JP6070291B2 - LIGHT SOURCE DEVICE, PROJECTOR, AND LIGHT SOURCE DEVICE CONTROL METHOD - Google Patents

Description

  The present invention relates to a light source device, a projector, and a program.

  In the case of a light source using a solid light source, a large number of light-emitting elements are connected in series to a power supply output and driven by current control in many cases. If one light emitting element fails in this connection state with the terminals open, all normal light emitting elements connected in series cannot be driven. As a countermeasure, it has been proposed to connect a Zener diode that operates at a voltage higher than the voltage between terminals at the time of driving each light emitting element in parallel with the light emitting element (see, for example, Patent Document 1 and Patent Document 2). . In this case, when the light emitting device fails in the open mode, the Zener diode is turned on to pass current, and the solid light source is driven by supplying current to the other series light emitting devices.

JP 2011-222124 A JP 2009-59835 A

  Here, when a Zener diode is used, the Zener diode generates heat, and thus heat radiation is required. Instead of the Zener diode, a self-on element such as a thyristor or a triac that starts operation at a voltage higher than the voltage between terminals at the time of driving each light emitting element may be connected in parallel with the light emitting element. In the case of a self-on element, heat generation is less than that of a Zener diode, but a large inrush current flows from the drive power supply side to the light emitting element due to a sudden drop in terminal voltage during operation. Further, once the driving is stopped, the protective short-circuiting element is turned off, and when it is driven again, it is turned on again and an inrush current flows. The repetition of the inrush current causes deterioration of other normal light emitting elements. In particular, when PWM driving is performed for dimming, for example, there is a problem that an inrush current flows for each PWM driving pulse and the light emitting element is significantly deteriorated.

  Accordingly, one embodiment of the present invention has been made in view of the above problem, and even when any light emitting element among a plurality of light emitting elements connected in series has an open failure, the light emission of other light emitting elements is maintained. It is another object of the present invention to provide a light source device, a projector, and a program that can reduce deterioration of a light emitting element.

  (1) In one embodiment of the present invention, a plurality of light-emitting elements connected in series and at least two light-emitting elements among the plurality of light-emitting elements are connected in parallel, and both ends of the light-emitting elements are short-circuited. A plurality of possible short-circuit units, a detection unit that detects a light emitting element that has failed open, a storage processing unit that stores light emitting element identification information for identifying the light emitting element detected by the detection unit in a storage device, and the storage device By referring to the stored light emitting element identification information, the short-circuit portion connected in parallel to the light emitting element is controlled so that both ends of the light emitting element identified by the referenced light emitting element identification information remain short-circuited. And a control unit. As a result, even when any light emitting element among a plurality of light emitting elements connected in series has an open failure, the light emission of the other light emitting elements can be maintained by short-circuiting the open light emitting element. Can do. Furthermore, by keeping both ends of the light emitting element short-circuited, it is possible to prevent the inrush current from flowing repeatedly through the light emitting element, and to reduce the deterioration of the light emitting element caused by the inrush current.

  (2) One embodiment of the present invention is the above-described light source device, wherein the short-circuit unit includes a FET connected in parallel to a light-emitting element connected in parallel to the light source device, and the drain of the FET By making the source conductive, both ends of the light emitting elements connected in parallel with each other are short-circuited. As a result, the FET can short-circuit both ends of the light emitting element that has failed to open at approximately 0 ohms, so that the loss in the FET becomes approximately 0 W and heat generation can be reduced. As a result, there is an advantage that the heat dissipation structure of the short-circuit portion is unnecessary. In addition, the FET has the advantage that the options are wider than those of the thyristor, and the parts can be selected according to the required performance, cost, and size.

  (3) Moreover, 1 aspect of this invention is the above-mentioned light source device, Comprising: When the said detection part short-circuits the both ends of one light emitting element among the said several light emitting elements to the said short circuit part, When a current flows through a plurality of light emitting elements, it is detected that the shorted light emitting element has an open failure. As a result, when one light emitting element is short-circuited, if a current flows through a plurality of light emitting elements connected in series, it is detected that the one light emitting element has an open failure. It is possible to reliably detect the light emitting element.

