JP6654435B2 - ウエーハ生成方法 - Google Patents
ウエーハ生成方法 Download PDFInfo
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- JP6654435B2 JP6654435B2 JP2016001647A JP2016001647A JP6654435B2 JP 6654435 B2 JP6654435 B2 JP 6654435B2 JP 2016001647 A JP2016001647 A JP 2016001647A JP 2016001647 A JP2016001647 A JP 2016001647A JP 6654435 B2 JP6654435 B2 JP 6654435B2
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- 238000000034 method Methods 0.000 title claims description 14
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 claims description 70
- 239000013078 crystal Substances 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 235000012431 wafers Nutrition 0.000 description 62
- 239000010410 layer Substances 0.000 description 23
- 230000001678 irradiating effect Effects 0.000 description 16
- 238000003384 imaging method Methods 0.000 description 8
- 238000001514 detection method Methods 0.000 description 4
- 238000005498 polishing Methods 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 238000010897 surface acoustic wave method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 239000007767 bonding agent Substances 0.000 description 1
- 238000003776 cleavage reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- YDZQQRWRVYGNER-UHFFFAOYSA-N iron;titanium;trihydrate Chemical group O.O.O.[Ti].[Fe] YDZQQRWRVYGNER-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000007017 scission Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/04—After-treatment of single crystals or homogeneous polycrystalline material with defined structure using electric or magnetic fields or particle radiation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
- C30B29/30—Niobates; Vanadates; Tantalates
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/06—Joining of crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02013—Grinding, lapping
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02175—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal
- H01L21/02183—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing tantalum, e.g. Ta2O5
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/222—Lithium-drift
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01003—Lithium [Li]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01073—Tantalum [Ta]
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- Power Engineering (AREA)
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- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metallurgy (AREA)
- High Energy & Nuclear Physics (AREA)
- Optics & Photonics (AREA)
- Inorganic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
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- Laser Beam Processing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
Description
第1の滑動ブロック32は、被案内溝321、321が一対の案内レール31、31に嵌合することにより、一対の案内レール31、31に沿ってX軸方向に移動可能に構成される。図示の保持テーブル機構3は、第1の滑動ブロック32を一対の案内レール31、31に沿ってX軸方向に移動させるためのX軸方向移動手段35を備えている。X軸方向移動手段35は、上記一対の案内レール31と31との間に平行に配設された雄ネジロッド351と、該雄ネジロッド351を回転駆動させるためのパルスモータ352等の駆動源を含んでいる。雄ネジロッド351は、その一端が上記静止基台2に固定された軸受ブロック353に回転自在に支持されており、その他端が上記パルスモータ352の出力軸に伝動連結されている。なお、雄ネジロッド351は、第1の滑動ブロック32の中央部下面に突出して設けられた図示しない雌ネジブロックに形成された貫通雌ネジ穴に螺合されている。従って、パルスモータ352によって雄ネジロッド351を正転および逆転駆動することにより、第1の滑動ブロック32は案内レール31、31に沿ってX軸方向に移動させられる。
図2には、本発明の第1の実施形態におけるウエーハの生成方法によって加工される被加工物としてのリチウムタンタレートインゴット7が保持テーブル34上に載置される状態が示されている。
上記した被加工物支持工程を実施したならば、リチウムタンタレートインゴット7を保持した保持テーブル34は、X軸方向移動手段35およびY軸方向移動手段36により撮像手段6の直下に位置付けられる。保持テーブル34が撮像手段6の直下に位置付けられると、撮像手段6及び前記制御手段によってリチウムタンタレートインゴット7のレーザー加工を実行する領域、及び保持テーブル34上に載置されたリチウムタンタレートインゴット7の表面高さを検出するアライメント工程を実行する。
(被加工物)
インゴット :LiTaO3 42°rotationY
厚み :257μm
生成ウエーハ厚み :85μm
(レーザー加工条件)
波長 :1064nm
平均出力 :0.55W
繰り返し周波数 :60kHz
パルス幅 :3ns
スポット径 :φ10.0μm
送り速度 :120mm/s
インデックス量 :50〜70μm
パス数 :1
重なり率 :80%
前記改質層形成工程を終了すると、リチウムタンタレートインゴット7が載置された保持テーブル34を、X軸方向移動手段35、及びY軸方向移動手段36を制御して、リチウムタンタレートウエーハを剥離する剥離手段8が配設された終端部側に移動させ、ウエーハ吸着手段84の直下に位置付ける。先に検出し制御手段に入力されたリチウムタンタレートインゴット7の表面からの位置に基づいて、剥離ユニットアーム82を降下させて該リチウムタンタレートインゴット7の上面に密着させるとともに、図示しない吸引手段を作動させてリチウムタンタレートインゴット7にウエーハ吸着手段84を吸着させ固定する(図5を参照)。そして、該ウエーハ吸着手段84と、リチウムタンタレートインゴット7とが固定された状態で図示しない超音波振動付与手段により超音波振動を付与すると共に、剥離用パルスモータ83を作動することにより該ウエーハ吸着手段84を回転駆動させてリチウムタンタレートインゴット7に対して捻り力を与え、該界面を境にしてリチウムタンタレートインゴット7の上部側を剥離させ、1枚のリチウムタンタレートウエーハ7´を得ることができる。
