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TW259891B - - Google Patents

Info

Publication number
TW259891B
TW259891B TW083105788A TW83105788A TW259891B TW 259891 B TW259891 B TW 259891B TW 083105788 A TW083105788 A TW 083105788A TW 83105788 A TW83105788 A TW 83105788A TW 259891 B TW259891 B TW 259891B
Authority
TW
Taiwan
Application number
TW083105788A
Original Assignee
Mitsubishi Electric Machine
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Machine filed Critical Mitsubishi Electric Machine
Application granted granted Critical
Publication of TW259891B publication Critical patent/TW259891B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • H01L21/67781Batch transfer of wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67793Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations with orientating and positioning by means of a vibratory bowl or track
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/137Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
    • Y10S414/138Wafers positioned vertically within cassette

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
TW083105788A 1993-07-01 1994-06-25 TW259891B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16365693A JP2812642B2 (ja) 1993-07-01 1993-07-01 ウエハ整列機

Publications (1)

Publication Number Publication Date
TW259891B true TW259891B (zh) 1995-10-11

Family

ID=15778089

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083105788A TW259891B (zh) 1993-07-01 1994-06-25

Country Status (5)

Country Link
US (1) US5501568A (zh)
JP (1) JP2812642B2 (zh)
KR (1) KR0146270B1 (zh)
DE (1) DE4423207C2 (zh)
TW (1) TW259891B (zh)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0992704A (ja) * 1995-09-21 1997-04-04 Nakajima:Kk 半導体用シリコンウェハーの移し替え装置
KR100248864B1 (ko) * 1995-12-29 2000-03-15 윤종용 웨이퍼 이송장치를 위한 챠저 어셈블리
US6286688B1 (en) * 1996-04-03 2001-09-11 Scp Global Technologies, Inc. Compliant silicon wafer handling system
US5735662A (en) * 1996-05-14 1998-04-07 Micron Technology, Inc. Adjustable wafer transfer machine
US6413459B1 (en) * 1998-08-05 2002-07-02 Micron Technology, Inc. Method for handling and processing microelectronic-device substrate assemblies
US6250870B1 (en) 1998-08-05 2001-06-26 Micron Electronics, Inc. Apparatus for handling and processing microelectronic-device substrate assemblies
AU6423500A (en) * 1999-08-27 2001-03-26 Brooks Automation Ag Handling device for preparing a wafer stack
KR100714262B1 (ko) * 2000-10-13 2007-05-02 삼성전자주식회사 반도체장치 제조설비의 웨이퍼 이송장치 및 그에 따른카세트
JP4180787B2 (ja) * 2000-12-27 2008-11-12 東京エレクトロン株式会社 基板処理装置および基板処理方法
JP4033689B2 (ja) * 2002-03-01 2008-01-16 東京エレクトロン株式会社 液処理装置および液処理方法
US7180709B2 (en) * 2002-05-09 2007-02-20 Maxtor Corporation Information-storage media with dissimilar outer diameter and/or inner diameter chamfer designs on two sides
US7628895B2 (en) * 2002-05-09 2009-12-08 Seagate Technology Llc W-patterned tools for transporting/handling pairs of disks
US7367773B2 (en) * 2002-05-09 2008-05-06 Maxtor Corporation Apparatus for combining or separating disk pairs simultaneously
US7083871B2 (en) * 2002-05-09 2006-08-01 Maxtor Corporation Single-sided sputtered magnetic recording disks
US7600359B2 (en) * 2002-05-09 2009-10-13 Seagate Technology Llc Method of merging two disks concentrically without gap between disks
US7052739B2 (en) * 2002-05-09 2006-05-30 Maxtor Corporation Method of lubricating multiple magnetic storage disks in close proximity
MY138480A (en) * 2002-05-09 2009-06-30 Maxtor Corp Method of simultaneous two-disk processing of single-sided magnetic recording disks
US7083502B2 (en) * 2002-10-10 2006-08-01 Maxtor Corporation Method for simultaneous two-disk texturing
US8172954B2 (en) * 2002-10-10 2012-05-08 Seagate Technology Llc Apparatus for simultaneous two-disk scrubbing and washing
US7168153B2 (en) * 2002-10-10 2007-01-30 Maxtor Corporation Method for manufacturing single-sided hard memory disks
US7748532B2 (en) * 2002-10-10 2010-07-06 Seagate Technology Llc Cassette for holding disks of different diameters
US7083376B2 (en) * 2002-10-10 2006-08-01 Maxtor Corporation Automated merge nest for pairs of magnetic storage disks
US7882616B1 (en) 2004-09-02 2011-02-08 Seagate Technology Llc Manufacturing single-sided storage media
ATE435830T1 (de) * 2006-11-24 2009-07-15 Jonas & Redmann Automationstec Verfahren zum bilden einer in einem prozessboot zu positionierenden back-to-back wafercharge und handhabungssystem zum bilden der back-to-back wafercharge
JP5151306B2 (ja) * 2007-08-09 2013-02-27 富士通株式会社 部品供給装置及びその方法
US8567837B2 (en) * 2010-11-24 2013-10-29 Taiwan Semiconductor Manufacturing Company, Ltd. Reconfigurable guide pin design for centering wafers having different sizes
US8936425B2 (en) * 2012-01-23 2015-01-20 Tera Autotech Corporation Ancillary apparatus and method for loading glass substrates into a bracket
CN102651427A (zh) * 2012-04-21 2012-08-29 中国电子科技集团公司第四十八研究所 一种批量硅片导向装置
CN102983229B (zh) * 2012-12-27 2015-05-20 无锡先导自动化设备股份有限公司 太阳能电池片自动上料装置
CN111916384B (zh) * 2020-08-17 2022-05-17 鑫天虹(厦门)科技有限公司 一种键合机对准模块和键合机

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4108323A (en) * 1977-09-28 1978-08-22 Rca Corporation Machine for changing the spacing of a plurality of wafers
US4573851A (en) * 1983-05-18 1986-03-04 Microglass, Inc. Semiconductor wafer transfer apparatus and method
US4695217A (en) * 1983-11-21 1987-09-22 Lau John J Semiconductor wafer transfer apparatus
JPS60182735A (ja) * 1984-02-29 1985-09-18 Tomuko:Kk ウエ−ハの配列ピツチ変更装置
JPS6270437U (zh) * 1985-10-21 1987-05-02
JPS636857A (ja) * 1986-06-26 1988-01-12 Fujitsu Ltd ウエ−ハ移し替え装置
JPS6448442A (en) * 1987-08-19 1989-02-22 Texas Instruments Japan Shifter for semiconductor wafer
US5030057A (en) * 1987-11-06 1991-07-09 Tel Sagami Limited Semiconductor wafer transferring method and apparatus and boat for thermal treatment of a semiconductor wafer
US4856957A (en) * 1988-01-11 1989-08-15 Mactronix, Inc. Semiconductor wafer transfer apparatus with back-to-back positioning and separation
FR2627760B1 (fr) * 1988-02-26 1993-01-22 Stephanois Rech Mec Dispositif pour le transfert d'articles d'au moins un organe support a au moins un autre organe support
JP2590363B2 (ja) * 1988-04-05 1997-03-12 東京エレクトロン株式会社 ピッチ変換機
KR0129405B1 (ko) * 1988-04-25 1998-04-07 하자마 겐쥬 배열된 판형상체의 상호 피치간격을 변환하는 피치변환장치 및 피치변환방법
JPH02169408A (ja) * 1988-12-21 1990-06-29 Matsushita Electric Ind Co Ltd 基板ピッチ変更装置
US4957406A (en) * 1989-05-08 1990-09-18 Intelmatec Corporation Apparatus for transferring disks from one cassette to another with different pitch
JPH0379341A (ja) * 1989-08-22 1991-04-04 Kawasaki Steel Corp 溶接性の良好な塗装鋼板
JPH0384043A (ja) * 1989-08-28 1991-04-09 Nippon Sheet Glass Co Ltd 二酸化珪素被覆ポリカーボネート成形体およびその製造方法
JP2796169B2 (ja) * 1990-03-23 1998-09-10 株式会社タカトリハイテック ウエーハの移載装置
US5188499A (en) * 1990-12-14 1993-02-23 Mactronix Method and apparatus for varying wafer spacing

Also Published As

Publication number Publication date
DE4423207C2 (de) 1997-09-25
US5501568A (en) 1996-03-26
JPH0717629A (ja) 1995-01-20
KR0146270B1 (ko) 1998-11-02
JP2812642B2 (ja) 1998-10-22
DE4423207A1 (de) 1995-01-12
KR950004421A (ko) 1995-02-18

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