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JPS59154366A - Measuring device provided with microcomputer with a/d conversion function - Google Patents

Measuring device provided with microcomputer with a/d conversion function

Info

Publication number
JPS59154366A
JPS59154366A JP2965883A JP2965883A JPS59154366A JP S59154366 A JPS59154366 A JP S59154366A JP 2965883 A JP2965883 A JP 2965883A JP 2965883 A JP2965883 A JP 2965883A JP S59154366 A JPS59154366 A JP S59154366A
Authority
JP
Japan
Prior art keywords
voltage
microcomputer
converter
circuit
conversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2965883A
Other languages
Japanese (ja)
Inventor
Minoru Shoda
庄田 稔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP2965883A priority Critical patent/JPS59154366A/en
Publication of JPS59154366A publication Critical patent/JPS59154366A/en
Pending legal-status Critical Current

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  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE:To correct automatically the A/D conversion error of a microcomputer with an A/D converter by connecting a voltage dividing circuit of a correcting voltage parallel with a measuring circuit to the A/D converter through a switch. CONSTITUTION:Instead of a measuring circuit 4 including a sensor whih connects a switch 3 to a contact K2, a voltage dividing circuit 5 of the correcting voltage parallel with the circuit 4 is connected to an A/D converter 2 of a microcomputer 1. An A/D-converted digital reference voltage and a regular digital reference voltage which is set preliminarily in the computer 1 in accordance with the reference voltage are compared with each other to determine the error of the converter 2. The error of a digital measured voltage, which is attained by the circuit 4, due to the converter 2 at the time, when the switch 3 is connected to a contact K1, is corrected automatically in accordance with this determined error by the computer 1, and the A/D cnversion error of the microcomputer with the A/D converter is corrected automatically.

Description

【発明の詳細な説明】 く技術分野〉 本発明はA/D変換機能付きマイクロコンビョ、−タを
備えた測定装置に関し、特に、そのA/D変換誤差の自
動補正方式に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a measuring device equipped with a microcomputer with an A/D conversion function, and more particularly to an automatic correction method for A/D conversion errors.

〈従来技術〉 例えば電子レジスタ等の民生用電子機器において、機能
の多様化、高性能化が進むにつれて、センサの出力信号
の変化を判別して加熱装置を制御するなどの目的のため
、A/D変換機能イ」きマイクロコンピュータを内蔵し
たものがある。このような電子機器において、Δ/D変
換精度に7\ラツキがあり、それよりも高精度なへ/D
変換を行なおうとすればA/D変換時の誤差を補正する
必要がある。
<Prior art> For example, as the functions of consumer electronic devices such as electronic registers become more diversified and their performance becomes higher, A/ Some devices have a built-in microcomputer with a D conversion function. In such electronic equipment, there is a 7\ fluctuation in the Δ/D conversion accuracy, and the accuracy of the Δ/D conversion is higher than that.
If conversion is to be performed, it is necessary to correct errors during A/D conversion.

第F図に従来例の回路図を示す。A/D変換機能付きマ
イクロコンピュータlば、アナログ信号人カポ−1−に
+とA/D変換基準電圧■ref、外部電源Vdd用の
各外部端子を備え、サーミスタ等のセンサRTは誤差補
正用可変抵抗器RV、固定抵抗R1と直列接続され、全
直列回路に基準電圧Vrefが印加され、センサ出力が
入カポ−1〜に1に接続されている。このような測定回
路において、入カポ−)K+に入力される電圧Vklば
、 てRAM (ランダムアクセスメモ1月に記憶される。
FIG. F shows a circuit diagram of a conventional example. A microcomputer with A/D conversion function is equipped with external terminals for analog signal capo 1-, A/D conversion reference voltage ref, and external power supply Vdd, and sensors RT such as thermistors are used for error correction. It is connected in series with a variable resistor RV and a fixed resistor R1, a reference voltage Vref is applied to all the series circuits, and a sensor output is connected to input ports 1 to 1. In such a measuring circuit, the voltage Vkl input to the input capacitor K+ is stored in RAM (random access memory).

しかし、A/D変換娯差を補正するため、可変抵抗器R
tを調節しなりればならない。
However, in order to correct the A/D conversion difference, the variable resistor R
t must be adjusted.

この調節方法を説明すると、まず、センサRTの代わり
に基準抵抗器Rdを接続し、入力ポートに1の電圧が所
定の値Vkl  ’になるように可変抵抗器の値RV’
を決定する。しかし、この方法では上述した調節作業を
必要とするばかりでなく、調節作業の誤差が生じ、更に
、使用中の経年変化による誤差が介入してくる。
To explain this adjustment method, first, a reference resistor Rd is connected in place of the sensor RT, and the value of the variable resistor RV' is adjusted so that the voltage of 1 becomes a predetermined value Vkl' at the input port.
Determine. However, this method not only requires the above-mentioned adjustment work, but also causes errors in the adjustment work, and furthermore, errors due to aging during use intervene.

