment of the present invention; FIG. 3 is a schematic diagram of the structure of the optical detection system according to the first embodiment of the present invention; FIG. 4 is a schematic diagram of the arrangement position of the light source according to the first embodiment of the present invention; 5 is a schematic flowchart of a process of identifying image information by the comparison unit according to the first embodiment of the present invention; 6 is a schematic diagram of the identification result of the optical detection system according to the first embodiment of the present invention; 7 is a flow chart illustrating the steps of implementing the detection method of the optical detection system according to the first embodiment of the present invention; 8 is a schematic diagram showing the identification result of the optical detection system according to the second embodiment of the present invention; FIG. 9 is a flowchart illustrating the steps of implementing the detection method of the optical detection system according to the second embodiment of the present invention.

100:光學檢測系統100: Optical Inspection System

10:自動控制設備10: Automatic control equipment

11:影像感測器11: Image sensor

20:控制檢測模組20: Control detection module

21:路徑單元21: Path unit

22:比對單元22: Comparison unit

23:顯示單元23: Display unit

30:光源30: Light source

Claims (10)

一光學檢測系統,其係包括:一自動控制設備,其係設置於一待測物的周圍,該自動控制模組具有一影像感測器,該影像感測器拍攝該待測物並產生複數影像資訊;複數光源,該等光源係圍繞該待測物設置,該等光源中的每一個根據該自動控制設備的一最佳移動路徑資訊各自啟動或關閉;以及一控制檢測模組,其係與該自動控制設備以及該等光源電性連接,該控制檢測模組係包含有一路徑單元、一比對單元及一顯示單元;其中,該路徑單元係針對該待測物之結構,運算出一路徑資訊,該路徑資訊做為該自動控制設備的移動路徑;該比對單元,其係與該路徑單元電性連接,該比對單元內儲存有複數瑕疵影像資訊,該比對單元接收該影像感測器所產生的該等影像資訊,並藉由該等瑕疵影像資訊辨識該等影像資訊上所存在的瑕疵,以產生複數比對影像資訊;以及該顯示單元,其係與該比對單元電性連接,該比對單元將該等比對影像資訊傳輸至該顯示單元,並由該顯示單元顯示該等比對影像資訊及該等影像資訊其中之一或其組合;其中,該最佳移動路徑資訊係根據該路徑資訊,排除該自動控制設備的移動路徑中具有大幅度的檢測角度者,並且產生該自動控制設備的該最佳移動路徑資訊。 An optical detection system includes: an automatic control device, which is arranged around an object to be measured, the automatic control module has an image sensor, and the image sensor captures the object to be measured and generates a plurality of image information; a plurality of light sources, the light sources are arranged around the object to be tested, each of the light sources is activated or deactivated according to an optimal moving path information of the automatic control device; and a control detection module, which is Electrically connected with the automatic control device and the light sources, the control and detection module includes a path unit, a comparison unit and a display unit; wherein, the path unit calculates a path information, the path information is used as the moving path of the automatic control device; the comparison unit is electrically connected with the path unit, the comparison unit stores plural defective image information, and the comparison unit receives the image The image information generated by the sensor, and identifying the defects existing in the image information by the defect image information, so as to generate a plurality of comparison image information; and the display unit, which is related to the comparison unit electrically connected, the comparison unit transmits the comparison image information to the display unit, and the display unit displays the comparison image information and one or a combination of the image information; The movement path information is based on the path information to exclude those with a large detection angle in the movement path of the automatic control device, and generate the optimal movement path information of the automatic control device. 如請求項1所述的光學檢測系統,其中,該自動控制設備為三軸機械手臂及多軸機械手臂其中之一。 The optical inspection system according to claim 1, wherein the automatic control device is one of a three-axis robot arm and a multi-axis robot arm. 如請求項1所述的光學檢測系統,其中,該影像感測器為工業相機及高速攝影機其中之一。 The optical detection system of claim 1, wherein the image sensor is one of an industrial camera and a high-speed camera. 如請求項1所述的光學檢測系統,其中,該控制檢測模組為電腦、伺服器及智慧型手機其中之一。 The optical detection system according to claim 1, wherein the control detection module is one of a computer, a server and a smart phone. 如請求項1所述的光學檢測系統,其中,該比對單元透過高斯濾波及二值化過濾該等影像資訊中的雜訊,以提高辨識該等影像資訊上所存在的瑕疵的準確率。 The optical inspection system according to claim 1, wherein the comparison unit filters the noise in the image information through Gaussian filtering and binarization, so as to improve the accuracy of identifying defects existing in the image information. 如請求項1所述的光學檢測系統,其中,該比對單元結合卷積神經網路辨識該等影像資訊上所存在的瑕疵。 The optical inspection system as claimed in claim 1, wherein the comparison unit is combined with a convolutional neural network to identify defects existing in the image information. 如請求項6所述的光學檢測系統,其中,該待測物為一輪圈,並且該等影像資訊上所存在的瑕疵包含髒粒及漆料刮傷其中之一或其組合。 The optical inspection system according to claim 6, wherein the object to be tested is a wheel, and the defects existing on the image information include one or a combination of dirty particles and paint scratches. 如請求項7所述的光學檢測系統,其中,該比對單元所產生的該等比對影像資訊,該等比對影像資訊係於髒粒處標示一第一警示圖案,並且於漆料刮傷處標示一第二警示圖案。 The optical detection system as claimed in claim 7, wherein the comparison image information generated by the comparison unit is a first warning pattern marked on the dirty particles and scratched on the paint. The wound is marked with a second warning pattern. 一種應用如請求項1所述之光學檢測系統的檢測方法,其係包含下列步驟:一模擬步驟,該光學檢測系統根據該待測物之結構,藉由該路徑單元運算出該路徑資訊,該路徑資訊做為該自動控制設備的移動路徑;一修正步驟,使用者根據該路徑資訊,排除該自動控制設備的移動路徑中具有大幅度的檢測角度者,以縮減檢測時間,並產生該自動控制設備的該最佳移動路徑資訊;一校正步驟,使用者根據該最佳移動路徑資訊,各自啟動或關閉該等光源中的每一個,以得到較清晰之該等影像資訊;一拍攝步驟,該自動控制設備根據該最佳移動路徑資訊移動,並藉由該影像感測器拍攝該待測物產生該等影像資訊;一比對步驟,該比對單元接收該影像感測器所產生的該等影像資訊,並藉由該等瑕疵影像資訊辨識該等影像資訊上所存在的瑕疵,以產生該等比對影像資訊;以及一顯示步驟,該比對單元將該等比對影像資訊傳輸至該顯示單元,並由該顯示單元顯示該等比對影像資訊。 A detection method using the optical detection system described in claim 1, which comprises the following steps: a simulation step, the optical detection system calculates the path information through the path unit according to the structure of the object to be tested, and the The path information is used as the moving path of the automatic control device; in a correction step, the user excludes those with a large detection angle in the moving path of the automatic control device according to the path information, so as to shorten the detection time and generate the automatic control the optimal movement path information of the device; a calibration step, the user activates or turns off each of the light sources according to the optimal movement path information, so as to obtain the clearer image information; a photographing step, the The automatic control device moves according to the optimal moving path information, and generates the image information by photographing the object to be tested by the image sensor; in a comparison step, the comparison unit receives the image sensor generated by the image sensor. and other image information, and identify the defects existing in the image information by the defect image information, so as to generate the comparison image information; and a display step, the comparison unit transmits the comparison image information to the the display unit, and the display unit displays the comparison image information. 如請求項9所述的檢測方法,其係進一步包括一標示步驟,該標示步驟介於該比對步驟以及該顯示步驟之間,其係透過該比對單元於髒粒處標示該第一警示圖案,並且於漆料刮傷處標示該第二警示圖案。 The detection method as claimed in claim 9, further comprising a marking step between the comparing step and the displaying step, wherein the first warning is marked at the dirty particle through the comparing unit pattern, and the second warning pattern is marked on the scratched part of the paint.
TW109123922A 2020-07-15 2020-07-15 Optical detection system and detection method thereof TWI769485B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW109123922A TWI769485B (en) 2020-07-15 2020-07-15 Optical detection system and detection method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW109123922A TWI769485B (en) 2020-07-15 2020-07-15 Optical detection system and detection method thereof

Publications (2)

Publication Number Publication Date
TW202204882A TW202204882A (en) 2022-02-01
TWI769485B true TWI769485B (en) 2022-07-01

Family

ID=81323457

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109123922A TWI769485B (en) 2020-07-15 2020-07-15 Optical detection system and detection method thereof

Country Status (1)

Country Link
TW (1) TWI769485B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI866316B (en) * 2023-07-03 2024-12-11 所羅門股份有限公司 Product testing method and system and computer program product

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI870171B (en) * 2023-12-20 2025-01-11 財團法人工業技術研究院 Wheel blank detecting device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI683995B (en) * 2017-08-18 2020-02-01 柏一威郡行銷有限公司 Device and system for detecting trailer vehicle condition of connected vehicle
US20200082191A1 (en) * 2017-11-20 2020-03-12 Ashok Krishnan Training of Vehicles to Improve Autonomous Capabilities
CN111127439A (en) * 2019-12-22 2020-05-08 上海眼控科技股份有限公司 Method and device for detecting tire tread of vehicle tire, electronic device and storage medium
TW202022320A (en) * 2018-12-05 2020-06-16 銓發科技股份有限公司 Vehicle interior detecting system
TWM605997U (en) * 2020-07-15 2021-01-01 國立雲林科技大學 Optical inspection system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI683995B (en) * 2017-08-18 2020-02-01 柏一威郡行銷有限公司 Device and system for detecting trailer vehicle condition of connected vehicle
US20200082191A1 (en) * 2017-11-20 2020-03-12 Ashok Krishnan Training of Vehicles to Improve Autonomous Capabilities
TW202022320A (en) * 2018-12-05 2020-06-16 銓發科技股份有限公司 Vehicle interior detecting system
CN111127439A (en) * 2019-12-22 2020-05-08 上海眼控科技股份有限公司 Method and device for detecting tire tread of vehicle tire, electronic device and storage medium
TWM605997U (en) * 2020-07-15 2021-01-01 國立雲林科技大學 Optical inspection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI866316B (en) * 2023-07-03 2024-12-11 所羅門股份有限公司 Product testing method and system and computer program product

Also Published As

Publication number Publication date
TW202204882A (en) 2022-02-01

Similar Documents

Publication Publication Date Title
TWI769485B (en) Optical detection system and detection method thereof
TWI598581B (en) Inspection apparatus and inspection method
CN109523541A (en) A kind of metal surface fine defects detection method of view-based access control model
CN103743761B (en) A kind of eyeglass watermark defect image detection device
CN109406529B (en) Performance adjusting method of AOI defect detection system
WO2017119250A1 (en) Flaw detection device and flaw detection method
JP2003240521A (en) Method and apparatus for inspection of external appearance and shape of specimen
CN103698337A (en) Method for automatically detecting adhesion defect of label of flat wine bottle
JP7514259B2 (en) System and method for determining whether a camera component is damaged - Patents.com
CN104101611A (en) Mirror-like object surface optical imaging device and imaging method thereof
CN112132828A (en) Film flaw detection method based on deep learning
CN113820319A (en) Textile surface defect detection device and method
JP2018028476A (en) Inspection device and inspection method
CN114577805A (en) MiniLED backlight panel defect detection method and device
JP2022526146A (en) Defect detection methods and systems in target coating image data
JP2020201158A (en) Three-dimensional object visual inspection device and three-dimensional object visual inspection method
TWM605997U (en) Optical inspection system
JP2017227474A (en) Lighting device and image inspection device
CN111833350B (en) Machine vision detection method and system
CN111815705A (en) Laser tracker filter protection lens pollution identification method, device and electronic equipment
CN110631498B (en) A method for obtaining the deformation distribution of the tire contact area
CN118111997A (en) LED large screen quality inspection method and equipment based on computer vision
JP4820971B2 (en) Surface inspection method
JP4017585B2 (en) Paint surface inspection equipment
JP2006242759A (en) Method for inspecting periodic pattern unevenness