TWI610074B - Inspection system for object with curved surfaces - Google Patents

Abstract

A surface defect detection system for a curved test object is used to detect the surface of the curved test object, and includes a test object feeding device, a first cycle detection device, and a second cycle detection device. The test object feeding device is used to transfer the curved test object for detection. The first loop detection device receives the curved test object from the test object feeding device to perform detection on the upper half of the curved test object. The second cycle detection device is coupled to the first cycle detection device to perform detection of a lower half of the curved surface object to be measured.

Description

Surface defect detection system for curved object

The present invention relates to a surface defect detection system, and more particularly to a surface defect detection system for detecting surface defects on a curved object to be measured.

Automated Optical Inspection (AOI) is a technology that uses machine vision for inspection to improve the defect that traditionally uses optical instruments to perform inspections. The application level includes research and development from high-tech industries, manufacturing quality control, As well as national defense, people's livelihood, medical treatment, environmental protection, electric power, etc.

The image processing technology was applied to the book and newspaper industry in the early days, and gradually applied to other fields in the later period. At present, machine vision is widely used in production lines. It is mainly used to transfer products to testing stations through transfer equipment. After the image acquisition device of the testing station performs image acquisition and feature recognition, it is determined in the classifier. Defective items.

In the technology of image processing, the processing of the spherical test object is very difficult, mainly because the ball system is a curved surface. Because of the curved surface relationship, the detection device will compress the edge information of the ball on the imaging. The problem is that most of the time, the sphere is rotated through the rotating mechanism, and multiple image acquisition and detection are performed to obtain the surface of the object with multiple viewing angles. However, rotating the sphere will greatly increase the detection Time, resulting in low efficiency of detection equipment.

The main purpose of the present invention is to solve the problems of high equipment installation cost and insufficient detection efficiency when detecting the surface image of a curved object under test in the prior art.

To achieve the above object, the present invention provides a surface defect detection system for a curved test object, which is used to detect the surface of the curved test object, including a test object feeding device, a first cycle detection device, and a Second cycle detection device. The test object feeding device is used to transfer the curved test object for detection. The first loop detection device receives the curved test object from the test object feeding device to perform detection on the upper half of the curved test object. The second cycle detection device is coupled to the first cycle detection device to perform detection of a lower half of the curved surface object to be measured.

The invention can save the time of rotating the curved object to be measured, and respectively shoot the two directions of the curved object to increase the detection efficiency.

The invention can be used for detecting the surface of the curved object to be tested, and by capturing the results of the curved surface of the object from different angles, an image of the surface of the curved object can be obtained to prevent the curved object from being caught at the grip position Detected problems.

100‧‧‧ Surface defect detection system for curved object

SP‧‧‧ Surface DUT

10‧‧‧Feeding device for test object

11‧‧‧Feeding track

12‧‧‧Limit gate

13‧‧‧ preparation area

20‧‧‧First cycle detection device

21‧‧‧The first rotating device

211‧‧‧Rotating disk

212‧‧‧Drive

22‧‧‧The first grasping device

221‧‧‧Grab unit

222‧‧‧Lifting device

23‧‧‧The first image detection device

24‧‧‧ The first image magnifying mirror

25‧‧‧The first ring light

A1‧‧‧First loading platform

A2‧‧‧First Test Station

A3‧‧‧First discharge station

A4‧‧‧Expansion Platform

N‧‧‧First discharge position

30‧‧‧Second cycle detection device

31‧‧‧Second Rotating Device

311‧‧‧Rotating disk

312‧‧‧Drive

32‧‧‧Second Grab Device

321‧‧‧Grab unit

322‧‧‧Lifting device

323‧‧‧Top material unit

33‧‧‧Second image detection device

34‧‧‧Second Image Amplifier

35‧‧‧Second Ring Light

B1‧‧‧Second loading station

B2‧‧‧Second Test Station

B3‧‧‧Defective material discharge station

B4‧‧‧Second discharge station

M‧‧‧Second discharge position

40‧‧‧ transfer device

41‧‧‧X axis stage

42‧‧‧Y-axis grasping arm

421‧‧‧Grab unit

422‧‧‧Lifting device

50‧‧‧stocking rack

51‧‧‧The first lifter

60‧‧‧Collecting rack

61‧‧‧Second Lifter

71‧‧‧Discharge track

72‧‧‧ Receiving device

TR‧‧‧Receiving tray

W11‧‧‧plane mirror

W12‧‧‧ flat mirror

W13‧‧‧Plane mirror

W14‧‧‧plane mirror

W21‧‧‧ flat mirror

W22‧‧‧ flat mirror

W23‧‧‧plane mirror

W24‧‧‧plane mirror

E11‧‧‧plane mirror

E12‧‧‧plane mirror

E21‧‧‧plane mirror

E22‧‧‧plane mirror

α1‧‧‧ angle

α2‧‧‧ angle

Block A-Block J

FIG. 1 is a top view of a surface defect detection system for a curved object to be tested according to the present invention.

