PL1769105T3 - Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania - Google Patents
Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzaniaInfo
- Publication number
- PL1769105T3 PL1769105T3 PL05751252T PL05751252T PL1769105T3 PL 1769105 T3 PL1769105 T3 PL 1769105T3 PL 05751252 T PL05751252 T PL 05751252T PL 05751252 T PL05751252 T PL 05751252T PL 1769105 T3 PL1769105 T3 PL 1769105T3
- Authority
- PL
- Poland
- Prior art keywords
- preparation
- gallium nitride
- crystalline gallium
- bulk mono
- mono
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/38—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B9/00—Single-crystal growth from melt solutions using molten solvents
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PL04368483A PL368483A1 (pl) | 2004-06-11 | 2004-06-11 | Monokryształy azotku zawierającego gal oraz jego zastosowanie |
PL04368781A PL368781A1 (pl) | 2004-06-25 | 2004-06-25 | Monokryształ azotku zawierającego gal oraz jego zastosowanie |
PCT/JP2005/011093 WO2005121415A1 (en) | 2004-06-11 | 2005-06-10 | Bulk mono-crystalline gallium-containing nitride and its application |
EP05751252.7A EP1769105B1 (en) | 2004-06-11 | 2005-06-10 | Bulk mono-crystalline gallium nitride and method for its preparation |
Publications (1)
Publication Number | Publication Date |
---|---|
PL1769105T3 true PL1769105T3 (pl) | 2014-11-28 |
Family
ID=34972821
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL05751252T PL1769105T3 (pl) | 2004-06-11 | 2005-06-10 | Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania |
Country Status (6)
Country | Link |
---|---|
US (1) | US8398767B2 (pl) |
EP (1) | EP1769105B1 (pl) |
JP (1) | JP5014804B2 (pl) |
KR (1) | KR100848380B1 (pl) |
PL (1) | PL1769105T3 (pl) |
WO (1) | WO2005121415A1 (pl) |
Families Citing this family (66)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4383172B2 (ja) | 2001-10-26 | 2009-12-16 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | 窒化物バルク単結晶層を用いる発光素子構造及びその製造方法 |
US20060138431A1 (en) | 2002-05-17 | 2006-06-29 | Robert Dwilinski | Light emitting device structure having nitride bulk single crystal layer |
JP4824313B2 (ja) | 2002-12-11 | 2011-11-30 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | ガリウム含有窒化物バルク単結晶を得るためのプロセス、得られた結晶から不純物を排除するためのプロセス、及びガリウム含有窒化物バルク単結晶からなる基板を製造するためのプロセス |
JP4860927B2 (ja) | 2002-12-11 | 2012-01-25 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | エピタキシ用基板及びその製造方法 |
US7435295B2 (en) | 2004-02-19 | 2008-10-14 | Matsushita Electric Industrial Co., Ltd. | Method for producing compound single crystal and production apparatus for use therein |
PL1769105T3 (pl) | 2004-06-11 | 2014-11-28 | Ammono S A | Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania |
PL371405A1 (pl) | 2004-11-26 | 2006-05-29 | Ammono Sp.Z O.O. | Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku |
JP2007277074A (ja) * | 2006-01-10 | 2007-10-25 | Ngk Insulators Ltd | 窒化アルミニウム単結晶の製造方法及び窒化アルミニウム単結晶 |
US8253221B2 (en) * | 2007-09-19 | 2012-08-28 | The Regents Of The University Of California | Gallium nitride bulk crystals and their growth method |
US8728234B2 (en) | 2008-06-04 | 2014-05-20 | Sixpoint Materials, Inc. | Methods for producing improved crystallinity group III-nitride crystals from initial group III-nitride seed by ammonothermal growth |
JP5129527B2 (ja) * | 2006-10-02 | 2013-01-30 | 株式会社リコー | 結晶製造方法及び基板製造方法 |
JP4760652B2 (ja) * | 2006-10-03 | 2011-08-31 | 三菱化学株式会社 | Ga含有窒化物結晶の製造方法およびそれを用いた半導体デバイスの製造方法 |
CN103184519A (zh) * | 2006-10-08 | 2013-07-03 | 迈图高新材料公司 | 用于形成氮化物晶体的方法 |
KR101330251B1 (ko) * | 2007-03-06 | 2013-11-15 | 서울바이오시스 주식회사 | 패터닝된 기판 상에 질화물 반도체층을 형성하는 방법 및그것을 갖는 발광 다이오드 |
WO2008143166A1 (ja) * | 2007-05-17 | 2008-11-27 | Mitsubishi Chemical Corporation | Iii族窒化物半導体結晶の製造方法、iii族窒化物半導体基板および半導体発光デバイス |
JP5560528B2 (ja) | 2008-01-28 | 2014-07-30 | 住友電気工業株式会社 | Iii族窒化物単結晶インゴットの製造方法、及びiii族窒化物単結晶基板の製造方法 |
WO2009108700A1 (en) | 2008-02-25 | 2009-09-03 | Sixpoint Materials, Inc. | Method for producing group iii nitride wafers and group iii nitride wafers |
WO2009149300A1 (en) | 2008-06-04 | 2009-12-10 | Sixpoint Materials | High-pressure vessel for growing group iii nitride crystals and method of growing group iii nitride crystals using high-pressure vessel and group iii nitride crystal |
US9157167B1 (en) | 2008-06-05 | 2015-10-13 | Soraa, Inc. | High pressure apparatus and method for nitride crystal growth |
US8097081B2 (en) | 2008-06-05 | 2012-01-17 | Soraa, Inc. | High pressure apparatus and method for nitride crystal growth |
US8871024B2 (en) | 2008-06-05 | 2014-10-28 | Soraa, Inc. | High pressure apparatus and method for nitride crystal growth |
WO2009151642A1 (en) | 2008-06-12 | 2009-12-17 | Sixpoint Materials, Inc. | Method for testing group-iii nitride wafers and group iii-nitride wafers with test data |
US8303710B2 (en) | 2008-06-18 | 2012-11-06 | Soraa, Inc. | High pressure apparatus and method for nitride crystal growth |
US8284810B1 (en) | 2008-08-04 | 2012-10-09 | Soraa, Inc. | Solid state laser device using a selected crystal orientation in non-polar or semi-polar GaN containing materials and methods |
WO2010017148A1 (en) | 2008-08-04 | 2010-02-11 | Soraa, Inc. | White light devices using non-polar or semipolar gallium containing materials and phosphors |
US8021481B2 (en) | 2008-08-07 | 2011-09-20 | Soraa, Inc. | Process and apparatus for large-scale manufacturing of bulk monocrystalline gallium-containing nitride |
US8323405B2 (en) | 2008-08-07 | 2012-12-04 | Soraa, Inc. | Process and apparatus for growing a crystalline gallium-containing nitride using an azide mineralizer |
US8430958B2 (en) | 2008-08-07 | 2013-04-30 | Soraa, Inc. | Apparatus and method for seed crystal utilization in large-scale manufacturing of gallium nitride |
US10036099B2 (en) | 2008-08-07 | 2018-07-31 | Slt Technologies, Inc. | Process for large-scale ammonothermal manufacturing of gallium nitride boules |
US8979999B2 (en) | 2008-08-07 | 2015-03-17 | Soraa, Inc. | Process for large-scale ammonothermal manufacturing of gallium nitride boules |
PL394857A1 (pl) * | 2008-08-07 | 2011-09-26 | Sorra, Inc. | Sposób amonotermalnego wytwarzania kryształów ciągnionych azotku galu na dużą skalę |
US8354679B1 (en) | 2008-10-02 | 2013-01-15 | Soraa, Inc. | Microcavity light emitting diode method of manufacture |
US8455894B1 (en) | 2008-10-17 | 2013-06-04 | Soraa, Inc. | Photonic-crystal light emitting diode and method of manufacture |
WO2010060034A1 (en) | 2008-11-24 | 2010-05-27 | Sixpoint Materials, Inc. | METHODS FOR PRODUCING GaN NUTRIENT FOR AMMONOTHERMAL GROWTH |
USRE47114E1 (en) | 2008-12-12 | 2018-11-06 | Slt Technologies, Inc. | Polycrystalline group III metal nitride with getter and method of making |
US9543392B1 (en) | 2008-12-12 | 2017-01-10 | Soraa, Inc. | Transparent group III metal nitride and method of manufacture |
US8461071B2 (en) | 2008-12-12 | 2013-06-11 | Soraa, Inc. | Polycrystalline group III metal nitride with getter and method of making |
US8878230B2 (en) | 2010-03-11 | 2014-11-04 | Soraa, Inc. | Semi-insulating group III metal nitride and method of manufacture |
US8987156B2 (en) | 2008-12-12 | 2015-03-24 | Soraa, Inc. | Polycrystalline group III metal nitride with getter and method of making |
US7892513B2 (en) * | 2009-01-26 | 2011-02-22 | Sumitomo Electric Industries, Ltd. | Group III nitride crystal and method of its growth |
JP5709122B2 (ja) * | 2009-02-20 | 2015-04-30 | 三菱化学株式会社 | アモノサーマル法および窒化物結晶 |
US8299473B1 (en) | 2009-04-07 | 2012-10-30 | Soraa, Inc. | Polarized white light devices using non-polar or semipolar gallium containing materials and transparent phosphors |
WO2010129718A2 (en) | 2009-05-05 | 2010-11-11 | Sixpoint Materials, Inc. | Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride |
US8306081B1 (en) | 2009-05-27 | 2012-11-06 | Soraa, Inc. | High indium containing InGaN substrates for long wavelength optical devices |
EP2267197A1 (en) * | 2009-06-25 | 2010-12-29 | AMMONO Sp.z o.o. | Method of obtaining bulk mono-crystalline gallium-containing nitride, bulk mono-crystalline gallium-containing nitride, substrates manufactured thereof and devices manufactured on such substrates |
US8435347B2 (en) | 2009-09-29 | 2013-05-07 | Soraa, Inc. | High pressure apparatus with stackable rings |
US9175418B2 (en) | 2009-10-09 | 2015-11-03 | Soraa, Inc. | Method for synthesis of high quality large area bulk gallium based crystals |
PL224995B1 (pl) | 2010-04-06 | 2017-02-28 | Inst Wysokich Ciśnień Polskiej Akademii Nauk | Podłoże do wzrostu epitaksjalnego |
US9564320B2 (en) | 2010-06-18 | 2017-02-07 | Soraa, Inc. | Large area nitride crystal and method for making it |
US8729559B2 (en) | 2010-10-13 | 2014-05-20 | Soraa, Inc. | Method of making bulk InGaN substrates and devices thereon |
US8786053B2 (en) | 2011-01-24 | 2014-07-22 | Soraa, Inc. | Gallium-nitride-on-handle substrate materials and devices and method of manufacture |
WO2012128263A1 (ja) * | 2011-03-22 | 2012-09-27 | 三菱化学株式会社 | 窒化物結晶の製造方法 |
WO2013010117A1 (en) * | 2011-07-13 | 2013-01-17 | The Regents Of The University Of California | Growing a group-iii nitride crystal using a flux growth and then using the group-iii nitride crystal as a seed for an ammonothermal re-growth |
JP2013058741A (ja) * | 2011-08-17 | 2013-03-28 | Hitachi Cable Ltd | 金属塩化物ガス発生装置、ハイドライド気相成長装置、及び窒化物半導体テンプレート |
US8482104B2 (en) | 2012-01-09 | 2013-07-09 | Soraa, Inc. | Method for growth of indium-containing nitride films |
JP2015509669A (ja) | 2012-03-06 | 2015-03-30 | ソラア インコーポレーテッドSoraa Inc. | 導波光効果を低減させる低屈折率材料層を有する発光ダイオード |
JP6106932B2 (ja) * | 2012-03-19 | 2017-04-05 | 株式会社リコー | 13族窒化物結晶、及び13族窒化物結晶基板 |
US10145026B2 (en) | 2012-06-04 | 2018-12-04 | Slt Technologies, Inc. | Process for large-scale ammonothermal manufacturing of semipolar gallium nitride boules |
JP6017035B2 (ja) * | 2012-07-23 | 2016-10-26 | ▲東▼莞市中▲か▼半▲導▼体科技有限公司Sino Nitride Semiconductor Co, Ltd | 金属拡散を防止する保護層付きの複合基板 |
EP2888390A1 (en) * | 2012-08-24 | 2015-07-01 | Sixpoint Materials Inc. | A bismuth-doped semi-insulating group iii nitride wafer and its production method |
US9761763B2 (en) | 2012-12-21 | 2017-09-12 | Soraa, Inc. | Dense-luminescent-materials-coated violet LEDs |
WO2014129544A1 (ja) | 2013-02-22 | 2014-08-28 | 三菱化学株式会社 | 周期表第13族金属窒化物結晶およびその製造方法 |
US11466384B2 (en) | 2019-01-08 | 2022-10-11 | Slt Technologies, Inc. | Method of forming a high quality group-III metal nitride boule or wafer using a patterned substrate |
US11721549B2 (en) | 2020-02-11 | 2023-08-08 | Slt Technologies, Inc. | Large area group III nitride crystals and substrates, methods of making, and methods of use |
EP4104201A1 (en) | 2020-02-11 | 2022-12-21 | SLT Technologies, Inc. | Improved group iii nitride substrate, method of making, and method of use |
US12091771B2 (en) | 2020-02-11 | 2024-09-17 | Slt Technologies, Inc. | Large area group III nitride crystals and substrates, methods of making, and methods of use |
Family Cites Families (132)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6065798A (ja) | 1983-09-19 | 1985-04-15 | Toyota Central Res & Dev Lab Inc | 窒化ガリウム単結晶の成長方法 |
CN1014535B (zh) | 1988-12-30 | 1991-10-30 | 中国科学院物理研究所 | 利用改进的矿化剂生长磷酸钛氧钾单晶的方法 |
US5096860A (en) * | 1990-05-25 | 1992-03-17 | Alcan International Limited | Process for producing unagglomerated single crystals of aluminum nitride |
KR920004181B1 (ko) * | 1990-09-13 | 1992-05-30 | 한국과학기술연구원 | 입방정질화붕소의 제조방법 |
