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JPH0425149A - Irradiation method of ultraviolet ray - Google Patents

Irradiation method of ultraviolet ray

Info

Publication number
JPH0425149A
JPH0425149A JP2129840A JP12984090A JPH0425149A JP H0425149 A JPH0425149 A JP H0425149A JP 2129840 A JP2129840 A JP 2129840A JP 12984090 A JP12984090 A JP 12984090A JP H0425149 A JPH0425149 A JP H0425149A
Authority
JP
Japan
Prior art keywords
wafer
ultraviolet
film
ultraviolet irradiation
ultraviolet rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2129840A
Other languages
Japanese (ja)
Other versions
JP3169952B2 (en
Inventor
Minoru Ametani
雨谷 稔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP12984090A priority Critical patent/JP3169952B2/en
Publication of JPH0425149A publication Critical patent/JPH0425149A/en
Application granted granted Critical
Publication of JP3169952B2 publication Critical patent/JP3169952B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To enable a UV lamp smaller than a wafer in diameter to irradiate all the surface of the wafer with ultraviolet rays by a method wherein the wafer or ultraviolet rays are rotated as the UV lamp of an ultraviolet irradiation device is provided eccentric to the wafer. CONSTITUTION:An ultraviolet irradiator 14 is provided eccentric to a wafer 1 on which an ultraviolet curing adhesive agent film 2 is pasted, and the wafer 1 or the ultraviolet irradiator 14 is made to rotate. For instance, the length of the lamp 14 is slightly larger than the diameter of the wafer 1, a vertical center line a of rotation of a support table 3 is made to extend passing through the edge of the lamp 14, ultraviolet rays are made to irradiate the wafer 1 covering it from its center to its periphery, and the support table 3 sucking the wafer 1 is made to start rotating at the same time when ultraviolet rays are made to start radiating. By this setup, a large wafer can be uniformly irradiated with UV rays by the use of a small device, and the film 2 can be separated off without inducing cracks or chips in the wafer.

Description

【発明の詳細な説明】 (産業上の利用分野〕 この発明は集積回路などの製造用ウェハなどに貼着した
フィルムに紫外線(以下UV光と称する)を照射する装
置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to an apparatus for irradiating ultraviolet light (hereinafter referred to as UV light) onto a film attached to a wafer for manufacturing integrated circuits or the like.

〔従来の技術〕[Conventional technology]

集積回路などの電子回路用チップなどの製造工程中にお
いて、半導体ウェハの表面にトランジス夕、グイオート
などの回路を構成したのち、各素子に切断するが、その
切断工程の前に中抜き円板状のリングフレームと、回路
を構成した半導体ウェハとを接着剤層を存するフィルム
に貼り付けてウェハを固定する作業と、切断装置でウェ
ハを切断して小片の素子とし、この素子をエアピンセッ
トあるいはコレットチャックで、フィルムから剥離して
取出す作業とがある。
During the manufacturing process of chips for electronic circuits such as integrated circuits, circuits such as transistors and circuits are formed on the surface of a semiconductor wafer and then cut into individual elements. The process involves fixing the wafer by pasting the ring frame and the semiconductor wafer with the circuit on a film with an adhesive layer, cutting the wafer into small pieces using a cutting device, and cutting the wafer into small pieces using air tweezers or collets. There is a process of peeling it off from the film using a chuck and taking it out.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記の二つの作業におけるウェハの切断分離の作業中に
おいては、ウェハはフィルム上に強く接着しておく必要
があり、切断後、小片となった各素子を取出す際にはこ
の素子がフィルムから容易に剥離できる状態となってい
る必要がある。
During the cutting and separation of the wafer in the above two operations, the wafer must be strongly adhered to the film, and after cutting, when removing each element that has become a small piece, the element can be easily removed from the film. It must be in a state where it can be peeled off.