FIG. 2 is a rear view of a surface defect detection system for a curved object to be tested according to the present invention.

FIG. 3 is a block distribution diagram of a sphere-based object to be tested.

FIG. 4 is a block distribution diagram of a sphere-based test object.

FIG. 5 is a schematic side view (a) of the first embodiment of the image magnifying mirror in the present invention.

FIG. 6 is a schematic front view (a) of the first embodiment of the image magnifying mirror in the present invention.

FIG. 7 is a schematic side view (two) of a first embodiment of an image magnifying mirror in the present invention.

FIG. 8 is a schematic front view (two) of a first embodiment of the image magnifying mirror in the present invention.

FIG. 9 is a schematic side view (a) of a second embodiment of the image magnifying mirror in the present invention.

FIG. 10 is a schematic front view (a) of a second embodiment of the image magnifying mirror in the present invention.

FIG. 11 is a schematic side view (second) of a second embodiment of the image magnifying mirror in the present invention.

FIG. 12 is a schematic front view (second) of a second embodiment of the image magnifying mirror in the present invention.

FIG. 13 is a schematic diagram of a work flow of a surface flaw detection system of a curved object to be tested (Part 1).

FIG. 14 is a schematic diagram of a work flow of a surface defect detection system of a curved object to be tested (II).

FIG. 15 is a diagram showing the operation of a surface defect detection system for a curved object to be tested according to the present invention; Work flow diagram (three).

FIG. 16 is a schematic diagram of a work flow of a surface defect detection system of a curved object to be tested (IV).

FIG. 17 is a schematic diagram of a work flow of a surface flaw detection system of a curved object to be tested (five).

FIG. 18 is a schematic diagram of a work flow of a surface flaw detection system of a curved object to be tested (six).

FIG. 19 is a schematic diagram of a work flow of a surface defect detection system of a curved object to be tested (seven).

FIG. 20 is a schematic diagram of a work flow of a surface flaw detection system of a curved object to be tested (eight).

FIG. 21 is a schematic diagram of a work flow of a surface defect detection system of a curved object to be tested (nine).

The detailed description and technical contents of the present invention are described below with reference to the drawings. Furthermore, the drawings in the present invention are for convenience of explanation, and their proportions are not necessarily drawn according to actual proportions. These drawings and their proportions are not intended to limit the scope of the present invention, and will be described here in advance.

Please refer to "Figure 1" and "Figure 2", which are a top view and a rear view of the surface flaw detection system for a curved object to be tested according to the present invention, and please also refer to "Figure 13".

This embodiment provides a surface defect detection system 100 for a curved object to detect the surface of the curved object SP. Surface of the curved object The flaw detection system 100 includes a material feeding device 10, a first cycle detection device 20, a second cycle detection device 30, a transfer device 40, a stocking rack 50, and a collecting rack 60.

The above devices can communicate with the controller through wired or wireless signals, and coordinate the work between the devices through the controller. The controller may be, for example, a Central Processing Unit (CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor), digital signal processor (DSP), or Programmable controller, Application Specific Integrated Circuits (ASIC), Programmable Logic Device (PLD) or other similar devices or a combination of these devices, and cooperate with the storage unit to execute software and firmware Or the storage of data.

The test object feeding device 10 is used to transfer the curved surface test object SP to a preparation area 13 for preparation for detection. The material feeding device 10 includes a material feeding track 11 and a material limiting gate 12 provided on the material feeding rail 11. The material limiting gate 12 restricts the curved object to be tested into the material preparation area 13. The number of SPs. When the number of entering the material preparation area 13 reaches a preset threshold (this embodiment is set to one), the material limit gate 12 is raised and blocks the entry of the curved surface test object SP from the rear to avoid the curved surface test object from the rear. The SP weight is added to the front-end curved object SP, causing the first grasping device 22 to fail to grasp.

The first loop detection device 20 receives the curved test object SP from the test object feeding device 10 to perform detection on the upper half of the curved test object SP. The first cycle detection device 20 includes a first rotation device 21, a plurality of first grasping devices 22 disposed on the first rotation device 21, and a first image disposed on a side of the first rotation device 21. Detecting device 23.

