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SE9700539L - Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta - Google Patents

Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta

Info

Publication number
SE9700539L
SE9700539L SE9700539A SE9700539A SE9700539L SE 9700539 L SE9700539 L SE 9700539L SE 9700539 A SE9700539 A SE 9700539A SE 9700539 A SE9700539 A SE 9700539A SE 9700539 L SE9700539 L SE 9700539L
Authority
SE
Sweden
Prior art keywords
test surface
partial images
camera
central unit
measuring
Prior art date
Application number
SE9700539A
Other languages
Unknown language ( )
English (en)
Other versions
SE508822C2 (sv
SE9700539D0 (sv
Inventor
Peter Larsson
Erland Max
Anders Larsson
Original Assignee
Volvo Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Volvo Ab filed Critical Volvo Ab
Priority to SE9700539A priority Critical patent/SE508822C2/sv
Publication of SE9700539D0 publication Critical patent/SE9700539D0/sv
Priority to EP98904474A priority patent/EP0960318B1/en
Priority to PCT/SE1998/000226 priority patent/WO1998036240A1/en
Priority to AU62334/98A priority patent/AU6233498A/en
Priority to DE69833103T priority patent/DE69833103T2/de
Publication of SE9700539L publication Critical patent/SE9700539L/sv
Publication of SE508822C2 publication Critical patent/SE508822C2/sv
Priority to US09/375,848 priority patent/US6667800B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE9700539A 1997-02-17 1997-02-17 Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta SE508822C2 (sv)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SE9700539A SE508822C2 (sv) 1997-02-17 1997-02-17 Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta
EP98904474A EP0960318B1 (en) 1997-02-17 1998-02-10 Method for measuring and quantifying surface defects on a test surface
PCT/SE1998/000226 WO1998036240A1 (en) 1997-02-17 1998-02-10 Method and device for measuring and quantifying surface defects on a test surface
AU62334/98A AU6233498A (en) 1997-02-17 1998-02-10 Method and device for measuring and quantifying surface defects on a test surface
DE69833103T DE69833103T2 (de) 1997-02-17 1998-02-10 Verfahren zum messen und quantifizieren von oberflächenfehlern auf einer prüfoberfläche
US09/375,848 US6667800B1 (en) 1997-02-17 1999-08-17 Method and device for measuring and quantifying surface defects on a test surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9700539A SE508822C2 (sv) 1997-02-17 1997-02-17 Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta

Publications (3)

Publication Number Publication Date
SE9700539D0 SE9700539D0 (sv) 1997-02-17
SE9700539L true SE9700539L (sv) 1998-08-18
SE508822C2 SE508822C2 (sv) 1998-11-09

Family

ID=20405811

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9700539A SE508822C2 (sv) 1997-02-17 1997-02-17 Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta

Country Status (6)

Country Link
US (1) US6667800B1 (sv)
EP (1) EP0960318B1 (sv)
AU (1) AU6233498A (sv)
DE (1) DE69833103T2 (sv)
SE (1) SE508822C2 (sv)
WO (1) WO1998036240A1 (sv)

