TWI485642B - 光電元件之客製化製造方法 - Google Patents
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Description
本發明係關於一種光電元件之客製化製造方法。
半導體光電元件,例如發光二極體(LED)或太陽能電池(solar cell),分別具有節能及乾淨能源的功效,受到世界環保團體及各國政府廣泛的重視,並已訂定時間表積極推廣,以解決地球暖化之問題。面對快速成長的需求,光電元件製造廠傳統的人工結合半自動生產方式,至少會面臨包括交期縮短,以及客戶端為因應多元應用產生的多樣化產品規格的挑戰。因此,除了積極的擴張生產線以因應大量需求及多元的應用,有效率的生產流程及快速反應客戶的需求已為當前亟待改善之重點。
本發明提供一光電元件之客製化生產方法,同時兼顧客戶需求及有效率的生產,以加速產業運用。
本發明揭露一光電元件之客製化製造方法。此客製化製造方法包含提供一生產流程,包含一前段流程、一客製化模組接續此前段流程、以及一暫存步驟介於此前段流程及此客製化模組之間;並且依前段流程生產一預定數量之半成品暫停於此暫存步驟,依據一客戶要求以調變此客製化模組使符合此客戶要求。
依本發明一實施例,所述之客戶要求包含一亮度要求。
依本發明一實施例,所述之客戶要求包含一光形或出光角度要求。
依本發明一實施例,所述之客戶要求包含一波長要求。
依本發明一實施例,所述之客戶要求包含一熱阻要求。
依本發明一實施例,所述之客製化模組更包含預置一對照表或對照曲線用以調變此客製化模組。
依本發明一實施例,所述之光電元件包含發光二極體或太陽能電池。
圖1揭示一符合本發明之客製化生產流程,包括標準流程步驟S1~S7、介於步驟S4及S5間之客製化模組Q1~Q4、以及於客製化模組Q1~Q4前之一暫存步驟T1。各步驟說明如下:S1(成長基板):提供一成長基板,用以成長一半導體磊晶疊層,此成長基板包括用以成長磷化鋁鎵銦(AlGaInP)之砷化鎵(GaAs)晶圓,或用以成長氮化銦鎵(InGaN)之藍寶石(Al2
O3
)晶圓、氮化鎵(GaN)晶圓或碳化矽(SiC)晶圓,或用以成長III-V族太陽能電池疊層之矽晶圓、鍺晶圓、或砷化鎵晶圓;S2(磊晶成長):於此成長基板上成長一具有光電特性之磊晶疊層,例如發光(light-emitting)疊層或光伏(photovoltaic)疊層;S3(晶圓檢測):以一晶圓測試機(testing prober),測試成長基板上之磊晶疊層是否符合電性要求,如定電壓之電流值(Iv
);或波長特性如峰波長值(peak wavelength)或半峰寬幅(half-peak width);S4(晶粒形成):以微影及蝕刻製程技術於上述之磊晶疊層定義出複數個晶粒結構及電極區域;客製化模組Q1:因應一客戶對於一亮度要求P1,調變客製化模組Q1,以達到此亮度要求P1,詳細之客製化模組Q1將於後續詳細說明;客製化模組Q2:因應一客戶對於一光形或出光角度要求P2,調變客製化模組Q2,以達到此光形或出光角度要求P2,詳細之客製化模組Q2將於後續詳細說明;客製化模組Q3:因應一客戶對於一波長要求P3,調變客製化模組Q3,以達到此波長要求P3,詳細之客製化模組Q3將於後續詳細說明;客製化模組Q4:因應一客戶對於一熱阻要求P4,調變客製化模組Q4,以達到此熱阻要求P4,詳細之客製化模組Q4將於後續詳細說明;S5(電極形成):形成p側及n側電極於各晶粒之對應之電極區域上,作為電性連接至外部線路之用;S6(晶粒檢測):以一晶粒測試機(testing prober),測試各晶粒之光電特性是否符合要求,如定電壓之電流值(Iv