The first rotating device 21 is pivoted in sections, and the plurality of first grasping devices 22 are sequentially moved to a first feeding station A1, a first detection station A2, and a first discharging station A3; In this embodiment, an expansion station A4 is also provided, which can be used for expansion according to the actual application. Specifically, the first rotating device 21 includes a rotating disk 211 and a driving device 212 disposed on one side of the rotating disk 211 to drive the rotating disk 211 to rotate. The driving device 212 may be, for example, a stepping motor, and the rotary disk 211 is controlled to pivot in sections by inputting a pulse wave signal, or, for example, a servo motor may be used to control the rotation angle of the servo motor through a feedback signal. The driving device 212 may also be, for example, a synchronous motor, an induction motor, a linear motor, and the like, and it is not intended to limit the implementation of the driving device 212 in the present invention. The first feeding station A1 corresponds to the position of the material preparation area 13 so that the first gripping device 22 can grasp the curved surface object SP; the first inspection station A2 is provided with the first image detecting device on one side. 23 Take a first side image of the curved object SP for detection, and the first discharge station A3 corresponds to a first discharge position N.

The first grasping device 22 is disposed on the rotating disk 211 and is used for grasping the curved surface SP to be detected. The first grasping device 22 mainly includes a grasping unit 221 and a lifting device 222 disposed on a side of the grasping unit 221 to reciprocate the grasping unit 221. In a preferred embodiment, in order to avoid damaging the surface of the curved surface test object SP and increase the stability of grasping the curved surface test object SP, The grasping unit 221 is preferably a vacuum adsorption device, and by providing a vacuum adsorption force in a local area of the curved surface test object SP, the curved surface test object SP is fixed on the suction cup of the vacuum adsorption device. The lifting device 222 is used to move the grasping unit 221 so that the grasping unit 221 moves up and down, further grasps or adsorbs the curved surface test object SP, or brings the curved surface test object SP close to the first image detection device. 23 Take an image of the curved surface test object SP.

The first image detection device 23 is disposed at the position of the first detection station A2. A first image amplification mirror 24 is disposed on one side of the first image detection device 23, and the first image amplification mirror 24 is There is an opening for the first grasping device 22 to move the curved surface test object SP to the middle of the opening, and the first image magnifying mirror 24 reflects the images of the curved surface test object SP from different perspectives to the The first image detecting device 23 acquires a plurality of surface images of the curved surface test object SP in one shot. The detailed description of the first image magnifying mirror 24 will be supplemented by drawings.

A first ring lamp 25 is provided between the first image magnifying mirror 24 and the first image detection device 23, and the first ring lamp 25 provides a suitable light source on the peripheral side of the curved object SP. To ensure that the first image detecting device 23 obtains a clear image.

The second cycle detection device 30 is coupled to the first cycle detection device 20 to detect the lower half of the curved surface test object SP. The second cycle detection device 30 includes a second rotation device 31, a plurality of second grasping devices 32 disposed on the second rotation device 31, and a second rotation device 31. Side second image detection device 33.

The second rotating device 31 pivots in sections and passes through a second feeding station B1, a second testing station B2, a defective product discharging station B3, and a second discharging station B4. Specifically, the second rotating device 31 includes a rotating disk 311 and a driving device 312 disposed on one side of the rotating disk 311 to drive the rotating disk 311 to rotate. The driving device 312 may, for example, control the rotary disk 311 to be pivoted in sections by a stepping motor through an input pulse signal, or may control the rotation angle of the servo motor by a feedback signal for a servo motor. The driving device 312 may also be, for example, a synchronous motor, an induction motor, a linear motor, and the like, and it is not intended to limit the implementation of the driving device 312 in the present invention. The second feeding station B1 corresponds to the opposite side position of the first discharging station A3, so that the second grasping device 32 grasps the first side of the curved object SP; the second detection station B2 One side is provided with the second image detection device 33, and when the curved surface test object SP moves to the second detection station B2, a second side image of the curved surface test object SP is captured through the second image detection device 33 The detection station B3 at the back end can be one or a plurality of defect stations (one is disclosed in this embodiment), and the controller can classify the defect according to the result of the image detection, and the surface can be classified according to the corresponding defect type. The test object SP is sent from the corresponding defective product discharge station B3; the second discharge station B4 corresponds to a second discharge position M to move the tested curved surface test object SP from the second discharge position M Submit.

