JPS5950322A - Diagnosis system for abnormality - Google Patents

Abstract

PURPOSE:To enable the early discovery of the abnormality in an instrument by disposing arrays heating elements at the beginning point for scanning, using the images thereof as a reference point, comparing the same with the analog-processed value of the thermogram of an object obtd. when the object is normal and diagnosing the presence or absence of the abnormality for the heat generation in each part of the object. CONSTITUTION:Diagnosis of an instrument 11 to be diagnosed is accomplished by installing an IR camera 14 in accordance with the base plate 12 of the instrument 11 in a operating state, and the IR rays radiated from the respective electronic parts on the base plate 12 are scanned and are detected with an IR sensor, by which thermogram pattern signal of the instrument 11 is obtd. The signal is inputted to a comparing arithmetic device 16 which compares the signal with the standard thermogram pattern signal from a storage device 20. The results of the comparison and calculation are recorded in a recorder 21 such as a printer. The results are also recorded in a video recorder 18 and are displayed on the image screen of a display device 19. A synchronizing marker 13 is disposed by scanning on the substrate 12 of the instrument 11 and is scanned and detected with the camera 14, by which the base point signal is obtd. in the specified position at every scanning and the synchronization in the stage of comparison and calculation is made easy.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an abnormality diagnosis method for diagnosing an abnormal state of an electronic component constituting, for example, an H-detector based on the presence or absence of heat generation.

Currently, in the social environment of atomic cashlicants, once a plant has stopped due to a breakdown or accident, it cannot be restarted unless the investigation of the cause and measures to prevent recurrence have been completed. It is necessary to prevent potential failures from occurring in the instruments that control them by early detection and treatment.

Most of the control instruments mentioned above are made up of electronic components, and when inspecting these instruments, it is necessary to supply a reference signal for measurement to the instruments and adjust the instrument output at this time to a normal value. It will be done.

However, with this method, it is not possible to grasp the deterioration state of each component, and it is impossible to discover potential failures. Further, it is extremely difficult to electrically inspect each component of each meter because the number of components is enormous and complicated distribution routes must be used to attach and detach them.

It is an object of the present invention to overcome all of the above-mentioned drawbacks and to provide an abnormality diagnosis method that can inspect the deterioration state of each electronic component constituting an instrument and detect latent failures at an early stage.

That is, the abnormality diagnosis method in this invention obtains a planar thermogram while scanning infrared rays emitted from a planar spread object. As a reference point, the thermogram Z of the object obtained under normal conditions is processed and stored in analog form, and compared with the analog processed values of the thermogram obtained separately to diagnose the presence or absence of abnormal heat generation in each part of the object. be.

Hereinafter, one embodiment of the present invention will be explained with reference to the drawings.5.
FIG. 1 shows the configuration 2, in which a scanning synchronization marker 13 is provided as a heat generation baseline on a flat substrate 12 to which an electronic component χ of an instrument to be diagnosed 1 is attached. This scanning synchronization marker 13 is a row-shaped heating element disposed at the end of the diagnostic section, and the infrared radiation sensor emitted by this heating element is 7 grams (
(thermographic image) is used as the base point of the pattern signal.

The part of the board 12 on which the scanning synchronization marker 13 is arranged is photographed by an infrared camera 14. This infrared camera 14
The infrared sensor receives and detects infrared rays corresponding to heat generated from each electronic component of the board 12 while scanning with a mirror, and detects infrared rays that are radiant energy proportional to the absolute temperature of the heat generating components of the diagnostic part. , which is then converted to an analog signal and output. In addition to supplying it to the comparison calculation device 16 as a turn signal,
The signal is supplied to the video recorder 18 and the display device 19 in accordance with the selection of the signal switch 17.

The comparison calculation device 16 is supplied with a standard/main turn signal matching the model of the instrument 11 to be diagnosed from a storage device 20 in which thermogram standard pattern signals for each diagnostic instrument under normal conditions are stored in advance. This standard turn signal is compared with the thermogram of the infrared camera 14 and the turn signal from the infrared camera 14 to determine whether there is an abnormality in the instrument 11 or not. Diagnose. In other words, the part of the main turn signal of the instrument to be diagnosed 1) that is outside the specified range with respect to the standard turn signal is determined to be an abnormal part, and the diagnosis result is recorded in the recording device 2 and the signal is Video recorder 1 via switch 17
8 or a display gray device 19 for recording and display.

