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TWI366196B - Programmable memory built-in self test circuit - Google Patents

Programmable memory built-in self test circuit

Info

Publication number
TWI366196B
TWI366196B TW096135374A TW96135374A TWI366196B TW I366196 B TWI366196 B TW I366196B TW 096135374 A TW096135374 A TW 096135374A TW 96135374 A TW96135374 A TW 96135374A TW I366196 B TWI366196 B TW I366196B
Authority
TW
Taiwan
Prior art keywords
test circuit
programmable memory
self test
memory built
built
Prior art date
Application number
TW096135374A
Other languages
Chinese (zh)
Other versions
TW200915333A (en
Inventor
Yeong Jar Chang
Chung Fu Lin
Original Assignee
Faraday Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Faraday Tech Corp filed Critical Faraday Tech Corp
Priority to TW096135374A priority Critical patent/TWI366196B/en
Publication of TW200915333A publication Critical patent/TW200915333A/en
Application granted granted Critical
Publication of TWI366196B publication Critical patent/TWI366196B/en

Links

TW096135374A 2007-09-21 2007-09-21 Programmable memory built-in self test circuit TWI366196B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096135374A TWI366196B (en) 2007-09-21 2007-09-21 Programmable memory built-in self test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096135374A TWI366196B (en) 2007-09-21 2007-09-21 Programmable memory built-in self test circuit

Publications (2)

Publication Number Publication Date
TW200915333A TW200915333A (en) 2009-04-01
TWI366196B true TWI366196B (en) 2012-06-11

Family

ID=44725733

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096135374A TWI366196B (en) 2007-09-21 2007-09-21 Programmable memory built-in self test circuit

Country Status (1)

Country Link
TW (1) TWI366196B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160138617A (en) * 2015-05-26 2016-12-06 에스케이하이닉스 주식회사 Smart self repair device and method
KR20160148347A (en) * 2015-06-16 2016-12-26 에스케이하이닉스 주식회사 Self repair device and method
JP2021048230A (en) * 2019-09-18 2021-03-25 キオクシア株式会社 Semiconductor storage device
TWI781017B (en) * 2021-12-17 2022-10-11 力晶積成電子製造股份有限公司 Test system and test circuit thereof

Also Published As

Publication number Publication date
TW200915333A (en) 2009-04-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees