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JP3169952B2 - Ultraviolet irradiation method and apparatus - Google Patents

Ultraviolet irradiation method and apparatus

Info

Publication number
JP3169952B2
JP3169952B2 JP12984090A JP12984090A JP3169952B2 JP 3169952 B2 JP3169952 B2 JP 3169952B2 JP 12984090 A JP12984090 A JP 12984090A JP 12984090 A JP12984090 A JP 12984090A JP 3169952 B2 JP3169952 B2 JP 3169952B2
Authority
JP
Japan
Prior art keywords
wafer
ultraviolet irradiation
film
light
ultraviolet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP12984090A
Other languages
Japanese (ja)
Other versions
JPH0425149A (en
Inventor
稔 雨谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP12984090A priority Critical patent/JP3169952B2/en
Publication of JPH0425149A publication Critical patent/JPH0425149A/en
Application granted granted Critical
Publication of JP3169952B2 publication Critical patent/JP3169952B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】[Industrial applications]

この発明は集積回路などの製造用ウエハなどに貼着し
たフィルムに紫外線(以下UV光と称する)を照射する方
法及び装置に関する。
The present invention relates to a method and an apparatus for irradiating a film adhered to a wafer for manufacturing an integrated circuit or the like with ultraviolet rays (hereinafter referred to as UV light).

【0002】[0002]

【従来の技術】[Prior art]

集積回路などの電子回路用チップなどの製造工程中に
おいて、半導体ウエハの表面にトランジスタ、ダイオー
ドなどの回路を構成したのち、各素子に切断するが、そ
の切断工程の前に中抜き円板状のリングフレームと回路
を構成した半導体ウエハとを接着剤層を有するフィルム
に貼り付けてウエハを固定する作業と、切断装置でウエ
ハを切断して小片の素子とし、この素子をエアピンセッ
トあるいはコレットチャックでフィルムから剥離して取
出す作業とがある。
During the manufacturing process of electronic circuit chips such as integrated circuits, circuits such as transistors and diodes are formed on the surface of a semiconductor wafer, and then cut into individual elements. The work of attaching the ring frame and the semiconductor wafer constituting the circuit to a film having an adhesive layer to fix the wafer, and cutting the wafer with a cutting device into small-piece elements, and using a piece of air tweezers or a collet chuck for the elements. There is a work to peel off from the film and take it out.

【0003】[0003]

【発明が解決しようとする課題】[Problems to be solved by the invention]

上記の二つの作業におけるウエハの切断分離の作業中
においては、ウエハはフィルム上に強く接着しておく必
要があり、切断後小片となった各素子を取出す際にはこ
の素子がフィルムから容易に剥離できる状態となってい
る必要がある。
During the work of cutting and separating the wafer in the above two operations, the wafer must be strongly adhered to the film, and when removing each element that has become a small piece after cutting, this element is easily separated from the film. It must be in a state where it can be peeled.

【0004】 また、ウエハに回路を形成したのちにその裏面を研磨
する工程において、回路形成面を保護する目的でウエハ
の回路形成面にフィルムを接着し、作業後溶液中に浸
し、その後フィルムを剥離する場合もあるが、この場合
も研磨中はウエハにフィルムが強く接着している必要が
あり、研磨後は簡単に剥離できなければ、剥離時にウエ
ハに割れや欠けが生ずるという問題がある。
In a process of polishing a back surface after forming a circuit on a wafer, a film is adhered to a circuit forming surface of the wafer for the purpose of protecting the circuit forming surface, immersed in a solution after work, and then immersed in a solution. In some cases, the film must be strongly adhered to the wafer during polishing. If the film cannot be easily peeled off after polishing, there is a problem that the wafer may be cracked or chipped at the time of peeling.

【0005】 このような矛盾した問題を解決するため、最初は接着
力が強く、UV光を照射すると三次元網状化して接着力が
低下するという性質の接着剤層を有するフィルムが用い
られているが、このUV光の照射用ランプはその大きさに
限界(長さ約100mm以下)があるため、大型のウエハ
(直径約200mm以上)の全面に万遍なくUV光を照射する
ためには複数のランプが必要となり、発熱量も大きいの
で装置が大型化しエネルギーの消費量も大となるなどの
問題がある。
In order to solve such a contradictory problem, a film having an adhesive layer having such a property that the adhesive strength is strong at first and the adhesive strength is reduced by irradiating with UV light to form a three-dimensional network. However, since the size of the UV light irradiation lamp is limited (less than about 100 mm in length), multiple lamps are required to uniformly irradiate the entire surface of a large wafer (about 200 mm or more in diameter). Lamps are required, and the amount of heat generated is large, so that there is a problem that the apparatus becomes large and energy consumption increases.

【0006】 この発明の課題は上記の問題点を解決して、小型の装
置を用いて大型のウエハにもUV光を均一に照射できる紫
外線照射方法及び装置を提供することである。
An object of the present invention is to solve the above problems and to provide an ultraviolet irradiation method and apparatus capable of uniformly irradiating a large wafer with UV light using a small apparatus.

【0007】[0007]

【課題を解決するための手段】[Means for Solving the Problems]

この発明は、上記の課題を解決する手段として、紫外
線照射により接着力が低下する性質の感圧接着剤層を有
するフィルムを電子回路形成用のウエハに貼着して所望
の加工を施す加工工程において、フィルムを貼着したウ
エハに対して紫外線照射手段を偏心させて配置し、ウエ
ハまたは紫外線照射手段を旋回させ、紫外線の照射をウ
エハ内の位置に応じて制限し、ウエハの所望の範囲に亘
って均一に紫外線を照射する方法としたのである。
The present invention provides, as a means for solving the above-mentioned problems, a processing step in which a film having a pressure-sensitive adhesive layer having a property such that the adhesive strength is reduced by ultraviolet irradiation is attached to a wafer for forming an electronic circuit and a desired processing is performed. In the above, the ultraviolet irradiation means is eccentrically arranged with respect to the wafer to which the film is adhered, the wafer or the ultraviolet irradiation means is turned, and the irradiation of the ultraviolet light is restricted according to the position in the wafer, so that the ultraviolet irradiation means is within a desired range of the wafer. This is a method of irradiating ultraviolet rays uniformly over the entire area.

【0008】 さらに、紫外線照射により接着力が低下する性質の感
圧接着剤層を有するフィルムを電子回路形成用のウエハ
に貼着して所望の加工を施す加工工程において、フィル
ムを貼着したウエハに対して紫外線照射手段を偏心させ
て配置するとともにウエハと紫外線照射手段の間にウエ
ハの中心側が狭くなった扇形の開口を有するマスクを設
け、この開口を通してウエハに紫外線を照射しながらウ
エハを旋回させて紫外線照射手段とマスクを静止させる
か、紫外線照射手段をマスクとともに旋回させてウエハ
を静止させることによりウエハの中心から周縁に均一な
紫外線照射を行う方法を採用することもできる。
Further, in a processing step of attaching a film having a pressure-sensitive adhesive layer having a property of decreasing adhesive strength by ultraviolet irradiation to a wafer for forming an electronic circuit and performing a desired processing, the wafer to which the film is attached The UV irradiating means is eccentrically arranged, and a mask having a fan-shaped opening with a narrower center side of the wafer is provided between the wafer and the UV irradiating means, and the wafer is rotated while irradiating the wafer with UV light through this opening Then, the ultraviolet irradiation means and the mask may be stopped, or the ultraviolet irradiation means may be swiveled together with the mask to stop the wafer so that uniform ultraviolet irradiation is performed from the center of the wafer to the periphery.

【0009】 又、上記第1の発明の方法を実施する装置として、紫
外線照射により接着力が低下する性質の感圧接着剤層を
有するフィルムを電子回路形成用のウエハに貼着して所
望の加工を施す加工工程において、フィルムを貼着した
ウエハに対して紫外線照射手段を偏心させて配置し、ウ
エハ又は紫外線照射手段を旋回させ、紫外線の照射をウ
エハ内の位置に応じて制限し、ウエハの所望の範囲に亘
って均一に紫外線を照射する紫外線照射装置を採用する
こともできる。
Further, as an apparatus for carrying out the method of the first invention, a film having a pressure-sensitive adhesive layer whose adhesive strength is reduced by irradiation with ultraviolet light is attached to a wafer for forming an electronic circuit, and a desired film is formed. In the processing step of performing the processing, the ultraviolet irradiation means is eccentrically arranged with respect to the wafer to which the film is attached, the wafer or the ultraviolet irradiation means is turned, and the irradiation of the ultraviolet light is restricted according to the position in the wafer, An ultraviolet irradiation device that uniformly irradiates ultraviolet rays over a desired range can be employed.