  (4) According to one embodiment of the present invention, a plurality of light emitting elements connected in series, a modulation unit that modulates light emitted from the light emitting elements, and at least two of the plurality of light emitting elements A plurality of short-circuit portions connected in parallel to each other and capable of short-circuiting both ends of each of the light-emitting elements, a detection unit that detects an open-circuit failure light-emitting element, and light emission that identifies the light-emitting element detected by the detection unit A projector comprising: a storage processing unit in a storage device that stores element identification information; and a control unit that controls the short-circuit unit to short-circuit both ends of the light-emitting elements identified by the light-emitting element identification information stored in the storage device. It is. As a result, even when any light emitting element among a plurality of light emitting elements connected in series has an open failure, the light emission of the other light emitting elements can be maintained by short-circuiting the open light emitting element. Can do. Furthermore, by keeping both ends of the light emitting element short-circuited, it is possible to prevent the inrush current from flowing repeatedly through the light emitting element, and to reduce the deterioration of the light emitting element caused by the inrush current.

  (5) According to one embodiment of the present invention, a plurality of light emitting elements connected in series and at least two light emitting elements among the plurality of light emitting elements are connected in parallel, and both ends of the light emitting elements are short-circuited. A light source device comprising a plurality of short-circuitable parts, wherein a detection step for detecting a light emitting element that has failed to open and light emitting element identification information for identifying the light emitting element detected in the detection step are stored in a storage device The storage processing step and the light emitting element identification information stored in the storage device are referenced, and the light emitting elements identified by the referenced light emitting element identification information are connected in parallel so as to short-circuit both ends. And a control step for controlling the short-circuit portion. As a result, even when any light emitting element among a plurality of light emitting elements connected in series has an open failure, the light emission of the other light emitting elements can be maintained by short-circuiting the open light emitting element. Can do. Furthermore, by keeping both ends of the light emitting element short-circuited, it is possible to prevent the inrush current from flowing repeatedly through the light emitting element, and to reduce the deterioration of the light emitting element caused by the inrush current.

It is a schematic block diagram which shows the structure of the light source device in this embodiment. It is a flowchart which shows an example of the flow of a process of the light source device in this embodiment. It is a schematic block diagram which shows the structure of a projector.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 is a schematic block diagram showing the configuration of the light source device 1 in the present embodiment. The light source device 1 includes a driving power source 2, a CPU (Central Processing Unit) 5, a storage device 6, six light emitting elements including light emitting elements 31 to 36, an nMOS (Metal-Oxide-Semiconductor) transistor Q3, and a short circuit unit 41 to 46. 6 short-circuit parts are provided.

  The drive power supply 2 is a constant current source as an example. The drive power supply 2 supplies a drive current to the light emitting element 31. The drive power supply 2 supplies a PWM signal to the gate of the nMOS transistor Q3. The drive power source 2 changes the duty cycle of the PWM signal, thereby changing the duty cycle of the constant current flowing through the light emitting elements 31 to 36 to substantially change the average current of the light emitting elements 31 to 36. Thereby, the drive power supply 2 can adjust the light emission intensity of the light emitting elements 31-36. Here, the drive power supply 2 includes an output monitoring unit 21. The output monitoring unit 21 monitors the drive current output from the drive power supply 2. For example, the output monitoring unit 21 outputs drive current information indicating the drive current to the CPU 5.

  The CPU 5 functions as a detection unit 51, a storage processing unit 52, and a control unit 53. The CPU 5 functions as a detection unit 51 that detects a light emitting element that has failed open. In that case, CPU5 which functions as the detection part 51 short-circuits one light emitting element among several light emitting elements to a certain short circuit part, when it detects that an electric current no longer flows into the light emitting elements 31-36. In this case, when a current flows through a plurality of light emitting elements connected in series, the CPU 5 detects that the shorted light emitting element has an open failure.

  Specifically, for example, the CPU 5 detects that the current does not flow to the light emitting elements 31 to 36 using the drive current indicated by the drive current information input from the output monitoring unit 21. For example, when the CPU 5 detects that no current flows through the light emitting elements 31 to 36, the CPU 5 determines that one of the light emitting elements 31 to 36 has an open failure, and once the driving current of the driving power source 2 is reached. Stop the output of. Then, for example, the CPU 5 turns on a field effect transistor (hereinafter referred to as FET) connected in parallel to one light emitting element and short-circuits both ends of the light emitting element, and again drives the drive power supply. 2 is driven. Here, each of the short-circuit portions 41 to 46 includes one FET. The CPU 5 monitors the drive current of the drive power supply 2 using the drive current information and determines whether the drive current is flowing. When the drive current is not flowing, the CPU 5 sequentially repeats the same short circuit process and determination process for the next light emitting element. When the drive current flows, it is determined that the light-emitting element that has been short-circuited most recently has an open failure, and thereafter, the FET connected in parallel to the light-emitting element is kept on.

  When the CPU 5 detects that the applied voltage of the driving power source 2 has risen above a certain level, the CPU 5 determines that one of the light emitting elements 31 to 36 has an open failure, and once the driving power source 2 The power output may be stopped. In that case, the CPU 5 may monitor the drive voltage of the drive power supply 2.

  The CPU 5 functions as a storage processing unit 52 that causes the storage device 6 to store light emitting element identification information that identifies a light emitting element that has failed to open. The storage device 6 holds light emitting element identification information.

  Next, processing of the CPU 5 that functions as the control unit 53 will be described. The CPU 5 refers to the light emitting element identification information stored in the storage device 6 and is connected in parallel to the light emitting element so that both ends of the light emitting element identified by the referenced light emitting element identification information remain short-circuited. It functions as the control part 53 which controls the short circuit part which is. Specifically, for example, the CPU 5 determines whether or not the light emitting element identification information is stored in the storage device 6 when the main power source is switched from the off state to the on state.

  When the light emitting element identification information is stored in the storage device 6, the CPU 5 refers to the light emitting element identification information stored in the storage device 6, for example. CPU5 controls the short circuit part connected in parallel with the light emitting element so that the both ends of the light emitting element identified by the referred light emitting element identification information may be short-circuited. Specifically, for example, the CPU 5 supplies a FET gate drive signal whose voltage is at a low level (for example, 0 V) to the short-circuit portion connected in parallel to the light emitting element that has failed to open. Further, the CPU 5 supplies a FET gate drive signal whose voltage is at a high level (for example, 5 V) to a short-circuit portion other than the short-circuit portion connected in parallel to the light emitting element that has failed open. As a result, only the short-circuit portion supplied with the low-level FET gate drive signal can short-circuit both ends of the light-emitting element.

  Then, the CPU 5 causes the drive power supply 2 to output a drive current. Thus, after detecting the open failure, the CPU 5 always bypasses the current flowing into the open failure light emitting element by always short-circuiting both ends of the open failure light emitting element. Supplied to the light emitting element of the stage. As a result, the drive power supply 2 can supply a current to the light emitting element other than the light emitting element that has failed open.

  The light emitting elements 31 to 36 are laser diodes (LD) as an example. The light emitting elements 31 to 36 are connected in series in order. Specifically, the light emitting element 31 has an anode connected to the drive power supply 2 and a cathode connected to the anode of the light emitting element 32 at the subsequent stage. The light emitting elements 32 to 35 have an anode connected to the cathode of the preceding light emitting element, and the cathode connected to the anode of the succeeding light emitting element. The light emitting element 36 has an anode connected to the preceding light emitting element 35 and a cathode connected to the drain of the nMOS transistor Q3. The light emitting elements 31 to 36 may be light emitting diodes.

  The nMOS transistor Q3 is an n-channel field effect transistor. The nMOS transistor Q3 has a gate connected to the drive power supply 2, a drain connected to the cathode of the light emitting element, and a source connected to the ground (GND). In the nMOS transistor Q3, a current flows from the drain to the source when the PWM signal input from the drive power supply 2 is at a high level. However, when the PWM signal input from the drive power supply 2 is at a low level, a current flows from the drain to the source. Not flowing. Thereby, only when the PWM signal is at a high level, a current flows through the light emitting elements 31 to 36 and the light emitting elements 31 to 36 emit light.

