KR19990087016A - 자기검출장치_ - Google Patents
자기검출장치_ Download PDFInfo
- Publication number
- KR19990087016A KR19990087016A KR1019980057181A KR19980057181A KR19990087016A KR 19990087016 A KR19990087016 A KR 19990087016A KR 1019980057181 A KR1019980057181 A KR 1019980057181A KR 19980057181 A KR19980057181 A KR 19980057181A KR 19990087016 A KR19990087016 A KR 19990087016A
- Authority
- KR
- South Korea
- Prior art keywords
- magnetic field
- magnetic
- gmr element
- predetermined
- resistance
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 22
- 238000000034 method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 14
- 235000002595 Solanum tuberosum Nutrition 0.000 description 7
- 244000061456 Solanum tuberosum Species 0.000 description 7
- BGPVFRJUHWVFKM-UHFFFAOYSA-N N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] Chemical compound N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] BGPVFRJUHWVFKM-UHFFFAOYSA-N 0.000 description 6
- 238000007493 shaping process Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000005389 magnetism Effects 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 1
- 239000003205 fragrance Substances 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 229910000889 permalloy Inorganic materials 0.000 description 1
- 239000011295 pitch Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Hall/Mr Elements (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
Claims (3)
- 자계를 발생하는 자계발생 수단과 이 자계 발생수단과 소정의 간극을 갖고 배치되고 이 자계 발생수단에 의해 발생된 자계를 변화 시키는 돌기형상을 구비한 자성회전체와, 이 자성회전체에서 변화된 자계에 따라 저항치가 변화하는 거대자기 저항소자를 구비하고, 상기 거대자기 저항소자를 이 거대자기 저항소자의 저항 변화율의 온도 특성이 작은 소정의 인가 자계의 진폭범위 내에서 동작 하도록 상기 자계 발생수단과 소정의 간극을 갖고 배치 하도록 한 것을 특징으로 하는 자기 검출장치.
- 제 1항에 있어서,상기 소정의 인가 자계의 진폭범위는 50 ~ 150[Oe]인 것을 특징으로 하는 자기 검출장치.
- 제 1항에 있어서,상기 거대자기 저항소자는 제 1의 자기저항 패턴과 제 2의 자기저항 패턴을 갖고 상기 제 1의 자기저항 패턴을 상기 거대자기 저항소자의 저항 변화율의 온도 특성이 작은 제 1의 소정의 인가 자계의 진폭범위내에서 동작 하도록 상기 자계발생수단과 소정의 간극을 갖고 배치하고 상기 제 2의 자기저항 패턴을 상기거대 자기저항 소자의 저항 변화율의 온도 특성이 작은 제 2의 소정과 인가 자계의 진폭범위내에서 동작 하도록 상기 자계발생수단과 소정의 간극을 갖고 배치해서 브리지 회로를 구성 하도록 한 것을 특징으로 하는 자기 검출장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12628198A JP3448209B2 (ja) | 1998-05-08 | 1998-05-08 | 磁気検出装置 |
JP98-126281 | 1998-05-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19990087016A true KR19990087016A (ko) | 1999-12-15 |
KR100363128B1 KR100363128B1 (ko) | 2003-02-17 |
Family
ID=14931339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-1998-0057181A KR100363128B1 (ko) | 1998-05-08 | 1998-12-22 | 자기검출장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6246234B1 (ko) |
JP (1) | JP3448209B2 (ko) |
KR (1) | KR100363128B1 (ko) |
DE (1) | DE19851323B4 (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1138153C (zh) * | 1998-09-28 | 2004-02-11 | 西加特技术有限责任公司 | 四层gmr夹层结构 |
US6577123B2 (en) * | 2001-06-04 | 2003-06-10 | Delphi Technologies, Inc. | Linear position sensor assembly |
US6911826B2 (en) * | 2001-06-12 | 2005-06-28 | General Electric Company | Pulsed eddy current sensor probes and inspection methods |
US6992479B2 (en) * | 2003-01-31 | 2006-01-31 | Delphi Technologies, Inc. | Magnetic sensor array configuration for measuring a position and method of operating same |
DE202005011361U1 (de) * | 2005-07-19 | 2006-11-23 | Woelke Magnetbandtechnik Gmbh & Co Kg | Magnetfeldempfindlicher Sensor |
US7521922B2 (en) * | 2006-11-07 | 2009-04-21 | Key Safety Systems, Inc. | Linear position sensor |
KR100872091B1 (ko) * | 2007-04-26 | 2008-12-05 | 에스앤티대우(주) | 상대변위 측정 센서모듈 및 이를 이용한 이동방향 감지방법 |
DE202007014319U1 (de) * | 2007-10-12 | 2009-02-26 | Woelke Magnetbandtechnik Gmbh & Co. Kg | Magnetfeldempfindlicher Sensor |
US7977935B2 (en) * | 2009-06-04 | 2011-07-12 | Key Safety Systems, Inc. | Temperature tolerant magnetic linear displacement sensor |
JP5215370B2 (ja) * | 2010-11-22 | 2013-06-19 | 三菱電機株式会社 | 磁気式位置検出装置 |
KR101636412B1 (ko) * | 2014-09-03 | 2016-07-05 | 한국수력원자력 주식회사 | 피검사체의 균열길이 측정방법 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3132549A1 (de) * | 1981-08-18 | 1983-03-03 | Robert Bosch Gmbh, 7000 Stuttgart | Vorrichtung zur erfassung der drehzahl von rotierenden teilen |
DE3426784A1 (de) * | 1984-07-20 | 1986-01-30 | Bosch Gmbh Robert | Magnetoresistiver sensor zur abgabe von elektrischen signalen |
US5644226A (en) * | 1994-03-02 | 1997-07-01 | Nippondenso Co., Ltd. | Magnetic detector having a bias magnet and magnetoresistive elements shifted away from the center of the magnet |
US5488294A (en) * | 1995-01-18 | 1996-01-30 | Honeywell Inc. | Magnetic sensor with means for retaining a magnet at a precise calibrated position |
JP3605880B2 (ja) * | 1995-05-12 | 2004-12-22 | 株式会社デンソー | 非接触型回転センサ |
JPH09329462A (ja) * | 1996-06-10 | 1997-12-22 | Mitsubishi Electric Corp | 検出装置 |
JPH09329461A (ja) | 1996-06-10 | 1997-12-22 | Mitsubishi Electric Corp | 検出装置 |
JPH10239098A (ja) | 1997-02-26 | 1998-09-11 | Mitsubishi Electric Corp | 磁気検出装置 |
-
1998
- 1998-05-08 JP JP12628198A patent/JP3448209B2/ja not_active Expired - Lifetime
- 1998-10-20 US US09/175,413 patent/US6246234B1/en not_active Expired - Lifetime
- 1998-11-06 DE DE19851323A patent/DE19851323B4/de not_active Expired - Lifetime
- 1998-12-22 KR KR10-1998-0057181A patent/KR100363128B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE19851323B4 (de) | 2004-05-06 |
DE19851323A1 (de) | 1999-11-25 |
KR100363128B1 (ko) | 2003-02-17 |
JP3448209B2 (ja) | 2003-09-22 |
JPH11325814A (ja) | 1999-11-26 |
US6246234B1 (en) | 2001-06-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6169396B1 (en) | Sensing device for detecting change in an applied magnetic field achieving high accuracy by improved configuration | |
US6107793A (en) | Magnetic sensing device unaffected by positioning error of magnetic field sensing elements | |
US7112957B2 (en) | GMR sensor with flux concentrators | |
JPH11304415A (ja) | 磁気検出装置 | |
US20070096716A1 (en) | Current sensor | |
JPH11304414A (ja) | 磁気検出装置 | |
US6819101B2 (en) | Magnetic detector | |
JP2012112703A (ja) | 磁気式位置検出装置 | |
US20100001723A1 (en) | Bridge type sensor with tunable characteristic | |
US6111403A (en) | Magnetic detector wherein the magnetic flux crosses the sensing elements at a predetermined angle | |
KR19990087016A (ko) | 자기검출장치_ | |
US7064649B2 (en) | Magneto-resistive layer arrangement and gradiometer with said layer arrangement | |
JP3619156B2 (ja) | 磁気検出装置 | |
US6014023A (en) | High resolution magnetoresistance sensing device with accurate placement of inducing and detecting elements | |
KR100538871B1 (ko) | 회전 검출 장치 | |
JP4286739B2 (ja) | 磁気検出装置 | |
KR20050116783A (ko) | 자기 검출 장치 | |
KR100631355B1 (ko) | 자기 센서, 자기 헤드, 하드 디스크 장치, 및 디스크 어레이 장치 | |
KR100323906B1 (ko) | 자기검출장치_ | |
JP2707850B2 (ja) | 磁気抵抗素子 | |
JP2000028395A (ja) | 磁気検出装置 | |
JPH08297814A (ja) | 磁気抵抗効果素子 | |
JPS5856485A (ja) | 磁気抵抗効果素子 | |
JPS63255980A (ja) | 磁気抵抗素子 | |
JPH1123724A (ja) | 強磁性物体通過センサ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application | ||
AMND | Amendment | ||
J201 | Request for trial against refusal decision | ||
E902 | Notification of reason for refusal | ||
B701 | Decision to grant | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121114 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20131031 Year of fee payment: 12 |
|
FPAY | Annual fee payment |
Payment date: 20141103 Year of fee payment: 13 |
|
FPAY | Annual fee payment |
Payment date: 20151016 Year of fee payment: 14 |
|
FPAY | Annual fee payment |
Payment date: 20161020 Year of fee payment: 15 |
|
FPAY | Annual fee payment |
Payment date: 20171018 Year of fee payment: 16 |
|
FPAY | Annual fee payment |
Payment date: 20181101 Year of fee payment: 17 |
|
EXPY | Expiration of term |