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TW201715093A - Method for manufacturing metal-filled microstructure - Google Patents

Method for manufacturing metal-filled microstructure Download PDF

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Publication number
TW201715093A
TW201715093A TW105130950A TW105130950A TW201715093A TW 201715093 A TW201715093 A TW 201715093A TW 105130950 A TW105130950 A TW 105130950A TW 105130950 A TW105130950 A TW 105130950A TW 201715093 A TW201715093 A TW 201715093A
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metal
filled
substrate
filled microstructure
producing
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堀田吉則
山下広祐
黒岡俊次
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富士軟片股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02Anodisation
    • C25D11/04Anodisation of aluminium or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02Anodisation
    • C25D11/04Anodisation of aluminium or alloys based thereon
    • C25D11/18After-treatment, e.g. pore-sealing
    • C25D11/20Electrolytic after-treatment

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
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  • Chemical Kinetics & Catalysis (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • ing And Chemical Polishing (AREA)

Abstract

The present invention addresses the problem of providing a method for manufacturing a metal-filled microstructure device with which the filling of metal into micropores is easy and in-plane uniformity is also good. This method for manufacturing a metal-filled microstructure device comprises: an anodic oxidation step for performing anodic oxidation on one surface of an aluminum substrate to form, on the one surface of the aluminum substrate, an anodic oxide film with micropores that are present in the thickness direction and barrier layers that are present in the bottoms of said micropores; a barrier layer-removing step after the anodic oxidation step for removing the barrier layers of said anodic oxide film using an aqueous alkaline solution comprising a metal M1 with a higher hydrogen overvoltage than aluminum; a metal-filling step after said barrier layer-removing step for performing electroplating to fill a metal M2 inside said micropores; and a substrate-removing step after said metal-filling step for removing the aluminum substrate to obtain the metal-filled microstructure device.

Description

金屬填充微細結構體的製造方法Method for manufacturing metal-filled microstructure

本發明是有關於一種金屬填充微細結構體的製造方法。The present invention relates to a method of producing a metal-filled microstructure.

在設於絕緣性基材中的微細孔中填充金屬而成的金屬填充微細結構體(器件)為近年來於奈米技術(nanotechnology)中亦受到關注的領域之一,例如期待其作為異向導電構件的用途。 異向導電性構件是插入至半導體元件等電子零件與電路基板之間,僅藉由加壓而獲得電子零件與電路基板間的電性連接,故被廣泛地用作半導體元件等電子零件等的電性連接構件或進行功能檢查時的檢查用連接器(connector)等。A metal-filled fine structure (device) in which a metal is filled in a fine hole provided in an insulating substrate is one of the fields that has recently attracted attention in nanotechnology, and for example, it is expected to be an anisotropic field. The use of conductive members. The isotropic conductive member is inserted between an electronic component such as a semiconductor element and a circuit board, and is electrically connected only to the circuit board by pressurization. Therefore, it is widely used as an electronic component such as a semiconductor element. An electrical connection member or a connector for inspection when performing a function check.

作為此種異向導電性構件,於專利文獻1中記載有「一種金屬填充微細結構體的製造方法,包括以下步驟:陽極氧化處理步驟,對鋁基板的單側的表面實施陽極氧化處理,於所述鋁基板的單側的表面上形成陽極氧化膜,該陽極氧化膜具有存在於厚度方向上的微孔(micropore)及存在於所述微孔的底部的阻障層;阻障層去除步驟,於所述陽極氧化處理步驟之後,將所述陽極氧化膜的所述阻障層去除;金屬填充步驟,於所述阻障層去除步驟之後,實施電解鍍敷處理而於所述微孔的內部填充金屬;以及基板去除步驟,於所述金屬填充步驟之後,將所述鋁基板去除,獲得金屬填充微細結構體。」(〔請求項1〕)。 [現有技術文獻] [專利文獻]Patent Document 1 discloses a method for producing a metal-filled microstructure, which includes the following steps: an anodizing treatment step of performing anodization on a surface of one side of an aluminum substrate. An anodic oxide film having a micropore present in a thickness direction and a barrier layer present at a bottom of the micropore; and a barrier layer removing step are formed on a surface of one side of the aluminum substrate After the anodizing treatment step, the barrier layer of the anodized film is removed; a metal filling step, after the barrier layer removing step, performing an electrolytic plating treatment on the microporous layer An internal filling metal; and a substrate removing step of removing the aluminum substrate after the metal filling step to obtain a metal-filled microstructure." (Request 1). [Prior Art Document] [Patent Literature]

[專利文獻1]國際公開第2015/029881號[Patent Document 1] International Publication No. 2015/029881

[發明所欲解決之課題] 本發明者等人對專利文獻1中記載的金屬填充微細結構體的製造方法進行了研究,結果得知存在以下問題:於阻障層去除步驟後的金屬填充步驟中,視電解鍍敷處理的條件不同而有時向微孔內部的金屬填充變得不充分,殘存未經金屬填充的微孔的問題,即,金屬填充的面內均勻性差的問題。[Problems to be Solved by the Invention] The inventors of the present invention have studied the method for producing a metal-filled microstructure according to Patent Document 1. As a result, it has been found that there is a problem that the metal filling step after the barrier layer removing step In the case where the conditions of the electrolytic plating treatment are different, the filling of the metal into the micropores may be insufficient, and the problem of the micropores not filled with the metal may remain, that is, the in-plane uniformity of the metal filling is poor.

因此,本發明的課題在於提供一種向微孔內的金屬填充變容易、面內均勻性亦變良好的金屬填充微細結構體的製造方法。 [用以解決課題之手段]Therefore, an object of the present invention is to provide a method for producing a metal-filled microstructure which is easy to fill a metal in a micropore and which has improved in-plane uniformity. [Means to solve the problem]

本發明者等人為了達成所述課題而進行了潛心研究,結果發現,藉由使用含有氫過電壓高於鋁的金屬的鹼水溶液將藉由陽極氧化處理所形成的陽極氧化膜中的阻障層去除,其後的金屬填充步驟中的向微孔內的金屬填充變容易,面內均勻性亦變良好,從而完成了本發明。 即,本發明提供以下構成的金屬填充微細結構體的製造方法。The inventors of the present invention conducted intensive studies to achieve the above problems, and as a result, found that a barrier in an anodized film formed by anodizing treatment by using an aqueous alkali solution containing a metal having a hydrogen overvoltage higher than aluminum The layer is removed, and the metal filling into the micropores in the subsequent metal filling step becomes easy, and the in-plane uniformity also becomes good, thereby completing the present invention. That is, the present invention provides a method for producing a metal-filled microstructure having the following structure.

[1] 一種金屬填充微細結構體的製造方法,包括以下步驟: 陽極氧化處理步驟,對鋁基板的單側的表面實施陽極氧化處理,於所述鋁基板的單側的表面上形成陽極氧化膜,其中所述陽極氧化膜具有存在於厚度方向上的微孔及存在於所述微孔的底部的阻障層; 阻障層去除步驟,於所述陽極氧化處理步驟之後,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液將所述陽極氧化膜的所述阻障層去除; 金屬填充步驟,於所述阻障層去除步驟之後,實施電解鍍敷處理而於所述微孔的內部填充金屬M2;以及 基板去除步驟,於所述金屬填充步驟之後,將所述鋁基板去除而獲得金屬填充微細結構體。 [2] 如[1]所記載的金屬填充微細結構體的製造方法,其中所述阻障層去除步驟中所用的所述金屬M1為離子化傾向高於所述金屬填充步驟中所用的所述金屬M2的金屬。 [3] 如[1]或[2]所記載的金屬填充微細結構體的製造方法,其中於所述金屬填充步驟之後且於所述基板去除步驟之前, 包括表面金屬突出步驟,將所述陽極氧化膜的未設置所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出。 [4] 如[1]至[3]中任一項所記載的金屬填充微細結構體的製造方法,其中於所述基板去除步驟之後, 包括背面金屬突出步驟,將所述陽極氧化膜的設有所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出。 [5] 如[3]或[4]所記載的金屬填充微細結構體的製造方法,其中所述表面金屬突出步驟及所述背面金屬突出步驟的至少一個步驟為使所述金屬M2較所述陽極氧化膜的表面突出10 nm~1000 nm的步驟。 [6] 如[1]至[5]中任一項所記載的金屬填充微細結構體的製造方法,其中於所述金屬填充步驟之後且於所述基板去除步驟之前, 包括樹脂層形成步驟,於所述陽極氧化膜的未設置所述鋁基板之側的表面上設置樹脂層。 [7] 如[6]所記載的金屬填充微細結構體的製造方法,其中所述樹脂層為可剝離的附黏著層的膜。 [8] 如[6]或[7]所記載的金屬填充微細結構體的製造方法,其中所述樹脂層為藉由加熱處理或紫外線曝光處理而黏著性變弱、變得可剝離的附黏著層的膜。 [9] 如[6]至[8]中任一項所記載的金屬填充微細結構體的製造方法,其中藉由陽極氧化處理步驟所形成的陽極氧化膜的平均厚度成為30 μm以下。 [10] 如[6]至[9]中任一項所記載的金屬填充微細結構體的製造方法,其中於所述基板去除步驟之後,包括捲取步驟,將金屬填充微細結構體以具有所述樹脂層的狀態捲取成捲筒狀。 [發明的效果][1] A method for producing a metal-filled microstructure, comprising the steps of: an anodizing treatment step of anodizing a surface of one side of an aluminum substrate to form an anodized film on a surface of one side of the aluminum substrate; Wherein the anodized film has micropores present in a thickness direction and a barrier layer present at a bottom of the micropores; a barrier layer removing step, after the anodizing treatment step, using a hydrogen overvoltage An alkali aqueous solution of the metal M1 higher than aluminum removes the barrier layer of the anodized film; a metal filling step, after the barrier layer removing step, performing an electrolytic plating treatment on the inside of the microporous layer Filling the metal M2; and a substrate removing step, after the metal filling step, removing the aluminum substrate to obtain a metal-filled microstructure. [2] The method for producing a metal-filled microstructure according to [1], wherein the metal M1 used in the barrier layer removing step has a higher ionization tendency than that used in the metal filling step Metal of metal M2. [3] The method for producing a metal-filled microstructure according to [1] or [2], wherein after the metal filling step and before the substrate removing step, a surface metal protruding step is included, the anode is The surface of the oxide film on the side where the aluminum substrate is not provided is partially removed in the thickness direction, so that the metal M2 filled in the metal filling step is more prominent than the surface of the anodized film. [4] The method for producing a metal-filled microstructure according to any one of [1] to [3] wherein, after the substrate removing step, a back metal protruding step is included, and the anodized film is provided The surface on the side of the aluminum substrate is partially removed in the thickness direction, so that the metal M2 filled in the metal filling step is more prominent than the surface of the anodized film. [5] The method for producing a metal-filled microstructure according to [3] or [4], wherein at least one step of the surface metal protruding step and the back metal protruding step is to make the metal M2 The surface of the anodized film protrudes from 10 nm to 1000 nm. [6] The method for producing a metal-filled microstructure according to any one of [1] to [5] wherein after the metal filling step and before the substrate removing step, a resin layer forming step is included A resin layer is provided on a surface of the anodized film on the side where the aluminum substrate is not provided. [7] The method for producing a metal-filled microstructure according to [6], wherein the resin layer is a peelable adhesive layer-attached film. [8] The method for producing a metal-filled microstructure according to [6], wherein the resin layer is adhesively weakened by heat treatment or ultraviolet exposure treatment, and is detachable. The film of the layer. [9] The method for producing a metal-filled microstructure according to any one of [6] to [8] wherein the anodized film formed by the anodizing treatment step has an average thickness of 30 μm or less. [10] The method for producing a metal-filled microstructure according to any one of [6] to [9] wherein after the substrate removing step, the winding step is included, and the metal is filled with the fine structure to have a The state of the resin layer is taken up in a roll shape. [Effects of the Invention]

根據本發明,可提供一種向微孔中的金屬填充變容易、面內均勻性亦變良好的金屬填充微細結構體的製造方法。According to the present invention, it is possible to provide a method for producing a metal-filled fine structure which is easy to fill metal in the micropores and which has improved in-plane uniformity.

[金屬填充微細結構體的製造方法] 本發明的金屬填充微細結構體的製造方法(以下亦簡稱為「本發明的製造方法」)為包括以下步驟的金屬填充微細結構體的製造方法:陽極氧化處理步驟,對鋁基板的單側的表面(以下亦稱為「單面」)實施陽極氧化處理,於所述鋁基板的單側的表面上形成陽極氧化膜,該陽極氧化膜具有存在於厚度方向上的微孔及存在於所述微孔的底部的阻障層;阻障層去除步驟,於所述陽極氧化處理步驟之後,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液將所述陽極氧化膜的所述阻障層去除;金屬填充步驟,於所述阻障層去除步驟之後,實施電解鍍敷處理而於所述微孔的內部填充金屬M2;以及基板去除步驟,於所述金屬填充步驟之後,將所述鋁基板去除而獲得金屬填充微細結構體。[Manufacturing Method of Metal-filled Fine Structure] The method for producing a metal-filled microstructure according to the present invention (hereinafter also simply referred to as "the method for producing the present invention") is a method for producing a metal-filled microstructure including the following steps: anodizing In the treatment step, an anodizing treatment is performed on a surface of one side of the aluminum substrate (hereinafter also referred to as "single side"), and an anodized film is formed on a surface of one side of the aluminum substrate, and the anodized film is present in the thickness a microporous in a direction and a barrier layer present at a bottom of the micropore; a barrier layer removing step, after the anodizing treatment step, using an aqueous alkali solution containing a metal M1 having a hydrogen overvoltage higher than aluminum The barrier layer removal process of the anodized film; the metal filling step, after the barrier layer removing step, performing an electrolytic plating process to fill the inside of the micropore with the metal M2; and a substrate removing step, After the metal filling step, the aluminum substrate is removed to obtain a metal-filled microstructure.

本發明中,如上文所述,使用含有氫過電壓高於鋁的金屬的鹼水溶液將藉由陽極氧化處理所形成的陽極氧化膜中的阻障層去除,藉此其後的金屬填充步驟中的向微孔內的金屬填充變容易,面內均勻性亦變良好。 其詳細情況雖不明確,但大致推測如下。 首先,對專利文獻1(國際公開第2015/029881號)中記載的製造方法研究了面內均勻性差的原因,結果若於電解鍍敷處理時使用酸性的鍍敷液(例如硫酸銅水溶液等),則於阻障層被去除的微孔的底部、即所露出的鋁基板的表面上觀察到氫氣的產生,因此本發明者等人發現其原因在於:因暫且產生的氫氣的存在,其後的鍍敷液難以滲入至微孔的內部。 相對於此,於本發明的製造方法中,可認為於金屬填充步驟之前,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液將阻障層去除,藉此不僅將阻障層去除,而且於微孔的底部所露出的鋁基板上形成相較於鋁而更不易產生氫氣的金屬M1的金屬層,結果,由鍍敷液所致的氫氣的產生得到抑制,容易進行利用電解鍍敷處理的金屬填充。In the present invention, as described above, the barrier layer in the anodized film formed by the anodizing treatment is removed using an aqueous alkali solution containing a metal having a hydrogen overvoltage higher than aluminum, whereby the metal filling step thereafter The filling of the metal into the micropores becomes easy, and the in-plane uniformity also becomes good. Although the details are not clear, they are roughly estimated as follows. First, the reason why the in-plane uniformity is poor is studied in the production method described in Patent Document 1 (International Publication No. 2015/029881). As a result, an acidic plating solution (for example, a copper sulfate aqueous solution or the like) is used in the electrolytic plating treatment. Then, the generation of hydrogen gas is observed at the bottom of the micropores from which the barrier layer is removed, that is, the surface of the exposed aluminum substrate, and the inventors have found that the reason is that the hydrogen gas is temporarily generated, and thereafter The plating solution is difficult to penetrate into the inside of the micropores. On the other hand, in the manufacturing method of the present invention, it is considered that the barrier layer is removed using an aqueous alkali solution containing the metal M1 having a hydrogen overvoltage higher than aluminum before the metal filling step, thereby not only removing the barrier layer but also removing the barrier layer. A metal layer of the metal M1 which is less likely to generate hydrogen gas than aluminum is formed on the aluminum substrate exposed at the bottom of the micropores, and as a result, generation of hydrogen gas by the plating solution is suppressed, and electrolytic plating is easily performed. Metal filling.

繼而,使用圖1A~圖1E、圖2A~圖2G、圖3A~圖3F對本發明的製造方法中的各步驟的概要加以說明後,對本發明的製造方法中所用的鋁基板及對鋁基板實施的各處理步驟加以詳述。Then, the outline of each step in the production method of the present invention will be described with reference to FIGS. 1A to 1E, FIGS. 2A to 2G, and FIGS. 3A to 3F, and then the aluminum substrate and the aluminum substrate used in the production method of the present invention are applied. Each processing step is described in detail.

<第1態樣> 如圖1A~圖1E所示,金屬填充微細結構體10可藉由包括以下步驟的製造方法而製作:陽極氧化處理步驟,對鋁基板1的單面實施陽極氧化處理,於鋁基板1的單面上形成陽極氧化膜4,該陽極氧化膜4具有存在於厚度方向上的微孔2及存在於微孔2的底部的阻障層3(參照圖1A及圖1B);阻障層去除步驟,於陽極氧化處理步驟之後,將陽極氧化膜4的阻障層3去除(參照圖1B及圖1C);金屬填充步驟,於阻障層去除步驟之後,於微孔2的內部填充金屬5b(金屬M2)(參照圖1C及圖1D);以及基板去除步驟,於金屬填充步驟之後,將鋁基板1去除(參照圖1D及圖1E)。 此處,本發明的製造方法如上文所述,其特徵在於:於所述阻障層去除步驟中,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液,藉此於將陽極氧化膜4的阻障層3去除的同時,於微孔2的底部形成包含金屬5a(金屬M1)的金屬層(參照圖1C、圖2C、圖3C)。<First Aspect> As shown in FIGS. 1A to 1E , the metal-filled microstructure 10 can be produced by a production method including the following steps: an anodizing treatment step of performing anodization on one side of the aluminum substrate 1 An anodized film 4 having micropores 2 present in the thickness direction and a barrier layer 3 present at the bottom of the micropores 2 is formed on one surface of the aluminum substrate 1 (see FIGS. 1A and 1B). The barrier layer removing step, after the anodizing treatment step, removing the barrier layer 3 of the anodized film 4 (refer to FIG. 1B and FIG. 1C); the metal filling step, after the barrier layer removing step, in the micropore 2 The inner filler metal 5b (metal M2) (see FIGS. 1C and 1D); and the substrate removal step, after the metal filling step, the aluminum substrate 1 is removed (see FIGS. 1D and 1E). Here, the manufacturing method of the present invention is as described above, characterized in that in the barrier layer removing step, an aqueous alkali solution containing a metal M1 having a hydrogen overvoltage higher than aluminum is used, whereby the anodized film 4 is used. While the barrier layer 3 is removed, a metal layer containing the metal 5a (metal M1) is formed on the bottom of the micropores 2 (see FIGS. 1C, 2C, and 3C).

<第2態樣> 本發明的製造方法較佳為包括後述表面金屬突出步驟及背面金屬突出步驟的至少一個步驟。 例如,如圖2A~圖2G(以下亦將該些圖簡略地統稱為「圖2」)所示,金屬填充微細結構體10可藉由包括以下步驟的製造方法而製作:陽極氧化處理步驟,對鋁基板1的單面實施陽極氧化處理,於鋁基板1的單面上形成陽極氧化膜4,該陽極氧化膜4具有存在於厚度方向上的微孔2及存在於微孔2的底部的阻障層3(參照圖2A及圖2B);阻障層去除步驟,於陽極氧化處理步驟之後,將陽極氧化膜4的阻障層3去除(參照圖2B及圖2C);金屬填充步驟,於阻障層去除步驟之後,於微孔2的內部填充金屬5b(金屬M2)(參照圖2C及圖2D);表面金屬突出步驟,於金屬填充步驟之後,將陽極氧化膜4的未設置鋁基板1之側的表面於厚度方向上局部去除,使金屬填充步驟中填充的金屬5較陽極氧化膜4的表面而更為突出(參照圖2D及圖2E);基板去除步驟,於表面金屬突出步驟之後,將鋁基板1去除(參照圖2E及圖2F);以及背面金屬突出步驟,於基板去除步驟之後,將陽極氧化膜4的設有鋁基板1之側的表面於厚度方向上局部去除,使金屬填充步驟中填充的金屬5較陽極氧化膜4的表面而更為突出(參照圖2F及圖2G)。 此處,本發明的製造方法可為如圖2的第2態樣所示般均包括表面金屬突出步驟及背面金屬突出步驟(以下將該些步驟統稱為「金屬突出步驟」)的態樣,亦可為僅包括表面金屬突出步驟及背面金屬突出步驟的任一者的態樣。<Second Aspect> The production method of the present invention preferably includes at least one step of a surface metal protruding step and a back metal protruding step which will be described later. For example, as shown in FIGS. 2A to 2G (hereinafter, collectively referred to as "FIG. 2"), the metal-filled microstructure 10 can be produced by a manufacturing method including the following steps: an anodizing treatment step, Anodization treatment is performed on one surface of the aluminum substrate 1, and an anodized film 4 having micropores 2 present in the thickness direction and present at the bottom of the micropores 2 is formed on one surface of the aluminum substrate 1. a barrier layer 3 (refer to FIGS. 2A and 2B); a barrier layer removing step, after the anodizing treatment step, removing the barrier layer 3 of the anodized film 4 (refer to FIGS. 2B and 2C); a metal filling step, After the barrier layer removing step, the inside of the micropores 2 is filled with a metal 5b (metal M2) (refer to FIG. 2C and FIG. 2D); a surface metal protruding step, after the metal filling step, the anodized film 4 is not provided with aluminum. The surface on the side of the substrate 1 is partially removed in the thickness direction, so that the metal 5 filled in the metal filling step is more prominent than the surface of the anodized film 4 (refer to FIGS. 2D and 2E); the substrate removal step is performed on the surface metal After the step, will The substrate 1 is removed (refer to FIGS. 2E and 2F); and the back metal protruding step, after the substrate removing step, the surface of the anodized film 4 on the side where the aluminum substrate 1 is provided is partially removed in the thickness direction, so that the metal filling step The metal 5 filled in is more prominent than the surface of the anodized film 4 (see FIGS. 2F and 2G). Here, the manufacturing method of the present invention may include a surface metal protruding step and a back metal protruding step (hereinafter collectively referred to as "metal protruding step") as shown in the second aspect of FIG. It may also be an aspect including only one of the surface metal protruding step and the back metal protruding step.

<第3態樣> 本發明的製造方法較佳為包括後述的樹脂層形成步驟。 例如,如圖3A~圖3F(以下亦將該些圖簡略地統稱為「圖3」)所示,金屬填充微細結構體10、金屬填充微細結構體10可藉由包括以下步驟的製造方法而製作:陽極氧化處理步驟,對鋁基板1的單面實施陽極氧化處理,於鋁基板1的單面上形成陽極氧化膜4,該陽極氧化膜4具有存在於厚度方向上的微孔2及存在於微孔2的底部的阻障層3(參照圖3A及圖3B);阻障層去除步驟,於陽極氧化處理步驟之後,將陽極氧化膜4的阻障層3去除(參照圖3B及圖3C);金屬填充步驟,於阻障層去除步驟之後,於微孔2的內部填充金屬5b(金屬M2)(參照圖3C及圖3D);樹脂層形成步驟,於金屬填充步驟之後,於陽極氧化膜4的未設置鋁基板1之側的表面上設置樹脂層(參照圖3D及圖3E);以及基板去除步驟,於樹脂層形成步驟之後,將鋁基板1去除(參照圖3E及圖3F)。 此處,圖3所示的第3態樣為意圖將所製作的金屬填充微細結構體20捲取成捲筒狀而供給的態樣(參照圖4),藉由在使用時將樹脂層7剝離,例如可用作異向導電性構件。<Third Aspect> The production method of the present invention preferably includes a resin layer forming step which will be described later. For example, as shown in FIGS. 3A to 3F (hereinafter, collectively referred to as "FIG. 3"), the metal-filled microstructures 10 and the metal-filled microstructures 10 can be manufactured by a manufacturing method including the following steps. Production: an anodizing treatment step of performing anodizing treatment on one side of the aluminum substrate 1 to form an anodized film 4 having a micropore 2 present in the thickness direction and present on one surface of the aluminum substrate 1 The barrier layer 3 at the bottom of the micropores 2 (refer to FIGS. 3A and 3B); the barrier layer removing step, after the anodizing treatment step, the barrier layer 3 of the anodized film 4 is removed (refer to FIG. 3B and FIG. 3C); metal filling step, after the barrier layer removing step, filling the inside of the micropores 2 with metal 5b (metal M2) (refer to FIGS. 3C and 3D); resin layer forming step, after the metal filling step, at the anode A resin layer is provided on the surface of the oxide film 4 on the side where the aluminum substrate 1 is not provided (see FIGS. 3D and 3E); and a substrate removal step is performed after the resin layer forming step (see FIGS. 3E and 3F). ). Here, the third aspect shown in FIG. 3 is an aspect in which the produced metal-filled microstructure 20 is wound up in a roll shape (see FIG. 4), and the resin layer 7 is used at the time of use. Peeling can be used, for example, as an anisotropic conductive member.

<其他態樣> 本發明的製造方法亦可為均滿足圖2所示的第2態樣及圖3所示的第3態樣的態樣,即,依序包括上文所述的陽極氧化處理步驟、阻障層去除步驟、金屬填充步驟、表面金屬突出步驟、樹脂層形成步驟、基板去除步驟及背面金屬突出步驟的態樣。 另外,本發明的製造方法亦可為專利文獻1(國際公開第2015/029881號)的圖2所示的態樣,即,使用所需形狀的遮罩層對鋁基板的表面的一部分實施陽極氧化處理的態樣。<Other Aspects> The manufacturing method of the present invention may be an aspect in which both the second aspect shown in FIG. 2 and the third aspect shown in FIG. 3 are satisfied, that is, the anodizing described above is sequentially included. The processing step, the barrier layer removing step, the metal filling step, the surface metal protruding step, the resin layer forming step, the substrate removing step, and the back metal protruding step are the same. In addition, the manufacturing method of the present invention may be an aspect shown in FIG. 2 of Patent Document 1 (International Publication No. 2015/029881), that is, an anode is applied to a part of the surface of the aluminum substrate using a mask layer of a desired shape. The state of oxidation treatment.

[鋁基板] 本發明的製造方法中所用的鋁基板並無特別限定,其具體例可列舉:純鋁板;以鋁作為主成分且含有微量的異元素的合金板;於低純度的鋁(例如回收再利用(recycle)材料)上蒸鍍高純度鋁而成的基板;藉由蒸鍍、濺鍍等方法於矽晶圓(silicon wafer)、石英、玻璃等的表面上被覆高純度鋁而成的基板;層壓(laminate)有鋁的樹脂基板等。[Aluminum Substrate] The aluminum substrate used in the production method of the present invention is not particularly limited, and specific examples thereof include a pure aluminum plate; an alloy plate containing aluminum as a main component and containing a trace amount of an impurity element; and low-purity aluminum (for example) A substrate obtained by vapor-depositing high-purity aluminum on a recycled material, and coated with high-purity aluminum on the surface of a silicon wafer, quartz, glass, or the like by vapor deposition or sputtering. a substrate; a resin substrate having an aluminum laminated or the like.

於本發明中,鋁基板中,藉由後述陽極氧化處理步驟來設置陽極氧化膜的表面較佳為鋁純度為99.5質量%以上,更佳為99.9質量%以上,進而佳為99.99質量%以上。若鋁純度為所述範圍,則微孔排列的規則性變充分。In the present invention, in the aluminum substrate, the surface of the anodized film is preferably provided with an aluminum purity of 99.5% by mass or more, more preferably 99.9% by mass or more, and still more preferably 99.99% by mass or more. When the aluminum purity is in the above range, the regularity of the arrangement of the micropores becomes sufficient.

另外,於本發明中,鋁基板中實施後述陽極氧化處理步驟的單側的表面較佳為預先實施熱處理、脫脂處理及鏡面整飾處理。 此處,關於熱處理、脫脂處理及鏡面整飾處理,可實施與日本專利特開2008-270158號公報的[0044]~[0054]段落中記載的各處理相同的處理。Further, in the present invention, it is preferred that the surface of the aluminum substrate to be subjected to the anodizing treatment step described later is subjected to heat treatment, degreasing treatment, and mirror finishing treatment in advance. Here, the heat treatment, the degreasing treatment, and the mirror finishing treatment can be carried out in the same manner as the respective treatments described in paragraphs [0044] to [0054] of JP-A-2008-270158.

[陽極氧化處理步驟] 所述陽極氧化步驟為藉由對所述鋁基板的單面實施陽極氧化處理而於所述鋁基板的單面上形成陽極氧化膜的步驟,所述陽極氧化膜具有存在於厚度方向的微孔及存在於微孔的底部的阻障層。 本發明的製造方法中的陽極氧化處理可使用以前公知的方法,就提高微孔排列的規則性、確保金屬填充微細結構體的異向導電性的觀點而言,較佳為使用自規則化法或恆定電壓處理。 此處,關於陽極氧化處理的自規則化法或恆定電壓處理,可實施與日本專利特開2008-270158號公報的[0056]~[0108]段落及[圖3]中記載的各處理相同的處理。[Anodic oxidation treatment step] The anodization step is a step of forming an anodized film on one surface of the aluminum substrate by performing anodization treatment on one side of the aluminum substrate, the anodized film having a presence a micropore in the thickness direction and a barrier layer present at the bottom of the micropore. The anodizing treatment in the production method of the present invention can be carried out by a conventionally known method, and from the viewpoint of improving the regularity of the arrangement of the micropores and ensuring the anisotropic conductivity of the metal-filled fine structure, it is preferred to use the self-regularization method. Or constant voltage processing. Here, the self-regularization method or the constant voltage treatment of the anodizing treatment can be carried out in the same manner as the respective processes described in the paragraphs [0056] to [0108] and [FIG. 3] of JP-A-2008-270158. deal with.

於本發明中,關於所述陽極氧化處理步驟,就將利用本發明的製造方法(特別是上文所述的第3態樣)所製作的金屬填充微細結構體以如圖4所示般捲取至既定直徑及既定寬度的卷芯21上的形狀供給的觀點而言,較佳為藉由陽極氧化處理所形成的陽極氧化膜的平均厚度為30 μm以下,更佳為5 μm~20 μm。其中,關於平均厚度,對陽極氧化膜使用聚焦離子束(Focused Ion Beam,FIB)於厚度方向上進行切削加工,藉由場發射式掃描電子顯微鏡(Field Emission Scanning Electron Microscope,FE-SEM)對其剖面拍攝表面照片(倍率50000倍),以10點測定的平均值的形式而算出平均厚度。In the present invention, with respect to the anodizing treatment step, the metal-filled microstructures produced by the production method of the present invention (especially the third aspect described above) are rolled as shown in FIG. From the viewpoint of the shape supply on the winding core 21 having a predetermined diameter and a predetermined width, it is preferable that the anodized film formed by the anodizing treatment has an average thickness of 30 μm or less, more preferably 5 μm to 20 μm. . Among them, regarding the average thickness, the anodic oxide film is cut in the thickness direction using a Focused Ion Beam (FIB), and is subjected to Field Emission Scanning Electron Microscope (FE-SEM). The photograph of the surface of the cross-section was taken (magnification: 50,000 times), and the average thickness was calculated as the average value measured at 10 points.

[阻障層去除步驟] 所述阻障層去除步驟為於所述陽極氧化處理步驟之後,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液將所述陽極氧化膜的阻障層去除的步驟。 於本發明的製造方法中,藉由所述阻障層去除步驟將阻障層去除,且亦如圖1C所示般,於微孔2的底部形成包含金屬M1的金屬層5a。 此處所謂氫過電壓(hydrogen overvoltage),是指產生氫所必需的電壓,例如鋁(Al)的氫過電壓為-1.66 V(日本化學學會雜誌,1982,(8),p1305-1313)。再者,以下示出高於鋁的氫過電壓的金屬M1的例子及其氫過電壓的值。 <金屬M1及氫(1N H2 SO4 )過電壓> ·鉑(Pt):0.00 V ·金(Au):0.02 V ·銀(Ag):0.08 V ·鎳(Ni):0.21 V ·銅(Cu):0.23 V ·錫(Sn):0.53 V ·鋅(Zn):0.70 V[Block barrier removal step] The barrier layer removal step is to remove the barrier layer of the anodized film using an aqueous alkali solution containing a metal M1 having a hydrogen overvoltage higher than aluminum after the anodizing treatment step. step. In the manufacturing method of the present invention, the barrier layer is removed by the barrier layer removing step, and as shown in FIG. 1C, a metal layer 5a containing the metal M1 is formed at the bottom of the micropores 2. Here, the hydrogen overvoltage refers to a voltage necessary for generating hydrogen, for example, the hydrogen overvoltage of aluminum (Al) is -1.66 V (J. J. Chem., 1982, (8), p1305-1313). Further, an example of the metal M1 higher than the hydrogen overvoltage of aluminum and the value of the hydrogen overvoltage thereof are shown below. <Metal M1 and hydrogen (1N H 2 SO 4 ) overvoltage> · Platinum (Pt): 0.00 V · Gold (Au): 0.02 V · Silver (Ag): 0.08 V · Nickel (Ni): 0.21 V · Copper ( Cu): 0.23 V · tin (Sn): 0.53 V · zinc (Zn): 0.70 V

本發明中,就與後述陽極氧化處理步驟中填充的金屬M2發生置換反應,對填充至微孔內部的金屬的電氣特性所造成的影響變少的理由而言,所述阻障層去除步驟中所用的金屬M1較佳為離子化傾向高於後述金屬填充步驟中所用的金屬M2的金屬。 具體而言,於使用銅(Cu)作為後述金屬填充步驟的金屬M2的情形時,所述阻障層去除步驟中所用的金屬M1例如可列舉Zn、Fe、Ni、Sn等,其中,較佳為使用Zn、Ni,更佳為使用Zn。 另外,於使用Ni作為後述金屬填充步驟的金屬M2的情形時,所述阻障層去除步驟中所用的金屬M1例如可列舉Zn、Fe等,其中,較佳為使用Zn。In the present invention, in the barrier layer removal step, the substitution reaction with the metal M2 filled in the anodizing treatment step described later is less affected by the electrical characteristics of the metal filled in the inside of the micropores. The metal M1 to be used is preferably a metal having a higher ionization tendency than the metal M2 used in the metal filling step described later. Specifically, when copper (Cu) is used as the metal M2 in the metal filling step described later, the metal M1 used in the barrier layer removing step may, for example, be Zn, Fe, Ni, Sn, or the like. In order to use Zn or Ni, it is more preferable to use Zn. In the case where Ni is used as the metal M2 in the metal filling step to be described later, examples of the metal M1 used in the barrier layer removing step include Zn, Fe, and the like. Among them, Zn is preferably used.

使用含有此種金屬M1的鹼水溶液將阻障層去除的方法並無特別限定,例如可列舉與以前公知的化學蝕刻處理相同的方法。The method of removing the barrier layer by using an aqueous alkali solution containing such a metal M1 is not particularly limited, and examples thereof include the same methods as the conventionally known chemical etching treatment.

<化學蝕刻處理> 關於利用化學蝕刻處理的阻障層的去除,例如可藉由以下方法等僅使阻障層選擇性地溶解:使所述陽極氧化處理步驟後的結構物浸漬於鹼水溶液中,使鹼水溶液填充至微孔的內部後,使pH緩衝液與陽極氧化膜的微孔的開口部側的表面接觸。<Chemical etching treatment> Regarding the removal of the barrier layer by the chemical etching treatment, for example, only the barrier layer can be selectively dissolved by immersing the structure after the anodizing treatment step in an aqueous alkali solution After the aqueous alkali solution is filled into the inside of the micropores, the pH buffer is brought into contact with the surface on the opening side of the micropores of the anodized film.

此處,含有所述金屬M1的鹼水溶液較佳為使用選自由氫氧化鈉、氫氧化鉀及氫氧化鋰所組成的組群中的至少一種鹼的水溶液。另外,鹼水溶液的濃度較佳為0.1質量%~5質量%。鹼水溶液的溫度較佳為10℃~60℃,進而較佳為15℃~45℃,更佳為20℃~35℃。 具體而言,例如可較佳地使用50 g/L且40℃的磷酸水溶液、0.5 g/L且30℃的氫氧化鈉水溶液、0.5 g/L且30℃的氫氧化鉀水溶液等。 再者,pH緩衝液可適宜地使用與上文所述的鹼水溶液相對應的緩衝液。Here, the aqueous alkali solution containing the metal M1 is preferably an aqueous solution using at least one base selected from the group consisting of sodium hydroxide, potassium hydroxide and lithium hydroxide. Further, the concentration of the aqueous alkali solution is preferably from 0.1% by mass to 5% by mass. The temperature of the aqueous alkali solution is preferably from 10 ° C to 60 ° C, more preferably from 15 ° C to 45 ° C, still more preferably from 20 ° C to 35 ° C. Specifically, for example, a 50 g/L aqueous solution of phosphoric acid at 40° C., a sodium hydroxide aqueous solution of 0.5 g/L and 30° C., an aqueous potassium hydroxide solution of 0.5 g/L and 30° C., or the like can be preferably used. Further, as the pH buffer, a buffer corresponding to the aqueous alkali solution described above can be suitably used.

另外,於鹼水溶液中的浸漬時間較佳為5分鐘~120分鐘,更佳為8分鐘~120分鐘,進而佳為8分鐘~90分鐘,尤佳為10分鐘~90分鐘。其中,較佳為10分鐘~60分鐘,更佳為15分鐘~60分鐘。Further, the immersion time in the aqueous alkali solution is preferably from 5 minutes to 120 minutes, more preferably from 8 minutes to 120 minutes, further preferably from 8 minutes to 90 minutes, and particularly preferably from 10 minutes to 90 minutes. Among them, it is preferably from 10 minutes to 60 minutes, more preferably from 15 minutes to 60 minutes.

[金屬填充步驟] 所述金屬填充步驟為於所述阻障層去除步驟之後,實施電解鍍敷處理而於陽極氧化膜中的微孔的內部填充金屬M2的步驟。[Metal Filling Step] The metal filling step is a step of performing electrolytic plating treatment to fill the inside of the micropores in the anodized film with the metal M2 after the barrier layer removing step.

<金屬M2> 所述金屬M2較佳為電阻率為103 Ω·cm以下的材料,其具體例可較佳地例示:金(Au)、銀(Ag)、銅(Cu)、鋁(Al)、鎂(Mg)、鎳(Ni)、鋅(Zn)、摻銦的錫氧化物(氧化銦錫(Indium Tin Oxide,ITO))等。 其中,就導電性的觀點而言,較佳為Cu、Au、Al、Ni,更佳為Cu、Au,進而佳為Cu。<Metal M2> The metal M2 is preferably a material having a specific resistance of 10 3 Ω·cm or less, and specific examples thereof are preferably exemplified by gold (Au), silver (Ag), copper (Cu), and aluminum (Al). ), magnesium (Mg), nickel (Ni), zinc (Zn), indium-doped tin oxide (Indium Tin Oxide (ITO)), and the like. Among them, from the viewpoint of conductivity, Cu, Au, Al, and Ni are preferable, Cu or Au is more preferable, and Cu is further preferable.

<填充方法> 將所述金屬M2填充至微孔的內部的電解鍍敷處理方法例如可使用電解鍍敷法或非電解鍍敷法。 此處,對於用於著色等的以前公知的電解鍍敷法而言,難以選擇性地於孔中使金屬以高縱橫比析出(成長)。可認為其原因在於:析出金屬於孔內被消耗,即便進行一定時間以上的電解,鍍敷亦不成長。<Filling Method> The electrolytic plating treatment method in which the metal M2 is filled in the inside of the micropores can be, for example, an electrolytic plating method or an electroless plating method. Here, in the conventionally known electrolytic plating method for coloring or the like, it is difficult to selectively precipitate (grow) metal in a high aspect ratio in a hole. The reason for this is considered to be that the precipitated metal is consumed in the pores, and the plating does not grow even if electrolysis is performed for a certain period of time or longer.

因此,於本發明的製造方法中,於藉由電解鍍敷法來填充金屬的情形時,必須於脈波電解或恆定電位電解時設置休止時間。休止時間必須為10秒鐘以上,較佳為30秒鐘~60秒鐘。 另外,為了促進電解液的攪拌,理想的是施加超音波。 進而,電解電壓通常為20 V以下,理想的是10 V以下,較佳為預先測定所使用的電解液中的目標金屬的析出電位,於該電位+1 V以內進行恆定電位電解。再者,於進行恆定電位電解時,理想的是可併用循環伏安法(cyclic voltammetry),可使用輸力強(Solartron)公司、柏斯(BAS)公司、北斗電工公司、依維姆(IVIUM)公司等的恆電位儀(potentiostat)裝置。Therefore, in the production method of the present invention, when the metal is filled by the electrolytic plating method, it is necessary to set the rest time at the time of pulse wave electrolysis or constant potential electrolysis. The rest time must be 10 seconds or longer, preferably 30 seconds to 60 seconds. Further, in order to promote the stirring of the electrolytic solution, it is desirable to apply ultrasonic waves. Further, the electrolysis voltage is usually 20 V or less, preferably 10 V or less, and it is preferable to measure the deposition potential of the target metal in the electrolytic solution to be used in advance, and carry out constant potential electrolysis at a potential of +1 V or less. Furthermore, in the case of constant potential electrolysis, it is desirable to use cyclic voltammetry in combination with Solartron, BAS, Hokuto Denko, and IVIUM. A potentiostat device such as a company.

鍍敷液可使用以前公知的鍍敷液。 具體而言,於使銅析出的情形時通常使用硫酸銅水溶液,硫酸銅的濃度較佳為1 g/L~300 g/L,更佳為100 g/L~200 g/L。另外,若於電解液中添加鹽酸則可促進析出。於該情形時,鹽酸濃度較佳為10 g/L~20 g/L。 另外,於使金析出的情形時,理想的是使用四氯金的硫酸溶液藉由交流電解來進行鍍敷。As the plating solution, a previously known plating solution can be used. Specifically, in the case of depositing copper, an aqueous copper sulfate solution is usually used, and the concentration of copper sulfate is preferably from 1 g/L to 300 g/L, more preferably from 100 g/L to 200 g/L. Further, when hydrochloric acid is added to the electrolytic solution, precipitation can be promoted. In this case, the hydrochloric acid concentration is preferably from 10 g/L to 20 g/L. Further, in the case of depositing gold, it is preferred to perform plating by alternating current electrolysis using a sulfuric acid solution of tetrachlorogold.

再者,對於非電解鍍敷法而言,於包含縱橫比高的微孔的孔中完全填充金屬需要長時間,故於本發明的製造方法中,理想的是藉由電解鍍敷法來填充金屬。Further, in the electroless plating method, it takes a long time to completely fill the metal in the pores including the micropores having a high aspect ratio, and therefore, in the production method of the present invention, it is desirable to fill by the electrolytic plating method. metal.

於本發明中,可認為,藉由所述阻障層去除步驟將阻障層去除,且於微孔的底部形成包含上文所述的金屬M1的金屬層,故如上所述,由鍍敷液所致的氫氣的產生得到抑制,容易進行利用電解鍍敷處理的金屬填充。In the present invention, it is considered that the barrier layer is removed by the barrier layer removing step, and a metal layer including the metal M1 described above is formed at the bottom of the micropore, so as described above, by plating The generation of hydrogen by the liquid is suppressed, and metal filling by electrolytic plating is easily performed.

[基板去除步驟] 所述基板去除步驟為於所述金屬填充步驟之後,將所述鋁基板去除而獲得金屬填充微細結構體的步驟。 將鋁基板去除的方法並無特別限定,例如可較佳地列舉藉由溶解而去除的方法等。[Substrate Removal Step] The substrate removal step is a step of removing the aluminum substrate after the metal filling step to obtain a metal-filled microstructure. The method for removing the aluminum substrate is not particularly limited, and for example, a method of removing by dissolution or the like is preferably exemplified.

<鋁基板的溶解> 所述鋁基板的溶解較佳為使用難以溶解陽極氧化膜、且容易溶解鋁的處理液。 此種處理液較佳為對鋁的溶解速度為1 μm/min以上,更佳為3 μm/min以上,進而佳為5 μm/min以上。同樣地,對陽極氧化膜的溶解速度較佳為成為0.1 nm/min以下,更佳為成為0.05 nm/min以下,進而佳為成為0.01 nm/min以下。 具體而言,較佳為含有至少一種離子化傾向低於鋁的金屬化合物、且pH值成為4以下或8以上的處理液,更佳為其pH值為3以下或9以上,進而佳為2以下或10以上。<Dissolution of Aluminum Substrate> The dissolution of the aluminum substrate is preferably a treatment liquid in which it is difficult to dissolve the anodized film and dissolve aluminum easily. The treatment liquid preferably has a dissolution rate of aluminum of 1 μm/min or more, more preferably 3 μm/min or more, and still more preferably 5 μm/min or more. Similarly, the dissolution rate of the anodized film is preferably 0.1 nm/min or less, more preferably 0.05 nm/min or less, and further preferably 0.01 nm/min or less. Specifically, it is preferably a treatment liquid containing at least one metal compound having a lower ionization tendency than aluminum and having a pH of 4 or less or 8 or more, more preferably a pH of 3 or less or 9 or more, and still more preferably 2 The following or 10 or more.

此種處理液較佳為以酸或鹼水溶液作為基質,且調配有例如錳、鋅、鉻、鐵、鎘、鈷、鎳、錫、鉛、銻、鉍、銅、汞、銀、鈀、鉑、金的化合物(例如氯化鉑酸)、該些金屬的氟化物、該些金屬的氯化物等的處理液。 其中,較佳為酸水溶液基質,且較佳為摻雜氯化物。 尤其就處理寬容度(latitude)的觀點而言,較佳為於鹽酸水溶液摻雜有氯化汞的處理液(鹽酸/氯化汞)、於鹽酸水溶液中摻雜有氯化銅的處理液(鹽酸/氯化銅)。 再者,此種處理液的組成並無特別限定,例如可使用溴/甲醇混合物、溴/乙醇混合物、王水等。The treatment liquid is preferably an acid or alkali aqueous solution as a matrix, and is formulated with, for example, manganese, zinc, chromium, iron, cadmium, cobalt, nickel, tin, lead, antimony, bismuth, copper, mercury, silver, palladium, platinum. A treatment solution of a gold compound (for example, chloroplatinic acid), a fluoride of the metal, or a chloride of the metal. Among them, a substrate of an aqueous acid solution is preferred, and a chloride is preferably doped. Particularly, from the viewpoint of handling latitude, a treatment liquid (hydrochloric acid/mercuric chloride) in which an aqueous solution of hydrochloric acid is doped with mercuric chloride, and a treatment liquid in which copper chloride is doped in an aqueous hydrochloric acid solution are preferred ( Hydrochloric acid / copper chloride). In addition, the composition of such a treatment liquid is not particularly limited, and for example, a bromine/methanol mixture, a bromine/ethanol mixture, aqua regia, or the like can be used.

另外,此種處理液的酸或鹼濃度較佳為0.01 mol/L~10 mol/L,更佳為0.05 mol/L~5 mol/L。 進而,使用此種處理液的處理溫度較佳為-10℃~80℃,較佳為0℃~60℃。Further, the acid or alkali concentration of the treatment liquid is preferably from 0.01 mol/L to 10 mol/L, more preferably from 0.05 mol/L to 5 mol/L. Further, the treatment temperature for using such a treatment liquid is preferably from -10 °C to 80 °C, preferably from 0 °C to 60 °C.

另外,所述鋁基板的溶解是藉由使所述金屬填充步驟後的鋁基板與上文所述的處理液接觸而進行。接觸的方法並無特別限定,例如可列舉浸漬法、噴霧法。其中,較佳為浸漬法。此時的接觸時間較佳為10秒鐘~5小時,更佳為1分鐘~3小時。Further, the dissolution of the aluminum substrate is performed by bringing the aluminum substrate after the metal filling step into contact with the treatment liquid described above. The method of contact is not particularly limited, and examples thereof include a dipping method and a spraying method. Among them, a dipping method is preferred. The contact time at this time is preferably from 10 seconds to 5 hours, more preferably from 1 minute to 3 hours.

[金屬突出步驟] 於本發明的製造方法中,就所製作的金屬填充微細結構體的金屬接合性提高的理由而言,較佳為如上文所述的第2態樣及圖2所示,包括表面金屬突出步驟及/或背面金屬突出步驟。 此處,所謂表面金屬突出步驟,為於所述金屬填充步驟之後且於所述基板去除步驟之前,將所述陽極氧化膜的未設置所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出的步驟。 另外,所謂背面金屬突出步驟,為於所述基板去除步驟之後,將所述陽極氧化膜的設有所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出的步驟。[Metal protrusion step] In the production method of the present invention, the reason why the metal bondability of the produced metal-filled microstructure is improved is preferably as shown in the second aspect and FIG. 2 described above. The surface metal protruding step and/or the back metal protruding step are included. Here, the surface metal protruding step is to partially remove the surface of the anodized film on the side where the aluminum substrate is not disposed in the thickness direction after the metal filling step and before the substrate removing step. The step of making the metal M2 filled in the metal filling step more prominent than the surface of the anodized film. In addition, the back metal protruding step is to partially remove the surface of the anodized film on the side where the aluminum substrate is provided in the thickness direction after the substrate removing step, so that the metal filling step is filled. The step of the metal M2 being more prominent than the surface of the anodized film.

此種金屬突出步驟中的陽極氧化膜的局部去除例如可藉由以下方式來進行:使具有填充有金屬的微孔的陽極氧化膜,與不溶解上文所述的金屬M1及金屬M2(特別是金屬M2)且溶解陽極氧化膜、即氧化鋁的酸水溶液或鹼水溶液接觸。接觸的方法並無特別限定,例如可列舉浸漬法、噴霧法。其中,較佳為浸漬法。The partial removal of the anodized film in such a metal protrusion step can be performed, for example, by anodizing a film having micropores filled with metal, and not dissolving the metal M1 and the metal M2 described above (special It is a metal M2) and is in contact with an anodic oxide film, that is, an aqueous acid solution or an aqueous alkali solution of alumina. The method of contact is not particularly limited, and examples thereof include a dipping method and a spraying method. Among them, a dipping method is preferred.

於使用酸水溶液的情形時,較佳為使用硫酸、磷酸、硝酸、鹽酸等無機酸或該些酸的混合物的水溶液。其中,就安全性優異的方面而言,較佳為不含鉻酸的水溶液。酸水溶液的濃度較佳為1質量%~10質量%。酸水溶液的溫度較佳為25℃~60℃。 另外,於使用鹼水溶液的情形時,較佳為使用選自由氫氧化鈉、氫氧化鉀及氫氧化鋰所組成的組群中至少一種鹼的水溶液。鹼水溶液的濃度較佳為0.1質量%~5質量%。鹼水溶液的溫度較佳為20℃~35℃。 具體而言,例如可較佳地使用50 g/L且40℃的磷酸水溶液、0.5 g/L且30℃的氫氧化鈉水溶液或0.5 g/L且30℃的氫氧化鉀水溶液。 於酸水溶液或鹼水溶液中的浸漬時間較佳為8分鐘~120分鐘,更佳為10分鐘~90分鐘,進而佳為15分鐘~60分鐘。此處,於重複進行短時間的浸漬處理的情形時,浸漬時間是指各浸漬時間的合計。再者,亦可於各浸漬處理之間實施清洗處理。In the case of using an aqueous acid solution, it is preferred to use an inorganic acid such as sulfuric acid, phosphoric acid, nitric acid or hydrochloric acid or an aqueous solution of a mixture of these acids. Among them, in terms of excellent safety, an aqueous solution containing no chromic acid is preferred. The concentration of the aqueous acid solution is preferably from 1% by mass to 10% by mass. The temperature of the aqueous acid solution is preferably from 25 ° C to 60 ° C. Further, in the case of using an aqueous alkali solution, it is preferred to use an aqueous solution selected from at least one of a group consisting of sodium hydroxide, potassium hydroxide and lithium hydroxide. The concentration of the aqueous alkali solution is preferably from 0.1% by mass to 5% by mass. The temperature of the aqueous alkali solution is preferably from 20 ° C to 35 ° C. Specifically, for example, a 50 g/L aqueous solution of phosphoric acid at 40 ° C, an aqueous solution of sodium hydroxide at 0.5 g/L and 30 ° C, or an aqueous potassium hydroxide solution at 0.5 g/L and 30 ° C can be preferably used. The immersion time in the aqueous acid solution or the aqueous alkali solution is preferably from 8 minutes to 120 minutes, more preferably from 10 minutes to 90 minutes, and still more preferably from 15 minutes to 60 minutes. Here, in the case where the immersion treatment for a short period of time is repeated, the immersion time means the total of the immersion times. Further, a cleaning treatment may be performed between the respective immersion treatments.

另外,於本發明的製造方法中,於將所製作的金屬填充微細結構體用作異向導電性構件時,就與配線基板等被接著物的壓接性變良好的理由而言,所述表面金屬突出步驟及/或所述背面金屬突出步驟較佳為使所述金屬M2較所述陽極氧化膜的表面突出10 nm~1000 nm的步驟,更佳為突出50 nm~500 nm的步驟。Further, in the production method of the present invention, when the produced metal-filled microstructure is used as an anisotropic conductive member, the pressure-bonding property of the substrate to be bonded, such as a wiring board, is improved. The step of protruding the surface metal and/or the step of protruding the back metal is preferably a step of projecting the metal M2 from 10 nm to 1000 nm from the surface of the anodized film, more preferably from 50 nm to 500 nm.

進而,於本發明的製造方法中,於藉由壓接等方法將所製作的金屬填充微細結構體與電極連接(接合)時,就可充分確保突出部分壓碎的情形時的面方向的絕緣性的理由而言,較佳為藉由所述表面金屬突出步驟及/或所述背面金屬突出步驟所形成的突出部分的縱橫比(突出部分的高度/突出部分的直徑)為0.01以上且小於20,更佳為6~20。Further, in the production method of the present invention, when the produced metal-filled microstructure is connected (joined) to the electrode by a method such as pressure bonding, the surface-direction insulation in the case where the protruding portion is crushed can be sufficiently ensured. For the reason of the nature, it is preferable that the aspect ratio (the height of the protruding portion / the diameter of the protruding portion) of the protruding portion formed by the surface metal protruding step and/or the back metal protruding step is 0.01 or more and less than 20, more preferably 6 to 20.

於本發明的製造方法中,藉由上文所述的金屬填充步驟及基板去除步驟以及任意的金屬突出步驟所形成的包含金屬的導通路較佳為柱狀,其直徑較佳為超過5 nm且為10 μm以下,更佳為40 nm~1000 nm。In the manufacturing method of the present invention, the metal-containing via path formed by the metal filling step and the substrate removing step and any metal protrusion step described above is preferably columnar, and the diameter thereof is preferably more than 5 nm. It is 10 μm or less, more preferably 40 nm to 1000 nm.

另外,所述導通路以藉由鋁基板的陽極氧化皮膜而彼此絕緣的狀態存在,其密度較佳為2萬個/mm2 以上,更佳為200萬個/mm2 以上,進而佳為1000萬個/mm2 以上,尤佳為5000萬個/mm2 以上,最佳為1億個/mm2 以上。Further, the conductive paths are present in a state of being insulated from each other by an anodic oxide film of an aluminum substrate, and the density thereof is preferably 20,000/mm 2 or more, more preferably 2,000,000/mm 2 or more, and still more preferably 1000. More than 10,000/mm 2 or more, particularly preferably 50 million/mm 2 or more, and most preferably 100 million/mm 2 or more.

進而,鄰接的各導通路的中心間距離較佳為20 nm~500 nm,更佳為40 nm~200 nm,進而佳為50 nm~140 nm。Further, the distance between the centers of the adjacent conduction paths is preferably from 20 nm to 500 nm, more preferably from 40 nm to 200 nm, and even more preferably from 50 nm to 140 nm.

[樹脂層形成步驟] 於本發明的製造方法中,就所製作的金屬填充微細結構體的搬送性提高的理由而言,較佳為如上文所述的第3態樣及圖3所示般,包括樹脂層形成步驟。 此處,所謂樹脂層形成步驟,為於所述金屬填充步驟之後(於具有所述表面金屬突出步驟的情形時為表面金屬突出步驟之後)且於所述基板去除步驟之前,於所述陽極氧化膜的未設置所述鋁基板之側的表面上設置樹脂層的步驟。[Resin layer forming step] In the production method of the present invention, the reason why the transportability of the produced metal-filled fine structure is improved is preferably as described in the third aspect and FIG. Including a resin layer forming step. Here, the resin layer forming step is after the metal filling step (after the surface metal protruding step in the case of the surface metal protruding step) and before the substrate removing step, the anodizing A step of providing a resin layer on the surface of the film on the side where the aluminum substrate is not provided.

構成所述樹脂層的樹脂材料具體而言,例如可列舉:乙烯系共聚物、聚醯胺樹脂、聚酯樹脂、聚胺基甲酸酯樹脂、聚烯烴系樹脂、丙烯酸系樹脂及纖維素系樹脂等,就搬送性的觀點、容易用作異向導電性構件的觀點而言,所述樹脂層較佳為可剝離的附黏著層的膜,更佳為藉由加熱處理或紫外線曝光處理而黏著性變弱、變得可剝離的附黏著層的膜。Specific examples of the resin material constituting the resin layer include an ethylene copolymer, a polyamide resin, a polyester resin, a polyurethane resin, a polyolefin resin, an acrylic resin, and a cellulose system. The resin layer or the like is preferably a peelable adhesive layer-attached film from the viewpoint of transportability and easy to use as an anisotropic conductive member, and more preferably by heat treatment or ultraviolet exposure treatment. A film with an adhesive layer that is weakened and becomes peelable.

所述附黏著層的膜並無特別限定,可列舉熱剝離型的樹脂層、或紫外線(Ultraviolet,UV)剝離型的樹脂層等。 此處,熱剝離型的樹脂層於常溫下具有黏著力,且僅藉由加熱便可容易地剝離,大多為主要使用發泡性的微膠囊(microcapsule)等的樹脂層。 另外,構成黏著層的黏著劑具體而言,例如可列舉:橡膠系黏著劑、丙烯酸系黏著劑、乙烯基烷基醚系黏著劑、矽酮系黏著劑、聚酯系黏著劑、聚醯胺系黏著劑、胺基甲酸酯系黏著劑、苯乙烯-二烯嵌段共聚物系黏著劑等。 另外,UV剝離型的樹脂層具有UV硬化型的接著層,藉由硬化而喪失黏著力,變得可剝離。 UV硬化型的接著層可列舉:於基質聚合物中,於聚合物側鏈或主鏈中或者主鏈末端導入有碳-碳雙鍵的聚合物等。具有碳-碳雙鍵的基質聚合物較佳為以丙烯酸系聚合物作為基本骨架的聚合物。 進而,丙烯酸系聚合物進行交聯,故視需要亦可含有多官能性單體等作為共聚合用單體成分。 具有碳-碳雙鍵的基質聚合物可單獨使用,亦可調配UV硬化性的單體或寡聚物。 UV硬化型的接著層為了藉由UV照射而硬化,較佳為併用光聚合起始劑。光聚合起始劑可列舉:安息香醚系化合物;縮酮系化合物;芳香族磺醯氯系化合物;光活性肟系化合物;二苯甲酮系化合物;噻噸酮(thioxanthone)系化合物;樟腦醌;鹵化酮;醯基膦氧化物;醯基磷酸酯(acylphosphonate)等。The film to which the adhesive layer is attached is not particularly limited, and examples thereof include a heat-peelable resin layer or an ultraviolet (UV) peel-off resin layer. Here, the heat-peelable resin layer has an adhesive force at normal temperature and can be easily peeled off only by heating, and a resin layer such as a microcapsule which is mainly foamed is mainly used. Further, specific examples of the adhesive constituting the adhesive layer include a rubber-based adhesive, an acrylic adhesive, a vinyl alkyl ether adhesive, an anthrone-based adhesive, a polyester adhesive, and a polyamide. An adhesive, a urethane-based adhesive, a styrene-diene block copolymer-based adhesive, or the like. Further, the UV-peelable resin layer has a UV-curable adhesive layer, which loses adhesion by curing and becomes peelable. The UV-curable adhesive layer may, for example, be a polymer in which a carbon-carbon double bond is introduced into a polymer side chain or a main chain or a main chain terminal in a matrix polymer. The matrix polymer having a carbon-carbon double bond is preferably a polymer having an acrylic polymer as a basic skeleton. Further, the acrylic polymer is crosslinked, and a polyfunctional monomer or the like may be contained as a monomer component for copolymerization as necessary. The matrix polymer having a carbon-carbon double bond may be used singly or as a UV curable monomer or oligomer. The UV-curable adhesive layer is cured by UV irradiation, and a photopolymerization initiator is preferably used in combination. Examples of the photopolymerization initiator include a benzoin ether compound; a ketal compound; an aromatic sulfonium chloride compound; a photoactive oxime compound; a benzophenone compound; a thioxanthone compound; Halogenated ketone; mercaptophosphine oxide; acylphosphonate and the like.

熱剝離型的樹脂層的市售品例如可列舉:WS5130C02、WS5130C10等因特利馬(Intelimer)[註冊商標]膠帶(霓達(Nitta)股份有限公司製造);索馬特(Somatac)[註冊商標]TE系列(索馬龍(Somar)株式會製);No.3198、No.3198LS、No.3198M、No.3198MS、No.3198H、No.3195、No.3196、No.3195M、No.3195MS、No.3195H、No.3195HS、No.3195V、No.3195VS、No.319Y-4L、No.319Y-4LS、No.319Y-4M、No.319Y-4MS、No.319Y-4H、No.319Y-4HS、No.319Y-4LSC、No.31935MS、No.31935HS、No.3193M、No.3193MS等瑞法(Revalpha)[註冊商標]系列(日東電工股份有限公司製造)等。Commercial products of the heat-peelable resin layer include, for example, WS5130C02, WS5130C10, etc. [Intelimer] [registered trademark] tape (manufactured by Nitta Co., Ltd.); Somatac [registered] Trademark] TE series (made by Somar); No. 3198, No. 3198LS, No. 3198M, No. 3198MS, No. 3198H, No. 3195, No. 3196, No. 3195M, No. 3195MS No. 3195H, No. 3195HS, No. 3195V, No. 3195VS, No. 319Y-4L, No. 319Y-4LS, No. 319Y-4M, No. 319Y-4MS, No. 319Y-4H, No. 319Y - 4HS, No. 319Y-4LSC, No. 31935MS, No. 31935HS, No. 3193M, No. 3193MS, etc., etc. (Revalpha) [registered trademark] series (manufactured by Nitto Denko Corporation).

UV剝離型的樹脂層的市售品例如可列舉:ELP DU-300、ELP DU-2385KS、ELP DU-2187G、ELP NBD-3190K、ELP UE-2091J等艾萊普(Elepholder)[註冊商標](日東電工股份有限公司製造);阿德瓦(Adwill)D-210、阿德瓦(Adwill)D-203、阿德瓦(Adwill)D-202、阿德瓦(Adwill)D-175、阿德瓦(Adwill)D-675(均為琳得科(Lintec)股份有限公司製造);斯米萊(Sumilite)[註冊商標]FLS的N8000系列(住友貝克萊特(Sumitomo Bakelite)股份有限公司製造);UC353EP-110(古河電氣工業股份有限公司製造)等切割膠帶(dicing tape);或 ELP RF-7232DB、ELP UB-5133D(均為日東電工股份有限公司製造);SP-575B-150、SP-541B-205、SP-537T-160、SP-537T-230(均為古河電氣工業股份有限公司製造)等背面研磨膠帶(back grind tape)。Commercial products of the UV-peelable resin layer include, for example, ELP DU-300, ELP DU-2385KS, ELP DU-2187G, ELP NBD-3190K, ELP UE-2091J, and the like, Elepholder [registered trademark] ( Nitto Denko Co., Ltd.); Adwill D-210, Adwill D-203, Adwill D-202, Adwill D-175, Ade Adwill D-675 (both manufactured by Lintec Co., Ltd.); Sumilite [registered trademark] FLS N8000 series (manufactured by Sumitomo Bakelite Co., Ltd.); Dicing tape such as UC353EP-110 (manufactured by Furukawa Electric Co., Ltd.); or ELP RF-7232DB, ELP UB-5133D (all manufactured by Nitto Denko Corporation); SP-575B-150, SP-541B -205, SP-537T-160, SP-537T-230 (both manufactured by Furukawa Electric Co., Ltd.) and other back grind tapes.

另外,貼附所述附黏著層的膜的方法並無特別限定,可使用以前公知的表面保護膠帶貼附裝置或層壓機來進行貼附。Further, the method of attaching the film with the adhesive layer is not particularly limited, and it can be attached by using a conventionally known surface protective tape attaching device or a laminating machine.

[捲取步驟] 於本發明的製造方法中,就所製作的金屬填充微細結構體的搬送性進一步提高的理由而言,較佳為於上文所述的任意的樹脂層形成步驟之後包括捲取步驟,將金屬填充微細結構體以具有所述樹脂層的狀態捲取成捲筒狀。 此處,所述捲取步驟中的捲取方法並無特別限定,例如可列舉如圖4所示般捲取至既定直徑及既定寬度的卷芯21上的方法。[Winding step] In the production method of the present invention, it is preferable to include a roll after the resin layer forming step described above, for the reason that the transportability of the produced metal-filled fine structure is further improved. In the step, the metal-filled microstructure is wound into a roll shape in a state of having the resin layer. Here, the winding method in the winding step is not particularly limited, and for example, a method of winding up to a winding core 21 having a predetermined diameter and a predetermined width as shown in FIG. 4 can be cited.

另外,於本發明的製造方法中,就容易進行所述捲取步驟中的捲取的觀點而言,較佳為將樹脂層除外的金屬填充微細結構體的平均厚度為30 μm以下,更佳為5 μm~20 μm。再者,關於平均厚度,對將樹脂層除外的金屬填充微細結構體利用FIB於厚度方向上進行切削加工,藉由FE-SEM對其剖面拍攝表面照片(倍率50000倍),以10點測定的平均值的形式而算出平均厚度。Further, in the production method of the present invention, from the viewpoint of facilitating the winding in the winding step, it is preferable that the metal-filled microstructure having the resin layer has an average thickness of 30 μm or less, more preferably It is 5 μm to 20 μm. In addition, regarding the average thickness, the metal-filled fine structure excluding the resin layer was subjected to a cutting process in the thickness direction by FIB, and a surface photograph (magnification: 50,000 times) of the cross-section was taken by FE-SEM, and measured at 10 points. The average thickness is calculated as the average value.

[其他處理步驟] 本發明的製造方法除了上文所述的各步驟以外,亦可包括專利文獻1(國際公開第2015/029881號)的[0049]~[0057]段落中記載的研磨步驟、表面平滑化步驟、保護膜形成處理、水洗處理。 另外,就製造上的操作性、或將金屬填充微細結構體用作異向導電性構件的觀點而言,應用如以下所示般的各種製程或形式。[Other Processing Procedures] The manufacturing method of the present invention may include the polishing steps described in paragraphs [0049] to [0057] of Patent Document 1 (International Publication No. 2015/029881), in addition to the above-described respective steps. Surface smoothing step, protective film forming treatment, and water washing treatment. Further, from the viewpoint of operability in production or use of a metal-filled fine structure as an anisotropic conductive member, various processes or forms as described below are applied.

<使用暫時接著劑的製程例> 於本發明中,亦可於藉由所述基板去除步驟而獲得金屬填充微細結構體之後,包括以下步驟:使用暫時接著劑(Temporary Bonding Materials)將金屬填充微細結構體固定於矽晶圓上,藉由研磨而進行薄層化。 繼而,可於薄層化的步驟之後,將表面充分清洗後,進行所述表面金屬突出步驟。 繼而,可於使金屬突出的表面上塗佈接著力較之前的暫時接著劑更強的暫時接著劑並將其固定於矽晶圓上後,將由之前的暫時接著劑所接著的矽晶圓剝離,對經剝離的金屬填充微細結構體側的表面進行所述背面金屬突出步驟。<Processing Example of Using Temporary Adhesive Agent> In the present invention, after the metal-filled fine structure is obtained by the substrate removing step, the following steps are included: the metal is filled with a temporary adhesive (Temporary Bonding Materials) The structure is fixed on the germanium wafer and thinned by grinding. Then, after the step of thinning, after the surface is sufficiently cleaned, the surface metal protruding step is performed. Then, after the temporary adhesive which is stronger than the previous temporary adhesive is applied to the surface on which the metal protrudes and is fixed on the germanium wafer, the germanium wafer which is followed by the previous temporary adhesive is peeled off. The back metal protruding step is performed on the surface of the peeled metal-filled fine structure side.

<使用蠟(WAX)的製程例> 於本發明中,亦可於藉由所述基板去除步驟而獲得金屬填充微細結構體之後,包括以下步驟:使用蠟將金屬填充微細結構體固定於矽晶圓上,藉由研磨而進行薄層化。 繼而,可於薄層化的步驟之後,將表面充分清洗後,進行所述表面金屬突出步驟。 繼而,可於使金屬突出的表面上塗佈暫時接著劑並將其固定於矽晶圓上後,藉由加熱使之前的蠟融解而剝離矽晶圓,對經剝離的金屬填充微細結構體側的表面進行所述背面金屬突出步驟。 再者,亦可使用固態蠟,若使用斯凱塗劑(Skycoat)(日化精工公司製造)等則可實現塗佈厚度均勻性的提高。<Processing Example of Using Wax (WAX)> In the present invention, after the metal-filled microstructure is obtained by the substrate removing step, the method includes the steps of: fixing the metal-filled microstructure to the twin by using wax. On the circle, thinning is performed by grinding. Then, after the step of thinning, after the surface is sufficiently cleaned, the surface metal protruding step is performed. Then, after applying a temporary adhesive to the surface on which the metal protrudes and fixing it on the ruthenium wafer, the ruthenium wafer is peeled off by melting the previous wax by heating, and the fine structure side is filled with the peeled metal. The surface performs the back metal protrusion step. Further, a solid wax can also be used, and the uniformity of coating thickness can be improved by using Skycoat (manufactured by Nissin Seiko Co., Ltd.).

<後進行基板去除處理的製程例> 於本發明中,亦可於所述金屬填充步驟之後且於所述基板去除步驟之前,包括以下步驟:使用暫時接著劑、蠟或功能性吸附膜將鋁基板固定於剛性基板(例如矽晶圓、玻璃基板等)上後,藉由研磨使所述陽極氧化膜的未設置所述鋁基板之側的表面薄層化。 繼而,可於薄層化的步驟之後,將表面充分清洗後,進行所述表面金屬突出步驟。 繼而,可於使金屬突出的表面上塗佈作為絕緣性材料的樹脂材料(例如環氧樹脂、聚醯亞胺樹脂等)後,利用與上文所述相同的方法於其表面上貼附剛性基板。關於利用樹脂材料的貼附,可選擇接著力大於暫時接著劑等的接著力般的材料,進行利用樹脂材料的貼附後,將最初貼附的剛性基板剝離,依序進行上文所述的基板去除步驟、研磨步驟及背面金屬突出處理步驟。 再者,功能性吸附膜可使用Q-恰克(Q-chuck)(註冊商標)(丸石產業股份有限公司製造)等。<Processing Example of Subsequent Substrate Removal Process> In the present invention, after the metal filling step and before the substrate removing step, the following steps may be included: using a temporary adhesive, wax or a functional adsorption film to aluminum After the substrate is fixed on a rigid substrate (for example, a germanium wafer, a glass substrate, or the like), the surface of the anodized film on the side where the aluminum substrate is not provided is thinned by polishing. Then, after the step of thinning, after the surface is sufficiently cleaned, the surface metal protruding step is performed. Then, after coating a resin material (for example, an epoxy resin, a polyimide resin, or the like) as an insulating material on the surface on which the metal protrudes, the rigidity is attached to the surface thereof by the same method as described above. Substrate. In the attachment by the resin material, a material having a bonding force greater than that of a temporary adhesive or the like can be selected, and after the bonding with the resin material, the rigid substrate to be attached first is peeled off, and the above-described method is sequentially performed. A substrate removal step, a polishing step, and a back metal protrusion processing step. Further, as the functional adsorption film, Q-chuck (registered trademark) (manufactured by Maruishi Co., Ltd.) or the like can be used.

於本發明中,較佳為將金屬填充微細結構體以藉由可剝離的層而貼附於剛體基板(例如矽晶圓、玻璃基板等)上的狀態以製品的形式提供。 於此種供給形態下,於將金屬填充微細結構體用作接合構件的情形時,可將金屬填充微細結構體的表面暫時接著於器件表面上,將剛體基板剝離後將成為連接對象的器件設置於適當的部位,進行加熱壓接,藉此利用金屬填充微細結構體將上下的器件接合。 另外,關於可剝離的層,可使用熱剝離層,亦能以與玻璃基板的組合而使用光剝離層。In the present invention, it is preferable that the metal-filled microstructure is provided in the form of a product in a state of being attached to a rigid substrate (for example, a germanium wafer, a glass substrate, or the like) by a peelable layer. In such a supply mode, when a metal-filled fine structure is used as the bonding member, the surface of the metal-filled microstructure can be temporarily attached to the surface of the device, and the rigid substrate can be peeled off to become a device to be connected. The upper and lower devices are joined by a metal-filled fine structure by heat-compression bonding at an appropriate portion. Further, as the peelable layer, a heat peeling layer can be used, and a light peeling layer can also be used in combination with a glass substrate.

另外,本發明的製造方法中,關於上文所述的各步驟,能以單片式來進行各步驟,亦能以鋁的線圈(coil)為整體而以網(web)連續處理。 另外,於連續處理的情形時,較佳為於各步驟之間設置適當的清洗步驟、乾燥步驟。Further, in the production method of the present invention, each step described above can be carried out in a single sheet, and the coil of aluminum can be continuously processed in a web. Further, in the case of continuous treatment, it is preferred to provide an appropriate washing step and drying step between the respective steps.

藉由包括此種各處理步驟的本發明的製造方法,可獲得金屬填充微細結構體,該金屬填充微細結構體是於來源於包含鋁基板的陽極氧化膜的絕緣性基材中設置的微孔的貫通孔的內部填充金屬而成。 具體而言,藉由本發明的製造方法,例如可獲得日本專利特開2008-270158號公報中記載的異向導電性構件,即,於絕緣性基材(具有微孔的鋁基板的陽極氧化膜)中,包含導電性構件(金屬)的多個導通路以彼此經絕緣的狀態而於所述絕緣性基材中於厚度方向上貫通,且所述各導通路的一端於所述絕緣性基材的一個面露出,所述各導通路的另一端於所述絕緣性基材的另一面露出,以此種狀態而設置的異向導電性構件。 [實施例]A metal-filled microstructure having a microporous layer provided in an insulating substrate derived from an anodized film containing an aluminum substrate can be obtained by the production method of the present invention including such processing steps. The inside of the through hole is made of metal. Specifically, by the production method of the present invention, for example, an anisotropic conductive member described in JP-A-2008-270158, that is, an insulating substrate (anodized film of an aluminum substrate having micropores) can be obtained. In the insulating substrate, the plurality of conductive paths including the conductive member (metal) are insulated from each other in the thickness direction, and one end of each of the conductive paths is on the insulating base One surface of the material is exposed, and the other end of each of the conduction paths is exposed on the other surface of the insulating base material, and an anisotropic conductive member is provided in such a state. [Examples]

以下,示出實施例對本發明加以具體說明。然而,本發明不限定於該些實施例。Hereinafter, the invention will be specifically described by way of examples. However, the invention is not limited to the embodiments.

[實施例1] <鋁基板的製作> 使用含有0.06質量%的Si、0.30質量%的Fe、0.005質量%的Cu、0.001質量%的Mn、0.001質量%的Mg、0.001質量%的Zn及0.03質量%的Ti且剩餘部分為Al及不可避免的雜質的鋁合金來製備熔態金屬,進行熔態金屬處理及過濾後,藉由直接激冷(Direct Chill,DC)鑄造法來製作厚度500 mm、寬度1200 mm的鑄塊。 繼而,藉由平面切削機將表面以平均10 mm的厚度削去後,於550℃下均熱保持約5小時,於溫度降低至400℃時,使用熱軋機製成厚度2.7 mm的軋板。 繼而,使用連續退火機於500℃下進行熱處理後,藉由冷軋而整飾成厚度1.0 mm,獲得日本工業標準(Japanese Industrial Standards,JIS)1050材的鋁基板。 將該鋁基板設定為寬度1030 mm後,實施以下所示的各處理。[Example 1] <Preparation of aluminum substrate> 0.06 mass% of Si, 0.30 mass% of Fe, 0.005 mass% of Cu, 0.001 mass% of Mn, 0.001 mass% of Mg, 0.001 mass% of Zn, and 0.03 were used. Aluminium alloy with a mass % of Ti and a balance of Al and unavoidable impurities to prepare a molten metal, which is subjected to molten metal treatment and filtration, and is formed by direct chilling (Direct Chill, DC) casting method to a thickness of 500 mm. Ingots with a width of 1200 mm. Then, after the surface was cut by an average cutting thickness of 10 mm by a plane cutting machine, the soaking was maintained at 550 ° C for about 5 hours, and when the temperature was lowered to 400 ° C, a hot rolling mill was used to make a rolled sheet having a thickness of 2.7 mm. . Then, after heat treatment at 500 ° C using a continuous annealing machine, it was finished by cold rolling to a thickness of 1.0 mm to obtain an aluminum substrate of Japanese Industrial Standards (JIS) 1050 material. After the aluminum substrate was set to have a width of 1030 mm, each treatment described below was carried out.

<電解研磨處理> 對所述鋁基板使用以下組成的電解研磨液,於電壓25 V、液溫度65℃、液流速3.0 m/min的條件下實施電解研磨處理。 陰極是設定為碳電極,電源是使用GP0110-30R(高砂製作所股份有限公司公司製造)。另外,電解液的流速是使用旋渦式流量監視器(flow monitor)FLM22-10PCW(亞速旺(As-one)股份有限公司製造)來測量。 (電解研磨液組成) ·85質量%磷酸(和光純藥公司製造的試劑)    660 mL ·純水      160 mL ·硫酸      150 mL ·乙二醇  30 mL<Electrochemical Polishing Treatment> An electrolytic polishing treatment was carried out on the aluminum substrate using an electrolytic polishing liquid having the following composition under the conditions of a voltage of 25 V, a liquid temperature of 65 ° C, and a liquid flow rate of 3.0 m/min. The cathode was set to a carbon electrode, and the power source was GP0110-30R (manufactured by Takasago Manufacturing Co., Ltd.). Further, the flow rate of the electrolytic solution was measured using a vortex flow monitor FLM22-10PCW (manufactured by As-One Co., Ltd.). (Electrochemical polishing composition) ·85 mass% phosphoric acid (reagent manufactured by Wako Pure Chemical Industries, Ltd.) 660 mL ·Pure water 160 mL ·Sulfuric acid 150 mL ·Glycol 30 mL

<陽極氧化處理步驟> 繼而,依照日本專利特開2007-204802號公報中記載的順序,對電解研磨處理後的鋁基板實施利用自規則化法的陽極氧化處理。 利用0.50 mol/L草酸的電解液,於電壓40 V、液溫度16℃、液流速3.0 m/min的條件下,對電解研磨處理後的鋁基板實施5小時的預陽極氧化處理。 其後,實施使預陽極氧化處理後的鋁基板於0.2 mol/L無水鉻酸、0.6 mol/L磷酸的混合水溶液(液溫:50℃)中浸漬12小時的脫膜處理。 然後,利用0.50 mol/L草酸的電解液,於電壓40 V、液溫度16℃、液流速3.0 m/min的條件的條件下,實施3小時45分鐘的再陽極氧化處理,獲得膜厚30 μm的陽極氧化膜。 再者,預陽極氧化處理及再陽極氧化處理均是陰極是設定為不鏽鋼電極,且電源使用GP0110-30R(高砂製作所股份有限公司製造)。另外,冷卻裝置是使用尼奧庫(NeoCool)BD36(大和科學(Yamato Scientific)股份有限公司製造),攪拌加溫裝置是使用派爾攪拌器(Pairstirrer)PS-100(EYELA東京理化器械股份有限公司製造)。進而,電解液的流速是使用旋渦式流量監視器FLM22-10PCW(亞速旺(As-one)股份有限公司製造)來測量。<Anodic Oxidation Treatment Step> Next, the aluminum substrate after the electrolytic polishing treatment is subjected to anodization treatment by a self-regularization method in the order described in Japanese Laid-Open Patent Publication No. 2007-204802. The aluminum substrate after electrolytic polishing was subjected to pre-anodizing treatment for 5 hours under the conditions of a voltage of 40 V, a liquid temperature of 16 ° C, and a liquid flow rate of 3.0 m/min using an electrolyte of 0.50 mol/L oxalic acid. Thereafter, a release treatment of immersing the pre-anodized aluminum substrate in a mixed aqueous solution of 0.2 mol/L of anhydrous chromic acid and 0.6 mol/L of phosphoric acid (liquid temperature: 50 ° C) for 12 hours was carried out. Then, using an electrolyte of 0.50 mol/L oxalic acid, a re-anodizing treatment was carried out for 3 hours and 45 minutes under the conditions of a voltage of 40 V, a liquid temperature of 16 ° C, and a liquid flow rate of 3.0 m/min to obtain a film thickness of 30 μm. Anodized film. Further, both the pre-anodizing treatment and the re-anodizing treatment were performed such that the cathode was set to a stainless steel electrode, and the power source was GP0110-30R (manufactured by Takasago Manufacturing Co., Ltd.). In addition, the cooling device is a NeoCool BD36 (manufactured by Yamato Scientific Co., Ltd.), and the stirring and warming device is a Piperrrer PS-100 (EYELA Tokyo Physical and Chemical Equipment Co., Ltd.). Manufacturing). Further, the flow rate of the electrolytic solution was measured using a vortex flow monitor FLM22-10PCW (manufactured by As-One Co., Ltd.).

<阻障層去除步驟> 繼而,於陽極氧化處理步驟後,使用將氫氧化銅(II)溶解於NaOH(48%)中並使用水以NaOH成為50 g/L的方式稀釋而成的鹼水溶液,實施於30℃下浸漬150秒鐘的蝕刻處理,將位於陽極氧化膜的微孔底部的阻障層去除,且於所露出的鋁基板的表面上同時使銅(金屬M1)析出。 另外,阻障層去除步驟後的陽極氧化膜的平均厚度為30 μm。<Blocking Layer Removal Step> Then, after the anodizing treatment step, an aqueous alkali solution obtained by dissolving copper (II) hydroxide in NaOH (48%) and diluting with water to 50 g/L using NaOH was used. The etching treatment was performed by immersing at 30 ° C for 150 seconds, and the barrier layer located at the bottom of the micropores of the anodized film was removed, and copper (metal M1) was simultaneously deposited on the surface of the exposed aluminum substrate. Further, the average thickness of the anodized film after the barrier layer removing step was 30 μm.

<金屬填充步驟> 繼而,以鋁基板為陰極、以鉑為正極而實施電解鍍敷處理。 具體而言,使用以下所示的組成的鎳鍍敷液,實施恆定電流電解,製作於微孔的內部填充有鎳的金屬填充微細結構體。 此處,恆定電流電解是使用山本鍍金試驗器股份有限公司公司製造的鍍敷裝置,使用北斗電工股份有限公司製造的電源(HZ-3000),於鍍敷液中進行循環伏安法確認析出電位後,於以下所示的條件下實施處理。 (鎳鍍敷液組成及條件) ·Ni(NH2 SO3 )2 ·4H2 O 1.24 mol/L ·NiCl2 ·6H2 O 0.04 mol/L ·H3 BO3 0.49 mol/L ·電流密度    1 A/dm2 ·電解液溫    40℃ ·電解時間    以成為30 μm的方式調整(於Cu板上試驗)<Metal Filling Step> Next, an electrolytic plating treatment is performed using an aluminum substrate as a cathode and platinum as a positive electrode. Specifically, constant current electrolysis was carried out using a nickel plating solution having the composition shown below, and a metal-filled fine structure in which nickel was filled in the inside of the micropores was produced. Here, the constant current electrolysis is performed by using a plating apparatus manufactured by Yamamoto Gold Plating Co., Ltd., using a power source (HZ-3000) manufactured by Hokuto Electric Co., Ltd., and performing a cyclic voltammetry to confirm the precipitation potential in the plating solution. Thereafter, the treatment was carried out under the conditions shown below. (Nickel plating composition and conditions) ·Ni(NH 2 SO 3 ) 2 ·4H 2 O 1.24 mol/L ·NiCl 2 ·6H 2 O 0.04 mol/L ·H 3 BO 3 0.49 mol/L ·Current density 1 A/dm 2 · Electrolyte temperature 40 ° C · Electrolysis time Adjust to 30 μm (test on Cu plate)

利用FE-SEM對在微孔中填充金屬後的陽極氧化膜的表面進行觀察,觀察1000個微孔中的由金屬所得的封孔的有無並算出封孔率(封孔微孔的個數/1000個),結果為98%。 另外,對在微孔中填充金屬後的陽極氧化膜利用FIB於厚度方向上進行切削加工,藉由FE-SEM對其剖面拍攝表面照片(倍率50000倍),確認微孔的內部,結果得知於經封孔的微孔中,其內部經金屬完全填充。The surface of the anodized film in which the metal was filled in the micropores was observed by FE-SEM, and the presence or absence of the sealing of the metal in the 1000 micropores was observed, and the sealing ratio (the number of the closed micropores / 1000), the result is 98%. In addition, the anodized film in which the metal was filled in the micropores was subjected to cutting in the thickness direction by FIB, and a photograph of the surface of the cross section was taken by FE-SEM (magnification: 50,000 times), and the inside of the micropores was confirmed. In the sealed micropores, the inside is completely filled with metal.

<基板去除步驟> 繼而,藉由浸漬於氯化銅/鹽酸的混合溶液中而將鋁基板溶解去除,製作平均厚度30 μm的金屬填充微細結構體。 所製作的金屬填充微細結構體中的導通路的直徑為60 nm,導通路間的間距為100 nm,導通路的密度為5770萬個/mm2<Substrate Removal Step> Then, the aluminum substrate was dissolved and removed by immersing in a mixed solution of copper chloride/hydrochloric acid to prepare a metal-filled microstructure having an average thickness of 30 μm. The diameter of the via in the fabricated metal-filled microstructure was 60 nm, the pitch between the vias was 100 nm, and the density of the vias was 57.7 million/mm 2 .

[實施例2] 將阻障層去除步驟中所用的鹼水溶液變更為「將氯化鎳溶解於NaOH(48%)中並使用水以NaOH成為50 g/L的方式稀釋而成的鹼水溶液」,且將金屬填充步驟中所用的鍍敷液變更為以下所示的組成的鋅鍍敷液,於以下所示的條件下實施鍍敷處理,除此以外,於與實施例1相同的條件下製作平均厚度30 μm的金屬填充微細結構體。 (鋅鍍敷液組成及條件) ·氫氧化鈉    100 g/L ·Zn   10 g/L ·電流密度    1 A/dm2 ·電解液溫    50℃ ·電解時間    以成為50 μm的方式調整(於Cu板上試驗)[Example 2] The aqueous alkali solution used in the barrier layer removal step was changed to "an aqueous alkali solution in which nickel chloride was dissolved in NaOH (48%) and water was diluted with NaOH to 50 g/L" In addition, the plating solution used in the metal filling step was changed to the zinc plating solution having the composition shown below, and the plating treatment was performed under the conditions shown below, except for the same conditions as in Example 1. A metal-filled microstructure having an average thickness of 30 μm was produced. (Zinc plating solution composition and conditions) · Sodium hydroxide 100 g / L · Zn 10 g / L · Current density 1 A / dm 2 · Electrolyte temperature 50 ° C · Electrolysis time is adjusted to 50 μm (in Cu Board test)

[實施例3] 將金屬填充步驟中所用的鍍敷液變更為以下所示的組成的銅鍍敷液,且於以下所示的條件下實施鍍敷處理,除此以外,於與實施例2相同的條件下製作平均厚度30 μm的金屬填充微細結構體。 (銅鍍敷液組成及條件) ·硫酸銅  100 g/L ·硫酸 50 g/L ·鹽酸      15 g/L ·溫度      25℃ ·電流密度    10 A/dm2 [Example 3] The plating solution used in the metal filling step was changed to the copper plating solution having the composition shown below, and the plating treatment was performed under the conditions shown below. A metal-filled microstructure having an average thickness of 30 μm was produced under the same conditions. (Composition and conditions of copper plating solution) · Copper sulfate 100 g / L · Sulfuric acid 50 g / L · Hydrochloric acid 15 g / L · Temperature 25 ° C · Current density 10 A / dm 2

[實施例4] 除了將阻障層去除步驟中所用的鹼水溶液變更為「將氧化鋅以成為2000 ppm的方式溶解於氫氧化鈉水溶液(50 g/l)中而成的鹼水溶液」以外,於與實施例3相同的條件下製作平均厚度30 μm的金屬填充微細結構體。[Example 4] The alkali aqueous solution used in the barrier layer removal step was changed to "an aqueous alkali solution obtained by dissolving zinc oxide in an aqueous sodium hydroxide solution (50 g/l) at 2000 ppm). A metal-filled microstructure having an average thickness of 30 μm was produced under the same conditions as in Example 3.

[實施例5] 於金屬填充步驟與基板去除步驟之間,於陽極氧化膜的未設置鋁基板之側的表面上塗佈環氧樹脂[艾比康(EPICON)(註冊商標)D-591,迪愛生(DIC)股份有限公司公司製造],形成膜厚2 μm的環氧樹脂層,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 5] Between the metal filling step and the substrate removing step, an epoxy resin [EPICON (registered trademark) D-591 was coated on the surface of the anodized film on the side where the aluminum substrate was not provided, A metal-filled microstructure was produced under the same conditions as in Example 4 except that an epoxy resin layer having a film thickness of 2 μm was formed. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例6] 於金屬填充步驟與基板去除步驟之間,於陽極氧化膜的未設置鋁基板之側的表面上塗佈可溶性聚醯亞胺(索爾比(Solpit)-6,6-PI,索爾比工業(Solpit Industries)股份有限公司製造),形成膜厚2 μm的聚醯亞胺樹脂層,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 6] Between the metal filling step and the substrate removing step, a soluble polyimine (Solpit-6,6-PI) was coated on the surface of the anodized film on the side where the aluminum substrate was not provided. A metal-filled microstructure was produced under the same conditions as in Example 4 except that a polyimine resin layer having a film thickness of 2 μm was formed by Solphi Industries Co., Ltd. (manufactured by Solpit Industries Co., Ltd.). Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例7] 於金屬填充步驟與基板去除步驟之間,於陽極氧化膜的未設置鋁基板之側的表面上塗佈環氧樹脂[艾比康(EPICON)(註冊商標)D-591,迪愛生(DIC)股份有限公司公司製造],形成膜厚20 μm的環氧樹脂層,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 7] Between the metal filling step and the substrate removing step, an epoxy resin [EPICON (registered trademark) D-591 was coated on the surface of the anodized film on the side where the aluminum substrate was not provided, A metal-filled microstructure was produced under the same conditions as in Example 4 except that an epoxy resin layer having a film thickness of 20 μm was formed. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例8] 於金屬填充步驟與基板去除步驟之間,於陽極氧化膜的未設置鋁基板之側的表面上塗佈可溶性聚醯亞胺(索爾比(Solpit)-6,6-PI,索爾比工業(Solpit Industries)股份有限公司製造),形成膜厚20 μm的聚醯亞胺樹脂層,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 8] Between the metal filling step and the substrate removing step, a soluble polyimine (Solpit-6,6-PI) was coated on the surface of the anodized film on the side where the aluminum substrate was not provided. A metal-filled microstructure was produced under the same conditions as in Example 4 except that a polyimine resin layer having a film thickness of 20 μm was formed by Solphi Industries Co., Ltd. (manufactured by Solpit Industries Co., Ltd.). Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例9] 於金屬填充步驟與基板去除步驟之間,於陽極氧化膜的未設置鋁基板之側的表面上加壓而使樹脂基材[Q-恰克(Q-Chuck)單面品H型(Type-H)(78 μm厚),丸石產業股份有限公司製造]吸附,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將樹脂基材除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 9] A resin substrate [Q-Chuck single-sided product was pressed between the metal filling step and the substrate removing step on the surface of the anodized film on the side where the aluminum substrate was not provided. A metal-filled microstructure was produced under the same conditions as in Example 4 except that H-type (Type-H) (78 μm thick) was produced by Maruza Co., Ltd. Further, the average thickness of the metal-filled fine structure excluding the resin substrate is as shown in Table 1 below.

