KR20190008482A - Insert for test handler - Google Patents

Abstract

The present invention relates to an insert for a test handler which has a stacking space in which an electronic component can be stacked. According to the present invention, the insert for a test handler comprises a flow suppressor which can suppress an arbitrary flow of a main body having the stacking space. According to the present invention, the accuracy in a checking operation on a remaining state of the electronic component is improved by light-receiving and light-emitting sensors, and an impact due to an unintentional external force is buffered, thereby minimizing a probability of separating the electronic component.

Description

INSERT FOR TEST HANDLER}

The present invention relates to an insert used for loading electronic components in a test handler for electrically connecting an electronic component such as a semiconductor device to a tester.

Electronic components such as semiconductor devices are produced through numerous processes as the case may be. Even though each process is performed under standardized conditions, it is practically impossible to produce only good products of electronic products, since the fine fluctuation of the conditions affects the production of electronic products. Therefore, the produced electronic parts are tested by a tester and then divided into good and defective parts, and only good parts are shipped.

Testing of electronic components is only possible if the electronic components are electrically connected to the tester. At this time, the test handler is a device that electrically connects the test socket of the tester to the electronic component.

The types of electronic components vary, and the electrical connection structure of electronic components is also various. So there are various types of test handlers.

There are a variety of types of test handlers that electrically connect electronic components and testers with electronic components loaded in test trays, and the present invention relates to these types of things.

The test handler to which the test tray is applied loads the electronic parts to be tested into the test tray and presses the electronic parts loaded in the test tray with the pusher to electrically connect the electronic parts to the tester Korean Patent Laid-Open Publication No. 10-2014-0127389), and when the test is completed, an unloaded electronic component from the test tray should be performed.

The test tray includes inserts and frames as disclosed in Korean Patent Laid-Open No. 10-2008-0040251.

The insert has a loading space for loading electronic components as described in Korean Utility Model Publication No. 20-2009-0001188, and a latch for holding the loaded electronic components stably in the loading space (a 'holding device' Quot;).

The loading space shall be open to penetrate vertically. This is because the electronic components must be drawn in or out of the loading space upward and the terminal of the electronic component must be exposed to the side of the tester by an area other than the supporting jaw supporting the electronic component in the downward direction. The open area at the top and bottom of the loading space is proportional to the size of the electronic component.

Inserts are installed in the frame.

In general, all components that make up a tester or test handler (for example, inserts, test trays, moving devices that move test trays, pushers, tester sockets) have manufacturing tolerances. Thus, for electronic and test sockets to be electrically precisely connected, the matching between the insert and the pusher and the matching between the insert and the test socket are required. Such mating requires relative movement between the insert and the pusher or test socket. However, because pushers and test sockets are fixedly installed, proper movement of the inserts is required during each matching process. So the inserts must be installed somewhat flowable in the frame.

On the other hand, when the tested electronic component is unloaded from the test tray, the electronic component to be tested is loaded into the empty test tray. At this time, if there are electronic parts remaining in the test tray due to defective unloading operation, problems such as defective loading operation, bad operation of the latch, damage of the electronic parts and inserts, and loss of electronic parts occur. Therefore, as described in Korean Patent Laid-Open Publication No. 10-1998-0063277, an operation of confirming whether or not the electronic parts remain in the test tray in which the unloading operation is completed is performed by using the water light emission sensor.

Conventionally, the size of the electronic parts is so large that the flow of the insert does not affect the confirmation operation of the water light emitting sensor. This will be described in detail with reference to FIG.

In FIG. 1, L ₁ is a hypothetical line (a line connecting ideal points where the center of the electronic component is to be positioned) along which the light of the light emitting sensor passes, L ₂ is the degree of twist of the test tray with respect to L ₁ It is a line.

For example, various mechanical tolerances, approximately lie non wrong test tray, insert 100 passes through the point (PP ₁ to PP even considering the flow level number of light by the light sensor, as in (a) of Fig. 1 ₄ ) did not deviate from the position of the remaining electronic component (ED).

However, due to the development of integrated technology, electronic parts are becoming smaller and smaller, so that the lower area of the loading space becomes smaller. As the bottom area of the loading space narrows, the area through which the light can pass through the light receiving sensor is reduced. Thus, as shown in FIG. 1 (b), a phenomenon in which the light from the light emitting sensor is clogged by the insert 100 itself (PP) due to the various mechanical tolerances, the degree of misalignment of the test tray, the degree of flow of the insert 100, ₂ points and PP ₄ points) are likely to occur. That is, as shown in FIG. 1, the position of the electronic component may be significantly deviated from the correct position due to the twist of the test tray or the insertion of the insert. In this case, even if there is no remaining electronic component (ED), it is confirmed that the electronic component (ED) is remained, resulting in a jam, which accompanies troublesome reconfirmation work and also causes a decrease in operation rate. do.

However, since it is difficult to reduce the limit tolerance that occurs in various mechanisms, there is a need to minimize or prevent the degree of misplacement of the test tray and the degree of flow of the insert.

It is expected that the degree of misalignment of the test tray can be solved in the direction of minimizing through automatic alignment. However, it is practically difficult to minimize the degree of flow of the insert in that the flow of the insert is necessary as long as there are various mechanical tolerances. In particular, it can not be considered that the insert is fixed to the frame without flow.

SUMMARY OF THE INVENTION An object of the present invention is to provide a technique relating to an insert which can guarantee the accuracy of the operation by the light emitting sensor which confirms whether the electronic component remains or not while ensuring the fluidity of the insert.

An insert for a test handler according to the present invention comprises a mounting space for mounting electronic components, a first matching hole to be matched with a pusher for pressing the electronic component to the test socket side, and a test socket on the tester side electrically connected to the electronic component A body having a second matching hole to be matched; The pusher includes a first matching pin inserted into the first matching hole and capable of exerting an external force on the body, and the test socket is inserted into the second matching hole, And a main body provided with a matching pin, and the main body having a base supporting the electronic parts loaded in the loading space, wherein the main body is installed in the main body and is operated to open the loading space so that the electronic component can be inserted into and out of the loading space A pair of latches for stably holding the electronic components loaded in the loading space; And at least one flow suppressor to suppress any flow of the main body when the main body is installed in the frame and to allow flow of the main body when an external force is applied; .

The flow restrainer has a spring capable of resiliently deforming and restoring the side surface of the body while elastically supporting the body.

The spring is provided in the form of a coil, and the flow restrainer further includes a pressing member elastically supported by the spring to elastically press the frame.

The flow restrainer is symmetrically disposed at least in a direction perpendicular to a direction in which the pair of latches are installed.

The present invention has the following effects.

First, if no external force is applied, the flow of the insert is suppressed and prevented, thereby improving the accuracy of confirming whether or not the electronic parts are left by the light emitting sensor.

Second, it minimizes the possibility of disengagement of electronic components by significantly buffering the impact of unintentional or external forces from the operating process.

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a reference diagram for describing a problem of the prior art.
Figure 2 is a conceptual top view of a test handler to which a test tray with inserts according to the present invention may be applied.
3 is a schematic view of a pusher of a pressurizing device that can be applied to the test handler of FIG.
Figure 4 is a schematic view of a test socket of a tester coupled to the test handler of Figure 2;
Figure 5 is a partially exploded perspective view of a test tray that may be applied to the test handler of Figure 5;
6 is another example of a frame constituting a test tray.
Figure 7 is a schematic plan view of an insert according to a first embodiment of the invention applied to the test tray of Figure 5;
Figures 8 and 9 are variations on the insert of Figure 7.
10 is a schematic plan view of an insert according to a second embodiment of the present invention.
11 is a schematic plan view of an insert according to a third embodiment of the present invention.
12 is a modification of the insert of Fig.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of description, descriptions of redundant or substantially identical configurations are omitted or compressed as much as possible.

