JPH05203568A - Method of analyzing various material, especially liquid - Google Patents

Abstract

PURPOSE: To obtain a real time high data quantity by calculating the magnitude of the deflection, scattering and permeation of a photometer average value by using the respective intensity values depending on the position in the polarizing direction of laser beam and the measuring width in the polarizing direction. CONSTITUTION: The deflection of laser beam formed in a differential cuvette is measured and respective position dependence intensity value Ai in the deflection direction are calculated as follows. With respect to the accuracy thereof, the sum total value of the respective measuring intensity values Ai is formed to calculate synthetic intensity S and S/t in respective partial intensity S/2 and t>2 is calculated as an upper limit value. Next, starting from i=1 from the intensity value Ai, an addition part sum total value(h -1) and S( K-1) are formed. Then, the calculated respective intensity value Ai and the measuring width (b) in a deflection direction of respective dimension substantializing means characterizing position dependence are used and deflection M as a luminous intensity average value can be calculated by formula I and the magnitude Wt of scattering can be calculated by formula II and the magnitude T of permeation can be calculated by formula III. In the formula III, SO is the sum total of the total intensity value Ai of a reference substance.

Description

Detailed Description of the Invention

[0001]

FIELD OF THE INVENTION The present invention relates to a method for analyzing various substances, in particular liquids, in which the deflection of a light beam is measured in a differential cuvette on the basis of a concentration-dependent refractive index.

This method can be used, inter alia, when turbidity and / or changes in light transmission due to contaminant particles occur while the sample is flowing through the differential cuvette.

[0003]

2. Description of the Prior Art In order to obtain a high measurement accuracy in refractive index measurement and to be free from the influence of external obstacles, it is preferable to operate on the principle of light deflection in a differential cuvette. Device is used. This differential cuvette is filled on the one hand with the sample and on the other hand with the reference liquid.

Such refractometers based on the principle of light deflection almost always use, for example, two photodetectors for detection, or only one photodetector which receives the modulated light. A special method for compensating for optical deflection is used. Position-sensitive photodetectors are better suited for measuring such light deflections. It has been shown that, in addition to determining the position by comparing the amplitude values under certain preconditions, it is possible to measure the transmittance and to measure the scattered light using the widening of its analytical signal.

In order to be able to resolve beyond each digital pixel step, the known method requires at least two recall cycles for each parameter. The resulting large number of paging cycles requires a relatively long time, during which the rapidly flowing sample may have already changed. A measurement error results because the actual measurement parameter is no longer detected.

[0006]

SUMMARY OF THE INVENTION The object of the invention is to keep the number of call cycles for the measurement acquisition necessary for high resolution small, even when the number of parameters to be measured is large. , To get an increased amount of information, in real time, about the flowing sample.

[0007]

SUMMARY OF THE INVENTION The above problems are in accordance with the present invention.
Produced in a differential cuvette of a light beam
By measuring the deflection, it is possible to separate various substances, especially liquids.
Each intensity depending on the position in the direction of deflection when analyzing
Value A_i  In two successive stages,
In the first step, the accuracy of each measurement
Strength value A_iTotal strength by creating the total value of
S for each partial strength S / 2 and t> 2
Solved by the method of obtaining each S / t as the upper limit
To be done. In the second stage, each position-dependent strength value
A_i  Starting from i = 1, the added parts
Create minute sums S (h-1) and S (k-1),
At this time, the position specification index i = h for these
And i = k is each dependent intensity value A_h  And A_k  But those additions
The calculated partial sum values S (h-1) and S (k-1) are
To increase beyond the respective limit values S / t and S / 2
Is set to. Each strength obtained in both stages above
Degree value and each dimension materialization means that characterizes the position dependence
, The width b measured in the direction of deflection, and a photometric average
Each deflection M as a value

