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JPS5285874A - X-ray detection apparatus - Google Patents

X-ray detection apparatus

Info

Publication number
JPS5285874A
JPS5285874A JP149476A JP149476A JPS5285874A JP S5285874 A JPS5285874 A JP S5285874A JP 149476 A JP149476 A JP 149476A JP 149476 A JP149476 A JP 149476A JP S5285874 A JPS5285874 A JP S5285874A
Authority
JP
Japan
Prior art keywords
detection apparatus
ray detection
ray
crystal
anx
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP149476A
Other languages
Japanese (ja)
Inventor
Kanae Suzuki
Koichi Hara
Masayoshi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP149476A priority Critical patent/JPS5285874A/en
Publication of JPS5285874A publication Critical patent/JPS5285874A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:In a crystal straight-advancing type wavelength dispersion type X-ray spectroscope, arrangement is so made that the distance from anX-ray generating source up to the center of spectral crystal may be read at high accuracy, whereby performing of highly accurate measurement is made possible.
JP149476A 1976-01-09 1976-01-09 X-ray detection apparatus Pending JPS5285874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP149476A JPS5285874A (en) 1976-01-09 1976-01-09 X-ray detection apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP149476A JPS5285874A (en) 1976-01-09 1976-01-09 X-ray detection apparatus

Publications (1)

Publication Number Publication Date
JPS5285874A true JPS5285874A (en) 1977-07-16

Family

ID=11502997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP149476A Pending JPS5285874A (en) 1976-01-09 1976-01-09 X-ray detection apparatus

Country Status (1)

Country Link
JP (1) JPS5285874A (en)

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Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20040309