[實施例10] 除了於金屬填充步驟與樹脂層形成步驟之間實施以下的表面金屬突出步驟以外,於與實施例9相同的條件下製作金屬填充微細結構體。再者,將樹脂基材除外的金屬填充微細結構體的平均厚度如下述表1所示。 <表面金屬突出步驟> 使金屬填充步驟後的結構體浸漬於氫氧化鈉水溶液(濃度:5質量%,液溫度:20℃)中,以突出部分的高度成為5 nm的方式調整浸漬時間,將鋁的陽極氧化膜的表面選擇性地溶解,製作使作為填充金屬的銅突出的結構體。[Example 10] A metal-filled microstructure was produced under the same conditions as in Example 9 except that the following surface metal protrusion step was carried out between the metal filling step and the resin layer forming step. Further, the average thickness of the metal-filled fine structure excluding the resin substrate is as shown in Table 1 below. <Surface metal protrusion step> The structure after the metal filling step is immersed in an aqueous sodium hydroxide solution (concentration: 5% by mass, liquid temperature: 20° C.), and the immersion time is adjusted so that the height of the protruding portion becomes 5 nm. The surface of the anodized film of aluminum is selectively dissolved, and a structure in which copper as a filler metal protrudes is produced.

[實施例11] 除了於基板去除步驟之後實施以下的背面金屬突出步驟以外,利用與實施例10相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。 <背面金屬突出步驟> 使基板去除步驟後的結構體浸漬於氫氧化鈉水溶液(濃度:5質量%,液溫度:20℃)中,以突出部分的高度成為5 nm的方式調整浸漬時間,將鋁的陽極氧化膜的表面選擇性地溶解,製作使作為填充金屬的銅突出的結構體。[Example 11] A metal-filled microstructure was produced in the same manner as in Example 10 except that the following back metal protrusion step was carried out after the substrate removal step. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below. <Back metal protruding step> The structure after the substrate removal step is immersed in an aqueous sodium hydroxide solution (concentration: 5% by mass, liquid temperature: 20° C.), and the immersion time is adjusted so that the height of the protruding portion becomes 5 nm. The surface of the anodized film of aluminum is selectively dissolved, and a structure in which copper as a filler metal protrudes is produced.

[實施例12] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為50 nm的方式調整浸漬時間,除此以外,利用與實施例11相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 12] A metal-filled microstructure was produced in the same manner as in Example 11 except that the immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 50 nm. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例13] 除了不進行樹脂層形成步驟以外,利用與實施例12相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 13] A metal-filled microstructure was produced in the same manner as in Example 12 except that the resin layer formation step was not carried out. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例14] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為200 nm的方式調整浸漬時間,除此以外,利用與實施例11相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 14] A metal-filled microstructure was produced in the same manner as in Example 11 except that the immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 200 nm. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例15] 貼附熱剝離型的帶黏著層的樹脂基材(瑞法(Revalpha)3195HS,日東電工股份有限公司製造)代替樹脂基材[Q-恰克(Q-Chuck)單面品H型(Type-H)(78 μm厚),丸石產業股份有限公司製造],除此以外,利用與實施例12相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 15] A resin substrate with a heat-peelable adhesive layer (Revalpha 3195HS, manufactured by Nitto Denko Corporation) was attached instead of a resin substrate [Q-Chuck single-sided product] A metal-filled microstructure was produced in the same manner as in Example 12 except that H-type (Type-H) (78 μm thick) was produced by Maruza Co., Ltd. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例16] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為500 nm的方式調整浸漬時間,且貼附UV剝離型的帶黏著層的樹脂基材(ELP DU-300,日東電工股份有限公司製造)代替樹脂基材[Q-恰克(Q-Chuck)單面品H型(Type-H)(78 μm厚),丸石產業股份有限公司製造],除此以外,利用與實施例11相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 16] The immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step became 500 nm, and the UV-peelable adhesive layer-attached resin substrate (ELP DU-300) was attached. , manufactured by Nitto Denko Co., Ltd.), in addition to the resin substrate [Q-Chuck, single-sided product type H (Type-H) (78 μm thick), manufactured by Maruishi Co., Ltd.], A metal-filled microstructure was produced in the same manner as in Example 11. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例17] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為500 nm的方式調整浸漬時間,除此以外,利用與實施例15相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 17] A metal-filled microstructure was produced in the same manner as in Example 15 except that the immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 500 nm. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例18] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為5000 nm的方式調整浸漬時間,除此以外,利用與實施例15相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 18] A metal-filled microstructure was produced in the same manner as in Example 15 except that the immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 5000 nm. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例19] 將陽極氧化處理步驟中的再陽極氧化處理的處理時間變更為10小時,除此以外,利用與實施例17相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 19] A metal-filled microstructure was produced in the same manner as in Example 17 except that the treatment time of the re-anodizing treatment in the anodizing treatment step was changed to 10 hours. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例20] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為200 nm的方式調整浸漬時間,且藉由網搬送來進行各處理步驟,除此以外,利用與實施例15相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 20] The immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 200 nm, and each processing step was carried out by mesh transportation, and other examples were used. The same method was used to produce a metal-filled microstructure. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例21] 將陽極氧化處理步驟中的再陽極氧化處理的處理時間變更為1小時15分鐘,除此以外,利用與實施例20相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 21] A metal-filled microstructure was produced in the same manner as in Example 20 except that the treatment time of the re-anodizing treatment in the anodizing treatment step was changed to 1 hour and 15 minutes. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[實施例22] 以表面金屬突出步驟及背面金屬突出步驟各自中的突出部分的高度成為500 nm的方式調整浸漬時間,且將陽極氧化處理步驟中的再陽極氧化處理的處理時間變更為7小時30分鐘,除此以外,利用與實施例20相同的方法製作金屬填充微細結構體。再者,將樹脂層除外的金屬填充微細結構體的平均厚度如下述表1所示。[Example 22] The immersion time was adjusted so that the height of the protruding portion in each of the surface metal protruding step and the back metal protruding step was 500 nm, and the treatment time of the re-anodizing treatment in the anodizing treatment step was changed to 7 hours. A metal-filled microstructure was produced in the same manner as in Example 20 except for the above. Further, the average thickness of the metal-filled fine structure excluding the resin layer is as shown in Table 1 below.

[比較例1] 將阻障層去除步驟中所用的鹼水溶液變更為「氫氧化鈉水溶液(50 g/l)」,且不進行基板去除步驟,除此以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,將鋁基板除外的金屬填充微細結構體的平均厚度如下述表1所示。[Comparative Example 1] The same conditions as in Example 4 were carried out except that the aqueous alkali solution used in the barrier layer removal step was changed to "aqueous sodium hydroxide solution (50 g/l)" without performing the substrate removal step. A metal-filled microstructure is fabricated underneath. Further, the average thickness of the metal-filled fine structure excluding the aluminum substrate is as shown in Table 1 below.

[比較例2] 除了將阻障層去除步驟中所用的鹼水溶液變更為「氫氧化鈉水溶液(50 g/l)」以外,於與實施例4相同的條件下製作金屬填充微細結構體。再者,金屬填充微細結構體的平均厚度如下述表1所示。[Comparative Example 2] A metal-filled microstructure was produced under the same conditions as in Example 4 except that the aqueous alkali solution used in the barrier layer removal step was changed to "aqueous sodium hydroxide (50 g/l)". Further, the average thickness of the metal-filled microstructure was as shown in Table 1 below.

[評價] 對於實施例1~實施例22及比較例1~比較例2中製作的各金屬填充微細結構體,藉由以下所示的方法評價搬送性、面內均勻性、分離性及兩面壓接性。將該些評價的結果示於下述表1中。[Evaluation] For each of the metal-filled fine structures produced in Examples 1 to 22 and Comparative Examples 1 to 2, the transportability, in-plane uniformity, separation property, and two-sided pressure were evaluated by the following methods. Connectivity. The results of these evaluations are shown in Table 1 below.

<搬送性> 對於所製作的各金屬填充微細結構體中未設置樹脂層的金屬填充微細結構體,如圖5A所示般將金屬填充微細結構體10捲繞於直徑100 mmf的橡膠製輥30上並觀察表面狀態。 另一方面,對於設有樹脂層的金屬填充微細結構體,如圖5B所示般將金屬填充微細結構體20架設於直徑100 mmf的兩根橡膠製輥30之間並使其旋轉,藉此觀察表面狀態。 再者,金屬填充微細結構體的寬度是設定為310 mm。藉由設定為310 mm,可應用於12吋晶圓以下的尺寸。 關於觀察的結果,將表面並無裂縫的狀態評價為「A」,將表面可見裂縫但於旋轉時並無脫落等的狀態評價為「B」,將表面可見裂縫、且於旋轉時可見局部脫落的狀態評價為「C」,將表面可見裂縫、且於旋轉時於過半的部分中可見脫落的狀態評價為「D」,將於設置的階段中於過半的部分中可見裂縫、且產生剝離的狀態評價為「E」。<Transportability> The metal-filled fine structure in which the resin layer is not provided in each of the produced metal-filled fine structures is wound around a rubber-made roller 30 having a diameter of 100 mmf as shown in FIG. 5A. Go up and observe the surface state. On the other hand, as shown in FIG. 5B, the metal-filled fine structure 20 is placed between the two rubber rolls 30 having a diameter of 100 mmf and rotated, as shown in FIG. 5B. Observe the surface state. Furthermore, the width of the metal-filled microstructure was set to 310 mm. By setting it to 310 mm, it can be applied to sizes below 12” wafers. As a result of the observation, the state in which the surface was not cracked was evaluated as "A", and the state in which the crack was observed on the surface but not peeled off during the rotation was evaluated as "B", and cracks were observed on the surface, and local peeling was observed at the time of rotation. The state was evaluated as "C", and a state in which cracks were observed on the surface and was observed to fall off in the half portion at the time of rotation was evaluated as "D", and cracks were observed in the half of the set stage, and peeling occurred. The status is evaluated as "E".

<面內均勻性> 於各金屬填充微細結構體的製作中,於金屬填充步驟之後立即使用FE-SEM以5萬倍的倍率於橫向上拍攝鄰接的10視場的照片,根據將未經金屬填充的微孔的個數除以總體的微孔的個數所得的值來算出未經金屬填充的微孔的個數的比例。 將未經金屬填充的微孔的比例為1%以下的情況評價為「A」,超過1%且為2%以下的情況評價為「B」,超過2%且為3%以下的情況評價為「C」,超過3%且為10%以下的情況評價為「D」。<In-Plane Uniformity> In the production of each metal-filled microstructure, an image of an adjacent 10 field of view was taken in the lateral direction at a magnification of 50,000 times using FE-SEM immediately after the metal filling step, according to the non-metal The ratio of the number of filled micropores divided by the number of the total micropores was used to calculate the ratio of the number of micropores not filled with metal. When the ratio of the micropores not filled with metal was 1% or less, it was evaluated as "A", and when it was more than 1% and 2% or less, it was evaluated as "B", and when it was more than 2% and was 3% or less, it was evaluated as "C" is evaluated as "D" when it exceeds 3% and is 10% or less.

<分離性> 對於所製作的各金屬填充微細結構體,將未形成樹脂層者、以手剝離樹脂層時並無樹脂殘留者評價為「A」,將樹脂層稍許殘留於金屬填充微細結構體上者評價為「B」,將樹脂層殘留於金屬填充微細結構體的幾乎整個面上者評價為「C」。 再者,比較例1中未進行基板去除步驟,故不評價分離性,於下述表1中表述作「-」。<Separation property> The resin-filled fine structure was prepared, and when the resin layer was not formed, when the resin layer was peeled off by hand, the resin was not evaluated as "A", and the resin layer was slightly left in the metal-filled fine structure. The upper one was evaluated as "B", and the resin layer remaining on almost the entire surface of the metal-filled microstructure was evaluated as "C". Further, in Comparative Example 1, since the substrate removal step was not performed, the separation property was not evaluated, and "-" was expressed in Table 1 below.

<兩面壓接性> 準備華爾茲(WALTS)公司製造的測試元件組(Test Element Group,TEG)晶片(菊鏈圖案(daisy chain pattern))及內插器(interposer),將該些構件設置於晶片固持器(chip holder)的上下,預先調整配向(alignment)。 於配向調整後,於設置於下側的內插器的Cu柱(post)側,重合所製作的各金屬填充微細結構體(具有樹脂層的情況下為將樹脂層去除後的金屬填充微細結構體),使用常溫接合裝置(WP-100,PMT公司製造)於250℃、1分鐘、6 MPa的條件下加熱壓接,進行接合。 對於接合後的樣本,使用萬能型黏結強度試驗機(Bond tester)(達格(DAGE)4000,達格(Dage)公司製造),對TEG晶片施加負荷並測定剝離強度。 其結果,將剝離強度為20 N以上的情況評價為「S」,15 N以上且小於20 N的情況評價為「A」,10 N以上且小於15 N的情況評價為「B」,2 N以上且小於10 N的情況評價為「C」,小於2 N的情況評價為「D」。<Two-sided crimpability> A test element group (TEG) wafer (daisy chain pattern) and an interposer manufactured by WALTS were prepared, and the components were placed on the wafer. The alignment of the chip holder is adjusted in advance. After the alignment adjustment, the metal-filled fine structures produced by the interposing on the Cu column side of the interposer provided on the lower side (when the resin layer is provided, the metal-filled fine structure after removing the resin layer) The mixture was heated and pressure-bonded at 250 ° C, 1 minute, and 6 MPa using a room temperature bonding apparatus (WP-100, manufactured by PMT Corporation) to bond. For the bonded samples, a bond tester (DAGE 4000, manufactured by Dage Co., Ltd.) was used, and a load was applied to the TEG wafer to measure the peel strength. As a result, the case where the peeling strength was 20 N or more was evaluated as "S", the case of 15 N or more and less than 20 N was evaluated as "A", and the case of 10 N or more and less than 15 N was evaluated as "B", 2 N. The case where the above is less than 10 N is evaluated as "C", and the case where it is less than 2 N is evaluated as "D".

[表1] ※金屬填充微細結構體的厚度表示將樹脂層•基板除外的厚度。[Table 1] * The thickness of the metal-filled microstructure is the thickness excluding the resin layer and the substrate.