  The short-circuit portions 41 to 46 each short-circuit both ends of the light-emitting elements connected in parallel under the control of the CPU 5. At that time, each of the short-circuit portions 41 to 46 includes a FET connected in parallel with the light emitting element connected in parallel to each other, and the drain and the source of the FET are brought into a conductive state so that they are connected in parallel. Short-circuit both ends of the light emitting element. Specifically, for example, when the FET gate drive signal input from the CPU 5 is at a low level, the short-circuit portions 41 to 46 short-circuit both ends of the light emitting elements connected in parallel.

Next, details of the circuit configuration of the short-circuit portion 41 will be described. In addition, since the structure of the short circuit parts 42 and 43 is the same as that of the circuit structure of the short circuit part 41, the description is abbreviate | omitted. The short circuit unit 41 includes an FET gate drive circuit 411 and a short circuit 412.
The FET gate drive circuit 411 supplies a low level voltage to the short circuit 412 when the FET gate drive signal supplied from the CPU 5 is at a low level. Here, the FET gate drive circuit 411 includes a resistor R14, a photocoupler F1, a resistor R15, and a resistor R16. As an example, the photocoupler F1 in this embodiment includes a light emitting diode D1 and a phototransistor Q1.

The light emitting diode D1 has an anode connected to a 5.0V potential line and a cathode connected to the CPU 5 via a resistor R14.
The phototransistor Q1 has a collector connected to one end of the resistor R16 and an emitter connected to the cathode of the light emitting element 33. One end of the resistor R15 is connected to the high potential line H41 of the light emitting element 31, and the other end of the resistor R15 is connected to the gate of a pMOS transistor Q12 described later and the other end of the resistor R16. Here, the high potential line H <b> 41 is a wiring connected to the anode of the light emitting element 31.

  The short circuit 412 shorts both ends of the light emitting element 31 when a low level voltage is supplied from the FET gate drive circuit 411. Here, the short circuit 412 includes a pMOS transistor Q12 as an example of an FET. In the pMOS transistor Q12, the gate is connected to the high potential line H41 via the resistor R15, and is connected to the collector of the phototransistor Q1 via the resistor R16. In the pMOS transistor Q12, the source is connected to the high potential line H41, and the drain is connected to the low potential line L41. Here, the low potential line L41 is a wiring connected to the cathode of the light emitting element 31. In this embodiment, the short circuit 412 includes the pMOS transistor Q12 as an example. However, the present invention is not limited to this, and the short circuit 412 may include another p-channel FET instead of the pMOS transistor Q12.

  Subsequently, the operation of the short-circuit portion 41 will be described. First, operation | movement of the short circuit part 41 in case the light emitting element 31 is operate | moving normally is demonstrated. The CPU 5 supplies a high-level (for example, 5V) FET gate drive signal to the diode D1 via the resistor R14. Since the voltage across the diode D1 becomes 0V and no current flows through the diode D1, the diode D1 does not emit light. As a result, the phototransistor Q1 is turned off, the gate potential of the pMOS transistor Q12 is at a high level close to the source potential, and the pMOS transistor Q12 is turned off. As a result, both ends of the light emitting element 31 are not short-circuited.

  Next, the operation of the short-circuit unit 41 when the light emitting element 31 has an open failure (cut) will be described. When the CPU 5 detects that the light emitting element 31 has an open failure, the CPU 5 supplies a low-level (for example, 0 V) FET gate drive signal to the diode D1 via the resistor R14. The voltage across the diode D1 becomes about 5V, and the current flows through the diode D1, so that the diode D1 emits light. As a result, the phototransistor Q1 is turned on, and the collector and emitter of the phototransistor Q1 are brought into conduction. As a result, the gate potential of the pMOS transistor Q12 is pulled to the potential of the cathode of the light emitting element 33 and becomes low level, so that the pMOS transistor Q12 is turned on.

  As described above, when it is detected that the light emitting element 31 has an open failure, the resistance values of the resistors R15 and R16 are determined in advance so that the gate voltage of the pMOS transistor Q12 becomes low level. When the pMOS transistor Q12 is turned on, a current flows between the source and drain of the pMOS transistor Q12, so that both ends of the light emitting element 31 can be short-circuited. Thereby, the pMOS transistor Q12 bypasses the current flowing into the light emitting element 31 that has failed to open and supplies it to the light emitting element 32, so that the drive power supply 2 drives the other light emitting elements 32 to 36 connected in series. Can do.

