TW201836957A - Device handler, and transferring method for device - Google Patents

Abstract

The present invention relates to a device handler and, more specifically, to a device handler which withdraws a device then inserts a new device into a board having a plurality of device sockets mounted thereon. Disclosed is a device handler capable of more quickly performing device withdrawal and insertion operations by comprising: a first board table (210) for moving a board (20) for device withdrawal in a Y-axis direction; and a second board table (220) for moving the board (20) for device insertion, in which a DC test was performed, in the Y-axis direction by receiving the board (20), from which the device (10) is withdrawn, from the first board table (210).

Description

 Component processor and component transmission method  

BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to an element processor, and more particularly to an element processor for inserting a new element after a refining plate deriving element provided with a plurality of component sockets, and a component picking and placing method for picking up and placing the component.

The semiconductor element (hereinafter referred to as "element") performs various inspections such as reliability inspection of electrical characteristics, heat, or pressure after the packaging process is completed.

In the inspection of the semiconductor element, for example, a burn-in test is performed. The burn-in test means that a plurality of components are inserted in the component socket 21 of the Burn-in Board, and the burn-in test substrate is accommodated in the test. In the burn-in test apparatus, after a predetermined time of heat or pressure is applied, it is discriminated whether or not a defective component is present.

The component device for aging test generally refers to a device that classifies (unloads) components from an aged test substrate on which components that are performing the burn-in test are mounted, according to inspection results of respective components such as pass and fail, and classification criteria given thereto. Each of the trays was reinserted into the component to be subjected to the burn-in test at the empty position (socket) of the burn-in test substrate on which the component was placed.

In addition, the performance of the component processor as described above is evaluated by the number of sorting per unit time (UPH: Units Per Hour), and the UPH transfers the components between the constituent elements constituting the component processor, and transfers the aged test substrate. The time required to decide.

Therefore, in order to improve the performance of the component processor, that is, UPH, it is necessary to improve the structure and configuration of each component.

As described above, the component processor for improving the UPH is as follows: Korean Patent No. 10-1133188 (Patent Document 1), Korean Patent No. 10-1177319 (Patent Document 2), and Korean Patent Publication No. 10-2016 -48628 (Patent Document 3) and the like.

On the other hand, as the market size of SD RAM to the standardized components such as the recent NAND flash memory continues to expand, mass production is also expanding.

In addition, in the mass production of components, the inspection requirements for components are also increased; with the subsequent process setting a plurality of component processors for classifying components according to the inspection results, according to the space occupied by the component processor's logistics supply structure device Differently, the supply structure of the tray, the plate, and the like of the device is a very important factor in the arrangement of the device.

Moreover, the component (that is, the object to be processed) is in a trend of miniaturization and thinning, and in particular, a plurality of terminals for connecting to external terminals are formed on the bottom surface, and the pitch between the terminals is also tended to be reduced, so Ability to fully cope with the performance of this trend.

 Patent Literature  

(Patent Document 1) KR10-1133188 B

(Patent Document 2) KR10-1177319 B

(Patent Document 3) KR1020160048628 A

(Patent Document 4) KR10-0805655 B

(Patent Document 5) KR10-1177319 B

(Patent Document 6) KR10-1216359 B

(Patent Document 7) KR1020150122031 A

(Patent Document 8) KR1020130099783 A

SUMMARY OF THE INVENTION An object of the present invention is to provide an element processor capable of performing component derivation and component insertion work more quickly on a refining plate provided with a component socket, in view of the problems and trends as described above.

Another object of the present invention is to provide a component picking and placing method that can efficiently pick up and place components of components of various specifications by an element processor.

The present invention has been made in order to achieve the above object. The present invention discloses a component processor comprising: a first refining table 210, receiving a refining provided with a plurality of component sockets 21 from a refining plate loader 800 The plate 20 moves the plate 20 in a Y-axis direction to derive the component 10 inserted into the component socket 21, wherein the component socket 21 is inserted with the component 10; an unloading buffer portion 310 is disposed at the first platen 210 Side, and a component unloading position UL1 and a component sorting position UL2 are set in the Y-axis direction, and a plurality of trays 30 are alternately arranged to the component unloading position UL1 and the component sorting position UL2, wherein the component unloading position UL1 is located at the first refining plate The refining plate 20 of the stage 210 receives the component 10, and the component sorting position UL2 sorts the loading component 10 according to a predetermined sorting criterion; an unloading transporting tool 510 derives the component 10 from the refining plate 20 located at the first refining plate 210, and the component 10 is transported to the tray 30 at the component unloading position UL1; a sorting tray portion 320 is adjacent to the component sorting position UL2 of the unloading buffer portion 310, and is placed in an X-axis direction according to a predetermined classification level. a tray 30; a component sorting tool 520, which reconfigures the components 10 in the tray 30 at the component sorting position UL2 and the tray 30 in the sorting tray portion 320 according to a predetermined classification level; a second panel The stage 220 receives the refining plate 20 from which the component is led out from the first refining plate 210 in the X-axis direction, and moves the refining plate 20 in the Y-axis direction so that the new component 10 is inserted into the component socket 21 of the refining plate 20; The DC test unit 230 is disposed adjacent to the second refining table 220, and is configured with a DC test socket 231 for DC test in the X-axis direction; a loading and transporting tool 530, and the component that is inspected as a good product is output from the DC test unit 230. 10, the component 10 is inserted into the component socket 21 of the second pallet station 220; a loading tray section 110 is provided adjacent to the DC test section 230, and one or more trays 30 for supplying the component 10 to the DC test section 230 are provided. The DC defective product tray unit 120 is adjacent to the DC test unit 230, and one or more trays 30 are disposed in the X-axis direction with respect to the loading tray unit 110, and are classified and loaded according to the inspection result of the defective test by the DC test unit 230. Element 10; and one Loading tool element 540, a DC test unit for conveying member 230, and transmitting the tray 230 to the DC defective portion 120 from the loading tray element portion 110 from the DC test unit.

The component processor sets a first plate transport line BL1 in the X-axis direction to transfer the refining plate 20 from the plate loader 800 to the first refining plate 210; and sets a second plate transport line BL2 in the X-axis direction. To transfer the refining plate 20 from the second refining table 210 to the refining plate loader 800; the second refining plate conveying line BL2 is located on the lower side than the first refining plate conveying line BL1 to prevent transportation with the first refining plate Line BL1 interferes.

The unloading buffer portion 310 may include a pair of trays 30 that are alternately located at the component unloading position UL1 and the component sorting position UL2, and a tray transporting portion 311 that moves the tray 30 such that the pair of trays 30 are alternately positioned at the component unloading position UL1 and the components Sorting position UL2.

The unloading conveyance tool 510 is combined with an image acquisition section 519 that takes an image of the component socket 21 after deriving the component 10 to confirm the position of the connection terminal of each component socket 21 on the refining plate 20.

