SG11201600242PA - Low density polishing pad - Google Patents
Low density polishing padInfo
- Publication number
- SG11201600242PA SG11201600242PA SG11201600242PA SG11201600242PA SG11201600242PA SG 11201600242P A SG11201600242P A SG 11201600242PA SG 11201600242P A SG11201600242P A SG 11201600242PA SG 11201600242P A SG11201600242P A SG 11201600242PA SG 11201600242P A SG11201600242P A SG 11201600242PA
- Authority
- SG
- Singapore
- Prior art keywords
- low density
- polishing pad
- density polishing
- pad
- low
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/04—Zonally-graded surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/205—Lapping pads for working plane surfaces provided with a window for inspecting the surface of the work being lapped
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
- B24D11/005—Making abrasive webs
- B24D11/006—Making abrasive webs without embedded abrasive particles
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/955,398 US20150038066A1 (en) | 2013-07-31 | 2013-07-31 | Low density polishing pad |
PCT/US2014/047065 WO2015017138A1 (en) | 2013-07-31 | 2014-07-17 | Low density polishing pad |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201600242PA true SG11201600242PA (en) | 2016-02-26 |
Family
ID=51263570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201600242PA SG11201600242PA (en) | 2013-07-31 | 2014-07-17 | Low density polishing pad |
Country Status (8)
Country | Link |
---|---|
US (1) | US20150038066A1 (en) |
EP (1) | EP3027363B1 (en) |
JP (3) | JP6517802B2 (en) |
KR (1) | KR101801693B1 (en) |
CN (1) | CN105408063B (en) |
SG (1) | SG11201600242PA (en) |
TW (1) | TWI579106B (en) |
WO (1) | WO2015017138A1 (en) |
Families Citing this family (66)
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US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
US10399201B2 (en) | 2014-10-17 | 2019-09-03 | Applied Materials, Inc. | Advanced polishing pads having compositional gradients by use of an additive manufacturing process |
US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
US10875145B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
KR102295988B1 (en) | 2014-10-17 | 2021-09-01 | 어플라이드 머티어리얼스, 인코포레이티드 | Cmp pad construction with composite material properties using additive manufacturing processes |
US9586304B2 (en) * | 2014-12-19 | 2017-03-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Controlled-expansion CMP PAD casting method |
US10005172B2 (en) * | 2015-06-26 | 2018-06-26 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Controlled-porosity method for forming polishing pad |
US10618141B2 (en) | 2015-10-30 | 2020-04-14 | Applied Materials, Inc. | Apparatus for forming a polishing article that has a desired zeta potential |
US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
WO2017127221A1 (en) | 2016-01-19 | 2017-07-27 | Applied Materials, Inc. | Porous chemical mechanical polishing pads |
JP7148226B2 (en) | 2016-09-21 | 2022-10-05 | 東友ファインケム株式会社 | Red curable resin composition |
US20180304539A1 (en) | 2017-04-21 | 2018-10-25 | Applied Materials, Inc. | Energy delivery system with array of energy sources for an additive manufacturing apparatus |
US20180345449A1 (en) * | 2017-06-06 | 2018-12-06 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads for improved removal rate and planarization |
US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
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JP7045334B2 (en) * | 2017-09-11 | 2022-03-31 | エスケイシー・ソルミックス・カンパニー・リミテッド | Porous polyurethane polishing pad and its manufacturing method |
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KR102054309B1 (en) | 2018-04-17 | 2019-12-10 | 에스케이씨 주식회사 | Porous polishing pad and preparation method thereof |
KR102058877B1 (en) | 2018-04-20 | 2019-12-24 | 에스케이씨 주식회사 | POROUS POLYURETHANE POLISHING PAD and PREPARATION METHOD THEREOF |
JP7299970B2 (en) | 2018-09-04 | 2023-06-28 | アプライド マテリアルズ インコーポレイテッド | Formulations for improved polishing pads |
KR20200079865A (en) | 2018-12-26 | 2020-07-06 | 에스케이씨 주식회사 | Composition for polishing pad, polishing pad and preparation method thereof |
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KR102174958B1 (en) | 2019-03-27 | 2020-11-05 | 에스케이씨 주식회사 | Polishing pad which minimizes occurence of defect and preparation method thereof |
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KR102197481B1 (en) | 2019-06-27 | 2020-12-31 | 에스케이씨 주식회사 | Polishing pad and preparation method thereof |
KR102273097B1 (en) | 2019-10-23 | 2021-07-05 | 에스케이씨솔믹스 주식회사 | Composition for polishing pad, polishing pad and preparation method thereof |
TWI741753B (en) | 2019-10-29 | 2021-10-01 | 南韓商Skc索密思股份有限公司 | Polishing pad, process for preparing the same, and process for preparing a semiconductor device using the same |
KR102188525B1 (en) | 2019-10-29 | 2020-12-08 | 에스케이씨 주식회사 | Polishing pad, preparation method thereof, and preparation method of semiconductor device using same |
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KR102300038B1 (en) | 2019-11-15 | 2021-09-08 | 에스케이씨솔믹스 주식회사 | Polyol composition recycled from polishing pad and preparation method thereof |
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KR102298111B1 (en) | 2019-11-15 | 2021-09-03 | 에스케이씨솔믹스 주식회사 | Polyurethane polishing pad comprising re-polyol and preparation method thereof |
KR102293765B1 (en) | 2019-11-21 | 2021-08-26 | 에스케이씨솔믹스 주식회사 | Polishing pad, preparation method thereof, and preparation method of semiconductor device using same |
KR102177748B1 (en) | 2019-11-28 | 2020-11-11 | 에스케이씨 주식회사 | Porous polishing pad and preparation method thereof |
US11813712B2 (en) | 2019-12-20 | 2023-11-14 | Applied Materials, Inc. | Polishing pads having selectively arranged porosity |
JP7576396B2 (en) * | 2020-01-20 | 2024-10-31 | ニッタ・デュポン株式会社 | Polishing Pad |
US11667061B2 (en) * | 2020-04-18 | 2023-06-06 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of forming leveraged poromeric polishing pad |
US11806829B2 (en) * | 2020-06-19 | 2023-11-07 | Applied Materials, Inc. | Advanced polishing pads and related polishing pad manufacturing methods |
KR20200105465A (en) | 2020-08-28 | 2020-09-07 | 에스케이씨 주식회사 | Composition for polishing pad, polishing pad and preparation method thereof |
KR20200105790A (en) | 2020-09-01 | 2020-09-09 | 에스케이씨 주식회사 | Composition for polishing pad, polishing pad and preparation method thereof |
CN112091817B (en) * | 2020-09-08 | 2022-06-17 | 中国航发贵州黎阳航空动力有限公司 | Thin wall annular part terminal surface grinding tool |
US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
US20240100648A1 (en) * | 2022-09-22 | 2024-03-28 | Cmc Materials Llc | Chemical mechanical polishing pads with a disulfide bridge |
KR102731712B1 (en) | 2023-04-14 | 2024-11-19 | 에스케이엔펄스 주식회사 | Polishing pad with controlled chlorine content and manufacturing method of semiconductor device using the same |
KR102741574B1 (en) | 2023-07-26 | 2024-12-12 | 에스케이엔펄스 주식회사 | Polishing pad with reduced defect occurrence and manufacturing method of semiconductor device using the same |
US20250033160A1 (en) | 2023-07-26 | 2025-01-30 | Sk Enpulse Co., Ltd. | Polishing pad with reduced defect and method of preparing a semiconductor device using the same |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5885312A (en) * | 1997-06-17 | 1999-03-23 | Speedfam Corporation | Grinding composition using abrasive particles on bubbles |
US6231942B1 (en) * | 1998-01-21 | 2001-05-15 | Trexel, Inc. | Method and apparatus for microcellular polypropylene extrusion, and polypropylene articles produced thereby |
TWI228522B (en) * | 1999-06-04 | 2005-03-01 | Fuji Spinning Co Ltd | Urethane molded products for polishing pad and method for making same |
US6368200B1 (en) * | 2000-03-02 | 2002-04-09 | Agere Systems Guardian Corporation | Polishing pads from closed-cell elastomer foam |
US20020016139A1 (en) * | 2000-07-25 | 2002-02-07 | Kazuto Hirokawa | Polishing tool and manufacturing method therefor |
US8062098B2 (en) * | 2000-11-17 | 2011-11-22 | Duescher Wayne O | High speed flat lapping platen |
JP2005517290A (en) * | 2002-02-06 | 2005-06-09 | アプライド マテリアルズ インコーポレイテッド | Method and apparatus for chemical mechanical polishing with eddy current monitoring system |
US6841221B2 (en) * | 2002-02-20 | 2005-01-11 | Congoleum Corporation | Heat activated coating texture |
JP2006513573A (en) * | 2003-01-10 | 2006-04-20 | スリーエム イノベイティブ プロパティズ カンパニー | Pad construction for chemical mechanical planarization applications |
US6960120B2 (en) * | 2003-02-10 | 2005-11-01 | Cabot Microelectronics Corporation | CMP pad with composite transparent window |
JP2004345014A (en) * | 2003-05-21 | 2004-12-09 | Hitachi Chem Co Ltd | Polishing pad and polishing method using the same |
US20050017122A1 (en) * | 2003-07-23 | 2005-01-27 | Conitex-Sonoco Llc | Apparatus and method for forming enlarged base on yarn carrier, and yarn carrier with enlarged base |
US7074115B2 (en) * | 2003-10-09 | 2006-07-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad |
JP2006128563A (en) * | 2004-11-01 | 2006-05-18 | Toyo Tire & Rubber Co Ltd | Polishing pad for polishing semiconductor wafer and method for manufacturing semiconductor device |
EP1704965A1 (en) * | 2005-03-24 | 2006-09-27 | Solvay Fluor GmbH | Grinding aid |
JP4986129B2 (en) * | 2007-01-15 | 2012-07-25 | 東洋ゴム工業株式会社 | Polishing pad |
JP5117147B2 (en) * | 2007-09-11 | 2013-01-09 | 富士紡ホールディングス株式会社 | Polishing pad and method of manufacturing polishing pad |
CN101990483B (en) * | 2008-04-01 | 2013-10-16 | 音诺帕德股份有限公司 | Polishing pad with controlled void formation |
EP2182024A3 (en) * | 2008-10-30 | 2011-04-20 | Rohm and Haas Company | Flexible acrylic foam composition |
JP5393434B2 (en) * | 2008-12-26 | 2014-01-22 | 東洋ゴム工業株式会社 | Polishing pad and manufacturing method thereof |
JP5521243B2 (en) * | 2009-07-03 | 2014-06-11 | 日本発條株式会社 | Polishing holding pad |
US20120009458A1 (en) * | 2010-07-12 | 2012-01-12 | Wu Donald P H | Connecting structure for exteriorly connecting a battery cell and a load |
US8702479B2 (en) * | 2010-10-15 | 2014-04-22 | Nexplanar Corporation | Polishing pad with multi-modal distribution of pore diameters |
US20120302148A1 (en) * | 2011-05-23 | 2012-11-29 | Rajeev Bajaj | Polishing pad with homogeneous body having discrete protrusions thereon |
JP5738731B2 (en) * | 2011-09-22 | 2015-06-24 | 東洋ゴム工業株式会社 | Polishing pad |
JP5945874B2 (en) * | 2011-10-18 | 2016-07-05 | 富士紡ホールディングス株式会社 | Polishing pad and manufacturing method thereof |
-
2013
- 2013-07-31 US US13/955,398 patent/US20150038066A1/en not_active Abandoned
-
2014
- 2014-07-17 CN CN201480042621.4A patent/CN105408063B/en active Active
- 2014-07-17 EP EP14747270.8A patent/EP3027363B1/en active Active
- 2014-07-17 SG SG11201600242PA patent/SG11201600242PA/en unknown
- 2014-07-17 WO PCT/US2014/047065 patent/WO2015017138A1/en active Application Filing
- 2014-07-17 JP JP2016531739A patent/JP6517802B2/en active Active
- 2014-07-17 KR KR1020167002464A patent/KR101801693B1/en active IP Right Grant
- 2014-07-30 TW TW103126073A patent/TWI579106B/en active
-
2016
- 2016-12-02 JP JP2016234679A patent/JP6415521B2/en active Active
-
2018
- 2018-12-20 JP JP2018238139A patent/JP2019077036A/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
WO2015017138A1 (en) | 2015-02-05 |
CN105408063B (en) | 2018-01-30 |
JP6517802B2 (en) | 2019-05-22 |
EP3027363A1 (en) | 2016-06-08 |
EP3027363B1 (en) | 2020-01-15 |
JP2016525459A (en) | 2016-08-25 |
JP2017042910A (en) | 2017-03-02 |
US20150038066A1 (en) | 2015-02-05 |
JP6415521B2 (en) | 2018-10-31 |
KR20160027075A (en) | 2016-03-09 |
KR101801693B1 (en) | 2017-11-27 |
TW201509595A (en) | 2015-03-16 |
CN105408063A (en) | 2016-03-16 |
JP2019077036A (en) | 2019-05-23 |
TWI579106B (en) | 2017-04-21 |
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