JP5262478B2 - Etching solution for transparent electrodes - Google Patents
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Description
本発明は透明電極用のエッチング液に関する。 The present invention relates to an etching solution for transparent electrodes.
透明電極はフラットパネルディスプレー、太陽電池等の製造に欠かせないものである。 Transparent electrodes are indispensable for the production of flat panel displays, solar cells and the like.
このような透明電極は、ITO(インジウム−スズ酸化物)膜、IZO(インジウム−酸化亜鉛)膜等の透明導電膜上にフォトレジストを塗布し、露光、現像後、フォトレジストをマスクとし、エッチング液を用いてエッチング後、残存するフォトレジストを剥離して形成される。ITOやIZOは非常に高価であるため、新しい透明電極が種々提案されている。それらの中でもZAO(アルミニウム酸化物添加亜鉛酸化物)膜は抵抗が低く、注目されている。 Such a transparent electrode is formed by applying a photoresist on a transparent conductive film such as an ITO (indium-tin oxide) film or an IZO (indium-zinc oxide) film, exposing and developing, and then etching using the photoresist as a mask. After etching using a liquid, the remaining photoresist is peeled off. Since ITO and IZO are very expensive, various new transparent electrodes have been proposed. Among them, a ZAO (aluminum oxide-added zinc oxide) film has been attracting attention because of its low resistance.
ITOを主成分とする透明電極(ITO透明電極)やIZOを主成分とする透明電極(IZO透明電極)用のエッチング液は種々提案されている(例えば、特許文献1、特許文献2参照)。また、ZAOを主成分とする透明電極(ZAO透明電極)のエッチング液としては、クエン酸を主成分とするエッチング液が提案されている程度である(例えば、特許文献3参照)。 Various etching solutions for transparent electrodes mainly composed of ITO (ITO transparent electrodes) and transparent electrodes mainly composed of IZO (IZO transparent electrodes) have been proposed (see, for example, Patent Document 1 and Patent Document 2). In addition, as an etching solution for a transparent electrode mainly containing ZAO (ZAO transparent electrode), an etching solution mainly containing citric acid has been proposed (see, for example, Patent Document 3).
ITO透明電極やIZO透明電極は高性能だが高価な透明電極であるため、コスト抑制を目的として、ITO(又はIZO)とZAOを併用する場合がある。この場合、ZAOをITO(又はIZO)と同一エッチング液でエッチングする必要がある。一般的にZAOはITO(又はIZO)より酸に溶解しやすく、例えば、燐酸、硝酸、酢酸の混合液のようなITO(又はIZO)用のエッチング液を使用すると、ZAOが100倍以上の高速でエッチングされてしまうため、エッチングを制御できない。 Since the ITO transparent electrode and the IZO transparent electrode are high-performance but expensive transparent electrodes, ITO (or IZO) and ZAO may be used together for the purpose of cost reduction. In this case, it is necessary to etch ZAO with the same etchant as ITO (or IZO). In general, ZAO is more soluble in acid than ITO (or IZO). For example, when an etching solution for ITO (or IZO) such as a mixture of phosphoric acid, nitric acid and acetic acid is used, ZAO is 100 times faster than ZOO. Etching cannot be controlled because of etching.
したがって、ITO(又はIZO)とZAOを併用した透明電極をエッチングするには、ZAOとITO(又はIZO)のエッチング速度差を小さくしなければならない。そこで、ZAOとITO(又はIZO)を同一液でエッチングできるエッチング液の開発が望まれていた。 Therefore, in order to etch a transparent electrode using both ITO (or IZO) and ZAO, the etching rate difference between ZAO and ITO (or IZO) must be reduced. Therefore, it has been desired to develop an etching solution that can etch ZAO and ITO (or IZO) with the same solution.
本発明は上記の課題に鑑みてなされたものであり、その第一の目的は、ZAO透明電極のエッチング液を提供することにある。第二の目的は、ITO透明電極(又はIZO透明電極)とZAO透明電極を同一液でエッチングできるエッチング液を提供することにある。 This invention is made | formed in view of said subject, The 1st objective is to provide the etching liquid of a ZAO transparent electrode. The second object is to provide an etching solution that can etch the ITO transparent electrode (or IZO transparent electrode) and the ZAO transparent electrode with the same solution.
本発明者らは、ZAO透明電極のエッチングについて鋭意検討した結果、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物と、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物を含有する水溶液が、ZAO透明電極をエッチングできるばかりでなく、ITO透明電極(又はIZO透明電極)とZAO透明電極を同一液でエッチングできることを見いだし、本発明を完成させるに至った。 As a result of intensive studies on etching of ZAO transparent electrodes, the present inventors have found that one or more compounds selected from the group consisting of hydrobromic acid and its salt, and a group consisting of hydrofluoric acid and its salt. It has been found that an aqueous solution containing one or two or more selected compounds can etch a ZAO transparent electrode, and can etch an ITO transparent electrode (or an IZO transparent electrode) and a ZAO transparent electrode with the same liquid. It came to complete.
すなわち、本発明は、以下に示すとおりの透明電極用のエッチング液及びそれを用いたエッチング方法である。 That is, this invention is an etching liquid for transparent electrodes as shown below, and an etching method using the same.
[1]臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物と、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物を含有する水溶液からなる透明電極用のエッチング液。 [1] From an aqueous solution containing one or more compounds selected from the group consisting of hydrobromic acid and salts thereof, and one or more compounds selected from the group consisting of hydrofluoric acid and salts thereof An etching solution for transparent electrodes.
[2]臭化水素酸の塩が、臭化水素酸アンモニウム及び臭化水素酸のアミン塩からなる群より選ばれる一種又は二種以上の化合物である上記[1]に記載のエッチング液。 [2] The etching solution according to the above [1], wherein the salt of hydrobromic acid is one or more compounds selected from the group consisting of ammonium hydrobromide and an amine salt of hydrobromic acid.
[3]フッ化水素酸の塩が、フッ化アンモニウム及びフッ化水素酸のアミン塩からなる群より選ばれる一種又は二種以上の化合物である上記[1]又は[2]に記載のエッチング液。 [3] The etching solution according to [1] or [2], wherein the salt of hydrofluoric acid is one or two or more compounds selected from the group consisting of ammonium fluoride and an amine salt of hydrofluoric acid. .
[4]エッチング液全体に対し、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.01〜10重量%の範囲、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.01〜10重量%の範囲で含まれる上記[1]乃至[3]のいずれかに記載のエッチング液。 [4] The group consisting of hydrofluoric acid and its salt in the range of 0.01 to 10% by weight of one or more compounds selected from the group consisting of hydrobromic acid and its salt with respect to the whole etching solution Etching liquid in any one of said [1] thru | or [3] in which the 1 type or 2 or more types of compound chosen from more is contained in 0.01 to 10 weight%.
[5]酸化亜鉛及び酸化アルミニウムを主成分とする透明電極を、上記[1]乃至[4]のいずれかに記載のエッチング液を用いてエッチングする透明電極のエッチング方法。 [5] A method for etching a transparent electrode, comprising etching a transparent electrode containing zinc oxide and aluminum oxide as main components using the etching solution according to any one of [1] to [4].
[6]酸化亜鉛及び酸化アルミニウムを主成分とする透明電極とインジウムを主成分とする透明電極とを、上記[1]乃至[4]のいずれかに記載のエッチング液を用い、同一液でエッチングする透明電極のエッチング方法。 [6] Etching a transparent electrode mainly composed of zinc oxide and aluminum oxide and a transparent electrode mainly composed of indium with the same liquid using the etching liquid according to any one of [1] to [4] above. A method for etching a transparent electrode.
[7]酸化亜鉛及び酸化アルミニウムを主成分とする透明電極が、ZAO(アルミニウム酸化物添加亜鉛酸化物)を主成分とする透明電極である上記[5]又は[6]に記載のエッチング方法。 [7] The etching method according to [5] or [6], wherein the transparent electrode mainly composed of zinc oxide and aluminum oxide is a transparent electrode mainly composed of ZAO (aluminum oxide-added zinc oxide).
[8]インジウムを主成分とする透明電極が、ITO(インジウム−スズ酸化物)又はIZO(インジウム−酸化亜鉛)を主成分とする透明電極である上記[5]乃至[7]のいずれかに記載のエッチング方法。 [8] The above [5] to [7], wherein the transparent electrode mainly composed of indium is a transparent electrode mainly composed of ITO (indium-tin oxide) or IZO (indium-zinc oxide). The etching method as described.
本発明のエッチング液によれば、ITO透明電極(又はIZO透明電極)とZAO透明電極を同一液でエッチングできるため、工業的に極めて有用である。 According to the etching solution of the present invention, the ITO transparent electrode (or IZO transparent electrode) and the ZAO transparent electrode can be etched with the same solution, which is extremely useful industrially.
本発明のエッチング液の必須成分は、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物と、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物である。 The essential components of the etching solution of the present invention are one or more compounds selected from the group consisting of hydrobromic acid and salts thereof, and one or more compounds selected from the group consisting of hydrofluoric acid and salts thereof. It is a compound of this.
本発明のエッチング液において、臭化水素酸や臭化水素酸塩は、ZAO、ITO及びIZOのエッチング速度を増加させる効果がある。 In the etching solution of the present invention, hydrobromic acid and hydrobromide have the effect of increasing the etching rate of ZAO, ITO and IZO.
本発明のエッチング液に使用できる臭化水素酸や臭化水素酸塩には特に制限はない。例えば、臭化水素酸塩としては、臭化水素酸のアンモニウム塩、アミン塩が好適なものとして挙げられる。本発明において、臭化水素酸のナトリウム塩、カリウム塩等の金属塩を使用しても、透明電極をエッチングすることは可能だが、一般のフラットパネルディスプレーの製造では金属を嫌うため、臭化水素酸のアンモニウム塩やアミン塩を使用することがが好ましい。また、臭化水素酸と臭化水素酸塩を併用すると、pH変動が小さく、しかもフラットパネルディスプレーを構成する他材にダメージのないエッチング液とすることができる。 There is no restriction | limiting in particular in the hydrobromic acid and hydrobromide which can be used for the etching liquid of this invention. For example, as a hydrobromide, an ammonium salt and an amine salt of hydrobromic acid are preferable. In the present invention, it is possible to etch a transparent electrode even if a metal salt such as sodium salt or potassium salt of hydrobromic acid is used. However, in the production of a general flat panel display, metal is disliked. It is preferable to use an ammonium salt or amine salt of an acid. Further, when hydrobromic acid and hydrobromide are used in combination, an etching solution having a small pH variation and having no damage to other materials constituting the flat panel display can be obtained.
本発明のエッチング液において、フッ化水素酸やその塩(すなわち、フッ化物塩)はITO(又はIZO)のエッチング速度を高め、ZAOのエッチング速度を下げる効果がある。 In the etching solution of the present invention, hydrofluoric acid or a salt thereof (that is, fluoride salt) has an effect of increasing the etching rate of ITO (or IZO) and decreasing the etching rate of ZAO.
本発明のエッチング液に使用できるフッ化水素酸及び/又はフッ化物塩に特に制限はない。本発明において、フッ化物塩として、フッ化ナトリウム、フッ化カリウム等の金属塩を使用しても、透明電極をエッチングすることは可能だが、一般のフラットパネルディスプレーの製造では上記したとおり金属を嫌うため、フッ化水素酸のアンモニウム塩(すなわち、フッ化アンモニウム)やアミン塩を使用することが好ましい。 There is no restriction | limiting in particular in the hydrofluoric acid and / or fluoride salt which can be used for the etching liquid of this invention. In the present invention, even if a metal salt such as sodium fluoride or potassium fluoride is used as the fluoride salt, the transparent electrode can be etched, but the production of a general flat panel display dislikes the metal as described above. Therefore, it is preferable to use an ammonium salt of hydrofluoric acid (that is, ammonium fluoride) or an amine salt.
