JP4908733B2 - 集積回路装置の活性区域から熱を除去する方法及びシステム - Google Patents
集積回路装置の活性区域から熱を除去する方法及びシステム Download PDFInfo
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- JP4908733B2 JP4908733B2 JP2003280819A JP2003280819A JP4908733B2 JP 4908733 B2 JP4908733 B2 JP 4908733B2 JP 2003280819 A JP2003280819 A JP 2003280819A JP 2003280819 A JP2003280819 A JP 2003280819A JP 4908733 B2 JP4908733 B2 JP 4908733B2
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- integrated circuit
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4093—Snap-on arrangements, e.g. clips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
- H01L2023/4037—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink
- H01L2023/4043—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink heatsink to have chip
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83192—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
102 熱伝導性要素
104 活性区域
106 集積回路装置
108 基板
110 モールドセクション
112 熱伝導性膜
114 接着剤
Claims (14)
- 集積回路装置の活性区域から熱を除去する方法において、
前記集積回路装置の周辺部をモールドセクションで保持し、
前記集積回路装置の活性区域へ分離体を付与し、
前記分離体を介して前記集積回路装置の活性区域へ熱伝導性要素を結合させ、
前記熱伝導性要素を前記モールドセクションへ固定させ、
前記活性区域へ前記熱伝導性要素を結合させる前に、前記集積回路装置の活性区域か又は前記熱伝導性要素へスペーサーを結合させる、
ことを特徴とする方法。 - 請求項1において、前記分離体が熱伝導性膜を有していることを特徴とする方法。
- 請求項1において、前記分離体が熱伝導性グリースを有していることを特徴とする方法。
- 請求項1において、前記集積回路装置の活性区域へ熱伝導性要素を結合させる場合に、前記熱伝導性要素を、前記熱伝導性要素を前記モールドセクションへ固定させる固定用ハードウエアと共に、前記活性区域へ結合させることを特徴とする方法。
- 集積回路装置の活性区域から熱を除去する方法において、
集積回路装置を形成し、
前記集積回路装置の活性区域を露出させる共に前記集積回路装置の周辺部をモールドセクションで保持し、
前記集積回路装置の活性区域へ分離体を付与し、
前記分離体を介して前記集積回路装置の活性区域へ熱伝導性要素を結合させ、
前記熱伝導性要素を前記モールドセクションへ固定させ、
前記活性区域へ前記熱伝導性要素を結合させる前に、前記集積回路装置の活性区域か又は前記熱伝導性要素へスペーサーを結合させる、
ことを特徴とする方法。 - 請求項5において、更に、前記集積回路装置の活性区域を薄い有機膜でコーティングすることを特徴とする方法。
- 請求項5において、前記分離体が熱伝導性膜を有していることを特徴とする方法。
- 請求項5において、前記分離体が熱伝導性グリースを有していることを特徴とする方法。
- 請求項5において、前記集積回路装置の活性区域へ熱伝導性要素を結合させる場合に、前記熱伝導性要素を、前記熱伝導性要素を前記モールドセクションへ固定させる固定用ハードウエアと共に、前記活性区域へ結合させることを特徴とする方法。
- 集積回路装置の活性区域から熱を除去するシステムにおいて、
前記集積回路装置の周辺部を保持しているモールドセクション、
前記集積回路装置の活性区域へ結合されている分離体、
前記分離体を介して前記集積回路装置の活性区域へ結合されている熱伝導性要素、
前記集積回路装置の活性区域か又は前記熱伝導性要素へ結合されているスペーサー、
前記熱伝導性要素を前記モールドセクションへ固定する固定手段、
を有していることを特徴とするシステム。 - 請求項10において、前記分離体が熱伝導性膜を有していることを特徴とするシステム。
- 請求項10において、前記分離体が熱伝導性グリースを有していることを特徴とするシステム。
- 請求項10において、前記固定手段が固定用ハードウエアを有していることを特徴とするシステム。
- 請求項13において、前記固定用ハードウエアがスプリングクリップ、接着剤、ナット、クリップ、ネジ、ボルト、スプリング及び有刺ポストのうちの少なくとも1つを有していることを特徴とするシステム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/205,715 US6785137B2 (en) | 2002-07-26 | 2002-07-26 | Method and system for removing heat from an active area of an integrated circuit device |
US10/205715 | 2002-07-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004064093A JP2004064093A (ja) | 2004-02-26 |
JP4908733B2 true JP4908733B2 (ja) | 2012-04-04 |
Family
ID=30000120
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003280819A Expired - Lifetime JP4908733B2 (ja) | 2002-07-26 | 2003-07-28 | 集積回路装置の活性区域から熱を除去する方法及びシステム |
Country Status (3)
Country | Link |
---|---|
US (1) | US6785137B2 (ja) |
EP (1) | EP1385206B1 (ja) |
JP (1) | JP4908733B2 (ja) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004093187A1 (ja) * | 2003-04-16 | 2004-10-28 | Fujitsu Limited | 電子部品パッケージ、電子部品パッケージ組立体およびプリント基板ユニット |
US7268019B2 (en) * | 2004-09-22 | 2007-09-11 | Halliburton Energy Services, Inc. | Method and apparatus for high temperature operation of electronics |
TW200611107A (en) * | 2004-09-24 | 2006-04-01 | Via Tech Inc | Heat dissipation module |
US20060209516A1 (en) * | 2005-03-17 | 2006-09-21 | Chengalva Suresh K | Electronic assembly with integral thermal transient suppression |
CN2800705Y (zh) * | 2005-05-29 | 2006-07-26 | 富准精密工业(深圳)有限公司 | 保护盖及具有该保护盖的散热装置 |
JP4986435B2 (ja) * | 2005-10-12 | 2012-07-25 | 株式会社ソニー・コンピュータエンタテインメント | 半導体装置、半導体装置の作成方法 |
US7382620B2 (en) * | 2005-10-13 | 2008-06-03 | International Business Machines Corporation | Method and apparatus for optimizing heat transfer with electronic components |
US7468548B2 (en) * | 2005-12-09 | 2008-12-23 | Fairchild Semiconductor Corporation | Thermal enhanced upper and dual heat sink exposed molded leadless package |
US7687897B2 (en) * | 2006-12-28 | 2010-03-30 | Stats Chippac Ltd. | Mountable integrated circuit package-in-package system with adhesive spacing structures |
KR101391925B1 (ko) * | 2007-02-28 | 2014-05-07 | 페어차일드코리아반도체 주식회사 | 반도체 패키지 및 이를 제조하기 위한 반도체 패키지 금형 |
US20090166890A1 (en) * | 2007-12-31 | 2009-07-02 | Chrysler Gregory M | Flip-chip package |
US8362607B2 (en) * | 2009-06-03 | 2013-01-29 | Honeywell International Inc. | Integrated circuit package including a thermally and electrically conductive package lid |
FR2968126A1 (fr) * | 2010-11-29 | 2012-06-01 | St Microelectronics Grenoble 2 | Boitier semi-conducteur a via thermique et procédé de fabrication |
US9072199B2 (en) * | 2010-12-27 | 2015-06-30 | Src, Inc. | Thermal transfer component, apparatus and method including thermally conductive frame penetrated by thermally conductive plug |
CN103179839A (zh) * | 2011-12-22 | 2013-06-26 | 鸿富锦精密工业(深圳)有限公司 | 电子装置 |
US9136202B2 (en) * | 2012-04-17 | 2015-09-15 | Qualcomm Incorporated | Enhanced package thermal management using external and internal capacitive thermal material |
JP5623463B2 (ja) * | 2012-06-25 | 2014-11-12 | 三菱電機株式会社 | 半導体モジュール |
FR2999336A1 (fr) * | 2012-12-07 | 2014-06-13 | Commissariat Energie Atomique | Composant electronique comportant un materiau absorbeur de chaleur et procede de fabrication de ce composant electronique |
US9111878B2 (en) * | 2013-01-31 | 2015-08-18 | Freescale Semiconductor, Inc | Method for forming a semiconductor device assembly having a heat spreader |
US9961798B2 (en) | 2013-04-04 | 2018-05-01 | Infineon Technologies Austria Ag | Package and a method of manufacturing the same |
EP3050095B1 (en) * | 2013-09-27 | 2019-02-13 | Intel Corporation | Dual-sided die packages |
US9918407B2 (en) * | 2016-08-02 | 2018-03-13 | Qualcomm Incorporated | Multi-layer heat dissipating device comprising heat storage capabilities, for an electronic device |
