JPS57111073A - Semiconductor light-receiving element - Google Patents
Semiconductor light-receiving elementInfo
- Publication number
- JPS57111073A JPS57111073A JP55187357A JP18735780A JPS57111073A JP S57111073 A JPS57111073 A JP S57111073A JP 55187357 A JP55187357 A JP 55187357A JP 18735780 A JP18735780 A JP 18735780A JP S57111073 A JPS57111073 A JP S57111073A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- type
- epitaxially grown
- ingaas
- type inp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 abstract 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
- H01L31/1075—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers, e.g. absorption or multiplication layers, form an heterostructure, e.g. SAM structure
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Abstract
PURPOSE:To increase the reverse withstand voltage of an avalanche photodiode by a method wherein an epitaxially grown guard ring layer, having a large low- density doped band gap, is provided. CONSTITUTION:For example, an N type InP layer 2 and an N type InGaAs layer 3, a P type InGaAs layer 4 are epitaxially grown in succession on an N type InP substrate 1. Then, using a sputter-evaporated SiO2 film 5 as a mask, a selective etching is performed as deep as to the N type InP layer 2. Besides, a low density P type layer 6, having a band gap larger than the InGaAs, is epitaxially grown as a guard ring on the part where the etching is performed. As a result, a large reverse withstand voltage can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55187357A JPS57111073A (en) | 1980-12-26 | 1980-12-26 | Semiconductor light-receiving element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55187357A JPS57111073A (en) | 1980-12-26 | 1980-12-26 | Semiconductor light-receiving element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57111073A true JPS57111073A (en) | 1982-07-10 |
Family
ID=16204574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55187357A Pending JPS57111073A (en) | 1980-12-26 | 1980-12-26 | Semiconductor light-receiving element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57111073A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0727824A3 (en) * | 1995-02-16 | 1997-06-04 | Hewlett Packard Co | Semiconductor light detector |
EP0869561A2 (en) * | 1997-04-01 | 1998-10-07 | Hewlett-Packard Company | Avalanche photodiode and method of making the same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5599782A (en) * | 1979-01-25 | 1980-07-30 | Nippon Telegr & Teleph Corp <Ntt> | Manufacture of guard ring for semiconductor photodetector |
JPS56158488A (en) * | 1980-05-12 | 1981-12-07 | Mitsubishi Electric Corp | Semiconductor device |
-
1980
- 1980-12-26 JP JP55187357A patent/JPS57111073A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5599782A (en) * | 1979-01-25 | 1980-07-30 | Nippon Telegr & Teleph Corp <Ntt> | Manufacture of guard ring for semiconductor photodetector |
JPS56158488A (en) * | 1980-05-12 | 1981-12-07 | Mitsubishi Electric Corp | Semiconductor device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0727824A3 (en) * | 1995-02-16 | 1997-06-04 | Hewlett Packard Co | Semiconductor light detector |
US5843804A (en) * | 1995-02-16 | 1998-12-01 | Hewlett-Packard Company | Method of making avalanche photodiodes with epitaxially-regrown guard rings |
EP0869561A2 (en) * | 1997-04-01 | 1998-10-07 | Hewlett-Packard Company | Avalanche photodiode and method of making the same |
EP0869561A3 (en) * | 1997-04-01 | 1999-09-01 | Hewlett-Packard Company | Avalanche photodiode and method of making the same |
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