JP4749299B2 - 露光装置、露光方法、及び表示用パネル基板の製造方法 - Google Patents
露光装置、露光方法、及び表示用パネル基板の製造方法 Download PDFInfo
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- 239000002826 coolant Substances 0.000 claims description 14
- 230000007246 mechanism Effects 0.000 description 15
- 239000010408 film Substances 0.000 description 14
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- 230000008569 process Effects 0.000 description 10
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- 239000004973 liquid crystal related substance Substances 0.000 description 7
- 239000010409 thin film Substances 0.000 description 7
- 230000008859 change Effects 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 3
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- 229910052753 mercury Inorganic materials 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 238000005401 electroluminescence Methods 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70375—Multiphoton lithography or multiphoton photopolymerization; Imaging systems comprising means for converting one type of radiation into another type of radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
- G03F7/2057—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using an addressed light valve, e.g. a liquid crystal device
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/7005—Production of exposure light, i.e. light sources by multiple sources, e.g. light-emitting diodes [LED] or light source arrays
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70175—Lamphouse reflector arrangements or collector mirrors, i.e. collecting light from solid angle upstream of the light source
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
- G03F7/70891—Temperature
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Description
2 マスク
3 ベース
4 Xガイド
5 Xステージ
6 Yガイド
7 Yステージ
8 θステージ
9 Z−チルト機構
10 チャック
20 マスクホルダ
30 露光光照射装置
31a,31b,31c,31d ランプ
32a,32b,32c,32d 集光鏡
33 第1平面鏡
34 レンズ
35 シャッター
36 コリメーターレンズ
37 第2平面鏡
38 電源
39 ランプハウス
39a 吸気口
39b 排気口
40 排気ファン
50a,50b,50c,50d,50e 隔壁
51 冷却水通路
52 給水管
53 排水管
Claims (6)
- 露光光を発生する複数のランプと、
各ランプが貫通する開口を底部に有し、各ランプの周囲に設けられ、各ランプから発生した露光光を集光する複数の集光鏡と、
各ランプの間に設けられ、各ランプから発生した露光光が他のランプへ照射されるのを防止し、かつ各ランプから発生した熱が他のランプへ伝わるのを抑制する隔壁と、
各集光鏡により集光された露光光がそれぞれ上方へ照射される様に、前記複数のランプ及び前記複数の集光鏡並びに前記隔壁を横方向に並べて収容し、前記複数のランプより下方の位置に吸気口を有し、前記複数のランプより上方の位置に排気ファンが接続された排気口を有し、前記吸気口から吸入された冷却媒体を、各集光鏡の開口を通して各ランプの周囲に流して前記排気口から排出し、各ランプの周囲に冷却媒体の流れを形成して各ランプを冷却するランプハウスと、
各集光鏡から照射された露光光を重ね合わせて基板へ照射する照射装置とを備え、前記複数のランプから発生した露光光により基板を露光することを特徴とする露光装置。 - 前記隔壁は、冷却水が流れる冷却水通路を有することを特徴とする請求項1に記載の露光装置。
- 露光光を発生する光源に複数のランプを用い、
各ランプの周囲に、各ランプが貫通する開口を底部に有する集光鏡を設けて、各ランプから発生した露光光を集光し、
各ランプの間に隔壁を設けて、各ランプから発生した露光光が他のランプへ照射されるのを防止し、かつ各ランプから発生した熱が他のランプへ伝わるのを抑制し、
各集光鏡により集光された露光光がそれぞれ上方へ照射される様に、複数のランプ及び複数の集光鏡並びに隔壁を横方向に並べてランプハウスに収容し、
ランプハウスの複数のランプより下方の位置に吸気口を設け、ランプハウスの複数のランプより上方の位置に排気ファンが接続された排気口を設け、吸気口から吸入された冷却媒体を、各集光鏡の開口を通して各ランプの周囲に流して排気口から排出し、各ランプの周囲に冷却媒体の流れを形成して各ランプを冷却し、
各集光鏡から照射された露光光を重ね合わせて基板へ照射して、複数のランプから発生した露光光により基板を露光することを特徴とする露光方法。 - 隔壁に冷却水通路を設け、冷却水通路に冷却水を流して隔壁を冷却することを特徴とする請求項3に記載の露光方法。
- 請求項1又は請求項2に記載の露光装置を用いて、マスクのパターンを基板へ転写することを特徴とする表示用パネル基板の製造方法。
- 請求項3又は請求項4に記載の露光方法を用いて、マスクのパターンを基板へ転写することを特徴とする表示用パネル基板の製造方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006265717A JP4749299B2 (ja) | 2006-09-28 | 2006-09-28 | 露光装置、露光方法、及び表示用パネル基板の製造方法 |