また、ウェハに回路を形成したのちに、その裏面を研磨
する工程において、回路形成面を保護する目的で、ウェ
ハの回路形成面にフィルムを接着し、作業後溶液中に浸
し、その後フィルムを剥離する場合もあるが、この場合
も研磨中ばウェハにフィルムが強く接着している必要が
あり、研磨後ば簡単に剥離できなければ、剥離時にウェ
ハに割れや欠けが生ずるという問題がある。
In addition, in the process of polishing the back side of a wafer after circuits are formed, a film is attached to the circuit-forming surface of the wafer in order to protect the circuit-forming surface, immersed in a solution after the process, and then the film is peeled off. However, in this case as well, the film needs to be strongly adhered to the wafer during polishing, and if it cannot be easily peeled off after polishing, there is a problem that the wafer will crack or chip when peeled off.

このような矛盾した問題を解決するため、最初は接着力
が強く、UV光を照射すると、三次元網状化して接着力
が低下するという性質の接着剤層を有するフィルムが用
いられているが、このUV光の照射用ランプはその大き
さに限界(長さ約100mm以下)があるため、大型の
ウェハ(直径約200mm以上)の全面に万遍なくUV
光を照射するためには複数のランプが必要となり、発熱
量も大きいので装置が大型化しエネルギーの消費量も大
となるなどの問題がある。
In order to solve these contradictory problems, films are used that have an adhesive layer that initially has strong adhesive strength, but when irradiated with UV light, the adhesive layer forms a three-dimensional network and the adhesive strength decreases. Since this UV light irradiation lamp has a size limit (length approximately 100 mm or less), UV light is applied evenly to the entire surface of a large wafer (diameter approximately 200 mm or more).
Multiple lamps are required to irradiate light, and the amount of heat generated is large, resulting in problems such as an increase in the size of the device and a large amount of energy consumption.

この発明の課題は上記の問題点を解決して、小型の装置
を用いて大型のウェハにもUV光を均一に照射できる紫
外線照射方法を提供するごとである。
An object of the present invention is to solve the above-mentioned problems and provide an ultraviolet irradiation method that can uniformly irradiate large wafers with UV light using a small device.

〔課題を解決するための手段〕[Means to solve the problem]

上記の課題を解決するために、この発明は紫外線を照射
することにより、接着力が低下する性質の感圧接着剤層
を有するフィルムを電子回路形成用のウェハに貼着して
裏面研削などの作業後溶液中に浸し、その後剥離する工
程において、ウェハ表面に紫外線硬化型の粘着フィルム
を貼り、必要な保護機能を利用したのち、紫外線を照射
する方法を提供する。
In order to solve the above-mentioned problems, the present invention has been developed by attaching a film having a pressure-sensitive adhesive layer whose adhesive strength is reduced by irradiation with ultraviolet rays to a wafer for forming electronic circuits, and performing back grinding etc. The present invention provides a method in which an ultraviolet curable adhesive film is attached to the wafer surface in the process of immersing the wafer in a solution after work and then peeling it off, and after utilizing the necessary protection function, the wafer is irradiated with ultraviolet rays.

また、紫外線を照射することにより、接着力が低下する
性質の感圧接着剤層を存するフィルムを電子回路形成用
のウェハに貼着して所望の加工を施す加工工程において
、フィルムを貼着したウェハに対して紫外線照射装置を
偏心させて配置し、ウェハまたは紫外線照射装置を旋回
させることにより、ウェハの所望の範囲に亘って紫外線
を照射する方法も提供する。
In addition, in the processing process in which a film containing a pressure-sensitive adhesive layer whose adhesive strength decreases when irradiated with ultraviolet light is applied to a wafer for forming electronic circuits and subjected to desired processing, the film is attached. The present invention also provides a method of irradiating a desired range of a wafer with ultraviolet rays by arranging the ultraviolet ray irradiation device eccentrically with respect to the wafer and rotating the wafer or the ultraviolet irradiation device.

