TW201547139A - Contact pin unit and electric components using the same - Google Patents
Contact pin unit and electric components using the same Download PDFInfo
- Publication number
- TW201547139A TW201547139A TW104110179A TW104110179A TW201547139A TW 201547139 A TW201547139 A TW 201547139A TW 104110179 A TW104110179 A TW 104110179A TW 104110179 A TW104110179 A TW 104110179A TW 201547139 A TW201547139 A TW 201547139A
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- Prior art keywords
- contact
- frame
- contact leg
- laminated
- socket
- Prior art date
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- 238000003475 lamination Methods 0.000 claims abstract description 43
- 239000000758 substrate Substances 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 8
- 238000000465 moulding Methods 0.000 claims description 5
- 238000013461 design Methods 0.000 description 18
- 230000017525 heat dissipation Effects 0.000 description 8
- 230000006835 compression Effects 0.000 description 7
- 238000007906 compression Methods 0.000 description 7
- 238000003780 insertion Methods 0.000 description 5
- 230000037431 insertion Effects 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000000149 penetrating effect Effects 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005304 joining Methods 0.000 description 3
- 238000010030 laminating Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 2
- 230000005489 elastic deformation Effects 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005381 potential energy Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/716—Coupling device provided on the PCB
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
- H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10325—Sockets, i.e. female type connectors comprising metallic connector elements integrated in, or bonded to a common dielectric support
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/167—Using mechanical means for positioning, alignment or registration, e.g. using rod-in-hole alignment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Connecting Device With Holders (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
本發明係關於一種可拆卸地容置IC封裝等之電子零件、並藉由接觸腳而將電子零件與電路基板電性連接之接觸腳單元;以及關於一種使用它之電子零件用插座。The present invention relates to a contact foot unit that detachably houses an electronic component such as an IC package and electrically connects the electronic component and the circuit substrate by contact with a foot; and a socket for an electronic component using the same.
向來,例如,在可拆卸地容置IC封裝等之電子零件而裝設於電路基板上之IC插座中,配列有構成IC封裝的容置部、並用以使一端接觸於IC封裝而其他端接觸於電路基板之接觸腳,而且配設有用以使IC封裝與電路基板電性連接之接觸腳單元。For example, in an IC socket that is detachably housed in an electronic component such as an IC package and mounted on a circuit board, a housing portion constituting the IC package is disposed, and one end is in contact with the IC package and the other end is in contact with The contact leg of the circuit board is provided with a contact leg unit for electrically connecting the IC package and the circuit board.
關於此類的接觸腳單元,已提案使用一種將由沿著板體的表面橫切板體的複數條溝予以平行形成而成之所謂的洗濯板狀的接觸腳框架,在沿著該溝內配置的接觸腳之一端及其他端為往板體的外側突出的狀態下,積層於板厚方向而成之物,來充當接觸腳單元(例如,參照專利文獻1)。 《先前技術文獻》 <專利文獻>With regard to such a contact leg unit, it has been proposed to use a so-called wash-plate-shaped contact foot frame in which a plurality of grooves which are transversely cut along the surface of the plate body are formed in parallel, and are arranged along the groove. The one end and the other end of the contact leg are formed by laminating in the direction of the plate thickness in a state of protruding toward the outer side of the plate body to serve as a contact leg unit (for example, refer to Patent Document 1). "Prior Technical Literature" <Patent Literature>
<專利文獻1>特開2012-89389號公報<Patent Document 1> JP-A-2012-89389
《發明所欲解決之課題》"The subject to be solved by the invention"
然而,在接觸腳框架的積層方向中之接觸腳單元的尺寸超過設計値的情況下,由於即使於積層方向壓縮接觸腳單元,在相鄰接的接觸腳框架間也沒有設置積層方向之壓縮替代品,因而就難以藉由壓縮來進行尺寸調整使達到設計値。However, in the case where the size of the contact leg unit in the lamination direction of the contact foot frame exceeds the design flaw, since the contact pin unit is compressed even in the lamination direction, no compression direction of the lamination direction is provided between the adjacent contact foot frames. Therefore, it is difficult to adjust the size by compression to achieve design flaws.
因此,雖然想要對於使接觸腳框架成型用的模具實施微修正來進行尺寸調整,然而在對於修正後的模具內成型的接觸腳框架進行積層時,若接觸腳單元的積層方向中之尺寸為偏離設計値的話,則就不得不再度進行模具之微修正,以致就會有接觸腳單元的尺寸調整變煩雜之虞。Therefore, although it is desired to perform micro-correction for the mold for molding the contact-foot frame to perform dimensional adjustment, when the contact-foot frame formed in the modified mold is laminated, the size in the lamination direction of the contact-foot unit is If you deviate from the design, you will have to re-correct the mold, so that the size adjustment of the contact unit will become more complicated.
是故,本發明之目的在於提供一種可處理解決諸如此類的問題點,並可提高積層方向之尺寸調整的容易性之接觸腳單元及使用它之電子零件用插座。 《用以解決課題之方法》In view of the above, it is an object of the present invention to provide a contact pin unit which can solve such problems and solve the problem of sizing of the lamination direction, and a socket for an electronic component using the same. "Methods for Solving Problems"
為了解決前述課題,根據本發明之接觸腳單元係以可拆卸地容置電子零件、並能電性連接電子零件與電路基板為前提,而且由包括接觸腳與接觸腳框架所構成;該接觸腳之一端為與電子零件接觸而其他端為與電路基板接觸;該接觸腳框架為由沿著板體的表面平行形成複數條溝而成,接觸腳為沿著溝內配置,於其一端及他端為往板體的外側突出之狀態下被積層於板厚方向;在積層狀態下,在相鄰接的接觸腳框架為抵接於積層方向之抵接面的至少一側的一部分上,形成有微小凸部;該微小凸部為能在被積層的接觸腳框架於積層方向壓縮時產生變形之物體。In order to solve the above problems, the contact foot unit according to the present invention is premised on detachably accommodating electronic components and electrically connecting the electronic components and the circuit substrate, and is composed of a contact foot and a contact foot frame; One end is in contact with the electronic component and the other end is in contact with the circuit substrate; the contact leg frame is formed by forming a plurality of grooves parallel along the surface of the plate body, and the contact leg is disposed along the groove, at one end thereof and The end is laminated in the plate thickness direction in a state of protruding toward the outer side of the plate body; and in the laminated state, the adjacent contact leg frame is formed on at least a part of the abutting surface of the abutting direction in the lamination direction. There is a small convex portion which is an object which can be deformed when the laminated contact foot frame is compressed in the lamination direction.
再者,根據本發明之電子零件用插座為由包括以下所構成之物體:配設有如上述之類的接觸腳單元之插座本體、可轉動地軸支撐於插座本體上之插座蓋體、可轉動地軸支撐於插座蓋體上、且在插座蓋體關閉的狀態下,可按壓被容置於接觸腳單元電子零件之散熱構件、及可使插座蓋體保持於關閉狀態之鎖閂構件。 《發明效果》Furthermore, the socket for an electronic component according to the present invention is an object including the following: a socket body provided with a contact foot unit as described above, a socket cover rotatably supported on the socket body, and a rotatable shaft Supported on the socket cover and in a state in which the socket cover is closed, the heat dissipating member accommodated in the electronic component of the contact leg unit and the latch member capable of holding the socket cover in the closed state can be pressed. Invention effect
根據本發明之接觸腳單元及電子零件用插座,能夠更為容易地對在接觸腳框架的積層方向中之接觸腳單元進行尺寸調整。According to the contact leg unit and the socket for an electronic component of the present invention, the contact leg unit in the lamination direction of the contact leg frame can be more easily sized.
以下,參照添附的圖面,針對用以實施本發明的實施形態來詳細敘述之。 圖1~圖5為顯示與本實施形態相關之電子零件用插座的一例子。Hereinafter, the embodiments for carrying out the invention will be described in detail with reference to the attached drawings. Fig. 1 to Fig. 5 show an example of a socket for an electronic component according to the embodiment.
電子零件用插座係容置用來充當電子零件的IC(Integrated Circuit)封裝100、並且配置於電路基板200上而用來使IC封裝100與電路基板200之間形成電性連接;例如,用於進行老化試驗(burn-in testing)等之性能試驗的IC插座10。The socket for an electronic component is housed in an IC (Integrated Circuit) package 100 for use as an electronic component, and is disposed on the circuit substrate 200 for electrically connecting the IC package 100 and the circuit substrate 200; for example, for An IC socket 10 that performs a performance test such as burn-in testing.
IC插座10係具備有:可容置IC封裝100之插座本體12、可開關自如地裝設於插座本體12、經由散熱構件14按壓IC封裝100之插座蓋體16、及使插座蓋體16保持於關閉的狀態(以下,稱為「關閉狀態」)之鎖固機構18;能夠使於插座本體12所容置的IC封裝100抵接於散熱構件14而使IC封裝100散熱。The IC socket 10 includes a socket body 12 that can accommodate the IC package 100, is detachably mounted to the socket body 12, presses the socket cover 16 of the IC package 100 via the heat dissipation member 14, and holds the socket cover 16 The locking mechanism 18 in a closed state (hereinafter referred to as a "closed state") can abut the heat sink member 14 with the IC package 100 housed in the socket body 12 to dissipate heat from the IC package 100.
另外,在以下的說明之中,於插座本體12所容置的IC封裝100,如圖20所示,其係在俯視觀察時呈約略正方形的封裝本體的底面100a上,具有半球狀端子100b被複數配列成m行×n列的陣列狀(m、n為除了0以外之自然數)之BGA(Ball Grid Array)型IC封裝。In the following description, the IC package 100 housed in the socket body 12 is formed on the bottom surface 100a of the package body which is approximately square in plan view as shown in FIG. 20, and has a hemispherical terminal 100b. A BGA (Ball Grid Array) type IC package in which an array of m rows × n columns (m, n is a natural number other than 0) is arranged in plural.
插座本體12係在俯視觀察時構成為約略矩形狀,在一側端部12a上設置有第1轉動軸X1,而在其他側端部12b設置有與第1轉動軸X1平行的第2轉動軸X2。The socket main body 12 is formed in a substantially rectangular shape in a plan view, and the first rotation axis X1 is provided on one end portion 12a, and the second rotation axis parallel to the first rotation axis X1 is provided on the other side end portion 12b. X2.
插座蓋體16為約略四方形狀的框體,以框體的一邊做為插座蓋體16的基端部16a,該基端部16a為可轉動地軸支撐於插座本體12的第1轉動軸X1,並構成為:當從圖2的虛線的狀態起轉動時,與基端部16a之一邊相對的對邊之插座蓋體16的前端部16b為與後述之鎖閂構件卡止。The socket cover 16 is a frame having a substantially square shape, and one side of the frame is a base end portion 16a of the socket cover 16, and the base end portion 16a is rotatably supported by the first rotation axis X1 of the socket body 12, Further, when rotated from the state of the broken line in Fig. 2, the distal end portion 16b of the opposite socket cover 16 facing the one side of the proximal end portion 16a is locked to a latch member to be described later.
又,插座蓋體16係具有以框體包圍在關閉狀態下按壓IC封裝100之前述的散熱構件14而形成的空間;散熱構件14係經由與第1轉動軸X1平行設置的第3的轉動軸X3而可轉動地軸支撐於插座蓋體16上,並在插座蓋體16關閉的情況,以均一的壓力按壓IC封裝100的上面。藉此,施加於IC封裝100之壓力分布的偏差就得以減低,並且得以將從IC封裝100產生的熱以良好的效率傳達到散熱構件14。散熱構件14主要是將被傳達到之熱從主散熱鰭片14a往空氣中散熱。Further, the socket cover 16 has a space formed by pressing the heat dissipation member 14 of the IC package 100 in a closed state in a closed state, and the heat dissipation member 14 is connected via a third rotation axis provided in parallel with the first rotation axis X1. The X3 is rotatably supported on the socket cover 16 and pressed against the upper surface of the IC package 100 with a uniform pressure when the socket cover 16 is closed. Thereby, the deviation of the pressure distribution applied to the IC package 100 is reduced, and the heat generated from the IC package 100 is transmitted to the heat radiating member 14 with good efficiency. The heat dissipating member 14 mainly radiates heat from the main fins 14a to the air.
在鎖固機構18上為於插座本體12的其他側端部12b中包括有:鎖閂構件20與約略コ字形狀的曲柄桿(lever)構件22;該鎖閂構件20為設置用來對從遠離插座本體12離開的方向附加勢能、並能與插座蓋體16的前端部16b卡止;該曲柄桿構件22為因被轉動,經由省略圖式的凸輪機構而使得鎖閂構件20往接近插座本體12的方向移動。鎖固機構18係構成為:藉由在插座蓋體16的前端部16b被鎖閂構件20卡止的狀態下,使曲柄桿構件22從圖2的虛線的狀態起轉動,進而傾倒直到相對於插座本體12呈約略平行為止,使鎖閂構件20接近插座本體12的方式移動,進而使得散熱構件14透過前端部16b被鎖閂構件20卡止的插座蓋體16而按壓IC封裝100;並且在該按壓狀態下成為限制曲柄桿構件22的動作之鎖固狀態。The locking mechanism 18 includes, in the other side end portions 12b of the socket body 12, a latch member 20 and a crank member 22 of a substantially U-shaped shape; the latch member 20 is provided for facing the slave The potential energy is added away from the direction in which the socket body 12 is away, and can be locked with the front end portion 16b of the socket cover 16; the crank lever member 22 is rotated, and the latch member 20 is brought close to the socket via the cam mechanism of the omitted figure. The direction of the body 12 moves. The lock mechanism 18 is configured such that the crank lever member 22 is rotated from the state of the broken line of FIG. 2 in a state where the front end portion 16b of the socket cover 16 is locked by the latch member 20, and is tilted until it is opposed to The socket body 12 is approximately parallel, and moves the latch member 20 in proximity to the socket body 12, thereby causing the heat dissipation member 14 to press the IC package 100 through the socket cover 16 whose front end portion 16b is locked by the latch member 20; In the pressed state, the lock state of the operation of the crank lever member 22 is restricted.
在插座本體12上於中央部形成有在俯視觀察時貫穿到底部之凹陷部12c,且在該凹陷部12c上配設有接觸腳單元24。接觸腳單元24係在插座本體12中,用來構成可拆卸地容置IC封裝100之容置部,並且用來構成使IC封裝100與電路基板200形成電性連接之連接部之物體。A recess portion 12c penetrating to the bottom portion in a plan view is formed in the socket body 12, and a contact leg unit 24 is disposed on the recess portion 12c. The contact leg unit 24 is formed in the socket body 12 to constitute an accommodating portion for accommodating the IC package 100, and is configured to constitute an object for electrically connecting the IC package 100 and the circuit substrate 200.
圖6~圖13為顯示接觸腳單元24的內容。 接觸腳單元24為具備有:具有複數個接觸腳26之單元本體28、及可裝設於單元本體28並從底面100a側容置IC封裝100之浮動板34。6 to 13 show the contents of the contact foot unit 24. The contact leg unit 24 includes a unit body 28 having a plurality of contact legs 26, and a floating plate 34 that can be mounted on the unit body 28 and that houses the IC package 100 from the bottom surface 100a side.
浮動板34為如圖8所示,可經由間插在單元本體28與浮動板34之間的彈性構件24a,而於單元本體28離開的方向被附加勢能。又,在浮動板34上形成有:被配設在單元本體28上之複數個接觸腳26的一端(後述第1接觸部)為從單元本體28側向著IC封裝100的底面100a側貫穿之接腳貫穿孔34a。此外,在浮動板34上係裝設有可導引IC封裝100的各角落之引導構件34b,藉以決定被容置於浮動板34上之IC封裝100的底面100a中之半球狀端子100b在接腳貫穿孔34a上的適當位置。The floating plate 34 is as shown in FIG. 8, and can be biased in the direction in which the unit body 28 is separated via the elastic member 24a interposed between the unit body 28 and the floating plate 34. Further, the floating plate 34 is formed with one end (a first contact portion to be described later) of the plurality of contact legs 26 disposed on the unit main body 28 so as to penetrate from the unit main body 28 side toward the bottom surface 100a side of the IC package 100. The foot penetrates the hole 34a. In addition, a guiding member 34b for guiding each corner of the IC package 100 is attached to the floating plate 34, thereby determining that the hemispherical terminal 100b in the bottom surface 100a of the IC package 100 accommodated on the floating plate 34 is connected. The foot passes through the appropriate position on the hole 34a.
單元本體28係具備有接觸腳26、及可供接觸腳26配列之接觸腳框架36,該接觸腳26之一端為與被容置在浮動板34上之IC封裝100的底面100a中之半球狀端子100b接觸,而其他端為與電路基板200的電極部接觸,進而使IC封裝100與電路基板200形成電性連接。The unit body 28 is provided with a contact leg 26 and a contact leg frame 36 for arranging the contact leg 26, and one end of the contact leg 26 is hemispherical in the bottom surface 100a of the IC package 100 housed on the floating plate 34. The terminal 100b is in contact with each other, and the other end is in contact with the electrode portion of the circuit board 200, thereby electrically connecting the IC package 100 and the circuit board 200.
接觸腳26係具有:可與IC封裝100的半球狀端子100b接觸之第1接觸部26a、可與電路基板200的電極部(省略圖式)接觸之第2接觸部26b、以及在兩接觸部之間被彎曲成例如S字狀的彈簧部26c。彈簧部26c係形成為:在第1接觸部26a為與半球狀端子100b接觸、而第2接觸部26b為與電路基板200的電極部接觸之狀態下,抵抗附加勢能力而將浮動板34按壓於單元本體28側時,因第1接觸部26a與第2接觸部26b之間所施加的壓縮力而產生彈性變形,藉以縮短第1接觸部26a與第2接觸部26b之距離。The contact leg 26 has a first contact portion 26a that can be in contact with the hemispherical terminal 100b of the IC package 100, a second contact portion 26b that can contact the electrode portion (not shown) of the circuit board 200, and two contact portions. The spring portion 26c is bent into, for example, an S-shape. The spring portion 26c is formed such that the first contact portion 26a is in contact with the hemispherical terminal 100b and the second contact portion 26b is in contact with the electrode portion of the circuit board 200, and the floating plate 34 is pressed against the additional potential. At the unit main body 28 side, elastic deformation occurs due to a compressive force applied between the first contact portion 26a and the second contact portion 26b, thereby shortening the distance between the first contact portion 26a and the second contact portion 26b.
接觸腳框架36係為由沿著板體的表面36a橫切板體之複數條溝36b平行形成所構成,即所謂的一種洗濯板狀之板體。例如,在接觸腳框架36為約略矩形狀的平板之情況,在平板的表面36a之中,由從一邊起延伸到相對向的對邊為止之溝36b平行形成而構成。接觸腳框架36係沿著溝36b內配置接觸腳26,在接觸腳26的第1接觸部26a及第2接觸部26b為往板體的外側突出之狀態而被積層於板厚方向Dt,藉此就可構成單元本體28(例如,約略長方體)。The contact leg frame 36 is formed by parallel formation of a plurality of grooves 36b transverse to the plate body along the surface 36a of the plate body, that is, a so-called wash plate-shaped plate body. For example, in the case where the contact foot frame 36 is a substantially rectangular flat plate, the groove 36b extending from one side to the opposite side is formed in parallel in the surface 36a of the flat plate. In the contact leg frame 36, the contact leg 26 is disposed along the groove 36b, and the first contact portion 26a and the second contact portion 26b of the contact leg 26 are stacked in the plate thickness direction Dt in a state of protruding toward the outside of the plate body. This constitutes the unit body 28 (e.g., approximately cuboid).
接觸腳框架36的溝36b之形狀、大小係設定成:在積層接觸腳框架36時,即便接觸腳26干擾到接觸腳框架36亦不會對接觸腳框架36的積層方向的尺寸產生影響。再者,平行形成的溝36b之平行方向的位置係因應:被配列成陣列狀的半球狀端子100b之行方向、或列方向中之任一方向(例如,行方向)的間距來加以設定的。The shape and size of the groove 36b of the contact leg frame 36 are set such that even if the contact leg 26 interferes with the contact leg frame 36 when the contact foot frame 36 is laminated, the size of the contact leg frame 36 in the lamination direction is not affected. Further, the position in the parallel direction of the grooves 36b formed in parallel is set in accordance with the pitch direction of the hemispherical terminals 100b arranged in an array or the pitch of any one of the column directions (for example, the row direction). .
在接觸腳框架36的溝36b中,除了電路基板200側的一部分與IC封裝100側的一部分以外之溝36b的中央部,為由接觸腳框架36的表面36a往內面36c貫穿之貫穿溝36d;在沿著溝36b內配置有接觸腳26時,彈簧部26c為插入到該貫穿溝36d。接觸腳框架36的各貫穿溝36d,在積層接觸腳框架36而形成單元本體28時,連續地於積層方向形成貫穿單元本體28之單元貫穿孔28a。在容置接觸腳26的彈簧部26c、並且於接觸腳26的第1接觸部26a及第2接觸部26b之間施加壓縮力的情況,單元貫穿孔28a係藉由彈簧部26c的變形來避免干擾接觸腳框架36。In the groove 36b of the contact leg frame 36, a central portion of the groove 36b excluding a part of the circuit board 200 side and a part of the IC package 100 side is a through groove 36d penetrating the inner surface 36c from the surface 36a of the contact leg frame 36. When the contact leg 26 is disposed along the groove 36b, the spring portion 26c is inserted into the through groove 36d. When each of the through grooves 36d of the contact leg frame 36 is formed to contact the leg frame 36 to form the unit main body 28, the unit through hole 28a penetrating the unit main body 28 is continuously formed in the lamination direction. When the spring portion 26c of the contact leg 26 is accommodated and a compressive force is applied between the first contact portion 26a and the second contact portion 26b of the contact leg 26, the unit through hole 28a is prevented by deformation of the spring portion 26c. Interfering with the contact foot frame 36.
在接觸腳框架36的溝36b之中,於非貫穿溝36d之IC封裝100側的一部分之第1有底溝36e中,藉由於積層狀態相隣接的接觸腳框架36的內面36c來封閉第1有底溝36e的開口,因此形成從接觸腳26之中彈簧部26c起插通第1接觸部26a側之第1插通孔36f。自接觸腳26的彈簧部26c起,由於接觸腳26的彈簧部26c的變形而在第1插通孔36f內,第1接觸部26a側係能夠於從IC封裝100往向著電路基板200之方向進行往復動作。Among the grooves 36b of the contact leg frame 36, the first bottomed groove 36e of a part of the IC package 100 side of the non-through groove 36d is closed by the inner surface 36c of the contact leg frame 36 adjacent to the laminated state. Since the opening of the bottom groove 36e is formed, the first insertion hole 36f that is inserted into the first contact portion 26a from the spring portion 26c of the contact leg 26 is formed. Since the spring portion 26c of the contact leg 26 is deformed by the spring portion 26c of the contact leg 26, the first contact portion 26a side can be directed from the IC package 100 toward the circuit substrate 200 in the first insertion hole 36f. Reciprocating action.