本発明のエッチング液において、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物と、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物は水に溶解して、又は懸濁して使用される。 In the etching solution of the present invention, one or more compounds selected from the group consisting of hydrobromic acid and salts thereof, and one or more compounds selected from the group consisting of hydrofluoric acid and salts thereof are: Used by dissolving in water or suspending.
本発明のエッチング液においては、アルコール等の親水性の有機溶媒を添加しても良い。このような有機溶媒としては、メタノール、エタノール、プロパノール等のアルコール、アセトン、メチルエチルケトン等のケトン、ジメチルスルホキシド等のスルホキシド、N,N−ジメチルホルムアミド、N−メチルピロリドン等のアミド、γ−ブチロラクトン等のラクトンが挙げられる。 In the etching solution of the present invention, a hydrophilic organic solvent such as alcohol may be added. Examples of such organic solvents include alcohols such as methanol, ethanol and propanol, ketones such as acetone and methyl ethyl ketone, sulfoxides such as dimethyl sulfoxide, amides such as N, N-dimethylformamide and N-methylpyrrolidone, and γ-butyrolactone. Examples include lactones.
本発明のエッチング液は、エッチング液全体に対し、通常、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.01〜10重量%の範囲、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.01〜10重量%の範囲で含まれる。好ましくは、臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.1〜5重量%の範囲、フッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物が0.01〜5重量%の範囲で含まれる。臭化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物の量が上記範囲より少ないと、エッチング力が工業的でないほど低下するおそれがあり、上記範囲より多いとエッチングが速くなりすぎ、コントロールできなくなるおそれがある。またフッ化水素酸及びその塩からなる群より選ばれる一種又は二種以上の化合物の量が上記範囲より少ないとITO(又はIZO)のエッチング速度が小さくなるおそれがあり、上記範囲より多いとフラットパネルディスプレーを構成する他材へのダメージが増大するおそれがある。 The etching solution of the present invention is usually in the range of 0.01 to 10% by weight of one or two or more compounds selected from the group consisting of hydrobromic acid and salts thereof with respect to the whole etching solution, hydrofluoric acid And one or more compounds selected from the group consisting of salts thereof and 0.01 to 10% by weight. Preferably, one or two or more compounds selected from the group consisting of hydrobromic acid and salts thereof are in the range of 0.1 to 5% by weight, one or two selected from the group consisting of hydrofluoric acid and salts thereof. More than one compound is included in the range of 0.01 to 5% by weight. If the amount of one or two or more compounds selected from the group consisting of hydrobromic acid and its salt is less than the above range, the etching power may decrease unindustrially. There is a risk that it becomes too controllable. Further, if the amount of one or more compounds selected from the group consisting of hydrofluoric acid and its salt is less than the above range, the etching rate of ITO (or IZO) may be reduced, and if it exceeds the above range, it is There is a possibility that damage to other materials constituting the panel display may increase.
本発明のエッチング液は、フラットパネルディスプレイ、太陽電池等の製造工程において、ZAO、ITO、IZO等を主成分とする透明電極(すなわち、ZAO透明電極、ITO透明電極、IZO透明電極等)をエッチングするためのエッチング液として使用される。 The etching solution of the present invention etches transparent electrodes (ie, ZAO transparent electrodes, ITO transparent electrodes, IZO transparent electrodes, etc.) mainly composed of ZAO, ITO, IZO, etc. in the manufacturing process of flat panel displays, solar cells, etc. It is used as an etchant for
本発明のエッチング液は、ITO透明電極(又はIZO透明電極)とZAO透明電極を同一液でエッチングできる。 The etching solution of the present invention can etch the ITO transparent electrode (or IZO transparent electrode) and the ZAO transparent electrode with the same solution.