);或波長特性如峰波長值(peak wavelength)或半峰寬幅(half-peak width);S7(晶粒切割):於完成上述之生產流程之後,切割具有上述結構之晶圓使各晶粒分離,成為一符合客戶需求之光電元件。
為方便說明,於暫存步驟T1之前之生產流程統稱為前段流程;於客製化模組之後之生產流程統稱為後續流程;而於前段流程與客製化流程之間存在一暫存步驟以保留依前段流程所預先完成之半成品,在客戶要求確收後,即可將保留於暫存步驟之半成品接續至對應之客製化模組生產,以達到客戶的要求。此外,暫存步驟包含計時前段流程所完成之半成品保留於暫存步驟之暫存時間,並預設一臨界時間,當暫存時間小於或接近於臨界時間始可進行客製化模組;若暫存時間相等於臨界時間仍未收到或確認客戶要求,則生產流程執行旁通1步驟直接跳至下一步驟。
圖2~圖5進一步揭示對應於圖1所示之客製化模組Q1~Q4。
請參考圖2進一步揭示對應於圖1所示之客製化模組Q1。首先,於前段流程完成之半成品保留一預定數量於暫存步驟T1,待收到客戶之亮度要求P1,即放行保留於暫存步驟之半成品以進行客製化模組Q1,其中客製化模組Q1預設子模組a1及子模組a2,分別對應亮度提昇或亮度降低之要求,其中,亮度提昇或亮度降低係相對於無任何客製化模組所生產之標準產品。子模組a1包含一表面圖案化步驟,係利用微影/蝕刻製程技術在磊晶表面形成具粗糙度之粗化表面,或形成具規則或不規則排列圖案之圖案化表面,以達到亮度提昇之要求;其中,藉由調整客製化參數ap1,例如蝕刻時間、圖案化密度、或圖案尺寸,可得到具不同粗糙度或圖案之表面。子模組a1更包含一對照表或對照曲線,預先記錄客製化參數ap1與亮度提昇值之對應關係,以便根據客戶之亮度要求選取對應之客製化參數值,達到客戶之亮度要求。子模組a2包含一形成遮光膜之步驟,係利用濺鍍機台濺鍍一薄金屬層於所述之磊晶疊層之上以吸收一部份之光線,達到亮度降低之要求,其中,藉由調整客製化參數ap2,例如遮光膜厚度,可得到不同的遮光效果。子模組a2又包含一對照表或對照曲線,預先記錄客製化參數ap2與亮度降低值之對應關係,以便根據客戶之亮度要求選取對應之客製化參數值,達到客戶之亮度要求。
請參考圖3進一步揭示對應於圖1所示之客製化模組Q2。客製化模組Q2係主要根據客戶之光形或出光角度要求P2,將保留於對應之暫存步驟T1之半成品放行以進行客製化模組Q2,其中客製化模組Q2預設子模組b1及子模組b2,以分別對應光形及出光角度要求。例如,子模組b1係包含形成一微結構層於磊晶疊層上以對應一光形要求,其中,藉由調整客製化參數bp1,例如調整微結構型態,可得到不同之光形,例如為不規則型態以形成漫射之光形、光子晶體型態以形成準直光之光形、或具長斜面之微結構以形成側向發光之光形。子模組b1更包含一預置之對照表,以便根據客戶之光形要求選取對應之微結構型態,達到客戶之光形要求。子模組b2係包含形成一出光角度調整層於磊晶疊層上以對應一關於出光角度之要求,此出光角度調整層包含一具有漸增或漸減折射率之多層薄膜結構形成於所述之磊晶疊層之上,以使光形內縮或外擴,其中,藉由調整客製化參數bp2,例如為包含氧化矽(SiO2
)/氮化矽(Si3
N4
)之出光角度調整層之對數,以得到不同之出光角度。子模組b2更包含一預置之對照表或對照曲線,預先記錄客製化參數bp2與出光角度之對應關係,以便根據客戶之出光角度要求選取對應之客製化參數值,達到客戶之出光角度要求。
