KR20240026665A - Test Slot Parallel Diagnostic Apparatus - Google Patents

Abstract

The purpose of the present invention is to provide a test slot parallel diagnostic device that can simultaneously diagnose test slots provided in a test device. For this purpose, the test slot parallel diagnostic device according to the present invention is connected to a storage element under test. a test device including test slots and diagnostic boards that are inserted one-to-one into the test slots to diagnose whether the test slots are operating normally, and the test device is used for diagnosis of the test slot for each test slot. A diagnostic command can be generated and transmitted to the diagnostic board inserted into the corresponding test slot, and diagnostic information generated in each of the diagnostic boards according to the diagnostic command can be obtained to simultaneously diagnose whether each of the test slots is operating normally.

Description

Test Slot Parallel Diagnostic Apparatus}

The present invention relates to a diagnostic device for diagnosing test slots to which storage elements are connected.

Various types of storage devices are used to store data.

Among storage devices, solid state drives (SSDs) are based on memories such as flash and DDR, and do not include motors and mechanical drives that are essential in hard disk drives (HDDs). No. Accordingly, SSD generates little heat and noise when operating, is resistant to external shocks, and shows dozens of times improved data transfer speed compared to HDD, so its use is rapidly increasing.

A test device is used to diagnose whether the SSD is operating normally. The test device is used to test not only SSDs but also various types of semiconductor devices.

The test device is provided with a plurality of test slots to test a plurality of SSDs and a plurality of semiconductor devices. That is, an SSD or semiconductor device is installed in each of the test slots, and the normality of the SSD or semiconductor device can be tested by a test device.

However, only when the reliability of each test slot is secured can the reliability of the test device be secured. Therefore, a diagnostic process to ensure the reliability of the test slots must be preceded, and whether the test slots are operating normally must be diagnosed regularly or irregularly even while the test device is in use.

For this purpose, conventionally, a diagnostic device that is independent of the test device is installed in the test slot to diagnose whether the test slot is operating normally.

However, in the past, normal operation was diagnosed only for the test slot into which the diagnostic device was inserted, and therefore, in order to diagnose all test slots provided in the test device, the diagnostic device had to be sequentially inserted into all test slots.

Therefore, conventionally, a lot of time and procedures were required to diagnose test slots of a test device.

The purpose of the present invention to solve the above-described problems is to provide a test slot parallel diagnostic device that can simultaneously diagnose test slots provided in a test device.

A test slot parallel diagnostic device according to the present invention for achieving the above-described purpose is a test device including test slots to which storage elements under test are connected, and is inserted one-to-one into the test slots to ensure normal operation of the test slots. It includes diagnostic boards that diagnose whether or not the test device is active, and the test device generates a diagnostic command for each test slot to diagnose the test slot and transmits it to the diagnostic board inserted into the test slot, and each of the diagnostic boards according to the diagnostic command. By obtaining diagnostic information generated in , it is possible to simultaneously diagnose whether each of the test slots is operating normally.

The test device may analyze the diagnostic information and output a replacement signal or a discontinuation signal for a test slot in which diagnostic information exceeding a preset error range has been obtained.

The test device transmits a first diagnostic command to a first diagnostic board among the diagnostic boards and a second diagnostic command to a second diagnostic board, and the first diagnostic command and the second diagnostic command are mutually exclusive. It may be a different type of diagnostic command.

The diagnosis command is a current value diagnosis command for diagnosing the current value consumed through the test slot, an input/output signal diagnosis command for diagnosing the input/output signal transmission characteristics of the test slot, and a pattern signal diagnosis command for diagnosing the pattern signal transmission characteristics of the test slot. It can contain at least one.

Each of the diagnostic boards includes a current load generator that consumes current supplied from a test slot, and the test device transmits a current value diagnosis command including a set current value to each diagnostic board, and the diagnostic board transmits the current value. The load generator controls the current load generator to consume a current corresponding to the set current value, and the test device compares the set current value with the current consumption value consumed by the current load generator to determine whether each test slot is normal. can be diagnosed.

Each of the diagnostic boards includes an input/output signal check unit, and the input/output signal check unit generates an output response signal identical to the output signal when an output signal is received from the test device through an output terminal of the test slot. It is transmitted to the test device through an input terminal, and when an input/output signal diagnosis command requesting an input terminal test is received from the test device, an input signal can be generated and the input signal can be transmitted to the test device through the input terminal.

The test device analyzes output signals output to the diagnostic boards and output response signals received from the input/output signal check units provided in the diagnostic boards to determine whether the output terminals of the test slots are operating normally. By diagnosing and analyzing input signals received from the diagnostic boards, it is possible to diagnose whether the input terminals of the test slots are operating normally.

Each of the diagnostic boards includes a first PCIe device, and the first PCIe device generates a pattern signal for reception and provides the pattern signal for reception to the test device through a pattern signal input terminal of a test slot. transmitted to a second PCIe device, and the second PCIe device can diagnose whether the pattern signal input terminal is operating normally by comparing the width of the EYE pattern obtained as a result of EYE analysis of the receiving pattern signal with a reference value.

When an output pattern signal is transmitted from the second PCIe device through the pattern signal output terminal of the test slot, the first PCIe device compares the width of the EYE pattern obtained as a result of EYE analysis of the output pattern signal with a reference value and determines the pattern signal. You can diagnose whether the signal output terminal is operating normally.

The test device may include test boards connected to the test slots, and each of the test boards may include a test board control unit that generates the diagnostic command.

According to the present invention, since the test slots provided in the test device can be diagnosed simultaneously, the process for diagnosing the test slots can be performed quickly.

Additionally, according to the present invention, since test slots can be diagnosed simultaneously under the same conditions, reliability of test slots can be improved.

1 is an exemplary diagram illustrating a method of using a test slot parallel diagnosis device according to the present invention.
Figure 2 is an exemplary diagram showing the configuration of a test slot parallel diagnosis device according to the present invention.
Figure 3 is an exemplary diagram showing the configuration of a diagnostic board applied to the test slot parallel diagnostic device according to the present invention.
Figure 4 is an exemplary diagram showing the connection relationship between a test board and a diagnostic board applied to the test slot parallel diagnostic device according to the present invention.
Figure 5 is an exemplary diagram showing an EYE pattern analyzed in the test slot parallel diagnosis device according to the present invention.

Like reference numerals refer to substantially the same elements throughout the specification. In the following description, cases that are not related to the core configuration of the present invention and detailed descriptions of configurations and functions known in the technical field of the present invention may be omitted. The meaning of terms described in this specification should be understood as follows.

The advantages and features of the present invention and methods for achieving them will become clear by referring to the embodiments described in detail below along with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below and will be implemented in various different forms. The present embodiments only serve to ensure that the disclosure of the present invention is complete and that common knowledge in the technical field to which the present invention pertains is not limited. It is provided to fully inform those who have the scope of the invention, and the present invention is only defined by the scope of the claims.

The shapes, sizes, proportions, angles, numbers, etc. disclosed in the drawings for explaining embodiments of the present invention are illustrative, and the present invention is not limited to the matters shown. Like reference numerals refer to like elements throughout the specification. Additionally, in describing the present invention, if it is determined that a detailed description of related known technologies may unnecessarily obscure the gist of the present invention, the detailed description will be omitted.

When 'includes', 'has', 'consists of', etc. mentioned in this specification are used, other parts may be added unless 'only' is used. When a component is expressed in the singular, the plural is included unless specifically stated otherwise.

When interpreting a component, it is interpreted to include the margin of error even if there is no separate explicit description.

In the case of a description of a positional relationship, for example, if the positional relationship of two parts is described as 'on top', 'on the top', 'on the bottom', 'next to', etc., 'immediately' Alternatively, there may be one or more other parts placed between the two parts, unless 'directly' is used.

In the case of a description of a temporal relationship, for example, if a temporal relationship is described as 'after', 'successfully after', 'after', 'before', etc., 'immediately' or 'directly' Unless used, non-consecutive cases may also be included.

Although first, second, etc. are used to describe various components, these components are not limited by these terms. These terms are merely used to distinguish one component from another. Accordingly, the first component mentioned below may also be the second component within the technical spirit of the present invention.

“X-axis direction,” “Y-axis direction,” and “Z-axis direction” should not be interpreted as only geometrical relationships in which the relationship between each other is vertical, and should not be interpreted as a wider range within which the configuration of the present invention can function functionally. It can mean having direction.

The term “at least one” should be understood to include all possible combinations from one or more related items. For example, “at least one of the first, second, and third items” means each of the first, second, or third items, as well as two of the first, second, and third items. It can mean a combination of all items that can be presented from more than one.

Each feature of the various embodiments of the present invention can be combined or combined with each other, partially or entirely, and various technological interconnections and operations are possible, and each embodiment can be implemented independently of each other or together in a related relationship. It may be possible.

Hereinafter, embodiments of the present specification will be described in detail with reference to the attached drawings.

Figure 1 is an exemplary diagram for explaining a method of using a test slot parallel diagnostic device according to the present invention, and Figure 2 is an exemplary diagram showing the configuration of a test slot parallel diagnostic device according to the present invention.

As shown in FIGS. 1 and 2, the test slot parallel diagnostic device according to the present invention includes a test device 200 including test slots 211 to which the storage element 300 under test is connected, and the test slots. It includes diagnostic boards 100 that are inserted one-to-one to diagnose whether test slots are operating normally.

First, the test device 200 generates a diagnostic command for diagnosis of the corresponding test slot for each test slot 211, transmits the diagnostic command to the diagnostic boards 100 inserted into the corresponding test slot 211, and diagnoses By obtaining diagnostic information generated from each of the diagnostic boards 100 according to a command, it is simultaneously diagnosed whether each of the test slots 211 is operating normally.

For this purpose, the test device 200 includes test boards 230 connected to test slots 211. Each of the test boards 230 may be connected one-to-one with the test slot 211, or two or more test boards 230 may be connected to one test slot 211.

The test board 230 can diagnose whether the test slot 211 is operating normally by communicating with the diagnosis board 100 connected to the test slot 211. Additionally, the test board 230 may communicate with the storage element 300 connected to the test slot 211 to test whether the storage element 300 is operating normally.

To this end, the test board 230 may be equipped with a test board control unit 231 that generates various diagnostic commands or test commands. That is, the test board 230 can actually perform diagnosis on the test slot 211. Hereinafter, for convenience of explanation, it will simply be described that the test device performs diagnosis on the test slot 211. However, as described above, actual diagnosis may be performed on the test board 230, and in particular, may be performed by the test board control unit 231.

Here, the diagnostic board 100 is for diagnosing the test slot 211, and the storage element 300 is a solid state drive (SSD), a hard disk drive (HDD), a semiconductor element, etc. means.

That is, the diagnostic board 100 is inserted into the test slot 211 of the test device 200 to diagnose whether the test slot 211 is operating normally, and the storage element 300 to be tested is used for the purpose of testing itself. is inserted into the test slot 211.

The test board 230 may be connected to the test slot 211 through an interface board (also called Hi-Fix) 210.

The test device 200 may be connected to the administrator terminal 400 through a network. The administrator can control various functions of the test device 200 through the administrator terminal 400 and monitor various test information and diagnostic information collected by the test device 200 through the administrator terminal 400.

Next, diagnostic boards are mounted on at least two of the test slots 211 provided in the test device 200, so that the at least two test slots 211 can be diagnosed simultaneously.

That is, the present invention includes at least two diagnostic boards 100, and each of the at least two diagnostic boards 100 is inserted into the test slot 211.

For example, as shown in FIG. 2, when eight test slots 211 are provided in the chamber 240 provided in the test device 200, eight diagnostic boards 100 are connected to eight test slots ( 211) can be connected one-to-one.

In this case, the eight test slots 211 can be diagnosed simultaneously by the test boards 230 connected to the eight test slots 211. Hereinafter, for convenience of explanation, a test device 200 in which eight test slots 211 are provided in one chamber 240 as shown in FIG. 2 will be described as an example of the present invention.

Here, the chamber 240 forms a closed space in which test slots 211 and diagnostic boards 100 (or storage elements 300) are provided. That is, the diagnostic boards 100 or storage elements 300 are connected to the test slot 211 inside the chamber 240.

Next, the test device 200 analyzes the diagnostic information collected through the diagnostic boards 100 and sends a replacement signal or discontinuation signal to the test slot 211 for which diagnostic information exceeding a preset error range has been obtained. It can be output through the output unit provided in (200), or a replacement signal or discontinuation signal can be transmitted to the manager terminal (400).

For example, as shown in FIG. 2, when eight diagnostic boards 100 are connected to eight test slots 211, the test device 200 connects eight test slots from the eight diagnostic boards 100. Eight pieces of diagnostic information can be collected through (211).

The main control unit of the test device 200 that collected 8 pieces of diagnostic information or the administrator terminal 400 that collected 8 pieces of diagnostic information from the test device 200 analyzes the 8 pieces of diagnostic information collected under the same conditions and determines the preset A replacement signal or a discontinuation signal can be output for the test slot 211 in which diagnostic information exceeding the error range has been obtained. The main control unit may perform the function of controlling the test board control units 231.

For example, when current is supplied through the test slots 211 to the diagnostic boards 100 under the same conditions, the size of the current supplied through one test slot is the size of the current supplied through the remaining test slots. If it is larger or smaller than the error range, the main control unit or manager terminal 400 of the test device determines that there is an error in the test slot, and outputs a replacement signal or a stop use signal for the test slot.

In this case, if the size of the current supplied through any one test slot is larger or smaller than the size of the current supplied through the remaining test slots within the error range, the main control unit or administrator terminal 400 or the test board control unit 231 ) can calculate the compensation value using the size of the current supplied through the test slot. The calculated compensation value may be stored in the test board 230 or the main control unit.

After diagnosis of the test slot, when the storage element 300 is connected to the test slot 211 and tested, the test device can supply current to the storage element 300 through the test slot 211 using the compensation value. there is. Accordingly, the current considering the compensation value may have the same or similar value as the current supplied to the storage elements 300 through the remaining test slots 211. Accordingly, the storage elements 300 can be tested normally.

However, the test board control unit 231, which has received the corresponding diagnostic information among the eight pieces of diagnostic information, can transmit the diagnostic result for the corresponding test slot 211 to the administrator terminal 400, and the corresponding test slot ( 211), the compensation value can also be generated and stored.

That is, the eight pieces of diagnostic information generated simultaneously may be comprehensively managed, or may be managed individually on each test board 230.

Next, the test device 200 may transmit a first diagnostic command to the first diagnostic board among the diagnostic boards 100 and a second diagnostic command to the second diagnostic board. In this case, the first diagnostic command may be transmitted to the second diagnostic board. The command and the second diagnostic command may be different types of diagnostic commands.

The diagnostic commands applied to the present invention include a current value diagnostic command for diagnosing the current value consumed through the test slot 211, an input/output signal diagnostic command for diagnosing the input/output signal transmission characteristics of the test slot 211, and a test slot 211 ) may include at least one of the pattern signal diagnosis commands for diagnosing the pattern signal transmission characteristics. Details on each of the current value diagnosis command, input/output signal diagnosis command, and pattern signal diagnosis command are described below with reference to FIGS. 3 to 6.

As described above, when the diagnostic command applied to the present invention includes a current value diagnostic command, an input/output signal diagnostic command, and a pattern signal diagnostic command, the current value diagnostic command will be transmitted to at least one first diagnostic board. and an input/output signal diagnosis command may be transmitted to at least one second diagnosis board. In this case, the current value diagnosis command may be the first diagnosis command, and the input/output signal diagnosis command may be the second diagnosis command.

That is, the test device 200 transmits a current value diagnostic command as a first diagnostic command to at least one first diagnostic board among the diagnostic boards 100, and transmits a second diagnostic command to at least one second diagnostic board. An input/output signal diagnostic command can be transmitted. In this case, the first diagnostic command and the second diagnostic command may be different types of diagnostic commands.

For example, the test device 200 can diagnose whether the current value is normally transmitted for four of the eight test slots 211 using a current value diagnosis command, and the four test slots 211 For the test slots 211, it is possible to diagnose whether input/output signals are normally transmitted using an input/output signal diagnosis command. In addition, the test device 200 can diagnose whether the current value is normally transmitted for two of the eight test slots 211 using a current value diagnosis command, and the two test slots 211 For (211), it is possible to diagnose whether the input/output signal is normally transmitted using the input/output signal diagnosis command, and for the remaining four test slots (211), whether the pattern signal is normally transmitted can be diagnosed using the pattern signal diagnosis command. It can be diagnosed.

To explain further, the manager can diagnose whether the current value is normally transmitted in the test slot 211 where an error related to the current value occurs or an abnormality in the current value is found, and whether an error related to the input/output signal occurs or the input/output signal is detected. For the test slot 211 in which a signal abnormality is found, it is possible to diagnose whether the input/output signal is transmitted normally, and for the test slot 211 in which an error related to the pattern signal occurs or an abnormality in the pattern signal is discovered, the pattern signal can be diagnosed. You can diagnose whether transmission is normal.

Accordingly, when simultaneously diagnosing the eight test slots 211, among the various functions of the test slots, diagnosis of the function in which an error occurred or an abnormality was found for each test slot 211 may be performed with priority. Accordingly, test slots can be diagnosed more quickly.

Lastly, the diagnostic boards 100 can be inserted one-to-one into the test slots 211 and perform the function of diagnosing whether the test slots 211 are operating normally.

The configuration and function of each of the diagnostic boards 100 will be described below with reference to FIGS. 3 to 5.

Figure 3 is an exemplary diagram showing the configuration of a diagnostic board applied to the test slot parallel diagnostic device according to the present invention, and Figure 4 shows the connection relationship between the test board and the diagnostic board applied to the test slot parallel diagnostic device according to the present invention. This is an exemplary diagram, and Figure 5 is an exemplary diagram showing an EYE pattern analyzed in the test slot parallel diagnosis device according to the present invention.

The diagnostic boards 100 can be inserted one-to-one into the test slots 211 and perform the function of diagnosing whether the test slots 211 are operating normally.

To this end, as shown in FIG. 3, each of the diagnostic boards 100 includes a current load generator 110, an input/output signal check unit 150, a first PCIe device 180, an interface unit 120, and a control unit. It may include (130) and a communication unit (140).

First, the current load generator 110 consumes the current supplied from the test slot 211.

The current load generator 110 includes at least two loads capable of consuming currents of different magnitudes. For example, the current load generator 110 may include a load that can consume 1 Ampere (1Amp) and a load that can consume 6 Amperes (6Amp), and in addition, currents of various sizes can be consumed. It can include loads that can be loaded. That is, the current load generator 110 may consume various amounts of current according to the control of the controller 130. Accordingly, the current terminal to which current is supplied among the test slots 211 can be diagnosed using currents of various sizes.

The test device 200 may transmit a current value diagnosis command including a set current value to each of the diagnostic boards 100, and each of the diagnostic boards 100 may have a current load generator 110 set to the set current value. The current load generator 110 is controlled to consume the corresponding current.

That is, the test board control unit 231 provided in the test device 200 can transmit a current value diagnosis command to the communication unit 140. The communication unit 140 may communicate with the test board control unit 231 through the interface unit 120, or may be connected between the communication unit 140 and the test board control unit 231 independently of the interface unit 120. Communication may be performed with the test board control unit 231 through a communication line.

The control unit 130 controls the current load generator 110 according to the set current value included in the current value diagnosis command received through the communication unit 140.

For example, when a current value diagnosis command that causes 1 Ampere (1 Amp) of current to be consumed is received, the control unit 130 selects a load set to consume 1 Ampere among the loads provided in the current load generator 110. Connect to the power supply unit 232.

The power supply unit 232 may be provided on the test board 230, as shown in FIG. 4.

The test device 200 can diagnose whether each of the test slots 211 is normal by comparing the set current value with the current consumption value consumed by the current load generator 110.

That is, the test board control unit 231 senses the amount of current supplied from the power supply unit 232 to the current load generator 110 through the current terminal of the test slot 211 and determines the amount of current supplied to the current load generator 110. , that is, calculates the current consumption value.

Afterwards, the test board control unit 231 compares the set current value and the consumed current value.

For example, if the set current value is 1 Amp, but the consumption current value is 1.1 Amp, it may be determined that 0.1 Ampere has leaked from the test slot 211.

In this case, the test board control unit 231 can set and store a compensation value to compensate for the difference of 0.1 ampere.

After diagnosis of the test slot, when the storage element 300 is connected to the test slot 211 and tested, the test device can supply current to the storage element 300 through the test slot 211 using the compensation value. there is.

For example, if the power supply unit 232 needs to supply a current of 1 ampere to the storage element 300, the test board control unit 231 controls the power supply unit 232 using a compensation value to supply 1.1 ampere. You can control it. Accordingly, the power supply unit 232 can supply 1.1 ampere to the test slot 211. Accordingly, substantially 1 ampere can be supplied to the storage element 300, and accordingly, tests on the storage element 300 can be performed normally.

In this case, the diagnosis as described above can be performed using various set current values. The test board control unit 231 may generate compensation values corresponding to various set current values according to the results of diagnosis based on the various set current values. Additionally, the test board control unit 231 may use compensation values corresponding to the set current values to calculate unset compensation values for unset current values that are not included in the set current values.

That is, currents of various sizes may be supplied to the storage element 300. In this case, currents of various sizes supplied to the storage element 300 may be set to set current values. However, when the sizes of currents supplied to the storage element 300 are very diverse, all sizes of currents supplied to the storage element 300 are set to set current values, making it difficult to use them for diagnosis of the test slot 211. .

In this case, as described above, the test board control unit 231 compensates for the unset current values by using compensation values corresponding to the set current values actually used for diagnosis of the test slot 211. Values can be calculated. That is, the test board control unit 231 may calculate unset compensation values from the compensation values using an interpolation method.

When testing the storage element 300, the test board control unit 231 normally sends currents of various sizes to the storage element 300 using the compensation values calculated through the above-described processes and the unset compensation values. can be supplied.

The functions described above can be performed simultaneously on all diagnostic boards 100 connected to the test slots 211.

Next, when the output signal (OS) is received from the test device through the output terminal of the test slot, the input/output signal check unit 150 generates an output response signal (ORS) identical to the output signal (OS) and connects the input terminal of the test slot. transmitted to the test device. To this end, the test board control unit 231 may transmit an input/output signal diagnosis command to the communication unit 140 or the input/output signal check unit 150 to diagnose the input terminal and output terminal of the test slot 211. Here, the output terminal of the test slot 211 refers to a terminal through which a signal output from the test board 230 to the storage element 300 is transmitted, and the input terminal of the test slot 211 refers to a terminal through which a signal is transmitted from the storage element 300 to the test board. (230) refers to the terminal through which the received signal is transmitted.

In this case, the test device 200, especially the test board control unit 231 connected to the test slot, is provided on the diagnosis board 100 and an output signal (OS) output from the test board 230 to the diagnosis board 100. By analyzing the output response signal (ORS) received from the input/output signal check unit 150, it is possible to diagnose whether the output terminal and input terminal of the test slot are operating normally.

For example, the output signal (OS) generated in the test board control unit 231 and transmitted to the diagnostic board 100 through the output terminal of the test slot 211, and the input/output signal check unit ( If the output response signal (ORS) generated in 150) and transmitted to the test board control unit 231 through the input terminal of the test slot 211 is the same or has similar characteristics within the error range, the Both output terminals and input terminals can be diagnosed as normal.

However, if the output signal (OS) and the output response signal (ORS) are not the same or have similar characteristics outside the error range, at least one of the output terminal and input terminal of the test slot 211 may be diagnosed as abnormal. .

In this case, the test board control unit 231 outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 through an output unit provided in the test device 200, or outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 to the administrator terminal 400. ) can transmit a replacement signal or a discontinuation of use signal, and the manager terminal 400 can provide a replacement signal or a discontinuation signal for the corresponding test slot 211 to the manager.

The manager who confirms the replacement signal or stop use signal can replace or not use the test slot 211, and can also perform a more precise diagnosis on the test slot 211.

As another example, when a diagnostic command requesting an input terminal test, that is, an input/output signal diagnostic command, is received from a test device, the input/output signal check unit 150 generates an input signal and then generates an input signal provided in the test slot 211. An input signal can be transmitted to a test device (test board control unit 231) through the input terminal.

The input/output signal diagnosis command may include information related to the input signal. That is, the input/output signal check unit 150 generates an input signal using information included in the input/output signal diagnosis command, and can transmit the generated input signal to the test device through the input terminal.

However, the input/output signal diagnosis command may include information to generate and transmit an input signal. The input/output signal check unit 150, which receives the input/output signal diagnosis command, generates an input signal and transmits it to the test device 200 through the input terminal, and sends information about the generated input signal to the interface unit 120 or the communication unit 140. ) can be transmitted to a test device (test board control unit 231).

In this case, the test device 200, especially the test board control unit 231 connected to the test slot, analyzes the input signal received from the diagnostic board 100 to diagnose whether the input terminal of the test slot is operating normally. .

For example, the input signal generated in the input/output signal check unit 150 and transmitted to the test board control unit 231 through the input terminal of the test slot 211 is a setting input signal based on the information included in the input/output signal diagnosis command. Alternatively, if the set input signal based on the information received from the input/output signal check unit 150 is the same or has similar characteristics within an error range, the input terminal of the test slot 211 may be diagnosed as normal.

However, the input signal generated by the input/output signal check unit 150 and transmitted to the test board control unit 231 through the input terminal of the test slot 211 is a set input signal or input/output signal based on the information included in the input/output signal diagnosis command. If the set input signal based on the information received from the signal check unit 150 is not the same or has similar characteristics outside the error range, the input terminal of the test slot 211 may be diagnosed as abnormal.

In this case, the test board control unit 231 outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 through an output unit provided in the test device 200, or outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 to the administrator terminal 400. ) can transmit a replacement signal or a discontinuation of use signal, and the manager terminal 400 can provide a replacement signal or a discontinuation signal for the corresponding test slot 211 to the manager.

The manager who confirms the replacement signal or stop use signal can replace or not use the test slot 211, and can also perform a more precise diagnosis on the test slot 211.

The functions described above can be performed simultaneously on all diagnostic boards 100 connected to the test slots 211.

Finally, the first PCIe device 180 generates a pattern signal for reception and transmits the pattern signal for reception to the test device, especially the test board 230, through the pattern signal input terminal of the test slot 211. 2 Can be transmitted to the PCIe device 233.

In this case, the second PCIe device 233 can diagnose whether the pattern signal input terminal is operating normally by comparing the width of the EYE pattern obtained as a result of EYE analysis of the reception pattern signal with a reference value.

Here, the first PCIe device 180 and the second PCIe device 233 refer to devices that transmit and receive pattern signals using PCIe (Peripheral Component Interconnect standard Express) that supports wide bandwidth.

For example, when a diagnostic command requesting diagnosis of pattern signal transmission characteristics, that is, a pattern signal diagnostic command, is received from a test device, the first PCIe device 180 generates a pattern signal for reception and then enters the test slot 211. A pattern signal for reception can be transmitted to a test device (test board control unit 231) through the provided pattern signal input terminal.

The pattern signal diagnosis command may include information related to the pattern signal for reception. That is, the first PCIe device 180 can generate a pattern signal for reception using information included in the pattern signal diagnosis command, and transmit the generated pattern signal for reception to a test device.

However, the pattern signal diagnosis command may include information to generate and transmit a pattern signal for reception. The first PCIe device 180, which has received the pattern signal diagnosis command, generates a pattern signal for reception and transmits it to the test device 200, and sends information about the generated pattern signal to the interface unit 120 or the communication unit 140. ) can be transmitted to a test device (test board control unit 231).

In this case, the test device 200, especially the second PCIe device 233 connected to the test slot, compares the width of the EYE pattern obtained as a result of EYE analysis of the reception pattern signal with the reference value to determine whether the pattern signal input terminal is operating normally. can be diagnosed.

The reference value may be the minimum width that can be recognized as a usable EYE pattern, or may be the width of the pattern signal for reception when generated by the first PCIe device 180, or at least one of various reference values used for EYE pattern analysis. It could be one.

For example, the second PCIe device 233 generates an EYE pattern for the reception pattern signal received through the pattern signal input terminal, as shown in (b) of FIG. 5.

As a result of the EYE pattern analysis, the width (Y) of the EYE pattern is the reference value (X), for example, the width of the receiving pattern signal when generated in the first PCIe device 180 shown in (a) of FIG. 5. If it is greater than that, the pattern signal input terminal of the test slot 211 can be diagnosed as normal. Additionally, as a result of the EYE pattern analysis, if the width (Y) of the EYE pattern is greater than the reference value (X) that can be recognized as a usable EYE pattern, the pattern signal input terminal of the test slot 211 may be diagnosed as normal. In addition, as a result of the EYE pattern analysis, if the width (Y) of the EYE pattern satisfies the reference value (X) corresponding to various reference values used in EYE pattern analysis, the pattern signal input terminal of the test slot 211 can be diagnosed as normal. You can.

To elaborate, if the width (Y) of the analyzed EYE pattern is greater than the reference value (X), the second PCIe device 233 may diagnose that the pattern signal input terminal of the test slot 211 is normal.

However, if the width (Y) of the analyzed EYE pattern is smaller than the reference value (X), the pattern signal input terminal of the test slot 211 may be diagnosed as abnormal. The fact that the width (Y) of the EYE pattern is smaller than the reference value (X) means that the receiving pattern signal is excessively changed due to noise, etc. when the receiving pattern signal is transmitted through the pattern signal input terminal.

If it is determined that the pattern signal input terminal is not normal, the test board control unit 231 outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 through the output unit provided in the test device 200, or the administrator terminal A replacement signal or a discontinuation signal for the test slot 211 can be transmitted to (400), and the manager terminal 400 can provide a replacement signal or a discontinuation signal for the corresponding test slot 211 to the manager. .

The manager who confirms the replacement signal or stop use signal can replace or not use the test slot 211, and can also perform a more precise diagnosis on the test slot 211.

As another example, when the first PCIe device 180 transmits an output pattern signal from the second PCIe device 233 through the pattern signal output terminal of the test slot, the width of the EYE pattern obtained as a result of EYE analysis of the output pattern signal By comparing with the reference value, it is possible to diagnose whether the pattern signal output terminal provided in the test slot 211 is operating normally.

For example, the first PCIe device 180 can diagnose whether the pattern signal output terminal is operating normally by comparing the width of the EYE pattern obtained as a result of EYE analysis of the output pattern signal with a reference value.

The reference value may be the minimum width that can be recognized as a usable EYE pattern, or may be the width of the output pattern signal when generated by the second PCIe device 233, or at least one of various reference values used for EYE pattern analysis. It could be. If the reference value is the width of the output pattern signal when generated by the second PCIe device 233, the second PCIe device 233 may transmit information related to the width of the output pattern signal to the first PCIe device 180.

The first PCIe device 180 generates an EYE pattern for the output pattern signal received through the pattern signal input terminal, as shown in (b) of FIG. 5.

As a result of the EYE pattern analysis, if the width (Y) of the EYE pattern is greater than the reference value (X), the pattern signal output terminal of the test slot 211 may be diagnosed as normal.

However, if the width (Y) of the analyzed EYE pattern is smaller than the reference value (X), the pattern signal output terminal of the test slot 211 may be diagnosed as abnormal.

The diagnosis result may be transmitted to the test board control unit 231, the main control unit, or the administrator terminal 400 through the communication unit 140.

If it is determined that the pattern signal output terminal is not normal, the test board control unit 231 or the main control unit outputs a replacement signal or a discontinuation signal for the corresponding test slot 211 through an output unit provided in the test device 200, or A replacement signal or a discontinuation signal for the corresponding test slot 211 can be transmitted to the administrator terminal 400. In addition, the manager terminal 400, which has received the diagnosis result through the test board control unit 231 or the main control unit or communication unit 140, may provide a replacement signal or a discontinuation signal for the test slot 211 to the manager. .

The manager who confirms the replacement signal or stop use signal can replace or not use the test slot 211, and can also perform a more precise diagnosis on the test slot 211.

The functions described above can be performed simultaneously on all diagnostic boards 100 connected to the test slots 211.

According to the present invention as described above, all test slots 211 provided in the test device 200 can be diagnosed simultaneously, and accordingly, the diagnosis process for the test slots 211 can proceed quickly.

Accordingly, testing of the storage elements 300 can also be conducted quickly.

The embodiments described above should be understood in all respects as illustrative and not restrictive. The scope of the present invention is indicated by the claims described below rather than the detailed description above, and all changes or modified forms derived from the meaning and scope of the claims and their equivalent concepts should be interpreted as being included in the scope of the present invention. do.

100: diagnostic board 200: test device
300: storage element 400: administrator terminal
211: test slot

Claims (10)

A test device including test slots to which storage elements under test are connected; and
Includes diagnostic boards that are inserted one-to-one into the test slots to diagnose whether the test slots are operating normally,
The test device generates a diagnostic command for diagnosis of the test slot for each test slot, transmits it to the diagnostic board inserted into the corresponding test slot, and obtains diagnostic information generated from each of the diagnostic boards according to the diagnostic command to test the test. A test slot parallel diagnostic device that simultaneously diagnoses whether each slot is operating normally. According to claim 1,
The test slot parallel diagnostic device analyzes the diagnostic information and outputs a replacement signal or a discontinuation signal for the test slot for which diagnostic information exceeding a preset error range has been obtained. According to claim 1,
The test device transmits a first diagnostic command to a first diagnostic board among the diagnostic boards and a second diagnostic command to a second diagnostic board,
The first diagnostic command and the second diagnostic command are different types of diagnostic commands. According to claim 1,
The diagnosis command is a current value diagnosis command for diagnosing the current value consumed through the test slot, an input/output signal diagnosis command for diagnosing the input/output signal transmission characteristics of the test slot, and a pattern signal diagnosis command for diagnosing the pattern signal transmission characteristics of the test slot. A parallel diagnostic device with at least one test slot. According to paragraph 1,
Each of the diagnostic boards includes a current load generator that consumes current supplied from the test slot,
The test device transmits a current value diagnosis command including a set current value to each of the diagnostic boards, and the diagnostic board controls the current load generator so that the current load generator consumes a current corresponding to the set current value, The test device is a test slot parallel diagnosis device that diagnoses whether each test slot is normal by comparing a set current value with a current consumption value consumed by the current load generator. According to claim 1,
Each of the diagnostic boards includes an input/output signal check unit,
The input/output signal check unit,
When an output signal is received from the test device through the output terminal of the test slot, an output response signal identical to the output signal is generated and transmitted to the test device through the input terminal of the test slot, and an input/output signal requesting an input terminal test. A test slot parallel diagnostic device that generates an input signal when a diagnostic command is received from the test device and transmits the input signal to the test device through the input terminal. According to claim 6,
The test device is,
By analyzing the output signals output to the diagnostic boards and the output response signals received from the input/output signal check units provided in the diagnostic boards, it is diagnosed whether the output terminals of the test slots are operating normally,
A test slot parallel diagnostic device that analyzes input signals received from the diagnostic boards to diagnose whether input terminals of the test slots are operating normally. According to claim 1,
Each of the diagnostic boards includes a first PCIe device,
The first PCIe device generates a pattern signal for reception and transmits the pattern signal for reception to a second PCIe device provided in the test device through the pattern signal input terminal of the test slot,
The second PCIe device is a test slot parallel diagnosis device that diagnoses whether the pattern signal input terminal is operating normally by comparing the width of the EYE pattern obtained as a result of EYE analysis of the reception pattern signal with a reference value. According to claim 8,
When an output pattern signal is transmitted from the second PCIe device through the pattern signal output terminal of the test slot, the first PCIe device compares the width of the EYE pattern obtained as a result of EYE analysis of the output pattern signal with a reference value and determines the pattern signal. A test slot parallel diagnostic device that diagnoses whether the signal output terminal is operating normally. According to claim 1,
The test device includes test boards connected to the test slots,
A test slot parallel diagnostic device wherein each of the test boards includes a test board control unit that generates the diagnostic command.

Images