US5190738A (en) * | 1991-06-17 | 1993-03-02 | Alcan International Limited | Process for producing unagglomerated single crystals of aluminum nitride |
US5306662A (en) * | 1991-11-08 | 1994-04-26 | Nichia Chemical Industries, Ltd. | Method of manufacturing P-type compound semiconductor |
US5456204A (en) * | 1993-05-28 | 1995-10-10 | Alfa Quartz, C.A. | Filtering flow guide for hydrothermal crystal growth |
PL173917B1 (pl) | 1993-08-10 | 1998-05-29 | Ct Badan Wysokocisnieniowych P | Sposób wytwarzania krystalicznej struktury wielowarstwowej |
WO1995008007A1 (en) * | 1993-09-17 | 1995-03-23 | Brent International Plc | Pre-rinse for phosphating metal surfaces |
US5679152A (en) * | 1994-01-27 | 1997-10-21 | Advanced Technology Materials, Inc. | Method of making a single crystals Ga*N article |
WO1995027815A1 (fr) | 1994-04-08 | 1995-10-19 | Japan Energy Corporation | Procede de tirage d'un cristal semi-conducteur constitue par un compose de nitrure de gallium et dispositif semi-conducteur a composes de nitrure de gallium |
US5599520A (en) * | 1994-11-03 | 1997-02-04 | Garces; Juan M. | Synthesis of crystalline porous solids in ammonia |
US5777350A (en) | 1994-12-02 | 1998-07-07 | Nichia Chemical Industries, Ltd. | Nitride semiconductor light-emitting device |
US5679965A (en) * | 1995-03-29 | 1997-10-21 | North Carolina State University | Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact, non-nitride buffer layer and methods of fabricating same |
US5670798A (en) * | 1995-03-29 | 1997-09-23 | North Carolina State University | Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact non-nitride buffer layer and methods of fabricating same |
JP3728332B2 (ja) * | 1995-04-24 | 2005-12-21 | シャープ株式会社 | 化合物半導体発光素子 |
CN1132253C (zh) * | 1995-08-31 | 2003-12-24 | 株式会社东芝 | 氮化镓基半导体发光元件及其制造方法 |
DE69633203T2 (de) * | 1995-09-18 | 2005-09-01 | Hitachi, Ltd. | Halbleiterlaservorrichtungen |
US5692663A (en) * | 1996-07-11 | 1997-12-02 | Testo Industry Corp. | Trigger structure |
CN1065289C (zh) | 1996-07-22 | 2001-05-02 | 中国科学院物理研究所 | 一种制备掺杂钒酸盐单晶的水热生长方法 |
JP3179346B2 (ja) * | 1996-08-27 | 2001-06-25 | 松下電子工業株式会社 | 窒化ガリウム結晶の製造方法 |
JPH1084161A (ja) * | 1996-09-06 | 1998-03-31 | Sumitomo Electric Ind Ltd | 半導体レーザ及びその製造方法 |
US6031858A (en) * | 1996-09-09 | 2000-02-29 | Kabushiki Kaisha Toshiba | Semiconductor laser and method of fabricating same |
US6542526B1 (en) * | 1996-10-30 | 2003-04-01 | Hitachi, Ltd. | Optical information processor and semiconductor light emitting device suitable for the same |
US6177292B1 (en) * | 1996-12-05 | 2001-01-23 | Lg Electronics Inc. | Method for forming GaN semiconductor single crystal substrate and GaN diode with the substrate |
US6677619B1 (en) * | 1997-01-09 | 2004-01-13 | Nichia Chemical Industries, Ltd. | Nitride semiconductor device |
CA2276335C (en) * | 1997-01-09 | 2006-04-11 | Nichia Chemical Industries, Ltd. | Nitride semiconductor device |
US5868837A (en) * | 1997-01-17 | 1999-02-09 | Cornell Research Foundation, Inc. | Low temperature method of preparing GaN single crystals |
PL184902B1 (pl) * | 1997-04-04 | 2003-01-31 | Centrum Badan Wysokocisnieniowych Pan | Sposób usuwania nierówności i obszarów silnie zdefektowanych z powierzchni kryształów i warstw epitaksjalnych GaN i Ga AL In N |
JP3491492B2 (ja) * | 1997-04-09 | 2004-01-26 | 松下電器産業株式会社 | 窒化ガリウム結晶の製造方法 |
CN1159750C (zh) | 1997-04-11 | 2004-07-28 | 日亚化学工业株式会社 | 氮化物半导体的生长方法 |
US5888389A (en) * | 1997-04-24 | 1999-03-30 | Hydroprocessing, L.L.C. | Apparatus for oxidizing undigested wastewater sludges |
PL183687B1 (pl) * | 1997-06-06 | 2002-06-28 | Centrum Badan | Sposób wytwarzania półprzewodnikowych związków grupy A-B o przewodnictwie elektrycznym typu p i typu n |
GB2333521B (en) | 1997-06-11 | 2000-04-26 | Hitachi Cable | Nitride crystal growth method |