<Outline of test handler>

2 is a conceptual plan view of a test handler (TH) to which a test tray with an insert according to the invention can be applied.

The test handler TH includes a loading device LA, a soak chamber SC, a test chamber TC, a pressurizing device PA, a dissocking chamber DC and an unloading device UA.

The loading apparatus LA loads the electronic components to be tested loaded in the customer tray CT ₁ into the test tray TT in the loading position LP.

The soak chamber SC is provided for applying a thermal stimulus (high temperature or low temperature) to the electronic parts loaded in the test tray TT from the loading position LP. Of course, in the case of a room temperature test, it is not necessary to apply a thermal stimulus.

The test chamber TC provides a space through which the electronic components loaded in the test tray TT through the soak chamber SC can be tested.

The pressurizing device PA presses the electronic components of the test tray TT in the test position TP in the test chamber TC toward the tester TESTER side so that the electronic components are electrically connected to the test sockets provided in the tester TESTER Lt; / RTI &gt; Wherein the pressurizing device PA has the same number of pushers P as the number of inserts in the test tray TT and each pusher P has a number of pushers P for matching with the insert the first has the mating pin (AP _1). And as in the schematic diagram of FIG. 4, the test socket TS also has a second mating pin AP ₂ for mating with the insert in the pressing process.

The dissocking chamber DC is provided to remove the previously applied thermal stimuli from the electronic components loaded in the test tray TT from the test chamber TC.

Unloading device (UA) is unloaded while the electronic components from the unloading position (UP) in the on test tray (TT) is moved to an empty customer tray (CT _2). At this time, the unloading apparatus UA classifies the electronic components according to the test result.

In addition to the basic configurations as described above, the test handler TH is configured to connect the test tray TT to the loading position LP via the loading position LP, the test position TP and the unloading position UP, A plurality of moving devices for moving along the path C are provided.

For reference, the test handler (TH) to which the test tray (TT) is applied has a vertical type in which the electronic parts are electrically connected to the tester (TESTER) while the test tray is vertically erected, (TESTER). The test handler of Fig. 2 described above has a vertical example, but the insert according to the invention can of course also be applied to a horizontal test handler.

<Outline of Test Tray>

Fig. 5 shows a part of a test tray TT which can be applied to the test handler TH.

The test tray TT includes an insert 200, a frame FR, and a mounting bolt IB according to an example of the present invention.

The insert 200 is provided for loading electronic components, and more specific embodiments are described below.

The frame (FR) is provided with an insert (200). To this end, the frame FR has compartments D for partitioning and installing the inserts 200 in a location other than the border B. These segmented teeth D may have a shorted portion A as shown in FIG.

The mounting bolts IB are provided for installing the inserts 200 so as not to be separated from the frame FR.

Various embodiments of the insert according to the present invention will now be described.

<First Embodiment of Insert>

7 is a schematic plan view of an insert 200 according to a first embodiment of the present invention shown in FIG.

The insert 200 according to this embodiment includes a body 210, a pair of latches 220, and four flow suppressors 230.

The main body has a loading space LS, a first matching hole AH ₁ , a second matching hole AH ₁ and a receiving jaw 211.

The loading space LS is formed in a form in which electronic parts can be loaded, and is opened up and down as mentioned above.

The first matching hole AH ₁ is formed to match the pusher P which presses the electronic component toward the test socket TS side. That is, the first matching pin AP ₁ of the pusher P is inserted into the first matching hole AH ₁ and the first matching pin AP ₁ applies an external force to the insert 200, Thereby causing the insert 200 to move finely so that the fit between the pusher P and the insert 200 is achieved.

And the second matching hole AH ₂ is formed to match with the test socket TS. Similarly, second matching pin of the test socket (TS) in the pressing process (AP ₂₎ the second matching hole as inserted in (AH _2), a second matching pin (AP ₂₎ insert standing applying an external force to the insert (200) Thereby causing movement of the insert 200 so that the match between the test socket TS and the insert 200 is made as the insert 200 moves finely.

The pedestal 211 supports the electronic components loaded in the loading space LS, thereby preventing the electronic parts loaded in the loading space LS from falling downward. The base jaw 211 is located near the lower end of the loading space LS.

Of course, the support jaw 211 may be replaced with a support film (referred to in the art as "support member") as in Korean Patent Laid-Open No. 10-2014-0070863. In this case, if the support film is semi-transparent, an image of the light formed on the support film is captured by the light emission sensor. If the support film is transparent, light transmitted through the support film may be recognized by the light receiving sensor. If the supporting film is opaque, a structure may be considered in which a through hole is formed in the vicinity of the center of the supporting film so that light of the light emitting sensor can pass through. In this case, light passes through the through hole smaller than the size of the semiconductor element It is predicted that the importance of the flow suppressor according to the present invention to be described later will become more remarkable.

The pair of latches 220 are installed in the main body 210 and are operated by a separate opening unit (not shown) so as to open the loading space LS so that the electronic parts can be put into and out of the loading space LS Thereby stably holding the electronic parts loaded in the loading space LS.

The flow suppressing devices 230 are installed on the four sides of the main body 210 to suppress the arbitrary flow of the main body 210 and permit the flow of the main body 210 when receiving external force. For this, the flow suppressor 230 in the insert 200 according to the present embodiment is provided in the form of a bent leaf spring capable of being elastically deformed and restored. One side of the leaf suppressor 230 is an inner side of the frame FR (Inner surface of the frame D or the frame B) and the other side is fixedly coupled to the main body 210 to elastically support the main body 210 with respect to the frame D or the frame B of the frame FR . Therefore, if the external force is not applied to the insert 200, the main body 210 is positioned by the flow suppressing units 230, and if the external force is removed even if the main body 210 moves due to an external force, ) Are moved to the home position and aligned at the home position.

In addition, the flow suppressor 230 significantly buffers the impacts when an unintended or operational impact is applied to the test tray TT by its elastic action. Thereby minimizing the possibility that the electronic component will be separated from the loading space LS due to a strong impact. In the case of semiconductor devices, for example, conventional semiconductor devices are relatively large, but they are getting smaller as the integration and process technology are developed. Therefore, in the related art, it is possible to sufficiently maintain a large semiconductor element in the loading space LS by using only the latch 220. However, in a state where a frequent impact is applied in the near future, It can be predicted that it may become difficult to maintain the temperature of the liquid. Frequent impacts can occur in the process of transporting the test tray (TT) or in the process of setting the test tray (TT) vertically. The insert 200 according to the present invention may also be used in conjunction with the latch 220 because the flow suppressor 230 absorbs a certain amount of operating shock or unintended impact. The holding function of the semiconductor device can be complemented.

Meanwhile, the insert 200A of FIG. 8 shows a modification including two flow suppressing units 230A. In other words, the flow suppressor 230A may be provided in a minimum number that can align the main body 210A. If the main body 210A is a structure that can be aligned only in one direction, An example in which only one flow suppressor 230B is configured as in the insert 200B according to the first embodiment can be fully considered.

Of course, the flow suppressor 230 may be provided in three or five or more locations in consideration of the need and structure or the zero point position of the electronic components loaded in the insert 200, The same can be considered in the second and third embodiments.

&Lt; Second Embodiment for Insert >

10 is a schematic plan view of an insert 300 according to a second embodiment of the present invention.

The insert 300 according to the present embodiment includes a body 310, a pair of latches 320, and four flow suppressors 330. Functions of the main body 310, the pair of latches 320, and the four flow suppressing units 330 are the same as those in the first embodiment, and therefore, only the advantages thereof will be described.

The main body 310 is provided with an installation hole IH through which the flow suppressor 330 can be installed.

The flow suppressor 330 includes a coil spring 331 and a pressing member 332.

The coil spring 331 resiliently supports the pressing member 332 such that the pressing member 332 contacts the compartment D or the visual tape B. [

One side of the pressing member 332 contacts the partition D or the frame B of the frame FR and the other side is inserted into the mounting hole IH of the main body 310. [ The resilient pressing force of the coil spring 331 acts between the partition D or the frame B and the main body 310 via the pressing member 332. [ Of course, the latching end HT is provided on the other side of the pressing member 332 so that the pressing member 332 can be prevented from coming out of the mounting hole IH if the pressing member is inserted into the mounting hole IH.

&Lt; Third embodiment about insert >

11 is a schematic plan view of an insert 400 according to a third embodiment of the present invention.

The insert 400 according to this embodiment includes a body 410, a pair of latches 420, and four flow suppressors 430. Similarly, the functions of the main body 410, the pair of latches 420, and the four flow suppressing units 430 are the same as in the first and second embodiments, and therefore, only the specific points will be described.

The main body 410 is formed with an installation groove IS through which the flow suppressor 430 can be installed.

The flow suppressor 430 includes a coil spring 431 and a pressing member 432.

The coil spring 431 resiliently supports the pressing member 432 such that the pressing member 432 comes into contact with the compartment D or the visual B.

The pressing member 432 has the shape of a ball. That is, the flow suppressor 430 in this embodiment is implemented in the form of a ball plunger.

When the flow suppressor 430 is implemented in the form of a ball plunger as in the present embodiment, as in the deformed insert 400A of Fig. 12, the contact of the pressing member 432A with the compartment D or the rim B The slope of the main body 410 can be aligned by the pair of flow suppressing devices 430A symmetrical to each other by forming the guide grooves GS into which the portions can be slightly inserted. This technical effect can also be obtained by machining the end of the pressing member 332 shown in the above-mentioned second embodiment into a spherical shape.

As described above, the inserts 200, 300, and 400 according to the present invention align the positions of the main bodies 210, 310, and 410 when the external force is not applied, . Therefore, it is sufficient if at least one flow suppressor 230, 330, and 430 is provided as described above. As shown in FIG. 12, for convenience of design, it is preferable to be symmetrically disposed in a direction X orthogonal to a direction Y where the pair of latches 420 are installed.

It should be understood, however, that the present invention is not limited to the above-described embodiment, and that the scope of the present invention is not limited to the following claims and equivalents thereof It should be understood.

200: Insert
210:
211:
AH ₁ : first matching hole AH ₂ : second matching hole
220: Latch
230: Flow Suppressor

Claims (4)

A first matching hole to be matched with a pusher for pressing the electronic component to the test socket side, and a second matching hole to be matched with a test socket on the tester side electrically connected to the electronic component main body; The pusher includes a first matching pin inserted into the first matching hole and capable of exerting an external force on the body, and the test socket is inserted into the second matching hole, And has a matching pin.
A pair of latches installed in the main body to stably maintain the electronic components that are operated to open the loading space for loading or unloading the electronic parts into or out of the loading space or loaded in the loading space; And
At least one flow suppressor for restricting arbitrary flow of the main body when the main body is installed in the frame and allowing flow of the main body when receiving an external force; Containing
Insert for test handler. The method according to claim 1,
Wherein the flow restrictor has a spring capable of resiliently deforming and restoring the side surface of the main body while elastically supporting the side surface of the main body on the inner surface of the frame
Insert for test handler. 3. The method of claim 2,
The spring is provided in the form of a coil,
The flow restrainer further includes a pressing member elastically supported by the spring to elastically press the frame
Insert for test handler. The method according to claim 1,
Wherein the flow restrainer is symmetrically disposed in a direction orthogonal to a direction in which at least one pair of the latches is installed
Insert for test handler.

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