さらに、紫外線を照射することにより、接着力か低下す
る性質の感圧接着剤層を有するフィルムを電子回路形成
用のウェハに貼着して所望の加工を施す加工工程におい
て、フィルムを貼着したウェハに対して紫外線照射装置
を偏心させて配置するとともにウェハと紫外線照射装置
の間にウェハの中心側が短くなった扇形の開口を有する
マスクを設け、この開口を通してウェハに紫外線を照射
しながらウェハを旋回させて紫外線照射装置とマスクを
静止させるか、紫外線照射装置をマスクとともに旋回さ
せてウェハを静止させることによりウェハの中心から周
縁に均一な紫外線照射を行う方法も提供する。
Furthermore, in a processing process in which a film with a pressure-sensitive adhesive layer whose adhesive strength decreases when irradiated with ultraviolet light is applied to a wafer for forming electronic circuits and subjected to desired processing, the film is attached. The ultraviolet irradiation device is arranged eccentrically with respect to the wafer, and a mask having a sector-shaped opening with the center side of the wafer shortened is provided between the wafer and the ultraviolet irradiation device, and the wafer is irradiated with ultraviolet rays through this opening. Also provided is a method of uniformly irradiating the wafer with ultraviolet light from the center to the periphery by rotating the ultraviolet irradiation device and the mask to make it stand still, or by rotating the ultraviolet irradiation device together with the mask to make the wafer stationary.

〔作用〕[Effect]

まず、紫外線を照射することにより、硬化して接着力が
低下する性質の感圧接着剤層を有するフィルムを電子回
路形成用の半導体ウェハに貼着する。
First, a film having a pressure-sensitive adhesive layer whose adhesive strength is reduced by curing by irradiation with ultraviolet rays is attached to a semiconductor wafer for forming an electronic circuit.

つぎにウェハに裏面研削などの作業を施したのち、この
ウェハを溶液中に浸し、そののちフィルムを剥離する。
Next, the wafer is subjected to operations such as back grinding, then immersed in a solution, and then the film is peeled off.

また、フィルムを貼着したウェハに対して紫外線照射装
置を偏心させて配置した場合はウェハまたは紫外線照射
装置を旋回させることにより、ウェハの所望の範囲に亘
って紫外線を照射させる。
Further, when the ultraviolet irradiation device is arranged eccentrically with respect to the wafer to which the film is attached, the wafer or the ultraviolet irradiation device is rotated to irradiate the ultraviolet rays over a desired range of the wafer.

さらに、ウェハと紫外線照射装置の間にウェハの中心側
が狭くなった扇形の開口を有するマスクを設りたもので
は、ごの開口を通してウェハに紫外線を照射しながらウ
ェハを旋回させて紫外線照射装置とマスクを静止させる
か、紫外線照射装置をマスクとともに旋回させてウェハ
を静止させるごとによりウェハの中心から周縁に均一な
紫外線照射が行える。
Furthermore, if a mask is installed between the wafer and the ultraviolet irradiation device with a fan-shaped opening that is narrower toward the center of the wafer, the wafer is rotated while irradiating the wafer with ultraviolet light through the opening. Uniform ultraviolet irradiation can be performed from the center to the periphery of the wafer by keeping the mask stationary or by rotating the ultraviolet irradiation device together with the mask to make the wafer stationary.

〔実施例〕〔Example〕

第1図に示す実施例において、1は電子回路形成用のシ
リコンウェハで、その−ヒにUV光の照射により三次元
網状化して接着力を低下する感圧性接着剤層すなわち、
粘着層を有する粘着フィルム2が貼付されている。
In the embodiment shown in FIG. 1, 1 is a silicon wafer for forming an electronic circuit, on which is a pressure-sensitive adhesive layer that becomes three-dimensionally reticulated by irradiation with UV light and reduces adhesive strength, that is,
An adhesive film 2 having an adhesive layer is attached.

上記ウェハ1は何等かの搬送手段により支持台3」二に
送られ、この台3上に真空吸引などにより同心状に吸着
固定される。
The wafer 1 is conveyed to a support table 3'2 by some transport means, and concentrically suctioned and fixed onto this table 3 by vacuum suction or the like.

また、−1−記支持台3は適宜駆動手段により旋回およ
び昇降自在となっている。
Moreover, the support stand 3 described in -1- can be rotated and moved up and down by appropriate driving means.

4はケースでその底部の開口5には左右に開閉する一対
のワークシャッタ6が設りである。
Reference numeral 4 denotes a case, and an opening 5 at the bottom thereof is provided with a pair of work shutters 6 that open and close from side to side.

