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JPH044753U - - Google Patents

Info

Publication number
JPH044753U
JPH044753U JP1990046148U JP4614890U JPH044753U JP H044753 U JPH044753 U JP H044753U JP 1990046148 U JP1990046148 U JP 1990046148U JP 4614890 U JP4614890 U JP 4614890U JP H044753 U JPH044753 U JP H044753U
Authority
JP
Japan
Prior art keywords
pattern
power
ground
hole
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1990046148U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990046148U priority Critical patent/JPH044753U/ja
Publication of JPH044753U publication Critical patent/JPH044753U/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本考案の実施例を示し、
第1図は側断面図、第2図は平面図である。第3
図はTAB方式の半導体装置の一例を示す要部斜
視図、第4図は高周波測定に対応した半導体装置
の側断面図を示す。 3……半導体ペレツト、5……多層配線基板、
6……透孔、7a……接地パターン、7b……電
源パターン、10……導電パターン。
1 and 2 show an embodiment of the present invention,
FIG. 1 is a side sectional view, and FIG. 2 is a plan view. Third
The figure is a perspective view of a main part of an example of a TAB type semiconductor device, and FIG. 4 is a side sectional view of a semiconductor device compatible with high frequency measurement. 3...Semiconductor pellet, 5...Multilayer wiring board,
6... Through hole, 7a... Ground pattern, 7b... Power supply pattern, 10... Conductive pattern.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 透孔を有し層間に接地パターン及び電源パター
ンを形成した多層配線基板の表面に、上記接地パ
ターンと接続された接地ライン、電源パターンと
接続された電源ライン、マイクロストリツプライ
ンを含む信号ラインをそれぞれ構成する導電パタ
ーンをその一端を透孔内に延在させて形成し、透
孔内に配置した半導体ペレツトの電極と導電パタ
ーンとを接続したことを特徴とする半導体装置。
A signal line including a ground line connected to the ground pattern, a power line connected to the power pattern, and a microstrip line is provided on the surface of a multilayer wiring board that has through holes and has a ground pattern and a power pattern formed between the layers. 1. A semiconductor device characterized in that each of the conductive patterns is formed by extending one end thereof into a through hole, and the conductive pattern is connected to an electrode of a semiconductor pellet placed in the through hole.
JP1990046148U 1990-04-26 1990-04-26 Pending JPH044753U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990046148U JPH044753U (en) 1990-04-26 1990-04-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990046148U JPH044753U (en) 1990-04-26 1990-04-26

Publications (1)

Publication Number Publication Date
JPH044753U true JPH044753U (en) 1992-01-16

Family

ID=31560972

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990046148U Pending JPH044753U (en) 1990-04-26 1990-04-26

Country Status (1)

Country Link
JP (1) JPH044753U (en)

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