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JPH04139628A - Optical semiconductor device and its manufacture - Google Patents

Optical semiconductor device and its manufacture

Info

Publication number
JPH04139628A
JPH04139628A JP2260988A JP26098890A JPH04139628A JP H04139628 A JPH04139628 A JP H04139628A JP 2260988 A JP2260988 A JP 2260988A JP 26098890 A JP26098890 A JP 26098890A JP H04139628 A JPH04139628 A JP H04139628A
Authority
JP
Japan
Prior art keywords
main surface
hologram
semiconductor laser
semiconductor device
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2260988A
Other languages
Japanese (ja)
Inventor
Takeshi Hamada
健 浜田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP2260988A priority Critical patent/JPH04139628A/en
Publication of JPH04139628A publication Critical patent/JPH04139628A/en
Pending legal-status Critical Current

Links

Landscapes

  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Optical Head (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To obtain a device in which the precision of the relative positional relation of components is high by forming all of the relative positional relation of the semiconductor laser chip, the detector for detecting a signal, and the hologram of the components on a silicon substrate by using the technique of photolithography. CONSTITUTION:Light emitted from the semiconductor laser chip 1 is reflected by a V-grooved reflector mirror 6, and is emitted upward. The emitted light is collected on a disk 3 by a lens 2, and the reflected light from this desk 3 is diffracted by the hologram 8, and is collected to a photodetector 9. Through this configuration, the relative positional relation of the V-grooved reflector mirror 6, the bonding position of the semiconductor laser chip 1, the photodetector 9, and the hologram 8 can be controlled in a 1mum unit by using the technique of the photolithography, and the device in which the precision of the relational position relation of the components is high can be realized.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、光デイスク装置などに用いられるホログラム
光ピックアップのための光半導体装置およびその製造方
法に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an optical semiconductor device for a hologram optical pickup used in an optical disk device, etc., and a method for manufacturing the same.

従来の技術 近年、光ピツクアップの小型軽量化および低価格化にと
もなって、ホログラムを用いた信号検出方式に注目が集
まっている。
2. Description of the Related Art In recent years, as optical pickups have become smaller, lighter, and cheaper, signal detection systems using holograms have been attracting attention.

従来のホログラム光ピックアップを第2図に示す。半導
体レーザチップ21から出射されたレーザ光はレンズ2
2によりディスク23の上に集光された後、反射されて
帰ってくる途中ホログラム24により分光されて、信号
検出用ディテクタ25の上番ご集光される。
A conventional hologram optical pickup is shown in FIG. The laser beam emitted from the semiconductor laser chip 21 passes through the lens 2
After being focused on the disk 23 by the light beam 2, the light beam is reflected and separated by the hologram 24 on the way back, and is focused on the upper number of the signal detection detector 25.

発明か解決しようとする課題 しかしながら上記従来の構成では、次のような課題があ
った。
Problems to be Solved by the Invention However, the above conventional configuration has the following problems.

1羅で安定した信号を得るためには、半導体レーザチッ
プから出射される光の光軸、検出用ディテクターのパタ
ーンおよびホログラムのパターンのそれぞれの位置関係
を1μmの精度で制御することが必要である。しかし、
第2図に示すようなそれぞれ独立した部品からなる従来
の構成ではこのような精密な位置関係の制御は極めて困
難であり、また温度変化などに起因する収納容器の変形
による位置のずれの可能性も大きい。
In order to obtain a stable signal at 1 ra, it is necessary to control the positional relationship of the optical axis of the light emitted from the semiconductor laser chip, the detection detector pattern, and the hologram pattern with an accuracy of 1 μm. . but,
With the conventional configuration consisting of independent parts as shown in Figure 2, it is extremely difficult to control such precise positional relationships, and there is also the possibility of positional deviation due to deformation of the storage container due to temperature changes, etc. It's also big.

本発明は上記従来の課題を解決するもので、構成部品の
相互位置関係の精度が高い光半導体装置およびその製造
方法を提供することを目的上する。
The present invention solves the above-mentioned conventional problems, and an object of the present invention is to provide an optical semiconductor device in which the mutual positional relationship of component parts is highly accurate, and a method for manufacturing the same.

