JPH0325135U - - Google Patents
Info
- Publication number
- JPH0325135U JPH0325135U JP8726189U JP8726189U JPH0325135U JP H0325135 U JPH0325135 U JP H0325135U JP 8726189 U JP8726189 U JP 8726189U JP 8726189 U JP8726189 U JP 8726189U JP H0325135 U JPH0325135 U JP H0325135U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- laser diode
- current
- under test
- diode under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 238000013500 data storage Methods 0.000 claims description 2
- 238000011156 evaluation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Description
第１図はこの考案の一実施例を示すブロツク図
、第２図乃至第４図は第１図に示した実施例の動
作を説明するためのグラフ、第５図は第４図に示
した特性の測定条件を説明するための接続図、第
６図は従来の技術を説明するための接続図である
。
１Ａ，１Ｂ……被試験レーザダイオード、２Ａ
，２Ｂ……電流・電圧源、３……コントロール回
路、４Ａ，４Ｂ……ＤＡ変換器、６Ａ，６Ｂ……
電圧測定回路、７……光パワー測定器、８Ａ，８
Ｂ……ＡＤ変換器、９……データ記憶回路。
Figure 1 is a block diagram showing one embodiment of this invention, Figures 2 to 4 are graphs for explaining the operation of the embodiment shown in Figure 1, and Figure 5 is the same as that shown in Figure 4. A connection diagram for explaining characteristics measurement conditions, and FIG. 6 is a connection diagram for explaining a conventional technique. 1A, 1B... Laser diode under test, 2A
, 2B... Current/voltage source, 3... Control circuit, 4A, 4B... DA converter, 6A, 6B...
Voltage measuring circuit, 7... Optical power measuring device, 8A, 8
B...AD converter, 9...data storage circuit.
Claims (1)
応した設定値を出力するコントロール回路と、 Ｂ このコントロール回路から出力された設定値
に従つて電流、電圧を発生する複数の電流・電圧
源と、 Ｃ これら複数の電流・電圧源から出力さた電流
、電圧が被試験レーザダイオードに与えられた結
果被試験レーザダイオードの端子間に発生する電
圧を測定する複数の電圧測定回路と、 Ｄ 被試験レーザダイオードが射出する光を受光
し、光エネルギを測定する光パワー測定器と、 Ｅ 上記電圧測定回路の測定結果と、上記光パワ
ー測定器の測定結果を記憶するデータ記憶器と、 によつて構成されたレーザダイオード評価装置
。[Claims for Utility Model Registration] A. A control circuit that outputs a set value corresponding to the current value applied to the laser diode under test, and B. A plurality of circuits that generate current and voltage according to the set value output from this control circuit. A current/voltage source, and a plurality of voltage measurement circuits that measure the voltage generated between the terminals of the laser diode under test as a result of the current and voltage output from these multiple current/voltage sources being applied to the laser diode under test. D. An optical power measuring device that receives the light emitted by the laser diode under test and measures the optical energy; E. A data storage device that stores the measurement results of the voltage measuring circuit and the optical power measuring device. A laser diode evaluation device configured by and.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8726189U JPH0325135U (en) | 1989-07-24 | 1989-07-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8726189U JPH0325135U (en) | 1989-07-24 | 1989-07-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0325135U true JPH0325135U (en) | 1991-03-14 |
Family
ID=31636913
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8726189U Pending JPH0325135U (en) | 1989-07-24 | 1989-07-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0325135U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001033513A (en) * | 1999-07-19 | 2001-02-09 | Nippon Telegr & Teleph Corp <Ntt> | Characteristic measuring method of semiconductor optical element and recording medium in which characteristic measuring program is recorded |
| JP2013257266A (en) * | 2012-06-14 | 2013-12-26 | Sharp Corp | Burn-in device |
| KR102005711B1 (en) * | 2019-04-15 | 2019-07-31 | 심재영 | Device for testing optical modules |
| WO2020116236A1 (en) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | Inspection device, inspection method, and inspection device program |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5849273B2 (en) * | 1977-11-28 | 1983-11-02 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | dry shaver |
| JPS62247582A (en) * | 1986-04-18 | 1987-10-28 | Fujitsu Ltd | Laser diode |
| JPS62273863A (en) * | 1986-05-23 | 1987-11-27 | Ricoh Co Ltd | Output controller for luminous element array |
-
1989
- 1989-07-24 JP JP8726189U patent/JPH0325135U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5849273B2 (en) * | 1977-11-28 | 1983-11-02 | エヌ・ベ−・フイリツプス・フル−イランペンフアブリケン | dry shaver |
| JPS62247582A (en) * | 1986-04-18 | 1987-10-28 | Fujitsu Ltd | Laser diode |
| JPS62273863A (en) * | 1986-05-23 | 1987-11-27 | Ricoh Co Ltd | Output controller for luminous element array |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001033513A (en) * | 1999-07-19 | 2001-02-09 | Nippon Telegr & Teleph Corp <Ntt> | Characteristic measuring method of semiconductor optical element and recording medium in which characteristic measuring program is recorded |
| JP2013257266A (en) * | 2012-06-14 | 2013-12-26 | Sharp Corp | Burn-in device |
| WO2020116236A1 (en) * | 2018-12-06 | 2020-06-11 | 日本電産リード株式会社 | Inspection device, inspection method, and inspection device program |
| JPWO2020116236A1 (en) * | 2018-12-06 | 2021-10-14 | 日本電産リード株式会社 | Inspection equipment, inspection methods, and programs for inspection equipment |
| KR102005711B1 (en) * | 2019-04-15 | 2019-07-31 | 심재영 | Device for testing optical modules |
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