JPH0526739A - Multiple-point temperature-measuring circuit - Google Patents
Multiple-point temperature-measuring circuitInfo
- Publication number
- JPH0526739A JPH0526739A JP20146991A JP20146991A JPH0526739A JP H0526739 A JPH0526739 A JP H0526739A JP 20146991 A JP20146991 A JP 20146991A JP 20146991 A JP20146991 A JP 20146991A JP H0526739 A JPH0526739 A JP H0526739A
- Authority
- JP
- Japan
- Prior art keywords
- electric wire
- wires
- diode
- horizontal
- vertical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は多数のダイオ−ドを用い
た多点温度測定回路に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multipoint temperature measuring circuit using a large number of diodes.
【0002】[0002]
【従来の技術】ダイオ−ドには温度に応じて電圧降下が
変化する性質がある。従来はその性質を利用してダイオ
ードを温度計測に使用していた。2. Description of the Related Art Diodes have the property that the voltage drop changes with temperature. Conventionally, the diode has been used for temperature measurement by utilizing its property.
【0003】[0003]
【発明が解決しようとする課題】この場合、1個のダイ
オードで1箇所の温度測定しかできないため、測定する
箇所(測定点)が多い場合にはその数だけダイオードが
必要になる。しかも夫々のダイオードには電流を印加す
るための2本の電線が必要になる。このためダイオード
によりN点の温度を測定する場合は−極側を共通電極に
しても(N+1)本という数の電線が必要となるという
問題点があった。In this case, since only one diode can measure the temperature at one location, when there are many locations (measurement points) to be measured, the diodes are required for that number. Moreover, each diode requires two electric wires for applying a current. Therefore, when the temperature at the N point is measured by the diode, there is a problem that the number of electric wires of (N + 1) is required even if the negative electrode side is the common electrode.
【0004】[0004]
【目的】本発明の目的は、ダイオ−ドを用いても配線数
が少なくてすむ多点温度測定回路を実現することにあ
る。[Object] An object of the present invention is to realize a multipoint temperature measuring circuit which requires a small number of wirings even if a diode is used.
【0005】[0005]
【課題を解決するための手段】本発明の多点温度測定回
路は、複数本の縦電線1と横電線2を格子状に配線し、
両電線1、2の夫々の交点の近くの縦電線1に複数の温
度測定用ダイオード3の一端を、夫々の交点の近くの横
電線2に夫々のダイオード3の他端を接続し、縦電線1
と横電線2の夫々の一端に夫々の縦電線1、横電線2へ
電気信号を切替え供給するマルチプレクサ4a、4bを
設けたものである。A multipoint temperature measuring circuit according to the present invention comprises a plurality of vertical electric wires 1 and horizontal electric wires 2 arranged in a grid pattern.
One end of each of the plurality of temperature measuring diodes 3 is connected to the vertical electric wire 1 near each intersection of both electric wires 1 and 2, and the other end of each diode 3 is connected to the horizontal electric wire 2 near each intersection. 1
Further, multiplexers 4a and 4b for switching and supplying electric signals to the vertical electric wire 1 and the horizontal electric wire 2 are provided at one end of each of the horizontal electric wires 2.
【0006】[0006]
【作用】本発明の多点温度測定回路では、図1の定電流
電源5からの電流を、マルチプレクサ4a、4bを介し
てダイオード3に印加すると、両マルチプレクサ4a、
4bに接続されている縦電線1と横電線2の交点におけ
るダイオード3(図1では3x)に電流が流れる。その
とき、そのダイオード3xはそれが設置されている箇所
の温度に応じた電圧降下を生じるので、この電圧を電圧
計6で測定することにより同ダイオード3が設置されて
いる箇所(測定点)の温度を測定することができる。In the multipoint temperature measuring circuit of the present invention, when the current from the constant current power source 5 shown in FIG. 1 is applied to the diode 3 via the multiplexers 4a and 4b, both multiplexers 4a,
A current flows through the diode 3 (3x in FIG. 1) at the intersection of the vertical electric wire 1 and the horizontal electric wire 2 connected to 4b. At that time, the diode 3x causes a voltage drop according to the temperature of the place where the diode 3x is installed. Therefore, by measuring this voltage with the voltmeter 6, the diode 3x can be measured at the place (measurement point) where the diode 3 is installed. The temperature can be measured.
【0007】[0007]
【実施例】本発明の多点温度測定回路の一実施例として
16箇所の測定点の温度を測定する場合の回路構成につ
いて図1に基づいて説明する。図1において3は温度測
定用のダイオードであり、これらは+極側のマルチプレ
クサ4aから分岐された4本の縦電線1a,1b,1
c,1dと、−極側のマルチプレクサ4bから分岐され
た4本の横電線2a,2b,2c,2dの16交点に配
置され、夫々のダイオ−ド3の+極側の一端7が縦線
に、−極側の一端8が横線に夫々接続されている。+極
側のマルチプレクサ4a及び−極側のマルチプレクサ4
bは、マルチプレクサ制御回路9からの指令信号に応じ
て可動接点が所定の縦電線1c、横電線2cを選択し、
選択された縦電線1cと横電線2cに、定電流電源5か
らの電流を供給するものである。選択された縦電線1
c、横電線2cの交点に接続されているダイオード3
(温度に応じて電圧降下を生じている)を電圧計6で測
定できるようにしてある。本実施例の場合、図1から明
らかなように、16個のダイオード3に電流を印加する
のに必要とする縦電線1と横電線2の数は8本であり、
マルチプレクサを用いない従来の回路では最低限17本
の電線が必要であったのに比べて大幅に電線数が減少す
る。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS As an embodiment of the multipoint temperature measuring circuit of the present invention, a circuit configuration for measuring temperatures at 16 measuring points will be described with reference to FIG. In FIG. 1, 3 is a diode for measuring temperature, and these are four vertical electric wires 1a, 1b, 1 branched from the multiplexer 4a on the + pole side.
c, 1d and four horizontal wires 2a, 2b, 2c, 2d branched from the multiplexer 4b on the minus side are arranged at 16 intersections, and one end 7 on the plus side of each diode 3 is a vertical line. In addition, one end 8 on the minus side is connected to the horizontal line, respectively. Multiplexer 4a on the + pole side and multiplexer 4 on the − pole side
In b, the movable contact selects a predetermined vertical electric wire 1c or horizontal electric wire 2c according to a command signal from the multiplexer control circuit 9,
The current from the constant current power source 5 is supplied to the selected vertical electric wire 1c and horizontal electric wire 2c. Selected vertical wire 1
c, the diode 3 connected to the intersection of the horizontal electric wire 2c
The voltmeter 6 can measure (a voltage drop occurs depending on the temperature). In the case of this embodiment, as is apparent from FIG. 1, the number of vertical electric wires 1 and horizontal electric wires 2 required to apply a current to the 16 diodes 3 is 8,
Compared with the conventional circuit that does not use a multiplexer, which requires a minimum of 17 wires, the number of wires is significantly reduced.
【0008】[0008]
【発明の効果】本発明の多点温度測定回路は、多くの測
定点で温度測定を行う場合でも電線数Hは、測定点の総
数NとしてH=2×N1/2 +2(この2本は定電流電源
5と2台のマルチプレクサとの間を結ぶ配線と、マルチ
プレクサ間を結ぶ2本)になる。ただしHが整数以外の
場合は小数点第1桁を切り上げる。従来最低でも(N+
1)本必要であったのに比べて大幅に低減できるという
効果がある。According to the multipoint temperature measuring circuit of the present invention, the number H of electric wires is H = 2 × N 1/2 +2 (these two wires are used as the total number N of measuring points even when temperature is measured at many measuring points). Is a wire connecting the constant current power source 5 and the two multiplexers, and two wires connecting the multiplexers. However, when H is not an integer, the first decimal point is rounded up. Conventionally at least (N +
1) There is an effect that it can be significantly reduced as compared with the case where the book is necessary.
【図1】本発明の多点温度測定用回路の一実施例を示す
回路図。FIG. 1 is a circuit diagram showing an embodiment of a multipoint temperature measurement circuit of the present invention.
1 縦電線 2 横電線 3 ダイオード 4 マルチプレクサ 1 Vertical wire 2 Horizontal wire 3 Diode 4 Multiplexer
Claims (1)
配線し、両電線1、2の夫々の交点の近くの縦電線1に
複数の温度測定用ダイオード3の一端を、夫々の交点の
近くの横電線2に夫々のダイオード3の他端を接続し、
縦電線1と横電線2の夫々の一端に夫々の縦電線1、横
電線2へ電気信号を切替え供給するマルチプレクサ4
a、4bを設けたことを特徴とする多点温度測定回路。Claims: 1. A plurality of vertical electric wires (1) and horizontal electric wires (2) are arranged in a grid pattern, and a plurality of temperature measuring diodes are provided on the vertical electric wires (1) near the intersections of both electric wires (1,2). Connect one end of 3 to the transverse wire 2 near each intersection and connect the other end of each diode 3 to
A multiplexer 4 for switching and supplying an electric signal to each of the vertical electric wire 1 and the horizontal electric wire 2 at one end of each of the vertical electric wire 1 and the horizontal electric wire 2.
A multi-point temperature measuring circuit characterized in that a and 4b are provided.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20146991A JPH0526739A (en) | 1991-07-16 | 1991-07-16 | Multiple-point temperature-measuring circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20146991A JPH0526739A (en) | 1991-07-16 | 1991-07-16 | Multiple-point temperature-measuring circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0526739A true JPH0526739A (en) | 1993-02-02 |
Family
ID=16441603
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20146991A Pending JPH0526739A (en) | 1991-07-16 | 1991-07-16 | Multiple-point temperature-measuring circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0526739A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006019578A1 (en) * | 2006-04-27 | 2007-10-31 | Abb Patent Gmbh | Gas or air temperature measurement device for use in low-voltage switching cabinet, has several temperature sensors that are fixed to places, which are arranged in matrix-shape, in evenly distributed manner and arranged above housing |
DE102009012500A1 (en) | 2009-03-12 | 2010-09-23 | Högenauer-Lego, Martin | System for measuring and/or regulating heat flows in e.g. vehicle components, has diode temperature sensors, where two of sensors are assigned to each other such that local heat flow flowing in region of sensor pairs is determinable |
JP2011237410A (en) * | 2010-05-03 | 2011-11-24 | Sharp Corp | Array element for temperature sensor array circuit, temperature sensor array circuit using array element, and am-ewod device including temperature sensor array circuit |
DE102014016068A1 (en) * | 2014-10-27 | 2016-04-28 | Bartec Gmbh | Device for monitoring the temperature of electrical / electronic components in hazardous areas |
EP4180781A1 (en) | 2021-11-16 | 2023-05-17 | Samsung SDI Co., Ltd. | A temperature measurement arrangement for a battery system and a temperature measurement method |
-
1991
- 1991-07-16 JP JP20146991A patent/JPH0526739A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006019578A1 (en) * | 2006-04-27 | 2007-10-31 | Abb Patent Gmbh | Gas or air temperature measurement device for use in low-voltage switching cabinet, has several temperature sensors that are fixed to places, which are arranged in matrix-shape, in evenly distributed manner and arranged above housing |
US8262285B2 (en) | 2006-04-27 | 2012-09-11 | Abb Ag | Device for measuring gas or air temperature in a casing box |
DE102009012500A1 (en) | 2009-03-12 | 2010-09-23 | Högenauer-Lego, Martin | System for measuring and/or regulating heat flows in e.g. vehicle components, has diode temperature sensors, where two of sensors are assigned to each other such that local heat flow flowing in region of sensor pairs is determinable |
DE102009012500B4 (en) * | 2009-03-12 | 2011-12-01 | Martin Högenauer-Lego | Heat flow sensor matrix and device for planar heating and / or cooling |
JP2011237410A (en) * | 2010-05-03 | 2011-11-24 | Sharp Corp | Array element for temperature sensor array circuit, temperature sensor array circuit using array element, and am-ewod device including temperature sensor array circuit |
DE102014016068A1 (en) * | 2014-10-27 | 2016-04-28 | Bartec Gmbh | Device for monitoring the temperature of electrical / electronic components in hazardous areas |
EP4180781A1 (en) | 2021-11-16 | 2023-05-17 | Samsung SDI Co., Ltd. | A temperature measurement arrangement for a battery system and a temperature measurement method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR890000880A (en) | Detector using the rotating element | |
JPH08211138A (en) | Device for measuring current using sensor chip and sensor | |
JPH0472195B2 (en) | ||
ATE122468T1 (en) | MEANS FOR OHMIC FAULT LOCATION AND DEVICE FOR USE IN CABLES. | |
JP4833766B2 (en) | measuring device | |
JPH0526739A (en) | Multiple-point temperature-measuring circuit | |
CN218546797U (en) | Kelvin four-wire test system realized through internal circuit of switch matrix | |
JPH0318765A (en) | Clamp ammeter | |
CN209446648U (en) | The current measuring device of copper bar type conducting wire | |
JPH10123189A (en) | Measurement method and device for resistance value | |
JP3276376B2 (en) | How to measure the resistance of a resistor | |
JPH04340477A (en) | Measuring apparatus for multiple resistance | |
JPH0339989A (en) | Method for inspecting defect of transparent conductive circuit substrate | |
KR20120124580A (en) | Insulation multimeter device | |
SU134140A1 (en) | Method of measuring stresses in aircraft propellers with coaxial switching scheme | |
JPH0611509Y2 (en) | Matrix switch circuit | |
JPH076540Y2 (en) | Circuit operation test equipment | |
JPH0140255Y2 (en) | ||
SU1627817A1 (en) | Method for measuring angle between intercrossing lines of object | |
JP2001135537A (en) | Electric signal transmitting device | |
JPH0622225Y2 (en) | Heater energization monitoring device | |
US2890412A (en) | Method of calibrating an electrical instrument | |
JPH0519819Y2 (en) | ||
JPH0422306Y2 (en) | ||
JPH02106120A (en) | Overcurrent detector |