JP6739285B2 - 基板処理装置 - Google Patents
基板処理装置 Download PDFInfo
- Publication number
- JP6739285B2 JP6739285B2 JP2016163668A JP2016163668A JP6739285B2 JP 6739285 B2 JP6739285 B2 JP 6739285B2 JP 2016163668 A JP2016163668 A JP 2016163668A JP 2016163668 A JP2016163668 A JP 2016163668A JP 6739285 B2 JP6739285 B2 JP 6739285B2
- Authority
- JP
- Japan
- Prior art keywords
- unit
- exhaust
- processing
- exhaust pipe
- processing unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012545 processing Methods 0.000 title claims description 311
- 239000000758 substrate Substances 0.000 title claims description 74
- 239000007788 liquid Substances 0.000 claims description 58
- 238000012546 transfer Methods 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 10
- 238000012423 maintenance Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 239000007789 gas Substances 0.000 description 87
- 235000012431 wafers Nutrition 0.000 description 54
- 239000012530 fluid Substances 0.000 description 39
- 230000007246 mechanism Effects 0.000 description 31
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 24
- 238000010586 diagram Methods 0.000 description 19
- 239000002253 acid Substances 0.000 description 8
- 238000003860 storage Methods 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 238000001035 drying Methods 0.000 description 6
- 238000011084 recovery Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 5
- 230000000630 rising effect Effects 0.000 description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- 238000010306 acid treatment Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- -1 dirt Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007562 laser obscuration time method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 210000003437 trachea Anatomy 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67023—Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
16 処理ユニット
20 チャンバ
21 FFU
21a 取込部
21b 給気部
Claims (7)
- 水平方向に並べて配置され、チャンバ内において基板を保持して処理液により前記基板を液処理する複数の処理ユニットと、
前記処理ユニットの並び方向と平行に対向配置され、かつ、それぞれの下面が板材で連結された梁部を多段に有し、前記板材のそれぞれに沿って前記処理ユニットを収容するフレーム構造体と、
前記処理ユニットごとに設けられ、該処理ユニットの内部へ気体を供給する気体供給部と、
前記処理ユニットからの排気を導く配管である第1排気管と、
処理液の供給系統まわりの雰囲気を排気する垂直方向の配管である第2排気管と、
前記雰囲気を排気する水平方向の配管である第3排気管と
を備え、
前記気体供給部は、
外気を取り込んで清浄化する取込部と、
前記取込部により清浄化された清浄空気を前記処理ユニットの内部へ給気する給気部と
を含み、
前記取込部は、前記並び方向に直交する前記チャンバそれぞれの同一側面に配置され、
前記第1排気管は、前記同一側面の幅内に収まるように前記取込部に並設され、
前記第3排気管は、前記梁部の対向面間に配置され、
前記処理ユニットは、前記第3排気管に積層されること
を特徴とする基板処理装置。 - 前記第1排気管は、
多段の前記処理ユニット間で、前記同一側面を上下に伸延すること
を特徴とする請求項1に記載の基板処理装置。 - メンテナンス領域側から視た前記処理ユニットの背後に設けられ、前記基板を前記処理ユニットへ搬送する搬送部
をさらに備え、
前記搬送部に近い側から順に、前記第1排気管、前記取込部が配置されること
を特徴とする請求項1または2に記載の基板処理装置。 - 前記取込部の外気の取り込み口は、
前記メンテナンス領域側へ向けて開口されていること
を特徴とする請求項3に記載の基板処理装置。 - 前記第2排気管は、
両端の前記処理ユニットの側方を通るように配置されるとともに、前記処理ユニットに連通する前記第3排気管に接続されて、前記雰囲気を共有する一つの筐体を形成すること
を特徴とする請求項1〜4のいずれか一つに記載の基板処理装置。 - 前記第2排気管は、
前記処理ユニットへ処理液を供給するための配管を収容すること
を特徴とする請求項1〜5のいずれか一つに記載の基板処理装置。 - 前記処理ユニットは、
複数種類の処理液を供給可能であって、
前記複数種類の処理液の少なくとも1つに対応する複数の個別排気管を有し、前記第1排気管を流れる排気の流出先を前記個別排気管のいずれかに切り替える排気切替ユニット
をさらに備え、
前記排気切替ユニットは、
最上段の前記処理ユニットよりも上方に配置され、
前記第2排気管の排気口は、前記排気切替ユニットへ接続されること
を特徴とする請求項1〜6のいずれか一つに記載の基板処理装置。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016163668A JP6739285B2 (ja) | 2016-08-24 | 2016-08-24 | 基板処理装置 |
US15/681,603 US10373849B2 (en) | 2016-08-24 | 2017-08-21 | Substrate processing apparatus |
KR1020170106759A KR102422391B1 (ko) | 2016-08-24 | 2017-08-23 | 기판 처리 장치 |
CN201710733225.1A CN107785291B (zh) | 2016-08-24 | 2017-08-24 | 基板处理装置 |
CN202310746612.4A CN116682763A (zh) | 2016-08-24 | 2017-08-24 | 基板处理装置 |
KR1020220079700A KR102518708B1 (ko) | 2016-08-24 | 2022-06-29 | 기판 처리 장치 |
KR1020230037402A KR102668038B1 (ko) | 2016-08-24 | 2023-03-22 | 기판 처리 장치 |
