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SG121898A1 - System for 2-D and 3-D vision inspection - Google Patents

System for 2-D and 3-D vision inspection

Info

Publication number
SG121898A1
SG121898A1 SG200405729A SG200405729A SG121898A1 SG 121898 A1 SG121898 A1 SG 121898A1 SG 200405729 A SG200405729 A SG 200405729A SG 200405729 A SG200405729 A SG 200405729A SG 121898 A1 SG121898 A1 SG 121898A1
Authority
SG
Singapore
Prior art keywords
vision inspection
vision
inspection
Prior art date
Application number
SG200405729A
Other languages
English (en)
Inventor
Yong Joo Puah
Hak Wee Tang
Original Assignee
Generic Power Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Generic Power Pte Ltd filed Critical Generic Power Pte Ltd
Priority to SG200405729A priority Critical patent/SG121898A1/en
Priority to CN2005800301544A priority patent/CN101124453B/zh
Priority to US11/573,344 priority patent/US7573569B2/en
Priority to PCT/SG2005/000301 priority patent/WO2006038885A1/fr
Publication of SG121898A1 publication Critical patent/SG121898A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry

Landscapes

  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Operations Research (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SG200405729A 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection SG121898A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection
CN2005800301544A CN101124453B (zh) 2004-10-06 2005-09-01 用于二维和三维图像检测的系统
US11/573,344 US7573569B2 (en) 2004-10-06 2005-09-01 System for 2-D and 3-D vision inspection
PCT/SG2005/000301 WO2006038885A1 (fr) 2004-10-06 2005-09-01 Systeme pour inspection par vision 2d et 3d

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection

Publications (1)

Publication Number Publication Date
SG121898A1 true SG121898A1 (en) 2006-05-26

Family

ID=36142857

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection

Country Status (4)

Country Link
US (1) US7573569B2 (fr)
CN (1) CN101124453B (fr)
SG (1) SG121898A1 (fr)
WO (1) WO2006038885A1 (fr)

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CN101387501B (zh) * 2008-10-06 2010-04-21 天津大学 超大型工件圆形截面形状与方位测量装置及方法
US8406619B2 (en) * 2009-03-23 2013-03-26 Vincent Pace & James Cameron Stereo camera with automatic control of interocular distance
KR101108672B1 (ko) * 2009-05-12 2012-01-25 (주)제이티 반도체소자 비전검사장치 및 그 방법
US9091725B2 (en) 2009-07-03 2015-07-28 Koh Young Technology Inc. Board inspection apparatus and method
WO2011011009A1 (fr) * 2009-07-23 2011-01-27 Hewlett-Packard Development Company, L.P. Afficheur avec un capteur optique
US7929852B1 (en) * 2009-10-13 2011-04-19 Vincent Pace Integrated 2D/3D camera
US8090251B2 (en) * 2009-10-13 2012-01-03 James Cameron Frame linked 2D/3D camera system
EP2508871A4 (fr) * 2009-11-30 2017-05-10 Nikon Corporation Appareil d'inspection, procédé de mesure pour forme en trois dimensions, et procédé de production d'une structure
KR101121994B1 (ko) * 2010-02-02 2012-03-09 주식회사 고영테크놀러지 검사 프로그램의 생성 방법
JP5488179B2 (ja) * 2010-04-30 2014-05-14 ソニー株式会社 検査装置及び検査方法
US8797398B2 (en) * 2010-05-03 2014-08-05 United Technologies Corporation On-the-fly dimensional imaging inspection
FR2963093B1 (fr) * 2010-07-26 2012-08-03 Vit Installation d'inspection optique 3d de circuits electroniques
FR2963144B1 (fr) * 2010-07-26 2012-12-07 Vit Installation d'inspection optique de circuits electroniques
US9071738B2 (en) 2010-10-08 2015-06-30 Vincent Pace Integrated broadcast and auxiliary camera system
US8879902B2 (en) 2010-10-08 2014-11-04 Vincent Pace & James Cameron Integrated 2D/3D camera with fixed imaging parameters
CA2738396C (fr) * 2011-04-28 2013-12-24 Denis Lessard Appareil et methode d'inspection optique
CN103249295B (zh) * 2012-02-08 2017-07-07 Juki株式会社 电子部件安装方法、电子部件安装装置以及电子部件安装系统
US8655163B2 (en) 2012-02-13 2014-02-18 Cameron Pace Group Llc Consolidated 2D/3D camera
US10659763B2 (en) 2012-10-09 2020-05-19 Cameron Pace Group Llc Stereo camera system with wide and narrow interocular distance cameras
CN103197424B (zh) * 2013-03-08 2016-09-28 深圳奥比中光科技有限公司 基于正交视觉的数字图像相关装置
EP2787320B1 (fr) * 2013-04-05 2017-09-20 Leica Geosystems AG Station totale avec fonctionnalité de balayage et modes de balayage sélectionnables
WO2015008874A1 (fr) * 2013-07-15 2015-01-22 엘지전자 주식회사 Robot nettoyeur et procédé d'auto-correction du capteur 3d du robot nettoyeur
SG2013084975A (en) * 2013-11-11 2015-06-29 Saedge Vision Solutions Pte Ltd An apparatus and method for inspecting asemiconductor package
US9829441B2 (en) * 2013-11-29 2017-11-28 Nextin, Inc. Wafer image inspection apparatus
US10688578B2 (en) 2014-08-04 2020-06-23 OK International, Inc Variable temperature controlled soldering iron
US10716220B2 (en) 2014-08-04 2020-07-14 Ok International, Inc. Variable temperature controlled soldering iron
US9516762B2 (en) 2014-08-04 2016-12-06 Ok International Inc. Soldering iron with automatic soldering connection validation
CN104132621A (zh) * 2014-08-08 2014-11-05 广东威创视讯科技股份有限公司 一种拼接屏的拼接处的检查方法
CA2915654C (fr) * 2015-07-08 2018-05-01 Delaware Capital Formation, Inc. Une cartouche de soudage intelligente destinee a la validation de la connexion de soudage automatique
CN106546597A (zh) * 2015-09-22 2017-03-29 泰科电子(上海)有限公司 焊接质量检测系统和方法
JP6997541B2 (ja) * 2017-05-31 2022-01-17 株式会社キーエンス 画像検査装置、画像検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器
CN109283188A (zh) * 2018-10-12 2019-01-29 成都精工华耀科技有限公司 一种轨道可视化巡检二维与三维一体化成像系统
TWI708041B (zh) * 2018-10-17 2020-10-21 所羅門股份有限公司 檢測與標記瑕疵的方法
US11029146B2 (en) 2018-10-18 2021-06-08 Cyberoptics Corporation Three-dimensional sensor with counterposed channels
CN110987954B (zh) * 2019-12-30 2021-10-22 江南大学 一种消除皮革表面缺陷检测盲区的方法及系统
TWI768923B (zh) * 2021-05-24 2022-06-21 致伸科技股份有限公司 相機鏡頭與光源之對位方法
CN114280075B (zh) * 2021-12-28 2024-06-28 无锡维度机器视觉产业技术研究院有限公司 一种管类零件表面缺陷在线视觉检测系统及检测方法
CN114414487B (zh) * 2022-01-19 2024-04-16 北京科技大学设计研究院有限公司 一种二维与三维融合的圆钢表面成像系统

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US20040150822A1 (en) * 2003-01-30 2004-08-05 Samsung Electronics Co., Ltd. Soldering inspection apparatus
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US7551272B2 (en) * 2005-11-09 2009-06-23 Aceris 3D Inspection Inc. Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object

Also Published As

Publication number Publication date
US7573569B2 (en) 2009-08-11
CN101124453B (zh) 2012-09-05
CN101124453A (zh) 2008-02-13
WO2006038885A1 (fr) 2006-04-13
US20070247614A1 (en) 2007-10-25

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