本発明のエッチング液は、非常にエッチング性能が高いので、低温でも十分使用することができるが、使用温度としては、0〜100℃の範囲が好ましい。0℃未満では、エッチング速度が現実的でないほど遅くなり、100℃を超える温度では、水の蒸散、蒸発が激しくなるため、実用的ではない。 Since the etching solution of the present invention has very high etching performance, it can be used sufficiently even at low temperatures, but the use temperature is preferably in the range of 0 to 100 ° C. If it is less than 0 ° C., the etching rate is unrealistically slow, and if it exceeds 100 ° C., water transpiration and evaporation become severe, which is not practical.
本発明のエッチング液は、バッチ式、枚葉式いずれも問題なく使用することができ、また、スプレー噴霧による洗浄やその他の方法を使用しても差し支えない。さらに、必要に応じて超音波を併用することができる。エッチング後のリンスとしては、アルコールのような有機溶剤を使用する必要はなく、水でリンスするだけで十分である。 The etching solution of the present invention can be used without any problem in either batch type or single wafer type, and cleaning by spraying or other methods may be used. Furthermore, ultrasonic waves can be used in combination as necessary. As the rinsing after etching, it is not necessary to use an organic solvent such as alcohol, and it is sufficient to rinse with water.
本発明を以下の実施例により更に詳細に説明するが、本発明はこれらに限定されるものではない。なお、表記を簡潔にするため、以下の略記号を使用した。 The present invention will be described in more detail with reference to the following examples, but the present invention is not limited thereto. In order to simplify the notation, the following abbreviations were used.
ZAO:アルミニウム酸化物添加亜鉛酸化物
ITO:インジウム−スズ酸化物
HBr:臭化水素酸
AF:フッ化アンモニウム
実施例1〜6、比較例1〜3:
ガラス板上に100nmの厚みでZAOを成膜した基板、及びガラス板上に100nmの厚みでITOを成膜した基板を、表1に記載のエッチング液に浸漬し、水洗乾燥後、そのシート抵抗から各膜厚を測定した。浸漬前後の膜厚変化から、ZAO,ITOのエッチング速度を算出した。それらの結果を表1に示す。
ZAO: zinc oxide added with aluminum oxide ITO: indium-tin oxide HBr: hydrobromic acid AF: ammonium fluoride Examples 1-6, Comparative Examples 1-3:
A substrate on which a ZAO film was formed with a thickness of 100 nm on a glass plate and a substrate on which an ITO film was formed with a thickness of 100 nm on a glass plate were immersed in the etching solution shown in Table 1, washed with water and dried, and then its sheet resistance Each film thickness was measured. The etching rate of ZAO and ITO was calculated from the change in film thickness before and after immersion. The results are shown in Table 1.
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JPS5789479A (en) * | 1980-11-26 | 1982-06-03 | Seiko Epson Corp | Etchant for transparent electric conductive film |
US5366588A (en) * | 1992-03-13 | 1994-11-22 | U.S. Philips Corporation | Method of manufacturing an electrically conductive pattern of tin-doped indium oxide (ITO) on a substrate |
JP4306827B2 (en) * | 1998-04-14 | 2009-08-05 | エルジー ディスプレイ カンパニー リミテッド | Etching agent |
JP2000160367A (en) * | 1998-11-24 | 2000-06-13 | Daikin Ind Ltd | Etching solution in which etching rate is speeded-up |
JP4897148B2 (en) * | 2001-03-29 | 2012-03-14 | 富士技研工業株式会社 | Etching solution for transparent conductive film |
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2008
- 2008-09-11 JP JP2008233306A patent/JP5262478B2/en not_active Expired - Fee Related
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