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GB9824986D0 (en) 1998-11-13 1999-01-06 Isis Innovation Non-contact topographical analysis apparatus and method thereof
SE511985C2 (sv) 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topografisk bestämning av en av infallande ljus belyst yta
SE515711C2 (sv) * 2000-02-09 2001-10-01 Volvo Personvagnar Ab Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt
SE0003904L (sv) * 2000-05-05 2001-11-06 Roger Tuomas Sätt att mäta ytråhet
US7430485B2 (en) 2003-08-22 2008-09-30 Rohm And Haas Company Method and system for analyzing coatings undergoing exposure testing
US20080027580A1 (en) * 2006-07-28 2008-01-31 Hui Zhang Robot programming method and apparatus with both vision and force
US8594417B2 (en) * 2007-11-27 2013-11-26 Alcoa Inc. Systems and methods for inspecting anodes and smelting management relating to the same
US10853873B2 (en) 2008-10-02 2020-12-01 Ecoatm, Llc Kiosks for evaluating and purchasing used electronic devices and related technology
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
US9881284B2 (en) 2008-10-02 2018-01-30 ecoATM, Inc. Mini-kiosk for recycling electronic devices
US20130144797A1 (en) * 2008-10-02 2013-06-06 ecoATM, Inc. Method And Apparatus For Recycling Electronic Devices
ES2791048T3 (es) 2008-10-02 2020-10-30 Ecoatm Llc Sistema de venta y mercado secundario de dispositivos
CA2832492C (en) 2011-04-06 2020-09-08 ecoATM, Inc. Method and kiosk for recycling electronic devices
JP2015129715A (ja) * 2014-01-08 2015-07-16 リコーエレメックス株式会社 検査装置及び検査装置の制御方法
US10401411B2 (en) 2014-09-29 2019-09-03 Ecoatm, Llc Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices
EP3201846B1 (en) 2014-10-02 2024-07-03 ecoATM, LLC Wireless-enabled kiosk for recycling consumer devices
CA2964223C (en) 2014-10-02 2020-04-14 ecoATM, Inc. Application for device evaluation and other processes associated with device recycling
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
CA2966348C (en) 2014-10-31 2019-11-12 ecoATM, Inc. Systems and methods for recycling consumer electronic devices
US10572946B2 (en) 2014-10-31 2020-02-25 Ecoatm, Llc Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices
CA2967021C (en) 2014-11-06 2024-03-12 ecoATM, Inc. Methods and systems for evaluating and recycling electronic devices
US11080672B2 (en) 2014-12-12 2021-08-03 Ecoatm, Llc Systems and methods for recycling consumer electronic devices
JP6292145B2 (ja) * 2015-02-24 2018-03-14 Ｊｆｅスチール株式会社 金属帯エッジ部の欠陥検出方法および金属帯エッジ部の欠陥検出装置
US10127647B2 (en) 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices
US9885672B2 (en) 2016-06-08 2018-02-06 ecoATM, Inc. Methods and systems for detecting screen covers on electronic devices
US10269110B2 (en) 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
CA3124435A1 (en) 2018-12-19 2020-06-25 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
US11482067B2 (en) 2019-02-12 2022-10-25 Ecoatm, Llc Kiosk for evaluating and purchasing used electronic devices
CA3129917A1 (en) 2019-02-12 2020-08-20 Ecoatm, Llc Connector carrier for electronic device kiosk
CN111738402A (zh) 2019-02-18 2020-10-02 埃科亚特姆公司 基于神经网络的电子设备物理状况评估及相关系统和方法
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
WO2022040667A1 (en) 2020-08-17 2022-02-24 Ecoatm, Llc Evaluating an electronic device using a wireless charger

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4162126A (en) * 1976-12-10 1979-07-24 Hitachi, Ltd. Surface detect test apparatus
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
JP2797333B2 (ja) * 1988-09-16 1998-09-17 セイコーエプソン株式会社 コンタクトレンズの製造方法及び装置
US5401977A (en) * 1988-10-14 1995-03-28 Byk-Gardner Gmbh Method and apparatus for gloss measurement with reference value pairs
US5129009A (en) * 1990-06-04 1992-07-07 Motorola, Inc. Method for automatic semiconductor wafer inspection
US5426506A (en) * 1993-03-22 1995-06-20 The University Of Chicago Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics
US5828500A (en) * 1995-10-11 1998-10-27 Asahi Kogaku Kogyo Kabushiki Kaisha Optical element inspecting apparatus
US5987159A (en) * 1996-09-24 1999-11-16 Cognex Corporation System or method for detecting defect within a semi-opaque enclosure
US5859698A (en) * 1997-05-07 1999-01-12 Nikon Corporation Method and apparatus for macro defect detection using scattered light

Also Published As

Publication number Publication date
DE69833103D1 (de) 2006-03-30
EP0960318A1 (en) 1999-12-01
SE508822C2 (sv) 1998-11-09
AU6233498A (en) 1998-09-08
SE9700539D0 (sv) 1997-02-17
US6667800B1 (en) 2003-12-23
WO1998036240A1 (en) 1998-08-20
EP0960318B1 (en) 2006-01-04
DE69833103T2 (de) 2006-08-31

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