〈発明の目的〉 本発明は上記した調節作業の労力をなくし、マイクロコ
ンピュータによりA/D変換誤差の換算を自動的に行う
電子機器の提供を目的としている。
<Objective of the Invention> An object of the present invention is to provide an electronic device that eliminates the labor of the above-mentioned adjustment work and automatically converts A/D conversion errors using a microcomputer.

〈発明の構成〉 本発明は要約すれば、従来のセンサ電圧検出回路に設け
られていた調節用可変抵抗器RVを省き、第2の入力ポ
ートI(2に所定の校正用基準電圧Vk2を与え、これ
をマイクロコンピュータに内蔵しているA/D変換部で
変換したデジタル値をコンピュータが読み取りこの値に
応じてセンサ出力のデジタルに変換値を補正することを
特徴としている。
<Configuration of the Invention> To summarize, the present invention omit the adjusting variable resistor RV provided in the conventional sensor voltage detection circuit, and apply a predetermined calibration reference voltage Vk2 to the second input port I (2). The computer reads the digital value converted by an A/D converter built into the microcomputer, and corrects the converted value to the digital value of the sensor output in accordance with this value.

〈実施例〉 以下、本発明の詳細な説明する。<Example> The present invention will be explained in detail below.

第2図に本発明実施例の回路図を示す。2 (IM+の
入力ボートK1.i<’にの信号は、共通のA/D変換
部2に切換回路3を介して導入され、この切換回路3は
マイクロコンピュータ1内のcpu c中央処理ユニッ
ト)の指令により切換られる。
FIG. 2 shows a circuit diagram of an embodiment of the present invention. 2 (The signal on the input port K1.i<' of IM+ is introduced to the common A/D converter 2 via the switching circuit 3, and this switching circuit 3 is connected to the CPU C central processing unit in the microcomputer 1.) It is switched by the command.

マイクロコンピュータの外部回路は、センサRTと抵抗
器R1の直列接続から成る測定用回路4と並列に、抵抗
器Ra&Rbの直列接続から成る補正電圧の分圧回路5
が設けられ、センサRTの出力端は入力ポートに+に接
続され、分圧回路5の分圧点は入カポ−1−に2に接続
される。
The external circuit of the microcomputer includes a correction voltage dividing circuit 5 consisting of a series connection of resistors Ra & Rb in parallel with a measurement circuit 4 consisting of a series connection of a sensor RT and a resistor R1.
The output end of the sensor RT is connected to the input port +, and the voltage dividing point of the voltage dividing circuit 5 is connected to the input port -1-2.

マイクロコンピュータ1は例えば8ビツト構成であって
、内蔵されているA/D変換部2は28−256の分解
能を持っているものとする。また、このA/D変換部2
は最大下ビット分の誤差を有するものとする。また、分
圧回路5の抵抗Ra。
It is assumed that the microcomputer 1 has, for example, an 8-bit configuration, and the built-in A/D converter 2 has a resolution of 28-256. In addition, this A/D converter 2
is assumed to have an error of the lowest bit. Also, the resistance Ra of the voltage dividing circuit 5.

Rbのバラツキによる誤差はA/D変換部の誤差に比べ
十分に小さく、無視しうるちのとする。
It is assumed that the error due to the variation in Rb is sufficiently smaller than the error of the A/D converter and can be ignored.

そこで、分圧回路5の分圧点の電圧 ように011″となるアナログ入力電圧値に等しくなる
よう、抵抗値Ra、Rbの比率を設定しておく。このよ
うに分圧電圧を設定することにより、まず切換回路3を
に2側に切換えてA/D変僕変力出力定しておけば、そ
の値の大小に応じて切換回路3をに1側に切換えたとき
のA/D変換出力値を補正することができる。すなわち
、K’2側に切換えたときのA/D変換出力の下3ビッ
トの値と、測定時に補正されるべきへ/D変換部の25
6ピント分解能に対する誤差は下表のようになる。
Therefore, the ratio of the resistance values Ra and Rb is set so that the voltage at the voltage dividing point of the voltage dividing circuit 5 is equal to the analog input voltage value of 011''. Setting the divided voltage in this way Therefore, if you first switch the switching circuit 3 to the 2nd side and set the A/D conversion output, the A/D conversion when switching the switching circuit 3 to the 1st side will depend on the magnitude of the value. The output value can be corrected.In other words, the value of the lower 3 bits of the A/D conversion output when switching to the K'2 side and the value of the lower 3 bits of the A/D conversion output that should be corrected during measurement.
6 Errors for focus resolution are as shown in the table below.

ただし、1単位はA/D変換部の最大出力に対し1/2
56である。
However, 1 unit is 1/2 of the maximum output of the A/D converter.
It is 56.

測定用回路4の出力、すなわら入カポ−)K+の電圧V
klは、 であって、これがA/D変換部2によりデジタル変襖さ
れた後の値が、例えばn=126であり、このときの入
力ボートに2の電圧Vk2のA/D変換出力が例えば“
100”であったとすれば、Δ/D変換誤差は表1より
→−1単位過大に出力されていることが判るから、補正
された測定値ばn−125となる。
Output of measurement circuit 4 (input capo) K+ voltage V
kl is, and the value after this is digitally transformed by the A/D converter 2 is, for example, n=126, and the A/D conversion output of the voltage Vk2 of 2 is applied to the input port at this time, for example. “
If it is 100'', it can be seen from Table 1 that the Δ/D conversion error is output in excess of -1 unit, so the corrected measurement value will be n-125.

なお、本発明の切換回路3はLSIの外部に設けてもよ
く、その場合の入力用ボートに+、に2はLSI外部に
存在する。
Note that the switching circuit 3 of the present invention may be provided outside the LSI, and in that case, the input ports + and 2 are located outside the LSI.

〈発明の効果〉 本発明によれば、従来のように可変抵抗器の調節による
A / I)変換部の調整作業が不要になり、製造工程
が合理化される。また、随時、自動的にまたは手動によ
り自動補正が実行されるから、當時高い測定精度を維持
することができる。
<Effects of the Invention> According to the present invention, it is no longer necessary to adjust the A/I converter by adjusting a variable resistor as in the prior art, and the manufacturing process is streamlined. Further, since automatic correction is executed automatically or manually as needed, high measurement accuracy can be maintained at all times.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来例を示す回路図である。第2図は本発明の
実施例を示す回路図、第3図は本発明の作用説明図であ
る。 1 マイクロコンピュータ 2−A / D変換部 3−切換回路 4−測定用回路 5−補正電圧の分圧回路 Kl、に2−人力ボート V r e f −A / D変換基準電圧特許出願人
   シャープ株式会社 代理人    弁理士 西 1) 新
FIG. 1 is a circuit diagram showing a conventional example. FIG. 2 is a circuit diagram showing an embodiment of the present invention, and FIG. 3 is an explanatory diagram of the operation of the present invention. 1 Microcomputer 2-A/D converter 3-Switching circuit 4-Measuring circuit 5-Correction voltage voltage dividing circuit Kl, 2-Human power boat Vref-A/D conversion reference voltage Patent applicant Sharp Corporation Company agent Patent attorney Nishi 1) Arata

Claims (1)

【特許請求の範囲】[Claims] 2個のアナログ電圧入力ボート(Kl、に2)、A/D
変換基準電圧端子、及び上記2個の入力ポートのいずれ
かの入力電圧をデジタル信号に変換するΔ/D変換ブロ
ックを備えたマイクロコンピュータと、センサの出力電
圧を上記2個の入力ポートのいずれか一方へ導入する測
定用回路と、上記基準電圧端子の電圧を所定の比率に分
圧して得られる補正用基準電圧を上記21IIIJの入
カポ−1−の残りの端子へ導入する補正電圧分圧回路を
有し、この補正電圧をL記A/D変換ブロックに入力し
たときのデジタル値の大きさに応じて上記センサの出力
電圧を一上記A / I)変換部に入力したときのデジ
タル値を補正するよう構成された、Δ/D変換機能付き
マイクロコンピュータを備えた測定装置。
2 analog voltage input ports (Kl, 2), A/D
A microcomputer equipped with a conversion reference voltage terminal and a Δ/D conversion block that converts the input voltage of either of the above two input ports into a digital signal, and a microcomputer that converts the output voltage of the sensor to one of the above two input ports. A measurement circuit that introduces the voltage at the reference voltage terminal into one, and a correction voltage divider circuit that introduces the correction reference voltage obtained by dividing the voltage of the reference voltage terminal into a predetermined ratio into the remaining terminal of the input capo-1- of the 21IIIJ. The output voltage of the sensor is adjusted according to the magnitude of the digital value when this correction voltage is input to the A/D conversion block described in L. A measuring device equipped with a microcomputer with a Δ/D conversion function configured to perform correction.
JP2965883A 1983-02-24 1983-02-24 Measuring device provided with microcomputer with a/d conversion function Pending JPS59154366A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2965883A JPS59154366A (en) 1983-02-24 1983-02-24 Measuring device provided with microcomputer with a/d conversion function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2965883A JPS59154366A (en) 1983-02-24 1983-02-24 Measuring device provided with microcomputer with a/d conversion function

Publications (1)

Publication Number Publication Date
JPS59154366A true JPS59154366A (en) 1984-09-03

Family

ID=12282211

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2965883A Pending JPS59154366A (en) 1983-02-24 1983-02-24 Measuring device provided with microcomputer with a/d conversion function

Country Status (1)

Country Link
JP (1) JPS59154366A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018105888A (en) * 2018-03-22 2018-07-05 ラピスセミコンダクタ株式会社 Semiconductor device and battery monitoring system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018105888A (en) * 2018-03-22 2018-07-05 ラピスセミコンダクタ株式会社 Semiconductor device and battery monitoring system

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