JPS5432978A - Correcting method for pattern - Google Patents
Correcting method for patternInfo
- Publication number
- JPS5432978A JPS5432978A JP9976377A JP9976377A JPS5432978A JP S5432978 A JPS5432978 A JP S5432978A JP 9976377 A JP9976377 A JP 9976377A JP 9976377 A JP9976377 A JP 9976377A JP S5432978 A JPS5432978 A JP S5432978A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- correcting method
- correct
- substrate
- work
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
PURPOSE: To correct and to work a pattern accurately by forming a protective film on a substrate and the pattern surface before laser-beam irradiation.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9976377A JPS5432978A (en) | 1977-08-19 | 1977-08-19 | Correcting method for pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9976377A JPS5432978A (en) | 1977-08-19 | 1977-08-19 | Correcting method for pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5432978A true JPS5432978A (en) | 1979-03-10 |
Family
ID=14256005
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9976377A Pending JPS5432978A (en) | 1977-08-19 | 1977-08-19 | Correcting method for pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5432978A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6163029A (en) * | 1984-09-03 | 1986-04-01 | Sanyo Electric Co Ltd | Method for correction of chromium mask |
WO2004088416A1 (en) * | 2003-03-28 | 2004-10-14 | Fujitsu Limited | Method for measuring/inspecting pattern size of photomask |
US6856374B1 (en) | 1999-11-19 | 2005-02-15 | Fujitsu Display Technologies Corporation | Display and method for repairing defects thereof |
-
1977
- 1977-08-19 JP JP9976377A patent/JPS5432978A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6163029A (en) * | 1984-09-03 | 1986-04-01 | Sanyo Electric Co Ltd | Method for correction of chromium mask |
US6856374B1 (en) | 1999-11-19 | 2005-02-15 | Fujitsu Display Technologies Corporation | Display and method for repairing defects thereof |
US7187423B2 (en) | 1999-11-19 | 2007-03-06 | Sharp Kabushiki Kaisha | Display and method for repairing defects thereof |
WO2004088416A1 (en) * | 2003-03-28 | 2004-10-14 | Fujitsu Limited | Method for measuring/inspecting pattern size of photomask |
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