The second grasping device 32 is disposed on the rotating disk 311 and is used for grasping the curved surface SP to be detected. The second grasping device 32 mainly includes There is a grasping unit 321, a lifting device 322 disposed on one side of the grasping unit 321 to reciprocate the grasping unit 321, and a feeding unit 323 disposed on the grasping unit 321 side. In a preferred embodiment, in order to avoid damaging the surface of the curved surface test object SP and increase the stability of grasping the curved surface test object SP, the grasping unit 321 is preferably a vacuum adsorption device. The vacuum adsorption force of the local area of the object SP is fixed, and the curved surface object SP is fixed on the suction cup of the vacuum adsorption device. The lifting device 322 is used to move the grasping unit 321 so that the grasping unit 321 moves up and down, further grasps or adsorbs the curved surface test object SP, or brings the curved surface test object SP close to the second image detection device. 33 Take an image of the curved surface test object SP. The ejection unit 323 pushes the curved surface test object SP away from the grasping unit 321 when the second grasping device 32 moves to the defective discharge station B3, so that the curved surface test object SP passes the discharge track 71. Move to the corresponding receiving device 72.

The second image detection device 33 is disposed at the position of the second detection station B2. A second image amplification mirror 34 is disposed on one side of the second image detection device 33. The second image amplification mirror 34 is There is an opening for the second grasping device 32 to move the curved surface test object SP to the middle of the opening, and the second image amplification mirror 34 reflects the images of the curved surface test object SP from different perspectives to the The second image detecting device 33 acquires a plurality of surface images of the curved surface test object SP in one shot. The second image magnifying mirror 34 will be described in detail later with the aid of a drawing.

A second ring light 35 is provided between the second image magnifying mirror 34 and the second image detection device 33. The second ring light 35 provides the curved surface to be Appropriate light sources on the peripheral side of the test object SP to ensure that the second image detection device 33 obtains a clear image.

The transfer device 40 is disposed on one side of the second discharge station B4, and is used to transfer the curved test object SP from the second discharge position M to the receiving tray TR to collect the curved surface. Good quality of the test object SP. Specifically, the transfer device 40 includes an X-axis stage 41 for carrying the receiving tray TR, and a Y-axis disposed between the second discharge position M and the X-axis stage 41. Grab arm 42. A lifting device 422 is provided on the Y-axis grasping arm 42 to control the vertical movement of the grasping unit 421. The X-axis stage 41 moves the empty empty ball groove on the receiving tray TR to the second The discharging position M is such that the gripping unit 421 of the Y-axis gripping arm 42 moves the curved object SP to the empty ball groove.

On both sides of the X-axis stage 41, a stocking rack 50 for setting a plurality of receiving trays TR and a collecting rack 60 for setting a plurality of receiving trays TR are respectively disposed. The stock rack 50 includes a first lifter 51. The first lifter 51 places an empty receiving tray TR on the X-axis stage 41 so that the X-axis stage 41 moves the receiving tray TR. Go to the second discharge position M to collect the detected good SP of the curved test object SP through the second discharge position M. The collecting rack 60 includes a second lifter 61. When the X-axis stage 41 is filled with the receiving tray TR, the collecting rack 60 is moved to the collecting rack 60, so that the second lifter 61 The receiving tray TR is taken away from the X-axis stage 41.

In order to facilitate obtaining images of multiple perspectives of the SPD on a curved surface in one shot, the present invention discloses an image magnifying mirror (the first image magnifying mirror 24, the first The two image magnifying mirrors 34) are used to assist the first image detection device 23 and the second image detection device 33 to obtain a complete surface image of the curved surface test object SP. The image amplification mirror system has an opening for the grasping units 221, 321 to move to the opening, so that the image amplification mirror ring is set on the peripheral side of the curved surface test object SP to reflect the curved surface to be measured. The images of the test object SP at different perspectives are used to obtain the images of the multiple surfaces of the curved surface test object SP in one shot through the first image detection device 23 and the second image detection device 33. The curved surface test object SP is a sphere in a preferred embodiment. However, it is not excluded in the present invention that the device and system are used to correspond to other different shapes and structures such as regular or irregular. The surface of the object to be tested is described here.

In order to facilitate the description corresponding to the light receiving angle of different implementation aspects and the corresponding positions of different viewing angles, a plurality of areas of the curved surface test object SP are respectively defined and described below. As shown in "Figure 3" and "Figure 4", the curved surface test object SP can be mainly divided into ten blocks, which are two pairs of side blocks A, B, and surrounding the block. Block C, Block D, Block E, Block F, Block G, Block H, Block I, and Block J between Block A and Block B. Among them, block C, block G, block E, and block I are block A immediately above; block D, block H, block F, and block J are close to the block below B. From a six-sided perspective, block A is the first side of the curved object SP, block B is the second side of the curved object SP, and block C and block D are curved objects. The third side of SP, the block E and the block F are the fourth side of the curved object SP, the block G and the block H are the fifth side, the block I and the block of the curved object SP The J series is the sixth surface of the curved object SP.