US6270569B1 (en) * | 1997-06-11 | 2001-08-07 | Hitachi Cable Ltd. | Method of fabricating nitride crystal, mixture, liquid phase growth method, nitride crystal, nitride crystal powders, and vapor phase growth method |
TW519551B (en) | 1997-06-11 | 2003-02-01 | Hitachi Cable | Methods of fabricating nitride crystals and nitride crystals obtained therefrom |
US6593589B1 (en) * | 1998-01-30 | 2003-07-15 | The University Of New Mexico | Semiconductor nitride structures |
US6249534B1 (en) | 1998-04-06 | 2001-06-19 | Matsushita Electronics Corporation | Nitride semiconductor laser device |
TW428331B (en) * | 1998-05-28 | 2001-04-01 | Sumitomo Electric Industries | Gallium nitride single crystal substrate and method of producing the same |
JPH11340576A (ja) * | 1998-05-28 | 1999-12-10 | Sumitomo Electric Ind Ltd | 窒化ガリウム系半導体デバイス |
JP4005701B2 (ja) * | 1998-06-24 | 2007-11-14 | シャープ株式会社 | 窒素化合物半導体膜の形成方法および窒素化合物半導体素子 |
JP2000031533A (ja) | 1998-07-14 | 2000-01-28 | Toshiba Corp | 半導体発光素子 |
TW413956B (en) * | 1998-07-28 | 2000-12-01 | Sumitomo Electric Industries | Fluorescent substrate LED |
US6335546B1 (en) * | 1998-07-31 | 2002-01-01 | Sharp Kabushiki Kaisha | Nitride semiconductor structure, method for producing a nitride semiconductor structure, and light emitting device |
JP2000091637A (ja) * | 1998-09-07 | 2000-03-31 | Rohm Co Ltd | 半導体発光素子の製法 |
US6423984B1 (en) * | 1998-09-10 | 2002-07-23 | Toyoda Gosei Co., Ltd. | Light-emitting semiconductor device using gallium nitride compound semiconductor |
US6252261B1 (en) * | 1998-09-30 | 2001-06-26 | Nec Corporation | GaN crystal film, a group III element nitride semiconductor wafer and a manufacturing process therefor |
JP3592553B2 (ja) * | 1998-10-15 | 2004-11-24 | 株式会社東芝 | 窒化ガリウム系半導体装置 |
US6150674A (en) * | 1998-11-06 | 2000-11-21 | Matsushita Electronics Corporation | Semiconductor device having Alx Ga1-x N (0<x<1) substrate |
TW498102B (en) * | 1998-12-28 | 2002-08-11 | Futaba Denshi Kogyo Kk | A process for preparing GaN fluorescent substance |
US20020096674A1 (en) * | 1999-01-08 | 2002-07-25 | Cho Hak Dong | Nucleation layer growth and lift-up of process for GaN wafer |
US6372041B1 (en) * | 1999-01-08 | 2002-04-16 | Gan Semiconductor Inc. | Method and apparatus for single crystal gallium nitride (GaN) bulk synthesis |
JP2000216494A (ja) | 1999-01-20 | 2000-08-04 | Sanyo Electric Co Ltd | 半導体発光素子およびその製造方法 |
EP1024524A2 (en) * | 1999-01-27 | 2000-08-02 | Matsushita Electric Industrial Co., Ltd. | Deposition of dielectric layers using supercritical CO2 |
US6177057B1 (en) * | 1999-02-09 | 2001-01-23 | The United States Of America As Represented By The Secretary Of The Navy | Process for preparing bulk cubic gallium nitride |
WO2000052796A1 (fr) * | 1999-03-04 | 2000-09-08 | Nichia Corporation | Element de laser semiconducteur au nitrure |
JP3957918B2 (ja) | 1999-05-17 | 2007-08-15 | 独立行政法人科学技術振興機構 | 窒化ガリウム単結晶の育成方法 |
US6592663B1 (en) * | 1999-06-09 | 2003-07-15 | Ricoh Company Ltd. | Production of a GaN bulk crystal substrate and a semiconductor device formed on a GaN bulk crystal substrate |
JP4329229B2 (ja) | 1999-06-30 | 2009-09-09 | 住友電気工業株式会社 | Iii−v族窒化物半導体の成長方法および気相成長装置 |
EP1065299A3 (en) * | 1999-06-30 | 2006-02-15 | Sumitomo Electric Industries, Ltd. | Group III-V nitride semiconductor growth method and vapor phase growth apparatus |
FR2796657B1 (fr) | 1999-07-20 | 2001-10-26 | Thomson Csf | Procede de synthese de materiaux massifs monocristallins en nitrures d'elements de la colonne iii du tableau de la classification periodique |
JP3968920B2 (ja) * | 1999-08-10 | 2007-08-29 | 双葉電子工業株式会社 | 蛍光体 |
JP4646359B2 (ja) | 1999-09-09 | 2011-03-09 | シャープ株式会社 | 窒化物半導体発光素子の製造方法 |
JP2001085737A (ja) * | 1999-09-10 | 2001-03-30 | Sharp Corp | 窒化物半導体発光素子 |
US6265322B1 (en) * | 1999-09-21 | 2001-07-24 | Agere Systems Guardian Corp. | Selective growth process for group III-nitride-based semiconductors |
