KR100324322B1 - 정전방전 보호회로 - Google Patents
정전방전 보호회로 Download PDFInfo
- Publication number
- KR100324322B1 KR100324322B1 KR1019990029976A KR19990029976A KR100324322B1 KR 100324322 B1 KR100324322 B1 KR 100324322B1 KR 1019990029976 A KR1019990029976 A KR 1019990029976A KR 19990029976 A KR19990029976 A KR 19990029976A KR 100324322 B1 KR100324322 B1 KR 100324322B1
- Authority
- KR
- South Korea
- Prior art keywords
- electrostatic
- discharge protection
- pads
- electrostatic discharge
- protection unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000872 buffer Substances 0.000 claims abstract description 8
- 238000007599 discharging Methods 0.000 claims abstract description 4
- 239000004065 semiconductor Substances 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 8
- 101000590281 Homo sapiens 26S proteasome non-ATPase regulatory subunit 14 Proteins 0.000 description 7
- 101001114059 Homo sapiens Protein-arginine deiminase type-1 Proteins 0.000 description 7
- 102100023222 Protein-arginine deiminase type-1 Human genes 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 101100163833 Arabidopsis thaliana ARP6 gene Proteins 0.000 description 5
- 101100524516 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) RFA2 gene Proteins 0.000 description 4
- 239000012535 impurity Substances 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 101100123053 Arabidopsis thaliana GSH1 gene Proteins 0.000 description 2
- 101100298888 Arabidopsis thaliana PAD2 gene Proteins 0.000 description 2
- 101150092599 Padi2 gene Proteins 0.000 description 2
- 102100035735 Protein-arginine deiminase type-2 Human genes 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 101100033865 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) RFA1 gene Proteins 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/931—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs characterised by the dispositions of the protective arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/611—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using diodes as protective elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/921—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs characterised by the configuration of the interconnections connecting the protective arrangements, e.g. ESD buses
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (3)
- 패키지 외부의 핀을 통해 전기신호를 인가받는 다수의 패드와; 상기 패드에 각각 접속되어 인가된 전기신호가 정전펄스일 경우에 이를 방전하는 정전방전 보호부와; 상기 정전방전 보호부에 각각 접속되어 정전펄스가 아닐 경우에 정전방전 보호부로부터 전기신호를 입력받는 내부 입력버퍼와; 상기 임의의 패드에 정전펄스가 인가되면, 다수의 패드 및 그에 각각 접속된 정전방전 보호부로 방전경로가 형성되도록 인접하는 패드 사이에 각각 접속되는 방전경로 형성부를 구비하여 구성되는 것을 특징으로 하는 정전방전 보호회로.
- 제 1 항에 있어서, 상기 방전경로 형성부는 상기 인접하는 일측 패드에 게이트 및 드레인이 접속되는 제1엔모스 트랜지스터와; 상기 인접하는 타측 패드에 게이트 및 소스가 접속되며, 제1엔모스 트랜지스터의 소스에 드레인이 접속되는 제2엔모스 트랜지스터로 구성되는 것을 특징으로 하는 정전방전 보호회로.
- 제 1 항에 있어서, 상기 방전경로 형성부는 상기 각각의 인접하는 패드에 애노드가 각각 접속되고, 캐소드가 서로 맞물리게 접속되는 제1,제2 다이오드로 구성되는 것을 특징으로 하는 정전방전 보호회로.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990029976A KR100324322B1 (ko) | 1999-07-23 | 1999-07-23 | 정전방전 보호회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019990029976A KR100324322B1 (ko) | 1999-07-23 | 1999-07-23 | 정전방전 보호회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010010861A KR20010010861A (ko) | 2001-02-15 |
KR100324322B1 true KR100324322B1 (ko) | 2002-02-16 |
Family
ID=19604001
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019990029976A Expired - Fee Related KR100324322B1 (ko) | 1999-07-23 | 1999-07-23 | 정전방전 보호회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100324322B1 (ko) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR940004802A (ko) * | 1992-08-12 | 1994-03-16 | 존 엠. 클락 3세 | Npn 바이폴라 트랜지스터를 사용한 정전방전(esd) 보호 |
JPH06151717A (ja) * | 1992-11-04 | 1994-05-31 | Rohm Co Ltd | 保護回路内蔵ic及び表示装置駆動用ic |
JPH0964281A (ja) * | 1995-08-29 | 1997-03-07 | Sanyo Electric Co Ltd | 集積回路の静電気保護回路 |
JPH1050937A (ja) * | 1996-07-29 | 1998-02-20 | Nec Corp | 集積回路の静電保護回路 |
KR19980059897A (ko) * | 1996-12-31 | 1998-10-07 | 문정환 | 정전기(eds) 보호회로 |
-
1999
- 1999-07-23 KR KR1019990029976A patent/KR100324322B1/ko not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR940004802A (ko) * | 1992-08-12 | 1994-03-16 | 존 엠. 클락 3세 | Npn 바이폴라 트랜지스터를 사용한 정전방전(esd) 보호 |
JPH06151717A (ja) * | 1992-11-04 | 1994-05-31 | Rohm Co Ltd | 保護回路内蔵ic及び表示装置駆動用ic |
JPH0964281A (ja) * | 1995-08-29 | 1997-03-07 | Sanyo Electric Co Ltd | 集積回路の静電気保護回路 |
JPH1050937A (ja) * | 1996-07-29 | 1998-02-20 | Nec Corp | 集積回路の静電保護回路 |
KR19980059897A (ko) * | 1996-12-31 | 1998-10-07 | 문정환 | 정전기(eds) 보호회로 |
Also Published As
Publication number | Publication date |
---|---|
KR20010010861A (ko) | 2001-02-15 |
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