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KR950015388A - Semiconductor memory circuit charging complementary bit lines - Google Patents

Semiconductor memory circuit charging complementary bit lines Download PDF

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Publication number
KR950015388A
KR950015388A KR1019940028599A KR19940028599A KR950015388A KR 950015388 A KR950015388 A KR 950015388A KR 1019940028599 A KR1019940028599 A KR 1019940028599A KR 19940028599 A KR19940028599 A KR 19940028599A KR 950015388 A KR950015388 A KR 950015388A
Authority
KR
South Korea
Prior art keywords
bit line
transistor
precharge
bit lines
compensation
Prior art date
Application number
KR1019940028599A
Other languages
Korean (ko)
Inventor
겐지 고또
Original Assignee
가네꼬 히사시
닛본덴기 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가네꼬 히사시, 닛본덴기 가부시끼가이샤 filed Critical 가네꼬 히사시
Publication of KR950015388A publication Critical patent/KR950015388A/en

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)

Abstract

반도체 메모리 디바이스는 프리차지 트랜지스터들과 비트 라인 레벨 등화 트랜지스터들 및 비트 라인 레벨 보상 트랜지스터들을 갖고 있다. 각각의 프리차지 트랜지스터는 판독 동작에 앞서 비트 라인을 프리차지하기 위해 비트 라인들 중 하나와 전원 단자 사이에 삽입된다. 2개의 비트 라인들의 전압 레벨을 등화시키기 위해 각각의 비트 라인 레벨 트랜지스터는 메모리 셀들이 삽입되는 비트라인들 사이에 삽입된다. 각각의 비트 라인 레벨 보상 트랜지스터는 각각의 프리차지 트랜지스터에 병렬로 접속된다. 비트 라인 레벨 보상 트랜지스터의 게이트 전극은 비트 라인에 접속된다 판독 동작의 초기 단계 동안, 비트 라인 레벨 보상 트랜지스터의 게이트-소스 전압의 절대값이 트랜지스터의 게이트 임계 전압보다 더 작고 트랜지스터는 오프-상태로 있기 때문에, 비트 라인의 전압 레벨은 높은 감소율로 강하한다. 그러므로, 비트 라인의 전압 레벨의 변화는 빠르게 감지되고 메모리 디바이스의 동작 효율성은 향상된다.The semiconductor memory device has precharge transistors and bit line level equalization transistors and bit line level compensation transistors. Each precharge transistor is inserted between one of the bit lines and the power supply terminal to precharge the bit line prior to the read operation. Each bit line level transistor is inserted between the bit lines into which memory cells are inserted to equalize the voltage level of the two bit lines. Each bit line level compensation transistor is connected in parallel to a respective precharge transistor. The gate electrode of the bit line level compensation transistor is connected to the bit line. During the initial phase of the read operation, the absolute value of the gate-source voltage of the bit line level compensation transistor is less than the gate threshold voltage of the transistor and the transistor is in an off state. Therefore, the voltage level of the bit line drops at a high reduction rate. Therefore, the change in the voltage level of the bit line is quickly detected and the operating efficiency of the memory device is improved.

Description

상보 비트라인을 충전시키는 반도체 메모리회로Semiconductor memory circuit charging complementary bit lines

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명의 양호한 실시예에 따른 반도체 메모리 디바이스의 회로도.3 is a circuit diagram of a semiconductor memory device according to a preferred embodiment of the present invention.

Claims (3)