請參考圖4進一步揭示對應於圖1所示之客製化模組Q3。客製化模組Q3係主要根據客戶之波長要求P3,將保留於對應之暫存步驟T1之半成品放行以進行客製化模組Q3,其中客製化模組Q3預設子模組c1以對應不同之波長要求P3。子模組c1包含形成一波長轉換層於磊晶疊層上以對應一波長要求,其中,藉由調整客製化參數cp1,例如選擇波長轉換材質,以轉換由磊晶疊層發出之原始光波長,例如為近紫外光或藍光波長390~460nm,成為綠、橙、紅光波長範圍。子模組c1更包含一預置之對照表,以便根據客戶之波長要求選取對應之波長轉換材質,達到客戶之要求。
請參考圖5進一步揭示對應於圖1所示之客製化模組Q4。客製化模組Q4係主要根據客戶之熱阻要求P4,將保留於對應之暫存步驟T1之半成品放行以進行客製化模組Q4,其中客製化模組Q4預設子模組d1及子模組d2。子模組d1包含對前述具有磊晶疊層之成長基板進行薄化,以降低元件熱阻,其中,藉由調整客製化參數dp1,例如為薄化厚度,可得到具有不同熱阻之元件,以達到客戶對於熱阻之要求。子模組d1更包含一預置之對照表或對照曲線,預先記錄客製化參數dp1與元件熱阻之對應關係,以便根據客戶之熱阻要求選取對應之客製化參數值,達到客戶之要求。子模組d2係包含一基板轉移步驟,包含選擇並貼合一符合客戶之熱阻要求之導熱基板至所述之磊晶疊層,並移除所述之成長基板。其中,藉由調整客製化參數dp2,例如為導熱基板之導熱值(thermal conductivity),藉以調整元件之熱阻,以達到客戶對於熱阻之要求。子模組d2更包含一預置之對照表,預先記錄客製化參數dp2與元件熱阻之對應關係,以便根據客戶之熱阻要求選取對應之客製化參數值,達到客戶之要求。
圖6揭示另一符合本發明之客製化流程之實施例。圖6之客製化模組Q1~Q3係彼此接續並介於步驟S4及S5之間,客製化模組Q4則介於步驟S5及S6之間,並於各客製化模組Q1~Q4之前對應設置暫存步驟T2~T5,且暫存步驟T2~T5各包含計時所述之半成品保留於暫存步驟之暫存時間,並各預設一臨界時間,例如為1~90天,較佳為30天以內,更佳為7天以內,在不影響半成品品質之前提下,以管制各暫存時間在各臨界時間之內始可進行客製化模組;若暫存時間於相等於臨界時間仍未收到或確認客戶要求,則執行對應之旁通2~旁通5步驟使直接跳至下一步驟。
本發明所列舉之各實施例僅用以說明本發明,並非用以限制本發明之範圍。任何人對本發明所作之任何顯而易知之修飾或變更皆不脫離本發明之精神與範圍。
a1、a2...客製化模組Q1之子模組
b1、b2...客製化模組Q2之子模組
c1...客製化模組Q3之子模組
d1、d2...客製化模組Q4之子模組
ap1、ap2、bp1、bp2、cp1、dp1、dp2...客製化參數
P1...亮度要求
P2...光形或出光角度要求
P3...波長要求
P4...熱阻要求
Q1~Q4...客製化模組
S1~S7...標準流程步驟
T1~T5...暫存步驟
旁通1~旁通5...旁通步驟
圖1為一流程圖,顯示依本發明之客製化製造方法之一實施例;圖2為一流程圖,進一步揭示圖1之客製化模組Q1;圖3為一流程圖,進一步揭示圖1之客製化模組Q2;圖4為一流程圖,進一步揭示圖1之客製化模組Q3;圖5為一流程圖,進一步揭示圖1之客製化模組Q4;圖6為一流程圖,顯示依本發明之客製化製造方法之另一實施例。
P1...亮度要求
P2...光形或出光角度要求
P3...波長要求
P4...熱阻要求
Q1~Q4...客製化模組
S1~S7...標準流程步驟
T1...暫存步驟
旁通1...旁通步驟
Claims (19)
- 一種光電元件之客製化製造方法,包含:提供一生產流程,包含一前段流程、一客製化模組接續該前段流程、一暫存步驟介於該前段流程及該客製化模組之間、以及一後續流程;其中該前段流程包含提供一成長基板,成長一具有光電特性之半導體磊晶疊層於該成長基板上及測試該具有光電特性之半導體磊晶疊層;依該前段流程生產一預定數量之半成品光電元件保留於該暫存步驟;收集一客戶要求,其中,該客製化模組對應該客戶要求;根據該客戶要求調變該客製化模組;以及於該後續流程使該半成品光電元件繼續完成該生產流程,以成為一客製化光電元件,其中該後續流程包含測試該客製化光電元件之光電特性是否符合要求。
