JPS5791542A - High frequency transistor device - Google Patents
High frequency transistor deviceInfo
- Publication number
- JPS5791542A JPS5791542A JP55168571A JP16857180A JPS5791542A JP S5791542 A JPS5791542 A JP S5791542A JP 55168571 A JP55168571 A JP 55168571A JP 16857180 A JP16857180 A JP 16857180A JP S5791542 A JPS5791542 A JP S5791542A
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- enclosure
- high frequency
- transistor device
- capacitors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/64—Impedance arrangements
- H01L23/66—High-frequency adaptations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/58—Structural electrical arrangements for semiconductor devices not otherwise provided for
- H01L2223/64—Impedance arrangements
- H01L2223/66—High-frequency adaptations
- H01L2223/6644—Packaging aspects of high-frequency amplifiers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01072—Hafnium [Hf]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19042—Component type being an inductor
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Lasers (AREA)
Abstract
PURPOSE:To shorten the rising time of a pulse output from a high frequency transistor device by providing an inductor in parallel with a capacitor forming the internal matching circuit at an input side. CONSTITUTION:An input terminal 28 and an output terminal 29 are provided at a transistor enclosure 27, a plurality of capacitors 15-20 are provided in the enclosure 27 with the first electrode connected to the grounding conductor in the enclosure 27, and a plurality of transistors 12 are grouned at the bases. The input terminal 28, output terminal 29, the second electrodes of the capacitors 15- 20 and the electrodes of the transistor 12 are respectively connected via bonding wires 21-25. An emitter electrode 13 and a base electrode 14 are formed correspondingly to the transistor 12. Grounding bonding wires 30-a, 30-b are provided as inductors in parallel with the capacitor 17.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55168571A JPS5791542A (en) | 1980-11-29 | 1980-11-29 | High frequency transistor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55168571A JPS5791542A (en) | 1980-11-29 | 1980-11-29 | High frequency transistor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5791542A true JPS5791542A (en) | 1982-06-07 |
Family
ID=15870503
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55168571A Pending JPS5791542A (en) | 1980-11-29 | 1980-11-29 | High frequency transistor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5791542A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05102813A (en) * | 1991-10-11 | 1993-04-23 | Toshiba Corp | Microwave pulse high output transistor |
US6049126A (en) * | 1995-12-14 | 2000-04-11 | Nec Corporation | Semiconductor package and amplifier employing the same |
WO2000075990A1 (en) * | 1999-06-07 | 2000-12-14 | Ericsson Inc. | High impedance matched rf power transistor |
WO2001045171A1 (en) * | 1999-12-15 | 2001-06-21 | Ericsson Inc. | Ldmos power package with resistive-capacitive stabilizing element |
US6653691B2 (en) | 2000-11-16 | 2003-11-25 | Silicon Semiconductor Corporation | Radio frequency (RF) power devices having faraday shield layers therein |
US6759742B2 (en) * | 1999-10-12 | 2004-07-06 | The Whitaker Corporation | Interchangeable bond-wire interconnects |
WO2009002392A2 (en) * | 2007-06-22 | 2008-12-31 | Cree, Inc. | Rf transistor packages with internal stability network and methods of forming rf transistor packages with internal stability networks |
CN102832145A (en) * | 2012-08-31 | 2012-12-19 | 中国科学院微电子研究所 | Packaging method of high-frequency internal matching power device |
US8592966B2 (en) | 2007-06-22 | 2013-11-26 | Cree, Inc. | RF transistor packages with internal stability network including intra-capacitor resistors and methods of forming RF transistor packages with internal stability networks including intra-capacitor resistors |
CN107293521A (en) * | 2017-05-27 | 2017-10-24 | 中国电子科技集团公司第十三研究所 | The method for realizing the Ω impedance matchings of L-band device 50 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5582515A (en) * | 1978-12-19 | 1980-06-21 | Toshiba Corp | Transistor amplifier |
-
1980
- 1980-11-29 JP JP55168571A patent/JPS5791542A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5582515A (en) * | 1978-12-19 | 1980-06-21 | Toshiba Corp | Transistor amplifier |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05102813A (en) * | 1991-10-11 | 1993-04-23 | Toshiba Corp | Microwave pulse high output transistor |
US6049126A (en) * | 1995-12-14 | 2000-04-11 | Nec Corporation | Semiconductor package and amplifier employing the same |
WO2000075990A1 (en) * | 1999-06-07 | 2000-12-14 | Ericsson Inc. | High impedance matched rf power transistor |
US6759742B2 (en) * | 1999-10-12 | 2004-07-06 | The Whitaker Corporation | Interchangeable bond-wire interconnects |
WO2001045171A1 (en) * | 1999-12-15 | 2001-06-21 | Ericsson Inc. | Ldmos power package with resistive-capacitive stabilizing element |
US6653691B2 (en) | 2000-11-16 | 2003-11-25 | Silicon Semiconductor Corporation | Radio frequency (RF) power devices having faraday shield layers therein |
WO2009002392A2 (en) * | 2007-06-22 | 2008-12-31 | Cree, Inc. | Rf transistor packages with internal stability network and methods of forming rf transistor packages with internal stability networks |
WO2009002392A3 (en) * | 2007-06-22 | 2009-02-19 | Cree Inc | Rf transistor packages with internal stability network and methods of forming rf transistor packages with internal stability networks |
US8330265B2 (en) | 2007-06-22 | 2012-12-11 | Cree, Inc. | RF transistor packages with internal stability network and methods of forming RF transistor packages with internal stability networks |
US8592966B2 (en) | 2007-06-22 | 2013-11-26 | Cree, Inc. | RF transistor packages with internal stability network including intra-capacitor resistors and methods of forming RF transistor packages with internal stability networks including intra-capacitor resistors |
CN102832145A (en) * | 2012-08-31 | 2012-12-19 | 中国科学院微电子研究所 | Packaging method of high-frequency internal matching power device |
CN107293521A (en) * | 2017-05-27 | 2017-10-24 | 中国电子科技集团公司第十三研究所 | The method for realizing the Ω impedance matchings of L-band device 50 |
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