반도체 메모리 회로에 있어서, 전원 단자와 비트 라인 사이에 접속되어 있으며, 자신의 게이트는 프리차지 신호를 수신하기 위해 접속되어 있는 프리차지 트랜지스터, 및 상기 프리차지 트랜지스터에 병렬로 접속되어 있고, 상기 비트 라인에 접속된 제어 전극을 갖고 있으며, 상기 비트 라인의 전압이 선정된 전압보다 낮을 때 온-상태로 되는 비트 라인 레벨 보상 트랜지스터를 포함하는 것을 특징으로 하는 반도체 메모리 회로.In a semiconductor memory circuit, a precharge transistor, which is connected between a power supply terminal and a bit line, whose gate is connected to receive a precharge signal, and is connected in parallel to the precharge transistor, wherein the bit line And a bit line level compensation transistor which has a control electrode connected to and is turned on when the voltage of said bit line is lower than a predetermined voltage. 제1항에 있어서, 상기 비트 라인 레벨 보상 트랜지스터는 인핸스먼트형 P채널 MOSFET인 것을 특징으로 하는 반도체 메모리 회로.2. The semiconductor memory circuit of claim 1 wherein the bit line level compensation transistor is an enhancement P-channel MOSFET. 반도체 정적 RAM에 있어서, 한 쌍의 보상 비트 라인들과, 상기 한 쌍의 보상 비트 라인들에 접속되고 워드 라인에 접속된 적어도 하나의 정적 RAM메모리 셀과, 상기 한 쌍의 보상 비트 라인들과 전압 공급 단자와의 사이에 접속되고, 상기 전압공급 단자와 상기 한 쌍의 보상 비트 라인들과의 사이에 접속된 한 쌍의 프리차지 트랜지스터들을 포함하는 비트 라인 부하 회로와, 상기 프리차지 트랜지스터의 게이트들이 프리차지 신호를 수신하기 위해 접속되어 있고, 인핸스먼트헝 P-채널 트랜지스터를 갖는 상기 각각의 비트 라인 레벨 보상 트랜지스터의 대응하는 상기 하나의 프리차지 트랜지스터에 병렬로 각각 접속되어 있고, 자신들 각각의 게이트가 상기 비트 라인들 중 대응하는 하나에 접속되는 한 쌍의 비트 라인 레벨 보상 트랜지스터를 포함하는 것을 특징으로 하는 반도체 정적 RAM.A semiconductor static RAM comprising: a pair of compensation bit lines, at least one static RAM memory cell connected to the pair of compensation bit lines and connected to a word line, the pair of compensation bit lines and a voltage A bit line load circuit connected between a supply terminal and a pair of precharge transistors connected between the voltage supply terminal and the pair of compensation bit lines, and gates of the precharge transistor Connected in order to receive a precharge signal, each in parallel to a corresponding said precharge transistor of said respective bit line level compensation transistor having an enhancement P-channel transistor, each of which has its own gate Including a pair of bit line level compensation transistors connected to corresponding ones of said bit lines Semiconductor static RAM, characterized in that. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940028599A 1993-11-02 1994-11-02 Semiconductor memory circuit charging complementary bit lines KR950015388A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP93-296012 1993-11-02
JP5296012A JPH07130177A (en) 1993-11-02 1993-11-02 Semiconductor storage device

Publications (1)

Publication Number Publication Date
KR950015388A true KR950015388A (en) 1995-06-16

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Application Number Title Priority Date Filing Date
KR1019940028599A KR950015388A (en) 1993-11-02 1994-11-02 Semiconductor memory circuit charging complementary bit lines

Country Status (2)

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JP (1) JPH07130177A (en)
KR (1) KR950015388A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100732390B1 (en) * 2001-12-29 2007-06-27 매그나칩 반도체 유한회사 current mirror type circuit for compensating leakage current

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1202530C (en) * 1998-04-01 2005-05-18 三菱电机株式会社 Static semiconductor memory device operating at high speed under lower power supply voltage
KR100666617B1 (en) * 2005-08-05 2007-01-10 삼성전자주식회사 Bit line sense amplifier and semiconductor memory device having the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5812193A (en) * 1981-07-15 1983-01-24 Toshiba Corp Semiconductor memory
JPS61237290A (en) * 1985-04-12 1986-10-22 Sony Corp Bit line drive circuit
JP3231310B2 (en) * 1990-01-29 2001-11-19 日本電気株式会社 Semiconductor storage device
JPH05274882A (en) * 1992-03-25 1993-10-22 Seiko Epson Corp Semiconductor memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100732390B1 (en) * 2001-12-29 2007-06-27 매그나칩 반도체 유한회사 current mirror type circuit for compensating leakage current

Also Published As

Publication number Publication date
JPH07130177A (en) 1995-05-19

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A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application