JPS5743418A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5743418A JPS5743418A JP11933280A JP11933280A JPS5743418A JP S5743418 A JPS5743418 A JP S5743418A JP 11933280 A JP11933280 A JP 11933280A JP 11933280 A JP11933280 A JP 11933280A JP S5743418 A JPS5743418 A JP S5743418A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- electrode material
- insulating layer
- electrode
- manufacture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76897—Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To obtain an electrode structure having flattened surface by forming an insulating layer of approximately equal thickness to that of an electrode material so as to surround the electrode material formed on a silicon substrate. CONSTITUTION:An electrode material layer 22 is formed on a silicon substrate 21, and a polysilicon layer 23 is then formed on the layer 22. A resist pattern 24 is formed on the layer 23, and is then etched. Thereafter, the resist pattern 24 is removed. Subsequently, an SiOx is covered to form an insulating layer 25 of SiOx. Successively, the overall surface is etched, and smoothed flattened surfaces can be obtained on the insulating layer 25 and the electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11933280A JPS5743418A (en) | 1980-08-29 | 1980-08-29 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11933280A JPS5743418A (en) | 1980-08-29 | 1980-08-29 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5743418A true JPS5743418A (en) | 1982-03-11 |
JPS6328335B2 JPS6328335B2 (en) | 1988-06-08 |
Family
ID=14758851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11933280A Granted JPS5743418A (en) | 1980-08-29 | 1980-08-29 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5743418A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5051257A (en) * | 1973-09-05 | 1975-05-08 |
-
1980
- 1980-08-29 JP JP11933280A patent/JPS5743418A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5051257A (en) * | 1973-09-05 | 1975-05-08 |
Also Published As
Publication number | Publication date |
---|---|
JPS6328335B2 (en) | 1988-06-08 |
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