In a preferred embodiment, the disclosed image magnifying mirrors (the first image magnifying mirror 24 and the second image magnifying mirror 34) are a plurality of plane reflections arranged on the peripheral side of the curved surface object SP. Mirror, the plane mirror is at an angle to the curved surface test object SP and the image detection device, and is used to reflect the images of the curved surface test object SP from different angles to the image detection device. The advantage of using a flat mirror for detection is that the flat mirror does not have curvature, so the reflected image will not be deformed, so the image at each position of the SP to be tested on the curved surface can reach reasonable detection accuracy. .

In one of the preferred embodiments, please refer to "Figure 5" to "Figure 8". This is a side schematic diagram (a), a front schematic diagram (a), and a side view of the first embodiment of the image magnifying mirror in the creation. Schematic diagram (II), frontal diagram (II).

As shown in "Figure 5" and "Figure 6", in this embodiment, on the first detection station A2, the flat mirrors W11, W12, W13, and W14 are respectively arranged on four sides of an opening on the average side. In the direction, at the first grasping device 22, the curved surface test object SP is inserted through the opening, and the images of the curved surface test object SP from four perspectives are reflected through the plane mirrors W11, W12, W13, and W14. As shown in FIG. 5 and FIG. 6, the plane mirrors W11, W12, W13, and W14 are disposed in four directions of the curved surface test object SP, except for the block A facing the first image detection device 23. Block C is obtained from the plane mirror W11, block G is obtained from the plane mirror W12, block E is obtained from the plane mirror W13, and block I is obtained from the plane mirror W14. Therefore, the five blocks on one side of the curved surface SP can be obtained in one shot.

Subsequently, the curved surface test object SP photographed at the first inspection station A2 is transferred to the second inspection station B2 for photographing at the other side. When shooting on the other side, as shown in FIG. 7 and FIG. 8, since the second gripping device 32 captures the curved surface test object SP from the other side, the curved surface test object SP block B The images can be taken. At the second inspection station B2, the four plane mirrors W21, W22, W23, and W24 are also used to obtain an enlarged image of the curved surface test object SP, and the curved surface test object SP and the amplified image are shot. In addition to the image of the curved surface test object SP facing the second image detection device 33, the block D is obtained from the plane mirror W21, the block F is obtained from the plane mirror W22, and the block H is obtained from the plane mirror W23, and block J is obtained from the plane mirror W24. Through the second shooting, an image that has not been obtained on the other hemisphere of the curved object SP can be obtained. As a result, all the images of the curved surface test object SP were obtained in two shots.

In the implementation mode in which the four-sided flat mirrors W11-W14 and the flat mirrors W21-W24 are provided, the focus is on obtaining an image on the front side of the curved surface SP to be tested, so that the center of the vision area of the image detection device is located at the center of the far and near. At the middle position of the curved surface, the center of the curved object SP must pass through the opening at an appropriate distance. The angle α1 between the plane mirror and the shooting direction of the image detection device should preferably approach 27 degrees, which is reasonable. The value can be between 17 ° and 37 °, depending on the distances between the plane mirrors W11-W14, W21-W24 and the curved surface SP, and the distance of the curved surface SP through the opening. Distance.

In another preferred embodiment, please refer to "Figure 9" to "Figure 12", This is a schematic diagram of the second embodiment of the image magnifying mirror in this creation.

In this embodiment, the angle between the plane reflectors E11, E12, E21, and E22 and the shooting direction of the image detection device is changed to change the image capturing angle of the curved surface test object SP by the image detection device. In "Figure 9" and "Figure 10", since the first grasping device 22 passes the entire curved surface test object SP through the opening between the flat mirrors E11 and E12, the curved surface can be seen The image of the back side of the test object SP, and the images of the front hemisphere and the back hemisphere of the curved surface test object SP were obtained in one shot. Since the image detection device can obtain images of two blocks in a single-sided planar mirror, this embodiment only needs to set two planar mirrors to obtain images of five blocks. As shown in "Figure 9" and "Figure 10", with the exception of block A, the flat mirror E11 on one side of the image detection device obtains all the images of blocks C and D, and the flat mirror on the other side All images of blocks E and F can be obtained in E12. Therefore, the five blocks on the side of the curved surface SP can be obtained in one shot.