由表1所示的結果得知,於使用不含氫過電壓高於鋁的金屬M1的鹼水溶液進行阻障層去除步驟的情形時,無論有無基板去除步驟,填充至微孔內的金屬的面內均勻性均差(比較例1及比較例2)。From the results shown in Table 1, when the barrier layer removal step was carried out using an aqueous alkali solution containing no metal M1 having a hydrogen overvoltage higher than aluminum, the metal filled in the micropores was filled with or without the substrate removal step. The in-plane uniformity was poor (Comparative Example 1 and Comparative Example 2).

相對於此,得知於使用含有氫過電壓高於鋁的金屬的鹼水溶液實施阻障層去除步驟的情形時,填充至微孔內的金屬的面內均勻性均變良好(實施例1~實施例22)。 尤其由實施例1~實施例4的對比得知,若阻障層去除步驟中所用的金屬M1為離子化傾向高於金屬填充步驟中所用的金屬M2的金屬,則填充至微孔內的金屬的面內均勻性變得更良好。 另外,由實施例4與實施例5~實施例9的對比得知,於具有樹脂層的情形時,搬送性變良好。On the other hand, when the barrier layer removal step is performed using an aqueous alkali solution containing a metal having a hydrogen overvoltage higher than aluminum, it is known that the in-plane uniformity of the metal filled in the micropores is good (Example 1 to Example 22). In particular, from the comparison of Examples 1 to 4, if the metal M1 used in the barrier layer removing step is a metal having a higher ionization tendency than the metal M2 used in the metal filling step, the metal filled in the micropores is filled. The in-plane uniformity becomes better. Further, from the comparison between Example 4 and Examples 5 to 9, it is found that when the resin layer is provided, the conveyability is improved.

1‧‧‧鋁基板
2‧‧‧微孔
3‧‧‧阻障層
4‧‧‧陽極氧化膜
5a‧‧‧金屬M1
5b‧‧‧金屬M2
5‧‧‧金屬
7‧‧‧樹脂層
10、20‧‧‧金屬填充微細結構體
21‧‧‧卷芯
30‧‧‧橡膠製輥
1‧‧‧Aluminum substrate
2‧‧‧Micropores
3‧‧‧Barrier layer
4‧‧‧Anodized film
5a‧‧‧Metal M1
5b‧‧‧Metal M2
5‧‧‧Metal
7‧‧‧ resin layer
10, 20‧‧‧Metal filled fine structure
21‧‧‧Volume core
30‧‧‧Rubber roll

圖1A為用以說明本發明的金屬填充微細結構體的製造方法的一例(第1態樣)的示意性剖面圖中,表示實施陽極氧化處理的鋁基板的示意性剖面圖。 圖1B為用以說明本發明的金屬填充微細結構體的製造方法的一例(第1態樣)的示意性剖面圖中,表示陽極氧化處理步驟後的狀態的示意性剖面圖。 圖1C為用以說明本發明的金屬填充微細結構體的製造方法的一例(第1態樣)的示意性剖面圖中,表示阻障層去除步驟後的狀態的示意性剖面圖。 圖1D為用以說明本發明的金屬填充微細結構體的製造方法的一例(第1態樣)的示意性剖面圖中,表示金屬填充步驟後的狀態的示意性剖面圖。 圖1E為用以說明本發明的金屬填充微細結構體的製造方法的一例(第1態樣)的示意性剖面圖中,表示基板去除步驟後的狀態的示意性剖面圖。 圖2A為用以說明本發明的金屬填充微細結構體的製造方法的另一例(第2態樣)的示意性剖面圖中,表示實施陽極氧化處理的鋁基板的示意性剖面圖。 圖2B為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示陽極氧化處理步驟後的狀態的示意性剖面圖。 圖2C為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示阻障層去除步驟後的狀態的示意性剖面圖。 圖2D為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示金屬填充步驟後的狀態的示意性剖面圖。 圖2E為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示表面金屬突出步驟後的狀態的示意性剖面圖。 圖2F為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示基板去除步驟後的狀態的示意性剖面圖。 圖2G為用以說明本發明的金屬填充微細結構體的製造方法的一例(第2態樣)的示意性剖面圖中,表示背面金屬突出步驟後的狀態的示意性剖面圖。 圖3A為用以說明本發明的金屬填充微細結構體的製造方法的另一例(第3態樣)的示意性剖面圖中,表示實施陽極氧化處理的鋁基板的示意性剖面圖。 圖3B為用以說明本發明的金屬填充微細結構體的製造方法的一例(第3態樣)的示意性剖面圖中,表示陽極氧化處理步驟後的狀態的示意性剖面圖。 圖3C為用以說明本發明的金屬填充微細結構體的製造方法的一例(第3態樣)的示意性剖面圖中,表示阻障層去除步驟後的狀態的示意性剖面圖。 圖3D為用以說明本發明的金屬填充微細結構體的製造方法的一例(第3態樣)的示意性剖面圖中,表示金屬填充步驟後的狀態的示意性剖面圖。 圖3E為用以說明本發明的金屬填充微細結構體的製造方法的一例(第3態樣)的示意性剖面圖中,表示樹脂層形成步驟後的狀態的示意性剖面圖。 圖3F為用以說明本發明的金屬填充微細結構體的製造方法的一例(第3態樣)的示意性剖面圖中,表示基板去除步驟後的狀態的示意性剖面圖。 圖4為對利用本發明的金屬填充微細結構體的製造方法所製作的金屬填充微細結構體的供給形態的一例進行說明的示意圖。 圖5A為用以說明搬送性的評價中所用的試驗體的示意圖。 圖5B為用以說明搬送性的評價中所用的試驗體的示意圖。1A is a schematic cross-sectional view showing an example of a method for producing a metal-filled microstructure according to the present invention (a first aspect), and is a schematic cross-sectional view showing an aluminum substrate subjected to anodization. 1B is a schematic cross-sectional view showing a state after the anodizing treatment step in a schematic cross-sectional view showing an example (first aspect) of a method for producing a metal-filled microstructure according to the present invention. 1C is a schematic cross-sectional view showing a state after the step of removing the barrier layer in a schematic cross-sectional view showing an example (first aspect) of the method for producing the metal-filled microstructure according to the present invention. 1D is a schematic cross-sectional view showing a state after a metal filling step in a schematic cross-sectional view showing an example (first aspect) of a method for producing a metal-filled microstructure according to the present invention. 1E is a schematic cross-sectional view showing a state after a substrate removal step in a schematic cross-sectional view showing an example (first aspect) of a method for producing a metal-filled microstructure according to the present invention. 2A is a schematic cross-sectional view showing another example (second aspect) of the method for producing a metal-filled microstructure according to the present invention, and shows an aluminum substrate subjected to anodization. 2B is a schematic cross-sectional view showing a state after the anodizing treatment step in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 2C is a schematic cross-sectional view showing a state after the step of removing the barrier layer in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 2D is a schematic cross-sectional view showing a state after the metal filling step in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 2E is a schematic cross-sectional view showing a state after the surface metal protruding step in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 2F is a schematic cross-sectional view showing a state after the substrate removal step in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 2G is a schematic cross-sectional view showing a state after the back metal protruding step in a schematic cross-sectional view showing an example (second aspect) of the method for producing the metal-filled microstructure according to the present invention. 3A is a schematic cross-sectional view showing another example (third aspect) of the method for producing a metal-filled microstructure according to the present invention, and shows an aluminum substrate subjected to anodization. 3B is a schematic cross-sectional view showing a state after the anodizing treatment step in a schematic cross-sectional view showing an example (third aspect) of the method for producing the metal-filled microstructure according to the present invention. 3C is a schematic cross-sectional view showing a state after the step of removing the barrier layer in a schematic cross-sectional view showing an example (third aspect) of the method for producing the metal-filled microstructure according to the present invention. 3D is a schematic cross-sectional view showing a state after the metal filling step in a schematic cross-sectional view for explaining an example (third aspect) of the method for producing the metal-filled microstructure according to the present invention. 3E is a schematic cross-sectional view showing a state after the resin layer forming step in a schematic cross-sectional view showing an example (third aspect) of the method for producing the metal-filled microstructure according to the present invention. 3F is a schematic cross-sectional view showing a state after the substrate removal step in the schematic cross-sectional view for explaining an example (third aspect) of the method for producing the metal-filled microstructure according to the present invention. FIG. 4 is a schematic view for explaining an example of a supply form of the metal-filled fine structure produced by the method for producing a metal-filled microstructure according to the present invention. Fig. 5A is a schematic view for explaining a test body used for evaluation of conveyance. Fig. 5B is a schematic view for explaining a test body used for evaluation of conveyability.

1‧‧‧鋁基板 1‧‧‧Aluminum substrate

2‧‧‧微孔 2‧‧‧Micropores

3‧‧‧阻障層 3‧‧‧Barrier layer

4‧‧‧陽極氧化膜 4‧‧‧Anodized film

5a‧‧‧金屬M1 5a‧‧‧Metal M1

5b‧‧‧金屬M2 5b‧‧‧Metal M2

5‧‧‧金屬 5‧‧‧Metal

10‧‧‧金屬填充微細結構體 10‧‧‧Metal filled fine structure

Claims (13)

一種金屬填充微細結構體的製造方法,包括以下步驟: 陽極氧化處理步驟,對鋁基板的單側的表面實施陽極氧化處理,於所述鋁基板的單側的表面上形成陽極氧化膜,其中所述陽極氧化膜具有存在於厚度方向上的微孔及存在於所述微孔的底部的阻障層; 阻障層去除步驟,於所述陽極氧化處理步驟之後,使用含有氫過電壓高於鋁的金屬M1的鹼水溶液將所述陽極氧化膜的所述阻障層去除; 金屬填充步驟,於所述阻障層去除步驟之後,實施電解鍍敷處理而於所述微孔的內部填充金屬M2;以及 基板去除步驟,於所述金屬填充步驟之後,將所述鋁基板去除而獲得金屬填充微細結構體。A method for manufacturing a metal-filled microstructure includes the following steps: an anodizing treatment step of anodizing a surface of one side of an aluminum substrate to form an anodized film on a surface of one side of the aluminum substrate, wherein The anodic oxide film has micropores present in a thickness direction and a barrier layer present at a bottom of the micropores; a barrier layer removing step, after the anodizing treatment step, using a hydrogen overvoltage higher than aluminum An alkali aqueous solution of the metal M1 removes the barrier layer of the anodized film; a metal filling step, after the barrier layer removing step, performing an electrolytic plating process to fill the inside of the micropore with a metal M2 And a substrate removing step of removing the aluminum substrate to obtain a metal-filled microstructure after the metal filling step. 如申請專利範圍第1項所述的金屬填充微細結構體的製造方法,其中所述阻障層去除步驟中所用的所述金屬M1為離子化傾向高於所述金屬填充步驟中所用的所述金屬M2的金屬。The method for producing a metal-filled microstructure according to claim 1, wherein the metal M1 used in the barrier layer removal step has a higher ionization tendency than that used in the metal filling step. Metal of metal M2. 如申請專利範圍第1項或第2項所述的金屬填充微細結構體的製造方法,其中於所述金屬填充步驟之後且於所述基板去除步驟之前, 包括表面金屬突出步驟,將所述陽極氧化膜的未設置所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出。The method for producing a metal-filled microstructure according to claim 1 or 2, wherein after the metal filling step and before the substrate removing step, a surface metal protruding step is included, the anode is The surface of the oxide film on the side where the aluminum substrate is not provided is partially removed in the thickness direction, so that the metal M2 filled in the metal filling step is more prominent than the surface of the anodized film. 如申請專利範圍第1項或第2項所述的金屬填充微細結構體的製造方法,其中於所述基板去除步驟之後, 包括背面金屬突出步驟,將所述陽極氧化膜的設有所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出。The method for producing a metal-filled microstructure according to claim 1 or 2, wherein after the substrate removing step, including a back metal protruding step, the anodized film is provided with the aluminum The surface on the side of the substrate is partially removed in the thickness direction, so that the metal M2 filled in the metal filling step is more prominent than the surface of the anodized film. 如申請專利範圍第3項所述的金屬填充微細結構體的製造方法,其中於所述基板去除步驟之後, 包括背面金屬突出步驟,將所述陽極氧化膜的設有所述鋁基板之側的表面於厚度方向上局部去除,使所述金屬填充步驟中填充的所述金屬M2較所述陽極氧化膜的表面而更為突出。The method for producing a metal-filled microstructure according to claim 3, wherein after the substrate removing step, a back metal protruding step is included, and the side of the anodized film on which the aluminum substrate is provided The surface is partially removed in the thickness direction such that the metal M2 filled in the metal filling step is more prominent than the surface of the anodized film. 如申請專利範圍第3項所述的金屬填充微細結構體的製造方法,其中所述表面金屬突出步驟為使所述金屬M2較所述陽極氧化膜的表面突出10 nm~1000 nm的步驟。The method for producing a metal-filled microstructure according to claim 3, wherein the surface metal protruding step is a step of causing the metal M2 to protrude from the surface of the anodized film by 10 nm to 1000 nm. 如申請專利範圍第4項所述的金屬填充微細結構體的製造方法,其中所述背面金屬突出步驟為使所述金屬M2較所述陽極氧化膜的表面突出10 nm~1000 nm的步驟。The method for producing a metal-filled microstructure according to claim 4, wherein the back metal protrusion step is a step of causing the metal M2 to protrude from the surface of the anodized film by 10 nm to 1000 nm. 如申請專利範圍第5項所述的金屬填充微細結構體的製造方法,其中所述表面金屬突出步驟及所述背面金屬突出步驟的至少一個步驟為使所述金屬M2較所述陽極氧化膜的表面突出10 nm~1000 nm的步驟。The method for producing a metal-filled microstructure according to claim 5, wherein the surface metal protruding step and the back metal protruding step are at least one step of making the metal M2 smaller than the anodized film. The surface protrudes from 10 nm to 1000 nm. 如申請專利範圍第1項或第2項所述的金屬填充微細結構體的製造方法,其中於所述金屬填充步驟之後且於所述基板去除步驟之前, 包括樹脂層形成步驟,於所述陽極氧化膜的未設置所述鋁基板之側的表面上設置樹脂層。The method for producing a metal-filled microstructure according to claim 1 or 2, wherein after the metal filling step and before the substrate removing step, a resin layer forming step is included in the anode A resin layer is provided on the surface of the oxide film on the side where the aluminum substrate is not provided. 如申請專利範圍第9項所述的金屬填充微細結構體的製造方法,其中所述樹脂層為可剝離的附黏著層的膜。The method for producing a metal-filled microstructure according to claim 9, wherein the resin layer is a peelable adhesive layer-attached film. 如申請專利範圍第9項所述的金屬填充微細結構體的製造方法,其中所述樹脂層為藉由加熱處理或紫外線曝光處理而使黏著性變弱、變得可剝離的附黏著層的膜。The method for producing a metal-filled microstructure according to claim 9, wherein the resin layer is a film having an adhesive layer which is weakened by adhesion by heat treatment or ultraviolet exposure treatment and which is peelable. . 如申請專利範圍第9項所述的金屬填充微細結構體的製造方法,其中藉由所述陽極氧化處理步驟所形成的陽極氧化膜的平均厚度成為30 μm以下。The method for producing a metal-filled microstructure according to claim 9, wherein the anodized film formed by the anodizing treatment step has an average thickness of 30 μm or less. 如申請專利範圍第9項所述的金屬填充微細結構體的製造方法,其中於所述基板去除步驟之後,包括捲取步驟,將金屬填充微細結構體以具有所述樹脂層的狀態捲取成捲筒狀。The method for producing a metal-filled microstructure according to claim 9, wherein after the substrate removing step, the winding step is performed, and the metal-filled microstructure is wound up in a state having the resin layer. Rolled.
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