[Equation 4]Due to the size of the scattering W_t  But

[Equation 5] And the magnitude of transmission T

[Equation 6]Is determined by the
All intensity values A_i  Represents the total of.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the accompanying drawings.
Will be described in detail. In the embodiment of the invention of FIG. 1,
Subsequent to the light source 1, the condenser lens is inserted in the optical path OO.
2, entrance slit 3, objective lens 4, differential cuvet
The mirror 5 and the reflecting mirror 5 are arranged. Differential cuvette
The beam of light passing through 5 is almost reflected by the reflecting mirror 6
Reflected in a direction, which causes the beam of light to have a differential cue.
Bet 5 was passed twice, and the slit image shows the incident slip.
An image is formed near the dot 3. In the reflected beam of light
A reflecting mirror 7 is provided at the position of the slit image to select a position.
It provides a deflection towards the selectively operating detector 8. 9 is
For amplification of each signal, their evaluation and display of results
Indicates a device that can be used. The optical flux is used to detect the reference signal.
Fiber 10 Is provided and the entrance opening of this one is
It is located near the slit 3 and its exit is open.
The mouth is a detector 11 associated with the device 9 above. Be guided to
ing.

FIG. 2 shows each of the detectors which operate in a position-selective manner.
Intensity value A measured by the pixel_i  Change the deflection direction of
Is shown. It is used as a means to materialize the size of the position.
Each pixel shown is numbered in order. Index
The line i (i = 1, 2, ..., Z) represents this. In addition, each
The pixel has an end width b in the expected deflection direction of the light beam.
Have

FIG. 3 shows the resolution for each individual pixel.
It shows the change curve 1 of the intensity value, but this is for each part
Strength value A_i  From S = S (z) imaged as a sum from
Including. Area 2 is the partial intensity value S / 2, and Area 3 is
The partial intensity value S / at t> 2, that is, at t = 8, for example.
represents t. The positions h and k represented by the pixel
Corresponds to the partial intensity values S / 2 and S / t of the following formulas S (h-1) ≤S / t <S (h) and S (k-1) ≤S / 2 <S (k). .. S (h
-1), S (k-1), S (h) and S (k) are respectively
Starting from 1 and forming up to each pixel
Each partial strength value A_i  Is the partial sum of.

The deflection of the light beam, which characterizes the change in the refractive index, and the determination of the scattering and transmission magnitudes are given by the equations given above.

[0012]

According to the present invention, the number of calling cycles for grasping the measured value can be kept small even when the number of parameters to be measured is large, so that a high amount of information in real time can be obtained.

[Brief description of drawings]

FIG. 1 is an illustration of one embodiment of an apparatus for carrying out the method of the present invention.

FIG. 2 is a diagram showing changes in measured intensity values for each pixel.

FIG. 3 is a diagram showing the course of light intensity for a series of pixel rows.

[Explanation of symbols]

 2 Condenser lens 3 Entrance slit 4 Objective lens 5 Differential cuvette 6 Reflector 7 Reflector 8 Detector 9 Amplification, evaluation and display device 10 Optical fiber 11 Detector

Claims (4)

[Claims] 1. A light beam produced in a differential cuvette.
In various substances, by measuring the emitted deflection
Also in the method of analyzing a liquid, each intensity value A depending on the position in the direction of its deflection_i  Seeking
At that time, in the first stage, the accuracy of each measurement
Strength value A_i  By creating the total value of
The degree value S, and now also the partial intensity values S / 2 and t> 2
The partial strength value S / t in each is calculated as the upper limit value.
In the second stage, each position-dependent strength value A_i  From
The added partial total values S (h-1) and S (k-1)
Create a location index for these
I = h and i = k are dependent intensity values A_h  And A_k  But
The partial sum values S (h-1) and S (k-
1) is higher than the respective limit values S / t and S / 2.
Are set so that each intensity value obtained in both of the above steps and the position
Measure in the direction of deflection of each dimension materialization means that characterizes existence.
Each deflection as a photometric average value using
M, size of scattering W_t  And the size of the transmission T can be determined.
And a method characterized by. 2. A photometric average value M is given by: The method of claim 1 determined according to. 3. The magnitude of scattering W_t  [Equation 2]The method of claim 1 determined according to. 4. The transmission magnitude T is expressed byAccording to a certain reference substance
All intensity values A_i  The method of claim 1, which represents the sum of