再者,在接觸腳框架36的溝36b之中,於非貫穿溝36d之電路基板200側的一部分之第2有底溝36g中,藉由與封閉第1有底溝36e的開口之相同的接觸腳框架36的內面36c來封閉第2有底溝36g的開口,因此形成從接觸腳26中之彈簧部26c起插通第2接觸部26b側之第2插通孔36h。接觸腳26之中從彈簧部26c起,第2接觸部26b側係能夠藉由接觸腳26的彈簧部26c之變形,而在第2插通孔36h內從IC封裝100起向著電路基板200的方向進行往復動作。Further, among the grooves 36b of the contact leg frame 36, the second bottomed groove 36g of a part of the non-through groove 36d on the side of the circuit board 200 is the same as the opening for closing the first bottomed groove 36e. Since the inner surface 36c of the contact leg frame 36 closes the opening of the second bottomed groove 36g, the second insertion hole 36h that is inserted into the second contact portion 26b side from the spring portion 26c of the contact leg 26 is formed. The contact portion 26 is formed from the spring portion 26c, and the second contact portion 26b side is deformable from the spring portion 26c of the contact leg 26, and is directed from the IC package 100 toward the circuit board 200 in the second insertion hole 36h. The direction is reciprocating.
接觸腳框架36的積層,具體而言,在溝36b的平行方向之第1方向D1 的兩端部36i中,將引導軸38插通於板厚方向Dt,即,接觸腳框架36的積層方向之第2方向D2 所穿設的引導孔36j,並隨著陣列狀配列之半球狀端子100b的行方向、或列方向之中的其他側(例如,列方向)的數量來進行積層而達到預定數。Contact pins laminated frame 36, specifically, in a direction parallel to the first direction D of the groove 36b in both end portions 36I 1, the guide shaft 38 is inserted through the thickness direction Dt of, i.e., the contact pins 36 of the frame laminate The guide holes 36j penetrating in the second direction D 2 of the direction are laminated in accordance with the row direction of the hemispherical terminals 100b arranged in the array or the other side (for example, the column direction) of the column direction. A predetermined number is reached.
再者,如此積層有既定數之接觸腳框架36所形成的單元本體28,係按照使得接觸腳26的第1接觸部26a及第2接觸部26b為分別從四方筒體的開口30a、32a起突出於開口方向的方式,而內插於藉由使約略四方形狀的第1框體30及第2框體32為與個別的開口30a、32a一致地重疊所形成之四方筒體。被內插的單元本體28係被第1框體30及第2框體32而固定於不會干擾接觸腳26的第1接觸部26a及第2接觸部26b的位置,例如,被在接觸腳框架36中之第1方向D1 的兩端部36i所挾持固定。Further, the unit main body 28 formed by stacking a predetermined number of contact leg frames 36 is such that the first contact portion 26a and the second contact portion 26b of the contact leg 26 are respectively formed from the openings 30a, 32a of the square tubular body. The first frame body 30 and the second frame body 32 having a substantially square shape are formed so as to protrude from the opening direction, and are formed into a square tubular body formed by overlapping the individual openings 30a and 32a. The unit body 28 to be inserted is fixed to the first contact portion 26a and the second contact portion 26b that do not interfere with the contact leg 26 by the first frame body 30 and the second frame body 32, for example, at the contact foot. both end portions of the frame 36 in a first direction D 1 is sandwiched by the fixing 36i.
此處,於成陣列狀配列的半球狀端子100b之行方向或列方向中之任一方向(例如,行方向)上,通過接腳貫穿孔34a,使得被配列在接觸腳框架36上之接觸腳26的第1接觸部26a,而正確地與半球狀端子100b接觸之事,是能夠用來管理經平行形成的溝36b之平行方向、即第1方向D1 中之位置等有關之成形精度。Here, in any one of the row direction or the column direction (for example, the row direction) of the hemispherical terminals 100b arranged in an array, the contacts are arranged on the contact foot frame 36 through the pin through holes 34a. For forming the first contact portion 26 of the foot 26a, and correctly in contact with the hemispherical terminal 100b things, it is able to manage a direction parallel to the groove 36b formed in parallel by, i.e. in the first direction D 1 location accuracy .
然而,對於成陣列狀配列的半球狀端子100b之行方向或列方向的其他方向(例如,列方向),即便是嚴密地管理接觸腳框架36的成形精度,也會由於積層多數個接觸腳框架36而引起之積層上的誤差,所以單元本體28的積層方向、即第2方向D2 中之實際的尺寸就會有大於設計値之虞。因而,被配列在接觸腳框架36上之接觸腳26的第1接觸部26a會有無法通過接腳貫穿孔34a而正確地與半球狀端子100b接觸之虞。However, even in the other direction (for example, the column direction) of the row-like arrangement of the hemispherical terminals 100b in the row direction or the column direction, even if the forming precision of the contact foot frame 36 is strictly managed, a plurality of contact foot frames are laminated due to the lamination. 36 and the error cause of the laminate, the laminating direction of the unit body 28, i.e. actual dimensions in the second direction D 2 will be greater than design Zhi Yu. Therefore, the first contact portion 26a of the contact leg 26 disposed on the contact leg frame 36 may not be in contact with the hemispherical terminal 100b through the pin through hole 34a.
相對於此,即便是對於接觸腳單元24在積層方向進行壓縮,在相鄰接的接觸腳框架36間也是沒有設置積層方向之壓縮替代品,所以要藉由壓縮進行尺寸調整使之達到設計値是有困難的。On the other hand, even if the contact leg unit 24 is compressed in the lamination direction, there is no compression substitute for the lamination direction between the adjacent contact leg frames 36, so that the size is adjusted by compression to achieve the design. It is difficult.
又,即便對於用來使接觸腳框架36成型之模具,例如實施0.0001mm單位之微修正來進行尺寸調整,當以修正後的模具所成型的接觸腳框架36來進行積層時,若接觸腳單元24的積層方向之尺寸偏離設計値的話,則就不得不再度對於模具實施微修正,因而就會有接觸腳單元24的尺寸調整變煩雜之虞。Further, even if the mold for molding the contact foot frame 36 is subjected to dimensional adjustment by, for example, micro-correction of 0.0001 mm unit, when the laminated body frame 36 formed by the modified mold is laminated, if the foot unit is laminated, If the size of the lamination direction of 24 deviates from the design flaw, the micro-correction of the mold has to be performed again, and thus the size adjustment of the contact foot unit 24 becomes complicated.
因而,如圖14~圖18所示,在積層狀態下相鄰接的接觸腳框架36於積層方向抵接(或接觸,以下相同)之表面36a、內面36c中之表面36a的一部分上,形成能夠在對所積層的接觸腳框架36於積層方向進行壓縮時可壓碎崩解之微小凸部36k;如圖19(a)所示,預先增大單純地積層接觸腳框架36時之積層方向的尺寸,有意地使其大於單元本體28的積層方向之設計値,然後再如圖19(b)所示這樣地於積層方向進行壓縮,就能夠將單元本體28的積層方向之實際的尺寸調整到設計値。Therefore, as shown in FIGS. 14 to 18, in the laminated state, the adjacent contact leg frames 36 are in contact with (or in contact with, the same below) the surface 36a and a portion of the surface 36a of the inner surface 36c in the lamination direction. The micro convex portion 36k capable of crushing and disintegrating when the contact contact frame 36 of the laminated layer is compressed in the lamination direction is formed; as shown in FIG. 19(a), the lamination when simply laminating the contact foot frame 36 is increased in advance. The size of the direction is intentionally made larger than the design direction of the lamination direction of the unit main body 28, and then the actual size of the lamination direction of the unit main body 28 can be obtained by compressing in the lamination direction as shown in Fig. 19(b). Adjust to design 値.
微小凸部36k的壓碎崩解係指微小凸部36k承受壓力而崩潰之塑性變形,因而幾乎不會導致微小凸部36k及其附近以外的接觸腳框架36之塑性變形的意思。從而,藉由使微小凸部36k壓碎崩解,可使得在積層狀態下相鄰接的接觸腳框架36間未形成有微小凸部36k的情況下,與一側的表面36a抵接之其他側的內面36c更為接近該表面36a,進而可達成使得由既定數的接觸腳框架36積層而成之單元本體28的積層方向之尺寸縮小的效果。換言之,對於微小凸部36k的壓碎崩解而言,在積層狀態下相鄰接的接觸腳框架36間,一側的表面36a與其他側的內面36c皆未形成有微小凸部36k的情況,因此也是同樣地,不只是包括在積層方向抵接的情況,也包括除了一側的表面36a與其他側的內面36c與微小凸部36k以外於積層方向未抵接的情況。The crushing and disintegration of the minute convex portion 36k means plastic deformation in which the minute convex portion 36k is subjected to pressure and collapses, so that the plastic deformation of the contact protrusion frame 36 other than the minute convex portion 36k and its vicinity is hardly caused. Therefore, by crushing and disintegrating the minute convex portions 36k, when the minute convex portions 36k are not formed between the adjacent contact leg frames 36 in the laminated state, the other surfaces 36a can be brought into contact with each other. The inner surface 36c of the side is closer to the surface 36a, and the effect of reducing the size of the stacking direction of the unit main body 28 formed by the predetermined number of contact leg frames 36 can be achieved. In other words, in the crushing and disintegration of the minute convex portion 36k, between the adjacent contact leg frames 36 in the laminated state, the one surface 36a and the other inner surface 36c are not formed with the minute convex portions 36k. In other words, the same applies to the case where the laminated surface is not in contact with each other except for the one surface 36a and the other inner surface 36c and the small convex portion 36k.
微小凸部36k為如前述,在積層狀態下相鄰接的接觸腳框架36為於積層方向抵接的表面36a、內面36c之中,除了被形成表面36a的情況以外,也可以是被形成於內面36c或兩面。即,微小凸部36k也可以是被形成於:在積層狀態下相鄰接的接觸腳框架36為於積層方向抵接的抵接面之中一側的一部分上。As described above, the contact protrusion frame 36 that is adjacent to each other in the laminated state is formed in the surface 36a and the inner surface 36c that abut on the lamination direction, and may be formed in addition to the surface 36a. On the inner surface 36c or on both sides. In other words, the small convex portion 36k may be formed on a portion of the contact surface of the contact leg frame 36 that is adjacent to each other in the laminated state.
微小凸部36k之形狀、尺寸等係可設計成:使得對接觸腳框架36以既定數積層時之積層方向的尺寸為超過單元本體28的積層方向之設計値、且對所積層的接觸腳框架36於積層方向進行壓縮時至少縮短到設計値。The shape, size, and the like of the minute convex portion 36k can be designed such that the size of the contact direction of the contact leg frame 36 with a predetermined number of layers is a design exceeding the lamination direction of the unit body 28, and the contact foot frame for the laminated layer 36 is shortened to at least design flaws when compressing in the lamination direction.
微小凸部36k能夠是按照:使得在對單元本體28於積層方向進行壓縮時,可有效率地將壓力傳達到各接觸腳框架36的微小凸部36k的方式來形成。例如,也可以是將它設置在各接觸腳框架36中約略相同的位置上。The minute convex portion 36k can be formed such that when the unit body 28 is compressed in the lamination direction, pressure can be efficiently transmitted to the minute convex portions 36k of the contact foot frames 36. For example, it may be arranged at approximately the same position in each of the contact foot frames 36.
又,微小凸部36k係能夠按照:使得所積層的接觸腳框架36間之距離(即表面36a與內面36c間之距離)為比在接觸腳框架36之任何部分還更能藉由壓縮而達成比較均一的縮短之方式來形成。例如,如本實施形態所示,微小凸部36k也可以是被形成在接觸腳框架36之中,沿著溝36b內配置的接觸腳26之第1接觸部26a側及第2接觸部26b側之分離的兩側上,跨越被平行形成之溝36b的平行方向而形成直線狀。Moreover, the minute projections 36k can be such that the distance between the contact foot frames 36 of the laminate (i.e., the distance between the surface 36a and the inner surface 36c) is more compressible than any portion of the contact foot frame 36. Achieve a more uniform way to shorten. For example, as described in the present embodiment, the small convex portion 36k may be formed in the contact leg frame 36, and the first contact portion 26a side and the second contact portion 26b side of the contact leg 26 disposed along the groove 36b. On both sides of the separation, a straight line is formed across the parallel direction of the grooves 36b formed in parallel.
另外,微小凸部36k,若是在對接觸腳框架36以既定數積層時之積層方向的尺寸為超過單元本體28的積層方向之設計値、且在對所積層的接觸腳框架36進行積層方向壓縮時至少縮短到設計値的話,能夠使用各種的位置、形狀、尺寸。從而,例如,微小凸部36k是未限定的,可以是以不連續點而形成在抵接面上、或者跨越第1方向D1 而連續地或斷續地構成1個以上的直線或曲線的方式而形成於抵接面上。基於同樣的理由,微小凸部36k可採用剖面矩形形狀、剖面三角形形狀、剖面半圓形形狀、剖面梯形形狀、剖面逆梯形形狀等之各種的剖面形狀。Further, the size of the small convex portion 36k in the lamination direction when the contact leg frame 36 is laminated with a predetermined number is a design exceeding the lamination direction of the unit main body 28, and the contact leg frame 36 of the laminated layer is compressed in the lamination direction. When the design is reduced to at least, various positions, shapes, and sizes can be used. Thus, for example, the minute projections 36k is not defined, but may be a discontinuous point is formed on the contact surface, or across the first direction D 1 continuously or intermittently constituting the one or more line or curve The method is formed on the abutting surface. For the same reason, the minute convex portion 36k may have various cross-sectional shapes such as a cross-sectional rectangular shape, a cross-sectional triangular shape, a cross-sectional semicircular shape, a cross-sectional trapezoidal shape, and a cross-sectional reverse trapezoidal shape.
針對藉由具備此種的微小凸部36k之接觸腳框架36來製造接觸腳單元24之方法,來進行說明。 首先,在接觸腳框架36的各溝36b中,將接觸腳26的彈簧部26c插入貫穿溝36d,從彈簧部26c將第1接觸部26a側配置於第1有底溝36e,從彈簧部26c將第2接觸部26b側配置於第2有底溝36g,將接觸腳26配列於接觸腳框架36。The method of manufacturing the contact leg unit 24 by the contact leg frame 36 having such a small convex portion 36k will be described. First, in each of the grooves 36b of the contact leg frame 36, the spring portion 26c of the contact leg 26 is inserted into the insertion groove 36d, and the first contact portion 26a side is disposed from the spring portion 26c to the first bottomed groove 36e, and the spring portion 26c is provided. The second contact portion 26b side is disposed on the second bottomed groove 36g, and the contact leg 26 is disposed on the contact leg frame 36.
將既定數之配列有接觸腳26的接觸腳框架36,積層於板厚方向Dt上而使形成單元本體28。 被積層的接觸腳框架36之積層方向的尺寸為如前述,由於藉由預先形成有微小凸部36k而設定成超過設計値,所以對被積層的接觸腳框架36於積層方向進行壓縮,直到該尺寸成為設計値為止。The contact body frame 36 of the contact leg 26 is arranged in a predetermined number, and is laminated in the plate thickness direction Dt to form the unit body 28. As described above, since the size of the laminated contact leg frame 36 in the lamination direction is set to exceed the design 藉 by forming the minute convex portion 36k in advance, the contact contact frame 36 of the laminated layer is compressed in the lamination direction until the The size has become a design.
例如,使積層方向相對於基準平面而言為約略成直角,將引導軸38插入通過引導孔32i,將被積層的接觸腳框架36配置於基準平面上。又,於配置在基準平面上的情況下,將對基準平面呈約略直角方向的距離為在單元本體28的積層方向中之設計値的治具模塊,配置在被積層的接觸腳框架36之兩側的基準面上。然後,將具有能架設在治具模塊間之尺寸、且平坦的按壓面之1各或複數個按壓治具,避開引導軸38而設定在被積層的接觸腳框架36的積層端面上,以平行於基準平面進行按壓直到與兩側的治具模塊相抵接為止。藉此,對被積層的接觸腳框架36於積層方向進行壓縮。For example, the stacking direction is about a right angle with respect to the reference plane, and the guide shaft 38 is inserted through the guide hole 32i, and the laminated contact leg frame 36 is placed on the reference plane. Further, in the case of being disposed on the reference plane, the distance between the reference plane and the reference plane in the stacking direction of the unit body 28 is set to be two of the contact contact frame 36 of the laminated layer. The reference plane on the side. Then, one or a plurality of pressing jigs having a flat pressing surface that can be placed between the jig modules are set on the laminated end faces of the laminated contact leg frames 36 while avoiding the guide shafts 38. Pressing parallel to the reference plane until it abuts the fixture modules on both sides. Thereby, the laminated contact frame 36 is compressed in the lamination direction.
按照使得接觸腳26的第1接觸部26a及第2接觸部26b為分別從四方筒體的開口30a、32a於開口方向突出的方式,將被壓縮的單元本體28內插於:約略四方形狀的第1框體30及第2框體32為使個別的開口30a、32a一致重疊所形成的四方筒體。然後,藉由第1框體30及第2框體32,將已內插的單元本體28挾持固定在不干擾接觸腳26的第1接觸部26a及第2接觸部26b的位置。 將被第1框體30與第2框體32所挾持固定的單元本體28,經由裝設在第1框體30上之彈性構件24a使之與浮動板34相連結,進而製作成接觸腳單元24。The compressed unit main body 28 is inserted into the approximately square shape so that the first contact portion 26a and the second contact portion 26b of the contact leg 26 protrude from the openings 30a and 32a of the rectangular tubular body in the opening direction. The first frame body 30 and the second frame body 32 are square tubular bodies formed by uniformly overlapping the individual openings 30a and 32a. Then, the unit body 28 that has been inserted is held by the first frame body 30 and the second frame body 32 at positions that do not interfere with the first contact portion 26a and the second contact portion 26b of the contact leg 26. The unit main body 28 held by the first frame body 30 and the second frame body 32 is coupled to the floating plate 34 via the elastic member 24a attached to the first frame body 30, thereby being formed into a contact foot unit. twenty four.
其次,針對具備此種的接觸腳單元24之IC插座10的動作來進行說明。 首先,圖1的上半部、及如圖2的虛線所示,在IC插座10的插座蓋體16及曲柄桿構件22開啟的狀態下,一邊以引導構件34b進行導引,一邊將IC封裝100容置於接觸腳單元24的浮動板34上。Next, the operation of the IC socket 10 including the contact leg unit 24 will be described. First, as shown in the dotted line of FIG. 2, the socket cover 16 and the crank lever member 22 of the IC socket 10 are opened, and the IC package is guided by the guide member 34b. 100 is placed on the floating plate 34 of the contact foot unit 24.
然後,轉動插座蓋體16使之約略平行於插座本體12地關閉,如圖4所示,使插座蓋體16的前端部16b被鎖閂構件20所卡止。另外,使曲柄桿構件22轉動,如圖2所示,藉由使之傾倒而呈約略平行於插座本體12,藉由圖式省略的凸輪機構使鎖閂構件20往接近插座本體12的方向移動,以散熱構件14按壓IC封裝100,並且在該按壓狀態下,使之成為限制曲柄桿構件22的動作之鎖固狀態。Then, the socket cover 16 is rotated to be closed approximately parallel to the socket body 12, and as shown in Fig. 4, the front end portion 16b of the socket cover 16 is locked by the latch member 20. Further, the crank member 22 is rotated, as shown in FIG. 2, by being tilted to be approximately parallel to the socket body 12, and the latch member 20 is moved toward the socket body 12 by a cam mechanism omitted from the drawing. The heat sink member 14 presses the IC package 100, and in this pressed state, it is in a locked state that restricts the operation of the crank lever member 22.
由於散熱構件14為相對於插座蓋體16進行轉動,所以散熱構件14最初為先接觸到IC封裝100然後成為鎖固狀態,由於散熱構件14及IC封裝100幾乎是面接觸狀態,所以能夠減低由散熱構件14所施加於IC封裝100之壓力分布的偏差,並且能夠將由IC封裝100所產生的熱效率良好地傳達到散熱構件14。Since the heat dissipating member 14 is rotated relative to the socket cover 16, the heat dissipating member 14 first contacts the IC package 100 and then becomes a locked state. Since the heat dissipating member 14 and the IC package 100 are almost in a surface contact state, the heat dissipating member 14 can be reduced. The variation in the pressure distribution applied to the IC package 100 by the heat dissipation member 14 and the heat generated by the IC package 100 can be efficiently transmitted to the heat dissipation member 14.
藉由散熱構件14為將IC封裝向著單元本體28按壓,浮動板34抵抗彈性構件24a的附加勢能力而往接近單元本體28的方向推擠。相對於此,接觸腳26的第1接觸部26a為通過浮動板34的接腳貫穿孔34a而與IC封裝100的半球狀端子100b接觸,而使壓縮力達到第1接觸部26a與第2接觸部26b之間。但,由於接觸腳26的彈簧部26c因彈性變形而吸收壓縮力的緣故,所以接觸腳26的第1接觸部26a及第2接觸部26b就分別以既定的壓力與半球狀端子100b及電路基板200相接觸。By pressing the IC package toward the unit body 28 by the heat radiating member 14, the floating plate 34 is urged toward the unit body 28 against the additional potential of the elastic member 24a. On the other hand, the first contact portion 26a of the contact leg 26 comes into contact with the hemispherical terminal 100b of the IC package 100 through the pin through hole 34a of the floating plate 34, and the compressive force reaches the first contact portion 26a and the second contact. Between the parts 26b. However, since the spring portion 26c of the contact leg 26 absorbs the compressive force due to the elastic deformation, the first contact portion 26a and the second contact portion 26b of the contact leg 26 are respectively at a predetermined pressure and the hemispherical terminal 100b and the circuit substrate. 200 contacts.
又,散熱構件14的下面為抵接於IC封裝100的上面,而從散熱鰭片14a來進行散熱。接著,在該狀態下,對IC封裝100施加電壓來進行老化試驗等的性能試驗。Further, the lower surface of the heat dissipation member 14 is in contact with the upper surface of the IC package 100, and is radiated from the heat dissipation fins 14a. Next, in this state, a voltage is applied to the IC package 100 to perform a performance test such as an aging test.