7はケース4内の中間部に固定した仕切板でその中央は
ガラス板からなるコバルトフィルタ10となっている。
Reference numeral 7 denotes a partition plate fixed to the middle part of the case 4, and the center thereof is a cobalt filter 10 made of a glass plate.

上記フィルタ10の上には開口9を有するエリヤマスク
11を固定し、さらにその」二には矢印方向に進退する
シャック12を設ける。
An area mask 11 having an opening 9 is fixed on top of the filter 10, and a shack 12 that moves forward and backward in the direction of the arrow is provided at the second part of the area mask 11.

13はケース4上に設けたランプハウスでその内部にU
Vランプ14を固定し、上部には排気ファン15が設け
である。
13 is a lamp house installed on case 4, and there is a U inside.
A V lamp 14 is fixed, and an exhaust fan 15 is provided at the top.

上記ランプ14は細長いもので、その長さはウェハ1の
半径よりも若干長いものである。
The lamp 14 is elongated, and its length is slightly longer than the radius of the wafer 1.

また、支持台3の垂直の回転中心線aがランプ14の端
部に若干かかり、UV光がウェハ1の中心から周縁に達
するようにしている。
Further, the vertical rotational center line a of the support base 3 slightly extends over the end of the lamp 14, so that the UV light reaches the periphery from the center of the wafer 1.

いまフィルム2を貼付したウェハ1がケース4の下方で
支持台3に吸着された条件で、ワークシャッタ6が開き
、支持台3が上昇してウェハ1を開口5からケース4内
に入れる。
Under the condition that the wafer 1 to which the film 2 has been pasted is attracted to the support stand 3 below the case 4, the work shutter 6 is opened, the support stand 3 is raised, and the wafer 1 is placed into the case 4 through the opening 5.

つぎにシャック12が開くと同時にUVランプ14が点
灯し、UV光がエリヤマスク11の開口9およびコバル
トフィルタ10を経てウェハ1上のフィルム2に照射さ
れる。
Next, at the same time as the shack 12 is opened, the UV lamp 14 is turned on, and UV light is irradiated onto the film 2 on the wafer 1 through the opening 9 of the area mask 11 and the cobalt filter 10.

一方、上記のようにUV光の照射が始まると同時に支持
台3が回転を始めるので、UV光はウェハ1」二のフィ
ルム2の全面に照射される。
On the other hand, since the support base 3 starts rotating at the same time as the UV light irradiation starts as described above, the entire surface of the film 2 of the wafer 1'' is irradiated with the UV light.

照射が終るとシャンク12が閉じランプ14は消灯され
、支持台3の回転が止り、かつ下降してウェハ1をケー
ス4の下方とし、ワークシャッタ6が閉しる。
When the irradiation is completed, the shank 12 is closed, the lamp 14 is turned off, the support table 3 stops rotating, and is lowered to place the wafer 1 below the case 4, and the work shutter 6 is closed.

上記の作用において、エリヤマスク11の開口9を第2
図のように矩形にすると、ウェハ1の円の中心部ばUV
光で連続的に照射されるので中心に近づく程露光時間が
長くなる。
In the above operation, the opening 9 of the area mask 11 is
If it is made into a rectangle as shown in the figure, the center of the circle of wafer 1 will be exposed to UV light.
Since it is continuously irradiated with light, the closer you get to the center, the longer the exposure time becomes.

従って、フィルム2に対するUV光の照射量が中心に近
づく程多くなるが、これを防止するためには第3図のよ
うに開口9が回転中心に近づく程狭くなる扇形にする。
Therefore, the amount of UV light irradiated onto the film 2 increases as the film 2 approaches the center, but in order to prevent this, the aperture 9 is formed into a fan shape that becomes narrower as it approaches the center of rotation, as shown in FIG.