In this embodiment, the gate of the pMOS transistor Q12 is lowered by two stages via the resistor R16 in order to make the pMOS transistor Q12 completely turned on by lowering the gate voltage of the pMOS transistor Q12 by 5V or more than the source voltage. The cathode of the light emitting element 33 is connected. Thereby, the pMOS transistor Q12 can lower the gate voltage in the range of 6.6 V to 10 V, for example, from the source voltage.
In the present embodiment, as an example, the gate of the pMOS transistor Q12 is described as being connected to the cathode of the light emitting element 33 two stages below. However, the present invention is not limited to this, and the gate of the pMOS transistor Q12 has one or three stages. It may be connected to the cathode of the lower light-emitting element in stages or more.

Next, details of the circuit configuration of the short-circuit portion 46 will be described. In addition, since the structure of the short circuit parts 44 and 45 is the same as that of the circuit structure of the short circuit part 46, the description is abbreviate | omitted. The short circuit unit 46 includes an FET gate drive circuit 461 and a short circuit 462.
The FET gate drive circuit 461 supplies a low level voltage to the short circuit 462 when the FET gate drive signal supplied from the CPU 5 is at a low level. Here, the FET gate drive circuit 461 includes a resistor R24, a photocoupler F2, a resistor R25, and a resistor R26. As an example, the photocoupler F2 in this embodiment includes a light emitting diode D2 and a phototransistor Q2.

The light emitting diode D2 has an anode connected to the 5.0V potential line and a cathode connected to the CPU 5 via a resistor R24.
The phototransistor Q2 has a collector connected to the anode of the light emitting element 34, and an emitter connected to the gate of an nMOS transistor Q22, which will be described later, and one end of a resistor R25 via a resistor R26. One end of the resistor R25 is connected to the other end of the gate and resistor R26 of the n MOS transistor Q22, which will be described later, the other end of the resistor R25 is connected to the low potential line L46 of the light emitting element 36. Here, the low potential line L46 is a wiring connected to the cathode of the light emitting element 36.

  The short circuit 462 shorts both ends of the light emitting element 31 when a low level voltage is supplied from the FET gate drive circuit 461. Here, the short circuit 462 includes an nMOS transistor Q22 as an example of an FET. The nMOS transistor Q22 has a gate connected to the low potential line L46 via the resistor R25, and is connected to the emitter of the phototransistor Q2 via the resistor R26. The nMOS transistor Q22 has a source connected to the low potential line L46 and a drain connected to the high potential line H46. Here, the high potential line H <b> 46 is a wiring connected to the anode of the light emitting element 36. In this embodiment, the short circuit 462 includes the nMOS transistor Q22 as an example. However, the present invention is not limited to this, and the short circuit 412 may include another n-channel FET instead of the nMOS transistor Q22.

  Next, the operation of the short circuit unit 46 will be described. First, the operation of the short circuit section 46 when the light emitting element 36 is operating normally will be described. The CPU 5 supplies a high-level (for example, 5V) FET gate drive signal to the diode D2 via the resistor R24. Since the voltage across the diode D2 becomes 0V and no current flows through the diode D2, the diode D2 does not emit light. As a result, the phototransistor Q2 is turned off, the gate potential of the nMOS transistor Q22 is close to the source potential and at a low level, and the nMOS transistor Q22 is turned off. As a result, both ends of the light emitting element 36 are not short-circuited.

  Next, the operation of the short-circuit portion 46 when the light emitting element 36 has an open failure (cut) will be described. When the CPU 5 detects that the light emitting element 36 has failed to open, it supplies a low level (eg, 0 V) FET gate drive signal to the diode D2 via the resistor R24. The voltage across the diode D2 becomes about 5V, and the current flows through the diode D2, so that the diode D2 emits light. As a result, the phototransistor Q2 is turned on, and the collector and emitter of the phototransistor Q2 are brought into conduction. As a result, the gate potential of the nMOS transistor Q22 is pulled up to the potential of the anode of the light emitting element 34, and the nMOS transistor Q22 is turned on.

In this way, when it is detected that the light emitting element 36 has an open failure, the resistance values of the resistors R25 and R26 are determined in advance so that the gate voltage of the nMOS transistor Q22 becomes high level. When the nMOS transistor Q22 is turned on, a current flows between the source and drain of the nMOS transistor Q22, so that both ends of the light emitting element 36 can be short-circuited. As a result, the nMOS transistor Q22 bypasses the current flowing into the light emitting element 36 that has failed to open and supplies it to the drain of the nMOS transistor Q3, so that the drive power supply 2 drives the other light emitting elements 31 to 35 connected in series. can do.

In the present embodiment, in order to fully on the nMOS transistor Q22 the gate voltage is higher than 5V than the source voltage of the nMOS transistor Q22, the gate of the n MOS transistor Q22, 2 via the resistor R26 rows above The light emitting element 34 is connected to the anode. Thereby, the nMOS transistor Q22 can make the gate voltage higher than the source voltage in a range of 6.6V to 10V, for example.
In this embodiment, the gate of the nMOS transistor Q22 is described as being connected to the anode of the light emitting element 34 on the second stage as an example. However, the present invention is not limited to this, and the gate of the nMOS transistor Q22 is one stage or three. It may be connected to the anode of the upper light-emitting element in stages or more.

FIG. 2 is a flowchart illustrating an example of a processing flow of the light source device 1 in the present embodiment.
(Step S101) First, the CPU 5 uses the drive current information input from the output monitoring unit 21 to determine whether a drive current is flowing. If the drive current is flowing (YES), it stands by as it is. When the drive current is not flowing (NO), the process proceeds to step S102.
(Step S <b> 102) The CPU 5 stops the output of the drive current of the drive power supply 2.
(Step S103) Next, the CPU 5 initializes the index i to 1.
(Step S104) Next, the CPU 5 short-circuits both ends of the light emitting element 3i (for example, when the index is 1, the light emitting element 31).
(Step S105) Next, the CPU 5 newly acquires drive current information from the output monitoring unit 21, and determines whether or not a drive current is flowing using the acquired drive current information. If the drive current is flowing (YES), the process proceeds to step S107. When the drive current is not flowing (NO), the process proceeds to step S106.
(Step S106) The CPU 5 increments the index i by 1, and returns to the process of Step S104.
(Step S107) The CPU 5 causes the storage device 6 to store light emitting element identification information for identifying the light emitting element 3i that has been short-circuited most recently.
(Step S108) Next, the CPU 5 controls the short-circuit portion in which the light emitting elements are connected in parallel so that both ends of the light emitting elements identified by the light emitting element identification information are always short-circuited.
(Step S109) Next, the CPU 5 drives the drive power supply 2. Above, the process of this flowchart is complete | finished.

  In addition, even if all the light emitting elements 31 to 36 are short-circuited in the flowchart of FIG. 2, if a drive current does not flow to the light emitting elements 31 to 36, there is a possibility that a plurality of light emitting elements are simultaneously open failure. The CPU 5 may determine whether or not a drive current flows through the light emitting elements 31 to 36 by simultaneously short-circuiting two of the light emitting elements 31 to 36. In that case, when the CPU 5 determines that the drive current does not flow, the combination of the two light emitting elements is sequentially changed, and each time the change is made, the changed two light emitting element sets are short-circuited at the same time. It may also be determined whether or not a drive current flows through. On the other hand, if it is determined that the drive current has flowed, the CPU 5 may control the short-circuit portion in which the two light emitting elements are connected in parallel so that both ends of the two light emitting elements are always short-circuited.

  Furthermore, even if all possible combinations of two light emitting elements are short-circuited, if no drive current flows through the light emitting elements 31 to 36, it is possible that three or more light emitting elements are simultaneously open-failed. May determine whether or not a driving current flows through the light emitting elements 31 to 36 by simultaneously short-circuiting three of the light emitting elements 31 to 36. In that case, when the CPU 5 determines that the drive current is not flowing, the combination of the three light emitting elements is sequentially changed, and each time the change is made, the changed three light emitting element sets are short-circuited at the same time. It may also be determined whether or not a drive current flows through. On the other hand, when it is determined that the drive current has flowed, the CPU 5 may control the short-circuit portion in which the three light emitting elements are connected in parallel so as to always short-circuit both ends of the three light emitting elements in that case.