2:静止基台
3:保持テーブル機構
4:レーザー光線照射ユニット
5:レーザー光線照射手段
6:撮像手段
7:リチウムタンタレートインゴット
8:ウエーハ剥離手段
31:案内レール
34:保持テーブル
82:剥離ユニットアーム
84:ウエーハ吸着手段
Claims (2)
- リチウムタンタレートのインゴットからウエーハを生成するウエーハ生成方法であって、
結晶軸に直交するY軸に対して42度の回転角をもって切断されたインゴットの中心軸に対して垂直に切断された端面を有すると共に該Y軸に平行に形成されたオリエンテーションフラットを有する42°rotationYインゴットの端面から、生成すべきウエーハの厚みに相当する深さの位置にリチウムタンタレートに対して透過性を有する波長のレーザー光線の集光点を位置付けて照射し相対的に加工送りしながら改質層を形成する改質層形成工程と、
外力を付与しインゴットからウエーハを剥離しウエーハを生成するウエーハ生成工程と、から少なくとも構成され、
該改質層形成工程において改質層を形成する際、オリエンテーションフラットに対して45°、又は135°の方向にレーザー光線を相対的に加工送りした場合に縦方向に伸びるいずれのクラックよりも短い縦方向のクラックを生じさせ、且つ、オリエンテーションフラットに対して45°、又は135°の方向にレーザー光線を相対的に加工送りした場合に横方向に伸びるいずれのクラックよりも長い横方向のクラックを生じさせる、オリエンテーションフラットに対して0°の方向又は90°の方向のいずれかを選択してレーザー光線を相対的に加工送りするウエーハ生成方法。 - 生成されたウエーハの剥離面およびインゴットの剥離面を研削して平坦化する研削工程を含む請求項1に記載のウエーハ生成方法。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016001647A JP6654435B2 (ja) | 2016-01-07 | 2016-01-07 | ウエーハ生成方法 |
TW105138923A TWI699269B (zh) | 2016-01-07 | 2016-11-25 | 晶圓生成方法 |
MYPI2016704615A MY183580A (en) | 2016-01-07 | 2016-12-14 | Wafer production method |
SG10201610635SA SG10201610635SA (en) | 2016-01-07 | 2016-12-20 | Wafer production method |
CN201611224048.6A CN107030905B (zh) | 2016-01-07 | 2016-12-27 | 晶片生成方法 |
KR1020160180043A KR102527029B1 (ko) | 2016-01-07 | 2016-12-27 | 웨이퍼 생성 방법 |
DE102016226297.1A DE102016226297A1 (de) | 2016-01-07 | 2016-12-29 | Waferherstellungsverfahren |
US15/397,309 US10774445B2 (en) | 2016-01-07 | 2017-01-03 | Wafer production method |
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JP2016001647A JP6654435B2 (ja) | 2016-01-07 | 2016-01-07 | ウエーハ生成方法 |
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JP2017121742A JP2017121742A (ja) | 2017-07-13 |
JP6654435B2 true JP6654435B2 (ja) | 2020-02-26 |
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US (1) | US10774445B2 (ja) |
JP (1) | JP6654435B2 (ja) |
KR (1) | KR102527029B1 (ja) |
CN (1) | CN107030905B (ja) |
DE (1) | DE102016226297A1 (ja) |
MY (1) | MY183580A (ja) |
SG (1) | SG10201610635SA (ja) |
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JP7034683B2 (ja) * | 2017-11-29 | 2022-03-14 | 株式会社ディスコ | 剥離装置 |
JP6959120B2 (ja) * | 2017-12-05 | 2021-11-02 | 株式会社ディスコ | 剥離装置 |
US10388526B1 (en) | 2018-04-20 | 2019-08-20 | Semiconductor Components Industries, Llc | Semiconductor wafer thinning systems and related methods |
US11121035B2 (en) | 2018-05-22 | 2021-09-14 | Semiconductor Components Industries, Llc | Semiconductor substrate processing methods |
US10896815B2 (en) | 2018-05-22 | 2021-01-19 | Semiconductor Components Industries, Llc | Semiconductor substrate singulation systems and related methods |
US20190363018A1 (en) | 2018-05-24 | 2019-11-28 | Semiconductor Components Industries, Llc | Die cleaning systems and related methods |
US10468304B1 (en) | 2018-05-31 | 2019-11-05 | Semiconductor Components Industries, Llc | Semiconductor substrate production systems and related methods |
US11830771B2 (en) | 2018-05-31 | 2023-11-28 | Semiconductor Components Industries, Llc | Semiconductor substrate production systems and related methods |
JP7266398B2 (ja) * | 2018-12-11 | 2023-04-28 | 株式会社ディスコ | 切削装置及び切削装置を用いたウエーハの加工方法 |
US11024501B2 (en) | 2018-12-29 | 2021-06-01 | Cree, Inc. | Carrier-assisted method for parting crystalline material along laser damage region |
US10562130B1 (en) | 2018-12-29 | 2020-02-18 | Cree, Inc. | Laser-assisted method for parting crystalline material |
US10576585B1 (en) | 2018-12-29 | 2020-03-03 | Cree, Inc. | Laser-assisted method for parting crystalline material |
US10611052B1 (en) | 2019-05-17 | 2020-04-07 | Cree, Inc. | Silicon carbide wafers with relaxed positive bow and related methods |
CN111992903A (zh) * | 2020-08-24 | 2020-11-27 | 松山湖材料实验室 | 激光同步剥离晶圆的方法 |
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