The invention discloses a component picking and placing method for picking up a component 10 from a first loading portion by a transporting tool and placing it on a second loading portion, wherein the transporting tool is provided with k pickers at a spacing distance x, the first A loading portion is provided with m elements 10 at a first spacing distance x1, and the second loading portion is configured with a second spacing distance x2 for n loading slots of the insertion element 10, the second spacing distance x2 and the first spacing The distance x1 is different, wherein the method comprises: a first picking step, when the first spacing distance x1 is less than the second spacing distance x2 by a predetermined size, setting the spacing distance x of the conveying tool to the first loading The first interval distance x1 in the portion is doubled from the first loading portion to pick up the component 10; a second picking step is to set the pickup of the component 10 not picked up in the first picking step to The first spacing portion of the first loading portion is twice the distance x1, and the component 10 is picked up from the first loading portion every interval; in a placing step, the conveying tool moves toward the second loading portion Three intervals The distance x3 is set to the second separation distance x2, and the components 10 are placed in the loading slots of the second loading portion, respectively.

Preferably, the number of pickers of the transporting tool is the same as the number of loading slots of the second loading section.

The first loading portion is a tray 30 for use in a burner sorter; the second loading portion is a DC test portion 230 disposed in the burner sorter; the transporting tool is further provided with more than one stacking picker The stacking picker is used to pick up the component 10 that is inspected by the DC test unit 230 as a defective product.

The component processor of the present invention includes a first refining table 210 and a second refining table 220, which can perform component derivation and component insertion operations more quickly, wherein the first refining table 210 is moved in the Y-axis direction for deriving components. The refining plate 20 and the second refining table 220 receive the refining plate 20 from which the component 10 is led out from the first refining table 210, and move the refining plate 20 for inserting the component for performing the DC test in the Y-axis direction.

The component processor of the present invention has the advantage that the component unloading tool 510 is also incorporated in the image acquiring portion 519 of the photographing element socket 21 by the component unloading tool 510 that derives the component from the refining plate 20, thereby acquiring the image of the component socket 21 while deriving the component. Therefore, it is possible to perform loading of the components on the second refining table 220 more accurately.

In particular, it has the advantage that as the miniaturization and integration of the component 10 form a very small separation distance on the bottom surface, it is required that the component 10 is more accurately positioned on the refining plate 20, so that when the component is loaded, the correction is performed on the component. The loading state of the component 10 of the socket 21, in turn, enables the component 10 to be positioned more accurately on the refining plate 20.

10‧‧‧ components

20‧‧‧Refer

21‧‧‧Component socket

30‧‧‧Tray

80‧‧‧ camera

110‧‧‧Loading tray section

120‧‧‧DC unqualified product tray department

130‧‧‧ Empty tray department

140‧‧‧Tray loading department

210‧‧‧First refining platform

220‧‧‧Second refining platform

230‧‧‧DC Test Department

231‧‧‧DC test socket (socket)

232‧‧‧DC Test Department

310‧‧‧Unloading buffer

311‧‧‧Tray Delivery Department

320‧‧‧ sorting tray department

510‧‧‧Unloading transport tools

511‧‧‧ Picker

512‧‧‧Image Acquisition Department

519‧‧‧Image Acquisition Department

520‧‧‧Component sorting tool

530‧‧‧Loading and transporting tools

531‧‧‧ Picker

539‧‧‧Image Acquisition Department

540‧‧‧Component loading tool

541‧‧‧ Picker

542‧‧‧Stack Pickup

610‧‧‧First Identification Department

611, 621, 641‧‧‧Image Acquisition Department

620‧‧‧Second Identification Department

649‧‧‧ camera

670‧‧‧ Third Identification Department

680‧‧‧ Fourth Identification Department

800‧‧‧Board loader

810, 820, 830, 840‧‧ ‧Adsorption pad replacement

UL1‧‧‧ component unloading position

UL2‧‧‧ component sorting position

BL1‧‧‧First board transportation line

BL2‧‧‧Second board transportation line

BIN1~BIN4‧‧‧Tray loading department (classification level)

x ₁ ‧‧‧first separation distance

x ₂ ‧‧‧Second separation distance

x ₃ ‧‧‧ third separation distance

G, DC1, DC2, E‧‧‧ pallet loading department

1 is a plan view showing an example of a component processor of the present invention; FIG. 2 is a schematic view showing a process of loading and unloading a panel by the component processor of FIG. 1; FIG. 3 is a diagram showing uninstallation in the component processor of FIG. Side view of an example of the structure of the buffer portion; FIG. 4 is a schematic view showing a process of picking up and placing components in the order of loading the tray portion - DC test portion - the plate in the component processor of FIG. 1; FIG. 5a and FIG. 5b As a variation of the schematic diagram shown in FIG. 4, a schematic diagram showing a process of picking up components on a tray in the loading tray section for transporting components from the loading tray section to the DC test section; FIG. 6 is shown in FIG. A plan view showing a process of transporting components from the loading tray portion to the DC test portion in the transport of the components; FIG. 7 is a view showing an example of the unloading transport tool and the loading and transporting tool used in the component processor of FIG. 1; Is a view showing an example of a component loading tool used in the component processor of Fig. 1.

Hereinafter, an element processor and a component picking and placing method of the present invention will be described with reference to the drawings.

As shown in FIG. 1, the component processor of the present invention includes a first refining table 210, which receives the refining plate 20 from the refining loader 800 and moves the refining plate 20 in the Y-axis direction to derive components inserted in the component socket 21. 10, wherein the refining plate 20 is provided with a plurality of component sockets 21, the component sockets are inserted with the components 10; the unloading buffer portion 310 is disposed on the side of the first refining table 210, and the component unloading position UL1 and the component points are set in the Y-axis direction. The position UL2 is sorted, and a plurality of trays 30 are alternately placed at the component unloading position UL1 and the component sorting position UL2, wherein the component unloading position UL1 receives the component 10 from the refining plate 20 located at the first refining table 210, and the component sorting position UL2 is Sorting and loading the component 10 according to a predetermined classification criterion; unloading the transport tool 510, deriving the component 10 from the refining plate 20 located at the first refining plate 210, and transporting the component 10 to the tray 30 at the component unloading position UL1; the sorting tray The part 320 is adjacent to the component sorting position UL2 of the unloading buffer unit 310, and sets a plurality of trays 30 in the X-axis direction according to a predetermined classification level; the component sorting tool 520, according to a predetermined classification level, The piece 10 is further disposed in the tray 30 located at the component sorting position UL2 and the tray 30 located in the sorting tray portion 320; the second palletizing station 220 receives the finished panel from the first pallet stage 210 in the X-axis direction. 20 is then moved in the Y-axis direction so that the new component 10 is inserted into the component socket 21 of the refining plate 20; the DC test section 230 is disposed to abut the second refining plate 220, and is disposed in the X-axis direction for the component 10. The DC test socket 231 of the DC test; the loading and transporting tool 530, the component 10 that is inspected as a good product is taken out from the DC test unit 230, the component 10 is inserted into the component socket 21 of the second platen table 220, and the loading tray portion 110 is set to The DC test unit 230 is adjacent to the DC test unit 230, and one or more trays 30 for supplying the components 10 to the DC test unit 230 are provided. The DC defective product tray unit 120 is disposed adjacent to the DC test unit 230 in the X-axis direction with respect to the loading tray unit 110. The above tray 30 sorts the loading member 10 based on the inspection result of the defective product by the DC test portion 230; one or more component loading tools 540 for transferring the component from the loading tray portion 110 to the DC test portion 230, and DC test part 230 DC defective transfer member 120 of the tray part.

Here, the component 10 as a processing object of the component processor of the present invention may be a memory semiconductor or a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), and a system LSI (Large Scale Integration, Large integrated circuit) and so on.

In particular, the element 10 may be any element that can be inserted into the component socket 21 of the refining plate 20 to perform a predetermined inspection (electrical test or the like).

For example, the component 10 may be a BGA component having a spherical outer terminal formed on its bottom surface.

The refining plate 20 is used as a refining plate (aging test substrate or the like) provided with the component receptacle 21 of the insertion member 10 to perform component inspection, and may have any configuration depending on the type of inspection of the component.

On the other hand, as shown in FIG. 1, the refining plate 20 is continuously received by the plate loader 800.

The plate loader 800 is a structure in which the refining plate 20 in which the component 10 is inserted is sequentially loaded and discharged while loading and unloading the refining plate 20 in which the component 10 is inserted, that is, as the first refining plate 20 is continuously supplied to the first refining plate 210. The structure may have various structures, and is specifically constituted by a plate loader disclosed in Patent Documents 1 to 5.

For example, when the plate loader 800 is viewed from the introduction direction of the refining plate 20 in the -X axis direction (for example, in the right direction to the left direction in FIG. 1), a plurality of refining plates 20 are loaded on one side. After the rack is introduced/discharged, the refining plate 20 loaded on the rack is guided to the other side, and the refining plate 20 is conveyed to the first laminating table 210, which will be described later, and then from the second refining table 220, which will be described later. The received refining plate 20 can be loaded on a rack.

On the other hand, the plate loader 800 conveys the refining plate 20 to the first refining table 210 in a direction in which the refining plate 20 is moved by the first refining table 210 to be described later (that is, in the X-axis direction perpendicular to the Y-axis).

Therefore, as shown in FIGS. 1 and 2, the component processor of the present invention sets the first plate conveyance line BL1 in the X-axis direction.

The first plate conveyance line BL1 is a conveyance line of the refining plate 20 set to convey the refining plate 20 from the plate loader 800 to the first refining table 210, as long as it can be moved from the plate loader 800 to the first A refining plate 210 can transfer the structure of the refining plate 20, and can be any structure.

Then, a first identification portion 610 may be provided, which is disposed on the route from the plate loader 800 to the first platen stage 210 to acquire the plate 20 and the component 10 inserted into the plate 20 Information.

The first recognition unit 610 is configured to be disposed on the route from the plate loader 800 to the first platen stage 210 to acquire the information of the plate 20 and the component 10 inserted in the plate 20, and may be a camera or the like. Various structures.

In addition, the first recognition portion 610 may have various configurations, specifically, photographing the entirety of the refining plate 20 according to the information acquisition form, or identifying another identification (such as a QR code additionally marked on the refining plate 20).

The first slab 210 may have various structures, and the first slab 210 receives the slab 20 provided with the plurality of component sockets 21 of the insertion member 10 from the slab loader 800, and moves in the Y-axis direction to derive the insertion. Element 10 of component socket 21.

Specifically, the first slab 210 receives the slab 20 from the slab loader 800 via the first slab transfer line BL1.

Further, the first slab 210 is moved in the Y-axis direction while the slab 20 is fixed, and the components can be led out by the unloading conveyance tool 510 which will be described later.

To this end, the first refining table 210 may include: a fixing tool for fixing the refining plate 20; a first linear refining conveying portion for moving the fixing tool of the fixing plate 20 in the Y-axis direction (not shown) .

Then, a third identification portion 670 for identifying the movement in the Y-axis direction of the refining plate 20 may be provided on the upper portion of the first refining table 210.

The third recognition unit 670 is configured to be disposed on the upper portion of the first refining table 210 for identifying the Y-direction movement of the refining plate 20, and may be a camera or the like.

In this case, the third recognition unit 670 may have any configuration as long as it can recognize the movement of the refining plate 20 in the Y-axis direction, and specifically may include the component socket 21 itself for identifying the refining plate 20 or the identification on the refining plate 20. Marked identifiers, etc.

On the other hand, a socket presser (not shown) is provided at a position where the component 10 is discharged by the unloading conveyance tool 510, and the socket pressurizer pressurizes the component receptacle 21 from the upper side to derive the component 10 from the refining plate 20.

The socket presser has a structure in which the element 10 is led out from the refining plate 20 at a position where the element 10 is led out by the unloading conveyance tool 510 as a structure from the upper side pressurizing element socket.

On the other hand, the socket pressurizer may be provided automatically or manually to correspond to the size of the component 10, the interval between the component receptacles 21, and the like.

In addition, the socket pressurizer may change the interval between the socket pressurizing portions (not shown) corresponding to the respective component sockets 21 to correspond to the interval change between the component receptacles 21.

In addition, the socket pressurizer may also change the size of the opening corresponding to each of the component receptacles 21 to correspond to the size of the component 10, the interval between the component receptacles 21, and the like.

The unloading buffer portion 310 may have various structures, and the unloading buffer portion 310 is disposed on the side of the first refining table 210, and sets the component unloading position UL1 and the component sorting position UL2 in the Y-axis direction, and turns the plurality of trays 30 in turn on the components. The unloading position UL1 and the component sorting position UL2, wherein the component unloading position UL1 receives the component 10 from the refining plate 20 located at the first refining plate 210, and the component sorting position UL2 sorts the loading component 10 according to a predetermined classification reference.

For example, as shown in FIGS. 1 and 3, the unloading buffer portion 310 may include a pair of trays 30 that are alternately positioned at the component unloading position UL1 and the component sorting position UL2; in order to rotate the pair of trays 30 at the component unloading position UL1 and the components The tray transport unit 311 of the tray 30 is moved by sorting the position UL2.

The tray transport unit 311 is configured to move the tray 30 by rotating the pair of trays 30 at the component unloading position UL1 and the component sorting position UL2, and may be various structures such as a moving guide portion and a linear drive portion.

On the other hand, it is preferable that the tray 30 of the unloading buffer unit 210 uses the same tray as the tray of the sorting tray unit 320, the tray of the loading tray unit 110, and the like, which will be described later.

In addition, the tray 30 of the unloading buffer portion 210 can be replaced according to the specifications of the element 10.

The unloading conveyance tool 510 may have various structures, and the unloading conveyance tool 510 is a structure that discharges the component 10 from the refining plate 20 located at the first refining table 210 to convey the component 10 to the tray 30 at the component unloading position UL1.

For example, the unloading conveyance tool 510 may include: one or more pickups 511 having a suction head passing through the vacuum pressure adsorption element 10 at the end; picking up the pickup 511 in the XZ, YZ or XYZ direction (preferably, the XZ direction) Transport device.

In particular, the unloading conveyance tool 510 arranges the pickups 511 in a row, or may be configured in various shapes of 8 × 1, 8 × 2, and the like.

In particular, as shown in FIG. 7, the unloading conveyance tool 510 may have a pickup 511 corresponding to the number and arrangement of 1/N (N is a natural number) of the number of the component sockets 21 disposed on the refining plate 20 in the X-axis direction. The component 10 is derived from the entire row on the refining plate 20.

In addition, since the intervals of the component receptacles 21 on the refining plate 20 (i.e., the component loading pitch on the tray 30) may be different from each other, the unloading conveyance tool 510 can adjust the spacing between the pickups 511 of the pickup component 10.

On the other hand, as the size of the element 10 is reduced or the pitch between the terminals such as the ball grid formed on the bottom surface of the element 10 is refined, in order to insert the element 10 into the component socket 21 of the refining plate 20, the component 10 is accurately moved. The location is very important.

Accordingly, it is preferable to know the exact position of the connection terminal of the component receptacle 21 formed on the refining plate 20 in the process of deriving the component 10 from the refining plate 20 by the unloading conveyance tool 510.

To this end, as shown in FIG. 7, the unloading conveyance tool 510 may be combined with an image acquisition section 519 that takes an image of the component socket 21 after deriving the component 10 to confirm that each component socket 21 is on the refining plate 20. The location on the top.

The image acquisition unit 519 can be configured by a camera or the like, and the image acquisition unit 519 captures an image of the component socket 21 after deriving the component 10, and confirms that it is formed on the refining plate 20 while being moved together with the unloading conveyance tool 510. The position of the connection terminal of the component socket 21.

On the other hand, the image acquisition unit 519 also recognizes the identification for confirming the specifications, dimensions, and the like of the refining plate 20, and can also confirm the position of each component socket 21 on the refining plate 20.

For example, the identification for confirming the specifications, dimensions, and the like of the refining plate 20 may be formed in various forms, such as four marks or the like marked at each vertex of the rectangular plate.

The position of each component socket 21 obtained on the refining plate 20 obtained by the image acquisition section 519 is transmitted to the second refining plate 220, which will be described later, by deriving all the components 10 from the first refining table 210, and then fixed to the second refining plate. The stage 220, in this state, is flexibly used as positional information of each component receptacle 21 on the refining plate 20, and the work of loading the component 10 by the loading and transporting tool 530 can be performed more quickly and accurately.

On the other hand, the identification for confirming the specifications, dimensions, and the like of the refining plate 20 is flexibly applied to confirm the accuracy of the refining plate 20 and the respective component receptacles 21 on the refining plate 20 in a state where the second refining table 220 is fixed. position.

The sorting tray unit 320 has a configuration in which a plurality of trays 30 are disposed in the X-axis direction in accordance with a predetermined sorting level as the component sorting position UL2 adjacent to the unloading buffer unit 310, and the tray 30 can be transported depending on the arrangement of the trays 30. structure.

For example, the sorting tray unit 320 is adjacent to the component sorting position UL2 of the unloading buffer unit 310, and a plurality of trays 30 can be arranged in the X-axis direction based on the predetermined classification levels BIN1, BIN2, BIN3, and BIN4.

Here, at least one of the trays 30 of the sorting tray portion 320, preferably the tray 30 to which the BIN 4 is given, can directly receive and arrange the tray 30 of the unloading buffer portion 310.

In addition, the defective product is excluded from the tray 30 located at the component sorting position UL2 of the unloading buffer unit 310, and then transferred to the tray 30 corresponding to the predetermined classification levels BIN1, BIN2, BIN3, and BIN4, and is transmitted from the initial to the minute. The tray 30 of the sorting tray unit 320 is derivatized to be loaded in an empty position in the tray 30 located at the component sorting position UL2.

Then, the trays 30 that are all filled with the good products and located at the component sorting position UL2 are transferred to the additionally provided tray unloading portion G, and are not placed in the component sorting position UL2 of the unloading buffer portion 310 without the tray transporting device (not shown). A new empty tray 30 of the filling element 10.

The component sorting tool 520 has a configuration in which the components 10 are relocated to the tray 30 of the tray 30 and the component sorting tray unit 320 located at the component sorting position UL2 according to a predetermined classification level, and can have various configurations.

For example, the component sorting tool 520 may include: one or more pickers having an adsorption head at the end to pass the vacuum pressure adsorbing element 10; and a picker that moves the picker in the XZ, YZ, XYZ directions (preferably, the XYZ direction) Shipping device.

In particular, the component sorting tool 520 can arrange the pickers in a row or in various shapes, such as 8x1, 10x1, 8x2, and the like.

The second refining table 220 may have various structures, and the second refining table 220 receives the refining plate 20 from which the component is led out from the first refining table 210 in the X-axis direction, and then moves in the Y-axis direction, and further in the refining plate 20 The component socket 21 is inserted into the new component 10.

Specifically, the second slab 220 receives the slab 20 from which the component is led out from the first slab 210 in the X-axis direction.

At this time, the second refining table 220 is different from the first refining table 210 which requires relatively low accuracy, and the component 10 should be accurately loaded for the component receptacle 21.

Accordingly, the second identification portion 620 can be provided in the way of transporting the refining plate 20 from the first refining table 210, and the second identification portion 620 is used to acquire the information of the refining plate 20 and the component 10 inserted in the refining plate 20.

The second recognition unit 620 is configured to acquire information on the refining plate 20 and the component 10 inserted in the refining plate 20 on the transport path for transporting the refining plate 20 from the first refining plate 210, and may have various structures, specifically a camera. Wait.

Further, the second recognition unit 620 may have various configurations depending on the information acquisition form, specifically, the entire refining plate 20 may be photographed, or another mark such as a QR code additionally marked on the refining plate 20 may be identified.

Further, it is preferable that the second slab 220 is different from the first slab 210, and the second slab 220 is movable in the X-Y axis direction so that the component 10 can be accurately mounted on the component socket 21.

To this end, the first refining table 220 may include: a fixing tool for fixing the refining plate 20; and a second linear refining conveying portion (not shown) for moving the fixing tool of the fixed refining plate 20 in the X-Y axis direction.

Further, a fourth identification portion 680 for identifying the movement of the refining plate 20 in the X-Y axis direction may be provided on the upper portion of the second refining table 220.

The fourth recognition unit 680 is configured to be disposed on the upper portion of the second platen 220 to recognize the movement of the plate 20 in the X-Y axis direction, and a camera or the like can be used.

In this case, the fourth recognition unit 680 may have any configuration as long as it can recognize the movement of the refining plate 20 in the XY-axis direction; specifically, the component socket 21 itself for identifying the refining plate 20 or An additional marking or the like on the board 20.

On the other hand, a socket presser (not shown) from the upper side pressurizing element receptacle 21 is provided at a position where the component 10 is inserted by the loading and transporting tool 530, so that the component 10 can be inserted into the refining plate 20.

The socket pressurizer may have various structures, and the socket pressurizer pressurizes the component receptacle 21 from the upper side at a position where the component 10 is inserted by the component transporting tool 530, so that the component 10 can be inserted into the component receptacle 21 of the refining plate 20. .

Alternatively, the socket pressurizer can be replaced to correspond to the size of the component 10, the spacing between the component receptacles 21, and the like.

In addition, the socket pressurizer may change the interval between the socket pressurizing portions (not shown) corresponding to the component receptacle 21 to correspond to the interval change between the component receptacles 21.

In addition, the socket presser may also change the size of the opening corresponding to each of the component receptacles 21 to correspond to the size of the component 10, the interval between the component receptacles 21, and the like.

On the other hand, the refining plate 20 in which the component 10 is inserted in the second refining table 220 is moved to the lower side (i.e., the Z-axis direction), and then moved to the plate loader 800 in the X-axis direction.

Therefore, as shown in FIGS. 1 and 2, the component processor of the present invention sets the second material conveying line BL2 in the X-axis direction.

The second plate transport line BL2 serves as a transport line for the plate 20 to be transported from the second platen 210 to the plate loader 800, as long as it can be transferred from the second platen 210 to the plate. The loader 800 may transfer the structure of the refining plate 20, or may be set to any one of the structures.

On the other hand, as shown in FIG. 2, the second plate transport line BL2 may interfere with the first plate transport line BL1 described above. To prevent this, the second plate transport line BL2 is preferably located below The position of the first sheet conveying line BL1.

If the second plate transport line BL2 is located below the lower side of the first plate transport line BL1, the process of loading and unloading the plate 20 is smooth, and further has the advantage that the size of the device can be minimized.

The DC test unit 230 is configured to be adjacent to the second refining table 220 and to arrange the DC test socket 231 (for the DC test element 10) in the X-axis direction, and may have various configurations.

The DC test unit 230 may be constituted by a plurality of sockets 231 capable of electrically connecting the elements 10, etc., and may have various configurations, and it is preferable to be able to correspond to the number of the component sockets 21 arranged in the X-axis direction on the refining plate 20. The DC test unit 230 is provided in the number and arrangement of N (N is a natural number).

On the other hand, according to the result of testing the respective elements 10 by the DC test unit 230, the element 10 inspected as a defective product is flexibly used as the material of the sorting element of the component sorting tool 540 to be described later.

In addition, as shown in FIG. 1, the DC test unit 230 can be automatically or manually replaced with another type of DC test portion 232 to correspond to the specifications of the component 10 (for example, the specifications of the component 10), the interval between the component receptacles 21, and the like. Variety.

The loading and transporting tool 530 may have various structures, and the loading and transporting tool 530 derives the component 10 inspected as a good product by the DC testing section 230, and inserts the component 10 into the component socket 21 of the second baking table 220.

For example, as shown in FIG. 7, the loading and transporting tool 530 may include: one or more pickers 531 having a pick-up head passing through the vacuum pressure-sucking element 10 at the end; and a pick-up transporting device in the XZ, YZ or XYZ direction (preferably The pickup 531 is moved in the XYZ-θ direction.

Here, the horizontal rotation error (theta direction rotation error) of the element 10 may occur during the pickup and transport of the component 10 by the DC test portion 230, and in order to correct the error, the loading and transporting tool 530 is preferably capable of horizontal rotation (ie, , θ direction) to rotate each of the pickups 531.

In addition, the loading and transporting tool 530 may have various structures for accurately rotating the pickup 531 when correcting the horizontal rotation error (theta-direction rotation error) of the component 10 picked up by the pickup 531; rotating the component picked up by the pickup 531 At 10 o'clock, it is necessary to rotate a plurality of pickups 531 or to rotate the pickups 531 and the like, respectively.

In addition, the horizontal rotation error (θ direction rotation error) of the element 10 in the process of picking up and transporting the element 10 by the DC test portion 230 can be measured by the image acquisition portion 641 provided on the moving path of the loading and transporting tool 530.

The image acquisition unit 641 is configured to measure the horizontal rotation error (the θ direction rotation error) of the element 10 in the process of picking up and transporting the element 10 by the DC test unit 230, and may have a configuration according to the loading and transporting tool 530 and a picking method. Various structures.

In addition, the loading and transporting tool 530 may arrange the pickers in a row or in various shapes, such as 8x1, 10x1, 8x2, and the like.

In particular, the loading and transporting tool 530 may have a pickup 531 corresponding to the number and arrangement of 1/N (N is a natural number) of the number of the component receptacles 21 arranged in the X-axis direction on the refining plate 20, in the refining plate 20 Element 10 is inserted across the entire line.

In addition, since the intervals (i.e., the pitch) of the component receptacles 21 on the refining plate 20 and the component loading pitch on the tray 30 can be different from each other, the loading and transporting tool 530 can adjust the spacing between the pickups 531 of the pickup components 10.

However, it is preferable that the socket interval in the DC test portion 230 is the same as the interval of the component socket 21 on the refining plate 20, and in this case, it is not necessary to adjust the interval between the pickups of the pickup member 10.

On the other hand, as the size of the element 10 is reduced or the pitch between the terminals such as the ball grid formed on the bottom surface of the element 10 is refined, in order to insert the element 10 into the component socket 21 of the refining plate 20, the component 10 is accurately moved. The location is very important.

Accordingly, it is preferable to understand the exact position of the connection terminal of the component receptacle 21 on the refining plate 20 during the loading of the component 10 by the loading and transporting tool 530.

To this end, as described above, the image acquisition section 512 is provided at the unloading conveyance tool 510 to acquire and flexibly apply the image of each component socket 21, and as an alternative (as shown in FIG. 7), the unloading conveyance tool 510 may be employed. The image acquisition unit 539 is provided, and the image acquisition unit 539 photographs the image of the component socket 21 after deriving the component 10 to confirm the position of each component socket 21 on the refining plate 20.

The image acquisition unit 539 is configured to photograph the position of the component socket 21 after the element 10 is derivatized to confirm the position of the connection terminal formed by the component socket 21 on the refining plate 20, and may be constituted by a camera or the like.

On the other hand, the image acquisition unit 539 also recognizes the identification for confirming the specifications, dimensions, and the like of the refining plate 20, and can also confirm the position of each component socket 21 on the refining plate 20.

For example, the identification for confirming the specifications, dimensions, and the like of the refining plate 20 may be formed in various forms, such as four marks or the like marked at each vertex of the rectangular plate.

Then, with respect to the position of each component socket 21 obtained on the refining plate 20 obtained by the image acquisition section 539, all the components 10 are transferred from the first refining table 210 to the second refining table 220, which will be described later, and then fixed to the second. In this state, the platen table 220 is flexibly used as the positional information of the component receptacles 21 on the refining plate 20, and the operation of loading the component 10 by the loading and transporting tool 530, which will be described later, can be performed more quickly and accurately.

On the other hand, it is applied flexibly to the identification of the specifications, dimensions, and the like of the refining plate 20, so that the accurate position of the refining plate 20 and the respective component receptacles 21 on the refining plate 20 can be confirmed in a state where the second refining table 220 is fixed.

The loading tray portion 110 may have various structures, the loading tray portion 110 is adjacent to the DC testing portion 230 and more than one tray 30 is placed to supply the component 10 to the DC testing portion 230.

For example, the loading tray portion 110 may have two or more trays 30 disposed in the X-axis direction, and the two or more trays 30 are adjacent to the DC test portion 230 to supply the components 10 to the DC test portion 230.

Here, the reason why the two or more trays 30 are disposed in the loading tray unit 110 is as follows: When all the components 10 are transferred to the DC test unit 230 by a certain component 30 of the component loading tool 540 to be described later, the adjacent trays 30 are turned to DC. The test unit 230 transports the component 10, and even if the tray 30 is empty, the component 10 can be transferred to the DC test unit without interruption.

On the other hand, when the tray 30 of the loading tray unit 110 transports all the components 10 to the DC test unit 230 and is vacated, the empty tray 30 can be transported by the tray transport unit and loaded to the additionally set empty tray unit 130.

Further, the tray 30 of the loading tray unit 110 can of course be transported to the unloading buffer unit 310, the sorting tray unit 320, and the like described above by the tray transport unit.

Further, a tray loading portion (not shown) additionally provided at a position where the tray 30 is removed from the loading tray portion 110 receives a new tray 30 in which the component 10 is mounted.

The DC defective product tray unit 120 may have various configurations, and the DC defective product tray unit 120 is adjacent to the DC test unit 230, and one or more trays 30 are arranged in the X-axis direction with respect to the loading tray unit 110 to be inspected by the DC test unit 230. The loading element 10 is classified for the inspection result of the defective product.

For example, the DC defective tray portion 120 may have a similar structure and configuration to the sorting tray portion 320 described above.

On the other hand, the loading tray unit 110, the DC defective product tray unit 120, the empty tray unit 130, and the sorting tray unit 320 can specifically arrange the trays 30 in a row in the X-axis direction, so that the tray can be transported by one tray transport unit. 30, and the tray 30 is smoothly transported.

Further, a tray loading unit 140, G, DC1, DC2, BIN1, BIN2, BIN3, BIN4, E corresponding to the loading tray unit 110, the DC defective product tray unit 120, the empty tray unit 130, and the sorting tray unit 320 can be provided. Further, it is possible to execute the tray 30 for loading the tray portion 110, the tray 30 for discharging the filled member 10 from the DC defective tray portion 120, the tray tray 130 for the empty tray portion 130, and/or the tray 30, and the tray tray 320. The tray 30 of the component 10 is filled.

The tray loading unit 140 may have various configurations, and the tray loading unit 140 is located at a lower portion or an upper portion of the apparatus main body, and loads the tray 30 corresponding to the loading tray unit 110, the DC defective product tray unit 120, the empty tray unit 130, and the sorting tray unit 320. The tray 30 for loading the tray portion 110, the tray 30 for discharging the filled component 10 from the DC defective tray portion 120, the tray 30 for the empty tray portion 130, and/or the tray 30 are discharged, and the tray 30 is discharged from the sorting tray portion 320. A tray 30 full of components 10.

On the other hand, the external supply of the component processor of the present invention and the carry-out of the tray 30 can be performed by various methods.

One or more component loading tools 540 are configured to transmit components from the loading tray portion 110 to the DC test portion 230 and from the DC test 230 to the DC defective tray portion 120, and may have various configurations.

For example, the component loading tool 540 may include: one or more pickers 511 having a suction head passing through the vacuum pressure adsorbing element 10 at the end; moving the pickup 511 in the XZ, YZ or XYZ direction (preferably, the XYZ-θ direction) Pickup conveyor.

Here, as shown in FIGS. 4 to 8, it is preferable to provide the component loading tool 540 such that the horizontal rotation error of the component 10 may occur during the insertion of the socket 231 of the pickup component 10 and the DC test portion 230 from the tray 30 ( In the θ direction rotation error), in order to correct the error, each of the pickups 541 can be horizontally rotated (that is, rotated in the θ direction).

In particular, the unloading conveyance tool 540 arranges the pickups 541 in a row, or may be configured in various shapes of 8 × 1, 8 × 2, and the like.

In addition, the component loading tool 540 performs the transfer of the component from the loading tray portion 110 to the DC test portion 230 and the transfer from the DC test portion 230 to the DC reject tray portion 120, or has two component loading tools 540 that can be separately loaded from the load. The tray unit 110 transmits the component to the DC test unit 230 and transmits the component from the DC test unit 230 to the DC defective tray unit 120.

On the other hand, as described above, the unloading transporting tool 510, the component sorting tool 520, the loading and transporting tool 530, and the component loading tool 540 include a plurality of pickers.

In addition, a plurality of pickup ends are detachably coupled to the adsorption head to pick up the components by vacuum pressing.

Moreover, it is preferable that the adsorption head (pad) can be replaced with a new adsorption head when the specifications (size, etc.) of the pickup element 10 are different or damaged due to long-term use.

To this end, at least one of the unloading transporting tool 510, the component sorting tool 520, the loading and transporting tool 530, and the component loading tool 540 is moved by horizontal movement and vertical direction to the adsorption pad replacing portions 810, 820, 830 disposed on the moving path. , 840, to automatically replace the new adsorption head.

The adsorption pad replacement portions 810, 820, 830, and 840 may be of any configuration, and the adsorption pad replacement portions 810, 820, 830, and 840 are disposed in the unloading conveyance tool 510, the component sorting tool 520, the loading and transporting tool 530, and the component loading tool. On the moving path of at least one of 540, the adsorption head can be automatically replaced by horizontal movement and vertical movement to automatically replace the new adsorption head.

For example, the structure and replacement method of the adsorption pad replacement portions 810, 820, 830, and 840 and the adsorption head include the structures shown in FIGS. 9a to 11b of Patent Document 8, the replacement method, and the like, and may have various forms.

Further, when the adsorption head is replaced by the adsorption pad replacement units 810, 820, 830, and 840, one or more image acquisition units 611 and 621 may be provided for confirming the state of the adsorption head coupled to the pickup.

On the other hand, for inserting the component 10 into the refining plate 20 and/or inserting the component 10 into the DC test portion 230, it is necessary to accurately place the component 10 to perform an accurate test.

However, there is a problem that the horizontal position error and the rotation error of the element 10 occur depending on the pickup process of the pickup, the replacement of the adsorption head, and the like.

To this end, it is necessary for the loading and transporting tool 530 and/or the component loading tool 540 to be configured to be more precisely controlled in the insertion member 10 (i.e., the loading process).

Here, the loading and transporting tool 530 and/or the component loading tool 540 may have the structure of the transporting tool disclosed in Patent Documents 1 to 8.

In particular, the loading and transporting tool 530 and/or the component loading tool 540 may have the structure of the transporting tool shown in FIGS. 5a to 7 of Patent Document 7.

Further, it is preferable that the loading and transporting tool 530 and/or the component loading tool 540 rotate the pickup in the θ direction with the longitudinal direction of the pickup as the rotation axis to correct the horizontal rotation error of the component 10 in the state of the pickup component 10 ( θ direction error).

In particular, in the case where the loading and transporting tool 530 and/or the component loading tool 540 has the structure of the transporting tool shown in FIGS. 5a to 7 of Patent Document 7, the camera 80 constituting a part of the transporting tool measures the picking member 10 The horizontal rotation error (theta direction error) of the element 10 in the state, the horizontal rotation error (the θ direction error) is corrected by the rotation of the pickup head or the like of the pickup element 10 or the entire rotation of the transport tool when the component (i.e., the loading component) is inserted. .

Here, in the rotation of the adsorption head or the like, the horizontal rotation error (the θ direction error) can be corrected by rotating the adsorption head or the like of the pickup element 10 by a rotation restricting member or the like provided separately in a state in which the rod constituting the pickup is fixed.

On the other hand, the manner in which the loading and transporting tool 530 and/or the component loading tool 540 picks up and places the components may vary depending on the pitch of the terminals formed on the bottom surface of the component 10 and whether or not the horizontal rotation error (theta direction error) is corrected. .

For example, if it is not necessary to correct the horizontal rotation error (theta direction error), the loading and transporting tool 530 and/or the component loading tool 540 picks up (1Pick) the component 10 at a time in a plurality of pickers, and then can load (1place) at a time. The DC test unit 230 is on the refining plate 20.

In addition, if it is necessary to correct the horizontal rotation error (θ direction error), it is required to correct the rotation error for each component 10, and after the plurality of pickups pick up the (1Pick) component 10 at a time, each component 10 can be loaded separately (n place; n is pickup) The number of picks up of the component 10 is on the DC test section 230 or the refining plate 20.

Here, if it is necessary to individually rotate each of the pickups in order to correct the rotation error, it is of course possible to correct the rotation error by the individual rotation of each pickup and then load it on the DC test unit 230 or the refining plate 20 at one time.

On the other hand, as described above, an error in the horizontal center position of the pickup may occur due to replacement of the adsorption head or the like, and therefore it is necessary to correct the error.

Accordingly, the loading and transporting tool 530 and/or the component loading tool 540 are disposed on the moving path to acquire the bottom surface image of each of the pickups (ie, the bottom surface image of the adsorption head) to calculate the center of the adsorption head, thereby replacing the adsorption The deviation of the center of the adsorption head before replacement is calculated after the head, so that the error of the horizontal center position of the pickup can be corrected by replacing the adsorption head.

To this end, a camera 649 can be provided, which is disposed on the moving path of the loading and transporting tool 530 and/or the component loading tool 540 (for example, in the vicinity of the DC test portion 230), and acquires the loading and transporting tool 530 and/or components on the lower side. An image of the bottom surface of the pickup of the loading tool 540.

On the other hand, depending on the size of the component 10, the execution speed at which the loading tool 530 picks up the component 10, inserts the component 10 into the refining plate 20, and/or picks up the component through the component loading tool 540, and inserts the component 10 into the DC test portion 230 can be determined.

Specifically, the arrangement of the trays 30 of the components 10 in the loading tray portion 110 differs according to the specifications of the components 10, such as 6 columns, 7 columns, 8 columns, 10 columns, 12 columns, etc., and is used for picking up components. The first separation distance x ₁ of the pickup 541 of the component loading tool 540 may also be different.

In addition, the second separation distance x ₂ of the component insertion slot (socket 231) of the DC test portion 230 may vary depending on the design and specifications of the component processor.

In addition, the third spacing distance x ₃ of the component insertion slots (sockets 21) on the refining plate 20 may vary depending on the design and specifications of the component processor.

Accordingly, it is generally the case that the loading and transporting tool 530 of the pickup member 10 and the component loading tool 540 can change the separation distance x constituting the pickup.

However, in the case where the separation distance constituting the pickup is changed to correspond to the specifications of all the elements 10, since the range of the variable distance is large, the positional error between the respective pickups is increased, it is difficult to control, and the size of the conveying tool is changed. Large, complex, and difficult to control.

Accordingly, as a new component picking and placing method, it is preferable that the present invention has a value slightly smaller than the first separation distance x ₁ (hereinafter, the reference pitch) as the minimum pitch value; and will be slightly smaller than the second separation distance x ₂ The large value is taken as the maximum pitch value to change the number of the pickups constituting the component loading tool 540 and the third separation distance x ₃ constituting the pickup, wherein the first separation distance x ₁ is the separation distance of the loading slot 21 of the tray 30, The tray 30 has a column corresponding to the number of pickups, wherein the second separation distance x ₂ is the separation distance of the component insertion grooves 231 of the DC test portion 230.

Further, if the first separation distance x ₁ of the loading slot 21 of the tray 30 is smaller than the reference pitch, the component loading tool 540 may be configured as follows: the component 10 is picked up by one element 10 on the tray 30, and then the pickup of the component 10 is not picked up. The device 10 picks up the component 10 on the tray 30 with a component 10 interposed therebetween.

Here, the component loading tool 540 that ends the component pickup can mount the component 10 in the DC test section 230 with a small variable pitch.

That is, as shown in FIGS. 4, 5a, and 5b, as a new component picking and placing method, the present invention discloses a component picking and placing method from a first loading portion by a transporting tool (component loading tool 540) (for example, The tray 20) the pickup member 10 is placed to the second loading portion, wherein the transport tool is provided with k (k is a natural number of 2 or more) pickups at a separation distance x, and the first loading portion is provided with a m at a first separation distance x ₁ (m is a natural number of 2 or more) element 10, the second loading portion is disposed a second distance x ₂ is inserted into element n (n is a natural number of 2 or more) of the loading slot 10, and a second distance x ₂ The first spacing distance x _{1 is} different, including: a first picking step, when the first spacing distance x _{1 is} less than the second spacing distance x _{2 by} a predetermined size, setting the separation distance x of the conveying tool to the first loading portion a separation distance x ₁ twice, picking up the component 10 from the first loading portion one at a time; in the second pickup step, the pickup of the unpicked component 10 in the first pickup step is set to the first interval of the first loading portion twice the distance x _1, and then every other from the first Pickup element 10 carrying portion; placing step, while the tool is moved toward the second conveying unit loading the third distance x ₃ is set to a second distance x _2, the loading elements 10 are placed in the groove of the second loading portion.

