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PL2029967T5 - Sposób pomiaru przedmiotu - Google Patents

Sposób pomiaru przedmiotu

Info

Publication number
PL2029967T5
PL2029967T5 PL07733073T PL07733073T PL2029967T5 PL 2029967 T5 PL2029967 T5 PL 2029967T5 PL 07733073 T PL07733073 T PL 07733073T PL 07733073 T PL07733073 T PL 07733073T PL 2029967 T5 PL2029967 T5 PL 2029967T5
Authority
PL
Poland
Prior art keywords
measuring
Prior art date
Application number
PL07733073T
Other languages
English (en)
Other versions
PL2029967T3 (pl
Inventor
Peter Kenneth Hellier
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=36745310&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL2029967(T5) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Renishaw Plc filed Critical Renishaw Plc
Publication of PL2029967T3 publication Critical patent/PL2029967T3/pl
Publication of PL2029967T5 publication Critical patent/PL2029967T5/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
PL07733073T 2006-06-06 2007-06-06 Sposób pomiaru przedmiotu PL2029967T5 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0611109.0A GB0611109D0 (en) 2006-06-06 2006-06-06 A method for measuring workpieces
PCT/GB2007/002058 WO2007141509A1 (en) 2006-06-06 2007-06-06 A method for measuring an object
EP07733073.6A EP2029967B2 (en) 2006-06-06 2007-06-06 A method for measuring an object

Publications (2)

Publication Number Publication Date
PL2029967T3 PL2029967T3 (pl) 2013-09-30
PL2029967T5 true PL2029967T5 (pl) 2018-02-28

Family

ID=36745310

Family Applications (1)

Application Number Title Priority Date Filing Date
PL07733073T PL2029967T5 (pl) 2006-06-06 2007-06-06 Sposób pomiaru przedmiotu

Country Status (8)

Country Link
US (1) US7765708B2 (pl)
EP (2) EP2647950B1 (pl)
JP (2) JP5437796B2 (pl)
CN (2) CN101467000B (pl)
DE (1) DE202007019371U1 (pl)
GB (1) GB0611109D0 (pl)
PL (1) PL2029967T5 (pl)
WO (1) WO2007141509A1 (pl)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0611109D0 (en) * 2006-06-06 2006-07-19 Renishaw Plc A method for measuring workpieces
JP5039666B2 (ja) * 2008-08-29 2012-10-03 三菱重工業株式会社 表面粗さの測定方法、表面粗さ測定装置及び加工装置
NL1036517C2 (nl) * 2009-02-05 2010-08-10 Holding Prodim Systems B V Inrichting en werkwijze voor het uitzetten van contouren of werken en een meetinrichting en aanwijsinrichting ingericht voor gebruik hierbij.
JP5269698B2 (ja) * 2009-06-10 2013-08-21 株式会社ミツトヨ 真円度測定装置
DE102010040195A1 (de) * 2009-10-28 2011-05-05 Dr. Johannes Heidenhain Gmbh Tastsystem und Verfahren zum Betrieb eines Tastsystems
EP2402714B1 (fr) * 2010-07-02 2013-04-17 Tesa Sa Dispositif de mesure de dimensions
JP2012103081A (ja) * 2010-11-09 2012-05-31 Mitsubishi Heavy Ind Ltd 穴検査装置
CN104487801B (zh) * 2012-04-18 2018-12-07 瑞尼斯豪公司 在机床上测量的方法以及相应的机床设备
IN2014DN08719A (pl) 2012-04-18 2015-05-22 Renishaw Plc
EP2839240B1 (en) 2012-04-18 2017-09-06 Renishaw PLC A method of analogue measurement scanning on a machine tool and corresponding machine tool apparatus
DE102013003585A1 (de) * 2013-03-01 2014-09-04 Liebherr-Verzahntechnik Gmbh Verfahren zur Verzahnungsmessung sowie Messeinrichtung und Verzahnmaschine
US9797699B2 (en) * 2013-08-22 2017-10-24 Illinois Tool Works Inc. Off-axis loadcell force sensing to automatically determine location of specimen features
WO2015162431A1 (en) * 2014-04-23 2015-10-29 Renishaw Plc Calibration of measurement probes
GB201417771D0 (en) 2014-10-08 2014-11-19 Delcam Ltd Measuring device and related methods
GB201505999D0 (en) 2015-04-09 2015-05-27 Renishaw Plc Measurement method and apparatus
CN106945034B (zh) * 2016-01-07 2021-09-03 鸿富锦精密电子(郑州)有限公司 机器人点位调节方法与系统
CN108562255B (zh) * 2018-01-05 2020-05-01 宿州大地网络科技有限公司 一种加工机床中在线测量的接触式探头迟疑信号的提取方法
US11487269B2 (en) * 2019-12-11 2022-11-01 GM Global Technology Operations LLC System and method to derive and apply computer numerical control global offsets during part measurement on coordinate measuring machine
ES2951021T3 (es) * 2020-01-13 2023-10-17 Ivoclar Vivadent Ag Fresadora dental y procedimiento de fresado dental
CN112171379B (zh) * 2020-08-22 2021-07-27 芽米科技成都有限公司 数控车床检测待维修管件中心轴偏移量的方法
US11644294B2 (en) 2021-01-29 2023-05-09 Autodesk, Inc. Automatic generation of probe path for surface inspection and part alignment
CN113639979B (zh) * 2021-07-26 2022-04-26 苏州佳祺仕信息科技有限公司 一种检测治具及用于检测带孔工件性能的检测装置