【0010】[0010]

【作用】[Action]

まず、紫外線を照射することにより硬化して接着力が
低下する性質の感圧接着剤層を有するフィルムを電子回
路形成用の半導体ウエハに貼着する。フィルムを貼着し
たウエハに対して紫外線照射手段を偏心させて配置し、
ウエハまたは紫外線照射手段を旋回させることによりウ
エハの所望の範囲に亘って紫外線を照射させる。
First, a film having a pressure-sensitive adhesive layer that is cured by irradiation with ultraviolet light and has a property of reducing adhesive strength is attached to a semiconductor wafer for forming an electronic circuit. The ultraviolet irradiation means is eccentrically arranged with respect to the wafer to which the film is attached,
By rotating the wafer or the ultraviolet irradiation means, ultraviolet light is irradiated over a desired range of the wafer.

【0011】 又、ウエハと紫外線照射手段の間にウエハの中心側が
狭くなった扇形の開口を有するマスクを設けたもので
は、この開口を通してウエハに紫外線を照射しながらウ
エハを旋回させて紫外線照射手段とマスクを静止させる
か、紫外線照射手段をマスクとともに旋回させてウエハ
を静止させることによりウエハの中心から周縁に均一な
紫外線照射が行える。
Further, in the case where a mask having a fan-shaped opening in which the center side of the wafer is narrowed is provided between the wafer and the ultraviolet irradiation means, the wafer is rotated while irradiating the wafer with ultraviolet light through this opening, and the ultraviolet irradiation means is provided. Then, the mask is stopped, or the ultraviolet irradiation means is rotated together with the mask to stop the wafer, so that uniform ultraviolet irradiation can be performed from the center to the periphery of the wafer.

【0012】 上記紫外線照射装置では、ウエハに対し偏心配置され
た紫外線照射手段から紫外線をウエハ又は紫外線照射手
段のいずれかを旋回させながらウエハに照射する。この
とき、紫外線の照射量がウエハの各部位置で均一となる
ように制限手段で制限して紫外線を照射する。
In the above-described ultraviolet irradiation apparatus, ultraviolet light is emitted from the ultraviolet irradiation means eccentrically arranged on the wafer while rotating either the wafer or the ultraviolet irradiation means. At this time, the irradiation amount of the ultraviolet rays is limited by the limiting means so that the irradiation amount of the ultraviolet rays is uniform at each position of the wafer.

【0013】[0013]

【実施例】【Example】

図1に示す実施例において、1は電子回路形成用のシ
リコンウエハで、その上にUV光の照射により三次元網状
化して接着力が低下する感圧性接着剤層すなわち、粘着
層を有する粘着フィルム2が貼付されている。上記ウエ
ハ1は適宜の搬送手段により支持台3上に送られ、この
台3上に真空吸引などにより同心状に吸着固定される。
In the embodiment shown in FIG. 1, reference numeral 1 denotes a silicon wafer for forming an electronic circuit, and a pressure-sensitive adhesive layer on which a three-dimensional network is formed by irradiation with UV light to reduce the adhesive force, that is, an adhesive film having an adhesive layer. 2 is affixed. The wafer 1 is sent onto the support table 3 by an appropriate transfer means, and is concentrically sucked and fixed on the table 3 by vacuum suction or the like.

【0014】 上記支持台3は適宜駆動手段により旋回および昇降自
在となっている。4はケースでその底部の開口5には左
右に開閉する一対のワークシャッタ6が設けてある。7
はケース4内の中間部に固定した仕切板でその中央はガ
ラス板からなるコバルトフィルタ10となっている。
The support table 3 can be turned and moved up and down by appropriate driving means. Reference numeral 4 denotes a case, and a pair of work shutters 6 which open and close left and right are provided in an opening 5 at the bottom. 7
Is a partition plate fixed to an intermediate portion in the case 4, and the center is a cobalt filter 10 made of a glass plate.

【0015】 上記フィルタ10の上には開口9を有するエリヤマスク
11を固定し、さらにその上には矢印方向に進退するシャ
ッタ12を設ける。13はケース4上に設けたランプハウス
でその内部に紫外線照射手段であるUVランプ14を固定
し、上部には排気ファン15が設けてある。
An area mask having an opening 9 on the filter 10
11 is fixed, and a shutter 12 that moves forward and backward in the direction of the arrow is further provided thereon. Reference numeral 13 denotes a lamp house provided on the case 4, in which a UV lamp 14 as an ultraviolet irradiation means is fixed, and an exhaust fan 15 is provided on the upper part.

【0016】 上記ランプ14は細長いもので、その長さはウエハ1の
半径よりも若干長いものである。また、支持台3の垂直
の回転中心線aがランプ14の端部に若干かかり、UV光が
ウエハ1の中心から周縁に達するようにしている。
The lamp 14 is elongated, and its length is slightly longer than the radius of the wafer 1. Further, the vertical rotation center line a of the support 3 is slightly applied to the end of the lamp 14 so that the UV light reaches the periphery from the center of the wafer 1.

【0017】 いまフィルム2を貼付したウエハ1がケース4の下方
で支持台3に吸着された条件で、ワークシャッタ6が開
き、支持台3が上昇してウエハ1を開口5からケース4
内に入れる。つぎにシャッタ12が開くと同時にUVランプ
14が点灯し、UV光がエリヤマスク11の開口9およびコバ
ルトフィルタ10を経てウエハ1上のフィルム2に照射さ
れる。
The work shutter 6 is opened under the condition that the wafer 1 on which the film 2 is attached is adsorbed to the support table 3 below the case 4, and the support table 3 rises to move the wafer 1 from the opening 5 to the case 4.
Put in. Next, when the shutter 12 opens, the UV lamp
14 is turned on, and the UV light is irradiated on the film 2 on the wafer 1 through the opening 9 of the area mask 11 and the cobalt filter 10.

【0018】 一方、上記のようにUV光の照射が始まると同時に支持
台3が回転を始めるので、UV光はウエハ1上のフィルム
2の全面に照射される。照射が終るとシャッタ12が閉じ
ランプ14は消灯され、支持台3の回転が止り、かつ下降
してウエハ1をケース4の下方とし、ワークシャッタ6
が閉じる。
On the other hand, since the support 3 starts rotating at the same time as the irradiation of the UV light starts as described above, the UV light is applied to the entire surface of the film 2 on the wafer 1. When the irradiation is completed, the shutter 12 is closed, the lamp 14 is turned off, the rotation of the support 3 is stopped, and the wafer 1 is moved downward so that the wafer 1 is below the case 4.
Closes.

【0019】 上記の作用において、エリヤマスク11の開口9を図2
のように矩形にすると、ウエハ1の円の中心部はUV光で
連続的に照射されるので中心に近づく程露光時間が長く
なる。従って、フィルム2に対するUV光の照射量が中心
に近づく程多くなるが、これを防止するためには図3の
ように開口9が回転中心に近づく程狭くなる扇形にす
る。
In the above operation, the opening 9 of the area mask 11 is
In the case of the rectangular shape as described above, the central portion of the circle of the wafer 1 is continuously irradiated with UV light, so that the exposure time becomes longer as approaching the center. Therefore, the irradiation amount of the UV light to the film 2 increases as it approaches the center, but in order to prevent this, as shown in FIG. 3, the opening 9 is formed into a sector shape that becomes narrower as it approaches the rotation center.

【0020】 また、図4、図5のように回転中心部に円形の開口16
を設けてこれを開口9と連続させ、上記開口16にUVの透
過率を低下させるガラスなどのフィルタ17を組み込んで
UV光の照射量をウエハ1の全域に亘って均一にする場合
もある。なお、実施例はUVランプ14を一本用いた場合を
示しているがランプ14を2本以上用いる場合もある。
As shown in FIGS. 4 and 5, a circular opening 16 is formed at the center of rotation.
Is provided so as to be continuous with the opening 9, and a filter 17 such as glass for reducing the transmittance of UV is incorporated in the opening 16.
The irradiation amount of UV light may be uniform over the entire area of the wafer 1 in some cases. Although the embodiment shows a case where one UV lamp 14 is used, there may be a case where two or more lamps 14 are used.

【0021】 この場合は、各ランプ14を回転中心から半径方向に位
置を違わせて配置するとよい。また、ウエハを回転させ
るかわりにUVランプ14を回転させることもでき、この場
合はエリヤマスク11もランプ14とともに回転させる。
In this case, the lamps 14 may be arranged at different positions in the radial direction from the center of rotation. Further, instead of rotating the wafer, the UV lamp 14 can be rotated. In this case, the area mask 11 is also rotated together with the lamp 14.

【0022】[0022]

【発明の効果】【The invention's effect】

この発明は、上記のように、ウエハ表面に紫外線硬化
型の粘着フィルムを貼り、紫外線照射手段であるUVラン
プをウエハの中心に対して偏心させて配置し、ウエハま
たは紫外線照射手段を旋回させることによりウエハの所
望の範囲に亘って紫外線を照射してウエハの直径より短
かいUVランプによりウエハの全面にUV光を均一に照射で
きるから、紫外線照射手段の発熱量が小さくなり、排気
ファンも小形にできるので装置全体を小型とすることが
できる。
According to the present invention, as described above, an ultraviolet-curable adhesive film is attached to the surface of a wafer, a UV lamp serving as an ultraviolet irradiation unit is disposed eccentrically with respect to the center of the wafer, and the wafer or the ultraviolet irradiation unit is turned. Irradiates the UV light over the desired area of the wafer, and the UV light shorter than the diameter of the wafer makes it possible to uniformly irradiate the entire surface of the wafer with UV light. Therefore, the size of the entire apparatus can be reduced.

【0023】 また、ウエハと紫外線照射手段の間にウエハ中心側が
狭くなった扇形の開口を有するマスクを設けた場合は、
ウエハの全面に均一にUV光を当てることができるから、
ウエハの中心部にUV光が当りすぎることを避ける必要の
ある場合に有効である。
In the case where a mask having a fan-shaped opening in which the center of the wafer is narrowed is provided between the wafer and the ultraviolet irradiation means,
Since UV light can be uniformly applied to the entire surface of the wafer,
This is effective when it is necessary to prevent the UV light from hitting the center of the wafer too much.

【0024】 紫外線照射装置では、上記第1の発明の方法を実施で
き、UV光をウエハに対し均一に照射できる。
In the ultraviolet irradiation apparatus, the method of the first invention can be performed, and the wafer can be uniformly irradiated with UV light.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 この発明の実施例を示す縦断正面図FIG. 1 is a longitudinal sectional front view showing an embodiment of the present invention.

【図2】 同上のエリヤマスクの各例を示す一部切欠平面図FIG. 2 is a partially cutaway plan view showing each example of the same area mask.

【図3】 同上のエリヤマスクの各例を示す一部切欠平面図FIG. 3 is a partially cutaway plan view showing each example of the same area mask.

【図4】 同上のエリヤマスクの各例を示す一部切欠平面図FIG. 4 is a partially cutaway plan view showing each example of the same area mask.