Here, it is preferable that the number of the pickups of the transporting tool is the same as the number of the loading slots of the second loading section.

The first loading portion may be a tray 30 for use in a Burn-In Sorter, and the second loading portion may be a DC test portion 230 disposed in the burn-in test sorter.

On the other hand, the transporting tool as the component loading tool 540 may further be provided with one or more stacking pickers 542 for picking up the components 10 which are inspected as defective by the DC testing section 230.

The build-up pickup 542 has a structure for picking up the component 10 which is inspected as a defective product by the DC test section 230 and is included in the component loading tool 540, and can have various configurations.

In particular, the build-up picker 542 picks up the component 10 that has been inspected as defective by the DC test section 230, and then, during the transport of the component between the tray 30 and the DC test section 230, the component 10 can be loaded to the aforementioned DC failure. The tray 30 of the product tray unit 120.

Here, the number of components 10 inspected as defective by the DC test unit 230 is very small due to the improvement of the semiconductor process, and thus one or two pickers can be used.

On the other hand, the stack pickup 542 not only picks up the component 10 which is inspected as defective by the DC test section 230, but also has the same or similar structure as the pickup which constitutes the component loading tool 540.

The foregoing is only a part of a preferred embodiment that can be implemented by the present invention. It is to be understood that the scope of the present invention is not limited by the above embodiments, and the technical idea of the present invention and its essential technical idea described above should be included in the present invention. Within the scope of the invention.

Claims (8)

 A component processor includes: a first refining table (210), receiving a refining plate (20) provided with a plurality of component sockets (21) from a plate loader (800), and in a Y-axis direction Moving the refining plate (20), and then deriving an element (10) inserted into the component socket (21), wherein the component socket (21) is inserted with the component (10); an unloading buffer portion (310) is disposed at the One side of the first refining table (210), and a component unloading position (UL1) and a component sorting position (UL2) are set in the Y-axis direction, the component unloading position (UL1) and the component sorting position are (UL2) arranging a plurality of trays (30) in turn, wherein the component unloading position (UL1) receives the component (10) from the slab (20) located at the first slab (210), the component sorting position (UL2) loading the component (10) according to a predetermined classification criterion; an unloading transport tool (510), and deriving the component (10) from the refining plate (20) located at the first refining plate (210), The component (10) is transported to the tray (30) at the component unloading position (UL1); a sorting tray portion (320) adjacent to the component sorting position (UL2) of the unloading buffer portion (310) ,root The preset classification level places a plurality of the trays (30) in an X-axis direction; a component sorting tool (520) reconfigures the components (10) in the component sorting according to a preset classification level a tray (30) at a position (UL2) and the tray (30) located in the sorting tray portion (320); a second refining table (220) from the first refining table in the X-axis direction ( 210) receiving the refining plate (20) from which the component is derived, and moving the refining plate (20) in the Y-axis direction to insert the new component (10) into the component socket of the refining plate (20) ( 21); a DC test portion (230) disposed adjacent to the second refining table (220), and configured in the X-axis direction a DC test socket (231) for DC testing; a loading and transporting tool (530) The component (10) inspected as a good product is derived from the DC test unit (230), and the component (10) is inserted into the component socket (21) of the second platen station (220); a loading tray a portion (110) disposed adjacent to the DC test portion (230) and provided with one or more trays (30) for supplying the DC test portion (230) to the DC test portion (230); a DC reject tray Department (120), adjacent In the DC test unit (230), one or more trays (30) are arranged in the X-axis direction with respect to the loading tray unit (110), and inspection results of the defective products are checked based on the DC test unit (230). Loading the component (10); and more than one component loading tool (540) for transferring components from the loading tray portion (110) to the DC testing portion (230), and from the DC testing portion (230) The DC defective product tray portion (120) transports the components.    The component processor of claim 1, wherein a first plate transport line (BL1) is set in the X-axis direction to the first platen from the plate loader (800) (210) conveying the slab (20); setting a second slab transfer line (BL2) in the X-axis direction to transfer the second slab (210) to the slab loader (800) The plate (20); the second plate transport line (BL2) is located on a lower side than the first plate transport line (BL1) to prevent interference of the first plate transport line (BL1).    The component processor of claim 1, wherein the unloading buffer (310) comprises: a pair of trays (30) in turn at the component unloading position (UL1) and the component sorting position (UL2) And a tray transport portion (311) that moves the tray (30) such that the pair of trays (30) are alternately located at the component unloading position (UL1) and the component sorting position (UL2).    The component processor of claim 1, wherein the unloading transport tool (510) incorporates an image acquisition unit (519) that takes a picture after deriving the component (10) An image of the component socket (21) to confirm the position of the connection terminals of the component sockets (21) on the composite board (20).    The component processor according to claim 1, wherein the loading and transporting tool (530) incorporates an image acquiring unit (539), and the image acquiring unit (539) photographs after the component (10) is derived. An image of the component socket (21) to confirm the position of the connection terminals of the component sockets (21) on the composite board (20).   A component picking and placing method for picking up an element (10) from a first loading portion by a transporting tool and placing it on a second loading portion, wherein the transporting tool is provided with k pickers at a spacing distance (x), the first a loading unit is provided with m elements (10) at a first spacing distance (x ₁ ), and the second loading unit is configured to insert n loading slots of the element (10) at a second spacing distance (x ₂ ). The two spacing distance (x ₂ ) is different from the first spacing distance (x ₁ ), wherein the method comprises: a first picking step, when the first spacing distance (x ₁ ) is less than the second spacing distance (x ₂ a predetermined size, the separation distance (x) of the transport tool is set to be twice the first separation distance (x ₁ ) in the first loading portion, and the first loading portion picks up the interval Element (10); a second picking step of setting the picker that does not pick up the component (10) in the first picking step to twice the first separation distance (x ₁ ) of the first loading portion, Further picking up the component (10) from the first loading portion at intervals of one; and in the placing step, moving the transport tool to the second loading portion At the same time, a third separation distance (x ₃ ) is set to the second separation distance (x ₂ ), and the element (10) is placed in the loading slot of the second loading portion, respectively.  The component picking and placing method of claim 6, wherein the number of pickers of the transporting tool is the same as the number of loading slots of the second loading section.    The component picking and placing method according to claim 6, wherein the first loading portion is a tray (30) used in a burning machine sorter; the second loading portion is disposed in the burning machine A DC test portion (230) of the picker; the transport tool is further provided with more than one stacking picker for picking up the component (10) which is inspected as defective by the DC test portion (230).