KR1020240060171A KR102702579B1 (ko) | 2016-08-24 | 2024-05-07 | 기판 처리 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016163668A JP6739285B2 (ja) | 2016-08-24 | 2016-08-24 | 基板処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018032723A JP2018032723A (ja) | 2018-03-01 |
JP6739285B2 true JP6739285B2 (ja) | 2020-08-12 |
Family
ID=61243366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016163668A Active JP6739285B2 (ja) | 2016-08-24 | 2016-08-24 | 基板処理装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10373849B2 (ja) |
JP (1) | JP6739285B2 (ja) |
KR (4) | KR102422391B1 (ja) |
CN (2) | CN107785291B (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7210960B2 (ja) * | 2018-09-21 | 2023-01-24 | 東京エレクトロン株式会社 | 真空処理装置及び基板搬送方法 |
JP7203545B2 (ja) * | 2018-09-21 | 2023-01-13 | 株式会社Screenホールディングス | 基板処理装置 |
JP7163199B2 (ja) * | 2019-01-08 | 2022-10-31 | 東京エレクトロン株式会社 | 基板処理装置 |
JP7382164B2 (ja) * | 2019-07-02 | 2023-11-16 | 東京エレクトロン株式会社 | 液処理装置および液処理方法 |
JP7370277B2 (ja) * | 2020-02-26 | 2023-10-27 | 株式会社Screenホールディングス | 基板処理装置 |
JP7509657B2 (ja) | 2020-10-29 | 2024-07-02 | 株式会社Screenホールディングス | 基板処理装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10291607A (ja) * | 1997-04-21 | 1998-11-04 | Toyota Autom Loom Works Ltd | 荷保管装置 |
JP2006019584A (ja) * | 2004-07-02 | 2006-01-19 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP5146526B2 (ja) * | 2010-12-28 | 2013-02-20 | 東京エレクトロン株式会社 | 液処理装置 |
JP5472169B2 (ja) * | 2011-03-16 | 2014-04-16 | 東京エレクトロン株式会社 | 液処理装置、液処理方法および記憶媒体 |
JP5889691B2 (ja) * | 2012-03-28 | 2016-03-22 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
JP6430784B2 (ja) * | 2014-10-31 | 2018-11-28 | 東京エレクトロン株式会社 | 基板液処理装置 |
-
2016
- 2016-08-24 JP JP2016163668A patent/JP6739285B2/ja active Active
-
2017
- 2017-08-21 US US15/681,603 patent/US10373849B2/en active Active
- 2017-08-23 KR KR1020170106759A patent/KR102422391B1/ko active IP Right Grant
- 2017-08-24 CN CN201710733225.1A patent/CN107785291B/zh active Active
- 2017-08-24 CN CN202310746612.4A patent/CN116682763A/zh active Pending
-
2022
- 2022-06-29 KR KR1020220079700A patent/KR102518708B1/ko active IP Right Grant
-
2023
- 2023-03-22 KR KR1020230037402A patent/KR102668038B1/ko active IP Right Grant
-
2024
- 2024-05-07 KR KR1020240060171A patent/KR102702579B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR102702579B1 (ko) | 2024-09-04 |
KR102668038B1 (ko) | 2024-05-21 |
US10373849B2 (en) | 2019-08-06 |
KR20240070487A (ko) | 2024-05-21 |
US20180061688A1 (en) | 2018-03-01 |
KR20180022610A (ko) | 2018-03-06 |
CN107785291A (zh) | 2018-03-09 |
KR20220099525A (ko) | 2022-07-13 |
CN107785291B (zh) | 2023-08-01 |
JP2018032723A (ja) | 2018-03-01 |
KR20230044162A (ko) | 2023-04-03 |
KR102518708B1 (ko) | 2023-04-05 |
CN116682763A (zh) | 2023-09-01 |
KR102422391B1 (ko) | 2022-07-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6739285B2 (ja) | 基板処理装置 | |
US10128132B2 (en) | Substrate liquid processing apparatus | |
CN105575850B (zh) | 基板液处理装置 | |
JP5146526B2 (ja) | 液処理装置 | |
KR101652773B1 (ko) | 액처리 장치 | |
JP6611893B2 (ja) | 基板液処理装置 | |
JP6280837B2 (ja) | 基板処理装置及び基板処理装置の基板載置部の雰囲気制御方法 | |
JP7221110B2 (ja) | 基板処理装置 | |
JP6675955B2 (ja) | 基板処理装置 | |
JP7213624B2 (ja) | 基板処理装置、基板処理システムおよび基板処理方法 | |
JP6559813B2 (ja) | 基板処理装置及び基板処理装置の基板載置部の雰囲気制御方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190605 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20200205 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20200212 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20200407 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200623 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200721 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6739285 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |