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JPS6066286A - Display panel and manufacture thereof - Google Patents

Display panel and manufacture thereof

Info

Publication number
JPS6066286A
JPS6066286A JP58175016A JP17501683A JPS6066286A JP S6066286 A JPS6066286 A JP S6066286A JP 58175016 A JP58175016 A JP 58175016A JP 17501683 A JP17501683 A JP 17501683A JP S6066286 A JPS6066286 A JP S6066286A
Authority
JP
Japan
Prior art keywords
transparent
insulating layer
forming
electrode
display panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58175016A
Other languages
Japanese (ja)
Inventor
両角 幸雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suwa Seikosha KK
Original Assignee
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suwa Seikosha KK filed Critical Suwa Seikosha KK
Priority to JP58175016A priority Critical patent/JPS6066286A/en
Publication of JPS6066286A publication Critical patent/JPS6066286A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は、集積回路技術によりスイッチング用薄膜トラ
ンジスタをマトリックス状に配置した透明基板(石英、
サファイヤ、高融点ガラス等)に封入された液晶、エレ
クトロクロミック等を駆動してなる画像表示ディスプレ
イの表示パネルに関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a transparent substrate (quartz,
The present invention relates to a display panel for an image display formed by driving a liquid crystal, electrochromic, etc. sealed in a sapphire, high melting point glass, etc.

例えば、携帯用の液晶テレビ等の透過型表示パネルは、
第1図の如く数千〜数万個の両案が配置された透明アク
ティブマトリックス基板1と、透明共通電極6を有する
透明基板4の間にスペーサー3を介して液晶7が封入さ
れており、−画素当りの等価回路は第2図の如くであり
、選択されたゲート信号でMOS)ランジスタ8をON
し、ビデオ信号はキャパシタ1oに保持され、電圧印加
により液晶9の分子配列が変化し表示を行う。
For example, transmissive display panels such as portable LCD televisions,
As shown in FIG. 1, a liquid crystal 7 is sealed between a transparent active matrix substrate 1 on which several thousand to tens of thousands of substrates are arranged, and a transparent substrate 4 having a transparent common electrode 6 via a spacer 3. - The equivalent circuit per pixel is as shown in Figure 2, and the selected gate signal turns on the MOS transistor 8.
However, the video signal is held in the capacitor 1o, and the molecular arrangement of the liquid crystal 9 changes by voltage application to perform display.

従来これらに用いられるマトリックス基板は、例えば次
の方法により形成される。第6図に於いて、透明石英基
板11に100o〜15ooXのPo1y−81(もし
くはα−81)を気相成長させホトエツチングでMOS
)ランジスタのアクティブ領域12を形成した後、熱酸
化により約1000Xのゲート#13を成長させる。次
にP・1 y −S i (もしくはα−8i)を約5
000X成長させ、リン拡散後ホトエツチングでゲート
電極14を形成する。続いてゲート電極14をマスクに
リンをイオン打込みしソース−ドレイン15.16を形
成した後、層間絶縁f!J 17として5102を気相
成長させコンタクトホール18,19を開け、透明電極
羽工n203 +8nO2(工T。
The matrix substrate conventionally used for these is formed, for example, by the following method. In FIG. 6, Po1y-81 (or α-81) of 100 to 150× is grown in a vapor phase on a transparent quartz substrate 11, and a MOS is formed by photo-etching.
) After forming the active region 12 of the transistor, grow gate #13 of about 1000X by thermal oxidation. Next, P・1 y −S i (or α−8i) is approximately 5
After 000X growth and phosphorus diffusion, a gate electrode 14 is formed by photoetching. Subsequently, using the gate electrode 14 as a mask, phosphorus is ion-implanted to form source-drains 15 and 16, and then interlayer insulation f! 5102 was vapor-phase grown as J17, contact holes 18 and 19 were opened, and transparent electrode layers n203 +8nO2 (processed T) were formed.

)を約1sooXスパツタ・ホトエツチングし、ビデオ
信号lFt極202画素電極21を形成していた。しか
しながらこれらに於いては、POly−81の成長方法
は、i産性、特性の点から減圧炉が用いられるが、基板
の表裏にデポジションされる為、透過型表示パネルとす
る為には、裏面のPo1y−Eliも同時にエツチング
しなくてはならず、エツチングには円筒形のOF4プラ
ズマエツチャーが用いられる。ところがエツチングされ
たP o 1y −B iの段差形状は急峻であり、テ
ーパー化の制御が困難であり、特にスパッタによる薄い
工TO膜とゲート電極ラインとの交差部では第4図の如
く箔切れに起因する断線が多発し、歩留−り低下の一大
原因となっている。又これらの改善策としては、層間絶
縁膜に高a P 8 G膜を用いてリフロー処理する方
法も試みたが、高温処理の為トランジスタの特性変化、
基板の変形があり良策ではない。
) was subjected to sputter photoetching of about 1 sooX to form a video signal lFt electrode 202 and a pixel electrode 21. However, in these cases, a reduced pressure furnace is used to grow POly-81 from the viewpoint of productivity and characteristics, but since it is deposited on the front and back sides of the substrate, in order to make a transmission type display panel, The backside Poly-Eli must also be etched at the same time, and a cylindrical OF4 plasma etcher is used for etching. However, the step shape of the etched P o 1y - B i is steep, making it difficult to control the taper, and especially at the intersection of the thin TO film formed by sputtering and the gate electrode line, foil breakage occurs as shown in Figure 4. Many wire breaks occur due to this, and this is a major cause of lower yields. As a method to improve these, we also tried using a high a P 8 G film as the interlayer insulating film and performing reflow processing, but due to the high temperature processing, the characteristics of the transistor changed,
This is not a good idea as it may cause deformation of the board.

しかるに本発明は、上記の係る欠点を除失したものであ
り、表示パネルの製造歩留り、品質を向上させるもので
あり、以下実施例に基づき詳細に説明する。第3図に同
様、厚み600μの透明石英基板11に減圧炉で130
0XのP O17−81を気相成長させホトエツチング
でアクティブ領域12を形成し900℃の水蒸気酸化で
1000^のゲート膜13を成長させた。再びPo1y
−81を約5oooX成長させ900℃でリン拡散後ホ
トエツチングでゲート電極14を形成した。
However, the present invention eliminates the above-mentioned drawbacks and improves the manufacturing yield and quality of display panels, and will be described in detail below based on Examples. Similarly to FIG. 3, a transparent quartz substrate 11 with a thickness of 600 μm was coated with
The active region 12 was formed by vapor phase growth of 0x PO17-81 and photoetching, and the gate film 13 of 1000^ was grown by steam oxidation at 900°C. Poly again
-81 was grown by about 500X, phosphorus was diffused at 900°C, and then photoetched to form the gate electrode 14.

前Eの’Po1y−81のエツチングはいずれも円筒形
のプラズマエツチャーを用い、CF4+025%で0−
4 t o r rのガス条件で行った。次にソース、
ドレイン15.16形成の為、リンを2×1Q”orr
2で打ち込んでから気相成長8102をs ’o o 
o X成長させ、続いて対向電極型のドライエツチャー
で、c z F 6 + ’ CHF5 ガスを用い8
1o2の異方性全面エツチングを行った。これによりP
 o 1y −S iゲート電極14の両側面には第5
図の如くS10□22が残っており、その角度は電顕て
調べた所40〜50°であった。又この角度は、B10
2の厚みを変える事によって、再限性良く変化出来る。
Etching of 'Po1y-81 in previous E was done using a cylindrical plasma etcher, with CF4+025% and 0-
The test was carried out under gas conditions of 4 tons. Next, the sauce
To form drain 15.16, add phosphorus to 2×1Q”orr.
2 and then vapor phase growth 8102 s 'o o
oX growth, followed by 8 sq.
1o2 anisotropic etching was performed on the entire surface. This allows P
o 1y -S i On both sides of the gate electrode 14, a fifth
As shown in the figure, S10□22 remains, and its angle was 40 to 50 degrees when examined using an electron microscope. Also, this angle is B10
By changing the thickness of 2, it can be varied with good reproducibility.

続いて再度8102を気相成長させ層間絶縁膜17とし
コンタクトホール形成後工TOを1500Xスノザツタ
し、ホトエツチングで信号電極20画素電極21を形成
したこの様にして1.6インチで210×152画素を
持つ液晶テレビ用の光示ツマネルを製造したが従来の様
に段差部で工TOが断線するもの&まなくなり、又エー
ジングテストでも信頼性の向上が確認供給を図るもので
あり、更には、半導体ICや薄膜ヘッドの段差改善にも
応用が出来る。
Subsequently, 8102 was again vapor-phase grown to form the interlayer insulating film 17, and after contact holes were formed, the processed TO was sanded at 1500x, and the signal electrode 20 and pixel electrode 21 were formed by photoetching.In this way, 210 x 152 pixels were formed in 1.6 inches. We manufactured optical display panels for LCD TVs, but as in the past, there were times when the TOO would break at the stepped part, and the aging test also confirmed that the reliability had improved. It can also be applied to improve the level difference in ICs and thin film heads.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、表示パネルの概略図、第2図番ま画素等価回
路、第3図(α)Cb)*第4図は従来の、第5図は本
発明に係わるマトリックス基板の概略図。 1.4.11・・・・・・透明基板 5・・・・・・・・・偏光m(フィルター)7.9・・
・液晶 8・・・・・・・・・M08トランジスター10・・・
・・・キャパシタ 13・・・・・・ゲート膜 14・・・・・・ゲート電極 17・・・・・・層間絶縁膜 20・・・・・・信号′t41極 21・・・・・・画素電極 22・・・・・IS102 第1図
FIG. 1 is a schematic diagram of a display panel, FIG. 2 is a pixel equivalent circuit, FIG. 3 is a schematic diagram of a matrix substrate according to the present invention, and FIG. 4 is a conventional diagram. 1.4.11...Transparent substrate 5...Polarized light m (filter) 7.9...
・Liquid crystal 8...M08 transistor 10...
... Capacitor 13 ... Gate film 14 ... Gate electrode 17 ... Interlayer insulating film 20 ... Signal 't41 pole 21 ... Pixel electrode 22...IS102 Fig. 1

Claims (2)

【特許請求の範囲】[Claims] (1) 画素透明電極と薄膜MO8)ランジスタよりな
る透明アクティブマトリクス基板と、透明共通電極を持
つ透明対向基板に封入された液晶を駆動してなる画像表
示用ディスプレイに於いて、該マトリクス基板の透明電
極とMOEI)ランジスタゲー)!極の少なく共交差ラ
インでは、ゲート電極の両側面のみにテーパー状の絶縁
層を形成させた事を特徴とする表示パネル。
(1) Pixel transparent electrode and thin film MO8) In an image display that drives a liquid crystal sealed in a transparent active matrix substrate consisting of transistors and a transparent counter substrate having a transparent common electrode, the transparent active matrix substrate Electrode and MOEI) transistor game)! A display panel characterized in that a tapered insulating layer is formed only on both sides of a gate electrode in the case of a few lines that intersect with each other.
(2) (1)に於いて、薄膜トランジスタを形成する
半導体薄膜パターン形成後に、少なく井筒−の絶縁層を
形成させる工程と該第−の絶縁層を全面異方性ドライエ
ツチングする工程と第2の絶縁層を形成する工程を施し
た事を特徴とする表示パネル6r)!l;uS−J=f
Jニー
(2) In (1), after forming a semiconductor thin film pattern for forming a thin film transistor, a step of forming an insulating layer with a small thickness of Izutsu, a step of performing anisotropic dry etching on the entire surface of the first insulating layer, and a second step. A display panel 6r) characterized by being subjected to a step of forming an insulating layer! l;uS-J=f
J knee
JP58175016A 1983-09-21 1983-09-21 Display panel and manufacture thereof Pending JPS6066286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58175016A JPS6066286A (en) 1983-09-21 1983-09-21 Display panel and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58175016A JPS6066286A (en) 1983-09-21 1983-09-21 Display panel and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS6066286A true JPS6066286A (en) 1985-04-16

Family

ID=15988740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58175016A Pending JPS6066286A (en) 1983-09-21 1983-09-21 Display panel and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS6066286A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01152428A (en) * 1987-12-09 1989-06-14 Hitachi Ltd Liquid crystal display device
JPH01169433A (en) * 1987-12-25 1989-07-04 Hitachi Ltd Liquid crystal display panel
US6184963B1 (en) 1987-06-10 2001-02-06 Hitachi, Ltd. TFT active matrix LCD devices employing two superposed conductive films having different dimensions for the scanning signal lines

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6184963B1 (en) 1987-06-10 2001-02-06 Hitachi, Ltd. TFT active matrix LCD devices employing two superposed conductive films having different dimensions for the scanning signal lines
US6384879B2 (en) 1987-06-10 2002-05-07 Hitachi, Ltd. Liquid crystal display device including thin film transistors having gate electrodes completely covering the semiconductor
JPH01152428A (en) * 1987-12-09 1989-06-14 Hitachi Ltd Liquid crystal display device
JPH01169433A (en) * 1987-12-25 1989-07-04 Hitachi Ltd Liquid crystal display panel

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