Subsequently, the curved surface test object SP photographed at the first inspection station A2 is transferred to the second inspection station B2 for photographing at the other side. When shooting on the other side, as shown in "Figure 11" and "Figure 12," since the second gripping device 32 captures the curved surface test object SP from the other side, the curved surface test object SP block B The images can be taken. At the second detection station B2, an enlarged image of the curved surface test object SP is obtained through two plane mirrors E21 and E22, and the curved surface test object SP and the amplified image are shot, except for block B. The second image detection device 33 obtains all the images of the blocks I and J on the plane mirror E21 on one side, and obtains all of the blocks G and H on the plane mirror E22 on the other side. The image can be obtained by secondary shooting.

In the implementation mode of setting the two-plane mirrors E11 and E12 (or the plane mirrors E21 and E22), the focus is on obtaining an image at the middle position of the SP of the curved object to be measured, in order to make the center of the visual area of the image detection device far and near It falls on the middle position of the tested surface, the center of the SP to be tested on the curved surface must pass through the opening, and the flat mirrors E11 and E12 (or the flat mirrors E21 and E22) and the image detection device are taken. The angle α2 between the directions should preferably approach the 45-degree angle, and the reasonable value can be between 35-degree and 55-degree angles. The plane mirrors E11 and E12 (or the plane mirrors E21 and E22) and the curved surface should be treated. The distance between the test objects SP and the distance that the curved surface test object SP passes through the opening are determined.

However, in this embodiment, even if the two plane mirrors E11 and E12 (or the plane mirrors E21 and E22) can obtain the images of the five blocks of the curved surface test object SP, the present invention does not exclude the simultaneous configuration The implementation of four plane mirrors for repeated detection for the same area to increase accuracy is described in advance.

In addition to the above two plane mirrors or four plane mirrors, the present invention does not exclude the provision of a single or a plurality of plane mirrors, a single or a plurality of curved mirrors, or without departing from the main spirit of the present invention. The other equal implementation patterns below will be described in advance.

The following is a description of the work flow of the surface defect detection system of the curved surface to be tested. Please refer to FIG. 13 to FIG. 21, which are schematic diagrams of the work flow of the surface defect detection system of the curved surface to be tested, as shown in the figure Show: First refer to "Figure 13". At the beginning, the surface of the test object SP It is moved from the feeding track 11 to the preparation area 13. When the curved surface test object SP is detected to move to the preparation area 13, the material limit gate 12 is lifted upward and blocks the curved surface test object SP behind. At the same time, the first grasping device 22 on the first feeding station A1 moves toward the material preparation area 13 to grasp the curved object SP.

Continuing, please refer to "Fig. 14". After the first gripping device 22 obtains the curved object SP, the rotating disk 211 drives the first gripping device 22 to move to the first detection station A2, and is ready to proceed. Image detection of the curved surface object SP.

Continuing, please refer to FIG. 15. The lifting device 222 of the first grasping device 22 moves the grasping unit 221 downward to move the grasping unit 221 to the first image magnifying mirror 24. In between, the first image amplification mirror 24 displays a plurality of angles of view of the curved surface test object SP, and the first image detection device 23 captures images of the curved surface test object SP and the plurality of angles of view. When the shooting is completed, the lifting device 222 moves the grasping unit 221 upward to return to the starting position.

Continuing, please refer to "Fig. 16". After the SP of the curved surface object is detected and returned to the starting position, the rotating disk 211 drives the first gripping device 22 to move to the first discharge station A3.

Continuing, please refer to FIG. 17, after the first gripping device 22 is moved to the first discharge station A3, the lifting device 222 of the first gripping device 22 moves the gripping unit 221 downward to On the second feeding station B1, the curved surface test object SP is grasped by the grasping unit 321 of the second grasping device 32.

Continuing, please refer to "Fig. 18", in the second grasping device 32 After the curved surface test object SP is obtained, the rotating disk 311 drives the second gripping device 32 to move to the second detection station B2, and prepares to perform image detection on the other side of the curved surface test object SP.

Continuing, please refer to FIG. 19. The lifting device 322 of the second grasping device 32 moves the grasping unit 321 upward to move the grasping unit 321 to the second image magnifying mirror 34. At the same time, a plurality of perspectives of the curved surface test object SP are displayed by the second image amplification mirror 34, and images of the curved surface test object SP and the plurality of perspectives are captured by the second image detection device 33. When the shooting is completed, the lifting device 322 moves the grasping unit 321 downward to return to the starting position.

Continuing, please refer to "Fig. 20". After the SP of the curved surface is detected and returned to the starting position, the rotating disk 311 drives the second gripping device 32 to move to the defective material discharge station B3. In the previous test, if the test result indicates that the curved surface test object SP is a defective product, the ejection unit 323 on the side of the grasping unit 321 pushes the curved surface test object SP away from the grasping unit 321 to pass The discharge track 71 moves to a receiving device 72. When the result of the SP test on the curved surface is a good product, no action is performed on the defective product discharge station B3.