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US3481466A (en) † 1968-03-19 1969-12-02 Micromatic Hone Corp Total indicated reading comparator circuit
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DE2333502A1 (de) † 1973-07-02 1975-01-30 Maag Zahnraeder & Maschinen Ag Vorrichtung zum pruefen von verzahnungsprofilen
GB1551218A (en) † 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
GB8612038D0 (en) 1986-05-17 1986-06-25 Tole W R Dimensional measurement of object
GB8618152D0 (en) * 1986-07-25 1986-09-03 Renishaw Plc Co-ordinate measuring
US4831741A (en) * 1987-02-04 1989-05-23 Sogoian Kaloust P Manufacturing gaging system for quality control
US4800652A (en) * 1987-09-25 1989-01-31 The Timken Company Machine for measuring generally circular objects in cylindrical coordinates
US5212646A (en) * 1987-12-19 1993-05-18 Renishaw Plc Method of using a mounting for surface-sensing stylus
US5165269A (en) * 1990-10-29 1992-11-24 Iimorrow, Inc. Electronic flux gate compass calibration technique
JPH07109363B2 (ja) * 1991-09-04 1995-11-22 株式会社中防鉄工所 棒状ワークの検査方法
DE4212455C3 (de) † 1992-04-14 2001-09-06 Zeiss Carl Verfahren zur Messung von Formelementen auf einem Koordinatenmeßgerät
JP2531609Y2 (ja) * 1992-05-12 1997-04-09 オークマ株式会社 非円形状ワークの位相及び径のチェック装置
JP3064111B2 (ja) * 1992-07-18 2000-07-12 先生精機株式会社 比較判別装置
US5341574A (en) * 1993-06-29 1994-08-30 The United States Of America As Represented By The Department Of Energy Coordinate measuring machine test standard apparatus and method
JPH07190702A (ja) * 1993-12-27 1995-07-28 Mazda Motor Corp カムシャフトの検査方法および検査装置
JP2967458B2 (ja) * 1994-11-11 1999-10-25 日産ネジ株式会社 ボルト軸部曲がり検出装置
US5898590A (en) * 1996-08-21 1999-04-27 The Boeing Company Method and apparatus for numerically controlled pattern determination
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GB9815830D0 (en) * 1998-07-22 1998-09-16 Renishaw Plc Method of and apparatus for reducing vibrations on probes carried by coordinate measuring machines
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system
JP2000292156A (ja) * 1999-04-09 2000-10-20 Tokyo Seimitsu Co Ltd ねじ穴有効深さ測定方法
JP2001038536A (ja) * 1999-08-03 2001-02-13 Tsunehiro Yoshida ネジ軸が曲がった不良ネジの選別装置
NL1013479C1 (nl) * 1999-11-03 2001-05-09 Theodorus Wilhelmus Antonius C Meetinrichting omvattende een verplaatsbare meettaster.
US6668466B1 (en) * 2000-10-19 2003-12-30 Sandia Corporation Highly accurate articulated coordinate measuring machine
JP3961293B2 (ja) * 2002-01-07 2007-08-22 株式会社ミツトヨ 表面性状倣い測定方法、プログラムおよび記録媒体
DE10262188B4 (de) † 2002-08-29 2010-05-12 Blum-Novotest Gmbh Multidirektionaler Messtaster
AU2003290051A1 (en) † 2002-12-13 2004-07-09 Werth Messtechnik Gmbh Method for measuring a contour of a workpiece by scanning
GB0322362D0 (en) * 2003-09-24 2003-10-22 Renishaw Plc Measuring methods for use on machine tools
GB0608235D0 (en) * 2006-04-26 2006-06-07 Renishaw Plc Differential calibration
GB0611109D0 (en) * 2006-06-06 2006-07-19 Renishaw Plc A method for measuring workpieces

Also Published As

Publication number Publication date
EP2647950A1 (en) 2013-10-09
US7765708B2 (en) 2010-08-03
PL2029967T3 (pl) 2013-09-30
EP2029967B2 (en) 2017-09-27
CN102607492B (zh) 2014-07-30
JP2009540285A (ja) 2009-11-19
EP2029967A1 (en) 2009-03-04
US20090235547A1 (en) 2009-09-24
CN101467000B (zh) 2012-02-29
GB0611109D0 (en) 2006-07-19
CN102607492A (zh) 2012-07-25
WO2007141509A1 (en) 2007-12-13
JP5437796B2 (ja) 2014-03-12
EP2647950B1 (en) 2018-05-09
EP2029967B1 (en) 2013-07-17
JP2014077799A (ja) 2014-05-01
CN101467000A (zh) 2009-06-24
DE202007019371U1 (de) 2012-02-01

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