  Furthermore, even when all possible combinations of the three light emitting elements are short-circuited, if no drive current flows through the light emitting elements 31 to 36, it is possible that four or more light emitting elements are simultaneously open-failed. The number of light-emitting elements that are simultaneously short-circuited may be increased by one, and the same processing may be performed as when three light-emitting elements are simultaneously short-circuited. In that case, the CPU 5 may increase the number of light-emitting elements that are simultaneously short-circuited up to six, which is the total number of light-emitting elements.

  As described above, in this embodiment, when the CPU 5 detects an open failure of the light emitting element 31, the gate potential of the pMOS transistor Q12 can be set to a low level by causing the diode D1 to emit light and turning on the phototransistor Q1. it can. Since the gate of the pMOS transistor Q12 is connected to the cathode of the light emitting element 33, the FET gate drive circuit 411 can supply a sufficient on-gate voltage to the pMOS transistor Q12. Therefore, by supplying a sufficient on-gate voltage to the pMOS transistor Q12, the MOS transistor Q12 can keep both ends of the light emitting element that has failed to open at approximately 0 ohms short-circuited. As a result, the loss in the pMOS transistor Q12 during the series of protection operations described above becomes almost 0 W, and heat generation can be reduced. Similarly, the loss in the FETs included in the short-circuit portions 42 to 46 is almost 0 W, and heat generation can be reduced.

  In the conventional method described in Patent Document 1, heat is generated in the Zener diode due to a larger power loss than the light emitting element during normal operation, and thus a structure for radiating the heat is required. Even if a self-on element is connected in parallel with the light-emitting element instead of the zener diode, the self-on element is smaller than the zener diode but continues to be on while the current is flowing, resulting in power loss. Heat is generated. On the other hand, in this embodiment, since heat is hardly generated by short-circuiting the light emitting element with the FET, there is an advantage that the heat dissipation structure of the short circuit becomes unnecessary compared with the conventional method.

Further, since there are many types of FETs compared to thyristors, there is an advantage that parts can be selected in accordance with required performance, cost, and size.
Further, the CPU 5 controls the short-circuit portion 41 to always turn on the pMOS transistor Q12 connected to the light emitting element 31 that is in the open failure state. Thereby, even when the driving of the light emitting elements 31 to 36 is started again, the driving starts from the ON state of the FET, so that it is possible to prevent the inrush current from flowing repeatedly through the light emitting elements 31 to 36. As a result, deterioration of the light emitting elements 31 to 36 caused by the inrush current can be reduced. Similarly, the protection circuits 22 to 26 can reduce deterioration of the light emitting elements 31 to 36 caused by the inrush current.
Further, the CPU 5 can determine the connection position of the light emitting element that has failed to open, so that, for example, by correcting light amount unevenness or light source heat generation in the operation after the failure, the CPU 5 can compensate for the deterioration of the optical characteristics due to the failure to some extent. Can do.

In addition, although this embodiment demonstrated the structure provided with the six short circuit parts 41-46 which can short-circuit each both ends of the light emitting elements 31-36 as an example, it is not restricted to this. What is necessary is just to provide the some short circuit part which is connected in parallel with each of at least 2 light emitting elements among several light emitting elements, and can short-circuit the both ends of each of those light emitting elements.
Further, the projector may be configured to include the light source device 1 of the present embodiment. FIG. 3 is a schematic block diagram showing the configuration of the projector 7. For example, as shown in FIG. 3, the projector 7 modulates light emitted from the light source device 1 and the light emitting elements 31 to 36 of the light source device 1 according to image data, and forms a modulated image light L. 71 and a projection optical system 72 that projects the image light L onto a screen (not shown).
Further, the program for executing each process of the CPU 5 of the present embodiment is recorded on a computer-readable recording medium, and the program recorded on the recording medium is read by the computer system and executed, whereby the CPU 5 You may perform the various process mentioned above.

  Here, the “computer system” may include an OS and hardware such as peripheral devices. Further, the “computer system” includes a homepage providing environment (or display environment) if a WWW system is used. The “computer-readable recording medium” means a flexible disk, a magneto-optical disk, a ROM, a writable nonvolatile memory such as a flash memory, a portable medium such as a CD-ROM, a hard disk built in a computer system, etc. This is a storage device.