課題を解決するための手段 この目的を達成するために本発明の光半導体装置は、主
面が(100)面であるシリコン基板の第1の主面に形
成された側面が(111)面であるV字状の溝と、前記
溝の一方の側面の中間部から前記第1−の主面に平行に
形成された第2の主面と、前記第2の主面にレーザ光が
前記溝の他方の側面に照射される方向に設置された半導
体レーザ素子と、前記シリコン基板の上に設けた透明膜
の表面に形成されたホログラムと、前記第1の主面上で
前記ホログラノからの回折光を受光する位置に設置され
た受光素子とを備えた構成を有している。
Means for Solving the Problems In order to achieve this object, the optical semiconductor device of the present invention has a silicon substrate whose main surface is a (100) plane, and whose side surface formed on the first main surface is a (111) plane. a V-shaped groove, a second main surface formed parallel to the first main surface from an intermediate part of one side surface of the groove, and a laser beam on the second main surface of the groove. , a hologram formed on the surface of a transparent film provided on the silicon substrate, and diffraction from the hologram on the first main surface. It has a configuration including a light receiving element installed at a position to receive light.

作用 上記の構成により、構成部品(半導体レーザチップ、信
号検出用ディテクター、ホログラム)の位置関係をすべ
てシリコン基板上で、フォトリソグラフィの技術を利用
することにより、1μmの精度で制御することができる
Effect: With the above configuration, the positional relationships of the components (semiconductor laser chip, signal detection detector, hologram) can all be controlled with an accuracy of 1 μm on the silicon substrate by using photolithography technology.

実施例 以下本発明の一実施例について、図面を参照しながら説
明する。
EXAMPLE Hereinafter, an example of the present invention will be described with reference to the drawings.

なお、レンズ2.ディスク3とレーザ光の関係について
は第2図の従来例と同じであり、ここでは省略した。
In addition, lens 2. The relationship between the disk 3 and the laser beam is the same as the conventional example shown in FIG. 2, and is omitted here.

第1図は本発明の一実施例における光半導体装置の断面
図である。シリコン(Si)基板4の第1の主面5aの
上にエツチングによりV字状の溝(以下■溝反射ミラー
と称する)6が形成されている。水酸化カリウム水溶液
からなるエツチング液を用いた異方性エツチングにより
、(111)面による光学的にも平坦なV溝反射ミラー
6を容易に形成することができる。このV溝反射ミラー
6に向かい合って半導体レーザチップ1をボンディング
する。半導体レーザチップ1をボンディングする面は出
射されるレーザ光の中心が■溝反射ミラー6に当たるよ
うにあらかじめ主面を少しエツチングして形成した主面
と平行な第2の面5bである。この半導体レーザチップ
1がボンディングされた81基板4の上に半導体レーザ
光を透過する透明膜7として樹脂をコーティングする。
FIG. 1 is a sectional view of an optical semiconductor device according to an embodiment of the present invention. A V-shaped groove (hereinafter referred to as a groove reflection mirror) 6 is formed on the first principal surface 5a of a silicon (Si) substrate 4 by etching. By anisotropic etching using an etching solution made of an aqueous potassium hydroxide solution, it is possible to easily form an optically flat V-groove reflecting mirror 6 having a (111) plane. A semiconductor laser chip 1 is bonded facing this V-groove reflection mirror 6. The surface to which the semiconductor laser chip 1 is bonded is a second surface 5b parallel to the main surface, which is formed by slightly etching the main surface in advance so that the center of the emitted laser beam hits the groove reflection mirror 6. The substrate 81 to which the semiconductor laser chip 1 is bonded is coated with resin as a transparent film 7 that transmits the semiconductor laser light.

この透明膜7の表面にフォトリソグラフィの技術を用い
てホログラム8を形成する。
A hologram 8 is formed on the surface of this transparent film 7 using photolithography technology.

また、Si基盤4の上にはフォトディテクター9が形成
されている。
Further, a photodetector 9 is formed on the Si substrate 4.

上記のように構成された本発明の光半導体装置の動作に
ついて説明する。半導体レーザチップ1から出射された
光は■溝反射ミラー6により反射され、上方に出射され
る。出射された光はレンズ2によってディスク3上に集
光され、そのディスク3からの反射光はホログラム8に
よって回折され、フォトディテクター9に集光される。
The operation of the optical semiconductor device of the present invention configured as described above will be explained. The light emitted from the semiconductor laser chip 1 is reflected by the groove reflection mirror 6 and emitted upward. The emitted light is focused onto a disk 3 by a lens 2, and the reflected light from the disk 3 is diffracted by a hologram 8 and focused onto a photodetector 9.