This video recorder 18 captures the damage captured by the infrared camera 14.
6, and the display device 19 is a device for recording the diagnostic results of the instrument 11 to be diagnosed.
+I direction display and comparison calculation result 16 diagnosis result i[! 1
This is a device for displaying on one screen. The reproduced signal from the video recorder 16 can be supplied to the comparator 16 via the display device 19 or the A/T converter 15 by the signal switch 17.

That is, in order to diagnose the instrument to be diagnosed 1 using the above-mentioned device, first, the infrared camera 14 is installed corresponding to the board 12 of the instrument to be diagnosed 11 in the operating state, and each electronic component on the board 12 is installed. The infrared rays emitted from the infrared rays are scanned and received by an infrared sensor to obtain a thermogram pattern signal of the instrument 11 to be diagnosed. And this mother turn number t゛ comparison i
a calculation system flx6 (= input, and note 1. is compared with the thermogram standard pattern signal from the device 2θ.

Fig. 2 shows an example of this, in which Fig. A shows a semi-pattern signal, and Fig. B shows a turn signal of the instrument to be diagnosed 1). The bar-shaped signal on the left side of both signals is the scanning synchronization marker 13 (it is a base point signal based on two points, and if you synchronize with this end point signal and compare both signals, the electric wire corresponding to the third position from the right) is abnormal. I understand that.

The results of this comparison calculation are recorded in a recording device 21 such as Zolinta, recorded in a video recorder 18, and displayed on the screen of an ice play device 19.

Therefore, by disposing a scanning marker 13 on the board 12 of the fracture breakage meter Bzx and scanning and detecting it with an infrared camera 14, a fixed position (two base point signals) can be obtained for each scan. Synchronization at the time of calculation is correct.Then, by comparing the same standard (standard) and turn signal with the turn signal of the instrument to be diagnosed, it is possible to determine which electronic component is abnormal. I can do it.

As described above, according to the present invention, when obtaining a flat thermogram while scanning infrared rays emitted from a flat object in an abnormality diagnosis method, a row of heating elements is placed at the starting point of scanning. Place the statue! Use it as a reference point, and use it as a reference point! 1. Compare with the analog processed values of the thermogram of the object that is constantly obtained, and check whether there is any abnormality in the emission of each part of the object.11
(By diagnosing this, it is possible to detect latent failures and deterioration of electronic components inside instruments, which were previously considered to be extremely difficult. This makes it possible to detect instrument abnormalities early. This improves the efficiency of instrument maintenance and inspection work. It is possible to improve and reduce costs.
It will be possible to improve the reliability of the number of bags measured and controlled, and to increase the operating rate of plant equipment.

This abnormality diagnosis method can be applied to any part that has a shape that can be measured on a plane and where the sluggish heat of the part changes due to deterioration, failure, etc.

[Brief explanation of drawings]

1 is a diagram showing the configuration of an abnormality diagnosis device according to an embodiment of the present invention, and FIG. 2 is a diagram showing the configuration of an abnormality diagnosis device according to an embodiment of the present invention, and FIG. It is a diagram showing Example Z for comparison with 11... B1 device to be diagnosed, 12... Board, 13...
Scanning synchronization marker, 14...Infrared camera, 1
5...A/D converter, 16...Comparison calculation device,)7
... signal switcher, 18... video recorder, 19.
...Display device, 20...Storage device, 2no...
・Recording device.

Claims (1)

[Claims] When obtaining a planar thermogram by scanning infrared rays emitted from a symmetrical object spread out in a planar shape, a row of heating elements is placed at the starting point of scanning, and its image is used as a reference point, and the object obtained under normal conditions is An abnormality diagnosis method in which the thermogram of an object is processed and stored in analog form, and compared with the analog processed values of the separately obtained thermogram to diagnose the presence or absence of heat abnormality in each part of the object.