  Further, the “computer-readable recording medium” means a volatile memory (for example, DRAM (Dynamic) in a computer system which becomes a server or a client when a program is transmitted through a network such as the Internet or a communication line such as a telephone line. Random Access Memory)) that holds a program for a certain period of time is also included. The program may be transmitted from a computer system storing the program in a storage device or the like to another computer system via a transmission medium or by a transmission wave in the transmission medium. Here, the “transmission medium” for transmitting the program refers to a medium having a function of transmitting information, such as a network (communication network) such as the Internet or a communication line (communication line) such as a telephone line. The program may be for realizing a part of the functions described above. Furthermore, what can implement | achieve the function mentioned above in combination with the program already recorded on the computer system, and what is called a difference file (difference program) may be sufficient.

  As mentioned above, although embodiment of this invention was explained in full detail with reference to drawings, a specific structure is not restricted to this embodiment. Each configuration in each embodiment, a combination thereof, and the like are examples, and the addition, omission, replacement, and other changes of the configuration can be made without departing from the spirit of the present invention. Further, the present invention is not limited by the embodiments, and is limited only by the scope of the claims.

DESCRIPTION OF SYMBOLS 1 Light source device 2 Drive power supply 5 CPU (Central Processing Unit)
6 Storage Device 7 Projector 31-36 Light Emitting Element 41-46 Short-Circuit Unit 51 Detection Unit 52 Storage Processing Unit 53 Control Unit 71 Modulation Unit 72 Projection Optical System 411, 461 FET Gate Drive Circuit 412, 462 Short-Circuit Circuit

Claims (7)

A plurality of light emitting elements connected in series;
At least are connected in parallel to each of the two light emitting elements, a plurality of short-circuit portions Ru are short-circuited at both ends of the light-emitting elements connected among the plurality of light emitting elements,
A detection unit for detecting a light emitting element that has an open failure among the plurality of light emitting elements ;
A storage device for storing a light emitting element identification information for identifying the light-emitting elements open faults detected by the detection unit,
Based on the light emitting element identification information stored in the storage device, a control unit that controls a short circuit unit connected to the open failure light emitting element so that a short circuit between both ends of the open failure light emitting element is maintained ;
A light source device comprising: The light source device according to claim 1,
Each short- circuit portion among the plurality of short- circuit portions ,
Itself has a connected FET in parallel with a light emitting element connected,
By the drain and source of the FET to conducting state, the light source device to short-circuit both ends of the light emitting elements are connected. The light source device according to claim 1 or 2,
The control unit detects whether or not a current flows through the plurality of light emitting elements;
Wherein the detection unit includes at least one short-circuit portion of the plurality of short-circuit portion is not short-circuit the two ends of the light emitting element itself is connected, and that the current is flowing to the plurality of light emitting elements by the control unit If detected, the light source device for detecting a shorted light-emitting element is open fault. The light source device according to any one of claims 1 to 3,
The plurality of short-circuit portions are light source devices connected in parallel to each of the plurality of light-emitting elements. The light source device according to any one of claims 1 to 4,
When the plurality of light emitting elements are re-driven after the light emitting element that has failed to be opened is short-circuited by the short circuit unit, the control unit is configured to detect both ends of the light emitting element that has failed to open based on the light emitting element identification information. A light source device that controls the short-circuit portion so that a short circuit is maintained. A light source device according to any one of claims 1 to 5,
A modulator for modulating light emitted from the light source device ;
A projection optical system that projects the light modulated by the modulation unit;
A projector comprising: A light source device comprising: a plurality of light emitting elements connected in series; and a plurality of short-circuit portions that are connected in parallel to at least two light emitting elements among the plurality of light emitting elements and short-circuit both ends of the connected light emitting elements. Control method,
Detecting a light emitting element that has an open failure among the plurality of light emitting elements;
Storing light emitting element identification information for identifying the detected open failure light emitting element;
Based on the stored light emitting element identification information, controlling a short-circuit portion connected to the light emitting element that has failed to be opened so that a short circuit between both ends of the light emitting element that has failed to open is maintained;
A method for controlling a light source device.

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