TW096121283A TW200816272A (en) | 2006-09-28 | 2007-06-13 | Light source for exposure, exposure device, exposure method, and manufacturing method of a panel substrate for display |
CN2007101114353A CN101154052B (zh) | 2006-09-28 | 2007-06-20 | 曝光用光源、曝光装置、曝光方法、以及面板基板的制造方法 |
KR1020070065297A KR101269255B1 (ko) | 2006-09-28 | 2007-06-29 | 노광용 광원, 노광 장치, 노광 방법 및 표시용 패널 기판의제조 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006265717A JP4749299B2 (ja) | 2006-09-28 | 2006-09-28 | 露光装置、露光方法、及び表示用パネル基板の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008083586A JP2008083586A (ja) | 2008-04-10 |
JP4749299B2 true JP4749299B2 (ja) | 2011-08-17 |
Family
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JP2006265717A Expired - Fee Related JP4749299B2 (ja) | 2006-09-28 | 2006-09-28 | 露光装置、露光方法、及び表示用パネル基板の製造方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4749299B2 (ja) |
KR (1) | KR101269255B1 (ja) |
CN (1) | CN101154052B (ja) |
TW (1) | TW200816272A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11926559B2 (en) | 2018-08-09 | 2024-03-12 | Ohara Inc. | Crystallized glass substrate |
US11926554B2 (en) | 2018-08-09 | 2024-03-12 | Ohara Inc. | Crystallized glass substrate |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5212629B2 (ja) * | 2008-08-05 | 2013-06-19 | ウシオ電機株式会社 | 光照射装置 |
JP5077198B2 (ja) * | 2008-11-13 | 2012-11-21 | ウシオ電機株式会社 | 光照射装置 |
JP5345443B2 (ja) * | 2009-04-21 | 2013-11-20 | 株式会社日立ハイテクノロジーズ | 露光装置、露光光照射方法、及び表示用パネル基板の製造方法 |
JP5471006B2 (ja) * | 2009-04-23 | 2014-04-16 | ウシオ電機株式会社 | 光照射装置 |
JP2011013513A (ja) * | 2009-07-03 | 2011-01-20 | Hitachi High-Technologies Corp | 液晶露光装置 |
JP5355261B2 (ja) * | 2009-07-07 | 2013-11-27 | 株式会社日立ハイテクノロジーズ | プロキシミティ露光装置、プロキシミティ露光装置の露光光形成方法、及び表示用パネル基板の製造方法 |
JP5510792B2 (ja) * | 2009-12-02 | 2014-06-04 | 岩崎電気株式会社 | 紫外線照射装置 |
JP7100398B1 (ja) | 2021-05-06 | 2022-07-13 | 株式会社 ベアック | 露光装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07113769B2 (ja) * | 1990-09-06 | 1995-12-06 | 株式会社オーク製作所 | 露光装置及び熱吸収式コールドミラー |
JPH0839030A (ja) * | 1994-07-29 | 1996-02-13 | Orc Mfg Co Ltd | 光照射装置 |
DE19935404A1 (de) * | 1999-07-30 | 2001-02-01 | Zeiss Carl Fa | Beleuchtungssystem mit mehreren Lichtquellen |
JP2002131841A (ja) * | 2000-10-25 | 2002-05-09 | Fujitsu General Ltd | 光源装置 |
CN2496130Y (zh) * | 2001-09-11 | 2002-06-19 | 梁茂忠 | 曝光机灯管水冷装置 |
JP2004245912A (ja) * | 2003-02-12 | 2004-09-02 | Ushio Inc | 光照射装置 |
JP4961685B2 (ja) * | 2005-05-18 | 2012-06-27 | ウシオ電機株式会社 | 光照射装置 |
JP7113769B2 (ja) * | 2019-02-18 | 2022-08-05 | 富士フイルム株式会社 | 情報処理装置、情報処理方法、情報処理プログラム、表示制御装置、表示制御方法、及び表示制御プログラム |
-
2006
- 2006-09-28 JP JP2006265717A patent/JP4749299B2/ja not_active Expired - Fee Related
-
2007
- 2007-06-13 TW TW096121283A patent/TW200816272A/zh unknown
- 2007-06-20 CN CN2007101114353A patent/CN101154052B/zh not_active Expired - Fee Related
- 2007-06-29 KR KR1020070065297A patent/KR101269255B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11926559B2 (en) | 2018-08-09 | 2024-03-12 | Ohara Inc. | Crystallized glass substrate |
US11926554B2 (en) | 2018-08-09 | 2024-03-12 | Ohara Inc. | Crystallized glass substrate |
Also Published As
Publication number | Publication date |
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KR20080029761A (ko) | 2008-04-03 |
KR101269255B1 (ko) | 2013-05-29 |
TW200816272A (en) | 2008-04-01 |
JP2008083586A (ja) | 2008-04-10 |
CN101154052B (zh) | 2011-02-09 |
CN101154052A (zh) | 2008-04-02 |
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