Continuing, please refer to "Fig. 21", the rotating disk 311 drives the second gripping device 32 to move to the second discharge station B4. If the curved surface SP is a good product, the Y-axis gripping arm 42 is Transfer the curved test object SP on the second grasping device 32 to the receiving tray TR to complete the material distribution work.

Through the above-mentioned program, the surface flaw detection system 100 for a curved test object of the present invention can detect the surface of the curved test object SP, and based on the detected As a result, the good and defective products are classified, and the fully automated work is completed.

In summary, the present invention can appropriately classify the curved surface test object based on the detection result of the curved surface test object, and the present invention can perform multiple actions simultaneously in the same time interval, which can save the curved surface test object from Elapsed time during transfer. In addition, the present invention can be used to detect the surface of a curved test object, and by capturing the results of the curved test object surface from different angles, an image of the surface of the curved test object can be obtained to prevent the curved test object from being caught at the gripping position. Problems that can be detected.

The present invention has been described in detail above, but the above is only a preferred embodiment of the present invention. When the scope of implementation of the present invention cannot be limited in this way, that is, the equality made in accordance with the scope of patent application of the present invention Changes and modifications should still be covered by the patent of the present invention.

100‧‧‧ Surface defect detection system for curved object

SP‧‧‧ Surface DUT

10‧‧‧Feeding device for test object

11‧‧‧Feeding track

13‧‧‧ preparation area

20‧‧‧First cycle detection device

21‧‧‧The first rotating device

211‧‧‧Rotating disk

212‧‧‧Drive

22‧‧‧The first grasping device

221‧‧‧Grab unit

222‧‧‧Lifting device

25‧‧‧The first ring light

A1‧‧‧First loading platform

A2‧‧‧First Test Station

A3‧‧‧First discharge station

A4‧‧‧Expansion Platform

30‧‧‧Second cycle detection device

31‧‧‧Second Rotating Device

311‧‧‧Rotating disk

312‧‧‧Drive

323‧‧‧Top material unit

35‧‧‧Second Ring Light

B4‧‧‧Second discharge station

M‧‧‧Second discharge position

40‧‧‧ transfer device

41‧‧‧X axis stage

42‧‧‧Y-axis grasping arm

421‧‧‧Grab unit

422‧‧‧Lifting device

50‧‧‧stocking rack

60‧‧‧Collecting rack

71‧‧‧Discharge track

72‧‧‧ Receiving device

TR‧‧‧Receiving tray

Claims (17)

