JPS5722570A - Automatic handling tool for parts - Google Patents
Automatic handling tool for partsInfo
- Publication number
- JPS5722570A JPS5722570A JP9038480A JP9038480A JPS5722570A JP S5722570 A JPS5722570 A JP S5722570A JP 9038480 A JP9038480 A JP 9038480A JP 9038480 A JP9038480 A JP 9038480A JP S5722570 A JPS5722570 A JP S5722570A
- Authority
- JP
- Japan
- Prior art keywords
- ics
- characteristic inspection
- components
- trays
- selection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To automatize the characteristic inspection and selection of electronic components by treating the components as specified which is held with a three- dimensionally moving retaining mechanism while placed on a moving tray. CONSTITUTION:Trays 4 carrying ICs 3A...are fed to a conveyor 2 in sequence through a magazine elevator 5. As detected with a photoelectric sensor or the like, the ICs 3A are grasped and placed onto a measuring socket 9 with a handling arm 10 which performs a vacuum chucking three-dimensionally moving with cylinders 11, 13 and 15 or the like. A characteristic inspection is performed with a test head 21 or the like. Likewise, accepted components are turned to the trays 4 while rejected ones excluded with an arm 10 or the like. This enables continuous characteristic inspection and selection of electronic components such as ICs automatically.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9038480A JPS5722570A (en) | 1980-07-02 | 1980-07-02 | Automatic handling tool for parts |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9038480A JPS5722570A (en) | 1980-07-02 | 1980-07-02 | Automatic handling tool for parts |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5722570A true JPS5722570A (en) | 1982-02-05 |
Family
ID=13997071
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9038480A Pending JPS5722570A (en) | 1980-07-02 | 1980-07-02 | Automatic handling tool for parts |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5722570A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59114817U (en) * | 1983-01-24 | 1984-08-03 | 三洋電機株式会社 | Jusa |
JPS6080237A (en) * | 1983-10-07 | 1985-05-08 | Mitsutoyo Mfg Co Ltd | Automatic inspection apparatus of package type circuit element |
JPS60207790A (en) * | 1984-03-28 | 1985-10-19 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Testing selecting device by robot arm |
EP0166448A2 (en) * | 1984-06-29 | 1986-01-02 | Advantest Corporation | IC test equipment |
JPS61139768A (en) * | 1984-12-12 | 1986-06-27 | Matsushita Electric Ind Co Ltd | Inspection of electronic parts |
US4686468A (en) * | 1984-12-10 | 1987-08-11 | Aseco Corporation | Contact set for test apparatus for testing integrated circuit package |
US4908126A (en) * | 1986-11-11 | 1990-03-13 | Multitest, Elektronische Systeme Gmbh | Apparatus for testing and sorting electronic components, in particular IC's |
US5125503A (en) * | 1989-04-17 | 1992-06-30 | Ekkehard Ueberreiter | Apparatus for testing electronic components having a loading station a testing station and an unloading station for the components |
WO1995028737A1 (en) * | 1994-04-18 | 1995-10-26 | Micron Technology, Inc. | Method and apparatus for automatically positioning electronic die within component packages |
WO2005053015A1 (en) * | 2003-11-26 | 2005-06-09 | Hirata Corporation | Work handling apparatus |
-
1980
- 1980-07-02 JP JP9038480A patent/JPS5722570A/en active Pending
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59114817U (en) * | 1983-01-24 | 1984-08-03 | 三洋電機株式会社 | Jusa |
JPS6326094Y2 (en) * | 1983-01-24 | 1988-07-15 | ||
JPS6080237A (en) * | 1983-10-07 | 1985-05-08 | Mitsutoyo Mfg Co Ltd | Automatic inspection apparatus of package type circuit element |
JPS60207790A (en) * | 1984-03-28 | 1985-10-19 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Testing selecting device by robot arm |
JPH0450156B2 (en) * | 1984-03-28 | 1992-08-13 | Intaanashonaru Bijinesu Mashiinzu Corp | |
US4715501A (en) * | 1984-06-29 | 1987-12-29 | Takeda Riken Co., Ltd. | IC test equipment |
EP0166448A2 (en) * | 1984-06-29 | 1986-01-02 | Advantest Corporation | IC test equipment |
US4686468A (en) * | 1984-12-10 | 1987-08-11 | Aseco Corporation | Contact set for test apparatus for testing integrated circuit package |
JPS61139768A (en) * | 1984-12-12 | 1986-06-27 | Matsushita Electric Ind Co Ltd | Inspection of electronic parts |
US4908126A (en) * | 1986-11-11 | 1990-03-13 | Multitest, Elektronische Systeme Gmbh | Apparatus for testing and sorting electronic components, in particular IC's |
US5125503A (en) * | 1989-04-17 | 1992-06-30 | Ekkehard Ueberreiter | Apparatus for testing electronic components having a loading station a testing station and an unloading station for the components |
WO1995028737A1 (en) * | 1994-04-18 | 1995-10-26 | Micron Technology, Inc. | Method and apparatus for automatically positioning electronic die within component packages |
EP1251550A1 (en) * | 1994-04-18 | 2002-10-23 | Micron Technology, Inc. | Method and apparatus for automatically positioning electronic die within component packages |
WO2005053015A1 (en) * | 2003-11-26 | 2005-06-09 | Hirata Corporation | Work handling apparatus |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE480762T1 (en) | ANALYZER OF MOISTURE OR ASH IN MIXED SAMPLES | |
ES8206044A1 (en) | Apparatus for inspecting hand-held articles and persons carrying same. | |
JPS5722570A (en) | Automatic handling tool for parts | |
EP0365827A3 (en) | Device for holding a plurality of sample containers for carrying out radiation measurements | |
DE3889473D1 (en) | Device for handling a wafer. | |
MY127007A (en) | Workpiece inspection apparatus and inspection method | |
DE3463296D1 (en) | Inspection apparatus for inspecting articles moving on a conveyor | |
ZA801050B (en) | Apparatus for inspecting translucent articles for faults | |
JPS5539021A (en) | Automatic plate tester | |
FR2521304B1 (en) | ||
DK433289D0 (en) | AUTOMATIC SUPPLY AND LOADING FOR SHEET SUBJECTS | |
JPS6420450A (en) | Automatic urine inspection apparatus | |
GB2035955A (en) | Inclination indicator for gripping means on loading machines | |
DE3061000D1 (en) | Sorting apparatus for grading piece goods | |
CN217717552U (en) | Automatic detection device for surface defects of microchannel plate | |
DE59509011D1 (en) | Device and method for automatically loading a test apparatus with staple fiber samples | |
ATE158244T1 (en) | METHOD AND DEVICE FOR RECEIVING OBJECTS FROM A COLLECTION ROOM, E.G. FOR FILLING CONTAINERS. | |
JPS56155854A (en) | Method for controlling driving in automatic chemical analysis apparatus | |
JPS56168555A (en) | Sample feeder | |
ATE76793T1 (en) | DEVICE FOR SORTING PIECE OF MEAT. | |
JPS5763423A (en) | Weighing device with identifying device for container | |
ES8300197A1 (en) | Modular device for the automatic dimensional control of rotating pieces. | |
JPS56130938A (en) | Inspecting apparatus of semiconductor pellet | |
JPS5417258A (en) | Apparatus for handling rejected articles | |
JPS6491010A (en) | Plate-body inspecting apparatus |