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JPS6342527Y2 - - Google Patents

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Publication number
JPS6342527Y2
JPS6342527Y2 JP1983035831U JP3583183U JPS6342527Y2 JP S6342527 Y2 JPS6342527 Y2 JP S6342527Y2 JP 1983035831 U JP1983035831 U JP 1983035831U JP 3583183 U JP3583183 U JP 3583183U JP S6342527 Y2 JPS6342527 Y2 JP S6342527Y2
Authority
JP
Japan
Prior art keywords
resist
nozzle
tip
coating device
receiving groove
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983035831U
Other languages
Japanese (ja)
Other versions
JPS59143044U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3583183U priority Critical patent/JPS59143044U/en
Publication of JPS59143044U publication Critical patent/JPS59143044U/en
Application granted granted Critical
Publication of JPS6342527Y2 publication Critical patent/JPS6342527Y2/ja
Granted legal-status Critical Current

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  • Coating Apparatus (AREA)

Description

【考案の詳細な説明】 (a) 考案の技術分野 本考案はレジスト塗布装置の改良に関するもの
である。
[Detailed Description of the Invention] (a) Technical Field of the Invention The present invention relates to an improvement of a resist coating device.

(b) 技術の背景 IC・LSIなどの半導体装置を形成する際、微細
パターンを形成する工程で、写真蝕刻法を用いた
微細なレジスト膜のパターンが使用されるのは周
知である。
(b) Background of the technology It is well known that when forming semiconductor devices such as ICs and LSIs, fine resist film patterns using photolithography are used in the process of forming fine patterns.

(c) 従来技術と問題点 たとえば半導体基板上にレジスト液を所定量噴
射して、該レジスト液を半導体基板上に均一に塗
布してレジスト膜を形成する場合に使用する従来
のレジスト塗布装置について、第1図を用いて説
明する。
(c) Conventional technology and problems For example, regarding conventional resist coating equipment used to spray a predetermined amount of resist liquid onto a semiconductor substrate and uniformly apply the resist liquid onto the semiconductor substrate to form a resist film. , will be explained using FIG.

同図においてチヤツク機構を有する基板載置台
1上に半導体基板2が固定され、該基板2上の所
定位置に設けられた噴射用ノズル3より高圧窒素
などによつて加圧されたレジスト液4が所定量前
記基板2上に噴射された後、前記噴射用ノズル3
に付設された開閉ベルブ5によつてレジスト液4
の噴射が停止される。前記基板2上のレジスト液
4は基板載置台1を高速回転することによつて均
一な厚さに拡がつて基板2上に均一に塗布される
ことになる。そして基板載置台1の周囲にはレジ
スト液の飛散を防止するため容器6によつて囲わ
れている。
In the figure, a semiconductor substrate 2 is fixed on a substrate mounting table 1 having a chuck mechanism, and a resist liquid 4 pressurized with high-pressure nitrogen or the like is injected from an injection nozzle 3 provided at a predetermined position on the substrate 2. After a predetermined amount is sprayed onto the substrate 2, the spray nozzle 3
The resist liquid 4 is released by the opening/closing bell 5 attached to the
injection is stopped. By rotating the substrate mounting table 1 at high speed, the resist liquid 4 on the substrate 2 is spread to a uniform thickness and is uniformly applied onto the substrate 2. The substrate mounting table 1 is surrounded by a container 6 to prevent the resist liquid from scattering.

しかしながら均一に塗布された基板上に、レジ
スト液の噴射を防止した後の噴射用ノズル3の先
端より、残存せる液滴が滴下する場合があり、か
かる落下滴が均一に塗布された基板上に滴下した
場合には、基板上のレジスト膜を除去して再度塗
布をやり直すことになり手間のかかる問題があつ
た。
However, remaining droplets may drip from the tip of the spray nozzle 3 after preventing spraying of the resist solution onto a substrate that has been uniformly coated, and such droplets may drop onto a substrate that has been coated uniformly. If the resist film is dropped, the resist film on the substrate must be removed and the coating must be reapplied, which is a time-consuming problem.

(d) 考案の目的 本考案の目的はかかる問題点を解消して能率よ
く塗布可能なレジスト塗布装置の提供にある。
(d) Purpose of the invention The purpose of the present invention is to provide a resist coating device that solves these problems and can efficiently coat resists.

(e) 考案の構成 その目的を達成するために本考案は、噴射ノズ
ルより加圧してレジスト液を噴射するレジスト塗
布装置において、該ノズルの下部に、該ノズル下
部の内径位置より外側で且つレジスト液の噴射を
停止した後に該ノズルの先端部に残存するレジス
トの液滴に接触する位置に、毛細管現象による液
滴誘引手段を備えた先端部を有し該ノズルの周辺
部下方側に向かつて延在するレジスト液滴の受溝
が固定されて配設されたことを特徴とする。
(e) Structure of the Device In order to achieve the object, the present invention provides a resist coating device that sprays a resist liquid under pressure from a spray nozzle, in which a portion of the resist liquid is placed at the bottom of the nozzle at an area outside the inner diameter position of the bottom of the nozzle. The nozzle has a tip portion provided with droplet attracting means by capillary action at a position where it comes into contact with the resist droplets remaining at the tip portion of the nozzle after the liquid jetting is stopped, and the tip portion is directed toward the lower side of the periphery of the nozzle. It is characterized in that the extending receiving groove for the resist droplet is fixedly disposed.

(f) 考案の実施例 以下本考案の実施例について図面を参照して説
明する。第2図は本考案の一実施例の要部斜視図
であり前図と同等の部分については同一符号を付
している。同図において噴射ノズル3の先端の後
述する所定の固定された位置に受溝11が図示し
たように支持枠12によつて設けられている。該
受溝11の先端部には例えば2つの切片13から
なる毛細管現象による液滴の誘引手段が付設され
ており第3図の受溝先端部の断面図に示すように
2つの切片13は図示したように上方に向けて間
隙が除々にせまくなるように配設されている。と
ころで前述したレジスト液の噴射を停止した後の
残存する液滴が滴下する場合は前記噴射ノズル径
より落下滴の径が大きくなつて重力により滴下す
る現象である。そこで本考案の一実施例において
は前記落下滴径の内側の位置で、かつノズル径
(内径)より外側の位置に前記受溝11の切片1
3を落下滴に接触するように配置(所定位置)す
る。このような所定位置に切片13を固定配置す
れば、レジストの噴射を停止した後にノズル先端
部に残存するレジスト液滴は、2つの切片13の
せまい間隙を毛細管現象によつて受溝11へ容易
に吸い取られる。従つてレジスト噴射を停止した
後に、均一に塗布された半導体基板上へのノズル
先端部からのレジスト液滴の落下は完全に防止さ
れる。
(f) Embodiments of the invention Examples of the invention will be described below with reference to the drawings. FIG. 2 is a perspective view of essential parts of an embodiment of the present invention, and parts equivalent to those in the previous figure are designated by the same reference numerals. In the figure, a receiving groove 11 is provided at a predetermined fixed position at the tip of the injection nozzle 3, which will be described later, by a support frame 12 as shown. The tip of the receiving groove 11 is provided with a means for attracting droplets by capillary action, which consists of, for example, two sections 13, and as shown in the cross-sectional view of the tip of the receiving groove in FIG. As shown, the gaps are arranged so that they gradually become narrower toward the top. By the way, when the droplets remaining after the above-mentioned jetting of the resist liquid is stopped dripping, it is a phenomenon that the droplets have a diameter larger than the diameter of the jetting nozzle and drop due to gravity. Therefore, in one embodiment of the present invention, a section 1 of the receiving groove 11 is located at a position inside the diameter of the falling drop and at a position outside the nozzle diameter (inner diameter).
3 is placed (at a predetermined position) so as to be in contact with the falling drop. By fixing the sections 13 at such predetermined positions, the resist droplets remaining at the tip of the nozzle after stopping spraying of the resist can easily flow into the receiving groove 11 through the narrow gap between the two sections 13 by capillary action. be absorbed by. Therefore, after resist jetting is stopped, resist droplets from the nozzle tip are completely prevented from falling onto the uniformly coated semiconductor substrate.

