[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

JPS5580040A - Light source apparatus for luminous spectrochemical analyzer - Google Patents

Light source apparatus for luminous spectrochemical analyzer

Info

Publication number
JPS5580040A
JPS5580040A JP15484078A JP15484078A JPS5580040A JP S5580040 A JPS5580040 A JP S5580040A JP 15484078 A JP15484078 A JP 15484078A JP 15484078 A JP15484078 A JP 15484078A JP S5580040 A JPS5580040 A JP S5580040A
Authority
JP
Japan
Prior art keywords
discharge
time constant
energy accumulation
luminous
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15484078A
Other languages
Japanese (ja)
Other versions
JPS6054618B2 (en
Inventor
Isao Fukui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP15484078A priority Critical patent/JPS6054618B2/en
Publication of JPS5580040A publication Critical patent/JPS5580040A/en
Publication of JPS6054618B2 publication Critical patent/JPS6054618B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To accomplish the analysis of elements suitable for the spark-line discharge and the arc-like discharge with single lumination by connecting several kinds of discharge energy accumulation circuits different in the time constant in parallel or series to the discharge gap. CONSTITUTION:Discharge energy accumulation circuits different in the time constant respectively comprising rectifying circuits 1 and 2, capacitors C1 and C2, resistances R1 and R2, choke coils L1 and L2, and diodes D1 and D2 are connected in parallel to the discharge gap G. In such a circuit, the time constant and the charging voltage of the capacitors C1 and C2 are selected properly and a trigger voltage is applied to the discharge gap G to discharge. Consequently, a spark-like discharge and an arc-like discharge are continuously produced. In this manner, it is possible to analyze the elements suitable for both types of the discharge simultaneously over one sample with single lumination. In the case of series connection of the energy accumulation circuits, the same effect can be obtained.
JP15484078A 1978-12-13 1978-12-13 Emission spectroscopy method Expired JPS6054618B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15484078A JPS6054618B2 (en) 1978-12-13 1978-12-13 Emission spectroscopy method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15484078A JPS6054618B2 (en) 1978-12-13 1978-12-13 Emission spectroscopy method

Publications (2)

Publication Number Publication Date
JPS5580040A true JPS5580040A (en) 1980-06-16
JPS6054618B2 JPS6054618B2 (en) 1985-11-30

Family

ID=15593027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15484078A Expired JPS6054618B2 (en) 1978-12-13 1978-12-13 Emission spectroscopy method

Country Status (1)

Country Link
JP (1) JPS6054618B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047944A (en) * 1983-08-26 1985-03-15 Shimadzu Corp Emission spectrometer
JPH04326043A (en) * 1991-04-25 1992-11-16 Shimadzu Corp Emission light spectrum analizer
JPH08210980A (en) * 1987-11-30 1996-08-20 Shimadzu Corp Emission spectroscopy analyzer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047944A (en) * 1983-08-26 1985-03-15 Shimadzu Corp Emission spectrometer
JPH08210980A (en) * 1987-11-30 1996-08-20 Shimadzu Corp Emission spectroscopy analyzer
JPH04326043A (en) * 1991-04-25 1992-11-16 Shimadzu Corp Emission light spectrum analizer

Also Published As

Publication number Publication date
JPS6054618B2 (en) 1985-11-30

Similar Documents

Publication Publication Date Title
BR8101695A (en) HIGH INTENSITY PERFECTED DISCHARGE LAMP CONTAINING ELECTRONIC STARTING AUXILIARY
JPS5580040A (en) Light source apparatus for luminous spectrochemical analyzer
FI821039L (en) APPARATUS OCH FOERFARANDE FOER TESTNING AV DETONERINGSSYSTEM
JPS55155258A (en) Device for measuring characteristic of gapless arrester
JPS56139081A (en) Capacitor voltage dropping circuit
JPS56107170A (en) Condenser electrostatic capacity measurement device
FR2314502A1 (en) Electrical leakage measurement apparatus - applies high voltage across component and measures current using opto-electronic threshold detection circuit
JPS576369A (en) Constant power load tester
JPS533277A (en) Partial discharge tester
JPS54136382A (en) Partial discharge measuring circuit
JPS5338266A (en) Screening method of semiconductors and device for the same
JPS5498067A (en) Discharge lamp lighting device
JPS5610265A (en) Method for measuring voltage-current characteristic of semiconductor element
JPS56142469A (en) Wiring test for wire-printed board
JPS5769942A (en) Detection circuit for selecting gallout signal
JPS5635430A (en) Device for screening semiconductor element
IT8423300A0 (en) INTEGRATED ELECTRONIC DEVICE WITH THREE TERMINALS WITH OUTPUT CURRENT SUBSTANTIALLY CANCELING UPON EXCEEDING A CERTAIN VALUE OF THE APPLIED VOLTAGE.
JPS52146068A (en) Apparatus for aging discharge lamps
JPS55122141A (en) Electric potential measuring method
JPS5570752A (en) Balancing type partial discharge test circuit
JPS55144558A (en) Electric component sorting apparatus
JPS5717942A (en) Detector for battery voltage of electronic flashing device
JPS56128403A (en) Checking method and device for thickness of insulating base material
JPS5587012A (en) Photo signal receiver
JPS5790723A (en) Power supply device