また、第4図、第5図のように回転中心部に円形の開口
16を設けてこれを開口Sと連続させ、−1−記聞口1
6にUVの透過率を低下させるガラスなどのフィルタ1
7を組み込んでUV光の照射量をウェハ1の全域に亘っ
て均一にする場合もある。
In addition, as shown in FIGS. 4 and 5, a circular opening 16 is provided at the center of rotation, and this is continuous with the opening S.
6. Filter 1 such as glass that reduces UV transmittance.
7 may be incorporated to make the amount of UV light irradiated uniform over the entire area of the wafer 1.

なお、実施例ばUVランプ14を一本用いた場合を示し
ているがランプ14を2本以上用いる場合もある。
Although the embodiment shows a case where one UV lamp 14 is used, two or more lamps 14 may be used.

この場合は、各ランプ14を回転中心から半径方向に位
置を違わせて配置するとよい。
In this case, the lamps 14 may be arranged at different positions in the radial direction from the center of rotation.

また、ウェハを回転させるかわりにUVランプ14を回
転させることもでき、この場合はエリヤマスク11もラ
ンプ14とともに回転させる。
Further, instead of rotating the wafer, the UV lamp 14 can be rotated, and in this case, the area mask 11 is also rotated together with the lamp 14.

〔発明の効果〕〔Effect of the invention〕

この発明は上記のように紫外線を照射することにより、
接着力が低下する性質の感圧接着剤層を有するフィルム
を電子回路形成用のウェハに貼着して裏面研削などの作
業後溶液中に浸し、その後剥離する工程において、ウェ
ハ表面に紫外線硬化型の粘着フィルムを貼り、必要な保
護機能を利用したのち、紫外線を照射することにより、
粘着フィルムの剥離が容易になるものであるが、特に、
この発明では紫外線照射装置のtJ Vランプをウェハ
の中心に対して偏心させて配置し、ウェハまたは紫外線
照射を旋回させることにより、ウェハの所望の範囲に亘
って紫外線を照射することによりウェハの直径より短か
いUVランプによりウェハの全面にUV光を照射できる
。従って紫外線照射装置の発熱量が小さくなり、IJ+
気ファンも小形にできるので装置全体を小型とすること
ができる。
In this invention, by irradiating ultraviolet rays as described above,
In the process of attaching a film with a pressure-sensitive adhesive layer that reduces adhesive strength to a wafer for forming electronic circuits, immersing it in a solution after operations such as back grinding, and then peeling it off, UV-curable adhesive is applied to the wafer surface. After applying the adhesive film and utilizing the necessary protection function, by irradiating it with ultraviolet rays,
This makes it easier to peel off the adhesive film, especially
In this invention, the tJV lamp of the ultraviolet irradiation device is arranged eccentrically with respect to the center of the wafer, and by rotating the wafer or the ultraviolet irradiation, the ultraviolet rays are irradiated over a desired range of the wafer, thereby reducing the diameter of the wafer. With a shorter UV lamp, the entire surface of the wafer can be irradiated with UV light. Therefore, the amount of heat generated by the ultraviolet irradiation device becomes smaller, and IJ+
Since the air fan can also be made smaller, the entire device can be made smaller.

また、ウェハと紫外線照射装置の間にウェハの中心側が
短くなった扇形の開口を有するマスクを設けた場合はウ
ェハの全面に均一にUV光を当てることができる。
Furthermore, if a mask having a fan-shaped opening with a shorter center side of the wafer is provided between the wafer and the ultraviolet irradiation device, the entire surface of the wafer can be uniformly irradiated with UV light.

従って、ウェハの中心部にUV光が当りすぎることを避
ける必要のある場合に有効である。
Therefore, it is effective when it is necessary to prevent UV light from hitting the center of the wafer too much.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の実施例を示す縦断正面図、第2図乃
至第4図は同上のエリヤマスクの各側を示す一部切欠平
面図、第5図は第411iJIV−TV線の断面図であ
る。 1・・・・・・シリコンウェハ、2・・・・・・貼着フ
ィルム、9・・・・・・開口、      11・・・
・・・エリヤマスク、14・・・・・・LJVランプ、
  16・・・・・・開口、17・・・・・・フィルタ
FIG. 1 is a longitudinal sectional front view showing an embodiment of the present invention, FIGS. 2 to 4 are partially cutaway plan views showing each side of the same area mask, and FIG. 5 is a sectional view taken along line 411i JIV-TV. It is. 1... Silicon wafer, 2... Adhesive film, 9... Opening, 11...
... Elijah mask, 14 ... LJV lamp,
16...Aperture, 17...Filter.