尚通常の加圧によるレジスト噴射時においては
前記受溝11の切片13は噴射ノズル径の太さに
噴射されるレジスト液に接触しないため実用上何
ら影響を与えることはない。
Incidentally, during resist injection by normal pressurization, the section 13 of the receiving groove 11 does not come into contact with the resist liquid that is injected to the diameter of the injection nozzle, so it does not have any practical effect.

(g) 考案の効果 以上説明したように本考案に係るレジスト塗布
装置によれば、均一にレジスト塗布がなされた基
板上へのノズル先端部からのレジスト液滴の落下
が防止されるので、レジスト塗布のし直しが発生
することがなく、作業能率が向上する。
(g) Effect of the invention As explained above, according to the resist coating device of the invention, the resist droplets are prevented from falling from the nozzle tip onto the substrate on which the resist has been evenly coated, so that the resist coating device can prevent the resist from falling from the nozzle tip. No need to reapply, improving work efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のレジスト塗布装置の概略構成断
面図、第2図は本考案の一実施例の要部斜視図、
第3図は受溝先端部の断面図である。 図において、3は噴射用ノズル、4はレジスト
液、11は受溝、12は支持枠、13は切片を示
す。
FIG. 1 is a schematic cross-sectional view of a conventional resist coating device, and FIG. 2 is a perspective view of essential parts of an embodiment of the present invention.
FIG. 3 is a sectional view of the tip of the receiving groove. In the figure, 3 is a spray nozzle, 4 is a resist liquid, 11 is a receiving groove, 12 is a support frame, and 13 is a section.

Claims (1)

【実用新案登録請求の範囲】 噴射ノズルより加圧してレジスト液を噴射する
レジスト塗布装置において、 該ノズルの下部に、 該ノズル下部の内径位置より外側で且つレジス
ト液の噴射を停止した後に該ノズルの先端部に残
存するレジストの液滴に接触する位置に、 毛細管現象による液滴誘引手段を備えた先端部
を有し該ノズルの周辺部下方側に向かつて延在す
るレジスト液滴の受溝が固定されて配設されたこ
とを特徴とするレジスト塗布装置。
[Scope of Claim for Utility Model Registration] In a resist coating device that sprays a resist solution under pressure from a spray nozzle, the nozzle is installed at the bottom of the nozzle outside the inner diameter position of the lower part of the nozzle and after the spraying of the resist solution is stopped. A resist droplet receiving groove extending toward the lower side around the periphery of the nozzle, the tip having a droplet attracting means by capillary action at a position in contact with the resist droplet remaining at the tip of the nozzle. A resist coating device characterized in that the resist coating device is fixedly arranged.
JP3583183U 1983-03-11 1983-03-11 Resist coating equipment Granted JPS59143044U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3583183U JPS59143044U (en) 1983-03-11 1983-03-11 Resist coating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3583183U JPS59143044U (en) 1983-03-11 1983-03-11 Resist coating equipment

Publications (2)

Publication Number Publication Date
JPS59143044U JPS59143044U (en) 1984-09-25
JPS6342527Y2 true JPS6342527Y2 (en) 1988-11-08

Family

ID=30166518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3583183U Granted JPS59143044U (en) 1983-03-11 1983-03-11 Resist coating equipment

Country Status (1)

Country Link
JP (1) JPS59143044U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632724A (en) * 1979-08-24 1981-04-02 Hitachi Ltd Photoresist applying apparatus
JPS57135057A (en) * 1981-02-16 1982-08-20 Tokyo Denshi Kagaku Kabushiki Nozzle for dripping liquid

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632724A (en) * 1979-08-24 1981-04-02 Hitachi Ltd Photoresist applying apparatus
JPS57135057A (en) * 1981-02-16 1982-08-20 Tokyo Denshi Kagaku Kabushiki Nozzle for dripping liquid

Also Published As

Publication number Publication date
JPS59143044U (en) 1984-09-25

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