JPS5497475A - Rays radiation angle detecting optical device from beltlike body scanned by rays - Google Patents

Rays radiation angle detecting optical device from beltlike body scanned by rays

Info

Publication number: JPS5497475A
Authority: JP; Japan
Prior art keywords: rays; optical device; angle detecting; radiation angle; detecting optical
Prior art date: 1978-01-04
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP16544578A

Other languages

English (en)

Other versions

JPS638420B2 (ja

Inventor

Zuitsuku Erubuin

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Erwin Sick GmbH Optik Elektronik

Original Assignee

Erwin Sick GmbH Optik Elektronik

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1978-01-04

Filing date

1978-12-29

Publication date

1979-08-01

1978-12-29 Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik

1979-08-01 Publication of JPS5497475A publication Critical patent/JPS5497475A/ja

1988-02-23 Publication of JPS638420B2 publication Critical patent/JPS638420B2/ja

Status Granted legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Engineering & Computer Science (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
Textile Engineering (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Length Measuring Devices By Optical Means (AREA)

JP16544578A 1978-01-04 1978-12-29 Rays radiation angle detecting optical device from beltlike body scanned by rays Granted JPS5497475A (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE2800351A DE2800351B2 (de)	1978-01-04	1978-01-04	Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Publications (2)

Publication Number	Publication Date
JPS5497475A true JPS5497475A (en)	1979-08-01
JPS638420B2 JPS638420B2 (ja)	1988-02-23

Family

ID=6028981

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP16544578A Granted JPS5497475A (en)	1978-01-04	1978-12-29	Rays radiation angle detecting optical device from beltlike body scanned by rays

Country Status (6)

Country	Link
US (1)	US4248537A (ja)
JP (1)	JPS5497475A (ja)
DE (1)	DE2800351B2 (ja)
FR (1)	FR2422933A1 (ja)
GB (1)	GB2023868B (ja)
SE (1)	SE428973B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS556293A (en) *	1978-06-23	1980-01-17	Sick Optik Elektronik Erwin	Detector for surface scratches on strip type element
JPS56129805A (en) *	1980-02-19	1981-10-12	Sick Optik Elektronik Erwin	Defect detector for woven cloth

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE2827705C3 (de) *	1978-06-23	1981-07-30	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Gerät zur Feststellung von Fehlern an Bahnmaterial
SE440405B (sv) *	1979-03-02	1985-07-29	Svenska Textilforskningsinst	Anordning for bestemning av riktningsfordelningen av fibrer i planet for ett dukformigt material
DE3037622C2 (de) *	1980-10-04	1987-02-26	Theodor Prof. Dr.-Ing. 1000 Berlin Gast	Einrichtung zur Bestimmung der Oberflächengüte
DE3307591C2 (de) *	1983-03-03	1986-06-05	Kraftwerk Union AG, 4330 Mülheim	Verfahren zur optischen Kontrolle der Oberfläche eines Prüfgutes
EP0123929B1 (de) *	1983-04-22	1988-06-22	Erwin Sick GmbH Optik-Elektronik	Fehlerfeststellungsvorrichtung
DE3411934C2 (de) *	1983-04-22	1986-04-24	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Fehlerfeststellungsvorrichtung
DE3408106A1 (de) *	1984-03-05	1985-09-12	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Optischer rauheits-scanner
DE3428435A1 (de) *	1984-08-01	1986-02-06	Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch	Rauheitssonde
US5448364A (en) *	1993-03-22	1995-09-05	Estek Corporation	Particle detection system with reflective line-to-spot collector
EP1241466A1 (fr) *	2001-03-13	2002-09-18	Daniel Malaise	Dispositif et procédé optoélectronique de mesure en temps réel de la lumière diffusée par une surface en défilement

Citations (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5035437A (ja) *	1973-07-31	1975-04-04
JPS5210793A (en) *	1975-07-15	1977-01-27	Yaskawa Electric Mfg Co Ltd	Fault detector

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
NL279098A (ja) *	1961-05-31
DE1473746A1 (de) *	1964-06-15	1969-01-09	Eastman Kodak Co	Vorrichtung zum photoelektrischen Abtasten eines gefuehrten Bandes
US3618063A (en) *	1970-02-11	1971-11-02	Eastman Kodak Co	Defect inspection apparatus
DE2051908A1 (de) *	1970-10-22	1972-04-27	Licentia Gmbh	Photoelektronische Oberflachenabtast einrichtung
GB1347777A (en) *	1970-12-12	1974-02-27	Sick Optik Elektronik Erwin	Photoelectric length measuring apparatus
GB1389444A (en) *	1971-03-09	1975-04-03	Sira Institute	Apparatus for automatic inspection of materials
JPS4879686A (ja) *	1972-01-28	1973-10-25
US3866054A (en) *	1973-09-28	1975-02-11	Du Pont	Defect size discriminator circuit for web inspection system
US3919531A (en) *	1974-05-16	1975-11-11	Libbey Owens Ford Co	Method of and apparatus for inspecting the contours of moving bent articles
GB1496765A (en) *	1974-12-19	1978-01-05	Ciba Geigy Ag	Examining sheet material photoelectrically

1978
- 1978-01-04 DE DE2800351A patent/DE2800351B2/de active Granted
- 1978-12-20 GB GB7849309A patent/GB2023868B/en not_active Expired
- 1978-12-22 US US05/972,301 patent/US4248537A/en not_active Expired - Lifetime
- 1978-12-22 SE SE7813256A patent/SE428973B/sv not_active IP Right Cessation
- 1978-12-29 JP JP16544578A patent/JPS5497475A/ja active Granted
1979
- 1979-01-02 FR FR7900035A patent/FR2422933A1/fr active Granted

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5035437A (ja) *	1973-07-31	1975-04-04
JPS5210793A (en) *	1975-07-15	1977-01-27	Yaskawa Electric Mfg Co Ltd	Fault detector

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS556293A (en) *	1978-06-23	1980-01-17	Sick Optik Elektronik Erwin	Detector for surface scratches on strip type element
JPS6223250B2 (ja) *	1978-06-23	1987-05-22	Erubin Jitsuku Oputeiku Erekutoroniku
JPS56129805A (en) *	1980-02-19	1981-10-12	Sick Optik Elektronik Erwin	Defect detector for woven cloth

Also Published As

Publication number	Publication date
SE428973B (sv)	1983-08-01
GB2023868A (en)	1980-01-03
FR2422933B1 (ja)	1984-03-02
DE2800351A1 (de)	1979-07-05
JPS638420B2 (ja)	1988-02-23
US4248537A (en)	1981-02-03
DE2800351C3 (ja)	1980-07-31
SE7813256L (sv)	1979-07-05
FR2422933A1 (fr)	1979-11-09
GB2023868B (en)	1982-06-23
DE2800351B2 (de)	1979-11-15

Publication	Publication Date	Title
AU519007B2 (en)	1981-11-05	Radiation imaging device
JPS5511000A (en)	1980-01-25	Radiation pickup device
JPS5611395A (en)	1981-02-04	Radiation image writeereading device
GB2030022B (en)	1983-12-14	Focus detecting device
GB2012518B (en)	1982-10-06	Radiation imaging system
ZA777541B (en)	1979-07-25	Optical scanning device
JPS5644831A (en)	1981-04-24	High resolution radiant detector
JPS55129732A (en)	1980-10-07	Optical scanning scar detector
JPS5413355A (en)	1979-01-31	Optical scanning device
GB2023285B (en)	1983-01-12	Radiation detection apparatus
GB2011116A (en)	1979-07-04	Optical scanning device
JPS5497475A (en)	1979-08-01	Rays radiation angle detecting optical device from beltlike body scanned by rays
JPS556385A (en)	1980-01-17	Light beam scanning device
JPS5489649A (en)	1979-07-16	Lens for concentrating radiation
IL66805A0 (en)	1982-12-31	Infra-red radiation imaging device
JPS54148494A (en)	1979-11-20	Radiation inspecting device
JPS5640807A (en)	1981-04-17	Optical arrangement for radiation detector
JPS53127720A (en)	1978-11-08	Focal point detection device
JPS5461921A (en)	1979-05-18	Focal point detector
GB8304479D0 (en)	1983-03-23	Radiation sensor means
GB2008848B (en)	1982-09-02	Radiation detection device
JPS5553051A (en)	1980-04-18	Radiation detector
GB2029153B (en)	1982-12-22	Focus detecting device
JPS55101069A (en)	1980-08-01	Multiicell radiation detector
GB2026277B (en)	1982-11-24	Three dimensional imaging by radiation absorption