81基板4の上に形成される■溝反射ミラー6、半導体
レーザチップ1のボンディング位置、フォトディテクタ
ー9およびホログラム8の相互位置関係はフォトリング
ラフィの技術を用いて1μm単位で制御することができ
る。
81 The mutual positional relationship between the ■groove reflecting mirror 6 formed on the substrate 4, the bonding position of the semiconductor laser chip 1, the photodetector 9, and the hologram 8 can be controlled in units of 1 μm using photolithography technology. .

なお、本実施例ではホログラム8を1面だけ用いる方式
の光ピツクアップについて述べたが、ホログラム8を2
面以上用いる方式の光ピツクアップにおいても透明膜7
を2層以上用いることにより、全く同様の効果を得るこ
とができる。
In this embodiment, an optical pickup using only one hologram 8 has been described, but if two holograms 8 are used,
Transparent film 7 is also used in optical pickup using more than one surface.
Exactly the same effect can be obtained by using two or more layers of.

さらに本実施例では、ホログラム8を形成する透明膜7
として樹脂を塗布する場合について述へたが、81基板
4の上に形成した酸化シリコン膜を透明膜7として用い
ても、全く同様の効果を得ることかできる。
Furthermore, in this embodiment, the transparent film 7 forming the hologram 8 is
Although the case where resin is applied has been described above, the same effect can be obtained even if a silicon oxide film formed on the 81 substrate 4 is used as the transparent film 7.

発明の効果 以上のように本発明は半導体レーザ素子を設置するため
の平面、レーザ光を反射するためのV溝反射ミラー、ホ
ログラムおよび受光素子をすへてフォトリングラフィ技
術を中心とする半導体処理技術を用いてシリコン基板上
に形成することにより、これら構成部品の相互位置関係
精度の高い、光デイスク装置等に用いられるホログラム
光ピックアップのための光半導体装置およびその製造方
法を実現できるものである。
Effects of the Invention As described above, the present invention provides a flat surface for installing a semiconductor laser element, a V-groove reflecting mirror for reflecting laser light, a hologram, and a light receiving element, and is capable of semiconductor processing centered on photolithography technology. By forming the optical semiconductor device on a silicon substrate using technology, it is possible to realize an optical semiconductor device for a holographic optical pickup used in optical disk devices, etc., and a method for manufacturing the same, in which the mutual positional relationship of these components is highly accurate. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例におけるホログラム光ピック
アップに用いる光半導体装置の断面図、第2図は従来の
ホログラム光ピックアップの一部断面正面図である。 1・・・・・・半導体レーザチップ(半導体レーデ素子
)、4・・・・・・シリコン基板、5a・・・・・・第
1の主面、5b・・・・・・第2の主面、6・・・・・
・V溝反射ミラー(V字状の溝)、7・・・・・・透明
膜、8・・・・・・ホログラム、9・・・・・・フォト
ディテクター(受光素子)。
FIG. 1 is a sectional view of an optical semiconductor device used in a hologram optical pickup according to an embodiment of the present invention, and FIG. 2 is a partially sectional front view of a conventional hologram optical pickup. DESCRIPTION OF SYMBOLS 1... Semiconductor laser chip (semiconductor laser element), 4... Silicon substrate, 5a... First main surface, 5b... Second main surface Face, 6...
- V-groove reflecting mirror (V-shaped groove), 7...Transparent film, 8...Hologram, 9...Photodetector (light receiving element).

Claims (2)