根據此類的接觸腳單元24,則被積層的接觸腳框架36的積層方向之尺寸係設定成:藉由預先形成微小凸部36k來達到使之超過單元本體28的積層方向之設計値。 從而,由於只憑將被積層的接觸腳框架36於積層方向壓縮,就能夠使之成為單元本體28的積層方向的設計値,所以與對於接觸腳框架36成型用的模具實施微修正來進行接觸腳框架36的板厚方向之尺寸調整的情況相比之下,能夠更為提高單元本體28的積層方向之尺寸調整的容易性。如此,則能夠縮短接觸腳單元24及IC插座10的製造時間,對於製造效率的提高也是有助益的。According to such a contact leg unit 24, the size of the laminated contact frame 36 in the lamination direction is set such that the design of the lamination direction of the unit main body 28 is achieved by forming the minute convex portion 36k in advance. Therefore, since the laminated contact frame 36 is compressed in the lamination direction, the design can be made in the lamination direction of the unit main body 28. Therefore, the mold for molding the contact leg frame 36 is slightly corrected for contact. In comparison with the case where the size of the leg frame 36 is adjusted in the thickness direction, the ease of dimensional adjustment of the stacking direction of the unit main body 28 can be further improved. Thus, the manufacturing time of the contact leg unit 24 and the IC socket 10 can be shortened, which is also advantageous for improving the manufacturing efficiency.
另外,在前述的實施形態中,雖然將本發明使用於容置IC封裝100之IC插座10以做為電子零件用插座,然而並未受限於此而已,本發明也能夠適用於容置其他的電子零件之裝置。Further, in the above-described embodiment, the present invention is applied to the IC socket 10 for accommodating the IC package 100 as a socket for an electronic component. However, the present invention is not limited thereto, and the present invention can also be applied to other components. The device for electronic parts.
又,在前述的實施形態中,雖然對於微小凸部36k成為與接觸腳框架36一體成形的接觸腳框架36的一部分進行了說明;然而為了使微小凸部36k容易壓碎崩解,所以也可以藉由將彼此不同材質(材料)加以組合而一體成形之二色成形,藉以使得微小凸部36k的材質為不同於接觸腳框架36。Further, in the above-described embodiment, the minute projections 36k are partially formed of the contact leg frame 36 integrally formed with the contact leg frame 36. However, in order to facilitate the crushing and disintegration of the micro projections 36k, The two-color molding is integrally formed by combining different materials (materials) from each other, whereby the material of the minute convex portion 36k is different from that of the contact foot frame 36.
又,在前述的實施形態中,雖然對於微小凸部36k成為與接觸腳框架36一體成形的接觸腳框架36的一部分進行了說明,然而就取代它而言,也可以是將不是與接觸腳框架36而是另外個別形成之其他個體的微小凸部,藉由接合、熔合、熔接、機械接合等之所有公知的接合方法,而使之與接觸腳框架36成為一體。在此種的情況下,其他個體的微小凸部,為了使它容易壓碎崩解,則也可以是使之與接觸腳框架36的材質不相同。或者,其他個體的微小凸部,例如,也可以是在積層狀態下,在相鄰接的接觸腳框架36間挾入極薄的薄片等之構成,而不是與接觸腳框架36成為一體的構成。Further, in the above-described embodiment, the minute projection 36k has been described as a part of the contact leg frame 36 integrally formed with the contact leg frame 36. However, instead of the contact lens frame 36, it may be 36. The minute projections of the other individual formed separately are integrally formed with the contact foot frame 36 by all known joining methods such as joining, fusing, welding, mechanical joining, and the like. In such a case, the minute projections of the other individual may be made different from the material of the contact foot frame 36 in order to make it easy to crush and disintegrate. Alternatively, the small convex portions of the other individual may be formed by, for example, forming an extremely thin sheet between the adjacent contact leg frames 36 in the laminated state, instead of being integrated with the contact foot frame 36. .
另外,在前述的實施形態中,雖然是在對被積層的接觸腳框架36實施壓縮時,藉由使微小凸部36k產生塑性變形而壓碎崩解,以進行尺寸調整使之達到單元本體28的積層方向的設計値,然而取而代之,也可以利用使微小凸部36k產生彈性變形,進行尺寸調整來達到單元本體28的積層方向之設計値。Further, in the above-described embodiment, when the laminated contact frame 36 is compressed, the minute projections 36k are plastically deformed to crush and disintegrate, and the size is adjusted to reach the unit body 28. Instead of designing the lamination direction, the design of the lamination direction of the unit body 28 can be achieved by elastically deforming the minute projections 36k and performing dimensional adjustment.
在利用使微小凸部36k產生彈性變形,以進行尺寸調整使之達到單元本體28的積層方向之設計値的情況下,可在被壓縮的接觸腳框架36的積層端面,於引導接腳上裝設擋止片來構成單元本體28,藉以在對被積層的接觸腳框架36進行壓縮之後,使得它不會再回復到原始的狀態。與接觸腳框架36相比之下,應該採用彈性豐富的材質,藉由如前述的二色成形法來形成微小凸部36k;或者也可以採用比接觸腳框架36還更是彈性豐富的材質之其他個體的微小凸部。In the case where the small convex portion 36k is elastically deformed to be dimensioned so as to reach the design direction of the unit body 28, the laminated end face of the compressed contact leg frame 36 can be attached to the guide pin. A stopper piece is provided to constitute the unit body 28, so that after the laminated contact foot frame 36 is compressed, it is not returned to the original state. In contrast to the contact foot frame 36, a material rich in elasticity should be used, and the minute convex portion 36k can be formed by the two-color forming method as described above; or a material rich in elasticity more than the contact foot frame 36 can also be used. Small protrusions of other individuals.
本項技術者從本揭示之說明當可明白:如前述所選擇的實施形態,只不過是為了以圖例示或說明本發明而選擇的;除此以外,如添附的申請專利範圍中所定義者,在不脫離本發明的範圍內,仍然存在有各式各樣的變更及修正之可能。From the description of the present disclosure, it will be apparent to those skilled in the art that the embodiments described above are merely selected to illustrate or illustrate the invention; in addition, as defined in the appended claims. Various modifications and changes are possible without departing from the scope of the invention.
此外,根據本發明之實施形態的前述之說明,只是為了例示而提供的,因而當然不是用來限定本發明(包括如添附的申請專利範圍中所請求的發明及與彼等均等之發明)。In addition, the foregoing description of the embodiments of the present invention is provided by way of example only, and thus is not intended to limit the invention (including the invention as claimed in the appended claims and equivalent inventions).
