JPS57133636A - Film forming device utilizing plasma at low temperature - Google Patents
Film forming device utilizing plasma at low temperatureInfo
- Publication number
- JPS57133636A JPS57133636A JP1898681A JP1898681A JPS57133636A JP S57133636 A JPS57133636 A JP S57133636A JP 1898681 A JP1898681 A JP 1898681A JP 1898681 A JP1898681 A JP 1898681A JP S57133636 A JPS57133636 A JP S57133636A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- cylinder
- end plate
- lead
- microwave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 abstract 2
- 230000002159 abnormal effect Effects 0.000 abstract 1
- 230000004913 activation Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 abstract 1
- 229910052742 iron Inorganic materials 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 230000035699 permeability Effects 0.000 abstract 1
- 238000001073 sample cooling Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
PURPOSE:To form a thin film of high quality without having the help of heat energy by a method wherein an end plate with a plasma lead-out window is movably constructed, a highly permeable material is arranged on the peripheral region of a magnetic coil, and the plasma with a high degree of activation is grown efficiently. CONSTITUTION:When a plasma growing chamber 1 is arranged facing the sample substrate 11 placed on a sample cooling stand 20, the following structure is formed. The end plate 14, having a plasma lead-out window 9, is inserted in a cylinder 15 maintaining a soft contact between the plate 14 and the cylinder 15, and the cylinder 15 is formed in such a manner that its vertical measurement will be adjustable using the screw, which is not shown in the diagram, provided on the lower surface of the cylinder 15. Also, a turn-back groove 16 of choke structure is provided between the end plate 14 and the inner surface of the cylinder 15 in order to prevent the abnormal discharge due to a microwave, and this enables the plasma growing chamber 1 to perform an optimum operation as a microwave cavity resonator. Besides, a ring-type member 18 made of highly permeable soft iron is fitted, along the waveguide 4, on the upper part of the microwave lead-in window 3, and the exciting coil 13 located inside the growing chamber 1 is surrounded by a housing having a high permeability.
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1898681A JPS57133636A (en) | 1981-02-13 | 1981-02-13 | Film forming device utilizing plasma at low temperature |
CA000375908A CA1159012A (en) | 1980-05-02 | 1981-04-22 | Plasma deposition apparatus |
US06/257,616 US4401054A (en) | 1980-05-02 | 1981-04-27 | Plasma deposition apparatus |
FR8108726A FR2481838A1 (en) | 1980-05-02 | 1981-04-30 | PLASMA DEPOSITION APPARATUS FOR FORMING A FILM ON A SUBSTRATE |
DE3117252A DE3117252C2 (en) | 1980-05-02 | 1981-04-30 | Plasma deposition device |
NL8102172A NL191267C (en) | 1980-05-02 | 1981-05-01 | Device for plasma processing of a substrate. |
GB8113505A GB2076587B (en) | 1980-05-02 | 1981-05-01 | Plasma deposition apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1898681A JPS57133636A (en) | 1981-02-13 | 1981-02-13 | Film forming device utilizing plasma at low temperature |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57133636A true JPS57133636A (en) | 1982-08-18 |
JPS6367332B2 JPS6367332B2 (en) | 1988-12-26 |
Family
ID=11986903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1898681A Granted JPS57133636A (en) | 1980-05-02 | 1981-02-13 | Film forming device utilizing plasma at low temperature |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57133636A (en) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60115235A (en) * | 1983-11-26 | 1985-06-21 | Nippon Telegr & Teleph Corp <Ntt> | Formimg method of insulation film on compound semiconductor substrate |
JPS60116781A (en) * | 1983-11-28 | 1985-06-24 | Kyocera Corp | Production of boron nitride film having high hardness |
JPS60116780A (en) * | 1983-11-28 | 1985-06-24 | Kyocera Corp | Manufacture of high hardness boron nitride film |
JPS6147628A (en) * | 1984-08-13 | 1986-03-08 | Nippon Telegr & Teleph Corp <Ntt> | Formation of semiconductor thin film and apparatus therefor |
JPS6380522A (en) * | 1986-09-24 | 1988-04-11 | Nec Corp | Excitation species cvd apparatus |
JPS63227777A (en) * | 1987-03-17 | 1988-09-22 | Nippon Telegr & Teleph Corp <Ntt> | Device for forming thin film |
JPS6455871A (en) * | 1987-08-26 | 1989-03-02 | Sumitomo Electric Industries | Manufacture of self-alignment type gate electrode |
US5069928A (en) * | 1988-02-01 | 1991-12-03 | Canon Kabushiki Kaisha | Microwave chemical vapor deposition apparatus and feedback control method |
US5296036A (en) * | 1990-11-29 | 1994-03-22 | Canon Kabushiki Kaisha | Apparatus for continuously forming a large area functional deposit film including microwave transmissive member transfer mean |
EP0406690A3 (en) * | 1989-06-28 | 1994-11-23 | Canon Kk | Process for continuously forming a large area functional deposited film by microwave pcvd method and an apparatus suitable for practicing the same |
US5397395A (en) * | 1990-10-29 | 1995-03-14 | Canon Kabushiki Kaisha | Method of continuously forming a large area functional deposited film by microwave PCVD and apparatus for the same |
US5514217A (en) * | 1990-11-16 | 1996-05-07 | Canon Kabushiki Kaisha | Microwave plasma CVD apparatus with a deposition chamber having a circumferential wall comprising a curved moving substrate web and a microwave applicator means having a specific dielectric member on the exterior thereof |
US5629054A (en) * | 1990-11-20 | 1997-05-13 | Canon Kabushiki Kaisha | Method for continuously forming a functional deposit film of large area by micro-wave plasma CVD method |
US5976257A (en) * | 1991-01-23 | 1999-11-02 | Canon Kabushiki Kaisha | Apparatus for continuously forming a large area deposited film by means of microwave plasma CVD process |
US6096389A (en) * | 1995-09-14 | 2000-08-01 | Canon Kabushiki Kaisha | Method and apparatus for forming a deposited film using a microwave CVD process |
WO2019239765A1 (en) * | 2018-06-14 | 2019-12-19 | 株式会社エスイー | Manufacturing device and manufacturing method for treating raw material with microwave surface wave plasma and obtaining product different from raw material |
JP2021037511A (en) * | 2018-06-14 | 2021-03-11 | 株式会社エスイー | Manufacturing device and manufacturing method for providing product different from raw material by treating raw material with micro wave surface wave plasma |
-
1981
- 1981-02-13 JP JP1898681A patent/JPS57133636A/en active Granted
Cited By (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60115235A (en) * | 1983-11-26 | 1985-06-21 | Nippon Telegr & Teleph Corp <Ntt> | Formimg method of insulation film on compound semiconductor substrate |
JPS60116781A (en) * | 1983-11-28 | 1985-06-24 | Kyocera Corp | Production of boron nitride film having high hardness |
JPS60116780A (en) * | 1983-11-28 | 1985-06-24 | Kyocera Corp | Manufacture of high hardness boron nitride film |
JPH0524992B2 (en) * | 1983-11-28 | 1993-04-09 | Kyocera Corp | |
JPH0524991B2 (en) * | 1983-11-28 | 1993-04-09 | Kyocera Corp | |
JPS6147628A (en) * | 1984-08-13 | 1986-03-08 | Nippon Telegr & Teleph Corp <Ntt> | Formation of semiconductor thin film and apparatus therefor |
JPS6380522A (en) * | 1986-09-24 | 1988-04-11 | Nec Corp | Excitation species cvd apparatus |
JPH0616496B2 (en) * | 1986-09-24 | 1994-03-02 | 日本電気株式会社 | Excited seed CVD device |
JPS63227777A (en) * | 1987-03-17 | 1988-09-22 | Nippon Telegr & Teleph Corp <Ntt> | Device for forming thin film |
JPS6455871A (en) * | 1987-08-26 | 1989-03-02 | Sumitomo Electric Industries | Manufacture of self-alignment type gate electrode |
US5069928A (en) * | 1988-02-01 | 1991-12-03 | Canon Kabushiki Kaisha | Microwave chemical vapor deposition apparatus and feedback control method |
US6253703B1 (en) * | 1988-02-01 | 2001-07-03 | Canon Kabushiki Kaisha | Microwave chemical vapor deposition apparatus |
EP0406690A3 (en) * | 1989-06-28 | 1994-11-23 | Canon Kk | Process for continuously forming a large area functional deposited film by microwave pcvd method and an apparatus suitable for practicing the same |
US5510151A (en) * | 1989-06-28 | 1996-04-23 | Canon Kabushiki Kaisha | Continuous film-forming process using microwave energy in a moving substrate web functioning as a substrate and plasma generating space |
US5714010A (en) * | 1989-06-28 | 1998-02-03 | Canon Kabushiki Kaisha | Process for continuously forming a large area functional deposited film by a microwave PCVD method and an apparatus suitable for practicing the same |
US5397395A (en) * | 1990-10-29 | 1995-03-14 | Canon Kabushiki Kaisha | Method of continuously forming a large area functional deposited film by microwave PCVD and apparatus for the same |
US5523126A (en) * | 1990-10-29 | 1996-06-04 | Canon Kabushiki Kaisha | Method of continuously forming a large area functional deposited film by microwave PCVD |
US5514217A (en) * | 1990-11-16 | 1996-05-07 | Canon Kabushiki Kaisha | Microwave plasma CVD apparatus with a deposition chamber having a circumferential wall comprising a curved moving substrate web and a microwave applicator means having a specific dielectric member on the exterior thereof |
US5629054A (en) * | 1990-11-20 | 1997-05-13 | Canon Kabushiki Kaisha | Method for continuously forming a functional deposit film of large area by micro-wave plasma CVD method |
US5296036A (en) * | 1990-11-29 | 1994-03-22 | Canon Kabushiki Kaisha | Apparatus for continuously forming a large area functional deposit film including microwave transmissive member transfer mean |
US5976257A (en) * | 1991-01-23 | 1999-11-02 | Canon Kabushiki Kaisha | Apparatus for continuously forming a large area deposited film by means of microwave plasma CVD process |
US6096389A (en) * | 1995-09-14 | 2000-08-01 | Canon Kabushiki Kaisha | Method and apparatus for forming a deposited film using a microwave CVD process |
WO2019239765A1 (en) * | 2018-06-14 | 2019-12-19 | 株式会社エスイー | Manufacturing device and manufacturing method for treating raw material with microwave surface wave plasma and obtaining product different from raw material |
JP2019214033A (en) * | 2018-06-14 | 2019-12-19 | 株式会社エスイー | Manufacturing device and manufacturing method for providing product different from raw material by treating raw material with micro wave surface wave plasma |
JP2021037511A (en) * | 2018-06-14 | 2021-03-11 | 株式会社エスイー | Manufacturing device and manufacturing method for providing product different from raw material by treating raw material with micro wave surface wave plasma |
Also Published As
Publication number | Publication date |
---|---|
JPS6367332B2 (en) | 1988-12-26 |
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