【図5】 図4のIV−IV線の断面図FIG. 5 is a sectional view taken along line IV-IV in FIG. 4;

【符号の説明】[Explanation of symbols]

1……シリコンウエハ 2……貼着フィルム 9……開口 11……エリヤマスク 14……UVランプ 16……開口 17……フィルタ 1 Silicon wafer 2 Adhesive film 9 Opening 11 Area mask 14 UV lamp 16 Opening 17 Filter

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】紫外線照射により接着力が低下する性質の
感圧接着剤層を有するフィルムを電子回路形成用のウエ
ハに貼着して所望の加工を施す加工工程において、フィ
ルムを貼着したウエハに対して紫外線照射手段を偏心さ
せて配置し、ウエハ又は紫外線照射手段を旋回させ、紫
外線の照射をウエハ内の位置に応じて制限し、ウエハの
所望の範囲に亘って均一に紫外線を照射することを特徴
とする紫外線照射方法。
1. A wafer to which a film is attached in a processing step of attaching a film having a pressure-sensitive adhesive layer having a property of decreasing adhesive strength by ultraviolet irradiation to a wafer for forming an electronic circuit and performing desired processing. UV light irradiating means is eccentrically arranged, the wafer or the UV light irradiating means is turned, the irradiation of the UV light is restricted according to the position in the wafer, and the UV light is uniformly irradiated over a desired range of the wafer. A method for irradiating ultraviolet rays, characterized in that:
【請求項2】紫外線照射により接着力が低下する性質の
感圧接着剤層を有するフィルムを電子回路形成用のウエ
ハに貼着して所望の加工を施す加工工程において、フィ
ルムを貼着したウエハに対して紫外線照射手段を偏心さ
せて配置するとともに、ウエハと紫外線照射手段の間に
ウエハの中心側が狭くなった扇形の開口を有するマスク
を設け、この開口を通してウエハに紫外線を照射しなが
らウエハを旋回させて紫外線照射手段とマスクを静止さ
せるか、紫外線照射手段をマスクとともに旋回させてウ
エハを静止させることによりウエハの中心から周縁に均
一な紫外線照射を行うことを特徴とする紫外線照射方
法。
2. A wafer to which a film is attached in a processing step of applying a film having a pressure-sensitive adhesive layer having a property of reducing adhesive strength by ultraviolet irradiation to a wafer for forming an electronic circuit and performing desired processing. The ultraviolet irradiation means is eccentrically arranged with respect to the wafer, and a mask having a fan-shaped opening in which the center side of the wafer is narrowed is provided between the wafer and the ultraviolet irradiation means. An ultraviolet irradiation method characterized in that the ultraviolet irradiation means and the mask are stopped by turning, or the ultraviolet irradiation means is turned together with the mask to stop the wafer, so that uniform ultraviolet irradiation is performed from the center to the periphery of the wafer.
【請求項3】紫外線照射により接着力が低下する性質の
感圧接着剤層を有するフィルムを電子回路形成用のウエ
ハに貼着して所望の加工を施す紫外線照射装置におい
て、フィルムを貼着したウエハに対して紫外線照射手段
を偏心させて配置し、ウエハ又は紫外線照射手段を旋回
手段により旋回自在とし、紫外線の照射をウエハ内の位
置に応じて制限する制限手段を介して紫外線をウエハの
所望の範囲に亘って均一に照射するようにしたことを特
徴とする紫外線照射装置。
3. An ultraviolet irradiation apparatus for applying a film having a pressure-sensitive adhesive layer whose adhesive strength is reduced by ultraviolet irradiation to a wafer for forming an electronic circuit and performing desired processing. The ultraviolet irradiation means is eccentrically arranged with respect to the wafer, the wafer or the ultraviolet irradiation means is turned by the turning means, and the ultraviolet light is transmitted to the wafer through the restricting means for restricting the irradiation of the ultraviolet light according to the position in the wafer. An ultraviolet irradiation apparatus characterized in that the irradiation is performed uniformly over the range of (1).
JP12984090A 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus Expired - Lifetime JP3169952B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12984090A JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12984090A JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Publications (2)

Publication Number Publication Date
JPH0425149A JPH0425149A (en) 1992-01-28
JP3169952B2 true JP3169952B2 (en) 2001-05-28

Family

ID=15019538

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12984090A Expired - Lifetime JP3169952B2 (en) 1990-05-18 1990-05-18 Ultraviolet irradiation method and apparatus

Country Status (1)

Country Link
JP (1) JP3169952B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007220905A (en) * 2006-02-16 2007-08-30 Shibuya Kogyo Co Ltd Pickup device of tabular article

Also Published As

Publication number Publication date
JPH0425149A (en) 1992-01-28

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