JPS5538664A - Nonvolatile memory circuit - Google Patents
Nonvolatile memory circuitInfo
- Publication number
- JPS5538664A JPS5538664A JP11117078A JP11117078A JPS5538664A JP S5538664 A JPS5538664 A JP S5538664A JP 11117078 A JP11117078 A JP 11117078A JP 11117078 A JP11117078 A JP 11117078A JP S5538664 A JPS5538664 A JP S5538664A
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- write
- read
- nonvolatile memory
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
Landscapes
- Read Only Memory (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Abstract
PURPOSE:To make it possible to write and read information at a high speed without limiting the number of rewriting operation by making nonvolatile the operation results of the dynamic memory of a MIS semiconductor nonvolatile memory transistor. CONSTITUTION:Binary information according to the ON-OFF operation of transistor Q2 corresponding to the charge in the floating capacity of control gate 17 of MIS transistor Q2 is read out through transistor Q3 to turn OFF transistor Q1 connected to gate 17. As a result, the write or refreshing operation of transistor Q2 is performed and transistor Q2 operates as a dynamic memory at a high speed. On the other hand, when transistor Q3 is turned ON by applying read digit line 12 with a voltage pulse of more than its critical voltage, gate 17 is charged; when the memory contents is ''1'', the threshold voltage of transistor Q2 never changes because a write voltage applied to drain 18 through transistor Q3 is high, and when ''0'', it does not change neither. As a result, information is stored in transistor Q2 even at power-OFF time and transistor Q2 operates as a nonvolatile memory, so that high-speed write and read operations can be performed without limiting the number of write operation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11117078A JPS5538664A (en) | 1978-09-08 | 1978-09-08 | Nonvolatile memory circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11117078A JPS5538664A (en) | 1978-09-08 | 1978-09-08 | Nonvolatile memory circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5538664A true JPS5538664A (en) | 1980-03-18 |
JPS6223396B2 JPS6223396B2 (en) | 1987-05-22 |
Family
ID=14554246
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11117078A Granted JPS5538664A (en) | 1978-09-08 | 1978-09-08 | Nonvolatile memory circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5538664A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4495693A (en) * | 1980-06-17 | 1985-01-29 | Tokyo Shibaura Denki Kabushiki Kaisha | Method of integrating MOS devices of double and single gate structure |
JPS62266793A (en) * | 1986-05-13 | 1987-11-19 | Mitsubishi Electric Corp | Nonvolatile semiconductor storage device |
JPH03134894A (en) * | 1989-10-19 | 1991-06-07 | Sharp Corp | Semiconductor memory device |
WO1995019625A1 (en) * | 1994-01-18 | 1995-07-20 | Tadashi Shibata | Semiconductor device |
WO2011140044A2 (en) * | 2010-05-06 | 2011-11-10 | Micron Technology, Inc. | Techniques for refreshing a semiconductor memory device |
US9812179B2 (en) | 2009-11-24 | 2017-11-07 | Ovonyx Memory Technology, Llc | Techniques for reducing disturbance in a semiconductor memory device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5152248A (en) * | 1974-09-03 | 1976-05-08 | Siemens Ag |
-
1978
- 1978-09-08 JP JP11117078A patent/JPS5538664A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5152248A (en) * | 1974-09-03 | 1976-05-08 | Siemens Ag |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4495693A (en) * | 1980-06-17 | 1985-01-29 | Tokyo Shibaura Denki Kabushiki Kaisha | Method of integrating MOS devices of double and single gate structure |
JPS62266793A (en) * | 1986-05-13 | 1987-11-19 | Mitsubishi Electric Corp | Nonvolatile semiconductor storage device |
JPH0568799B2 (en) * | 1986-05-13 | 1993-09-29 | Mitsubishi Electric Corp | |
JPH03134894A (en) * | 1989-10-19 | 1991-06-07 | Sharp Corp | Semiconductor memory device |
WO1995019625A1 (en) * | 1994-01-18 | 1995-07-20 | Tadashi Shibata | Semiconductor device |
US9812179B2 (en) | 2009-11-24 | 2017-11-07 | Ovonyx Memory Technology, Llc | Techniques for reducing disturbance in a semiconductor memory device |
WO2011140044A2 (en) * | 2010-05-06 | 2011-11-10 | Micron Technology, Inc. | Techniques for refreshing a semiconductor memory device |
WO2011140044A3 (en) * | 2010-05-06 | 2012-02-09 | Micron Technology, Inc. | Techniques for refreshing a semiconductor memory device |
CN102884582A (en) * | 2010-05-06 | 2013-01-16 | 美光科技公司 | Techniques for refreshing a semiconductor memory device |
Also Published As
Publication number | Publication date |
---|---|
JPS6223396B2 (en) | 1987-05-22 |
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