JP4145437B2 (ja) | 1999-09-28 | 2008-09-03 | 住友電気工業株式会社 | 単結晶GaNの結晶成長方法及び単結晶GaN基板の製造方法と単結晶GaN基板 |
CN1113988C (zh) | 1999-09-29 | 2003-07-09 | 中国科学院物理研究所 | 一种氮化镓单晶的热液生长方法 |
US6398867B1 (en) * | 1999-10-06 | 2002-06-04 | General Electric Company | Crystalline gallium nitride and method for forming crystalline gallium nitride |
EP1104031B1 (en) * | 1999-11-15 | 2012-04-11 | Panasonic Corporation | Nitride semiconductor laser diode and method of fabricating the same |
US6653663B2 (en) * | 1999-12-06 | 2003-11-25 | Matsushita Electric Industrial Co., Ltd. | Nitride semiconductor device |
JP2001168385A (ja) * | 1999-12-06 | 2001-06-22 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体素子及びiii族窒化物系化合物半導体発光素子 |
JP2001185718A (ja) | 1999-12-24 | 2001-07-06 | Hitachi Cable Ltd | 窒化ガリウム系化合物半導体を用いた高電子移動度トランジスタ用エピタキシャルウェハの製造方法 |
US7315599B1 (en) | 1999-12-29 | 2008-01-01 | Intel Corporation | Skew correction circuit |
US6355497B1 (en) * | 2000-01-18 | 2002-03-12 | Xerox Corporation | Removable large area, low defect density films for led and laser diode growth |
JP3335974B2 (ja) | 2000-01-24 | 2002-10-21 | 星和電機株式会社 | 窒化ガリウム系半導体発光素子及びその製造方法 |
JP4429459B2 (ja) | 2000-03-03 | 2010-03-10 | 古河電気工業株式会社 | 高抵抗GaN結晶層の製造方法 |
US20010015437A1 (en) * | 2000-01-25 | 2001-08-23 | Hirotatsu Ishii | GaN field-effect transistor, inverter device, and production processes therefor |
US6447604B1 (en) * | 2000-03-13 | 2002-09-10 | Advanced Technology Materials, Inc. | Method for achieving improved epitaxy quality (surface texture and defect density) on free-standing (aluminum, indium, gallium) nitride ((al,in,ga)n) substrates for opto-electronic and electronic devices |
US6596079B1 (en) * | 2000-03-13 | 2003-07-22 | Advanced Technology Materials, Inc. | III-V nitride substrate boule and method of making and using the same |
JP3946427B2 (ja) | 2000-03-29 | 2007-07-18 | 株式会社東芝 | エピタキシャル成長用基板の製造方法及びこのエピタキシャル成長用基板を用いた半導体装置の製造方法 |
TW518767B (en) * | 2000-03-31 | 2003-01-21 | Toyoda Gosei Kk | Production method of III nitride compound semiconductor and III nitride compound semiconductor element |
AU2001274810A1 (en) * | 2000-04-17 | 2001-10-30 | Virginia Commonwealth University | Defect reduction in gan and related materials |
JP2001339121A (ja) | 2000-05-29 | 2001-12-07 | Sharp Corp | 窒化物半導体発光素子とそれを含む光学装置 |
GB2363518A (en) | 2000-06-17 | 2001-12-19 | Sharp Kk | A method of growing a nitride layer on a GaN substrate |
US6693935B2 (en) * | 2000-06-20 | 2004-02-17 | Sony Corporation | Semiconductor laser |
JP2002016285A (ja) * | 2000-06-27 | 2002-01-18 | National Institute Of Advanced Industrial & Technology | 半導体発光素子 |
US6586762B2 (en) * | 2000-07-07 | 2003-07-01 | Nichia Corporation | Nitride semiconductor device with improved lifetime and high output power |
JP3968968B2 (ja) * | 2000-07-10 | 2007-08-29 | 住友電気工業株式会社 | 単結晶GaN基板の製造方法 |
EP1176120A1 (en) * | 2000-07-28 | 2002-01-30 | Japan Pionics Co., Ltd. | Process for purifying ammonia |
JP4154558B2 (ja) * | 2000-09-01 | 2008-09-24 | 日本電気株式会社 | 半導体装置 |
US6858882B2 (en) | 2000-09-08 | 2005-02-22 | Sharp Kabushiki Kaisha | Nitride semiconductor light-emitting device and optical device including the same |
JP4416297B2 (ja) * | 2000-09-08 | 2010-02-17 | シャープ株式会社 | 窒化物半導体発光素子、ならびにそれを使用した発光装置および光ピックアップ装置 |
JP2002094189A (ja) * | 2000-09-14 | 2002-03-29 | Sharp Corp | 窒化物半導体レーザ素子およびそれを用いた光学装置 |
JP2002134416A (ja) | 2000-10-19 | 2002-05-10 | Ricoh Co Ltd | p型3族窒化物の結晶成長方法および製造方法、並びに半導体素子 |
US6936488B2 (en) * | 2000-10-23 | 2005-08-30 | General Electric Company | Homoepitaxial gallium-nitride-based light emitting device and method for producing |
US7053413B2 (en) | 2000-10-23 | 2006-05-30 | General Electric Company | Homoepitaxial gallium-nitride-based light emitting device and method for producing |
JP4063520B2 (ja) * | 2000-11-30 | 2008-03-19 | 日本碍子株式会社 | 半導体発光素子 |
WO2002044443A1 (en) * | 2000-11-30 | 2002-06-06 | North Carolina State University | Methods and apparatus for producing m'n based materials |
JP4003413B2 (ja) | 2000-12-11 | 2007-11-07 | 日亜化学工業株式会社 | 13族窒化物結晶の製造方法 |
JP3785566B2 (ja) | 2001-03-19 | 2006-06-14 | 株式会社日鉱マテリアルズ | GaN系化合物半導体結晶の製造方法 |
US6806508B2 (en) | 2001-04-20 | 2004-10-19 | General Electic Company | Homoepitaxial gallium nitride based photodetector and method of producing |
JP4633962B2 (ja) | 2001-05-18 | 2011-02-16 | 日亜化学工業株式会社 | 窒化物半導体基板の製造方法 |
US6734530B2 (en) * | 2001-06-06 | 2004-05-11 | Matsushita Electric Industries Co., Ltd. | GaN-based compound semiconductor EPI-wafer and semiconductor element using the same |
PL219109B1 (pl) * | 2001-06-06 | 2015-03-31 | Ammono Spółka Z Ograniczoną Odpowiedzialnością | Sposób otrzymywania objętościowego monokrystalicznego azotku zawierającego gal oraz urządzenie do otrzymywania objętościowego monokrystalicznego azotku zawierającego gal |
PL350375A1 (en) | 2001-10-26 | 2003-05-05 | Ammono Sp Z Oo | Epitaxial layer substrate |
PL207400B1 (pl) | 2001-06-06 | 2010-12-31 | Ammono Społka Z Ograniczoną Odpowiedzialnością | Sposób i urządzenie do otrzymywania objętościowego monokryształu azotku zawierającego gal |
US6488767B1 (en) * | 2001-06-08 | 2002-12-03 | Advanced Technology Materials, Inc. | High surface quality GaN wafer and method of fabricating same |
JP2002009392A (ja) | 2001-06-22 | 2002-01-11 | Matsushita Electric Ind Co Ltd | 半導体発光素子およびその製造方法 |
US6562466B2 (en) * | 2001-07-02 | 2003-05-13 | Essilor International Compagnie Generale D'optique | Process for transferring a coating onto a surface of a lens blank |
IL161420A0 (en) * | 2001-10-26 | 2004-09-27 | Ammono Sp Zoo | Substrate for epitaxy |
JP4383172B2 (ja) | 2001-10-26 | 2009-12-16 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | 窒化物バルク単結晶層を用いる発光素子構造及びその製造方法 |
US6949140B2 (en) * | 2001-12-05 | 2005-09-27 | Ricoh Company, Ltd. | Crystal growth method, crystal growth apparatus, group-III nitride crystal and group-III nitride semiconductor device |
US7097707B2 (en) * | 2001-12-31 | 2006-08-29 | Cree, Inc. | GaN boule grown from liquid melt using GaN seed wafers |
JP4801315B2 (ja) * | 2002-01-29 | 2011-10-26 | 株式会社リコー | Iii族窒化物結晶の製造方法 |
US20030209191A1 (en) * | 2002-05-13 | 2003-11-13 | Purdy Andrew P. | Ammonothermal process for bulk synthesis and growth of cubic GaN |
US20060138431A1 (en) | 2002-05-17 | 2006-06-29 | Robert Dwilinski | Light emitting device structure having nitride bulk single crystal layer |
JP4416648B2 (ja) | 2002-05-17 | 2010-02-17 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | 発光素子の製造方法 |
WO2003097906A1 (fr) | 2002-05-17 | 2003-11-27 | Ammono Sp.Zo.O. | Installation de production de monocristal en vrac utilisant de l'ammoniaque supercritique |
CN100550543C (zh) | 2002-06-26 | 2009-10-14 | 阿莫诺公司 | 氮化物半导体激光装置及其制造方法 |
WO2004003261A1 (en) | 2002-06-26 | 2004-01-08 | Ammono Sp. Z O.O. | Process for obtaining of bulk monocrystallline gallium-containing nitride |
US7099073B2 (en) * | 2002-09-27 | 2006-08-29 | Lucent Technologies Inc. | Optical frequency-converters based on group III-nitrides |
JP4860927B2 (ja) | 2002-12-11 | 2012-01-25 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | エピタキシ用基板及びその製造方法 |
AU2003285766A1 (en) | 2002-12-11 | 2004-06-30 | Ammono Sp. Z O.O. | Process for obtaining bulk-crystalline gallium-containing nitride |
JP4824313B2 (ja) | 2002-12-11 | 2011-11-30 | アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン | ガリウム含有窒化物バルク単結晶を得るためのプロセス、得られた結晶から不純物を排除するためのプロセス、及びガリウム含有窒化物バルク単結晶からなる基板を製造するためのプロセス |
KR100902525B1 (ko) | 2003-04-03 | 2009-06-15 | 미쓰비시 가가꾸 가부시키가이샤 | 산화아연 단결정 |
PL1769105T3 (pl) | 2004-06-11 | 2014-11-28 | Ammono S A | Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania |
KR100848379B1 (ko) | 2004-06-11 | 2008-07-25 | 암모노 에스피. 제트오. 오. | Ⅹⅲ족 원소 질화물의 층으로 이루어진 고 전자이동도트랜지스터 및 그 제조 방법 |
PL371405A1 (pl) | 2004-11-26 | 2006-05-29 | Ammono Sp.Z O.O. | Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku |
US7704324B2 (en) | 2005-01-25 | 2010-04-27 | General Electric Company | Apparatus for processing materials in supercritical fluids and methods thereof |
CN101437987A (zh) | 2006-04-07 | 2009-05-20 | 加利福尼亚大学董事会 | 生长大表面积氮化镓晶体 |
US8253221B2 (en) | 2007-09-19 | 2012-08-28 | The Regents Of The University Of California | Gallium nitride bulk crystals and their growth method |
EP2092093A4 (en) | 2006-10-25 | 2017-06-14 | The Regents of The University of California | Method for growing group iii-nitride crystals in a mixture of supercritical ammonia and nitrogen, and group iii-nitride crystals grown thereby |
-
2005
- 2005-06-10 PL PL05751252T patent/PL1769105T3/pl unknown
- 2005-06-10 WO PCT/JP2005/011093 patent/WO2005121415A1/en active Application Filing
- 2005-06-10 US US11/629,109 patent/US8398767B2/en active Active
- 2005-06-10 EP EP05751252.7A patent/EP1769105B1/en not_active Not-in-force
- 2005-06-10 KR KR1020067027510A patent/KR100848380B1/ko not_active IP Right Cessation
- 2005-06-10 JP JP2006551658A patent/JP5014804B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
WO2005121415A1 (en) | 2005-12-22 |
JP2008501600A (ja) | 2008-01-24 |
EP1769105B1 (en) | 2014-05-14 |
JP5014804B2 (ja) | 2012-08-29 |
US8398767B2 (en) | 2013-03-19 |
EP1769105A1 (en) | 2007-04-04 |
US20080303032A1 (en) | 2008-12-11 |
KR100848380B1 (ko) | 2008-07-25 |
KR20070033384A (ko) | 2007-03-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
PL1769105T3 (pl) | Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania | |
EP1734158A4 (en) | METHOD OF PULLING GALLIUM NITRIDE CRYSTALS AND GALLIUM NITRIDE CRYSTAL | |
EP2031103A4 (en) | PROCESS FOR PRODUCING GALLIUM NITRIDE CRYSTAL AND GALLIUM NITRIDE GALLERY | |
ZA200702659B (en) | Shelf-stable foodstuffs and methods for their preparation | |
EP2221855A4 (en) | NITRIDE SEMICONDUCTOR AND METHOD FOR GROWING NITRIDE SEMICONDUCTOR CRYSTAL | |
IL180377A0 (en) | Vacuum package system and method | |
EP1942583A4 (en) | ECHOUNTERPRESSION PROCESS AND EQUIPMENT | |
EP1881669A4 (en) | METHOD AND DEVICE FOR TRANSMITTING LAN SIGNALS IN AN OPTICAL TRANSPORT NETWORK | |
EP1754810A4 (en) | GROUP III NITRIDE SEMICONDUCTOR CRYSTAL, PROCESS FOR PRODUCING THE SAME, AND GROUP III NITRIDE SEMICONDUCTOR DEVICE | |
EP1942582A4 (en) | METHOD AND DEVICE FOR CANCELLATION OF ECHO | |
PL1763999T3 (pl) | Urządzenie porcjujące i pakujące oraz sposób porcjowania i pakowania | |
IL177404A0 (en) | Methods for preparing t-cells | |
EP1953808A4 (en) | PROCESS FOR PRODUCING EPITAXIAL WAFER AND EPITAXIAL WAFER | |
EP2123801A4 (en) | METHOD AND DEVICE FOR PREPARING GROUP III NITRIDE | |
EP1735088A4 (en) | COMPOSITION AND PROCESS FOR PRODUCING SILICON-CONTAINING PRODUCTS | |
TWI366895B (en) | Wafer packaging and singulation method | |
EP1887618A4 (en) | III-V GROUP NITRIDE COMPOUND SEMICONDUCTOR DEVICE AND ELECTRODE FORMATION METHOD | |
ZA200803283B (en) | Pharmaceutical gallium compositions and methods | |
TWI346974B (en) | Polycrystalline sige junctions for advanced devices | |
EP1806439A4 (en) | METHOD OF MANUFACTURING MONOCRYSTALS OF AlN AND MONOCRYSTAL OF AlN | |
EP1971319A4 (en) | PREPARATION FOR SHAVING AND SHAVING METHOD | |
EP1766667A4 (en) | METHOD FOR DRAWING GAN-BASED NITRIDE LAYER MATERIAL | |
EP1818430A4 (en) | SINGLE GROUP III NITRIDE CRYSTAL AND PROCESS FOR PREPARING SAID CRYSTAL, AND SEMICONDUCTOR DEVICE | |
GB0619862D0 (en) | Method and device for fastening fastening member | |
EP1829289A4 (en) | METHOD AND SYSTEM MULIT-FUNCTION BY PUSH BUTTON |