【特許請求の範囲】[Claims] (1)主面が(100)面であるシリコン基板の第1の
主面に形成された側面が(111)面であるV字状の溝
と、前記溝の一方の側面の中間部から前記・第1の主面
に平行に形成された第2の主面と、前記第2の主面にレ
ーザ光が前記溝の他方の側面に照射される方向に設置さ
れた半導体レーザ素子と、前記シリコン基板の上に設け
た透明膜の表面に形成されたホログラムと、前記第1の
主面上で前記ホログラムからの回折光を受光する位置に
設置された受光素子とを備えた光半導体装置。
(1) A V-shaped groove whose side surfaces are (111) planes formed in a first principal surface of a silicon substrate whose principal plane is (100) planes, and - a second main surface formed parallel to the first main surface; a semiconductor laser element installed on the second main surface in a direction in which laser light is irradiated onto the other side surface of the groove; An optical semiconductor device comprising: a hologram formed on a surface of a transparent film provided on a silicon substrate; and a light receiving element installed on the first main surface at a position to receive diffracted light from the hologram.
(2)主面が(100)面であるシリコン基板の第1の
主面に側面が(111)面であるV字状の溝を形成する
工程と、前記溝の一方の側面の中間部から前記第1の主
面に平行に第2の主面を形成する工程と、前記第2の主
面にレーザ光が前記溝の他方の側面に照射される方向に
半導体レーザ素子を設置する工程と、前記シリコン基板
の上に透明膜を形成する工程と、前記透明膜の表面にホ
ログラムを形成する工程と、前記第1の主面上で前記ホ
ログラムからの回折光を受光する位置に受光素子を設置
する工程を有する光半導体装置の製造方法。
(2) forming a V-shaped groove whose side surfaces are (111) planes on the first main surface of the silicon substrate whose main surface is (100) planes; forming a second main surface parallel to the first main surface; and installing a semiconductor laser element on the second main surface in a direction in which the other side of the groove is irradiated with laser light. , forming a transparent film on the silicon substrate, forming a hologram on the surface of the transparent film, and placing a light receiving element on the first main surface at a position to receive diffracted light from the hologram. A method for manufacturing an optical semiconductor device, which includes a step of installing an optical semiconductor device.
JP2260988A 1990-09-28 1990-09-28 Optical semiconductor device and its manufacture Pending JPH04139628A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2260988A JPH04139628A (en) 1990-09-28 1990-09-28 Optical semiconductor device and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2260988A JPH04139628A (en) 1990-09-28 1990-09-28 Optical semiconductor device and its manufacture

Publications (1)

Publication Number Publication Date
JPH04139628A true JPH04139628A (en) 1992-05-13

Family

ID=17355510

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2260988A Pending JPH04139628A (en) 1990-09-28 1990-09-28 Optical semiconductor device and its manufacture

Country Status (1)

Country Link
JP (1) JPH04139628A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0676340A (en) * 1992-08-26 1994-03-18 Sharp Corp Optical pickup device
JPH06259800A (en) * 1993-03-05 1994-09-16 Matsushita Electric Ind Co Ltd Optical device
US5481386A (en) * 1993-02-17 1996-01-02 Hitachi, Ltd. Flying type optical head integrally formed with light source and photodetector and optical disk apparatus with the same
US5680385A (en) * 1995-03-30 1997-10-21 Nec Corporation Optical head with a heat sink
US6614743B1 (en) * 1999-11-11 2003-09-02 Matsushita Electric Industrial Co., Ltd. Semiconductor laser device
US6747939B2 (en) 2000-03-01 2004-06-08 Matsushita Electric Industrial Co., Ltd. Semiconductor laser device and optical pickup device using the same
JP2005141891A (en) * 2003-11-04 2005-06-02 Samsung Electronics Co Ltd Slim optical pickup

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0676340A (en) * 1992-08-26 1994-03-18 Sharp Corp Optical pickup device
US5481386A (en) * 1993-02-17 1996-01-02 Hitachi, Ltd. Flying type optical head integrally formed with light source and photodetector and optical disk apparatus with the same
US5995474A (en) * 1993-02-17 1999-11-30 Hitachi, Ltd. Flying type optical head integrally formed with light source and photodetector and optical disk apparatus with the same
US6185177B1 (en) 1993-02-17 2001-02-06 Hitachi, Ltd. Flying type optical head integrally formed with light source and photodetector and optical disk apparatus with the same
US6611487B2 (en) 1993-02-17 2003-08-26 Hitachi, Ltd. Flying type optical head integrally formed with light source and photodetector and optical disk apparatus with the same
JPH06259800A (en) * 1993-03-05 1994-09-16 Matsushita Electric Ind Co Ltd Optical device
US5680385A (en) * 1995-03-30 1997-10-21 Nec Corporation Optical head with a heat sink
US6614743B1 (en) * 1999-11-11 2003-09-02 Matsushita Electric Industrial Co., Ltd. Semiconductor laser device
US6747939B2 (en) 2000-03-01 2004-06-08 Matsushita Electric Industrial Co., Ltd. Semiconductor laser device and optical pickup device using the same
JP2005141891A (en) * 2003-11-04 2005-06-02 Samsung Electronics Co Ltd Slim optical pickup

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