CN107706286B (zh) * | 2017-09-27 | 2019-10-11 | 开发晶照明(厦门)有限公司 | Led发光装置和led支架 |
WO2019066989A1 (en) * | 2017-09-30 | 2019-04-04 | Intel Corporation | INTEGRATED SUBSTRATE AMOUNTS AND HEAT DIFFUSER CUSTOMIZATION FOR ENHANCED PACKAGING THERMOMECHANICS |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1486152A (en) | 1976-02-19 | 1977-09-21 | Standard Telephones Cables Ltd | Manufacture of solid state devices |
US4709301A (en) * | 1985-09-05 | 1987-11-24 | Nec Corporation | Package |
JPS6376444A (ja) * | 1986-09-19 | 1988-04-06 | Nec Corp | チツプキヤリア |
GB2246471B (en) | 1988-08-23 | 1993-07-28 | Nobuo Mikoshiba | Cooling semiconductor devices |
JPH02220465A (ja) * | 1989-02-22 | 1990-09-03 | Hitachi Ltd | 半導体デバイスの冷却装置 |
JP2691613B2 (ja) * | 1989-05-08 | 1997-12-17 | 菱電工機エンジニアリング株式会社 | Cad/cam装置 |
FR2679729B1 (fr) * | 1991-07-23 | 1994-04-29 | Alcatel Telspace | Dissipateur thermique. |
US5177669A (en) * | 1992-03-02 | 1993-01-05 | Motorola, Inc. | Molded ring integrated circuit package |
EP0566872A3 (en) * | 1992-04-21 | 1994-05-11 | Motorola Inc | A thermally enhanced semiconductor device and method for making the same |
JP2748771B2 (ja) * | 1992-05-14 | 1998-05-13 | 日本電気株式会社 | フィルムキャリア半導体装置及びその製造方法 |
JPH0864732A (ja) | 1994-08-26 | 1996-03-08 | Mitsubishi Electric Corp | 半導体集積回路装置 |
MY114536A (en) | 1994-11-24 | 2002-11-30 | Apic Yamada Corp | A resin molding machine and a method of resin molding |
JPH098209A (ja) * | 1995-06-15 | 1997-01-10 | Hitachi Ltd | 半導体装置およびモールド金型 |
NL1003315C2 (nl) | 1996-06-11 | 1997-12-17 | Europ Semiconductor Assembly E | Werkwijze voor het inkapselen van een geïntegreerde halfgeleiderschake- ling. |
US6046905A (en) * | 1996-09-30 | 2000-04-04 | Intel Corporation | Dual spring clip attachment mechanism for controlled pressure interface thermal solution on processor cartridges |
US5969947A (en) * | 1997-12-17 | 1999-10-19 | International Business Machines Corporation | Integral design features for heatsink attach for electronic packages |
JP2001358259A (ja) * | 2000-06-15 | 2001-12-26 | Seiko Epson Corp | 半導体パッケージ |
US6459582B1 (en) * | 2000-07-19 | 2002-10-01 | Fujitsu Limited | Heatsink apparatus for de-coupling clamping forces on an integrated circuit package |
US20050252602A1 (en) * | 2002-03-20 | 2005-11-17 | Tomomi Tateishi | Organic thin-film device and its production method |
-
2002
- 2002-07-26 US US10/205,715 patent/US6785137B2/en not_active Expired - Lifetime
-
2003
- 2003-07-08 EP EP03254327.4A patent/EP1385206B1/en not_active Expired - Lifetime
- 2003-07-28 JP JP2003280819A patent/JP4908733B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6785137B2 (en) | 2004-08-31 |
EP1385206B1 (en) | 2015-06-17 |
EP1385206A2 (en) | 2004-01-28 |
US20040017661A1 (en) | 2004-01-29 |
EP1385206A3 (en) | 2004-03-17 |
JP2004064093A (ja) | 2004-02-26 |
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