A curved surface test object surface defect detection system for detecting the surface of a curved test object includes: a test object feeding device including a feeding track for transmitting the curved test object to perform Detection; a first cycle detection device comprising a first rotation device, a plurality of first grasping devices provided on the first rotation device, and a first image detection provided on one side of the first rotation device Device, the first grasping device receives and grasps a lower half of the curved object to be tested from the feeding device of the object to be tested, and the second image detecting device photographs the upper half of the curved object to perform detection And a second cycle detection device coupled to the first cycle detection device, the second cycle detection device includes a second rotation device, a plurality of second gripping devices disposed on the second rotation device, and A second image detecting device disposed on one side of the second rotating device, the second grasping device receiving and grasping an upper half of the curved object to be measured from the first loop detecting device, the second image detecting device Means lower half of the imaging surface was measured for detection. According to the surface defect detection system of the curved object to be tested as described in the first item of the scope of patent application, the material feeding track is provided with a material limit gate, which limits the number of the curved object to enter the preparation area. The surface defect detection system of the curved object to be tested as described in item 1 of the scope of patent application, The first rotating device is pivoted in sections and passes through a first feeding station, a first detecting station, and a first discharging station. The first feeding station corresponds to the position of the preparation area so that the first A grasping device grasps the curved object to be tested. The first detection platform is provided with the first image detection device. When the curved object to be moved to the first detection platform is detected through the first image The device captures a first side image of the curved object to be detected, and the first discharge station corresponds to a first discharge position. The surface defect detection system for a curved object under test according to item 3 of the patent application scope, wherein the second rotating device is pivoted in sections through a second feeding station, a second inspection station, and a second exit Material loading platform, the second loading platform corresponds to the opposite side position of the first discharging platform, so that the second gripping device can grasp the first side of the curved object to be tested, and the second testing platform side The second image detection device is provided. When the curved object to be detected is moved to the second detection platform, a second side image of the curved object to be detected is captured through the second image detection device for detection. The discharging station is corresponding to a second discharging position to send the detected curved test object from the second discharging position. According to the defect detection system for a curved surface to-be-measured object as described in item 4 of the patent application scope, wherein the first grasping device or the second grasping device is a vacuum adsorption device. The surface flaw detection system for a curved object to be tested as described in item 4 of the scope of patent application, The first gripping device or the second gripping device includes a gripping unit and a lifting device disposed on one side of the gripping unit to reciprocate the gripping unit. According to the defect detection system for a curved surface to be tested according to item 6 of the patent application scope, wherein the second cycle detection device further includes one or more defect discharge stations, and the controller selects according to the obtained defect types. Send the curved object to be tested from the corresponding discharge station of the defective product. According to the defect detection system for a curved object under test according to item 7 of the scope of the patent application, wherein the second gripping device includes a jacking unit disposed on one side of the gripping unit, and the jacking unit is connected to the second The grasping device is moved to the defective product discharging station, and the curved test object is pushed into the discharging track by the grasping unit to be collected in the receiving device. The surface defect detection system for a curved object under test as described in item 4 of the patent application scope further includes a receiving tray, and a curved object to be transferred from the second discharging position to the receiving tray. On the transfer device. The surface defect detection system for a curved object under test according to item 9 of the patent application scope, wherein the transfer device includes an X-axis stage for carrying the receiving tray, and a second output Position and Y-axis grasping between this X-axis stage A lifting device for controlling the upward and downward movement of the gripping unit is arranged on the Y-axis grasping arm, and the idle empty ball groove is moved to the second discharging position by the X-axis stage so that the Y-axis The grasping unit of the grasping arm moves the test object to the empty ball groove. According to the surface defect detection system of the curved object to be tested as described in item 10 of the patent application scope, it further includes a stocking rack for setting a plurality of receiving trays, and a collecting rack for setting a plurality of receiving trays. The stock rack includes a first lifter. The first lifter places the empty receiving tray on the X-axis stage so that the X-axis stage moves the receiving tray to the second discharge. Position, the collecting rack system includes a second lifter, and the X-axis stage is moved to the collecting rack when the receiving tray is full, so that the receiving tray is brought by the second elevator Off the X-axis stage. The surface defect detection system for a curved object under test according to item 4 of the patent application scope, wherein the first loop detection device includes a first image magnifying mirror disposed on one side of the first detection platform to reflect the curved surface Images of different angles on the side of the object to be tested are taken and detected by the first image detection device; the second cycle detection device includes a second image magnifying mirror disposed on the side of the second detection station to reflect the Images on the other side of the curved object under test with different viewing angles are taken and detected by the second image detection device. As described in claim 12, the curved surface to-be-detected object surface defect detection system, wherein the first image amplification mirror system is a plurality of plane reflection mirrors disposed on a peripheral side of a first detection position, and the plane reflection mirror system There is an angle between the first image detection device and the shooting direction of the first image detection device, which is used to reflect a plurality of images with different perspectives on one side of the curved object to be measured; A plane mirror on the peripheral side of the position. The plane mirror has an angle with the shooting direction of the second image detection device, and is used to reflect images on the other side of the curved object to be measured. According to the surface defect detection system of the curved object to be tested according to item 13 of the patent application scope, the plane mirrors of the first image magnifying mirror are evenly arranged in four directions around the first detection position for Reflect the images from four perspectives on one side of the curved object at one time; the plane mirrors of the second image magnifying mirror are evenly arranged in four directions on the peripheral side of the second detection position to reflect the curved surface at one time. Images from four perspectives on the other side of the object. According to claim 14 of the scope of patent application, a surface defect detection system for a curved object to be tested, wherein the angle between the plane reflection mirror of the first image magnifying mirror and the shooting direction of the first image detection device is preferably between 17 Between 37 degrees and 37 degrees; taken by the plane mirror of the second image magnifying mirror and the second image detection device The angle between the directions is preferably between 17 and 37 degrees. As described in claim 13 of the patent application, the surface defect detection system of a curved object under test, wherein the plane mirrors of the first image magnifying mirror are respectively disposed on two sides of the first detection position to reflect the object under test. Images of the two sides of the object; the plane mirrors of the second image amplifying mirror are respectively disposed on the two sides of the second detection position, and are used to reflect the images of the other two sides of the object. As described in claim 16 of the patent application, the surface defect detection system of a curved test object, wherein the angle between the plane mirror of the first image magnifying mirror and the shooting direction of the first image detection device is preferably between 35 The angle between the plane mirror of the second image magnifying mirror and the shooting direction of the second image detection device is preferably between 35 degrees and 55 degrees.