- 如申請專利範圍第1項所述之客製化製造方法,其中調變該客製化模組包含調變該客製化模組之一客製化參數。
- 如申請專利範圍第1項所述之客製化製造方法,其中該客製化模組包含提供一子模組集合,且調變該客製化模組包含選定該集合內其中之一子模組以符合該要求。
- 如申請專利範圍第2項所述之客製化製造方法,其中調變該 客製化模組包含依照一預置之對照表或對照曲線以調變該客製化參數。
- 如申請專利範圍第1項所述之客製化製造方法,其中該暫存步驟包含暫存該半成品光電元件於一臨界時間之內,於該臨界時間內放行保留於該暫存步驟之該半成品光電元件以進行該客製化模組。
- 如申請專利範圍第1項所述之客製化製造方法,其中該暫存步驟包含暫存該半成品光電元件於一臨界時間之內,超過該臨界時間則直接進行該後續流程。
- 如申請專利範圍第1項所述之客製化製造方法,其中該客戶要求包含亮度要求。
- 如申請專利範圍第1項所述之客製化製造方法,其中該客戶要求包含光形或出光角度要求。
- 如申請專利範圍第1項所述之客製化製造方法,其中該客戶要求包含波長要求。
- 如申請專利範圍第1項所述之客製化製造方法,其中該客戶要求包含熱阻要求。
- 如申請專利範圍第1項所述之客製化製造方法,其中該光電 元件包含發光二極體或太陽能電池。
- 一種光電元件之客製化製造方法,包含:提供一生產流程,包含一前段流程、一第一暫存步驟、一第一客製化模組、一第二暫存步驟、一第二客製化模組、以及一後續流程;其中該前段流程包含提供一成長基板,成長一具有光電特性之半導體磊晶疊層於該成長基板上及測試該具有光電特性之半導體磊晶疊層;依該前段流程生產一預定數量之半成品光電元件保留於該些暫存步驟;收集一第一客戶要求,其中,該第一客製化模組對應該第一客戶要求;根據該第一客戶要求調變該第一客製化模組;收集一第二客戶要求,其中,該第二客製化模組對應該第二客戶要求;根據該第二客戶要求調變該第二客製化模組;以及於該後續流程使該半成品光電元件繼續完成該生產流程,以成為一客製化光電元件,其中該後續流程包含測試該客製化光電元件之光電特性是否符合要求。
- 如申請專利範圍第12項所述之客製化製造方法,其中調變該第一或第二客製化模組包含調變該第一或第二客製化模 組之一客製化參數。
- 如申請專利範圍第12項所述之客製化製造方法,其中該第一或第二客製化模組包含提供一子模組集合,且調變該第一或第二客製化模組包含選定該集合內其中之一子模組以符合該要求。
- 如申請專利範圍第13項所述之客製化製造方法,其中調變該第一或第二客製化模組包含依照一預置之對照表或對照曲線以調變該客製化參數。
- 如申請專利範圍第12項所述之客製化製造方法,其中該第一或第二暫存步驟包含暫存該半成品光電元件於一臨界時間之內,於該臨界時間內放行保留於該暫存步驟之該半成品光電元件以進行該客製化模組。
- 如申請專利範圍第16項所述之客製化製造方法,其中該第一或第二暫存步驟包含暫存該半成品光電元件於一臨界時間之內,超過該臨界時間則直接進行該後續流程。
- 如申請專利範圍第12項所述之客製化製造方法,其中該第一客戶要求或該第二客戶要求係包含一要求選自於亮度要求、光形要求、出光角度要求、波長要求、以及熱阻要求所組成之群組。
- 如申請專利範圍第12項所述之客製化製造方法,其中該光電元件包含發光二極體或太陽能電池。
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