Claims (3)

【特許請求の範囲】[Claims] (1)紫外線を照射することにより、接着力が低下する
性質の感圧接着剤層を有するフィルムを電子回路形成用
のウェハに貼着して裏面研削などの作業後溶液中に浸し
、その後剥離する工程において、ウェハ表面に紫外線硬
化型の粘着フィルムを貼り、必要な保護機能を利用した
のち、紫外線を照射することを特徴とする紫外線照射方
法。
(1) A film with a pressure-sensitive adhesive layer whose adhesive strength decreases when irradiated with ultraviolet rays is attached to a wafer for forming electronic circuits, dipped in a solution after back grinding, etc., and then peeled off. An ultraviolet irradiation method characterized by applying ultraviolet curable adhesive film to the wafer surface and irradiating it with ultraviolet rays after applying the necessary protective function.
(2)紫外線を照射することにより、接着力が低下する
性質の感圧接着剤層を有するフィルムを電子回路形成用
のウェハに貼着して所望の加工を施す加工工程において
、フィルムを貼着したウェハに対して紫外線照射装置を
偏心させて配置し、ウェハまたは紫外線照射装置を旋回
させることにより、ウェハの所望の範囲に亘って紫外線
を照射することを特徴とする紫外線照射方法。
(2) In the process of attaching a film with a pressure-sensitive adhesive layer whose adhesive strength decreases when irradiated with ultraviolet rays to a wafer for forming electronic circuits and performing the desired processing, the film is attached. An ultraviolet irradiation method comprising: placing an ultraviolet irradiation device eccentrically with respect to a wafer, and rotating the wafer or the ultraviolet irradiation device to irradiate ultraviolet rays over a desired range of the wafer.
(3)紫外線を照射することにより、接着力が低下する
性質の感圧接着剤層を有するフィルムを電子回路形成用
のウェハに貼着して所望の加工を施す加工工程において
、フィルムを貼着したウェハに対して紫外線照射装置を
偏心させて配置するとともに、ウェハと紫外線照射装置
の間にウェハの中心側が短くなった扇形の開口を有する
マスクを設け、この開口を通してウェハに紫外線を照射
しながらウェハを旋回させて紫外線照射装置とマスクを
静止させるか、紫外線照射装置をマスクとともに旋回さ
せてウェハを静止させることによりウェハの中心から周
縁に均一な紫外線照射を行うことを特徴とする紫外線照
射方法。
(3) In the process of attaching a film with a pressure-sensitive adhesive layer whose adhesive strength decreases when irradiated with ultraviolet rays to a wafer for forming electronic circuits and performing the desired processing, the film is attached. The ultraviolet irradiation device is placed eccentrically with respect to the wafer, and a mask having a sector-shaped opening with the center side of the wafer shortened is provided between the wafer and the ultraviolet irradiation device. An ultraviolet irradiation method characterized by uniformly irradiating ultraviolet rays from the center to the periphery of the wafer by rotating the wafer and keeping the ultraviolet irradiation device and mask stationary, or by rotating the ultraviolet irradiation device together with the mask and keeping the wafer stationary. .
JP12984090A 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus Expired - Lifetime JP3169952B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12984090A JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12984090A JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Publications (2)

Publication Number Publication Date
JPH0425149A true JPH0425149A (en) 1992-01-28
JP3169952B2 JP3169952B2 (en) 2001-05-28

Family

ID=15019538

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12984090A Expired - Lifetime JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Country Status (1)

Country Link
JP (1) JP3169952B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007220905A (en) * 2006-02-16 2007-08-30 Shibuya Kogyo Co Ltd Pickup device of tabular article

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007220905A (en) * 2006-02-16 2007-08-30 Shibuya Kogyo Co Ltd Pickup device of tabular article

Also Published As

Publication number Publication date
JP3169952B2 (en) 2001-05-28

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