10‧‧‧IC插座
12‧‧‧插座本體
12a‧‧‧一側端部
12b‧‧‧其他側端部
12c‧‧‧凹陷部
14‧‧‧散熱構件
16‧‧‧插座蓋體
16a‧‧‧基端部
16b‧‧‧前端部
20‧‧‧鎖閂構件
22‧‧‧曲柄桿構件
24‧‧‧接觸腳單元
26‧‧‧接觸腳
26a‧‧‧第1接觸部
26b‧‧‧第2接觸部
28‧‧‧單元本體
36‧‧‧接觸腳框架
36a‧‧‧表面
36b‧‧‧溝
36c‧‧‧內面
36k‧‧‧微小凸部
100‧‧‧IC封裝
200‧‧‧電路基板10‧‧‧IC socket
12‧‧‧ socket body
12a‧‧‧One end
12b‧‧‧Other side ends
12c‧‧‧Depression
14‧‧‧Heat components
16‧‧‧ Socket cover
16a‧‧‧ base end
16b‧‧‧ front end
20‧‧‧Lock member
22‧‧‧Crank member
24‧‧‧ contact foot unit
26‧‧‧Contact feet
26a‧‧‧1st contact
26b‧‧‧2nd contact
28‧‧‧ Unit Ontology
36‧‧‧Contact foot frame
36a‧‧‧Surface
36b‧‧‧ditch
36c‧‧‧ inside
36k‧‧‧Small convex
100‧‧‧IC package
200‧‧‧ circuit substrate
圖1為IC插座之平面圖,其上半部顯示插座蓋體為開啟的狀態,而下半部顯示插座蓋體為關閉的狀態。 圖2為IC插座的正面圖。 圖3為IC插座的側面圖。 圖4為有關圖1的A-A線之剖面圖。 圖5為有關圖1的B-B線之剖面圖。 圖6為接觸腳單元的斜視圖。 圖7為接觸腳單元的平面圖。 圖8為有關圖7的C-C線之剖面圖。 圖9為有關圖7的D-D線之剖面圖。 圖10為有關已卸下第1框體的接觸腳單元之平面圖。 圖11為顯示接觸腳框架的積層狀態之斜視圖。 圖12為接觸腳框架的平面圖。 圖13為有關圖12的E-E線之剖面圖。 圖14為有關圖12的F-F線之剖面圖。 圖15為圖13的G部已被放大之放大圖。 圖16為圖14的H部已被放大之放大圖。 圖17為圖14的I部已被放大之放大圖。 圖18為顯示在圖14的H部之單元本體的積層狀態之說明圖。 圖19為用以說明有關單元本體的積層方向之壓縮效果之說明圖;(a)為壓縮前的狀態、(b)為壓縮後的狀態。 圖20為顯示IC封裝的一例子;(a)為正面圖、(b)為底面圖。1 is a plan view of an IC socket, the upper half of which shows the state in which the socket cover is open, and the lower half shows the state in which the socket cover is closed. Figure 2 is a front elevational view of the IC socket. Figure 3 is a side view of the IC socket. Figure 4 is a cross-sectional view taken along line A-A of Figure 1. Figure 5 is a cross-sectional view taken along line B-B of Figure 1. Figure 6 is a perspective view of the contact foot unit. Figure 7 is a plan view of the contact foot unit. Figure 8 is a cross-sectional view taken along line C-C of Figure 7. Figure 9 is a cross-sectional view taken along line D-D of Figure 7. Fig. 10 is a plan view showing a contact unit in which the first housing has been removed. Figure 11 is a perspective view showing a laminated state of the contact foot frame. Figure 12 is a plan view of the contact foot frame. Figure 13 is a cross-sectional view taken along line E-E of Figure 12 . Figure 14 is a cross-sectional view taken along line F-F of Figure 12 . Fig. 15 is an enlarged view showing the portion G of Fig. 13 enlarged. Fig. 16 is an enlarged view showing the portion H of Fig. 14 enlarged. Fig. 17 is an enlarged view showing the portion I of Fig. 14 enlarged. Fig. 18 is an explanatory view showing a laminated state of the unit body of the H portion of Fig. 14; Fig. 19 is an explanatory view for explaining a compression effect of a stacking direction of a unit body; (a) is a state before compression, and (b) is a state after compression. Fig. 20 is a view showing an example of an IC package; (a) is a front view and (b) is a bottom view.
26‧‧‧接觸腳 26‧‧‧Contact feet
28‧‧‧單元本體 28‧‧‧ Unit Ontology
36‧‧‧接觸腳框架 36‧‧‧Contact foot frame
36a‧‧‧表面 36a‧‧‧Surface
36b‧‧‧溝 36b‧‧‧ditch
36c‧‧‧內面 36c‧‧‧ inside
36d‧‧‧貫穿溝 36d‧‧‧through trench
36e‧‧‧底溝 36e‧‧‧ditch
36f‧‧‧插通孔 36f‧‧‧ inserted through hole
36k‧‧‧微小凸部 36k‧‧‧Small convex
D2‧‧‧方向 D 2 ‧‧‧ Direction
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-072625 | 2014-03-31 | ||
JP2014072625A JP6251624B2 (en) | 2014-03-31 | 2014-03-31 | Contact pin unit and socket for electrical parts using the same |
Publications (2)
Publication Number | Publication Date |
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TW201547139A true TW201547139A (en) | 2015-12-16 |
TWI657629B TWI657629B (en) | 2019-04-21 |
Family
ID=54240357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW104110179A TWI657629B (en) | 2014-03-31 | 2015-03-30 | Contact pin unit and electric components using the same |
Country Status (6)
Country | Link |
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JP (1) | JP6251624B2 (en) |
KR (1) | KR20160138396A (en) |
CN (1) | CN106134014B (en) |
SG (1) | SG11201608003VA (en) |
TW (1) | TWI657629B (en) |
WO (1) | WO2015152031A1 (en) |
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2019207829A (en) * | 2018-05-30 | 2019-12-05 | モレックス エルエルシー | socket |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5542860A (en) * | 1995-03-15 | 1996-08-06 | Molex Incorporated | Electrical connector with mounting post |
TW400666B (en) * | 1997-01-29 | 2000-08-01 | Furukawa Electric Co Ltd | IC socket |
JP2001326046A (en) * | 2000-05-17 | 2001-11-22 | Enplas Corp | Contact pin assembly |
US6592381B2 (en) * | 2001-01-25 | 2003-07-15 | Teradyne, Inc. | Waferized power connector |
US6644985B2 (en) * | 2001-02-16 | 2003-11-11 | Fci Americas Technology, Inc. | Ball attached zero insertion force socket |
JP4079211B2 (en) * | 2002-03-19 | 2008-04-23 | 株式会社エンプラス | Socket for electrical parts |
US6699047B1 (en) * | 2002-12-30 | 2004-03-02 | Hon Hai Precision Ind. Co., Ltd. | Electrical connector with retention protrusions |
TWI264159B (en) * | 2004-03-09 | 2006-10-11 | Hon Hai Prec Ind Co Ltd | Electrical connector |
US20080119086A1 (en) * | 2006-11-20 | 2008-05-22 | Chou Hsuan Tsai | Terminal structure of electrical connector |
CN101267070B (en) * | 2007-03-14 | 2010-08-25 | 顺连电子股份有限公司 | Stack type connector |
US8469720B2 (en) * | 2008-01-17 | 2013-06-25 | Amphenol Corporation | Electrical connector assembly |
JP5002481B2 (en) * | 2008-02-18 | 2012-08-15 | 矢崎総業株式会社 | connector |
CN101752765B (en) * | 2008-11-28 | 2012-10-03 | 富士康(昆山)电脑接插件有限公司 | Electric coupler |
JP5612436B2 (en) * | 2010-10-21 | 2014-10-22 | 株式会社エンプラス | Socket for electrical parts |
-
2014
- 2014-03-31 JP JP2014072625A patent/JP6251624B2/en active Active
-
2015
- 2015-03-27 SG SG11201608003VA patent/SG11201608003VA/en unknown
- 2015-03-27 WO PCT/JP2015/059568 patent/WO2015152031A1/en active Application Filing
- 2015-03-27 CN CN201580016827.4A patent/CN106134014B/en not_active Expired - Fee Related
- 2015-03-27 KR KR1020167024537A patent/KR20160138396A/en not_active Abandoned
- 2015-03-30 TW TW104110179A patent/TWI657629B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
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CN106134014B (en) | 2019-01-22 |
KR20160138396A (en) | 2016-12-05 |
TWI657629B (en) | 2019-04-21 |
JP2015195120A (en) | 2015-11-05 |
CN106134014A (en) | 2016-11-16 |
JP6251624B2 (en) | 2017-12-20 |
WO2015152031A1 (en) | 2015-10-08 |
SG11201608003VA (en) | 2016-11-29 |
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